Apparatus for measuring defects caused by water leakage and defect measurement method

Abstract

A defect measurement apparatus according to an embodiment of the present invention comprises: a first acoustic sensor that is arranged at one end of an object to be measured, and configured to obtain a first acoustic signal generated from the object being measured; a second acoustic sensor that is arranged at the other end of the object being measured, and configured to obtain a second acoustic signal generated from the object being measured; and a control unit electrically connected to the first acoustic sensor and the second acoustic sensor, wherein the control unit extracts acoustic parameters respectively for the first acoustic signal and the second acoustic signal to obtain a first acoustic parameter and a second acoustic parameter, and if a first comparison result from comparing the first acoustic parameter and the second acoustic parameter with a reference parameter, which is an acoustic parameter at the time of occurrence of a defect, is within an error range, identifies that a defect has occurred in the object being measured and generates defect identification information.

Description

Defect measurement device and defect measurement method according to water leakage

[0001] The present invention relates to a defect measuring device and a defect measuring method capable of measuring defects in a measurement target due to water leakage.

[0002] When a material experiences small deformations, internal strain energy accumulates, and the release of this accumulated strain energy is called acoustic emission. Acoustic emission testing measures elastic waves generated by this strain energy and is used as a non-destructive test to measure material damage, fracture, and deformation.

[0003] Acoustic emission testing can identify the movement of dislocations within a material, the occurrence and movement of slip, crack formation, and crack propagation, and it is important to monitor and analyze these in real time.

[0004] For example, metal or PVC pipes can develop leaks due to external forces or defects such as corrosion, which can result in significant losses. To prevent such losses, technologies capable of diagnosing and predicting potential defects in measurement targets such as pipes are essential. The more accurately a defect can be located with minimal cost and time, the more effective it is.

[0005] The problem to be solved by the present invention is to provide a defect measuring device and a defect measuring method capable of identifying a defect of a measurement target in real time and accurately measuring the location where the defect occurred.

[0006] According to one embodiment of the present invention, a defect measuring device includes a first acoustic sensor arranged at one end of a measurement object and configured to obtain a first acoustic signal generated from the measurement object, a second acoustic sensor arranged at the other end of the measurement object and configured to obtain a second acoustic signal generated from the measurement object, and a control unit electrically connected to the first acoustic sensor and the second acoustic sensor, wherein the control unit obtains the first acoustic signal and the second acoustic signal in real time using the first acoustic sensor and the second acoustic sensor, extracts acoustic parameters for each of the first acoustic signal and the second acoustic signal, and obtains the first acoustic parameter and the second acoustic parameter, and when a first comparison result of comparing the first acoustic parameter and the second acoustic parameter with a reference parameter, which is an acoustic parameter at the time of occurrence of a defect, is within an error range, the control unit can identify that a defect has occurred in the measurement object and generate defect identification information.

[0007] In the defect measuring device according to one embodiment of the present invention, the control unit can extract acoustic parameters for each of the first acoustic signal and the second acoustic signal to obtain the first acoustic parameter and the second acoustic parameter only when the amplitude value of each of the first acoustic signal and the second acoustic signal is equal to or greater than a threshold amplitude value.

[0008] In the defect measuring device according to one embodiment of the present invention, when the control unit identifies that a defect has occurred in the measurement target through the first comparison result, the control unit may detect a defect location based on the acquisition time of the first acoustic signal and the second acoustic signal to generate first defect location information, detect a defect location based on the amplitude of the first acoustic signal and the second acoustic signal to generate second defect location information, and generate first defect location estimation information based on the first defect location information and the second defect location information.

[0009] In the defect measuring device according to one embodiment of the present invention, the control unit may generate the first defect location information by using the positions of each of the first acoustic sensor and the second acoustic sensor, the transmission speed of each of the first acoustic signal and the second acoustic signal, and the difference in acquisition time at which the first acoustic sensor and the second acoustic sensor acquire the first acoustic signal and the second acoustic signal, and may generate the second defect location information by using the positions of each of the first acoustic sensor and the second acoustic sensor, and the difference in amplitude of the first acoustic signal and the second acoustic signal.

[0010] In the defect measuring device according to one embodiment of the present invention, the control unit can generate the first defect location estimation information in a different way depending on whether the second comparison result of comparing the first defect location information and the second defect location information is within the error range.

[0011] In the defect measuring device according to an embodiment of the present invention, when generating the first defect location estimation information, the control unit may generate the first defect location estimation information as one of the defect location according to the first defect location information and the defect location according to the second defect location information when the second comparison result is within the error range, and may generate the first defect location estimation information as an average location of the first defect location information and the second defect location information when the second comparison result is outside the error range.

[0012] In the defect measuring device according to one embodiment of the present invention, the acoustic parameter may include at least one of an amplitude value, a duration during which the amplitude value is maintained above a threshold amplitude value, energy, a count of sections exceeding the threshold amplitude value, a rise time, and a peak frequency.

[0013] According to one embodiment of the present invention, the defect measuring device further includes a memory electrically connected to the control unit and configured to store the reference parameter, and the control unit can update the reference parameter by reflecting an average parameter corresponding to an average of the first acoustic parameter and the second acoustic parameter to the reference parameter when the first comparison result of comparing the first acoustic parameter and the second acoustic parameter with the reference parameter, which is the acoustic parameter at the time of occurrence of the defect, is within an error range.

[0014] According to an embodiment of the present invention, the defect measuring device further includes a first vibration sensor arranged at one end of the measurement object to obtain a first vibration signal generated from the measurement object, and a second vibration sensor arranged at the other end of the measurement object to obtain a second vibration signal generated from the measurement object, wherein the first vibration sensor and the second vibration sensor are electrically connected to the control unit, and the control unit obtains the first vibration signal and the second vibration signal in real time using the first vibration sensor and the second vibration sensor, and generates defect risk information when there is a high possibility of a defect occurring in the measurement object based on a third comparison result obtained by comparing the first vibration signal and the second vibration signal with a reference vibration signal database related to defect occurrence, and generates defect occurrence information when a defect occurs in the measurement object.

[0015] In the defect measuring device according to one embodiment of the present invention, the reference vibration signal database may include first reference vibration signal data including vibration signal data for a specific period before a defect actually occurs, and second reference vibration signal data including vibration signal data according to the degree of a defect when a defect actually occurs.

[0016] In the defect measuring device according to one embodiment of the present invention, the control unit may determine that there is a high possibility that a defect will occur in the measurement target when the first vibration signal and the second vibration signal are within an error range when compared with the first reference vibration signal data and are outside an error range when compared with the second reference vibration signal data, and may generate the defect risk information.

[0017] In the defect measuring device according to one embodiment of the present invention, the control unit can determine that a defect has occurred in the measurement target and generate the defect occurrence information when the first vibration signal and the second vibration signal are within an error range when compared with the second reference vibration signal data.

[0018] In the defect measuring device according to one embodiment of the present invention, when the first vibration signal and the second vibration signal are within an error range when compared with the second reference vibration signal data, the control unit may detect a defect location based on the acquisition time of the first vibration signal and the second vibration signal to generate third defect location information, detect a defect location based on the amplitude of the first vibration signal and the second vibration signal to generate fourth defect location information, and generate second defect location estimation information based on the third defect location information and the fourth defect location information.

[0019] In the defect measurement device according to one embodiment of the present invention, when both the first defect location estimation information and the second defect location estimation information are generated, the control unit can generate final defect location estimation information through a summation based on each weight.

[0020] According to an embodiment of the present invention, the defect measuring device further includes a third acoustic sensor arranged between the one end and the other end of the measurement object to obtain a third acoustic signal generated from the measurement object, the third acoustic sensor being electrically connected to the control unit, the control unit obtaining the third acoustic signal in real time, extracting an acoustic parameter for the third acoustic signal to additionally obtain a third acoustic parameter, and comparing the first acoustic parameter, the second acoustic parameter, and the third acoustic parameter with the reference parameter, if the first comparison result is within an error range, the defect can be identified as having occurred in the measurement object and the defect identification information can be generated.

[0021] A defect measurement method according to one embodiment of the present invention may include a first acoustic sensor arranged at one end of a measurement object to obtain a first acoustic signal generated from the measurement object, an acoustic signal acquisition step arranged at the other end of the measurement object to obtain a second acoustic signal generated from the measurement object in real time, a parameter acquisition step extracting acoustic parameters for each of the first acoustic signal and the second acoustic signal to obtain the first acoustic parameter and the second acoustic parameter, and a defect identification step of identifying that a defect has occurred in the measurement object and generating defect identification information when a first comparison result of comparing the first acoustic parameter and the second acoustic parameter with a reference parameter, which is an acoustic parameter at the time of occurrence of a defect, is within an error range.

[0022] The defect measurement method according to one embodiment of the present invention may include a defect location information generation step of generating first defect location information by detecting a defect location based on acquisition times of the first acoustic signal and the second acoustic signal when a defect is identified as occurring in the measurement target through the first comparison result, and generating second defect location information by detecting a defect location based on amplitudes of the first acoustic signal and the second acoustic signal, and an estimation information generation step of generating first defect location estimation information as one of a defect location according to the first defect location information, a defect location according to the second defect location information, and an average location of the first defect location information and the second defect location information when the second comparison result of comparing the first defect location information and the second defect location information is within an error range.

[0023] In the defect measurement method according to one embodiment of the present invention, the acoustic parameter may include at least one of an amplitude value, a duration during which the amplitude value is maintained above a threshold amplitude value, energy, a count of sections exceeding the threshold amplitude value, a rise time, and a peak frequency.

[0024] According to embodiments of the present invention, defects can be effectively and accurately identified.

[0025] According to embodiments of the present invention, the location of a defect can be estimated effectively, accurately and quickly.

[0026] According to embodiments of the present invention, loss due to defect occurrence can be effectively prevented.

[0027] FIG. 1 is a block diagram showing a defect measuring device according to one embodiment of the present invention.

[0028] Figure 2 is a flowchart showing the flow of a defect measurement method according to one embodiment of the present invention.

[0029] Figure 3 is an exemplary diagram showing acoustic parameters according to one embodiment of the present invention.

[0030] Figure 4 is a flowchart showing a portion of the flow of a defect measurement method according to one embodiment of the present invention.

[0031] FIG. 5 is a flowchart showing the flow of generating first defect location estimation information in a defect measurement method according to one embodiment of the present invention.

[0032] FIG. 6 is a conceptual diagram illustrating a concept of generating first defect location information according to one embodiment of the present invention.

[0033] FIG. 7 is a conceptual diagram illustrating a concept of generating second defect location information according to an embodiment of the present invention.

[0034] FIG. 8 is a flowchart showing a part of the flow for generating first defect location estimation information according to one embodiment of the present invention.

[0035] FIG. 9 is a flowchart showing the flow of generating defect risk information or defect occurrence information using vibration sensors in a defect measurement method according to one embodiment of the present invention.

[0036] FIG. 10 is an exemplary diagram showing objects to which a defect measuring device and measuring method according to one embodiment of the present invention can be applied.

[0037] Hereinafter, with reference to the attached drawings, preferred embodiments of the present invention will be described in detail so that those skilled in the art can easily implement the invention. However, the present invention may be implemented in various different forms and is not limited or restricted by the following examples.

[0038] In order to clearly explain the present invention, a detailed description of a part that is irrelevant to the description or a related known technology that may unnecessarily obscure the gist of the present invention has been omitted, and when adding reference signs to components of each drawing in this specification, the same or similar reference signs are attached to the same or similar components throughout the specification.

[0039] In addition, terms and words used in this specification and claims should not be interpreted as limited to their usual or dictionary meanings, but should be interpreted as meanings and concepts that conform to the technical idea of ​​the present invention based on the principle that the inventor can appropriately define the concept of the term to explain his or her own invention in the best way.

[0040] FIG. 1 is a block diagram showing a defect measuring device according to one embodiment of the present invention.

[0041] A defect measurement device (1) (hereinafter referred to as the "device") can measure defects in various measurement objects. The device (1) can quickly and accurately analyze whether a defect has occurred and where it has occurred based solely on the signals / data measured for the measurement object. The defect in the measurement object may be a defect that can cause a water leak.

[0042] The device (1) may include an acoustic sensor (10). The acoustic sensor (10) can acquire an acoustic signal when acoustic emission occurs due to damage to the measurement target. In particular, the acoustic sensor (10) can acquire an acoustic signal generated from the measurement target in real time.

[0043] The acoustic sensor (10) may include a first acoustic sensor (11) and a second acoustic sensor (12).

[0044] The first acoustic sensor (11) can be arranged at one end of the measurement target to obtain a first acoustic signal generated from the measurement target.

[0045] The second acoustic sensor (12) may be arranged at the other end of the measurement target to obtain a second acoustic signal generated from the measurement target.

[0046] The device (1) may include a vibration sensor (20). The vibration sensor (20) can obtain a vibration signal when a vibration signal is generated due to damage in the measurement target.

[0047] The vibration sensor (20) may include a first vibration sensor (21) and a second vibration sensor (22).

[0048] The first vibration sensor (21) can be arranged at one end of the measurement target to obtain a first vibration signal generated from the measurement target.

[0049] The second vibration sensor (22) may be arranged at the other end of the measurement target to obtain a second vibration signal generated from the measurement target.

[0050] The device (1) may include a memory (30). The memory (30) may be configured to store reference parameters described below. In addition, the memory (30) may store data on acquired acoustic signals and vibration signals.

[0051] The device (1) may include a control unit (40).

[0052] The control unit (40) can be electrically connected to the acoustic sensor (10) (e.g., the first acoustic sensor (11) and the second acoustic sensor (12)), the vibration sensor (20) (e.g., the first vibration sensor (21) and the second vibration sensor (22)), and the memory (30). The control unit (40) can perform control on the acoustic sensor (10) (e.g., the first acoustic sensor (11) and the second acoustic sensor (12)), the vibration sensor (20) (e.g., the first vibration sensor (21) and the second vibration sensor (22)), and the memory (30).

[0053] FIG. 2 is a flowchart showing the flow of a defect measurement method according to an embodiment of the present invention, and FIG. 3 is an exemplary diagram showing acoustic parameters according to an embodiment of the present invention.

[0054] The method for measuring a defect of the device (1) may include a step of acquiring an acoustic signal in real time according to S100. For example, the control unit (40) may acquire a first acoustic signal and a second acoustic signal in real time using a first acoustic sensor (11) and a second acoustic sensor (12). Specifically, the first acoustic signal and the second acoustic signal generated due to damage between the one end and the other end may be acquired in real time using the first acoustic sensor (11) and the second acoustic sensor (12) arranged at one end and the other end of the measurement target.

[0055] The defect measurement method of the device (1) may include a step of acquiring acoustic parameters according to S110. For example, the control unit (40) may extract acoustic parameters for each of the first acoustic signal and the second acoustic signal to acquire the first acoustic parameter and the second acoustic parameter.

[0056] Referring to FIG. 3, for example, the acoustic parameter may include at least one of an amplitude value, a duration during which the amplitude value is maintained above a threshold amplitude value, energy, a count of sections exceeding the threshold amplitude value, a rise time, and a peak frequency.

[0057] The defect measurement method of the device (1) may include a step of generating defect identification information according to S120. For example, the memory (30) may store a reference parameter, which is an acoustic parameter at the time of occurrence of a defect. The control unit (40) may identify that a defect has occurred in the measurement target if the first comparison result of comparing the first acoustic parameter and the second acoustic parameter with the reference parameter is within the error range, thereby generating defect identification information.

[0058] The control unit (30) may also update the reference parameters stored in the memory (30). For example, if the first comparison result of comparing the first acoustic parameter and the second acoustic parameter with the reference parameter, which is the acoustic parameter at the time of occurrence of a defect, is within the error range, the control unit (40) may update the reference parameters by reflecting an average parameter corresponding to the average of the first acoustic parameter and the second acoustic parameter in the reference parameters.

[0059] As described above, the device (1) can quickly and accurately identify whether a defect has occurred in a measurement target by comparing the first acoustic parameter and the second acoustic parameter with the reference parameter and generating defect identification information if the difference is within the error range.

[0060] The device (1) may further include a third acoustic sensor. The third acoustic sensor may be positioned between one end and the other end of the measurement object. The third acoustic sensor may be configured to acquire a third acoustic signal generated from the measurement object.

[0061] The third acoustic sensor can be electrically connected to the control unit (40).

[0062] The control unit (40) can generate more precise defect identification information by using the third acoustic sensor than when only the first acoustic sensor (11) and the second acoustic sensor (12) are used. For example, the control unit (40) can obtain the third acoustic signal in real time, extract acoustic parameters for the third acoustic signal, and additionally obtain the third acoustic parameter. In addition, the control unit (40) can identify that a defect has occurred in the measurement target when the first comparison result of comparing the first acoustic parameter, the second acoustic parameter, and the third acoustic parameter with the reference parameter is within the error range, and generate defect identification information.

[0063] If the control unit (40) further uses the third acoustic sensor to generate defect identification information, more accurate measurement of whether a defect has occurred can be performed.

[0064] Figure 4 is a flowchart showing a portion of the flow of a defect measurement method according to one embodiment of the present invention.

[0065] The control unit (40) can determine whether the amplitude value of each of the first sound signal and the second sound signal is greater than or equal to a threshold amplitude value at S105 between S100 and S110.

[0066] For example, the control unit (40) can extract acoustic parameters for each of the first acoustic signal and the second acoustic signal only when the amplitude values ​​of each of the first acoustic signal and the second acoustic signal are equal to or greater than a threshold amplitude value, thereby obtaining the first acoustic parameter and the second acoustic parameter.

[0067] The device (1), according to S105, can determine whether the amplitude values ​​of each of the first and second acoustic signals are equal to or greater than a threshold amplitude value, thereby not generating defect identification information for acoustic signals that do not reach the threshold amplitude value. Accordingly, the device (1) can perform identification only for defects above a certain level, thereby enabling effective defect management.

[0068] FIG. 5 is a flowchart showing a flow for generating first defect location estimation information in a defect measurement method according to an embodiment of the present invention, FIG. 6 is a conceptual diagram showing a concept for generating first defect location information according to an embodiment of the present invention, and FIG. 7 is a conceptual diagram showing a concept for generating second defect location information according to an embodiment of the present invention.

[0069] The flow of Fig. 5 is explained with reference to Figs. 6 and 7.

[0070] The defect measurement method of the device (1) may include a step of generating first defect location information according to S200. For example, if the control unit (40) identifies that a defect has occurred in the measurement target through the first comparison result, the control unit (40) may detect the defect location based on the acquisition times of the first and second acoustic signals and generate first defect location information (X1).

[0071] Referring to FIG. 6, the control unit (40) can generate first defect location information (x1) by using the positions (s1, s2) of the first acoustic sensor (11) and the second acoustic sensor (12), respectively, the transmission speed (v) of the first acoustic signal and the second acoustic signal, respectively, and the acquisition time difference (t1-t0, t2-to) at which the first acoustic sensor and the second acoustic sensor acquire the first acoustic signal and the second acoustic signal, respectively. t0 may denote an initial time, and t1 and t2 may denote acquisition times of the first acoustic signal and the second acoustic signal, respectively.

[0072] The transmission speed (v) of each of the first acoustic signal and the second acoustic signal may vary depending on the material of the measurement target, and when the material is the same, the transmission speed (V) of each of the first acoustic signal and the second acoustic signal may be the same.

[0073] Specifically, the control unit (40) can calculate the first defect location information (x1) using the following mathematical formulas.

[0074] [Mathematical Formula 1]

[0075]

[0076] [Equation 2]

[0077]

[0078] The defect measurement method of the device (1) may include a step of generating second defect location information according to S210. The control unit (40) may detect a defect location based on the amplitude of the first acoustic signal and the second acoustic signal and generate second defect location information (x2).

[0079] Referring to FIG. 7, the control unit (40) can generate second defect location information by using the positions (S1, S2) of the first acoustic sensor (11) and the second acoustic sensor (12), respectively, and the difference in amplitude (A1, A2) of the first acoustic signal and the second acoustic signal.

[0080] Specifically, the control unit (40) can calculate the second defect location information (x2) using the following mathematical formula.

[0081] [Equation 3]

[0082]

[0083] The defect measurement method of the device (1) may include a step of generating first defect location estimation information according to S220. The control unit (40) may generate the first defect location estimation information based on the first defect location information (x1) and the second defect location information (x2).

[0084] As described above, the device (1) can estimate the defect location quickly, accurately, and efficiently by generating defect location estimation information based on judgment based on information.

[0085] The generation of the first defect location estimation information according to S220 is described below with reference to FIG. 8.

[0086] FIG. 8 is a flowchart showing a part of the flow for generating first defect location estimation information according to one embodiment of the present invention.

[0087] In the defect measurement method of the device (1), S220 can perform operations according to S300 to S320.

[0088] In the defect measurement method, S220 can determine whether the second comparison result is within the error range according to S300. For example, the control unit (40) can generate the first defect location estimation information in a different way depending on whether the second comparison result of comparing the first defect location information (x1) and the second defect location information (x2) is within the error range.

[0089] If the control unit (40) determines that the second comparison result is within the error range according to S300, it can perform the operation according to S310, and if it determines that it is outside the error range, it can perform the operation according to S320.

[0090] The control unit (40) can generate first defect location estimation information as one of the defect location (x1) according to the first defect location information and the defect location (x2) according to the second defect location information, when the second comparison result is within the error range (or is determined to be within the error range) according to S310.

[0091] The control unit (40) can generate first defect location estimation information as the average location ((x1+x2) / 2) of the first defect location information and the second defect location information when the second comparison result is outside the error range (or when it is determined to be outside the error range).

[0092] As described above, the device (1) can precisely estimate a defect location by reasonably generating first defect location estimation information based on whether the defect location (x1) according to the first defect location information and the defect location (x2) according to the second defect location information are within an error range.

[0093] The device (1) can estimate the defect location more accurately and precisely by using vibration sensors, which will be described later.

[0094] FIG. 9 is a flowchart showing the flow of generating defect risk information or defect occurrence information using vibration sensors in a defect measurement method according to one embodiment of the present invention.

[0095] The defect measurement method of the device (1) may include a step of acquiring a first vibration signal and a second vibration signal in real time, according to S400. For example, the control unit (40) may acquire the first vibration signal and the second vibration signal in real time using the first vibration sensor (21) and the second vibration sensor (22).

[0096] The defect measurement method of the device (1) can generate defect risk information or defect occurrence information according to S410. For example, the control unit (40) can generate defect risk information when there is a high possibility of a defect occurring in the measurement target based on the third comparison result of comparing the first vibration signal and the second vibration signal with a reference vibration signal database related to defect occurrence, and can generate defect occurrence information when a defect occurs in the measurement target.

[0097] The reference vibration signal database may include first reference vibration signal data including vibration signal data for a specific period before a defect actually occurs and second reference vibration signal data including vibration signal data according to the degree of a defect when a defect actually occurs.

[0098] Specifically, the control unit (40) can determine that there is a high possibility of a defect occurring in the measurement target and generate defect risk information when the first vibration signal and the second vibration signal are within the error range when compared with the first reference vibration signal data and are outside the error range when compared with the second reference vibration signal data.

[0099] The control unit (40) can determine that a defect has occurred in the measurement target and generate defect occurrence information when the first vibration signal and the second vibration signal are within the error range when compared with the second reference vibration signal data.

[0100] Specifically, the control unit (40) can generate third defect location information and fourth defect location information when the first vibration signal and the second vibration signal are within an error range when compared with the second reference vibration signal data. The control unit (40) can detect a defect location based on the acquisition time of the first vibration signal and the second vibration signal and generate the third defect location information. In addition, the control unit (40) can detect a defect location based on the amplitude of the first vibration signal and the second vibration signal and generate the fourth defect location information.

[0101] The operations of the above-described control unit (40) for generating the third defect location information and the fourth defect location information can be applied in the same or similar manner as the operations of generating the first defect location information and the second defect location information using an acoustic signal.

[0102] The control unit (40) can generate the second defect location estimation information based on the third defect location information and the fourth defect location information. For example, when both the first defect location estimation information and the second defect location estimation information are generated, the control unit (40) can generate the final defect location estimation information through a summation based on each weight. Specifically, for example, the final defect location estimation information may be an average value of the first defect location estimation information and the second defect location estimation information, or may be a calculated value in which different weights are applied to the first defect location estimation information and the second defect location estimation information.

[0103] As described above, the device (1) can estimate the defect location more precisely and accurately by further utilizing vibration signals.

[0104] According to the above-described device (1), defects in the measurement target can be effectively and accurately identified in real time, and the location of the defect can be accurately measured. Accordingly, losses resulting from defects in the measurement target can be effectively prevented.

[0105] FIG. 10 is an exemplary diagram showing objects to which a defect measuring device and measuring method according to one embodiment of the present invention can be applied.

[0106] The device (1) and the defect measurement method of the device (1) can be applied to various measurement objects such as railway facilities / vehicles, thermal power plants / turbines, fuel cells, press molding, motors / bearings, welding, general structures, pressure tanks, oil pipelines, gas pipelines, injection molding, valves / pumps, and 3D printing devices.

[0107] Accordingly, the device (1) can effectively and accurately estimate whether a defect has occurred and where the defect has occurred using only information / data measured by the sensor for various measurement targets.

[0108] Although the present invention has been described above with reference to limited embodiments and drawings, the present invention is not limited thereto, and various embodiments are possible within the scope equivalent to the technical idea of ​​the present invention and the patent claims to be described below by a person having ordinary skill in the art to which the present invention pertains.

[0109] [Explanation of symbols]

[0110] 1: Defect measuring device

[0111] 10: Acoustic sensor

[0112] 11: First acoustic sensor

[0113] 12: Second acoustic sensor

[0114] 20: Vibration sensor

[0115] 21: First vibration sensor

[0116] 22: Second vibration sensor

[0117] 30: Memory

[0118] 40: Control unit

Claims

1. A first acoustic sensor arranged on one end of a measurement target and configured to obtain a first acoustic signal generated from the measurement target; A second acoustic sensor arranged at the other end of the measurement object and configured to obtain a second acoustic signal generated from the measurement object; and It includes a control unit electrically connected to the first acoustic sensor and the second acoustic sensor, The above control unit, The first acoustic signal and the second acoustic signal are acquired in real time using the first acoustic sensor and the second acoustic sensor, Extracting acoustic parameters for each of the first acoustic signal and the second acoustic signal to obtain the first acoustic parameter and the second acoustic parameter, A defect measuring device that identifies a defect as occurring in the measurement target and generates defect identification information when the first comparison result of comparing the first acoustic parameter and the second acoustic parameter with the reference parameter, which is the acoustic parameter at the time of occurrence of a defect, is within the error range.

2. In claim 1, The above control unit, A defect measuring device that extracts acoustic parameters for each of the first acoustic signal and the second acoustic signal only when the amplitude value of each of the first acoustic signal and the second acoustic signal is greater than or equal to a threshold amplitude value, thereby obtaining the first acoustic parameter and the second acoustic parameter.

3. In claim 1, The above control unit, If it is identified that a defect has occurred in the measurement target through the above first comparison result, The first defect location information is generated by detecting the defect location based on the acquisition time of the first acoustic signal and the second acoustic signal, A defect location is detected based on the amplitude of the first acoustic signal and the second acoustic signal, and second defect location information is generated. A defect measuring device that generates first defect location estimation information based on the first defect location information and the second defect location information.

4. In claim 3, The above control unit, The first defect location information is generated by using the positions of each of the first acoustic sensor and the second acoustic sensor, the transmission speed of each of the first acoustic signal and the second acoustic signal, and the difference in acquisition time at which the first acoustic sensor and the second acoustic sensor acquire the first acoustic signal and the second acoustic signal, A defect measuring device that generates the second defect location information by using the positions of the first acoustic sensor and the second acoustic sensor, respectively, and the difference in amplitude between the first acoustic signal and the second acoustic signal.

5. In claim 4, The above control unit, A defect measurement device that generates the first defect location estimation information in a different manner depending on whether the second comparison result of comparing the first defect location information and the second defect location information is within the error range.

6. In claim 5, The above control unit, In generating the above first defect location estimation information, If the second comparison result is within the error range, the first defect location estimation information is generated as one of the defect location according to the first defect location information and the defect location according to the second defect location information, A defect measuring device that generates the first defect location estimation information as an average location of the first defect location information and the second defect location information when the second comparison result is outside the error range.

7. In claim 6, The above acoustic parameters are, A defect measuring device comprising at least one of an amplitude value, a duration during which the amplitude value is maintained above a threshold amplitude value, energy, a count of sections exceeding the threshold amplitude value, a rise time, and a peak frequency.

8. In claim 7, Further comprising a memory electrically connected to the control unit and configured to store the reference parameters, The above control unit, A defect measuring device that updates the reference parameter by reflecting an average parameter corresponding to the average of the first acoustic parameter and the second acoustic parameter in the reference parameter when the first comparison result of comparing the first acoustic parameter and the second acoustic parameter with the reference parameter, which is the acoustic parameter at the time of occurrence of a defect, is within the error range.

9. In claim 8, A first vibration sensor arranged on one end of the measurement object and configured to obtain a first vibration signal generated from the measurement object; and It further includes a second vibration sensor arranged at the other end of the measurement object to obtain a second vibration signal generated from the measurement object, The first vibration sensor and the second vibration sensor are electrically connected to the control unit, The above control unit, The first vibration signal and the second vibration signal are acquired in real time using the first vibration sensor and the second vibration sensor, A defect measuring device that generates defect risk information when there is a high possibility of a defect occurring in the measurement target based on a third comparison result obtained by comparing the first vibration signal and the second vibration signal with a reference vibration signal database related to defect occurrence, and generates defect occurrence information when a defect occurs in the measurement target.

10. In claim 9, The above reference vibration signal database is, First reference vibration signal data including vibration signal data for a specific period before a defect actually occurs; and A defect measuring device including second reference vibration signal data including vibration signal data according to the degree of defect when a defect actually occurs.

11. In claim 10, The above control unit, A defect measuring device that determines that there is a high possibility of a defect occurring in the measurement target and generates the defect risk information when the first vibration signal and the second vibration signal are within the error range when compared with the first reference vibration signal data and are outside the error range when compared with the second reference vibration signal data.

12. In claim 11, The above control unit, A defect measuring device that determines that a defect has occurred in the measurement target and generates the defect occurrence information when the first vibration signal and the second vibration signal are within the error range when compared with the second reference vibration signal data.

13. In claim 12, The above control unit, If the first vibration signal and the second vibration signal are within the error range when compared with the second reference vibration signal data, Based on the acquisition time of the first vibration signal and the second vibration signal, a defect location is detected and third defect location information is generated. A defect location is detected based on the amplitude of the first vibration signal and the second vibration signal, and fourth defect location information is generated. A defect measuring device that generates second defect location estimation information based on the third defect location information and the fourth defect location information.

14. In claim 13, The above control unit, A defect measurement device that generates final defect location estimation information through summation based on each weight when both the first defect location estimation information and the second defect location estimation information are generated.

15. In claim 14, It further includes a third acoustic sensor arranged between the first end and the second end of the measurement object to obtain a third acoustic signal generated from the measurement object. The third acoustic sensor is electrically connected to the control unit, The above control unit, Acquire the above third sound signal in real time, Extracting the acoustic parameters for the third acoustic signal to additionally obtain the third acoustic parameters, A defect measuring device that identifies a defect as occurring in the measurement target and generates the defect identification information when the first comparison result of comparing the first acoustic parameter, the second acoustic parameter, and the third acoustic parameter with the reference parameter is within the error range.

16. A first acoustic sensor positioned at one end of a measurement target to obtain a first acoustic signal generated from the measurement target, and an acoustic signal acquisition step positioned at the other end of the measurement target to obtain a second acoustic signal generated from the measurement target in real time; A parameter acquisition step for extracting acoustic parameters for each of the first acoustic signal and the second acoustic signal to acquire first acoustic parameters and second acoustic parameters; and A defect measurement method, comprising a defect identification step of identifying that a defect has occurred in the measurement object and generating defect identification information when the first comparison result of comparing the first acoustic parameter and the second acoustic parameter with the reference parameter, which is the acoustic parameter at the time of occurrence of a defect, is within the error range.

17. In claim 16, A defect location information generation step in which, when a defect is identified as occurring in the measurement target through the first comparison result, a defect location is detected based on the acquisition time of the first acoustic signal and the second acoustic signal to generate first defect location information, and a defect location is detected based on the amplitude of the first acoustic signal and the second acoustic signal to generate second defect location information; and A defect measurement method, comprising an estimation information generation step of generating first defect location estimation information as one of a defect location according to the first defect location information, a defect location according to the second defect location information, and an average location of the first defect location information and the second defect location information, when the second comparison result of comparing the first defect location information and the second defect location information is within the error range.

18. In claim 17, The above acoustic parameters are, A defect measurement method comprising at least one of an amplitude value, a duration during which the amplitude value is maintained above a threshold amplitude value, energy, a count of sections exceeding the threshold amplitude value, a rise time, and a peak frequency.

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