Electronic component testing device

Abstract

The invention relates to an electronic component testing device. The electronic component testing device is provided with a machine table, a bearing chassis arranged on the machine table, a testing plate, a detection piece, a testing unit, a feeding unit and a control unit. The test board can be driven to rotate relative to the bearing chassis. The detection piece is arranged on the table top of the machine table and can detect whether the test board exists or not. And the control unit can control the action of the testing unit or the feeding unit according to the detection result of the detection piece. Whether the test board is arranged on the bearing chassis or not can be detected and judged through the detection piece, and the control unit determines whether to control the action of the test unit or the feeding unit or not according to the detection result of the detection piece, so that the control unit can be effectively prevented from driving the test unit or the feeding unit by mistake.

Description

Technical Field

[0001] The invention relates to a testing device, and in particular to an electronic component testing device suitable for testing electronic components. Background Art

[0002] After manufacturing, general electronic components usually need to undergo electrical testing to determine their physical properties. For example, the electronic component testing device disclosed in the I821945 patent case is provided with a machine, a supporting chassis mounted on the machine, a test board disposed on the supporting chassis and driven to rotate by the machine, and a test unit disposed on the machine and located on the upper and lower sides of the supporting chassis and the test board. The test board is provided with a plurality of slots for accommodating the electronic components to be tested.

[0003] The test unit is provided with a lower terminal box arranged below the carrier chassis and an upper terminal box located above the test board. The multiple lower terminals of the lower terminal box can be electrically connected to and contact the downward electrodes of the electronic components, and the upper terminal box can be driven to move downward toward the test board so that the multiple upper terminals thereof are electrically connected to and contact the upward electrodes of the electronic components, thereby performing electrical tests on the electronic components.

[0004] Before conducting electrical tests, this type of electronic component testing device must calibrate the downward movement distance of the upper terminal box. The calibration method is to move the upper terminal box downward from a reference position without setting the test board, and stop moving the upper terminal box downward when the upper terminals are electrically connected to the lower terminals, thereby knowing the distance between the reference position and the lower terminal. Before the upper terminals are electrically connected to the lower terminals, the upper terminal box will be driven to move downward continuously until the upper terminals are electrically connected to the lower terminals. Afterwards, when conducting electrical tests on electronic components, the downward movement distance of the upper terminal box can be accurately controlled by deducting the height of the electronic components. However, during the calibration and electrical testing process, the test board is often repeatedly installed and removed, and calibration may occur when there is a test board. At this time, the upper terminal and the lower terminal are separated by the test board, so that the upper terminal and the lower terminal cannot be electrically connected to each other, causing the upper terminal box to be continuously driven downward and squeeze the test board, thereby causing damage to the test board or the upper terminal... and other components. Summary of the invention

[0005] Therefore, an object of the present invention is to provide an electronic component testing device that can improve at least one disadvantage of the prior art.

[0006] Therefore, the electronic component testing device of the present invention is provided with a machine, a supporting chassis, a test board, a detection piece, a test unit, a feeding unit, and a control unit. The machine is provided with a machine table. The supporting chassis is arranged on the machine table. The test board can be driven to rotate relative to the supporting chassis. The detection piece is arranged on the machine table and can detect whether the test board exists. The test unit and the feeding unit are arranged at the periphery of the supporting chassis. The control unit can control the test unit or the feeding unit. The control unit can control the operation of the test unit or the feeding unit according to the detection result of the detection piece.

[0007] The effectiveness of the present invention lies in that the detection component can detect whether the test plate is set on the supporting chassis, and the control unit will decide whether to control the actuation design of the test unit or the feeding unit according to the detection result of the detection component, which can effectively prevent the control unit from driving the test unit or the feeding unit unexpectedly. BRIEF DESCRIPTION OF THE DRAWINGS

[0008] Other features and effects of the present invention will be clearly presented in the embodiments with reference to the accompanying drawings, in which:

[0009] Figure 1 is a three-dimensional diagram illustrating the structure of an embodiment of an electronic component testing device of the present invention;

[0010] Figure 2 is a three-dimensional diagram illustrating the structure of the embodiment, in which a feeding unit and a plurality of testing units are omitted;

[0011] Figure 3 is a functional block diagram illustrating the functional architecture of the embodiment;

[0012] Figure 4 is a three-dimensional exploded view illustrating the structure of a load-bearing chassis and a test board of the embodiment;

[0013] Figure 5 is an incomplete side cross-sectional view illustrating a situation when an upper terminal group is driven downward to electrically connect with a lower terminal group when the test unit is driven to perform a calibration function;

[0014] Figure 6 is similar Figure 5 , illustrating a situation when the upper terminal group is driven to move downward and electrically connect to the electronic components on the test board when the test unit is driven to perform a test function;

[0015] Figure 7 is an operation schematic diagram, schematically illustrating the situation when the test unit is driven to perform the calibration function, adjusting and recording the situation when the upper terminal group moves down a calibration distance; and

[0016] Figure 8 It is an incomplete side sectional view, schematically illustrating the situation in which when the test unit is driven to perform the test function, the upper terminal group is controlled to move downward a certain distance.

[0017]

Explanation of symbols

[0018] 100: Electronic components

[0019] 101: First electrode

[0020] 102: Second electrode

[0021] 200: Electronic component testing equipment

[0022] 3: Machine

[0023] 30: Machine table

[0024] 301: Concave area

[0025] 31: Driving mechanism

[0026] 4: Load-bearing chassis

[0027] 40: Hollow area

[0028] 41: Block

[0029] 5: Test board

[0030] 50: Storage tank

[0031] 6: Inspection parts

[0032] 61: Transmitter

[0033] 62: Receiving Department

[0034] 7: Feeding unit

[0035] 8: Test unit

[0036] 81: Lower terminal group

[0037] 811: Lower terminal

[0038] 82: Transfer unit

[0039] 83: Upper terminal group

[0040] 831: Upper terminal

[0041] 9: Control unit

[0042] d1: correction distance

[0043] d2: Predetermined height

[0044] d3: moving distance DETAILED DESCRIPTION

[0045] See also Figure 1 , 2 3. An embodiment of the electronic component testing device 200 of the present invention is suitable for testing a plurality of electronic components 100 (shown in FIG. Figure 6 ) electrical test, the electronic component 100 is for example but not limited to a capacitor, an inductor, etc. Each of the two ends of the electronic component 100 is provided with a first electrode 101 and a second electrode 102 (shown in FIG. Figure 8 ).

[0046] The electronic component testing device 200 is provided with a machine platform 3, and a supporting chassis 4, a testing board 5, a detection component 6, a feeding unit 7 and multiple testing units 8 arranged on the machine platform 3, and a control unit 9 that signals connect the detection component 6, the feeding unit 7 and the testing units 8.

[0047] See also Figure 2 , 4 The machine platform 3 is provided with a machine platform surface 30 which is inclined upward, and the machine platform surface 30 is provided with a recessed area 301 for the detection member 6 to be embedded and installed.

[0048] The supporting chassis 4 is disposed on the machine table 30 and is composed of a plurality of independent but detachable sectors 41 of different sizes that are connected to each other and formed into a ring shape, and the sectors 41 surround a hollow area 40 that can expose the machine table 30. The recessed area 301 is located in the hollow area 40.

[0049] The test plate 5 is in the form of a disc and is connected to a driving mechanism 31 disposed on the machine 3. It is coaxially disposed above the supporting chassis 4 to cover the hollow space 40 and can be driven by the driving mechanism 31 to rotate relative to the supporting chassis 4. The test plate 5 is provided with a plurality of grooves 50 extending from top to bottom, and the grooves 50 are arranged in a multi-ring shape with radial inner and outer spacing. Figure 8 As shown, each of the containing grooves 50 can be used to contain an electronic component 100 , and the first electrode 101 and the second electrode 102 of the electronic component 100 contained in each of the containing grooves 50 face downward and upward respectively.

[0050] See also Figure 3 , 4The detection member 6 is located in the hollow area 40 and below the test board 5, and is located in the area between the inner ring side of the containing groove 50 of the test board 5 and the rotation center of the test board 5, and can be used to detect whether the test board 5 exists. The detection member 6 is provided with a transmitting portion 61 for transmitting light toward the bottom surface of the test board 5, and a receiving portion 62 for receiving light reflected from the bottom surface of the test board 5. When the receiving portion 62 receives the reflected light, a detection signal is generated.

[0051] See also Figure 1 The feeding unit 7 is disposed at the periphery of the supporting chassis 4. The feeding unit 7 can be driven by the control unit 9 to release the contained electronic components 100 one by one into the containing grooves 50 of the test board 5. Since the feeding unit 7 can be used to place the electronic components 100 into the containing grooves 50 of the test board 5, which is a prior art and has many methods, it will not be described in detail.

[0052] See also Figure 1 , 5 6, the test units 8 are arranged on the machine table 30 along the periphery of the test board 5, and can be controlled by the control unit 9 to perform electrical tests on the electronic components 100 arranged in the containing grooves 50 of the test board 5.

[0053] Each of the test units 8 has a lower terminal group 81 disposed on the machine table 30 and embedded and exposed on the upper surface of the supporting chassis 4, a shifting unit 82 disposed on the machine table 30, and an upper terminal group 83 disposed on the shifting unit 82 and spaced above the test board 5. The lower terminal group 81 is located below the test board 5 and is provided with a plurality of lower terminals 811 arranged radially along the test board 5. The upper terminal group 83 is provided with a plurality of upper terminals 831 corresponding to the lower terminals 811, respectively, and the length or width of the upper terminals 831 is greater than the diameter of the containing groove 50, so that the upper terminals 831 cannot pass through the containing groove 50 and electrically connect and contact the lower terminals 811. The shifting unit 82 can be controlled by the control unit 9 to drive the upper terminals 831 to move up and down relative to the supporting chassis 4 or the test board 5.

[0054] When the test board 5 is not provided on the supporting chassis 4, as shown in FIG. Figure 5 As shown, the upper terminal group 83 driven downward will electrically connect and contact the lower terminals 811 of the lower terminal group 81 with the upper terminals 831 .

[0055] When the test board 5 is mounted on the supporting chassis 4 and the test board 5 is driven to rotate relative to the supporting chassis 4, Figure 6As shown, the radially arranged containing grooves 50 will shift through a test position in batches. When the containing grooves 50 contain electronic components 100, the lower terminals 811 will be electrically connected to the first electrodes 101 of the electronic components 100 in the containing grooves 50 located at the test position, and the upper terminals 831 driven to move toward the test board 5 will be electrically connected to the second electrodes 102 of the electronic components 100 located at the test position. At this time, the test unit 8 can perform a predetermined functional electrical test on the electrically connected electronic components 100 via the upper terminals 831 and the lower terminals 811.

[0056] See also Figure 3 , 7 , 8, the control unit 9 has a built-in calibration function and a test function, and controls the test unit 8 to execute. When the calibration function is activated, the control unit 9 will drive the transfer unit 82 to drive the upper terminal set 83 downward when the detection member 6 does not generate the detection signal and determines that the detection result of the detection member 6 is that the test board 5 does not exist, and stop moving downward when the upper terminal set 83 is electrically connected to the lower terminal set 81, and record the distance that the upper terminal set 83 is driven downward to obtain a calibration distance d1. Before the upper terminal set 83 is not electrically connected to the lower terminal set 81, the control unit 9 will continue to drive the transfer unit 82 to drive the upper terminal set 83 downward until the upper terminal set 83 is electrically connected to the lower terminal set 81. When the detection element 6 generates the detection signal and determines that the test board 5 exists as a result of the detection of the detection element 6, the control unit 9 does not drive the adjustment unit 82 to move the upper terminal set 83 downward, so as to prevent the upper terminal set 83 from continuously moving downward and causing damage to the components.

[0057] When the control unit 9 starts the test function, the detection unit 6 generates the detection signal. When the detection result of the detection unit 6 is determined to be the presence of the test board 5, the control unit 9 calculates the moving distance d3 when controlling the adjustment unit 82 to drive the upper terminal group 83 downward to electrically connect and contact the second electrode 102 of the electronic component 100 according to a predetermined height d2 of the electronic component 100 (the standard length of the electronic component 100) and the correction distance d1 measured when the correction function is started. The moving distance d3 is obtained by subtracting the predetermined height d2 from the correction distance d1, d1-d2=d3. When actually performing electrical testing, the adjustment unit 82 can drive the upper terminal group 83 downward to a distance slightly greater than the moving distance d3 to ensure that the upper terminal 831 can be electrically connected and contacted with the electronic component 100.

[0058] In addition, when the control unit 9 starts the test function and determines that the test board 5 exists as a result of the detection of the detection member 6, it will also control the driving mechanism 31 to drive the test board 5 to rotate, and control the feeding unit 7 to place the electronic components 100 into the containing groove 50 of the test board 5. At the same time, the control unit 9 will control the transfer unit 82 to drive the upper terminal group 83 to move downward at least the moving distance d3 each time the test board 5 rotates and transfers a batch of electronic components 100 to the test position, so that the upper terminal group 83 is electrically connected to the electronic components 100 located at the test position with the upper terminals 831, thereby allowing the test unit 8 to perform electrical tests on the electronic components 100 located at the test position. After the electrical test is completed, the control unit 9 will control the transfer unit 82 to drive the upper terminal group 83 to move upward and reset, and control the driving mechanism 31 to drive the test board 5 to transfer the next batch of electronic components 100 to the test position for electrical testing of the electronic components 100.

[0059] On the contrary, when the control unit 9 starts the test function but the detection element 6 does not generate the detection signal and determines that the test board 5 does not exist, the feeding unit 7 is not driven and the adjustment unit 82 is not controlled to drive the upper terminal group 83 to move downward.

[0060] In summary, the detection member 6 can detect whether the test board 5 is set on the carrier chassis 4, and the control unit 9 will decide whether to control the test unit 8 or the feed unit 7 according to the detection result of the detection member 6. When the test board 5 is set on the carrier chassis 4, the calibration function is not performed to avoid component damage. Or when the test board 5 is not set on the carrier chassis 4, the test function is not performed, that is, the feed unit 7 is not controlled to release the electronic component 100 to be tested to avoid the electronic component 100 from scattering. Therefore, the electronic component testing device 200 of the present invention is indeed a very innovative creation and can indeed achieve the purpose of the present invention.

[0061] The above descriptions are merely embodiments of the present invention, and should not be used to limit the scope of implementation of the present invention. All simple equivalent changes and modifications made according to the scope of the patent application of the present invention and the contents of the patent specification are still within the scope of the patent of the present invention.

Claims

1. An electronic component testing device, comprising: A machine, provided with a machine table; A supporting chassis is arranged on the table of the machine, a test plate which can be driven to rotate is arranged on the supporting chassis, and a test unit and a feeding unit are arranged on the periphery of the supporting chassis; A control unit capable of controlling the testing unit or the feeding unit; in, The machine is provided with a detection component which can detect whether the test plate exists; the control unit can control the operation of the test unit or the feeding unit according to the detection result of the detection component.

2. The electronic component testing device according to claim 1, in, The detection component is arranged on the machine table and is located below the test board.

3. The electronic component testing device according to claim 1, in, The bearing chassis is composed of a plurality of independently and detachably connected and assembled sector-shaped blocks of different sizes, wherein the blocks enclose a hollow area for revealing the machine table, the test board covers the hollow area, and the detection component is located in the hollow area.

4. The electronic component testing device according to claim 1, in, The detection component is provided with a transmitting part capable of transmitting light toward the testing board, and a receiving part capable of receiving light reflected from the testing board.

5. The electronic component testing device as claimed in claim 4, in, The emitting part emits light toward the bottom surface of the test board, and the receiving part receives light reflected from the bottom surface of the test board.

6. The electronic component testing device according to claim 1, in, The test unit is provided with an upper terminal set and a lower terminal set. When the detection result of the detection member is that the test board does not exist, the control unit drives the upper terminal set to contact the lower terminal set.

7. The electronic component testing device as claimed in claim 1, in, The test unit is provided with an upper terminal set and a lower terminal set. When the detection result of the detection member is that the test board exists, the control unit will not drive the upper terminal set to contact the lower terminal set.

8. The electronic component testing device as claimed in claim 1, in, The control unit will drive the feeding unit to place the electronic component into the test board when the detection result of the detection member is that the test board exists.

9. The electronic component testing device as claimed in claim 1, in, The control unit will not drive the feeding unit to place the electronic component into the test board when the detection result of the detection member is that the test board does not exist.

10. The electronic component testing device according to claim 1, in, The test plate is provided with a plurality of grooves, which are arranged in a multi-ring shape with radial inner and outer spacing. The detection member is located in the area between the inner ring side of the grooves of the test plate and the rotation center of the test plate.

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