The invention discloses a method and equipment for measuring device internal surface temperature. The method comprises the steps: completing the calibration of a transmittance parameter of an infraredthermometer through a standard light window, completing the calibration of the emissivity of the infrared thermometer through adding a standard temperature measurement piece, keeping the emissivity,transmittance, standard light window and standard temperature measurement piece unchanged, maintaining device internal detection point constant temeprature, carrying out temperature measurment on a to-be-measured surface, wherein the measurement temeprature of theinfrared thermometer is the temerpature of theto-be-measured surface, wherein the above process is standard measurment; replacing a similar actual temperature measuring piece, and maintaining the device internal detection point temeprature to be constant, so that the actual temperature measuring piece surface temeprature is basicallyclose to the original standard temperature measuring piece infrared measurement temperature, and the process is approximate measurement; according to the two non-contact temperature measurement calibration methods, the influence of factors such as measurement precision, test distance, radiation process transmission medium, measurement process emissivity change, actual measurement conditions and the like are taken into consideration, and the measurement precision and the measurement efficiency are improved.