Electronic component

A laminate structure with specific ceramic compositions and crystal components addresses high dielectric loss and material strength issues in low-temperature fired ceramics, enhancing the reliability and durability of electronic components by reducing surface scratches and cracks.

WO2026141101A1PCT designated stage Publication Date: 2026-07-02MURATA MFG CO LTD
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Patent Information

Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
MURATA MFG CO LTD
Filing Date
2025-12-17
Publication Date
2026-07-02

AI Technical Summary

Technical Problem

Existing ceramic materials for multilayer wiring boards face issues with high dielectric loss and material strength, leading to surface scratches and cracks during low-temperature firing, which affect the reliability of electronic components.

Method used

A laminate structure comprising low-dielectric ceramic layers with specific compositions of RO-ZnO-Al2O3-B2O3-SiO2 and ceramic crystal components like SiO2BaAl2Si2O8, ZnAl2O4, and Zn2SiO4, along with controlled ratios of RO, ZnO, and Al in the glass component, reduces dielectric loss and enhances material strength, minimizing surface scratches and cracks.

Benefits of technology

The solution provides electronic components with low dielectric loss and improved resistance to surface scratches, ensuring reliability and durability even when using low-temperature fired ceramics.

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Abstract

An electronic component that comprises a laminate in which a plurality of low-temperature fired ceramic layers are laminated, wherein: the laminate is provided with a first layer that is positioned on one main surface and a second layer that is in contact with the first layer; the first layer and the second layer are formed from a low dielectric constant ceramic that contains a post-firing glass component (A1) and an oxide (C1) of a ceramic crystal component; the post-firing glass component (A1) is RO-Zno-Al2O3-B2O3-SiO2 wherein RO is at least one selected from the group consisting of MgO, CaO, SrO, and BaO; the ratio of RO, the ratio of ZnO, and the ratio of Al2O3 contained in the post-firing glass component (A1) are 0.1 mol% to 10 mol% inclusive; the sum of the ratio of RO, the ratio of ZnO, and the ratio of Al2O3 contained in the post-firing glass component (A1) is 15 mol% or less; the ratio (SiO2 / B2O3) of SiO2 and B2O3 contained in the post-firing glass component (A1) is less than 3.4; the oxide (C1) of the ceramic crystal component contains at least one selected from the group consisting of SiO2, BaAl2Si2O8, ZnAl2O4, and Zn2SiO4; and the amount of quartz contained in the first layer is smaller than the amount of quartz contained in the second layer.
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