Impact test device, impact test method, abnormality detection device, and method for measuring thickness of refractory

Abstract

This impact test device for performing an impact test on an impact test object includes: an impact device for vibrating an impact test object by impacting the impact test object; a surface wave receiving device for measuring a surface wave signal generated on a surface of the impact test object by the vibration caused by being impacted by the impact device; and a calculation device for collecting data of the surface wave signal measured by the surface wave receiving device and calculating the collected data. The calculation device detects an abnormality of the impact device on the basis of an index of a normal state extracted from changes over time in the waveform of the surface wave signal measured by the surface wave receiving device.

Description

Impact test device, impact test method, abnormality detection device, and refractory thickness measurement method

[0001] The present invention relates to an impact test device and an impact test method used, for example, to measure the thickness of furnace refractories, as well as an abnormality detection device for the impact test device and a method for measuring the thickness of refractory.

[0002] The furnace walls of industrial furnaces, such as blast furnaces, typically have a multi-layered structure consisting of a steel shell, unshaped refractory, and refractory bricks (the primary refractory material). The innermost refractory bricks wear away from the core, and cracks within them shorten the furnace's lifespan. Therefore, measuring the thickness of refractory bricks and clarifying their internal condition are crucial for furnace maintenance. The hearth of a blast furnace is particularly susceptible to severe wear because it is constantly exposed to molten iron, even during refractory shutdowns. Furthermore, direct repair is impossible during the decades of operation. Accurately measuring the refractory thickness during operation and clarifying the internal condition of refractory bricks can enable the detection of blast furnace anomalies, optimize furnace operation to extend the furnace's lifespan, and accurately predict the furnace's lifespan and refurbishment timing.

[0003] As a method for measuring the thickness of a refractory material, Patent Document 1 describes a method for measuring the thickness of a refractory material by an impact elastic wave resonance method. The method described in Patent Document 1 involves frequency analysis of a measured signal and converting the peak frequency into the remaining thickness of the brick.

[0004] Japanese Patent Application Publication No. 8-219751

[0005] In the impact acoustic wave resonance method, the frequency characteristics of the input signal must correspond to the expected frequency band of the received signal, but the hammer used as the input device for the impact acoustic wave resonance method undergoes deformation and damage as measurements continue, causing changes in the frequency characteristics and excitation force. However, the method described in Patent Document 1 does not take into account changes in the frequency characteristics and excitation force of the impact device, and as measurements are repeated, the upper limit frequency of the input signal decreases, and a peak corresponding to the remaining thickness does not appear, making it impossible to measure the remaining thickness.

[0006] The present invention has been made to solve the above-mentioned problems, and its purpose is to provide an impact testing device and an impact testing method that can detect abnormalities in an impact device, as well as an impact device abnormality detection device and a refractory thickness measurement method.

[0007] [1] An impact test apparatus according to the present invention is an impact test apparatus for performing an impact test on an impact test object, and includes an impact device that vibrates the impact test object by impacting it, a surface wave receiving device that measures surface wave signals generated on the surface of the impact test object by the vibration caused by the impact of the impact device, and a computing device that collects data on the surface wave signals measured by the surface wave receiving device and calculates the collected data, and the computing device detects an abnormality in the impact device based on a normal state indicator extracted from a change over time in the waveform of the surface wave signal measured by the surface wave receiving device.

[0008] [2] In the impact test device according to the present invention, in the impact test device of [1], the calculation device uses, as the index, distance decay characteristics of maximum amplitude in surface waves measured by the surface wave receiving device.

[0009] [3] The impact test device according to the present invention is the impact test device of [2], wherein the surface wave receiving device has a first surface wave detecting unit that detects surface waves at a first detection position that is a first distance from a position where the impact test object is impacted by the impact device, and a second surface wave detecting unit that detects surface waves at a second detection position that is a second distance from the impact position, and the arithmetic unit calculates a predetermined impact speed (impact) of the impact device on the impact test object in a normal state. a normal state index acquisition unit that detects a maximum amplitude of the surface waves measured by the first surface wave detection unit and the second surface wave detection unit when the impact test object is struck at a speed (speed), and acquires the distance attenuation characteristic calculated from the maximum amplitude of the surface waves, the first distance, and the second distance as an index of the normal state; a storage unit that stores the distance attenuation characteristic in association with a set collision speed between the impact unit of the impact device and the impact test object; and an abnormality detection unit that sets a threshold value for the maximum amplitude of the surface waves by the impact device in a normal state that is predicted from the distance attenuation characteristic at a third distance between an impact position when the impact test object is struck at the collision speed by the impact device in an unknown state and the first detection position or the second detection position, and compares the maximum amplitude of the surface waves when the impact test object is struck by the impact device in an unknown state with the threshold value to detect an abnormality.

[0010] [4] The impact test device according to the present invention is the impact test device of [3], wherein the arithmetic device further has an abnormality prediction unit that calculates the time when an abnormality will occur in the impact device based on the time progression of the maximum amplitude of the surface wave when the impact device, the state of which is unknown, is caused to impact the impact test object at the collision speed.

[0011] [5] In the impact test device of the present invention, in the impact test device of [4], the arithmetic device further has a function setting unit that selects whether to execute processing by the normal state index acquisition unit or by the abnormality detection unit.

[0012] [6] The impact test device according to the present invention is any one of the impact test devices [1] to [5], wherein the impact test object has a refractory material, and the thickness of the refractory material is measured by vibrating the impact test object.

[0013] [7] The impact testing device according to the present invention is the impact testing device according to [6], wherein the thickness of the refractory material is measured by an impact elastic wave resonance method.

[0014] [8] An impact test method according to the present invention is a method for performing an impact test on an impact test object, and includes the steps of: vibrating the impact test object by impacting it with an impact device; measuring a surface wave signal generated on the surface of the impact test object by the vibration caused by the impact of the impact device with a surface wave receiving device; obtaining and storing an index of a normal state extracted from the time change in the waveform of the surface wave signal measured by the surface wave receiving device; and detecting an abnormality in the impact device based on the index.

[0015] [9] The abnormality detection device according to the present invention is an abnormality detection device for detecting an abnormality in an impact test device that performs an impact test by vibrating an impact test object by impacting it with an impact device and measuring a surface wave signal generated on the surface of the impact test object by the vibration caused by the impact of the impact device with a surface wave receiving device, and collects data on the surface wave signal measured by the surface wave receiving device, calculates the collected data, and detects an abnormality in the impact device based on an index of normal state extracted from the change over time in the waveform of the surface wave signal measured by the surface wave receiving device.

[0016]

[10] The anomaly detection device according to the present invention is the anomaly detection device according to [9], wherein the index is the distance attenuation characteristic of the maximum amplitude of the surface wave measured by the surface wave receiving device.

[0017]

[11] The anomaly detection device according to the present invention is the anomaly detection device according to

[10] , wherein the surface wave receiving device has a first surface wave detection unit that detects surface waves at a first detection position that is a first distance from a position where the impact test object is impacted by the impact device, and a second surface wave detection unit that detects surface waves at a second detection position that is a second distance from the impact position, and when the impact test object is impacted by the impact device in a normal state at a predetermined impact speed, the maximum amplitude of the surface waves measured by the first surface wave detection unit and the second surface wave detection unit is detected, and the distance attenuation characteristic is calculated from the maximum amplitude of the surface waves, the first distance, and the second distance. as an index of the normal state; a memory unit that stores the distance attenuation characteristics in association with a set collision speed between the impact unit of the impact device and the impact test object; and an abnormality detection unit that sets, as a threshold value, the maximum amplitude of the surface wave generated by the impact device in a normal state predicted from the distance attenuation characteristics at a third distance between the impact position when the impact test object is struck at the collision speed by the impact device, whose state is unknown, and the first detection position or the second detection position, and compares the maximum amplitude of the surface wave generated by the impact device, whose state is unknown, with the threshold value to detect an abnormality.

[0018]

[12] The anomaly detection device according to the present invention is the anomaly detection device of

[11] , further comprising an anomaly prediction unit that calculates the time when an anomaly will occur in the impact device based on the change over time in the maximum amplitude of the surface wave when the impact device, the state of which is unknown, is caused to impact the impact test object at the impact velocity.

[0019]

[13] The anomaly detection device according to the present invention is the anomaly detection device of

[12] , further comprising a function setting unit that selects whether to execute processing by the normal state index acquisition unit or by the anomaly detection unit.

[0020]

[14] A method for measuring the thickness of a refractory material according to the present invention includes using an impact test device according to any one of [1] to [5] to vibrate an impact test object having a refractory material, and measuring the thickness of the refractory material.

[0021]

[15] The method for measuring the thickness of a refractory material according to the present invention is the method for measuring the thickness of a refractory material according to

[14] , wherein the thickness of the refractory material is measured by an impact acoustic wave resonance method.

[0022] According to the present invention, an impact test device and an impact test method capable of detecting an abnormality in an impact device, as well as an impact device abnormality detection device and a refractory thickness measurement method are provided. This allows for rapid detection of deterioration of the impact device and prevents measurement errors caused by deterioration of the impact device during an impact test. Furthermore, because the method uses surface waves generated by the impact device, it is possible to detect deterioration of impact devices that do not output signals like test hammers.

[0023] FIG. 1 is a functional block diagram showing the configuration of an impact testing device according to a first embodiment of the present invention. FIG. 2 is a diagram showing an example of the positional relationship between the impact position of a normal impact device and the first and second surface wave detection units in a surface wave receiving device. FIG. 3 is a diagram showing an example of the time signal of the surface wave measured by each surface wave detection unit. FIG. 4 is a diagram showing an example of the relationship between the distance between the impact position of an impact device performing anomaly detection and the surface wave detection unit, and the maximum amplitude of the surface wave. FIG. 5 is a diagram showing an example of the positional relationship between the impact position of an impact device performing anomaly detection and the surface wave detection unit. FIG. 6 is a diagram showing an example of the distance attenuation characteristic output by the distance attenuation characteristic calculation unit, and the relationship between the propagation distance and the estimated surface wave amplitude value. FIG. 7 is a diagram showing an example of the time signal of the surface wave output by the surface wave detection unit when an impact test object is impacted using the impact unit of an impact device that has softened due to deterioration. FIG. 8 is a flowchart showing an example of the control process flow of the anomaly detection device. FIG. 9 is a functional block diagram showing the configuration of an impact testing device according to a second embodiment of the present invention. Fig. 10 is a diagram showing an example of the time transition of the maximum amplitude of the surface wave detected by the surface wave maximum value detection unit when the impact test object is impacted multiple times using the impact unit of the impact device. Fig. 11 is a schematic diagram showing an example of a usage mode of the anomaly detection device in the impact test device according to the first embodiment. Fig. 12 is a diagram showing an example of the surface wave measured during impact when measuring the thickness of refractory material by the impact acoustic wave resonance method.

[0024] Hereinafter, an embodiment of the present invention will be described with reference to the accompanying drawings.

[0025] 1 is a functional block diagram showing an impact testing device according to a first embodiment of the present invention. The impact testing device 10 is for measuring the thickness of refractory material in an industrial furnace such as a blast furnace, and includes an abnormality detection device 1A, an impact device 2, a surface wave receiving device 3, and a control device 4.

[0026] [Impact Device 2] The impact device 2 has a drive unit 201 and an impact unit 202. The drive unit 201 drives the impact unit 202. The impact unit 202 may be, for example, a plastic hammer for work that does not output an excitation signal.

[0027] [Surface Wave Receiving Device 3] The surface wave receiving device 3 measures surface waves generated on the surface of the impact test object by impact with the impact device 2. The surface wave receiving device 3 has a first surface wave detecting unit 301 and a second surface wave detecting unit 302 that detect, at different positions, surface waves generated from the impact position of the impact test object by the impact device 2.

[0028] [Control device 4] The control device 4 controls the operations of the anomaly detection device 1A and the impact device 2. The control device 4 has an input unit 401, a speed setting unit 402 that sets the collision speed between the impact unit 202 and the impact test object, a trigger unit 403 that triggers the drive unit 201 to impact, a position setting unit 404 that sets the impact position of the impact device 2, and a function selection unit 405 that selects a function of the anomaly detection device 1A.

[0029] [Anomaly Detection Device 1A] The anomaly detection device 1A collects data of surface wave signals measured by the surface wave receiving device 3 and performs calculations on the collected data. The anomaly detection device 1A also detects an abnormality in the impact device 2 using an index extracted from a time change in the waveform of the surface wave signal measured by the surface wave receiving device 3. As shown in FIG. 1 , the anomaly detection device 1A includes a function setting unit 101, a normal state index acquisition unit 102, an anomaly detection processing unit 103, and a storage unit 104, and functions as a calculation device. The anomaly detection device 1A may be part of the calculation device.

[0030] 1, the anomaly detection device 1A is configured independently of the control device 4, but this is not limiting, and the anomaly detection device 1A and the control device 4 may be configured as a single device. For example, the anomaly detection device 1A and the control device 4 may be configured as a personal computer (PC) or the like.

[0031] (Function setting unit 101) The function setting unit 101 selects whether to execute processing by the normal state index acquisition unit 102 or by the abnormality detection processing unit 103, depending on the information received from the control device 4. Details of the normal state index acquisition unit 102 and the abnormality detection processing unit 103 will be described below.

[0032] (Normal State Index Acquisition Unit 102) The normal state index acquisition unit 102 acquires, as an index of the normal state of the impact device 2, an index extracted from the change over time in the waveform of the surface wave signal measured by the surface wave receiving device 3 when a normal impact device 2 impacts the impact test object at the impact speed specified by the speed setting unit 402. Specifically, the normal state index acquisition unit 102 acquires (calculates) a distance attenuation characteristic as the index from the maximum amplitude of the surface wave signal output by the surface wave receiving device 3. In one aspect, the normal state index acquisition unit 102 includes a surface wave maximum amplitude detection unit 1021 that detects the maximum amplitude of the surface waves output by the first surface wave detection unit 301 and the second surface wave detection unit 302, and a distance attenuation characteristic calculation unit 1022 that calculates the distance attenuation characteristic of the maximum amplitude of the surface waves. The normal state index acquiring unit 102 acquires the distance attenuation characteristics of the maximum amplitude of the surface wave when the impact test object is impacted by the impact device 2, from the maximum amplitude of the surface wave signals measured by the first surface wave detecting unit 301 and the second surface wave detecting unit 302. The acquired information is stored in the storage unit 104, which will be described later.

[0033] (Abnormality Detection Processing Unit 103) The abnormality detection processing unit 103 detects an abnormality in the impact device 2 based on an index of the normal state of the impact device 2 extracted from the time change in the waveform of the surface wave signal acquired by the normal state index acquisition unit 102. More specifically, the abnormality detection processing unit 103 receives as input the distance attenuation characteristics of the surface wave output from the normal state index acquisition unit 102 and stored in the memory unit 104, and the distance between the impact position of the impact device 2, the state of which is unknown and output by the control unit 4, and the installation position of the surface wave receiving device 3, and determines an abnormality in the impact device 2, as described below. In one aspect, the abnormality detection processing unit 103 includes a detection threshold setting unit 1031 that sets a detection threshold, a surface wave amplitude comparison unit 1032 that compares surface waves, and an abnormality determination unit 1033 that determines an abnormality in the impact device 2.

[0034] (Acquisition of Distance Attenuation Characteristics of Surface Waves in Normal State Index Acquisition Unit 102) Acquisition of distance attenuation characteristics of surface waves in the normal state index acquisition unit 102 will be described with reference to FIGS. 2 to 4. FIG. 2 is a diagram showing an example of the positional relationship between an impact position 501 of a normal impact device 2 and the first surface wave detection unit 301 and the second surface wave detection unit 302 in the surface wave receiving device 3. In the example shown in FIG. 2, the distance between the impact position 501 and the detection position of the first surface wave detection unit 301 is a first distance d1, and the distance between the impact position 501 and the detection position of the second surface wave detection unit 302 is a second distance d2. When the impact device 2 impacts the impact test object, a surface wave is generated on the surface of the impact test object. FIG. 3(a) is a diagram showing an example of a time signal of the surface wave measured by the first surface wave detection unit 301. FIG. 3(b) is a diagram showing an example of a time signal of the surface wave measured by the second surface wave detection unit 302. 2 and 3 , the second distance d2 is longer than the first distance d1, and the amplitude of the surface waves detected by the first surface wave detection unit 301 is greater than the amplitude of the surface waves detected by the second surface wave detection unit 302. Fig. 4 is a diagram showing an example of a relationship between the distance between the impact position 501 and the surface wave detection unit, and the amplitude of the surface waves. The distance attenuation characteristic calculation unit 1022 calculates the distance attenuation characteristic of the maximum amplitude of the surface waves generated when the impact test object is impacted by a normal impact device 2, from the first distance d1, the maximum amplitude a1 of the surface waves detected by the first surface wave detection unit 301, the second distance d2, and the maximum amplitude a2 of the surface waves detected by the second surface wave detection unit 302. Examples of distance attenuation characteristics to be calculated include the coefficient (slope) of the curve (which is inversely proportional to the root of the distance) connecting points (d1, a1) and (d2, a2) in Figure 4, and a database that records the relationship between amplitude and distance detected by surface wave detectors installed at two or more points at different distances.

[0035] (Abnormality Detection of Impact Device 2 by Abnormality Detection Processing Unit 103) A method of abnormality detection of the impact device 2 by the abnormality detection processing unit 103 will be described with reference to FIGS. 5 to 7. FIG. 5 is a diagram showing an example of the positional relationship between the impact position 601 of the impact device 2, the state of which is unknown and for which abnormality detection is to be performed, and the first surface wave detection unit 301. In the example shown in FIG. 5, the distance between the impact position 601 and the first surface wave detection unit 301 is a third distance d3. FIG. 6 is a diagram showing an example of the relationship between the distance attenuation characteristic output by the distance attenuation characteristic calculation unit 1022, the third distance d3, and a predicted value (surface wave amplitude estimation value) of the maximum amplitude a3 of the surface wave measured by the first surface wave detection unit 301. As shown in FIG. 6, when the distance attenuation characteristic and the third distance d3 are obtained, the detection threshold setting unit 1031 predicts the value of the maximum amplitude a3 of the surface wave generated by a normal impact device based on the distance attenuation characteristic and sets this as the detection threshold. The distance between the impact position 601 and the second surface wave detection unit 302 may be used as the third distance d3. Fig. 7 is a diagram showing an example of a time signal of a surface wave output by the first surface wave detection unit 301 when an impact test object is impacted at a collision velocity v using the impact unit 202 of the impact device 2 that has softened due to deterioration (deformation or damage). As shown in Fig. 7, when the impact unit 202 of the impact device 2 softens, the excitation force decreases and the amplitude of the generated surface wave also decreases. The detection threshold setting unit 1031 predicts the value of the maximum amplitude a3 of the surface wave and sets this value as a threshold. The surface wave amplitude comparison unit 1032 compares the maximum amplitude a of the surface wave measured when the deteriorated impact device 2 impacts the impact test object with the maximum amplitude a3 set as the threshold. The abnormality determination unit 1033 determines an abnormality in the impact device 2 using the following equation (1):

[0036] Here, R(v)=0 indicates an abnormality, and R(v)=1 indicates a normality.

[0037] (Memory unit 104) The memory unit 104 stores the distance attenuation characteristics of the maximum amplitude of the surface wave when the impact test object is struck by the impact device 2 in a normal state, which are acquired (detected) by the normal state indicator acquisition unit 102. At this time, this distance attenuation characteristic is stored in association with the impact speed. The memory unit 104 also stores various other data used in processing. The memory unit 104 can be configured with a storage device such as a RAM (Random Access Memory) or a hard disk.

[0038] [Control Processing by Anomaly Detection Device 1A] Next, the control processing by the anomaly detection device 1A will be described with reference to Fig. 8. Fig. 8 is a flowchart showing an example of the flow of the control processing by the anomaly detection device 1A.

[0039] First, in step S100, the function setting unit 101 of the abnormality detection device 1A sets the abnormality detection device 1A to a normal state index acquisition state.

[0040] Next, in step S101, the normal state index acquisition unit 102 of the abnormality detection device 1A receives the surface wave time signal from the surface wave receiving device 3, the surface wave maximum amplitude detection unit 1021 detects the maximum amplitude of the surface wave, and the distance attenuation characteristic calculation unit 1022 calculates the distance attenuation characteristic.

[0041] Next, in step S102, the function setting unit 101 of the anomaly detection device 1A sets the anomaly detection device 1A to an anomaly detection state.

[0042] Next, in step S103, the abnormality detection processing unit 103 of the abnormality detection device 1A receives the time signal of the surface wave generated by the impact device 2 and compares the maximum amplitude of the surface wave at that time with the predicted maximum amplitude of the surface wave.

[0043] In step S104, the abnormality determination unit 1033 determines whether the maximum amplitude of the surface wave upon impact is less than the predicted value. If the maximum amplitude of the surface wave upon impact is less than the predicted value (step 104: YES), the control process proceeds to step S105. If the maximum amplitude is equal to or greater than the predicted value (step 104: NO), the control process proceeds to step S106.

[0044] In step S105, the abnormality determination unit 1033 of the abnormality detection device 1A outputs an abnormality.

[0045] In step S106, the anomaly detection device 1A determines whether to end the display process. If the anomaly detection process is to be continued without ending (step S106: NO), the anomaly detection device 1A returns to step S103 and repeats the anomaly detection process described above. If the anomaly detection process is to be ended (step S106: YES), the anomaly detection device 1A ends all processes.

[0046] In addition, when index acquisition and abnormality detection are always performed in pairs, it is not necessary to switch between the normal state index acquisition state and the abnormality detection state (steps S100 and S102).

[0047] As described above, the abnormality detection device of this embodiment evaluates the impact device using the surface waves generated by the impact device, and therefore can easily detect an abnormal state of the impact device that does not output a vibration signal.

[0048] <Second Embodiment> Fig. 9 is a functional block diagram showing an impact testing device according to a second embodiment of the present invention. In this embodiment, an impact testing device 10' has an abnormality detection device 1B, an impact device 2, a surface wave receiving device 3, and a control device 4. The impact device 2, the surface wave receiving device 3, and the control device 4 are configured in the same manner as in the first embodiment. The abnormality detection device 1B further includes an abnormality prediction unit 105 in addition to the configuration of the abnormality detection device 1A of the first embodiment.

[0049] (Method for predicting abnormality of impact device 2 using abnormality prediction unit 105) The method for predicting abnormality of impact device 2 in abnormality prediction unit 105 will be described with reference to Fig. 10. Fig. 10 is a diagram showing an example of the time transition of the maximum amplitude of the surface wave detected by surface wave maximum amplitude detection unit 1021 when the impact test object is hit multiple times at a collision speed v using the impact unit 202 of the impact device 2. In Fig. 10, ｍａｘ is the maximum value of the maximum amplitude of the surface wave in the normal state, a ｍｉｎ is the minimum value of the maximum amplitude of the surface wave in a normal state. ｎThe maximum amplitude of the surface wave up to the time of use is the actual measured value. Ｌ The maximum amplitude of the surface wave at is a predicted value. Ｌ The predicted value of the maximum amplitude of the surface wave in the normal state is the minimum value a ｍｉｎ At this time, the number of times of use is N Ｌ is the time when the abnormality occurs.

[0050] The predicted value of the maximum amplitude of the surface wave at the number of times of use n is ｎ The maximum value of the maximum amplitude of the surface wave at the number of uses n is calculated from the maximum amplitude of the surface wave up to the number of uses n. ｈ (n), and the maximum value of the maximum amplitude of the surface wave in the normal state is a ｍａｎ Then, the prediction formula for the maximum amplitude of the surface wave at the number of uses n is a function f(n) that minimizes the following formula (2):

[0051] Here, N １ is the maximum amplitude of the surface wave ｍａｘ It no longer indicates the number of uses.

[0052] Also, the inverse function of the function f(n) is f －１ (n), the predicted value of the minimum value of the maximum amplitude of the surface wave is a ｍｉｎ Number of uses less than N Ｌ is calculated by the following formula (3).

[0053] Here, ceil(·) is the smallest integer equal to or greater than the real number in parentheses.

[0054] <Example of Use of Anomaly Detection Device> FIG. 11 is a schematic diagram showing an example of a usage mode of the anomaly detection device 1A in the impact test device 10 according to the first embodiment. The impact test device 10 includes the anomaly detection device 1A, an impact device 2, a surface wave receiving device 3, and a control device 4. The anomaly detection device 1A is a device that detects an abnormality in the impact device, which serves as an input signal source, when measuring the thickness of the refractory in a furnace having a furnace wall composed of a steel shell and a refractory. The refractory thickness is measured, for example, by an impact acoustic wave resonance method. Examples of furnaces having furnace walls composed of a steel shell and a refractory include industrial furnaces such as blast furnaces, gasification melting furnaces, and RH furnaces.

[0055] 11 shows how the steel shell Z is struck by the striking device 2 based on the impact speed set by the control device 4, the surface waves generated during the striking are measured by the surface wave receiving device 3, and received by the abnormality detection device 1A, which then compares the maximum amplitude of the surface wave during the striking with the predicted maximum amplitude of the surface wave to determine whether an abnormality has occurred. Fig. 12 is a diagram showing an example of the surface wave measured during striking when measuring the thickness of refractory material by the impact acoustic wave resonance method.

[0056] In the example shown in FIG. 11 , the anomaly detection device 1A, the impacting device 2, the surface wave receiving device 3, and the control device 4 operate as follows. First, the control device 4 transmits a set impact speed to the impacting device 2. The impacting device 2 impacts the surface of the steel shell Z at the set impact speed. The surface wave receiving device 3 receives surface waves as shown in FIG. 12 generated by the impact of the impacting device 2. The surface waves received by the surface wave receiving device 3 are transmitted to the anomaly detection device 1A, which analyzes the surface waves to detect an anomaly in the impacting device 2. The surface wave receiving device 3 may also serve as a signal receiving device for measuring the thickness of the refractory using the impact acoustic wave resonance method, and the anomaly detection device 1A may also serve as a measuring device for measuring the thickness of the refractory using the impact acoustic wave resonance method. In the example shown in FIG. 12 , the component up to time t0 is considered to be a surface wave component and used to detect an anomaly in the impacting device, and the component after time t0 is considered to be a reflection component from the refractory and used to measure the thickness of the refractory.

[0057] In this embodiment, we will explain the case where the abnormality detection device 1A and the control device 4 are performed on different terminals, but this embodiment is not limited to this, and these processes may be performed on the same terminal, or some of these processes may be performed on a server.

[0058] According to the present invention, it is possible to provide an impact testing device and an impact testing method that can detect an abnormality in an impact device, as well as an impact device abnormality detection device and a refractory thickness measurement method.

[0059] 1A, 1B Abnormality detection device (arithmetic device) 2 Impact device 3 Surface wave receiving device 4 Control device 101 Function setting unit 102 Normal state index acquisition unit 103 Abnormality detection processing unit 104 Storage unit 105 Abnormality prediction unit 201 Drive unit 202 Impact unit 301 First surface wave detection unit 302 Second surface wave detection unit 1021 Surface wave maximum amplitude detection unit 1022 Distance attenuation characteristic calculation unit 1031 Detection threshold setting unit 1032 Surface wave amplitude comparison unit 1033 Abnormality determination unit

Claims

1. An impact testing apparatus for performing an impact test on an impact test object, comprising: an impact device that vibrates the impact test object by impact; a surface wave receiving device that measures surface wave signals generated on the surface of the impact test object by the vibration caused by the impact of the impact device; and a computing device that collects data on the surface wave signals measured by the surface wave receiving device and calculates the collected data, wherein the computing device detects an abnormality in the impact device based on an indicator of the normal state of the impact device extracted from the time change in the waveform of the surface wave signal measured by the surface wave receiving device.

2. The impact testing device according to claim 1, wherein the calculation device uses, as the index, the distance attenuation characteristics of the maximum amplitude of the surface wave measured by the surface wave receiving device.

3. The surface wave receiving device has a first surface wave detecting unit that detects surface waves at a first detecting position that is a first distance from the impact position of the impact device of the impact test object, and a second surface wave detecting unit that detects surface waves at a second detecting position that is a second distance from the impact position, and the computing device has a normal state index acquiring unit that detects the maximum amplitude of surface waves measured by the first surface wave detecting unit and the second surface wave detecting unit when the impact device hits the impact test object at a predetermined impact speed in a normal state, and acquires the distance attenuation characteristic calculated from the maximum amplitude of the surface waves and the first and second distances as an index of the normal state, and a memory unit that stores the distance attenuation characteristic in association with a set impact speed between the impact device of the impact device and the impact test object. an abnormality detection unit that sets a threshold value for a maximum amplitude of the surface wave generated by the impact device in a normal state that is predicted from the distance attenuation characteristics at a third distance between an impact position when the impact test object is impacted at the impact speed by the impact device in an unknown state and the first detection position or the second detection position, and compares the maximum amplitude of the surface wave generated by the impact device in an unknown state with the threshold value to detect an abnormality.

4. The impact testing device according to claim 3, wherein the computing device further comprises an abnormality prediction unit that calculates the time when an abnormality will occur in the impact device based on the time progression of the maximum amplitude of the surface wave when the impact device, the state of which is unknown, is caused to impact the impact test object at the collision speed.

5. An impact testing device as described in claim 4, wherein the arithmetic device further has a function setting section that selects whether to execute processing by the normal state index acquisition section or by the abnormality detection section.

6. An impact test device according to any one of claims 1 to 5, wherein the subject of the impact test has a refractory material, and the thickness of the refractory material is measured by vibrating the subject of the impact test.

7. The impact testing device according to claim 6, wherein the thickness of the refractory material is measured by an impact elastic resonant wave resonance method.

8. An impact test method for conducting an impact test on an impact test object, comprising: a step of vibrating the impact test object by impacting with an impact device; a step of measuring with a surface wave receiving device a surface wave signal generated on the surface of the impact test object by the vibration caused by the impact of the impact device; a step of obtaining and storing an index of a normal state extracted from the time change in the waveform of the surface wave signal measured by the surface wave receiving device; and a step of detecting an abnormality in the impact device based on the index.

9. An abnormality detection device for detecting an abnormality in an impact test device that performs an impact test by vibrating an impact test object by impacting it with an impact device and measuring a surface wave signal generated on the surface of the impact test object by the vibration caused by the impact of the impact device with a surface wave receiving device, the abnormality detection device collecting data on the surface wave signal measured by the surface wave receiving device, calculating the collected data, and detecting an abnormality in the impact device based on an index of normal state extracted from the change over time in the waveform of the surface wave signal measured by the surface wave receiving device.

10. The anomaly detection device according to claim 9, wherein the index is the distance attenuation characteristic of the maximum amplitude of the surface wave measured by the surface wave receiving device.

11. The surface wave receiving device has a first surface wave detecting unit that detects surface waves at a first detecting position that is a first distance from the impact position of the impact device of the impact test object, and a second surface wave detecting unit that detects surface waves at a second detecting position that is a second distance from the impact position; a normal state index acquiring unit that detects the maximum amplitude of surface waves measured by the first surface wave detecting unit and the second surface wave detecting unit when the impact device hits the impact test object at a predetermined impact speed in a normal state, and acquires the distance attenuation characteristic calculated from the maximum amplitude of the surface wave and the first and second distances as an index of the normal state; and a storage unit that stores the distance attenuation characteristic in association with the set impact speed between the impact device of the impact device and the impact test object. an anomaly detection unit that sets a threshold value for a maximum amplitude of the surface wave generated by the impact device in a normal state that is predicted from the distance attenuation characteristics at a third distance between an impact position when the impact test object is impacted at the impact speed by the impact device in an unknown state and the first detection position or the second detection position, and compares the maximum amplitude of the surface wave generated by the impact device in an unknown state with the threshold value to detect an abnormality.

12. An abnormality detection device as described in claim 11, further comprising an abnormality prediction unit that calculates the time when an abnormality will occur in the impact device based on the time progression of the maximum amplitude of the surface wave when the impact device, the state of which is unknown, is caused to impact the impact test object at the collision speed.

13. The abnormality detection device according to claim 12, further comprising a function setting unit that selects whether to execute processing by the normal state index acquisition unit or processing by the abnormality detection unit.

14. A method for measuring the thickness of a refractory material, comprising: vibrating a refractory material to be subjected to an impact test using the impact test device according to any one of claims 1 to 5; and measuring the thickness of the refractory material.

15. A method for measuring the thickness of a refractory material according to claim 14, wherein the thickness of the refractory material is measured by an impact elastic wave resonance method.

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