Automatic analysis device and method for determining LED light source in automatic analysis device

Abstract

The present invention comprises a reaction cell 108 that accommodates a reaction solution 107 to be analyzed, an LED chip 402 that irradiates the reaction solution 107 within the reaction cell 108 with light, a spectroscope 302 that measures the amount of light from the LED chip 402 that has passed through the reaction solution 107, and a control unit 201. A processing unit 203 determines an abnormality in an optical system component including the LED chip 402 from the relationship between the light amount measured by the spectroscope 302 and the LED total energization time obtained by integrating the lighting time of the LED chip 402. This makes it possible to provide an automatic analysis device capable of more appropriately discerning the state of an LED for each device, and a method for determining an LED light source in the automatic analysis device.

Description

Automatic analyzer and method for determining LED light source in automatic analyzer

[0001] The present invention relates to an automatic analyzer and a method for determining an LED light source in the automatic analyzer.

[0002] As a method for determining the lifespan of an LED light source, Patent Document 1 discloses a technology in which "the lighting time of an LED is accumulated while it is on, and when the accumulated lighting time reaches a preset lifespan, a notification is given that the LED has reached the end of its lifespan."

[0003] Japanese Patent Application Publication No. 10-39836

[0004] 2. Description of the Related Art Automated analyzers are known that analyze the amounts of components such as proteins, sugars, and lipids contained in biological samples such as serum and urine.

[0005] In automated analyzers, biological samples and reagents are reacted in a reaction vessel, and the resulting color change of the reaction solution is measured. To measure the color change, light emitted from a light source is irradiated onto the reaction solution, and the amount of light transmitted through the reaction solution is measured using a light-receiving element to calculate absorbance, and the amount of component is determined from the relationship between absorbance and concentration.

[0006] The light source used in an automated analyzer should have a wide emission spectrum to accommodate a large number of test items, and should be able to stably emit a certain amount of light at the measurement wavelength to enable highly accurate absorbance measurements. For this reason, xenon lamps, halogen lamps, etc. have traditionally been used. In recent years, light-emitting diodes (LEDs), which are expected to have a long lifespan, have also come into use.

[0007] The LEDs used as light sources in automated analyzers are consumables with a limited lifespan and require periodic replacement. In many cases, the replacement period for LED light sources is uniformly determined regardless of the operating environment or individual differences between LED light sources. For example, if the LED replacement period is determined to be when the light intensity falls below a threshold, e.g., 70% of the initial level, there is a problem in that it is not possible to take into account the effects of changes in light intensity due to the condition of the automated analyzer.

[0008] Furthermore, if the lifespan of the LED light source is set in advance instead of the light intensity, there is a possibility that replacement will be recommended even when there is no abnormality in performance and the LED is still in a usable condition. Similarly, there is a risk that the LED will continue to be used without being recommended to be replaced even when it has reached the end of its performance lifespan, which could result in incorrect analysis results being output, so there is room for improvement.

[0009] That is, it is desired to appropriately determine the state, abnormality, and lifespan of each LED light source regardless of the device condition.

[0010] The technology disclosed in Patent Document 1 is a method for monitoring the lifespan of an LED based solely on the accumulated lighting time of the LED, and does not take into account the fact that the degree of wear of an LED light source varies from one LED to another, so there is room for improvement.

[0011] An object of the present invention is to provide an automatic analyzer that can more appropriately determine the state of an LED for each device, and a method for determining an LED light source in an automatic analyzer.

[0012] The present invention includes multiple means for solving the above-mentioned problems, and one example thereof includes a reaction vessel that contains a liquid to be analyzed, an LED light source that irradiates light onto the liquid in the reaction vessel, a measurement unit that measures the amount of light from the LED light source that has passed through the liquid, and a processing unit that processes information, and the processing unit determines whether there is an abnormality in an optical system component including the LED light source based on the relationship between the amount of light measured by the measurement unit and the total LED power-on time, which is the sum of the lighting times of the LED light source.

[0013] According to the present invention, the state of the LED can be determined more appropriately for each device. Problems, configurations, and effects other than those described above will become apparent from the following description of the embodiments.

[0014] 1 is a schematic diagram showing an example of the overall configuration of an automatic analyzer of an embodiment; FIG. 2 is a diagram showing an example of the configuration of an absorbance measurement unit that measures absorbance in an automatic analyzer of an embodiment; FIG. 3 is a diagram showing an example of the configuration of an LED light source in an automatic analyzer of an embodiment; FIG. 4 is a diagram showing an example of the relationship between total power-on time T and blank light intensity; FIG. 5 is a flowchart showing a flow of isolating the cause of a first abnormality using LED substrate temperature data in an automatic analyzer of an embodiment; FIG. 6 is a diagram showing an example of the relationship between the LED substrate temperature and light intensity immediately after the LED light source starts emitting light; FIG. 7 is a diagram showing an example of the relationship between total power-on time T and the amount of change in light intensity per unit temperature; FIG. 8 is a flowchart showing an abnormality determination flow of an LED light source using the amount of change in light intensity per unit temperature in an automatic analyzer of an embodiment; FIG. 9 is a flowchart showing an example of a method for acquiring the amount of change in light intensity per unit temperature in an automatic analyzer of an embodiment; FIG. 10 is a diagram showing an example of the relationship between total power-on time T and the amount of change in light intensity per unit temperature; and FIG. 11 is a diagram showing an LED light source status screen in an automatic analyzer of an embodiment.

[0015] An embodiment of the automatic analyzer of the present invention and a method for determining an LED light source in the automatic analyzer will be described with reference to Figures 1 to 11. In the drawings used in this specification, identical or corresponding components are designated by the same or similar reference numerals, and repeated description of these components may be omitted.

[0016] First, an example of the overall configuration of an automatic analyzer will be described with reference to Fig. 1. Fig. 1 is a schematic diagram showing an example of the overall configuration of an automatic analyzer according to an embodiment.

[0017] The automated analyzer 100 shown in FIG. 1 includes a sample line 103, a reagent disk 106, a reaction disk 109, a sample dispensing mechanism 110 and a reagent dispensing mechanism 111 that move samples and reagents between these disks, and a control system that controls the operation of these mechanisms.

[0018] A sample cup 102, which is a container for holding a sample 101, is arranged on the sample line 103. The sample 101 is, for example, blood or urine. A plurality of reagent bottles 105, which are containers for holding a reagent 104, are arranged on the circumference of a reagent disk 106.

[0019] A plurality of reaction cells 108, which are containers for containing a reaction solution 107 to be analyzed, which is a mixture of a sample 101 and a reagent 104, are arranged on the circumference of the reaction disk 109. The plurality of reaction cells 108 are each assigned a cell number such as 1, 2, 3, ....

[0020] The sample dispensing mechanism 110 is a mechanism used to transfer a fixed amount of sample 101 from the sample cup 102 to the reaction cell 108. The sample dispensing mechanism 110 is composed of, for example, a nozzle that dispenses or aspirates a solution, a robot that positions and transports the nozzle to a predetermined position, a pump that dispenses or aspirates a solution from the nozzle, and a flow path that connects the nozzle and the pump.

[0021] The reagent dispensing mechanism 111 is a mechanism used when transferring a fixed amount of reagent 104 from the reagent bottle 105 to the reaction cell 108. The reagent dispensing mechanism 111 also includes, for example, a nozzle that dispenses or aspirates a solution, a robot that positions and transports the nozzle to a predetermined position, a pump that dispenses or aspirates a solution from the nozzle, and a flow path that connects the nozzle and the pump.

[0022] The solution stirring unit 112 is a mechanism that stirs and mixes the sample 101 and the reagent 104 in the reaction cell 108. The washing unit 114 is a mechanism that discharges the reaction solution 107 from the reaction cell 108 after the analysis process has been completed, and washes the reaction cell 108 by discharging and sucking detergent and water. After the washing process is completed, the next sample 101 is dispensed into the reaction cell 108 from the sample dispensing mechanism 110, and new reagent 104 is dispensed from the reagent dispensing mechanism 111, and these are used for another reaction process.

[0023] In the reaction disk 109, the reaction cells 108 are immersed in a constant temperature fluid 115 in a constant temperature bath whose temperature and flow rate are controlled. Therefore, the reaction cells 108 and the reaction solutions 107 therein are kept at a constant temperature by the control unit 201 even while being moved by the reaction disk 109. The constant temperature fluid 115 is, for example, water or air.

[0024] The absorbance measurement unit 113 is a mechanism for performing absorbance analysis in the automatic analyzer 100 , and is disposed on a part of the circumference of the reaction disk 109 .

[0025] The control system of the automatic analyzer 100 is composed of a control unit 201 that controls the operation of each of the above-mentioned mechanisms within the automatic analyzer 100, a light intensity measurement circuit 202 that measures the light intensity of the reaction solution 107 to be analyzed, a processing unit 203 that processes the measurement data measured by the light intensity measurement circuit 202, a memory unit 204 that stores the processed data, and an input unit 205 and a display unit 206 that serve as interfaces with the processing unit 203.

[0026] The processing unit 203 calculates the component concentrations of the sample 101 based on the light intensity data measured by the light intensity measurement circuit 202. The analysis results of the component concentrations of the sample 101 calculated by the processing unit 203 are output to the display unit 206. The light intensity data and analysis results are stored in the storage unit 204. The data stored in the storage unit 204 can be shared with the outside via an information network.

[0027] In this embodiment, the processing unit 203 determines an abnormality in the optical system components including the LED chip 402 based on the relationship between the light amount measured by the spectroscope 302 and the total LED power-on time obtained by integrating the lighting time of the LED chip 402 (see FIG. 3). Details of this will be described later.

[0028] The control unit 201 , light quantity measurement circuit 202 , processing unit 203 , storage unit 204 , input unit 205 , and display unit 206 are configured by a computer or the like, and are connected to each mechanism within the automatic analyzer 100 .

[0029] The control system controls the operation of each device based on various programs stored in a storage device. The control processes for the operations executed by the control system may be integrated into a single program, or may be separated into multiple programs, or a combination of these. Some or all of the programs may be implemented using dedicated hardware or may be modularized. Furthermore, these programs can be updated online or offline.

[0030] The input unit 205 and the display unit 206 input and output data to and from the processing unit 203. The input unit 205 is an information input device such as a keyboard, a touch panel, or a numeric keypad. The display unit 206 is an information output device, such as a display, for outputting the analysis results of the automatic analyzer 100.

[0031] The above is the overall configuration of the automatic analyzer 100 of this embodiment.

[0032] The configuration of the automatic analyzer 100 is not limited to a biochemical analyzer that performs analysis of biochemical analysis items as shown in Fig. 1, but may be an analyzer that performs analysis of other analysis items, such as an immunoanalyzer that performs analysis of immune analysis items. The biochemical analyzer is also not limited to the form shown in Fig. 1, but may be one that is separately equipped with an analyzer that measures other analysis items, such as electrolytes.

[0033] Furthermore, the automated analyzer 100 is not limited to a configuration having a single analysis module as shown in FIG. 1, but may be configured to have two or more analysis modules capable of measuring various identical or different analysis items and preprocessing modules that perform preprocessing and postprocessing connected by a transport device.

[0034] (Absorbance Measuring Unit 113) FIG. 2 is a diagram showing an example of the configuration of the absorbance measuring unit 113 that measures absorbance in the automatic analyzer 100. As shown in FIG.

[0035] The absorbance measurement unit 113 of the automatic analyzer 100 of this embodiment is mainly composed of an LED unit 301, a spectroscope 302, a light source-side slit 304, a condenser lens 305, and a spectroscope-side slit 306. The absorbance measurement unit 113 uses the LED unit 301 shown in FIG. 2 as a light source for absorbance measurement.

[0036] In the LED unit 301, the irradiation light generated from the LED chip 402 is emitted along an optical axis 303, and is collected by a collecting lens 305 to be irradiated onto the reaction solution 107 in the reaction cell 108. In addition, a light source side slit 304 is arranged to make the light amount distribution within the irradiation surface of the light uniform, and limits the width of the light emitted from the LED unit 301.

[0037] The light transmitted through the reaction solution 107 in the reaction cell 108 is dispersed by a diffraction grating 3021 in the spectroscope 302 and received by a detector array 3022 equipped with a large number of light receivers. The spectroscope 302 is an optical device that measures the amount of light from the LED chip 402 that has passed through the reaction solution 107.

[0038] The detector array 3022 is an example of a photodetector. At this time, light that has not passed through the reaction solution 107 becomes noise, so a spectroscope-side slit 306 is provided to prevent such stray light from entering the spectroscope 302.

[0039] The detector array 3022 receives light at a plurality of measurement wavelengths, such as 340 nm, 376 nm, 415 nm, 450 nm, 480 nm, 505 nm, 546 nm, 570 nm, 600 nm, 660 nm, 700 nm, and 800 nm. The light received by the detector array 3022 is converted into an electrical signal (light-receiving signal) and stored in the memory unit 204 as measurement data via the light intensity measurement circuit 202.

[0040] (LED Unit 301) FIG. 3 is a diagram showing an example of the configuration of the LED unit 301. As shown in FIG.

[0041] As shown in FIG. 3, the LED unit 301 is mainly composed of an LED mounting substrate 401 , an LED chip 402 , a temperature sensor 403 , an optical filter 404 , and a temperature adjustment unit 405 .

[0042] An LED chip 402 that irradiates light onto the reaction solution 107 in the reaction cell 108 and a temperature sensor 403 that measures the temperature of the LED mounting substrate 401 are mounted on the LED mounting substrate 401. An optical filter 404 adjusts the intensity of light of a wavelength that is detected by the detector array 3022, out of the light irradiated from the LED chip 402. A temperature adjustment unit 405 controls the temperatures of the LED mounting substrate 401 and the LED chip 402. The set temperature of the temperature adjustment unit 405 is, for example, 37°C. From the viewpoint of thermal conductivity, the LED mounting substrate 401 is made of a material whose base material is a metal such as aluminum or copper.

[0043] The LED mounting substrate 401 supplies power to the LED chip 402, which causes the LED chip 402 to emit light. The heat generated by the light emitted by the LED chip 402 is balanced by the control of the temperature adjustment unit 405. As a result, the temperature inside the LED unit 301 rises as soon as light emission begins, and stabilizes after a certain period of time has passed. The temperature sensor 403 acquires the temperature of the LED mounting substrate 401.

[0044] (Example of Control of Automated Analyzer 100 by Control Unit 201) The analytical operation for measuring the amounts of components such as proteins, sugars, and lipids contained in the sample 101 is performed, for example, according to the following procedure.

[0045] First, the user places the sample cup 102 filled with the sample 101 on the sample line 103. Next, the user issues an instruction to start analysis to the automatic analyzer 100 via the input unit 205. The control unit 201 instructs the cleaning unit 114 to clean the reaction cell 108. At this time, the amount of light transmitted through the reaction cell 108 containing water (hereinafter referred to as the "blank light amount") is acquired and stored in the memory unit 204.

[0046] Next, the control unit 201 instructs the sample dispensing mechanism 110 to dispense a fixed amount of the sample 101 in the sample cup 102 into the reaction cell 108. Subsequently, the control unit 201 instructs the reagent dispensing mechanism 111 to dispense a fixed amount of the reagent 104 in the reagent bottle 105 into the reaction cell 108. When dispensing the sample 101 and the reagent 104, the control unit 201 instructs the drive units of each disk to rotate the reagent disk 106 and the reaction disk 109. At this time, the reagent bottle 105 and the reaction cell 108 are positioned at predetermined dispensing positions according to the drive timing of the corresponding dispensing mechanism.

[0047] The control unit 201 instructs the solution stirring unit 112 to stir the sample 101 and the reagent 104 dispensed into the reaction cell 108 , thereby generating a reaction solution 107 .

[0048] As the reaction disk 109 rotates, the reaction cell 108 containing the reaction solution 107 passes through a measurement position where an absorbance measurement unit 113 is disposed. Every time the reaction cell 108 passes through the measurement position, the amount of light transmitted through the reaction solution 107 is acquired via the absorbance measurement unit 113. The processing unit 203 sequentially outputs data obtained by subtracting the amount of blank light from the amount of light transmitted through the reaction solution 107, and stores the data as reaction process data.

[0049] During the accumulation of this reaction process data, if necessary, another reagent 104 is additionally dispensed into the reaction cell 108 by the reagent dispensing mechanism 111, stirred by the solution stirring unit 112, and measured for a certain period of time. As a result, the reaction process data acquired at certain time intervals is sent to the processing unit 203 and stored in the memory unit 204.

[0050] After the reaction process data has been acquired, the control unit 201 instructs each mechanism to perform an analysis termination operation. In the analysis termination operation, the washing unit 114 washes the reaction cell 108, and after washing of the reaction cell 108 is complete, each mechanism returns to its initial position before the start of the analysis operation. Thereafter, the operation of the automatic analyzer 100 stops, and the analysis operation ends.

[0051] (Storage of Blank Light Amount Data) In this embodiment, data on the blank light amount in a specific reaction cell 108 is stored in the storage unit 204 for each cell number and measurement wavelength, and is accumulated as history data.

[0052] Furthermore, data on the temperature of the LED mounting substrate 401 when the blank light amount is acquired (hereinafter referred to as "LED substrate temperature") is stored in the storage unit 204 and accumulated as history data.

[0053] Furthermore, the memory unit 204 records the cumulative lighting time of the LED unit 301, starting from the time when the LED unit 301 first started to light up after the LED unit 301 was installed in the automatic analyzer 100, as the total power-on time T. For example, if the LED unit 301 is turned on for five hours on the first day after it is installed in the automatic analyzer 100 and then turned off, on the second day it is turned on for five hours and then turned off, and on the third day it is turned on for ten hours and then turned off, then the total power-on time T on the third day will be 20 hours. In this way, the memory unit 204 stores the cumulative time since the LED unit 301 was turned on as the total power-on time T.

[0054] The processing unit 203 monitors the state of the LED unit 301 including the LED chip 402 based on the data of the total power-on time T and the blank light amount.

[0055] All acquired data on blank light intensity can be stored in the storage unit 204, or only data on a specific cell number and / or specific wavelength can be stored. Also, the storage unit 204 can store data on blank light intensity acquired under all circumstances, or only data acquired at a specific timing, for example, the first time in a day, can be stored.

[0056] Next, details of the processing of the automatic analyzer 100 according to this embodiment and an example of a method for determining the LED unit 301 will be described with reference to FIGS. 4 to 11. FIG.

[0057] (First Abnormality Judgment: Abnormality Judgment of Optical Component) Fig. 4 is a diagram showing the relationship between the total power-on time T and the blank light intensity. As the total power-on time T increases, the blank light intensity decreases. It is generally known that the decrease in the blank light intensity with the increase in the total power-on time T is linear up to a certain total power-on time T (for example, 2000 hours), and then decreases non-linearly thereafter.

[0058] The processing unit 203 calculates an approximation curve with the total power-on time T as the horizontal axis and the blank light amount as the vertical axis, based on past history data of the total power-on time T and the blank light amount stored in the storage unit 204. The processing unit 203 also calculates a first A reference curve indicating an upper reference value of a predetermined certain deviation degree for the approximation curve, and a first B reference curve indicating a lower reference value of a predetermined certain deviation degree for the approximation curve.

[0059] When the processing unit 203 newly measures the blank light intensity, if the blank light intensity for the total current-flow time T at the time of measurement is greater than the upper limit value indicated by the first A reference curve or less than the lower limit value indicated by the first B reference curve, the processing unit 203 determines that the blank light intensity is outside the blank light intensity reference value.

[0060] If the blank light intensity is outside the reference value, the processing unit 203 determines that there is a first abnormality, which is an abnormality in an optical component such as the reaction cell 108, the absorbance measurement unit 113, the LED unit 301, or the constant temperature fluid 115, or an abnormality in the device condition. The processing unit 203 can output a message of the first abnormality to the display unit 206 to notify the user.

[0061] The blank light intensity data can be obtained before dispensing the sample 101 immediately after the start of the analysis operation, or can be obtained when the automatic analyzer 100 is in a status other than analysis operation, such as during maintenance performed at the user's discretion.

[0062] Furthermore, when the processing unit 203 determines that the blank light intensity for the newly measured total current flow time T is below the upper limit indicated by the first A reference curve and above the lower limit indicated by the first B reference curve, it determines that the blank light intensity is within the blank light intensity reference value, and stores the blank light intensity data in the memory unit 204 as historical data that can be used for the above-mentioned approximation curve.

[0063] Furthermore, if the blank light intensity during the newly measured total power-on time T falls outside the blank light intensity reference value, the blank light intensity data is stored in the memory unit 204 as history data that cannot be used for the approximation curve.

[0064] (Method of calculating reference value used in first abnormality determination) The reference value used in the above-described first abnormality determination can be calculated based on history data of multiple automatic analyzers 100 shared via an information network. Of course, it is possible to determine the reference value from a single automatic analyzer 100, but it is preferable to use data from multiple automatic analyzers 100 because a large amount of data can be obtained.

[0065] For example, the processing unit 203 may calculate the blank light intensity P ０ and the blank light amount P at a predetermined total current-carrying time T (for example, 2000 hours) ２０００ Collect data on:

[0066] The processing unit 203 may calculate, for example, the collected blank light amount P ０ Standard deviation SD of the data group ０ Leading to P ０ +3SD ０ is set as the upper limit of the blanking light amount when the total power-on time is 0 hours. ２０００ Similarly, the collected blank light amount P ２０００ Standard deviation SD of the data group ２０００ Leading to P ２０００ +3SD ２０００ is the upper limit of the light intensity when the total power-on time is 2000 hours.

[0067] The processing unit 203 also plots P on a graph with the total power-on time T on the horizontal axis and the blank light amount on the vertical axis. ０ +3SD ０ and P ２０００ +3SD ２０００ The processing unit 203 can create a line connecting P and P as a first A reference line from 0 hours to 2000 hours of total power-on time, and can use the first A reference line as a reference value used for the first abnormality determination. ０ -3SD ０ and P ２０００ -3SD ２０００ A straight line connecting these points can be created and used as the first B reference line from 0 hours to 2000 hours of total current application time.

[0068] The processing unit 203 can use, as a reference value for determining the first abnormality, a first A reference curve and a first B reference curve created based on a predetermined deviation from an approximation curve created from historical data of the blank light intensity. Also, the processing unit 203 can use a first A reference line and a first B reference line created based on the blank light intensity collected via an information network.

[0069] For example, the first abnormality determination is performed using the 1A reference line and the 1B reference line in a range of the total power-on time T (e.g., from 0 hours to 2000 hours) in which the blanking light amount decreases linearly as the total power-on time T increases. On the other hand, the first abnormality determination can be performed using the 1A reference curve and the 1B reference curve in a range of the total power-on time T (e.g., after 2000 hours) in which the blanking light amount decreases non-linearly as the total power-on time T increases.

[0070] Furthermore, the processing unit 203 calculates the fitting accuracy of the approximation curve, for example, the coefficient of determination, and when it is determined that the fitting accuracy is below a predetermined value, it performs the first abnormality determination using the first A reference straight line and the first B reference straight line. On the other hand, when it is determined that the fitting accuracy is equal to or greater than the predetermined value, it can perform the first abnormality determination using the first A reference curve and the first B reference curve.

[0071] In this way, by providing multiple methods for calculating reference values ​​to determine abnormalities in optical components including the LED unit 301 and using different methods of calculating reference values ​​depending on the usage status of the LED unit 301, it is possible to more accurately determine abnormalities in the LED unit 301 even when there is little historical data.

[0072] (Isolating the cause of the first abnormality using LED board temperature data) In this embodiment, when the processing unit 203 determines that there is an abnormality in an optical component, it can determine the cause of the abnormality in the optical component from the temperature data of the LED mounting board 401 measured by the temperature sensor 403.

[0073] There are several possible causes of the first abnormality, in addition to an abnormality in the LED unit 301. For example, there are a decrease in the amount of acquired light due to scratches or dirt on the reaction cell 108, noise due to air bubbles or dust in the water in the reaction cell 108, or air bubbles or dust in the constant temperature fluid 115. The LED board temperature data can be used as a means of distinguishing between the cause of the first abnormality caused by the LED unit 301 and other causes.

[0074] 5 is a flowchart showing a flow of isolating the cause of the first abnormality using LED board temperature data. The processing unit 203 performs a first abnormality determination (S101), and if it is determined that the first abnormality has not occurred (S101: NO), the processing unit 203 ends this flow.

[0075] On the other hand, if it is determined that a first abnormality has occurred (S101: YES), the processing unit 203 calculates a temperature reference value for the LED substrate temperature (S102). The temperature reference value may be a predetermined range (e.g., ±1°C or ±3SD of the historical data) from the average value calculated from the historical data of the LED substrate temperature, or a predetermined range (e.g., ±1°C or ±3SD of the historical data) from the previously acquired LED substrate temperature.

[0076] Next, if it is determined that the LED substrate temperature at the time of blank light intensity measurement is within the above-mentioned temperature reference value (S103: NO), the processing unit 203 determines that the cause of the first abnormality is an abnormality in an optical component other than the LED unit 301 or the device condition (S104), and ends this flow.

[0077] On the other hand, if it is determined that the LED substrate temperature during blank light intensity measurement is outside the above-mentioned temperature reference value (S103: YES), the processing unit 203 determines that the cause of the first abnormality is an abnormality in the LED unit 301 (S105), and terminates the abnormality determination flow.

[0078] (Determining the Second Abnormality: Isolating the Cause of the First Abnormality Using the Amount of Change in Light Intensity per Unit Temperature) Another method for more accurately isolating the cause of the first abnormality is to use the amount of change in light intensity per unit temperature. In this way, the processing unit 203 can change the method for calculating multiple reference values ​​depending on the usage status of the LED chip 402. In this case, an abnormality in the LED chip 402 can be determined from the relationship between the amount of change in light intensity per unit temperature and the total time the LEDs are powered on.

[0079] Fig. 6 is a diagram showing the relationship between the LED substrate temperature and the light intensity immediately after the LED unit 301 starts emitting light. As shown in Fig. 6, the light intensity decreases linearly as the LED substrate temperature rises. As shown in Fig. 6, if the slope of the regression line R when the LED substrate temperature is on the horizontal axis and the light intensity is on the vertical axis is taken as slope S, the slope S of the regression line R indicates the amount of change in the light intensity per unit temperature. Therefore, data on slope S is accumulated and stored in the memory unit 204.

[0080] The slope S shown in FIG. ０ is the amount of change in light intensity per unit temperature when the total power-on time T is 0 hours, and the slope S １２０００ is the amount of change in light intensity per unit temperature when the total power-on time T is 12,000 hours. １２０００ is the slope S ０ is close to zero compared to

[0081] 7 is a diagram showing the relationship between the total current-flow time T and the slope S. As shown in FIG. 7, the slope S tends to linearly approach zero as the total current-flow time T elapses. The processing unit 203 accumulates data on the slope S and calculates a regression line r with the total current-flow time T on the horizontal axis and the slope S on the vertical axis. The processing unit 203 also calculates a second A reference line indicating an upper limit of a predetermined degree of deviation from the regression line r, and a second B reference line indicating a lower limit of a certain degree of deviation from the regression line r.

[0082] Then, if the newly measured and calculated change in light intensity per unit temperature during the total power supply time T is greater than the upper limit value indicated by the second A reference line or smaller than the lower limit value indicated by the second B reference line, the processing unit 203 judges this to be a second abnormality.

[0083] The slope S is calculated as the amount of change in the amount of light per unit temperature, so it is possible to ignore the influence of scratches or dirt on the reaction cell 108. Furthermore, since the slope S is calculated from data at multiple points, it is possible to ignore the influence of light amount noise caused by air bubbles or dust in the flowing water in the reaction cell 108 or air bubbles or dust in the constant temperature fluid 115, and the influence of temperature noise on the LED substrate.

[0084] Therefore, by performing the second abnormality determination, it is possible to detect an abnormality caused by the LED unit 301, such as discoloration or peeling of the optical filter 404, or a crack in the LED chip 402. The processing unit 203 can output the abnormality caused by the LED unit 301 to the display unit 206 and prompt the user to replace the LED unit 301.

[0085] Furthermore, if the first abnormality described above occurs but the second abnormality described above does not occur, the processing unit 203 can determine that there is a problem with the device condition other than the LED unit 301, such as scratches or dirt on the reaction cell 108, air bubbles or debris in the water in the reaction cell 108, or air bubbles or debris in the constant temperature fluid 115, and can display a screen on the display unit 206 urging the user to check the device condition other than the LED unit 301.

[0086] 8 is a flowchart showing a flow of determining whether the LED unit 301 is abnormal, using the first abnormality determination and the second abnormality determination. First, when the processing unit 203 acquires new blank light intensity data, it performs the first abnormality determination described above on the blank light intensity data (S201).

[0087] If it is determined that the blank light amount is equal to or less than the upper limit value indicated by the first A reference curve in FIG. 4 and equal to or greater than the lower limit value indicated by the first B reference curve (S201: NO), the processing unit 203 ends the abnormality determination flow.

[0088] On the other hand, if it is determined that the blank light intensity exceeds the upper limit value indicated by the first A reference curve in Figure 4 or falls below the lower limit value indicated by the first B reference curve (S201: YES), the processing unit 203 acquires and calculates data on the change in light intensity per unit temperature and performs a second abnormality determination (S202).

[0089] If it is determined that the change in light intensity per unit temperature is equal to or less than the upper limit value indicated by the second A reference curve in Figure 7 and equal to or greater than the lower limit value indicated by the second B reference curve (S202: NO), the processing unit 203 determines that the cause of the first abnormality is an abnormality in an optical component other than the LED unit 301 or the device condition (S203), and terminates the abnormality determination flow.

[0090] On the other hand, if it is determined that the change in light intensity per unit temperature exceeds the upper limit value indicated by the second A reference curve in FIG. 7 or falls below the lower limit value indicated by the second B reference curve (S202: YES), the processing unit 203 determines that the cause of the first abnormality is an abnormality in the LED unit 301 (S204), and terminates the abnormality determination flow.

[0091] (Acquisition of change in light intensity per unit temperature) Furthermore, in this embodiment, the processing unit 203 can determine an abnormality in the LED chip 402 by deriving an approximation curve from the relationship between the obtained change in light intensity per multiple unit temperatures and the total LED power-on time corresponding to the change in light intensity.

[0092] At this time, the processing unit 203 can acquire data on the change in light intensity per unit temperature at a timing when measurement of the light intensity of the reaction solution 107 is not being performed. In addition, the change in light intensity per unit temperature can be acquired simultaneously for multiple reaction cells 108.

[0093] FIG. 9 is a flowchart showing a detailed example of a method for acquiring the amount of change in light amount per unit temperature.

[0094] First, the processing unit 203 issues an instruction to acquire the amount of change in light intensity per unit temperature, for example, immediately after starting the analysis termination operation after the completion of reaction process data acquisition (S301). At this time, the LED unit 301 is in an on state. Following the instruction from the control unit 201, the cleaning unit 114 fills a specific reaction cell 108 (here, cell A) with a transparent solution such as water (S302), and then turns off the LED unit 301 (S303). To allow the LED substrate temperature to decrease, the cleaning unit 114 waits for a certain period of time, for example, 30 seconds (S304), and then turns on the LED unit 301 again (S305).

[0095] When the LED unit 301 is turned on again, the LED substrate temperature rises, and the light intensity decreases as the LED substrate temperature rises (S306). The change in light intensity is linear with the change in LED substrate temperature. After the LED unit 301 is turned on again, the light intensity measurement circuit 202 acquires light intensity data and LED substrate temperature data when cell A passes through the absorbance measurement unit 113 (S307).

[0096] As the reaction disk 109 rotates, the cell A passes again through the absorbance measurement unit 113. At this time, the light quantity measurement circuit 202 acquires the light quantity data and the LED substrate temperature data again (S308).

[0097] Similarly, the light quantity measurement circuit 202 acquires light quantity data and LED substrate temperature data when the cell A passes through the absorbance measurement unit 113 for the third time (S309).

[0098] From the three points of data acquired by the above operation, the processing unit 203 derives a regression line R with the LED substrate temperature on the horizontal axis and the light intensity on the vertical axis, and calculates the change in light intensity per unit temperature, which is the slope S of the regression line (S310).

[0099] The number of data points to be acquired may be three or more. Furthermore, according to this embodiment, in addition to cell A, the same data can be simultaneously acquired for a plurality of other reaction cells 108. By measuring the amount of change in light intensity per unit temperature for a plurality of reaction cells 108, the accuracy of the acquired data can be improved.

[0100] After the analysis is completed, the reaction disk 109 is stopped so that the cell A is positioned in front of the absorbance measurement unit 113, and light intensity data and temperature data can be continuously acquired at multiple points.

[0101] In addition to the above, when a first abnormality occurs, the control unit 201 can issue an instruction to stop the analysis operation and an instruction to acquire data on the amount of light per unit temperature. Also, the user can arbitrarily start acquiring data on the amount of light per unit temperature via the input unit 205.

[0102] This operation can also be performed at any time, for example, during maintenance to fill the flow path with detergent, as long as fluctuations in light intensity do not affect the operation of the automatic analyzer 100. By acquiring data on the amount of change in light intensity per unit temperature when absorbance measurement of the sample 101 is not being performed, it is possible to determine whether there is an abnormality in the LED unit 301 without delaying the analysis operation.

[0103] Furthermore, when the processing unit 203 determines that the newly calculated change in light intensity per unit temperature is equal to or less than the upper limit indicated by the second A reference line in Figure 7 and equal to or greater than the lower limit indicated by the second B reference line, the data on the change in light intensity per unit temperature is stored in the memory unit 204 as historical data that can be used to calculate the regression line r.

[0104] Furthermore, if the newly calculated data on the change in light intensity per unit temperature exceeds the upper limit indicated by the second A reference line in Figure 7 or falls below the lower limit indicated by the second B reference line, the data on the change in light intensity per unit temperature is stored in memory unit 204 as historical data that cannot be used to calculate the regression line r.

[0105] Regarding the change in light intensity per unit temperature shown above, it is possible to obtain data for only a specific cell number and / or a specific wavelength, or it is possible to obtain data for all cell numbers and / or a specific wavelength.

[0106] (Application to Lifespan Prediction) Furthermore, in this embodiment, the processing unit 203 can predict the lifespan of the LED unit 301 including the LED chip 402 from the relationship between the amount of change in light intensity per unit temperature and the total power-on time of the LEDs. For example, the lifespan of the LED chip 402 can be predicted by calculating a lifespan prediction reference value based on the relationship between the amount of change in light intensity per unit temperature and the total power-on time of the LEDs, and calculating the time until the amount of change in light intensity per unit temperature reaches the lifespan prediction reference value.

[0107] 10 is a graph in which the horizontal axis represents the total power-on time T and the vertical axis represents the amount of change in light intensity per unit temperature of the LED unit 301. In Fig. 10, the regression line r indicates that the amount of change in light intensity per unit temperature linearly approaches zero as the total power-on time T increases.

[0108] The processing unit 203 derives the regression line r when multiple points, for example, three or more points, of data on the amount of change in light intensity per unit temperature that can be used to derive the regression line r are stored in the storage unit 204. The processing unit 203 also calculates a value obtained by adding a predetermined coefficient to the intercept b of the regression line r as a reference value for life prediction in the amount of change in light intensity per unit temperature.

[0109] The processing unit 203 calculates the total power-on time T (Tx) when the regression line r reaches the life prediction reference value, and then subtracts the current total power-on time T from Tx to calculate the remaining life of the LED unit 301.

[0110] For example, at the time when the total current application time is 12,000 hours, the regression line r is Y = 1.11 × 10 －４ X-2.8, and the coefficient is determined to be 2.0, the reference value for the life prediction is -2.8+2.0, that is, -0.8. The processing unit 203 calculates the total power-on time Tx at which the amount of change in light quantity per unit temperature reaches -0.8 by calculating -0.8=1.11×10 －４ From Tx-2.8, the processing unit 203 calculates Tx=18,000 hours. The processing unit 203 also subtracts the current total power-on time of 12,000 hours from Tx=18,000 hours, and estimates the remaining life of the LED unit 301 to be 6,000 hours.

[0111] The processing unit 203 displays the remaining life of the LED unit 301 to the user via the display unit 206. Furthermore, every time new data on the amount of change in light intensity per unit temperature that can be used to derive the regression line r is acquired, the processing unit 203 creates the regression line r and updates Tx and the remaining life.

[0112] (Display Method on Display Unit) The processing unit 203 can cause the display unit 206 to display an LED light source status screen 501 of the LED chip 402 .

[0113] 11 is a diagram showing an LED light source status screen 501, which is an example of the display unit 206 that displays the status of the LED unit 301. The user can display the LED light source status screen 501 on the display unit 206 at any timing by operating the input unit 205.

[0114] The LED light source status screen 501 displays an analysis unit column 502 that shows the connected analysis unit, an LED board temperature column 503 that shows the current LED board temperature, an LED light source abnormality column 504 that shows whether or not there is an abnormality in the LED unit 301, an LED light source total power-on time column 505 that shows the total power-on time T of the LED unit 301, and a remaining life column 506 that shows the remaining life of the LED unit 301.

[0115] When the first or second abnormality is determined for the LED unit 301, the LED light source abnormality column 504 displays "abnormality detected" and highlights it by changing the color, etc., to prompt the user to inspect and replace the LED unit 301.

[0116] The remaining life column 506 displays the value obtained by subtracting the total power-on time T at the time of screen display from the value obtained by adding the total power-on time T at the time the remaining life of the LED unit 301 was last calculated and the remaining life.

[0117] For example, if it is determined that the total power-on time T at the time the remaining life of the LED unit 301 was last calculated was 12,000 hours, the remaining life is 6,000 hours, and the total power-on time T at the time of screen display was 12,010 hours, then 12,000 hours + 6,000 hours - 12,010 hours, or 5,990 hours, is displayed in the remaining life column 506. If the value in the remaining life column 506 falls below a predetermined reference value, for example, 1,000 hours or less, the remaining life column 506 is highlighted by changing the color, for example, to prompt the user to proceed with preparations to replace the LED unit 301.

[0118] If an abnormality is detected in the measurement value, the user can infer the cause of the abnormal measurement value by referring to the LED board temperature column 503, the LED light source abnormality column 504, and the LED light source total power-on time column 505, thereby reducing the effort required to investigate the cause.

[0119] Furthermore, the user can refer to the remaining life column 506 and prepare for replacement of the LED unit 301 by procuring a new LED unit 301 in advance and requesting a service technician to perform the replacement work, etc. Therefore, the downtime of the device can be significantly reduced compared to when the device is stopped after the LED unit 301 reaches the end of its life and the above-mentioned replacement preparation is performed.

[0120] In addition to FIG. 11, the graphs of FIGS. 4, 6, 7, and 10 described above can also be displayed on the display unit 206.

[0121] (Determining Abnormality in the Light Source Before Shipping) After manufacturing, the LED unit 301 may undergo an aging process before shipping, in which the LED unit 301 is repeatedly turned on and off for a predetermined period of time a predetermined number of times. By acquiring the amount of change in the light intensity per unit temperature during this aging process, it is possible to determine whether there is an abnormality in the LED unit 301 before shipping.

[0122] For example, in the aging process, the LED unit 301 is turned on for 10 hours and turned off for 1 hour, and this is repeated five times. The processing unit 203 acquires the amount of change in light intensity per unit temperature at the start of the first lighting.

[0123] Next, the amount of change in light intensity per unit temperature when the lamp is turned on for 10 hours, then turned off for 1 hour, and then turned back on is obtained. Similarly, the amount of change in light intensity per unit temperature when the lamp is turned back on from the off state is obtained each time, and the processing unit 203 derives a regression line r from the amount of change in light intensity per unit temperature at five points and the total power-on time T.

[0124] Data on the slope L and intercept of the regression line r are stored in the storage unit 204. If an abnormality is found in the newly acquired regression line r, for example, if the slope L of the newly acquired regression line r does not fall within the range of the average value of the stored data ±3SD, the shipment of the LED unit 301 can be stopped, thereby making it possible to prevent the shipment of abnormal units.

[0125] (Correction of Light Amount) In this embodiment, the processing unit 203 can correct the light amount based on the amount of decrease in the light amount that accompanies an increase in the total power-on time of the LEDs.

[0126] As a specific example, the processing unit 203 can compare the initial blank light intensity, which is the blank light intensity measured for the first time after the LED unit 301 is installed, with the new blank light intensity that is newly measured, and correct the light intensity data.

[0127] For this purpose, the processing unit 203 calculates the rate of decrease of the new blank light intensity relative to the initial blank light intensity. Thereafter, when calculating the component concentrations of the sample 101 from the light intensity data acquired during the analysis operation, the light intensity can be corrected based on the rate of decrease of the blank light intensity.

[0128] For example, if the average of the new blank light intensity in multiple, say 50, reaction cells 108 is 60% of the average of the initial blank light intensity in each reaction cell 108 with the same cell number, the processing unit 203 divides the light intensity acquired in that reaction cell 108 by 0.6 and uses this value as the corrected light intensity to calculate the component concentration of the sample 101.

[0129] (Correction of LED mounting substrate temperature) Furthermore, the processing unit 203 calculates a temperature correction value for the temperature of the LED mounting substrate 401 using the amount of change in light intensity per unit temperature based on the amount of decrease in light intensity due to an increase in the total power-on time of the LEDs, and adjusts the temperature of the LED mounting substrate 401 based on the temperature correction value, thereby correcting the light intensity.

[0130] For example, the processing unit 203 first calculates the amount of decrease in the new blank light intensity relative to the initial blank light intensity. Next, the processing unit 203 calculates a correction value for the LED substrate temperature using the latest data on the amount of change in light intensity per unit temperature. The temperature adjustment unit 405 can correct the temperature setting value of the temperature adjustment unit 405 based on the calculated correction value for the LED substrate temperature.

[0131] As a specific example, assume that the initial blank light intensity is 100, the acquired blank light intensity is 80, and the latest value of the change in light intensity per unit temperature is -10 per 1°C. In this case, to increase the light intensity by 20, the correction value for the LED substrate temperature is -2°C. The processing unit 203 calculates the correction value for the LED substrate temperature as described above, and the control unit 201 instructs the temperature adjustment unit 405 to lower the substrate temperature by 2°C. The temperature adjustment unit 405 lowers the temperature setting value by 2°C based on the above instruction, and is able to adjust the temperature of the LED mounting substrate 401.

[0132] Next, the effects of this embodiment will be described.

[0133] The automated analyzer 100 of the present embodiment described above includes a reaction cell 108 that contains the reaction solution 107 to be analyzed, an LED chip 402 that irradiates light onto the reaction solution 107 in the reaction cell 108, a spectrometer 302 that measures the amount of light from the LED chip 402 that has passed through the reaction solution 107, and a control unit 201. The processing unit 203 determines an abnormality in optical components including the LED chip 402 from the relationship between the amount of light measured by the spectrometer 302 and the total LED power-on time, which is the accumulated time that the LED chip 402 is turned on.

[0134] By making a judgment based on the total LED power-on time of each LED chip 402 in this way, it is possible to appropriately judge the individual status, abnormality, and lifespan based on the condition of each device, taking into account individual differences, and therefore it is possible to more appropriately judge the status of the LED for each device, thereby enabling maintenance and replacement to be performed at more appropriate times.

[0135] The optical system further includes an LED mounting substrate 401 on which an LED chip 402 is mounted, and a temperature sensor 403 that measures the temperature of the LED mounting substrate 401. When the processing unit 203 determines that there is an abnormality in an optical system component, it determines the cause of the abnormality in the optical system component from the data on the temperature of the LED mounting substrate 401 measured by the temperature sensor 403. This makes it possible to isolate and determine the abnormality in the LED unit 301 among the optical system components, and enables appropriate maintenance, including replacement, to be performed.

[0136] Furthermore, the device is further provided with a memory unit 204 in which multiple methods for calculating reference values ​​for determining abnormalities in optical components are recorded, and the processing unit 203 changes the method for calculating the multiple reference values ​​depending on the usage status of the LED chip 402, thereby enabling more accurate abnormality determination even when there is little historical data.

[0137] Furthermore, the processing unit 203 determines whether there is an abnormality in the LED chip 402 from the relationship between the amount of change in light intensity per unit temperature and the total time the LED is powered on, thereby making it possible to determine whether there is an abnormality in the LED unit 301 in a short time (for example, 30 seconds or less) regardless of individual differences in the LED unit 301 or the device condition.

[0138] Furthermore, the processing unit 203 determines whether there is an abnormality in the LED chip 402 by deriving an approximate curve from the relationship between the amount of change in light intensity per unit temperature and the total LED power-on time corresponding to the amount of change in light intensity, thereby achieving more accurate abnormality determination.

[0139] In addition, the processing unit 203 can acquire data on the change in light intensity per unit temperature at a time when the light intensity of the reaction solution 107 is not being measured, thereby making it possible to determine whether there is an abnormality in the LED unit 301 without delaying the analysis operation.

[0140] Furthermore, by providing a plurality of reaction cells 108, the processing unit 203 can simultaneously acquire the amount of change in light intensity per unit temperature for the plurality of reaction cells 108, thereby improving the accuracy of abnormality determination for the LED unit 301.

[0141] Furthermore, the processing unit 203 predicts the lifespan of the LED chip 402 from the relationship between the amount of change in light intensity per unit temperature and the total power-on time of the LED. In particular, the processing unit 203 calculates a lifespan prediction reference value based on the relationship between the amount of change in light intensity per unit temperature and the total power-on time of the LED, and predicts the lifespan of the LED chip 402 by calculating the time until the amount of change in light intensity per unit temperature reaches the lifespan prediction reference value, thereby making it possible to notify the user of the appropriate time to replace the LED unit 301 regardless of individual differences in the LED unit 301 and the device condition.

[0142] Furthermore, the processing unit 203 corrects the light intensity based on the amount of decrease in light intensity that occurs with an increase in the total LED power-on time, calculates a temperature correction value for the temperature of the LED mounting board 401 using the amount of change in light intensity per unit temperature based on the amount of decrease in light intensity that occurs with an increase in the total LED power-on time, and adjusts the temperature of the LED mounting board 401 based on the temperature correction value, thereby correcting the light intensity.This makes it possible to cancel errors in the measurement results that occur due to a decrease in the light intensity of the LED unit 301 over time, and further improves the accuracy of analysis.

[0143] The automatic analyzer 100 is further provided with a display unit 206 that displays information about the automatic analyzer 100, and the processing unit 203 displays a status screen of the LED chip 402 on the display unit 206, allowing the user to grasp the current status of the LED unit 301 within the device, and thus allowing the user to grasp to some extent in advance the maintenance schedule, such as whether replacement preparation is necessary.

[0144] <Others> The present invention is not limited to the above-described embodiments, and various modifications and applications are possible. The above-described embodiments have been described in detail to clearly explain the present invention, and the present invention is not necessarily limited to those having all of the described configurations.

[0145] 100: Automated analyzer 101: Sample 102: Sample cup 103: Sample line 104: Reagent 105: Reagent bottle 106: Reagent disk 107: Reaction solution (liquid) 108: Reaction cell (reaction vessel, optical component) 109: Reaction disk (optical component) 110: Sample dispensing mechanism 111: Reagent dispensing mechanism 112: Solution stirring section 113: Absorbance measurement section 114: Cleaning section 115: Constant temperature fluid 201: Control section 202: Light quantity measurement circuit (optical component) 203: Processing section 204: Memory section 205: Input section 206: Display section 301: LED unit (optical component) 302: Spectrometer (measurement section, optical component) 3021: Diffraction grating (optical component) 3022: Detector array (optical component) 303: Optical axis 304: Light source side slit (optical component) 305: Condenser lens (optical component) 306: Spectrometer side slit (optical component) 401: LED mounting board (board, optical component) 402: LED chip (LED light source, optical component) 403: Temperature sensor (optical component) 404: Optical filter (optical component) 405: Temperature adjustment section (optical component) 501: LED light source status screen 502: Analysis unit column 503: LED board temperature column 504: LED light source abnormality column 505: LED light source total power-on time column 506: Remaining life column

Claims

1. An automatic analyzer comprising: a reaction vessel for containing a liquid to be analyzed; an LED light source for irradiating light onto the liquid in the reaction vessel; a measurement unit for measuring the amount of light from the LED light source that has passed through the liquid; and a processing unit for processing information, wherein the processing unit determines abnormalities in optical components including the LED light source based on the relationship between the amount of light measured by the measurement unit and the total LED power-on time, which is the sum of the lighting times of the LED light source.

2. An automatic analyzer according to claim 1, further comprising a substrate on which the LED light source is mounted, and a temperature sensor for measuring the temperature of the substrate, wherein when the processing unit determines that there is an abnormality in the optical system component, it determines the cause of the abnormality in the optical system component from data on the temperature of the substrate measured by the temperature sensor.

3. An automatic analyzer according to claim 2, further comprising a memory unit in which a plurality of methods for calculating a reference value for determining abnormalities in the optical components are recorded, and the processing unit changes the calculation method for the plurality of reference values ​​depending on the usage status of the LED light source.

4. An automatic analyzer according to claim 2, wherein the processing unit determines whether the LED light source is abnormal based on the relationship between the amount of change in light intensity per unit temperature and the total time the LED is energized.

5. An automatic analyzer according to claim 4, wherein the processing unit determines whether or not there is an abnormality in the LED light source by deriving an approximation curve from the relationship between the obtained amounts of change in light intensity per unit temperature and the total LED power-on time corresponding to the amounts of change in light intensity.

6. An automatic analyzer according to claim 5, wherein the processing unit acquires data on the amount of change in light intensity per unit temperature at a time when measurement of the amount of light on the liquid is not being performed.

7. An automatic analyzer according to claim 6, comprising a plurality of reaction vessels, and wherein the processing unit simultaneously acquires the amount of change in light intensity per unit temperature for the plurality of reaction vessels.

8. An automatic analyzer according to claim 7, wherein the processing unit predicts the life of the LED light source from the relationship between the amount of change in light intensity per unit temperature and the total time the LED is energized.

9. An automatic analyzer according to claim 8, wherein the processing unit calculates a life prediction reference value based on the relationship between the amount of change in light intensity per unit temperature and the total time the LED is energized, and predicts the life of the LED light source by calculating the time until the amount of change in light intensity per unit temperature reaches the life prediction reference value.

10. An automatic analyzer according to claim 9, wherein the processing unit corrects the amount of light based on the amount of decrease in the amount of light that occurs with an increase in the total time that the LED is energized.

11. An automatic analyzer according to claim 10, wherein the processing unit calculates a temperature correction value for the temperature of the substrate using the amount of change in light intensity per unit temperature based on the amount of decrease in light intensity due to an increase in the total power-on time of the LEDs, and corrects the light intensity by adjusting the temperature of the substrate based on the temperature correction value.

12. An automatic analyzer according to claim 1, further comprising a display unit that displays information relating to said automatic analyzer, wherein said processing unit causes said display unit to display a status screen of said LED light source.

13. A method for determining an LED light source in an automatic analyzer comprising a reaction vessel containing a liquid to be analyzed, an LED light source that irradiates light onto the liquid in the reaction vessel, and a measurement unit that measures the amount of light from the LED light source that has passed through the liquid, the method determining whether there is an abnormality in an optical system component including the LED light source based on the relationship between the amount of light measured by the measurement unit and the total LED power-on time, which is the sum of the lighting time of the LED light source.

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