A switch jam diagnosis method, system and storage medium based on single chip microcomputer

Abstract

The present invention discloses a switch jam diagnosis method, system and storage medium based on a single-chip microcomputer. The method is applied to a switch jam diagnosis system based on a single-chip microcomputer, and the system includes: a single-chip microcomputer and an edge analysis module. The method includes: obtaining a switch status signal after the target switch is closed according to the single-chip microcomputer, and transmitting the switch status signal to the edge analysis module; performing impact detection on the received switch status signal according to the edge analysis module, and determining the jam diagnosis result of the target switch according to the signal impact of the impact detection. The present invention avoids the problems of high computing power resource requirements and insufficient application scenarios in the existing switch jam diagnosis method based on deep learning, and can achieve efficient and accurate diagnosis of the jam fault of the switch in the switch cabinet, with low computing power resource requirements. At the same time, the solution has strong interpretability, can quickly adapt to the switch jam diagnosis scenarios of various switch cabinets, and has better rapid implementation capabilities.

Description

Technical Field

[0001] The present invention relates to the field of electric power technology, and in particular to a switch jam diagnosis method, system and storage medium based on a single-chip microcomputer. Background Art

[0002] During operation, switchgear requires switching (isolating) switches. Damage to the switch mechanism or electrical faults can easily lead to a jam. If a jam occurs and the system cannot respond promptly, it can seriously impact power supply reliability and safe grid operation.

[0003] In the existing technology, deep learning is usually used to realize the switch jam diagnosis of switch cabinets. However, this method requires a large amount of sample data to form a reliable switch jam diagnosis model. At the same time, the required computing power resources are also high, making it difficult to adapt to a variety of application scenarios. Summary of the Invention

[0004] The present invention provides a switch jamming diagnosis method, system and storage medium based on a single-chip microcomputer, so as to realize efficient and accurate diagnosis of the jamming fault of the switch in the switch cabinet.

[0005] According to one aspect of the present invention, a switch stuck diagnosis method based on a single-chip microcomputer is provided, which is applied to a switch stuck diagnosis system based on a single-chip microcomputer. The system includes: a single-chip microcomputer and an edge analysis module; wherein the method includes:

[0006] Obtain the switch status signal of the target switch after closing according to the single chip microcomputer, and transmit the switch status signal to the edge analysis module;

[0007] The edge analysis module performs impact detection on the received switch status signal, and determines the stuck diagnosis result of the target switch according to the impact of the impact detection signal.

[0008] According to another aspect of the present invention, a switch jam diagnosis system based on a single-chip microcomputer is provided, the system comprising:

[0009] A single-chip microcomputer is used to obtain a switch status signal after the target switch is closed, and transmit the switch status signal to the edge analysis module;

[0010] The edge analysis module is used to perform impact detection on the received switch status signal and determine the stuck diagnosis result of the target switch based on the impact of the impact detection signal.

[0011] According to another aspect of the present invention, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the switch jam diagnosis method based on a single-chip microcomputer according to any embodiment of the present invention when executed.

[0012] The technical solution of the embodiment of the present invention obtains the switch status signal of the target switch after closing the switch according to the single-chip microcomputer, and transmits the switch status signal to the edge analysis module; the edge analysis module performs impact detection on the received switch status signal, and determines the stuck diagnosis result of the target switch according to the signal impact of the impact detection. Through the above technical solution, the problems of high computing power resource requirements and insufficient application scenarios in the existing switch stuck diagnosis method based on deep learning are avoided, and it can achieve efficient and accurate diagnosis of the stuck fault of the switch in the switch cabinet, with low computing power resource requirements. At the same time, the solution has strong interpretability, can quickly adapt to the switch stuck diagnosis scenarios of various switch cabinets, and has better rapid implementation capabilities.

[0013] It should be understood that the content described in this section is not intended to identify the key or important features of the embodiments of the present invention, nor is it intended to limit the scope of the present invention. Other features of the present invention will become readily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0015] Figure 1 This is a flow chart of a switch jam diagnosis method based on a single chip microcomputer according to the first embodiment of the present invention;

[0016] Figure 2 This is a flow chart of a switch jam diagnosis method based on a single chip microcomputer according to a second embodiment of the present invention;

[0017] Figure 3 2. It is a schematic diagram of the spectrum characteristics of the switch jamming provided by the second embodiment of the present invention;

[0018] Figure 4 Schematic diagram of data slicing and jam diagnosis process according to the second embodiment of the present invention;

[0019] Figure 5 1 is a schematic structural diagram of a switch jam diagnosis system based on a single-chip microcomputer according to a third embodiment of the present invention;

[0020] Figure 6 1 is a structural diagram of a switch jam diagnosis system based on a single chip microcomputer provided according to a fourth embodiment of the present invention. DETAILED DESCRIPTION

[0021] In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts should fall within the scope of protection of the present invention.

[0022] It should be noted that the terms "first", "second", etc. in the description and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that the numbers used in this way can be interchanged where appropriate so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0023] Example 1

[0024] Figure 1 A flowchart of a switch jam diagnosis method based on a single-chip microcomputer is provided for the first embodiment of the present invention. This embodiment is applicable to the case where a switch jam diagnosis is performed on a switch in a switch cabinet based on a single-chip microcomputer. The method can be executed by a switch jam diagnosis system based on a single-chip microcomputer. The switch jam diagnosis system based on a single-chip microcomputer can be implemented in the form of hardware and / or software. Figure 1 As shown, the first embodiment provides a switch jam diagnosis method based on a single-chip microcomputer, which is applied to a switch jam diagnosis system based on a single-chip microcomputer. The method specifically includes the following steps:

[0025] S110 , obtaining a switch status signal after the target switch is closed according to the single chip microcomputer, and transmitting the switch status signal to the edge analysis module.

[0026] The target switch can be understood as the switch to be diagnosed for a stuck fault. The number of target switches can be one or more, meaning that the technical solution of the present application can implement parallel diagnosis of stuck faults in multiple switches. The switch status signal can refer to a status signal generated by the target switch after closing, including, but not limited to, a voltage signal, a current signal, a vibration signal, etc.

[0027] In an embodiment of the present invention, when it is necessary to perform a stuck fault diagnosis on the target switch in the switch cabinet, the single-chip microcomputer can be controlled to obtain the switch status signal after the target switch is closed, and the switch status signal can be transmitted to the edge analysis module, and then the edge analysis module will process and analyze the switch status signal to generate a corresponding stuck diagnosis result.

[0028] It should be understood that the single-chip microcomputer in this embodiment, as a device for acquiring switch state signals, can be either a direct data collector of the switch state signals or a data receiver for controlling other switch state signal acquisition devices. This embodiment does not impose any specific restrictions on this. Specifically, the single-chip microcomputer itself can be integrated with a switch state signal acquisition function, for example, it can be integrated with a voltage detection circuit, a current detection circuit, etc., so that the switch state signal after the target switch is closed can be directly acquired; in addition, the single-chip microcomputer can also be connected to a switch state signal acquisition device such as a voltage detection sensor, a current sensor, and a vibration sensor. The switch state signal acquisition device is responsible for real-time acquisition of the switch state signal after the target switch is closed, and transmits the switch state signal to the single-chip microcomputer, so that the single-chip microcomputer can indirectly acquire the switch state signal after the target switch is closed.

[0029] S120 , performing impact detection on the received switch status signal according to the edge analysis module, and determining a stuck diagnosis result of the target switch according to the impact condition of the impact detected signal.

[0030] In embodiments of the present invention, since switch jams have short-duration impact characteristics, an edge analysis module can be invoked to perform impact detection on the received switch status signal to determine whether and how many impacts have occurred within a preset time period. A target switch jam diagnosis result can then be determined based on the signal impacts detected. In one specific embodiment, the switch status signal can be segmented into several data slices, and then the signal impacts corresponding to each data slice within a preset time period are counted. The target switch jam diagnosis result can then be determined based on the total number of impacts within the preset time period. Specifically, if the total number of impacts exceeds a preset threshold, the target switch is determined to have experienced a jam; otherwise, the target switch is not.

[0031] Furthermore, based on the above-mentioned embodiment of the invention, a switch stuck diagnosis system based on a single-chip microcomputer in the embodiment of the present invention further includes: a result reporting module; correspondingly, a switch stuck diagnosis method based on a single-chip microcomputer further includes:

[0032] The result reporting module reports the jam diagnosis results generated by the edge analysis module to the target receiving device.

[0033] In an embodiment of the present invention, after the edge analysis module generates a stuck diagnosis result of the target switch, the switch stuck diagnosis system can report the stuck diagnosis result to the target receiving device by calling the result reporting module, so that the operation and maintenance personnel can perform subsequent operation and maintenance processing based on the switch stuck diagnosis result received by the target receiving device, for example, it can be: detecting the specific cause of the switch stuck (mechanical failure, electrical failure, etc.), replacing the switch, cleaning the switch, etc.; wherein, the target receiving device may include but is not limited to: smart terminals (mobile phones, tablets, etc.) of the switch cabinet diagnosis on-site operation and maintenance personnel, remote control terminals of the switch cabinet, etc.

[0034] Furthermore, based on the above-mentioned embodiment of the invention, a switch jam diagnosis system based on a single-chip microcomputer in the embodiment of the present invention further includes: a data preprocessing module; correspondingly, a switch jam diagnosis method based on a single-chip microcomputer further includes:

[0035] The data preprocessing module performs at least one data processing operation of analog-to-digital conversion, signal amplification, and signal filtering on the switch state signal.

[0036] In an embodiment of the present invention, before performing a stuck fault diagnosis on the switch status signal, a data preprocessing operation can be performed on the acquired switch status signal by calling a data preprocessing module. For example, it can include at least one of the following: performing analog-to-digital conversion on the collected switch status signal to facilitate subsequent data analysis and processing; performing signal amplification processing on the switch status signal to improve the signal strength; performing noise filtering processing on the switch status signal to improve the accuracy of the data, thereby improving the accuracy of subsequent switch stuck fault diagnosis.

[0037] The technical solution of the embodiment of the present invention obtains the switch status signal of the target switch after closing the switch according to the single-chip microcomputer, and transmits the switch status signal to the edge analysis module; the edge analysis module performs impact detection on the received switch status signal, and determines the stuck diagnosis result of the target switch according to the signal impact of the impact detection. Through the above technical solution, the problems of high computing power resource requirements and insufficient application scenarios in the existing switch stuck diagnosis method based on deep learning are avoided, and it can achieve efficient and accurate diagnosis of the stuck fault of the switch in the switch cabinet, with low computing power resource requirements. At the same time, the solution has strong interpretability, can quickly adapt to the switch stuck diagnosis scenarios of various switch cabinets, and has better rapid implementation capabilities.

[0038] Example 2

[0039] Figure 2 The flowchart of a switch jam diagnosis method based on a single chip microcomputer provided in the second embodiment of the present invention is further optimized and expanded based on the above embodiment, and can be combined with various optional technical solutions in the above embodiment. Figure 2As shown, the second embodiment provides a switch jam diagnosis method based on a single-chip microcomputer, which is applied to a switch jam diagnosis system based on a single-chip microcomputer. The method specifically includes the following steps:

[0040] S210 , in response to a closing trigger operation of the target switch, the voltage detection sensor is controlled based on the single chip microcomputer to continuously collect the voltage signal of the target switch, and the voltage signal is transmitted to the edge analysis module as a switch state signal.

[0041] The closing trigger operation may include a manual closing operation of the target switch by an operator or maintenance personnel, or an automatic closing operation of the target switch by a switchgear control system, and this embodiment does not impose any specific limitations on this. The voltage detection sensor may refer to a sensor device that is connected to the microcontroller and the target switch, respectively, and is used to collect a voltage signal after the target switch is closed.

[0042] In an embodiment of the present invention, the switch jam diagnosis system based on the single-chip microcomputer may further include: a voltage detection sensor, so that it can respond to the closing trigger operation of the target switch. For example, when it is detected that the switch cabinet control system initiates the switching action, the voltage sensor is controlled by the single-chip microcomputer to continuously collect the voltage signal after the target switch is closed, so that the single-chip microcomputer can transmit the acquired voltage signal to the edge analysis module for analysis and processing. In actual applications, the price of single-chip microcomputers is usually relatively expensive, while the price of voltage sensors is relatively low. In this embodiment, a separate voltage sensor is set to collect the voltage signal of the target switch, and then the collected voltage signal is sent to the single-chip microcomputer. This can avoid the problem that the target switch is damaged due to an electrical fault and the single-chip microcomputer is also damaged. At the same time, if the voltage detection sensor is damaged, it is simpler and more convenient to replace than the single-chip microcomputer.

[0043] Furthermore, based on the above embodiments of the invention, the voltage detection sensor may adopt a voltage detection circuit, and the voltage detection circuit is electrically connected to the target switch.

[0044] In an embodiment of the present invention, the voltage detection sensor can adopt a voltage detection circuit, and the voltage detection circuit is electrically connected to the target switch. Specifically, the voltage detection circuit can be implemented using a comparator, that is, the input end of the comparator is electrically connected to the target switch to receive the voltage signal after the target switch is closed. At the same time, the reference voltage of the comparator can be set to a fixed voltage value. When the detected voltage signal is greater than or less than the reference voltage, the comparator will output a high level or low level signal, thereby realizing the voltage detection function.

[0045] S220 , calling the edge analysis module to receive the voltage signal of the switch state information transmitted by the single chip microcomputer, and dividing the voltage signal according to a preset slicing interval to obtain multiple raw data slices.

[0046] Among them, the preset slicing interval can be understood as the time interval used to perform data segmentation on a time-continuous voltage signal. In this embodiment, the preset slicing interval needs to be smaller than the impact interval after the switch is stuck and larger than the time scale of one impact, and the time scale is based on the frequency of atomic vibration.

[0047] Depend on Figure 3 The schematic diagram of the switch jam spectrum shows that the voltage signal during a stuck switch exhibits short-duration impulses. Therefore, the jam diagnosis can be determined by analyzing the impulses in the voltage signal. Waveform analysis also reveals that the interval between impulses after a stuck switch is approximately 200ms, while the typical duration of an impulse is around 5ms. Therefore, a preset slicing interval—the length of the raw data slice—that is, the length of the raw data slice, as long as it is greater than 5ms and less than 200ms, ensures that a complete signal impulse is sliced, preventing missed or duplicate detection of signal impulses. In a preferred embodiment, the preset slicing interval is 100ms.

[0048] It can be understood that the duration corresponding to the above-mentioned impact interval and the typical time scale of an impact is only an example. In practical applications, it can be determined based on the actual switch jam spectral characteristics of the target switch in the switch cabinet, and then the appropriate preset slice interval can be determined to improve the diagnostic accuracy.

[0049] S230 , calling the edge analysis module to perform wavelet transform on each original data slice, and extracting the high-frequency components corresponding to the original data slice.

[0050] The wavelet transform is a time-frequency signal analysis method based on the Fourier transform that can capture the time-varying characteristics of the signal, effectively extracting the signal's local features. High-frequency components can be used to characterize the rapidly changing portions of the voltage signal after the original data slice is decomposed using the wavelet transform. This means that the high-frequency components can reflect the signal's sudden changes in the original data slice.

[0051] In an embodiment of the present invention, the edge analysis module can be called to perform wavelet transform on each original data slice after time segmentation to obtain the D item of the corresponding slice voltage signal, that is, the high-frequency component, so that the impact detection of the signal can be realized based on the high-frequency component later; further, this embodiment does not impose specific restrictions on the wavelet basis function and the number of decomposition layers used in the wavelet transform, and can be set accordingly according to the actual application scenario.

[0052] It is understandable that in practical applications, other signal transformation methods similar to wavelet transform may also be used, such as Hilbert transform, wavelet packet transform, etc. This embodiment does not impose any specific limitation on this.

[0053] Furthermore, after extracting the high-frequency components of the original data slices, the memory occupied by the corresponding original data slices can be released to prepare for the next data analysis and processing, which can reduce excessive memory usage and thus improve resource utilization.

[0054] S240 , calling the edge analysis module to determine the pulse factor corresponding to the high-frequency component, and determining the signal impact of the corresponding original data slice according to the pulse factor.

[0055] The pulse factor may refer to the ratio of a signal peak value to a rectified average value (average of absolute values), and the pulse factor may be used to detect whether there is an impact in the signal.

[0056] In an embodiment of the present invention, after extracting the high-frequency components of each original data slice, the edge analysis module can be called to determine the pulse factors corresponding to each high-frequency component respectively, and the signal impact conditions of the corresponding original data slices can be determined in turn according to the pulse factors, that is, whether a signal impact occurs in each original data slice.

[0057] It is understandable that the use of the pulse factor as a measurement indicator for signal impact detection is only an example. In actual applications, other measurement indicators such as the peak factor may also be used, and this embodiment does not specifically limit this.

[0058] Furthermore, based on the above-mentioned embodiment of the invention, S240 specifically includes the following steps:

[0059] S2401, calling the edge analysis module to respectively determine the signal peak value and the rectified average value corresponding to the high-frequency component;

[0060] S2402. Call the edge analysis module to determine the ratio of the signal peak value to the rectified average value as the pulse factor. When the pulse factor is greater than 1, the signal impact situation is determined as a signal impact occurring in the original data slice. Otherwise, the signal impact situation is determined as no signal impact occurring in the original data slice.

[0061] Specifically, the edge analysis module can be called to determine the signal peak and rectified average value (average of absolute values) corresponding to the high-frequency component, and then the ratio of the two is used as the pulse factor. At the same time, if the pulse factor is greater than 1, it means that the corresponding original data slice has a signal impact. Otherwise, it means that the original data slice has no signal impact.

[0062] S250 , calling the edge analysis module to count the signal impacts of all raw data slices within a preset diagnosis period to obtain a total number of impacts.

[0063] Among them, the preset diagnostic period may refer to the time period used to diagnose whether a jamming fault occurs in the target switch. The preset diagnostic period may include at least one typical action duration of the target switch. The specific setting may be based on actual needs. This embodiment does not impose specific restrictions on this. For example, the preset diagnostic period may be 5 seconds.

[0064] In the embodiment of the present invention, the edge analysis module may be called to count the signal impacts corresponding to all raw data slices within a preset diagnosis period, thereby obtaining the total number of impacts within the preset diagnosis period.

[0065] S260: Calling the edge analysis module to determine the jam diagnosis result as the switch being jammed when the total number of impacts is greater than a preset threshold; otherwise, determining the jam diagnosis result as the switch not being jammed.

[0066] In the embodiment of the present invention, the edge analysis module can be called to compare the total number of impacts with a preset number threshold. If the total number of impacts is greater than the preset number threshold, the target switch jam diagnosis result is determined to be a switch jam; otherwise, the target switch jam is determined to be a switch not jammed. Figure 4 As shown, in a specific embodiment, if the impact signal occurs 8 times or more within 5 seconds, the target switch is diagnosed as having a stuck fault; if the impact signal occurs less than 8 times within 5 seconds, the target switch is diagnosed as not having a stuck fault.

[0067] The technical solution of the embodiment of the present invention is to control the voltage sensor through a single-chip microcomputer to collect the voltage signal after the target switch is closed, and then transmit the voltage signal to the edge analysis module for analysis and processing. The edge analysis module then performs data slicing, wavelet transform, impact detection, impact number statistics and jam diagnosis on the collected voltage signal in sequence. It can achieve efficient and accurate diagnosis of jam faults of switches in switch cabinets, with low computing power resource requirements. At the same time, the solution has strong interpretability, can quickly adapt to switch jam diagnosis scenarios of various switch cabinets, has better rapid implementation capabilities, and is convenient for iteration and adaptation of algorithms.

[0068] Example 3

[0069] Figure 5 This is a schematic diagram of the structure of a switch jam diagnosis system based on a single chip microcomputer provided in the third embodiment of the present invention. Figure 5 As shown, the system includes: a single chip microcomputer 31 and an edge analysis module 32. The structure of the switch jam diagnosis system of this embodiment is described in detail below.

[0070] The single chip microcomputer 31 is used to obtain the switch status signal after the target switch is closed, and transmit the switch status signal to the edge analysis module 32;

[0071] The edge analysis module 32 is used to perform impact detection on the received switch status signal and determine the stuck diagnosis result of the target switch according to the impact of the impact detection signal.

[0072] The edge analysis module 32 may be understood as an edge analysis node for analyzing and processing the switch status signal to obtain a corresponding switch jam diagnosis result, and may include, but is not limited to, an edge computer (PC), an edge server, and the like.

[0073] Wired or wireless communication can be used between the single-chip microcomputer 31 and the edge analysis module 32. For example, the single-chip microcomputer 31 can be configured with a SIM card slot for inserting an IoT card, thereby realizing wireless communication with the edge analysis module 32.

[0074] Furthermore, based on the above-mentioned embodiments of the invention, a switch jam diagnosis system based on a single-chip microcomputer in an embodiment of the present invention also includes: a voltage detection sensor, which is used to collect the voltage signal of the target switch and transmit the voltage signal as a switch status signal to the edge analysis module 32.

[0075] Furthermore, based on the above-mentioned embodiment of the invention, the voltage detection sensor adopts a voltage detection circuit, and the voltage detection circuit is electrically connected to the target switch.

[0076] Furthermore, based on the above-mentioned embodiment of the invention, the edge analysis module 32 specifically includes:

[0077] a data segmentation unit, configured to receive a voltage signal of the switch state information transmitted by the single chip microcomputer 31 and segment the voltage signal according to a preset slicing interval to obtain a plurality of raw data slices;

[0078] A high-frequency component extraction unit is used to perform wavelet transform on each original data slice to extract the high-frequency component corresponding to the original data slice;

[0079] A signal impact detection unit is used to determine the pulse factor corresponding to the high-frequency component and determine the signal impact of the corresponding raw data slice based on the pulse factor;

[0080] The impact number statistics unit is used to count the signal impacts of all raw data slices within a preset diagnosis period to obtain the total impact number;

[0081] The jam diagnosis unit is used to determine the jam diagnosis result as the switch being jammed when the total number of impacts is greater than a preset number threshold, and conversely, determine the jam diagnosis result as the switch not being jammed.

[0082] Furthermore, based on the above-mentioned embodiment of the invention, the signal impact detection unit is specifically configured to:

[0083] Determine the signal peak value and rectified average value corresponding to the high frequency component respectively;

[0084] The ratio of the signal peak value to the rectified average value is determined as the pulse factor. When the pulse factor is greater than 1, the signal impact situation is determined as a signal impact occurring in the original data slice. Otherwise, the signal impact situation is determined as no signal impact occurring in the original data slice.

[0085] Furthermore, based on the above-mentioned embodiments of the invention, a switch jam diagnosis system based on a single-chip microcomputer in an embodiment of the present invention further includes: a result reporting module, which is used to report the jam diagnosis result generated by the edge analysis module 32 to the target receiving device.

[0086] Furthermore, based on the above-mentioned embodiments of the invention, a switch jam diagnosis system based on a single-chip microcomputer in an embodiment of the present invention also includes: a data preprocessing module, which is used to perform at least one data processing operation of analog-to-digital conversion, signal amplification and signal filtering on the switch status signal.

[0087] The switch jam diagnosis system based on a single-chip microcomputer provided in an embodiment of the present invention can execute the switch jam diagnosis method based on a single-chip microcomputer provided in any embodiment of the present invention, and has the corresponding functional modules and beneficial effects of the execution method.

[0088] Example 4

[0089] Figure 6 This is a schematic diagram of the structure of a switch jam diagnosis system based on a single chip microcomputer provided in the fourth embodiment of the present invention. Figure 6 As shown, the system includes: an intelligent collection and analysis device, which includes a sensor and data collection module 41, an edge analysis module 42 and a result reporting module 43.

[0090] Among them, the sensor and data acquisition module 41 is used to collect the voltage signal after the target switch is closed, and pre-process the collected data information; the edge analysis module 42 is used to analyze and process the collected data information, obtain the characteristics of the collected information (i.e., the number of impacts), and accumulate the characteristics, perform impact number determination and cumulative calculation, and generate the corresponding switch jam diagnosis result; the result reporting module 43 is used to report the switch jam diagnosis result to the target receiving device.

[0091] The switch jam diagnosis system based on a single-chip microcomputer provided in an embodiment of the present invention can execute the switch jam diagnosis method based on a single-chip microcomputer provided in any embodiment of the present invention, and has the corresponding functional modules and beneficial effects of the execution method.

[0092] Example 5

[0093] An embodiment of the present invention further provides a computer-readable storage medium having computer instructions stored thereon, wherein the computer instructions are used to enable a processor to implement the switch jam diagnosis method based on a single chip microcomputer provided in the above embodiment when executed.

[0094] It should be noted that the computer-readable medium described above in this embodiment may be a computer-readable signal medium or a computer-readable storage medium, or any combination thereof. A computer-readable storage medium may be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device, or component, or any combination thereof. More specific examples of computer-readable storage media may include, but are not limited to, an electrical connection having one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination thereof. In this embodiment, a computer-readable storage medium may be any tangible medium containing or storing a program that can be used by or in conjunction with an instruction execution system, device, or component. Furthermore, in this embodiment, a computer-readable signal medium may include a data signal propagated in baseband or as part of a carrier wave, which carries computer-readable program code. This propagated data signal may take a variety of forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. A computer-readable signal medium may also be any computer-readable medium other than a computer-readable storage medium that can transmit, propagate, or transport a program for use by or in conjunction with an instruction execution system, apparatus, or device. The program code contained on the computer-readable medium may be transmitted using any suitable medium, including but not limited to wires, optical cables, RF (radio frequency), etc., or any suitable combination thereof.

[0095] It should be understood that the various forms of the processes shown above can be used to reorder, add, or delete steps. For example, the steps described in the present invention can be performed in parallel, sequentially, or in a different order, as long as the desired results of the technical solution of the present invention can be achieved. This is not limited herein.

[0096] The above specific embodiments do not limit the scope of protection of the present invention. Those skilled in the art will appreciate that various modifications, combinations, sub-combinations, and substitutions may be made based on design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention are intended to be included within the scope of protection of the present invention.

Claims

1. A switch jam diagnosis method based on a single chip microcomputer, characterized in that: Applied to a switch jam diagnosis system based on a single-chip microcomputer, the system includes: a single-chip microcomputer and an edge analysis module; wherein the method includes: Acquire a switch status signal after the target switch is closed according to the single chip microcomputer, and transmit the switch status signal to the edge analysis module; performing an impact detection on the received switch status signal according to the edge analysis module, and determining a stuck diagnosis result of the target switch according to the impact of the signal detected; The step of performing impact detection on the received switch status signal according to the edge analysis module and determining a stuck diagnosis result of the target switch according to the impact of the signal detected includes: Calling the edge analysis module to receive the voltage signal of the switch state signal transmitted by the single chip microcomputer, and dividing the voltage signal according to a preset slice interval to obtain a plurality of raw data slices; Calling the edge analysis module to perform wavelet transform on each of the raw data slices to extract high-frequency components corresponding to the raw data slices; Calling the edge analysis module to determine the pulse factor corresponding to the high-frequency component, and determining the signal impact condition corresponding to the original data slice according to the pulse factor; Calling the edge analysis module to count the signal impacts of all the raw data slices within a preset diagnosis period to obtain a total number of impacts; The edge analysis module is called to determine the jam diagnosis result as the switch being jammed when the total number of impacts is greater than a preset number threshold; otherwise, the jam diagnosis result is determined as the switch not being jammed.

2. The method according to claim 1, characterized in that The system further includes a voltage detection sensor; the step of obtaining a switch status signal after the target switch is closed according to the single chip microcomputer and transmitting the switch status signal to the edge analysis module includes: In response to the closing trigger operation of the target switch, the voltage detection sensor is controlled by the single chip to continuously collect the voltage signal of the target switch, and the voltage signal is transmitted to the edge analysis module as the switch status signal.

3. The method according to claim 2, characterized in that The voltage detection sensor adopts a voltage detection circuit, and the voltage detection circuit is electrically connected to the target switch.

4. The method according to claim 1, wherein The calling of the edge analysis module to determine the pulse factor corresponding to the high-frequency component, and determining the signal impact condition corresponding to the original data slice according to the pulse factor, includes: Calling the edge analysis module to respectively determine the signal peak value and the rectified average value corresponding to the high-frequency component; The edge analysis module is called to determine the ratio of the signal peak value to the rectified average value as the pulse factor, and when the pulse factor is greater than 1, the signal impact situation is determined as a signal impact occurring in the original data slice; otherwise, the signal impact situation is determined as no signal impact occurring in the original data slice.

5. The method according to claim 1, characterized in that The system further includes a result reporting module; and the method further includes: The jam diagnosis result generated by the edge analysis module is reported to the target receiving device according to the result reporting module.

6. The method according to claim 1, characterized in that The system further includes a data preprocessing module; the method further includes: The data preprocessing module performs at least one data processing operation of analog-to-digital conversion, signal amplification, and signal filtering on the switch state signal.

7. A switch jam diagnosis system based on a single chip microcomputer, characterized in that: The system comprises: A single-chip microcomputer is used to obtain a switch status signal after the target switch is closed, and transmit the switch status signal to the edge analysis module; an edge analysis module, configured to perform impact detection on the received switch status signal, and determine a stuck diagnosis result of the target switch according to the impact of the signal detected; The edge analysis module includes: a data segmentation unit, configured to receive the voltage signal of the switch state signal transmitted by the single chip microcomputer, and segment the voltage signal according to a preset slicing interval to obtain a plurality of original data slices; a high-frequency component extraction unit, configured to perform wavelet transform on each of the original data slices to extract the high-frequency component corresponding to the original data slice; a signal impact detection unit, configured to determine a pulse factor corresponding to the high-frequency component, and determine the signal impact condition corresponding to the original data slice according to the pulse factor; An impact number statistics unit is used to count the signal impacts of all the raw data slices within a preset diagnosis period to obtain a total impact number; The jam diagnosis unit is configured to determine the jam diagnosis result as the switch being jammed when the total number of impacts is greater than a preset number threshold, and conversely, determine the jam diagnosis result as the switch not being jammed.

8. The system according to claim 7, characterized in that The system further includes a voltage detection sensor for collecting a voltage signal of the target switch and transmitting the voltage signal as the switch status signal to the edge analysis module.

9. The system according to claim 8, characterized in that The voltage detection sensor adopts a voltage detection circuit, and the voltage detection circuit is electrically connected to the target switch.

10. The system according to claim 7, wherein: The signal impact detection unit is specifically used to: respectively determining a signal peak value and a rectified average value corresponding to the high frequency component; The ratio of the signal peak value to the rectified average value is determined as the pulse factor, and when the pulse factor is greater than 1, the signal impact situation is determined as a signal impact occurring in the original data slice; otherwise, the signal impact situation is determined as no signal impact occurring in the original data slice.

11. The system according to claim 7, wherein: The system also includes a result reporting module for reporting the jam diagnosis result generated by the edge analysis module to a target receiving device.

12. The system according to claim 7, wherein: The system further includes a data preprocessing module for performing at least one data processing operation of analog-to-digital conversion, signal amplification, and signal filtering on the switch state signal.

13. A computer-readable storage medium, characterized in that The computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the switch jam diagnosis method based on a single-chip microcomputer according to any one of claims 1 to 6 when executed.

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