Method and apparatus for assessing aging state of silicone rubber, device and storage medium

Abstract

Disclosed in the present invention are a method and apparatus for assessing the aging state of silicone rubber, a device and a storage medium. The method comprises: acquiring permittivities of various silicone rubbers in different aging states, each permittivity comprising a direct current conduction component and a dielectric relaxation component; performing differential transformation on each permittivity to separate the direct current conduction component from the dielectric relaxation component in the permittivity, so as to remove the direct current conduction component and obtain a permittivity containing only the dielectric relaxation component, and, on the basis of the permittivity containing only the dielectric relaxation component, generating a dielectric spectrum corresponding to each of the silicone rubbers; and, on the basis of loss peaks in the dielectric spectra, analyzing and assessing the aging state of each of the silicone rubbers, so as to obtain the current aging state of each of the silicone rubbers to be assessed. The present invention can improve the accuracy of assessing the aging state of silicone rubber.

Description

A method, apparatus, device, and storage medium for assessing the aging condition of silicone rubber. Technical Field

[0001] This invention relates to the field of aging research technology for insulating materials, and in particular to a method, apparatus, equipment, and storage medium for assessing the aging status of silicone rubber. Background Technology

[0002] In recent years, silicone rubber has attracted much attention due to its high elasticity, wide temperature range, and excellent electrical properties, and it is increasingly used as a primary insulating material in power equipment. Currently, power equipment failures are frequent, partly due to the breakdown of silicone rubber, the primary insulating material; however, research on this aspect is limited. Breakdown of solid insulating materials is a gradual process, and aging is the main cause. Therefore, to improve the reliability of power equipment operation, it is essential to understand the aging state of silicone rubber, conduct a reasonable assessment of its aging state, and analyze its aging mechanism.

[0003] The assessment of the aging state of silicone rubber mainly relies on changes in its properties and structure. Currently, many modern instruments and equipment can be used for the assessment and diagnosis of the aging state of silicone rubber insulation materials, such as Fourier transform infrared spectroscopy and broadband dielectric spectrometry, providing a foundation for better evaluation of the state of silicone rubber insulation. However, since early dielectric degradation often manifests as an increase in the dielectric loss factor in the low-frequency range at higher temperatures, the low-frequency relaxation loss process is easily masked by the DC conductivity process during the assessment, failing to reflect the low-frequency dielectric process and affecting the accuracy of dielectric analysis. Summary of the Invention

[0004] This invention provides a method, apparatus, device, and storage medium for assessing the aging state of silicone rubber, in order to solve the technical problem that in existing dielectric analysis, the low-frequency relaxation loss process is easily masked by the DC conductivity process, and cannot accurately reflect the dielectric process of silicone rubber.

[0005] To address the aforementioned technical problems, embodiments of the present invention provide a method for evaluating the aging state of silicone rubber, comprising:

[0006] The dielectric constants of silicone rubber under several different aging states are obtained; wherein the dielectric constants include: a DC conductivity component and a dielectric relaxation component;

[0007] The dielectric constant is subjected to a differential transformation to separate the DC conductivity component from the dielectric relaxation component, thereby eliminating the DC conductivity component and obtaining a dielectric constant containing only the dielectric relaxation component. Based on the dielectric constant containing only the dielectric relaxation component, the dielectric spectrum corresponding to each of the silicone rubbers is generated.

[0008] The aging state of each silicone rubber is analyzed and evaluated based on the loss peaks in the dielectric spectrum to obtain the current aging state of each silicone rubber to be evaluated.

[0009] As a preferred embodiment, the dielectric constant of the silicone rubber to be evaluated is: ε * =ε'-jε”=ε ∞ +(ε s -ε ∞ ) / (1+jωτ)+σ dc / jωε0; ε'=ε ∞ +(ε s -ε ∞ ) / (1+ω 2 τ 2 ); ε”=[(ε s -ε ∞ )ωτ] / (1+ω 2 τ 2 );

[0010] Where, ε * ε' and ε" are the dielectric constants of the silicone rubber to be evaluated, respectively, where ε' and ε" are the real and imaginary parts of the dielectric constant. ∞ It is the spectral dielectric constant, ε s σ is the static dielectric constant, j is the imaginary unit, ω is the angular frequency of the electric field, τ is the relaxation time, and σ is the static dielectric constant. dc ε is the electrical conductivity, and ε0 is the vacuum permittivity.

[0011] As a preferred embodiment, the dielectric constant containing only the dielectric relaxation portion is:

[0012] in, It is the dielectric constant after differential transformation, which only contains the dielectric relaxation part.

[0013] As a preferred embodiment, the method for assessing the aging state of silicone rubber further includes:

[0014] The characteristic element content of each silicone rubber is obtained by X-ray photoelectron spectroscopy, and then the standard current aging state of each silicone rubber is obtained based on the characteristic element content.

[0015] The current aging state is compared with the standard current aging state, and the accuracy of the current aging state is verified based on the comparison results.

[0016] Based on the above embodiments, another embodiment of the present invention provides a silicone rubber aging state assessment device, including: a dielectric constant acquisition module, a differential transformation module, and an aging state assessment module;

[0017] The dielectric constant acquisition module is used to acquire the dielectric constant of silicone rubber in several different aging states; wherein, the dielectric constant includes: a DC conductivity component and a dielectric relaxation component;

[0018] The differential transformation module is used to perform differential transformation on the dielectric constant, separating the DC conductance part and the dielectric relaxation part of the dielectric constant, thereby eliminating the DC conductance part and obtaining a dielectric constant that only contains the dielectric relaxation part, and generating the dielectric spectrum corresponding to each of the silicone rubbers based on the dielectric constant that only contains the dielectric relaxation part.

[0019] The aging state assessment module is used to analyze and assess the aging state of each silicone rubber based on the loss peak in the dielectric spectrum, and obtain the current aging state of each silicone rubber to be assessed.

[0020] As a preferred embodiment, the dielectric constant of the silicone rubber to be evaluated is: ε * =ε'-jε”=ε ∞ +(ε s -ε ∞ ) / (1+jωτ)+σ dc / jωε0; ε'=ε ∞ +(ε s -ε ∞ ) / (1+ω 2 τ 2 ); ε”=[(ε s -ε ∞ )ωτ] / (1+ω 2 τ 2 );

[0021] Where, ε * ε is the dielectric constant, where ε' and ε” are the real and imaginary parts of the dielectric constant, respectively. ∞ It is the spectral dielectric constant, ε s σ is the static dielectric constant, j is the imaginary unit, ω is the angular frequency of the electric field, τ is the relaxation time, and σ is the static dielectric constant. dc ε is the electrical conductivity, and ε0 is the vacuum permittivity.

[0022] As a preferred embodiment, the dielectric constant containing only the dielectric relaxation portion is:

[0023] in, It is the dielectric constant after differential transformation, which only contains the dielectric relaxation part.

[0024] As a preferred embodiment, the silicone rubber aging state assessment device further includes: an accuracy verification module;

[0025] The accuracy verification module is used to obtain the characteristic element content of each silicone rubber obtained by X-ray photoelectron spectroscopy, and then obtain the standard current aging state of each silicone rubber through the characteristic element content.

[0026] The current aging state is compared with the standard current aging state, and the accuracy of the current aging state is verified based on the comparison results.

[0027] Based on the above embodiments, another embodiment of the present invention provides an electronic device, the device including a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein the processor executes the computer program to implement the silicone rubber aging state assessment method described in the above embodiments of the invention.

[0028] Based on the above embodiments, another embodiment of the present invention provides a storage medium, the storage medium including a stored computer program, wherein, when the computer program is running, it controls the device where the storage medium is located to execute the silicone rubber aging state assessment method described in the above embodiments of the invention.

[0029] Compared with the prior art, the embodiments of the present invention have the following beneficial effects:

[0030] This invention provides a method for evaluating the aging state of silicone rubber, which obtains the dielectric constants of silicone rubbers in several different aging states. The dielectric constant includes a DC conductivity component and a dielectric relaxation component. A differential transformation is performed on the dielectric constant to separate the DC conductivity component from the dielectric relaxation component, thereby eliminating the DC conductivity component and obtaining a dielectric constant containing only the dielectric relaxation component. Based on this dielectric constant containing only the dielectric relaxation component, a dielectric spectrum corresponding to each silicone rubber is generated. The aging state of each silicone rubber is analyzed and evaluated based on the loss peaks in the dielectric spectrum to obtain the current aging state of each silicone rubber to be evaluated.

[0031] Existing technologies using dielectric analysis to assess the aging state of silicone rubber suffer from several drawbacks. Firstly, the dielectric constant obtained using a dielectric spectrometer includes both DC conductivity and dielectric relaxation components. Secondly, the low-frequency relaxation loss process of silicone rubber is easily masked by the DC conductivity. Thirdly, early dielectric degradation often manifests as an increase in the dielectric loss factor in the low-frequency range at higher temperatures. This means existing dielectric analyses cannot reflect the low-frequency dielectric processes, affecting the accuracy of silicone rubber aging state assessment. To address this issue, this invention performs a differential transformation on the dielectric constant of silicone rubber to separate the DC conductivity and dielectric relaxation components. This process eliminates the DC conductivity component, resulting in a dielectric constant containing only the dielectric relaxation component. Then, a dielectric spectrum is generated based on this dielectric constant. The loss peaks in the dielectric spectrum allow for analysis and assessment of the silicone rubber's aging state, thus improving the accuracy of silicone rubber aging state assessment. Attached Figure Description

[0032] Figure 1 is a flowchart illustrating a method for evaluating the aging state of silicone rubber according to an embodiment of the present invention;

[0033] Figure 2 is a schematic diagram of silicone rubber samples under different aging conditions;

[0034] Figure 3 is a schematic diagram of the dielectric constant of silicone rubber insulating materials under different aging conditions;

[0035] Figure 4 shows the dielectric spectrum of silicone rubber obtained by mathematical differential transformation under different aging conditions;

[0036] Figure 5 is a schematic diagram of a silicone rubber aging state assessment device provided in an embodiment of the present invention. Detailed Implementation

[0037] To make the objectives, technical solutions, and advantages of this application clearer, the technical solutions of this application will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0038] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the application; the terms “comprising” and “having”, and any variations thereof, in the specification, claims, and foregoing description of the drawings are intended to cover non-exclusive inclusion.

[0039] In the description of the embodiments of this application, technical terms such as "first" and "second" are used only to distinguish different objects and should not be construed as indicating or implying relative importance or implicitly specifying the number, specific order, or primary and secondary relationship of the indicated technical features. In the description of the embodiments of this application, "multiple" means two or more, unless otherwise explicitly defined.

[0040] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0041] In the description of the embodiments in this application, the term "and / or" is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, and B existing alone. Additionally, the character " / " in this document generally indicates that the preceding and following related objects have an "or" relationship.

[0042] In the description of the embodiments of this application, the term "multiple" refers to two or more (including two), similarly, "multiple sets" refers to two or more (including two sets), and "multiple pieces" refers to two or more (including two pieces).

[0043] In the description of the embodiments of this application, unless otherwise expressly specified and limited, technical terms such as "installation," "connection," "joining," and "fixing" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. For those skilled in the art, the specific meaning of the above terms in the embodiments of this application can be understood according to the specific circumstances.

[0044] Example 1

[0045] Please refer to Figure 1, which is a flowchart illustrating a method for assessing the aging state of silicone rubber according to an embodiment of the present invention, including the following specific steps:

[0046] S1. Obtain the dielectric constant of silicone rubber under several different aging states; wherein, the dielectric constant includes: a DC conductivity component and a dielectric relaxation component;

[0047] Preferably, the dielectric constant of the silicone rubber to be evaluated is: ε * =ε'-jε”=ε∞ +(ε s -ε ∞ ) / (1+jωτ)+σ dc / jωε0; ε'=ε ∞ +(ε s -ε ∞ ) / (1+ω 2 τ 2 ); ε”=[(ε s -ε ∞ )ωτ] / (1+ω 2 τ 2 );

[0048] Where, ε * ε' and ε" are the dielectric constants of the silicone rubber to be evaluated, respectively, where ε' and ε" are the real and imaginary parts of the dielectric constant. ∞ It is the spectral dielectric constant, ε s σ is the static dielectric constant, j is the imaginary unit, ω is the angular frequency of the electric field, τ is the relaxation time, and σ is the static dielectric constant. dc ε is the electrical conductivity, and ε0 is the vacuum permittivity.

[0049] Specifically, for silicone rubber under different aging conditions, its dielectric constant is tested using a broadband dielectric spectrometer to obtain the dielectric constant of silicone rubber under different aging conditions.

[0050] In a specific embodiment, please refer to Figure 2, which is a schematic diagram of silicone rubber samples under different aging conditions. The silicone rubber samples obtained through accelerated thermal aging experiments can be divided into four batches and placed in a forced-air drying oven. The drying temperatures are set at 225, 250, 275, and 300°C, and thermal aging treatments are performed at five time gradients: 24, 48, 96, 336, and 504 hours, respectively, to obtain silicone rubber in different aging states. The dielectric constant is then measured using a broadband dielectric spectrometer. Please refer to Figure 3, which is a schematic diagram of the dielectric constant of silicone rubber insulating materials under different aging conditions. Figures (a)-(d) show the dielectric constants obtained after each group of silicone rubber samples underwent thermal aging treatments at drying temperatures of 225, 250, 275, and 300°C for five time gradients: 24, 48, 96, 336, and 504 hours, respectively.

[0051] The dielectric constant obtained by broadband dielectric spectrometry includes both DC conductivity and dielectric relaxation components. According to dielectric physics, the complex dielectric constant of a dielectric during a single relaxation process satisfies the Debye equation, as shown in equation (1). * =ε'-jε”=ε ∞ +(ε s -ε ∞ ) / (1+jωτ) ε'=ε ∞ +(ε s -ε∞ ) / (1+ω 2 τ 2 ) ε”=[(ε s -ε ∞ )ωτ] / (1+ω 2 τ 2 (1)

[0052] In equation (1), ε * ε is the complex permittivity, ε' and ε” are the real and imaginary parts of the complex permittivity, respectively. ∞ It is the spectral dielectric constant, ε s ω is the static dielectric constant, j is the imaginary unit, ω is the angular frequency of the electric field, and τ is the relaxation time.

[0053] However, in reality, the DC conduction process of a dielectric also generates dielectric loss, and the complex permittivity in this case is as shown in equation (2). * =ε'-jε”=ε ∞ +(ε s -ε ∞ ) / (1+jωτ)+σ dc / jωε0 (2)

[0054] In equation (2), σ dc ε is the electrical conductivity, and ε0 is the vacuum permittivity.

[0055] S2. Perform a differential transformation on the dielectric constant to separate the DC conductivity part from the dielectric relaxation part, thereby eliminating the DC conductivity part and obtaining a dielectric constant that only contains the dielectric relaxation part. Based on the dielectric constant that only contains the dielectric relaxation part, generate the dielectric spectrum corresponding to each of the silicone rubbers.

[0056] Preferably, the dielectric constant containing only the dielectric relaxation portion is:

[0057] in, It is the dielectric constant after differential transformation, which only contains the dielectric relaxation part.

[0058] Specifically, in response to the problem that the dielectric constant of silicone rubber obtained by dielectric spectrometer testing contains both DC conductivity and dielectric relaxation components, and that the low-frequency relaxation loss process of silicone rubber is easily masked by the DC conductivity process, this invention separates the low-frequency DC conductivity process from the dielectric relaxation process by performing a mathematical differential transformation on the real part of the complex dielectric constant, thereby eliminating the DC conductivity component and obtaining a dielectric constant that only contains the dielectric relaxation component. The transformed formula is shown in the following (3).

[0059] S3. Based on the loss peaks in the dielectric spectrum, the aging state of each silicone rubber is analyzed and evaluated to obtain the current aging state of each silicone rubber to be evaluated.

[0060] Specifically, for silicone rubber insulating materials under different aging states, after performing the aforementioned mathematical differentiation on the real part of the complex dielectric constant, a dielectric constant containing only the dielectric relaxation portion can be obtained. Based on this dielectric constant, a dielectric spectrum corresponding to each silicone rubber is generated, and corresponding loss peaks will be displayed in the respective dielectric spectrum. The aging state of the silicone rubber insulating material can then be evaluated by observing the changes in the loss peaks in the transformed dielectric spectrum. The loss peaks in the dielectric spectrum represent the intensity of molecular motion in the silicone rubber insulating material at a specific temperature. When silicone rubber ages, changes in its internal molecular structure lead to changes in the position and intensity of the loss peaks. Therefore, information about the degrees of freedom of molecular motion within the silicone rubber can be obtained by analyzing the changes in the loss peaks. For example, a decrease in the loss peak may indicate a reduction in molecular motion, while a broadening of the peak may indicate an increase in the diversity of motion types. Specifically, changes in the height, width, and position of the loss peaks can reflect changes in the loss peaks and serve as indicators for quantifying the degree of aging of the silicone rubber.

[0061] Since ε' is not affected by DC conductance, the parameter obtained by mathematical differential transformation has the significance of dielectric loss. It only includes the relaxation process, for Further differentiation reveals that in the applied electric field, the frequency relationship satisfies ωτ=1, and a peak will appear in the transformed dielectric spectrum, namely the loss peak, with a magnitude of (ε). s -ε ∞ ) / 2. Due to The absolute value of is proportional to the square of ε”, so its loss peak width is narrower than ε”, thus this method is more conducive to the analysis and characterization of aging state.

[0062] Please refer to Figure 4, which shows the dielectric spectrum obtained by mathematical differential transformation of the dielectric constant of silicone rubber under different aging conditions. Figures (a)-(d) are the dielectric spectra obtained after thermal aging treatment of each group of silicone rubber samples for 24, 48, 96, 336 and 504 h at drying temperatures of 225, 250, 275 and 300 °C, respectively, to obtain the dielectric constant, and then performing differential transformation on the obtained dielectric constant.

[0063] The dielectric spectrum curves obtained after mathematical differentiation show that although the loss peaks in the dielectric spectrum curves of unaged and silicone rubber samples at different aging degrees are not very obvious, the parameter with dielectric loss significance after differentiation decreases with increasing temperature. Furthermore, this parameter is not significantly affected by frequency changes in the high-frequency range, but gradually increases with aging time in the low-frequency range, and the curvature of the curve relating this parameter to frequency also decreases. Therefore, this dielectric spectroscopy analysis method provides a new approach for assessing the aging state of silicone rubber insulating materials.

[0064] Preferably, the method for assessing the aging state of silicone rubber further includes: obtaining the content of characteristic elements of each silicone rubber obtained by X-ray photoelectron spectroscopy, and then obtaining the standard current aging state of each silicone rubber based on the content of the characteristic elements; comparing the current aging state with the standard current aging state, and verifying the accuracy of the current aging state based on the comparison result.

[0065] Furthermore, in one specific embodiment, X-ray photoelectron spectroscopy (XPS) can be used to test the content of characteristic elements in silicone rubber samples under different aging conditions. Then, based on the content of these characteristic elements, the standard current aging state of each silicone rubber sample can be obtained. The current aging state is then compared with the standard current aging state, and the rationality and effectiveness of the method are verified based on the comparison results.

[0066] Therefore, this invention provides a method for assessing the aging state of silicone rubber. By performing a differential transformation on the dielectric constant of silicone rubber, the DC conductivity component and the dielectric relaxation component of the dielectric constant are separated, thereby eliminating the DC conductivity component and obtaining a dielectric constant containing only the dielectric relaxation component. Then, a dielectric spectrum corresponding to the silicone rubber is generated based on the dielectric constant containing only the dielectric relaxation component. The aging state of the silicone rubber can be analyzed and assessed based on the loss peaks in the dielectric spectrum, thus obtaining the current aging state of the silicone rubber to be assessed and improving the accuracy of silicone rubber aging state assessment.

[0067] Example 2

[0068] Please refer to Figure 5, which is a structural schematic diagram of a silicone rubber aging state assessment device provided in an embodiment of the present invention. The device includes: a dielectric constant acquisition module, a differential transformation module, and an aging state assessment module.

[0069] The dielectric constant acquisition module is used to acquire the dielectric constant of silicone rubber in several different aging states; wherein, the dielectric constant includes: a DC conductivity component and a dielectric relaxation component;

[0070] The differential transformation module is used to perform differential transformation on the dielectric constant, separating the DC conductance part and the dielectric relaxation part of the dielectric constant, thereby eliminating the DC conductance part and obtaining a dielectric constant that only contains the dielectric relaxation part, and generating the dielectric spectrum corresponding to each of the silicone rubbers based on the dielectric constant that only contains the dielectric relaxation part.

[0071] The aging state assessment module is used to analyze and assess the aging state of each silicone rubber based on the loss peak in the dielectric spectrum, and obtain the current aging state of each silicone rubber to be assessed.

[0072] Preferably, the dielectric constant of the silicone rubber to be evaluated is: ε * =ε'-jε”=ε ∞ +(ε s -ε ∞ ) / (1+jωτ)+σ dc / jωε0; ε'=ε ∞ +(ε s -ε ∞ ) / (1+ω 2 τ 2 ); ε”=[(ε s -ε ∞ )ωτ] / (1+ω 2 τ 2 );

[0073] Where, ε * ε is the dielectric constant, where ε' and ε” are the real and imaginary parts of the dielectric constant, respectively. ∞ It is the spectral dielectric constant, ε s σ is the static dielectric constant, j is the imaginary unit, ω is the angular frequency of the electric field, τ is the relaxation time, and σ is the static dielectric constant. dc ε is the electrical conductivity, and ε0 is the vacuum permittivity.

[0074] Preferably, the dielectric constant containing only the dielectric relaxation portion is:

[0075] in, It is the dielectric constant after differential transformation, which only contains the dielectric relaxation part.

[0076] Preferably, the silicone rubber aging condition assessment device further includes: an accuracy verification module;

[0077] The accuracy verification module is used to obtain the characteristic element content of each silicone rubber obtained by X-ray photoelectron spectroscopy, and then obtain the standard current aging state of each silicone rubber through the characteristic element content.

[0078] The current aging state is compared with the standard current aging state, and the accuracy of the current aging state is verified based on the comparison results.

[0079] It should be noted that the device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs. Furthermore, in the accompanying drawings of the device embodiments provided by this invention, the connection relationships between modules indicate that they have communication connections, which can be specifically implemented as one or more communication buses or signal lines. Those skilled in the art can understand and implement this without any creative effort.

[0080] Those skilled in the art will clearly understand that, for convenience and simplicity, the specific working process of the device described above can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0081] Example 3

[0082] Accordingly, embodiments of the present invention provide an electronic device, the device including a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein the processor executes the computer program to implement the silicone rubber aging state assessment method described in the above embodiments of the invention.

[0083] The electronic device may be a desktop computer, laptop, handheld computer, or cloud server, etc. The device may include, but is not limited to, a processor and a memory.

[0084] The processor can be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor can be a microprocessor or any conventional processor. The processor is the control center of the device, connecting various parts of the device via various interfaces and lines.

[0085] Example 4

[0086] Accordingly, embodiments of the present invention provide a storage medium, the storage medium including a stored computer program, wherein, when the computer program is running, it controls the device where the storage medium is located to execute the silicone rubber aging state assessment method described in the above embodiments of the invention.

[0087] The memory can be used to store the computer program. The processor implements various functions of the device by running or executing the computer program stored in the memory and calling data stored in the memory. The memory may mainly include a program storage area and a data storage area. The program storage area may store the operating system, applications required for at least one function, etc.; the data storage area may store data created based on the use of the mobile phone, etc. In addition, the memory may include high-speed random access memory, and may also include non-volatile memory, such as hard disk, RAM, plug-in hard disk, smart media card (SMC), secure digital (SD) card, flash card, at least one disk storage device, flash memory device, or other volatile solid-state storage device.

[0088] The storage medium is a computer-readable storage medium, and the computer program is stored in the computer-readable storage medium. When executed by a processor, the computer program can implement the steps of the various method embodiments described above. The computer program includes computer program code, which can be in the form of source code, object code, executable file, or some intermediate form. The computer-readable medium can include: any entity or device capable of carrying the computer program code, recording media, USB flash drive, portable hard drive, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electrical carrier signals, telecommunication signals, and software distribution media, etc. It should be noted that the content included in the computer-readable medium can be appropriately added or removed according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, the computer-readable medium does not include electrical carrier signals and telecommunication signals.

[0089] The above description represents the preferred embodiments of the present invention. It should be noted that those skilled in the art can make various improvements and modifications without departing from the principles of the present invention, and these improvements and modifications are also considered to be within the scope of protection of the present invention.

Claims

1. A method for assessing the aging state of silicone rubber, characterized in that, include: The dielectric constants of silicone rubber under several different aging states are obtained; wherein the dielectric constants include: a DC conductivity component and a dielectric relaxation component; The dielectric constant is subjected to a differential transformation to separate the DC conductivity component from the dielectric relaxation component, thereby eliminating the DC conductivity component and obtaining a dielectric constant containing only the dielectric relaxation component. Based on the dielectric constant containing only the dielectric relaxation component, the dielectric spectrum corresponding to each of the silicone rubbers is generated. The aging state of each silicone rubber is analyzed and evaluated based on the loss peaks in the dielectric spectrum to obtain the current aging state of each silicone rubber to be evaluated.

2. The method for assessing the aging state of silicone rubber as described in claim 1, characterized in that, The dielectric constant of the silicone rubber to be evaluated is: ε * = ε'-jε” = ε ∞ +(ε s -ε ∞ ) / (1 + jωτ)+σ dc / jωε0; ε' = ε ∞ +(ε s -ε ∞ ) / (1 + ω 2 τ 2 ); ε” = [(ε s -ε ∞ )ωτ] / (1 + ω 2 τ 2 ); Where, ε * ε' and ε" are the dielectric constants of the silicone rubber to be evaluated, respectively, where ε' and ε" are the real and imaginary parts of the dielectric constant. ∞ It is the spectral dielectric constant, ε s σ is the static dielectric constant, j is the imaginary unit, ω is the angular frequency of the electric field, τ is the relaxation time, and σ is the static dielectric constant. dc ε is the electrical conductivity, and ε0 is the vacuum permittivity.

3. The method for assessing the aging state of silicone rubber as described in claim 2, characterized in that, The dielectric constant containing only the dielectric relaxation portion is: in, It is the dielectric constant after differential transformation, which only contains the dielectric relaxation part.

4. The method for assessing the aging state of silicone rubber as described in claim 1, characterized in that, Also includes: The characteristic element content of each silicone rubber is obtained by X-ray photoelectron spectroscopy, and then the standard current aging state of each silicone rubber is obtained based on the characteristic element content. The current aging state is compared with the standard current aging state, and the accuracy of the current aging state is verified based on the comparison results.

5. A device for assessing the aging condition of silicone rubber, characterized in that, include: Dielectric constant acquisition module, differential transformation module, and aging state assessment module; The dielectric constant acquisition module is used to acquire the dielectric constant of silicone rubber in several different aging states; wherein, the dielectric constant includes: a DC conductivity component and a dielectric relaxation component; The differential transformation module is used to perform differential transformation on the dielectric constant, separating the DC conductance part and the dielectric relaxation part of the dielectric constant, thereby eliminating the DC conductance part and obtaining a dielectric constant that only contains the dielectric relaxation part, and generating the dielectric spectrum corresponding to each of the silicone rubbers based on the dielectric constant that only contains the dielectric relaxation part. The aging state assessment module is used to analyze and assess the aging state of each silicone rubber based on the loss peak in the dielectric spectrum, and obtain the current aging state of each silicone rubber to be assessed.

6. The silicone rubber aging condition assessment device as described in claim 5, characterized in that, The dielectric constant of the silicone rubber to be evaluated is: ε * = ε' - jε'' = ε ∞ +(ε s - ε ∞ ) / (1 + jωτ) + σ dc / jωε0; ε' = ε ∞ +(ε s - ε ∞ ) / (1 + ω 2 τ 2 ); ε'' = [(ε s - ε ∞ )ωτ] / (1 + ω 2 τ 2 ); Where, ε * ε is the dielectric constant, where ε' and ε” are the real and imaginary parts of the dielectric constant, respectively. ∞ It is the spectral dielectric constant, ε s σ is the static dielectric constant, j is the imaginary unit, ω is the angular frequency of the electric field, τ is the relaxation time, and σ is the static dielectric constant. dc ε is the electrical conductivity, and ε0 is the vacuum permittivity.

7. The silicone rubber aging condition assessment device as described in claim 5, characterized in that, The dielectric constant containing only the dielectric relaxation portion is: in, It is the dielectric constant after differential transformation, which only contains the dielectric relaxation part.

8. The silicone rubber aging condition assessment device as described in claim 5, characterized in that, Also includes: Accuracy verification module; The accuracy verification module is used to obtain the characteristic element content of each silicone rubber obtained by X-ray photoelectron spectroscopy, and then obtain the standard current aging state of each silicone rubber through the characteristic element content. The current aging state is compared with the standard current aging state, and the accuracy of the current aging state is verified based on the comparison results.

9. An electronic device, characterized in that, The device includes a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein the processor, when executing the computer program, implements the silicone rubber aging state assessment method as described in any one of claims 1 to 4.

10. A storage medium, characterized in that, The storage medium includes a stored computer program, wherein, when the computer program is executed, it controls the device containing the storage medium to perform the silicone rubber aging state assessment method as described in any one of claims 1 to 4.

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