Device and method for optimizing delay in an electrical device

Abstract

A device (100) and method (400) for optimizing delay in an electrical device (100). The electrical device (100) comprises a microcontroller (102), and a power source (112). The microcontroller (102) is configured to determine optimal delay required by the electrical device (100) for performing a specific operation at a specific ambient temperature. The microcontroller (102) is configured to store, in a memory unit (106), the determined optimal delay required by the electrical device 100 for each of the operations performed at different ambient temperatures. The microcontroller (102) is further configured to retrieve from the memory unit (106), optimum delay required by the electrical device (100) and perform the operation based on the retrieved optimal delay.

Description

[0001] Description

[0002] DEVICE AND METHOD FOR OPTIMIZING DELAY IN AN ELECTRICAL DEVICE

[0003] The present invention relates to a field of monitoring electrical devices in process industries, and more particularly to a method for optimizing delay in an electrical device when performing operations that require higher current than the average current consumed by the electrical device.

[0004] It is common knowledge that technological advancement in the field of electronics has led to a radical shift in the way modern-day industries operate. Particularly, use of various electrical and electronic devices in process industries enables precise control over the process by continuously monitoring operational parameters of the processes. Further, appropriate actions are taken based on the monitored operational parameters thereby improving the efficiency of the processes.

[0005] The electrical devices typically comprise electronic components such as microcontrollers, volatile / non-volatile memory, sensors, microprocessors, power sources such as capacitors / battery, so on and so forth. These devices typically require low electric current (<270 pA) for its operation. However, these low power devices are configured perform certain power-intensive operations that require higher current (>20000 pA). Some of the power-intensive operations that are performed by the electrical device includes radio transmission, flashing of memory or the like. The electrical devices include power source that supplies high electrical current to the components of the electrical device whenever the power-intensive operations are performed. However, after discharging, the power source needs some delay or time for charging before performing the next operation.

[0006] In the existing solution, the power source is connected to cascaded power converters for handling the surge in the power demand from the components of the electrical device. Further, a feedback mechanism is employed to monitor the power source charge level to avoid complete discharge of the power source. The feedback mechanism is used to provide a delay or sleep time for the components of the electrical device such that during this delay, the power source is charged back to its full capacity.

[0007] Such configuration of providing cascaded power converters and providing hardware-based feedback mechanism results in poor efficiency and affects the performance of the electrical device.

[0008] In view of the foregoing, there is a need for an improved technique for optimizing delay in an electrical device. Therefore, it is an object of the present invention to provide an electrical device with optimized delay and a method for optimizing delay in an electrical device.

[0009] The object of the present invention is achieved by an electrical device comprising a microcontroller comprising at least one processor unit, and a memory unit communicatively coupled to the one or more processor units. The memory unit comprises one or modules stored in the form of machine-readable instructions executable by the one or more processing units. The one or more modules are configured to perform method steps.

[0010] The object of the current invention is achieved by providing an electrical device with optimized delay. The electrical device comprises a microcontroller, and a power source. The microcontroller further comprises at least one processor unit configured to perform a set of operations, a sensor configured to measure at least one environmental parameter such as ambient temperature, and a memory unit. The power source is electrically connected to the microcontroller and configured to supply electric power to the microcontroller. The set of operations performed by the microcontroller includes wireless communication, erasing of volatile memory, or any other similar operation that require higher current compared to average current consumption of the electrical device.

[0011] According to an embodiment, the microcontroller is further configured to determine optimal delay required by the electrical device for performing a specific operation at a specific ambient temperature. The microcontroller is further configured to determine optimal delay required by the electrical device for performing a specific operation at a specific ambient temperature, by performing the specific operation at the specific ambient temperature for different delay values.

[0012] According to an embodiment, the microcontroller is configured to determine optimal delay required by the electrical device using the ambient temperature and an ageing factor associated with the electrical device. Advantageously, considering ageing factor as an input to determine optimal delay enables in accurate determination of optimal delay. The reason being, electrical devices, as they age, tend to consume more electrical current for performing an operation. Therefore, ageing factor also plays a vital role in the delay required by the electrical device.

[0013] According to an embodiment, the microcontroller is configured to store, in the memory unit, optimal delay required by the electrical device for performing a specific operation at a specific ambient temperature. According to an embodiment, the microcontroller is configured to retrieve, from the memory unit, optimum delay required by the electrical device, for performing the specific operation at the specific temperature.

[0014] According to an embodiment, the microcontroller is configured to perform the specific operation with the optimum delay by drawing electric power from the power source. According to an embodiment, the set of operations performed by the microcontroller includes wireless communication, erasing of volatile memory, or any other similar operation that require higher current compared to average current consumption of the electrical device.

[0015] Advantageously, performing an operation at a given temperature using the optimal delay enables improving the operating efficiency of the electrical device, wherein use of higher delay values for operating the electrical device is avoided.

[0016] According to an embodiment, the lowest delay value for performing the specific operation at the specific ambient temperature is determined as optimal delay for the specific operation at the specific ambient temperature.

[0017] According to an embodiment, microcontroller is configured to perform an operation at the highest delay required by the electrical device, wherein the highest delay is delay of the electrical device when the ambient temperature is at a maximum threshold temperature.

[0018] The microcontroller is configured to iteratively reduce the delay of the electrical device and perform the operation for the reduced delay of the electrical device until the electrical device encounters a reset or stop operation. The microcontroller is configured to select the delay value that precedes the delay value for which the electrical device encounters a reset or stop operation, as the optimal delay of the electrical device.

[0019] The object of the current invention is achieved by providing method for optimizing delay in an electrical device comprising a microcontroller. The method comprises receiving, by the microcontroller, data relating to environmental parameter such as ambient temperature. The electrical device may comprise sensors to monitor environmental parameters and communicate the data relating to environmental parameters with the microcontroller.

[0020] The method comprises determining, by the microcontroller, optimal delay for performing an operation at different ambient temperatures. The step of determining, by the microcontroller, optimal delay for performing an operation at different ambient temperatures further comprises performing the operation at different ambient temperatures, by the microcontroller, for different delay values of the electrical device. The step of performing the operation at different ambient temperatures comprises performing the operation at an ambient temperature for the highest delay value of the electrical device corresponding to that operation. Further, the step comprises iteratively reducing the delay and performing the operation at the ambient temperature until the electrical device encounters a reset or stop operation. The step further comprises selecting the delay value that is preceding the delay value for which the electrical device encounters a reset or stop operation, as the optimal delay value of the electrical device.

[0021] According to an embodiment, the highest delay value of the electrical device corresponding to that specific ambient temperature is obtained from a historical data.

[0022] The method comprises identifying, by the microcontroller, the lowest delay for performing the operation at each of the ambient temperatures.

[0023] The method comprises storing, in a memory unit of the electrical device, the optimum delay for performing a desired operation at the measured ambient temperature.

[0024] The method comprises retrieving, from the memory unit, the optimum delay for performing a desired operation at the measured ambient temperature. In one aspect, the lowest delay for performing the operation at each of the ambient temperatures, without the electrical device encountering a reset or stop operation, is the optimal delay.

[0025] The method comprises performing, by the microcontroller, the desired operation with the optimum delay by drawing electric power from a power source that is electrically connected to the microcontroller.

[0026] Advantageously, determining optimum delay and performing an operation using the optimum delay improves the efficiency of the electrical device, wherein such technique negates the usage of higher delay for operating the electrical device.

[0027] The object of the present invention may also be achieved by a computer-program product, having machine-readable instructions stored therein, that when executed by a processor(s), cause the processor(s) to perform the foregoing method.

[0028] The object of the present invention may also be achieved by a computer-readable storage medium comprising instructions which, when executed by one or more processing units cause the one or more processing units to perform foregoing method.

[0029] The present invention is further described hereinafter with reference to illustrated embodiments shown in the accompanying drawings, in which: FIG 1 illustrates a block diagram of an electrical device with optimized delay, in accordance with an embodiment of the present invention;

[0030] FIG 2 illustrates a graphical representation of current consumption at different ambient temperatures, in accordance with an embodiment of the present invention;

[0031] FIG 3 illustrates a graphical representation of current consumption and delays in electrical device, in accordance with an embodiment of the present invention;

[0032] FIG 4 illustrates an exemplary method for optimizing delay in an electrical device, in accordance with an embodiment of the present invention; and

[0033] FIG 5 illustrates an exemplary method for determining optimal delay for performing an operation at different ambient temperatures, in accordance with an embodiment of the present invention.

[0034] Hereinafter, embodiments for carrying out the present invention are described in detail. The various embodiments are described with reference to the drawings, wherein like reference numerals are used to refer to like elements throughout. In the following description, for purpose of explanation, numerous specific details are set forth in order to provide a thorough understanding of one or more embodiments. It may be evident that such embodiments may be practiced without these specific details.

[0035] FIG 1 is a block diagram of an electrical device 100 with an optimized delay, in accordance with an implementation. The electrical device 100 may be implemented in an industrial environment to monitor parameters. As an example, the electrical device 100 may be implemented in a process industry to monitor fluid level in a storage tank. The electrical device 100 may monitor the desired parameter and communicate the measured parameter wirelessly to a central control system such as SCADA.

[0036] The electrical device 100 comprises a microcontroller 102, and a power source 112. The power source 112 is electrically connected to the microcontroller 102. The power source 112 may be a capacitor or a battery that is additionally provided in the electrical device 100 to power the components of the electrical device 100.

[0037] The power source 1 12 may be an external source that is not included within the electrical device 100. Referring to FIG. 1 , the microcontroller 102 further comprises at least one processor unit 104, a memory unit 106, a sensor 108, and a communication unit 110. The processor unit 104 is configured to perform a set of operations as required.

[0038] In one aspect, the set of operations performed by the processor unit 104 may include powerintensive operations such as, but not limited to, wireless communication, erasing of volatile memory, or any other similar operation. The power-intensive operations consume higher electric current compared to the maximum input current of the electrical device 100. As an example, the maximum input current of the electrical device 100 may be 270 pA and the current consumption for performing power-intensive operations may be 20000 pA.

[0039] The processor unit 104, as used herein, means any type of computational circuit, such as, but not limited to, a microprocessor unit 104, microcontroller 102, complex instruction set computing microprocessor unit 104, reduced instruction set computing microprocessor unit 104, very long instruction word microprocessor unit 104, explicitly parallel instruction computing microprocessor unit 104, graphics processing unit, digital signal processing unit, or any other type of processing circuit. The processor unit 104 may also include embedded controllers, such as generic or programmable logic devices or arrays, application specific integrated circuits, single-chip computers, or the like.

[0040] The memory unit 106 may be non-transitory volatile memory and non-volatile memory. The memory unit 106 may be coupled for communication with the processor unit 104, such as being a computer-readable storage medium. The processor unit 104 may execute machine-readable instructions and / or source code stored in the memory unit 106. A variety of machine-readable instructions may be stored in and accessed from the memory unit 106. The memory unit 106 may include any suitable elements for storing data and machine-readable instructions, such as read only memory, random access memory, erasable programmable read only memory, electrically erasable programmable read only memory, a hard drive, a removable media drive for handling compact disks, digital video disks, diskettes, magnetic tape cartridges, memory cards, and the like.

[0041] The sensor 108 is configured to measure at least one environmental parameter such as ambient temperature. In certain implementations, the sensor 108 may be configured to measure parameters such as humidity, wind speed so on and so forth. The sensor 108 may communicate the measured parameter with the processor unit 104, wherein the processor unit 104 may receive the measured parameter as input for performing operations. The communication unit 110 of the microcontroller 102 may enable communication of data between the microcontroller 102 and a central control system such as SCADA. The communication unit 1 10 may communicate with the central control system via wired or wireless means. The communication unit 110 may enable wireless communication via Bluetooth, Wi-Fi, or any other similar wireless technologies.

[0042] The microcontroller 102 is configured to determine optimal delay required by the electrical device 100 for performing a specific operation at a specific ambient temperature as measured by the sensor 108.

[0043] The term “delay” herein may refer to the time gap between the two instances of operations performed by the microcontroller 102. Referring to FIG 2, illustrated is a graphical representation 200 of current consumption at different ambient temperatures, in accordance with an embodiment of the present invention The graphical representation 200 is a plot representing the current consumed by the electrical device 100 while performing power-intensive operations. The delay between performing the operations, particularly power-intensive operations, enables in the charging back the power source 112 after performing the power-intensive operation so that the power source 112 is ready to supply current from the next instance of the power-intensive operation.

[0044] In addition, the current consumed by the electrical device 100 is dependent on the ambient temperature of the environment in which the electrical device 100 operates. The increase in ambient temperature increases the current consumed by the electrical device 100. Referring to FIG 3 illustrated is a graphical representation 300 of current consumption and delays in electrical device, in accordance with an embodiment of the present invention. The graphical representation 300 depicts a plot of current consumption for different ambient temperatures. As seen from FIG. 3, the electrical device 100 performs multiple power-intensive operations A, B, C, and D. Each of the operations consume different amount of electric current at different ambient temperatures. An example is depicted in FIG. 3, wherein the electric current for performing an operation at 40°C and 80°C are provided. The electric current required for performing an operation at 40°C is lesser than electric current required to perform the same operation at 80°C. Therefore, it is apparent that ambient temperature plays a vital role in the amount of electric current consumed for performing an operation. To avoid the failure of electrical device 100 when operating at higher ambient temperature, a buffer current value is provided, and the electrical device 100 is designed to operate at the buffer electric current value.

[0045] From the foregoing, it is understood that ambient temperature influences the current consumption for performing operations. Further, the amount of current consumed by the electrical device 100 when performing power-intensive operations affects the delay of the electrical device 100. Therefore, the ambient temperature at which the electrical device 100 is operating plays a significant role in delay required by the electrical device 100.

[0046] The microcontroller 102 determines the optimal delay required by the electrical device 100 for each of the operations at different ambient temperatures. The microcontroller 102 performs one of the operations at one ambient temperature for different delay values. As an example, the microcontroller 102 may perform operation A at an ambient temperature of 25°C for different delay values such as 100ms, 90 ms, 80 ms so on and so forth. Further, the microcontroller 102 determines the optimal delay value among the different delay values using a technique that is described hereunder.

[0047] The microcontroller 102 performs the operation at an ambient temperature for a highest possible delay value. The highest delay value is typically the delay value required by the electrical device 100 for performing the operation when the electrical device 100 is operating at a maximum threshold ambient temperature. As an example, the maximum threshold ambient temperature may be in the range of 80°C - 100°C, and the delay value required by the electrical device 100 at that ambient temperature to perform the operation may be chosen as the highest possible delay value. Further, the microcontroller 102 iteratively reduces the delay value and performs the operation at the same ambient temperature for the reduced delay of the electrical device 100 until the electrical device 100 encounters a reset or stop operation.

[0048] The microcontroller 102 may monitor whether the reset or stop operation is initiated before a predetermined time limit. If the electrical device 100 encounters a reset or stop operation for a delay value, the microcontroller 102 selects the delay value that precedes the delay value for which the electrical device 100 encountered a reset or stop operation, as the optimal delay of the electrical device 100.

[0049] The lowest delay value for performing a specific operation at the specific ambient temperature is determined as optimal delay for the specific operation at the specific ambient temperature.

[0050] The following table shows an example of determination of optimal delay value for different powerintensive operations performed by the microcontroller 102.

[0051] Table 1

[0052] From the table, it is apparent that the optimal delay value for Flash write operation at 25°C is 90 ms. Similarly, optimal delay values for other operations are also determined. The values provided in the table are merely examples, and actual values may change based on the device and operating conditions.

[0053] In certain embodiments, the microcontroller 102 is configured to determine the optimal delay based on ambient temperature and an ageing factor associated with the electrical device 100. Age of the electrical device 100 has an influence on the current consumed by the electrical device 100. Therefore, considering the aging factor to determine the optimal delay of the electrical device 100 aids in refining the optimal delay required by the electrical device 100.

[0054] As an example, for two similar electrical devices, the aging factor of the individual components of the electrical devices influences the overall power consumption of the electrical device. Therefore, for similar electrical devices the optimal delay may vary depending on the aging factor for individual components of the electrical devices.

[0055] The microcontroller 102 is configured to store, in the memory unit 106, the determined optimal delay required by the electrical device 100 for each of the operations performed at different ambient temperatures. The optimal delay values may be stored in the memory unit 106 as a lookup table.

[0056] The determined optimal delay values may be stored in the memory unit 106 as a multidimensional array.

[0057] The microcontroller 102 is configured to retrieve, from the memory unit 106, optimum delay required by the electrical device 100 for performing the specific operation at the specific temperature by the processor unit 104. Upon retrieving the optimal delay required by the power source, the microcontroller 102 may perform the operation based on the optimal delay for performing the specific operation at that specific ambient temperature.

[0058] During the working of the electrical device 100, the microcontroller 102 receives the data relating to ambient temperature from the sensor 108. Based on the operation to be performed, the microcontroller 102 may retrieve the optimal delay stored in the lookup table in the memory unit 106 for the corresponding operation, and the ambient temperature. The microcontroller 102 may then perform the operation based on the retrieved optimal delay required by the electrical device 100.

[0059] Referring to FIG 4, illustrated is an exemplary method for optimizing delay in an electrical device 100, in accordance with an embodiment of the present invention.

[0060] At step 402, data relating to environmental parameter such as ambient temperature is received by the microcontroller 102 of the electrical device 100. The microcontroller 102 comprises a sensor 108 that is configured to measure the ambient temperature.

[0061] At step 404, the optimal delay required by the electrical device 100 for performing an operation at different ambient temperatures is determined by the microcontroller 102. The method of determining optimal delay for performing an operation is explained in FIG. 5.

[0062] At step 406, the optimum delay for performing a desired operation at the measured ambient temperature is stored in the memory unit 106.

[0063] At step 408, the optimum delay for performing a desired operation at the measured ambient temperature is retrieved from the memory unit 106.

[0064] At step 410, the desired operation is performed with the retrieved optimum delay by drawing electric power from the power source 1 12 that is electrically connected to the microcontroller 102.

[0065] Referring to FIG 5, illustrated is an exemplary method for determining optimal delay for performing an operation at different ambient temperatures, in accordance with an embodiment of the present invention.

[0066] At step 502, the operation is performed at different ambient temperatures, by the microcontroller 102, for different delay values of the electrical device 100. The microcontroller 102 begins by performing the operation at an ambient temperature for the highest delay value of the electrical device 100 corresponding to that operation. Further, the delay value is iteratively reduced, and the operation is performed until the electrical device 100 encounters a reset or stop operation.

[0067] The highest delay value of the electrical device 100 corresponding to that specific ambient temperature is obtained from a historical data. As explained earlier, the highest delay value is typically the delay value required by the electrical device 100 for performing the operation when the electrical device 100 is operating at a maximum threshold ambient temperature. As an example, the maximum threshold ambient temperature may be in the range of 80°C - 100°C, and the delay value required by the electrical device 100 at that ambient temperature to perform the operation may be chosen as the highest possible delay value.

[0068] At step 504, the lowest delay for performing the operation at each of the ambient temperatures is identified by the microcontroller 102. The lowest delay value that is preceding the delay value for which the electrical device 100 encountered a reset or stop operation, is selected as the optimal delay value of the electrical device 100.

[0069] The disclosed invention offers a solution for optimizing delay in low power devices with strict input power constraints. Typically, these devices consume less electric power for its working. However, certain operations performed by these devices require high current. In such instances, a power source 1 12 such as battery or capacitor provides the high current required for performing the operation. Further, a delay must be provided for the power source 1 12 for it to charge back to its full capacity so that the operation can be performed again. The present invention enables in accurately determining the optimal delay, so that the power source 1 12 can be charged back to its full capacity.

[0070] The present invention determines optimal delay required by the electrical device 100 for performing different operations and different ambient temperatures. This data is stored in a database and used to perform operations with optimal delay. The present invention improves the operational efficiency of the low power devices with strict input power constraints.

[0071] While the invention has been illustrated and described in detail with the help of a preferred embodiments, the invention is not limited to the disclosed examples. Other variations may be deducted by those skilled in the art without leaving the scope of protection of the claimed invention. List of references

[0072] 100 Electrical device

[0073] 102 Microcontroller 104 Processor unit

[0074] 106 Memory unit

[0075] 108 Sensor

[0076] 110 Communication unit

[0077] 112 Power source 200 graphical representation of current consumption at different ambient temperatures

[0078] 300 graphical representation of current consumption and delays in electrical device

[0079] 400 exemplary method for optimizing delay in an electrical device

[0080] 500 exemplary method for determining optimal delay for performing an operation at different ambient temperatures

Claims

Claims1. An electrical device (100) with optimized delay, the electrical device (100) comprising: a microcontroller (102), wherein the microcontroller (102) comprises: at least one processor unit (104) configured to perform a set of operations; a sensor (108) configured to measure at least one environmental parameter such as ambient temperature; and a memory unit (106); and a power source (1 12) electrically connected to the microcontroller (102) and configured to supply electric power to the microcontroller (102); wherein the microcontroller (102) is configured to: determine optimal delay required by the electrical device (100) for performing a specific operation at a specific ambient temperature as measured by the sensor (108); store, in the memory unit (106), optimal delay required by the electrical device (100) for performing a specific operation at a specific ambient temperature; retrieve, from the memory unit (106), optimum delay required by the electrical device (100), for performing the specific operation at the specific temperature; and perform the specific operation with the optimum delay by drawing electric power from the power source (112).

2. The electrical device according to claim 1 , wherein microcontroller (102) is configured to determine optimal delay required by the electrical device (100) for performing a specific operation at a specific ambient temperature, by performing the specific operation at the specific ambient temperature for different delay values.

3. The electrical device according to any of the preceding claims, wherein the microcontroller (102) is configured to determine the optimal delay based on the ambient temperature and an ageing factor associated with the electrical device (100).

4. The electrical device according to any of the preceding claims, wherein the lowest delay value for performing the specific operation at the specific ambient temperature is determined as optimal delay for the specific operation at the specific ambient temperature.

5. The electrical device according to any of the preceding claims, wherein the set of operations performed by the microcontroller (102) includes wireless communication, erasing of volatilememory, or any other similar operation that require higher current compared to average input current consumption of the electrical device (100).

6. The electrical device according to any of the preceding claims, wherein the microcontroller (102) is further configured to: perform an operation at the highest delay of the electrical device (100), wherein the highest delay is the delay required by the electrical device (100) when the ambient temperature is at a maximum threshold temperature; iteratively reduce the delay required by the electrical device (100) and perform the operation for the reduced delay of the electrical device (100) until the electrical device (100) encounters a reset or stop operation; select the delay value that precedes the delay value for which the electrical device (100) encountered a reset or stop operation, as the optimal delay of the electrical device (100).

7. A method for optimizing delay in an electrical device (100) comprising a microcontroller (102), wherein the method comprises: receiving, by the microcontroller (102), data relating to environmental parameter such as ambient temperature; determining, by the microcontroller (102), optimal delay for performing an operation at different ambient temperatures; storing, in a memory unit (106) of the electrical device (100), the optimum delay for performing a desired operation at the measured ambient temperature; retrieving, from the memory unit (106), the optimum delay for performing a desired operation at the measured ambient temperature; and performing, by the microcontroller (102), the desired operation with the optimum delay by drawing electric power from a power source (1 12) that is electrically connected to the microcontroller (102).

8. The method according to claim 7, wherein the method further comprises determining optimal delay for performing an operation at different ambient temperatures by: performing the operation at different ambient temperatures, by the microcontroller (102), for different delay values of the electrical device (100); identifying, by the microcontroller (102), the lowest delay for performing the operation at each of the ambient temperatures; and storing, in the memory unit (106), the lowest delay for performing the operation at each of the ambient temperature as optimal delay.

9. The method according to claim 8, wherein performing the operation at different ambient temperatures comprises: performing the operation at an ambient temperature for the highest delay value of the electrical device (100) corresponding to that operation; iteratively reducing the delay and performing the operation at the ambient temperature until the electrical device (100) encounters a reset or stop operation; and selecting the delay value that is preceding the delay value for which the electrical device (100) encountered a reset or stop operation, as the optimal delay value of the electrical device (100).

10. The method according to claim 8 or 9, wherein the highest delay value of the electrical device (100) corresponding to that specific ambient temperature is obtained from a historical data.

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