Method and device for calculating vitrinite reflectivity of hydrocarbon source rock, medium and electronic equipment

By analyzing the core and three-dimensional seismic data of the source rock formation, a multi-regression relationship was established, and the mirroplasmic reflectivity of the source rock was calculated, which solved the problem of inaccurate calculations in the existing technology and improved the accuracy of the mirroplasmic reflectivity. meets the needs of oil and gas exploration.

CN119087523AActive Publication Date: 2024-12-06PETROCHINA CO LTD
View PDF 8 Cites 0 Cited by

Patent Information

Application Number
CN202310664546.6
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2023-06-06
Publication Date
2024-12-06
Estimated Expiration
2043-06-06

AI Technical Summary

Technical Problem

The existing scopic reflectivity calculation methods of source rocks cannot accurately reflect the changes in the burial depth of source rocks and the changes in the reflectivity of inter-well scopic reflectivity, resulting in inaccurate calculation results and difficult to meet the evaluation needs of geological significance.

Method used

By analyzing the core of the source rock formation, the reflectance measurement value of the scoplasmic body is obtained, combining the depth relocation and density logging curves, a multivariate regression relationship is established, and a three-dimensional seismic data is used to perform strata calibration and time depth conversion, and the intermediate vertical depth is calculated by calculating the intermediate vertical depth. and volume density layer, the reflectivity of the scoplasmic body is finally calculated and error correction is performed.

Benefits of technology

The calculation accuracy of the mirroplasmic reflectivity of the source rock is improved, and the changes in the mirroplasmic reflectivity of the source rock can be more realistically reflected, enhancing the accuracy of oil and gas exploration and tight oil evaluation.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN119087523A_ABST
    Figure CN119087523A_ABST
Patent Text Reader

Abstract

The invention discloses a method and device for calculating the vitrinite reflectivity of hydrocarbon source rock, a medium and electronic equipment. The method comprises the following steps: analyzing a hydrocarbon source rock stratum core to obtain a vitrinite reflectivity measured value; performing depth homing, performing standardization processing on a density logging curve, and combining with a vitrinite reflectivity measured value to establish a multiple regression relational expression; obtaining time horizon of a hydrocarbon source rock top interface and a hydrocarbon source rock bottom interface through seismic reflection interpretation; calculating an intermediate vertical depth horizon based on the time horizon; obtaining a density three-dimensional data volume through the standardized interval transit time curve and the standardized density curve; obtaining a volume density horizon in combination with the time horizon and the density three-dimensional data volume; and calculating vitrinite reflectivity corresponding to each calculation unit according to the multiple regression relational expression, the middle vertical depth horizon and the volume density horizon. According to the technical scheme provided by the invention, the accuracy of calculating the vitrinite reflectivity can be improved.
Need to check novelty before this filing date? Find Prior Art

Description

Technical Field

[0001] The present application belongs to the field of petroleum exploration technology, and in particular relates to a method, device, medium and electronic equipment for calculating the reflectivity of vitrinite in hydrocarbon source rocks. Background Art

[0002] Source rock refers to rocks that can generate oil and gas flows with industrial value. It is one of the key factors controlling whether a sedimentary basin can form oil and gas reservoirs. In the exploration and evaluation stage of oil and gas basins, accurate evaluation of source rocks is an important basis for locking in favorable exploration targets. In recent years, tight oil and gas have shown huge exploration and development potential. Tight oil and gas are close to or located within source rocks. Source rock evaluation is also an important part of tight oil and gas evaluation. Source rock evaluation mainly includes three aspects: organic matter abundance, organic matter type and maturity of organic matter in source rocks. The maturity of organic matter in source rocks is an important indicator to measure the actual hydrocarbon generation capacity of source rocks, and is an important basis for evaluating the hydrocarbon generation amount and resource prospects of a region or a source rock system. The vitrinite reflectance is the most commonly used maturity index to characterize the maturity of source rocks. Therefore, the ability to continuously and accurately determine the vitrinite reflectance of source rocks is of great practical significance for oil and gas exploration and tight oil evaluation in oil and gas basins.

[0003] At present, from the current research status at home and abroad, the vitrinite reflectance of source rocks is mainly determined based on the analysis and testing of source rock cores. On this basis, mathematical methods are used to grid the plane discrete distribution and limited number of analytical and testing data to obtain the plane isovalue map of the vitrinite reflectance of the source rock. However, this idea only obtains the plane distribution characteristics of the vitrinite reflectance of the source rock by mathematically calculating the analytical and testing data of known points, and does not consider the change of vitrinite reflectance caused by factors such as the change of burial depth of the source rock. The vitrinite reflectance of the source rock between wells is only calculated by mathematical methods, and cannot truly reflect the change of vitrinite reflectance. Moreover, for source rocks with a large thickness, it is difficult to reflect the actual vitrinite reflectance of the source rock using analytical and testing data at certain depths. Therefore, the existing method has certain limitations and cannot give an accurate calculation value of the vitrinite reflectance of the source rock with geological significance. Therefore, the present application provides a method for calculating the vitrinite reflectance of the source rock to improve the accuracy of calculating the vitrinite reflectance of the source rock. Summary of the invention

[0004] The embodiments of the present application provide a method, device, medium and electronic device for calculating the vitrinite reflectance of hydrocarbon source rocks, wherein the method can improve the accuracy of calculating the vitrinite reflectance.

[0005] Other features and advantages of the present application will become apparent from the following detailed description, or may be learned in part by the practice of the present application.

[0006] According to a first aspect of an embodiment of the present application, a method for calculating the vitrinite reflectance of a source rock is provided, characterized in that the method comprises: obtaining the vitrinite reflectance measurement values ​​corresponding to the source rock formation cores at different well points by analyzing the source rock formation cores; establishing a multivariate regression equation by depth homing the source rock formation cores, standardizing the density logging curves of the source rock formation cores, and combining the vitrinite reflectance measurement values ​​corresponding to the source rock formation cores at different well points; interpreting the seismic reflections of the top interface of the source rock and the bottom interface of the source rock based on three-dimensional seismic data and after calibrating the horizon of the top interface of the source rock and the bottom interface of the source rock, thereby obtaining the top interface of the source rock and the bottom interface of the source rock. time horizon; based on the time horizon of the source rock top interface and the source rock bottom interface, and in combination with the time-depth conversion method, the vertical depth horizon of the source rock top interface and the source rock bottom interface are obtained, so as to calculate the intermediate vertical depth horizon corresponding to each calculation unit; by performing density inversion on the standardized acoustic wave time difference curve and the standardized density curve, the density three-dimensional data body of the source rock is obtained; in combination with the time horizon of the source rock top interface and the source rock bottom interface, and the density three-dimensional data body, the volume density horizon corresponding to each calculation unit is obtained; according to the multivariate regression relationship, the intermediate vertical depth horizon, and the volume density horizon, the vitrinite reflectance corresponding to each calculation unit is calculated.

[0007] In some embodiments of the present application, based on the aforementioned scheme, the calculation of the intermediate vertical depth layer corresponding to each calculation unit includes: calculating the thickness of each calculation unit according to the vertical depth layer of the top interface of the source rock and the bottom interface of the source rock, and combining the preset number of calculation units; calculating the intermediate vertical depth layer of each calculation unit according to the vertical depth layer of the top interface of the source rock and the thickness of the calculation unit.

[0008] In some embodiments of the present application, based on the aforementioned scheme, the obtaining of the volume density horizon corresponding to each calculation unit includes: calculating the time thickness of each calculation unit according to the time horizon of the top interface of the source rock and the bottom interface of the source rock, and combining the preset number of calculation units; calculating the time horizon of the top interface and the bottom interface corresponding to each calculation unit according to the time horizon of the top interface of the source rock and the time thickness, so as to determine the average density corresponding to each calculation unit, and then using the average density corresponding to each calculation unit as the volume density horizon corresponding to each calculation unit.

[0009] In some embodiments of the present application, based on the aforementioned scheme, after calculating the vitrinite reflectance corresponding to each calculation unit, the method further includes: calculating the average measurement value of the vitrinite reflectance measurement value corresponding to any one of the calculation units according to the vitrinite reflectance measurement value; calculating the absolute error and relative error corresponding to any one of the calculation units according to the average measurement value and the vitrinite reflectance corresponding to any one of the calculation units, thereby correcting the vitrinite reflectance corresponding to any one of the calculation units according to the absolute error and the relative error.

[0010] In some embodiments of the present application, based on the aforementioned scheme, the correction of the vitrinite reflectance corresponding to any one of the calculation units includes: if the absolute error is greater than a preset absolute error, and the relative error is greater than a preset relative error, then according to the average measured value and the vitrinite reflectance corresponding to any one of the calculation units, constructing a vitrinite reflectance fitting curve, thereby correcting the vitrinite reflectance corresponding to any one of the calculation units according to the vitrinite reflectance fitting curve.

[0011] In some embodiments of the present application, based on the aforementioned scheme, the interpretation density of the seismic reflection interpretation of the top interface and the bottom interface of the source rock is 1×1.

[0012] In some embodiments of the present application, based on the above scheme, the vitrinite reflectance corresponding to each calculation unit is calculated by the following formula:

[0013] R on =a×H ρn +b×H dn +c

[0014] Among them, R on is the vitrinite reflectance corresponding to each calculation unit, H ρn is the volume density horizon, H dn is the intermediate vertical depth layer, and a, b, c are characteristic coefficients of the source rock formation.

[0015] Compared with the prior art, the present invention has at least the following beneficial effects:

[0016] The present invention prepares source rock formation cores into samples for analysis and testing, and uses a microphotometer to measure the vitrinite reflectance of each sample, thereby obtaining the vitrinite reflectance measurement values ​​corresponding to the source rock formation cores at different well points. A multivariate regression relationship is established by performing depth homing on the source rock formation cores, standardizing the density logging curves of the source rock formation cores, and combining the vitrinite reflectance measurement values ​​corresponding to the source rock formation cores at different well points.

[0017] Using 3D seismic data, on the basis of calibrating the top and bottom interfaces of the source rock, the seismic reflections of the top and bottom interfaces of the source rock are interpreted to obtain the time horizons of the top and bottom interfaces of the source rock. Then, by establishing a velocity field, the time horizons of the top and bottom interfaces of the source rock are converted to time depth, thus obtaining the vertical depth horizons of the top and bottom interfaces of the source rock.

[0018] According to the vertical depth horizon of the top interface of the source rock and the bottom interface of the source rock and the preset number of calculation units, the thickness of each calculation unit is calculated to obtain the intermediate vertical depth horizon corresponding to each calculation unit. The density three-dimensional data volume of the source rock is obtained by density inversion of the standardized acoustic time difference curve and the standardized density curve. Then, according to the time horizon of the top interface of the source rock and the bottom interface of the source rock obtained above and the preset number of calculation units, the volume density horizon corresponding to each calculation unit is obtained, so as to calculate the vitrinite reflectance corresponding to each calculation unit according to the multivariate regression relationship, the intermediate vertical depth horizon, and the volume density horizon.

[0019] Based on the above method, the method for calculating the vitrinite reflectance of hydrocarbon source rocks provided by the present invention can improve the accuracy of calculating the vitrinite reflectance.

[0020] According to a second aspect of an embodiment of the present application, a device for calculating the vitrinite reflectivity of a source rock is provided, characterized in that the device comprises: a measuring unit, for obtaining the vitrinite reflectivity measurement values ​​corresponding to the source rock formation cores of different well points by analyzing the source rock formation cores; a first data processing unit, for establishing a multivariate regression relationship by performing depth homing on the source rock formation cores, standardizing the density logging curves of the source rock formation cores, and combining the vitrinite reflectivity measurement values ​​corresponding to the source rock formation cores of the different well points; a second data processing unit, for interpreting the seismic reflections of the top interface of the source rock and the bottom interface of the source rock according to three-dimensional seismic data and after calibrating the horizon of the top interface of the source rock and the bottom interface of the source rock, so as to obtain the time horizon of the top interface of the source rock and the bottom interface of the source rock; A data conversion unit is used to obtain the vertical depth layer of the top interface of the source rock and the bottom interface of the source rock based on the time layer of the top interface of the source rock and the bottom interface of the source rock in combination with the time-depth conversion method, so as to calculate the intermediate vertical depth layer corresponding to each calculation unit; a third data processing unit is used to obtain the density three-dimensional data body of the source rock by performing density inversion on the standardized acoustic wave time difference curve and the standardized density curve; a fourth data processing unit is used to obtain the volume density layer corresponding to each calculation unit in combination with the time layer of the top interface of the source rock and the bottom interface of the source rock and the three-dimensional density data body; a fifth data processing unit is used to calculate the vitrinite reflectance corresponding to each calculation unit according to the multivariate regression relationship, the intermediate vertical depth layer, and the volume density layer.

[0021] According to a third aspect of an embodiment of the present application, a computer-readable storage medium is provided, characterized in that at least one program code is stored in the computer-readable storage medium, and the at least one program code is loaded and executed by a processor to implement the operations performed by the described method.

[0022] According to a fourth aspect of an embodiment of the present application, an electronic device is provided, characterized in that the electronic device includes one or more processors and one or more memories, at least one program code is stored in the one or more memories, and the at least one program code is loaded and executed by the one or more processors to implement the operations performed by the method.

[0023] The beneficial effects of each embodiment of the second to fourth aspects mentioned above can refer to the beneficial effects of the first aspect and each embodiment of the first aspect mentioned above, and will not be repeated here.

[0024] It should be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] The drawings herein are incorporated into the specification and constitute a part of the specification, showing embodiments consistent with the present application, and together with the specification, are used to explain the principles of the present application. Obviously, the drawings described below are only some embodiments of the present application, and for ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. In the drawings:

[0026] Figure 1 A flow chart showing a method for calculating the reflectance of vitrinite of a source rock in an embodiment of the present application is shown;

[0027] Figure 2 A schematic diagram showing the division of computing units and intermediate vertical depth in an embodiment of the present application is shown;

[0028] Figure 3 A schematic diagram of the intermediate vertical depth layer of the calculation unit 1 in the embodiment of the present application is shown;

[0029] Figure 4 A schematic diagram showing a volume density layer of a calculation unit 1 in an embodiment of the present application is shown;

[0030] Figure 5 A schematic diagram of spectrum slicing of an amplitude tuning body in an embodiment of the present application is shown;

[0031] Figure 6 The vitrinite reflectance fitting curve in the embodiment of the present application is shown;

[0032] Figure 7 shows a planar distribution diagram of the corrected vitrinite reflectance in an embodiment of the present application;

[0033] Figure 8 A schematic diagram of the structure of a device for calculating the reflectance of vitrinite of a hydrocarbon source rock in an embodiment of the present application is shown;

[0034] Fig. 9 A schematic diagram of the structure of an electronic device in an embodiment of the present application is shown. DETAILED DESCRIPTION

[0035] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0036] In addition, described feature, structure or characteristic can be combined in one or more embodiments in any suitable manner. In the following description, many specific details are provided to provide a full understanding of the embodiments of the present application. However, those skilled in the art will appreciate that the technical scheme of the present application can be put into practice without one or more of the specific details, or other methods, components, devices, steps, etc. can be adopted. In other cases, known methods, devices, realizations or operations are not shown or described in detail to avoid blurring the various aspects of the application.

[0037] The block diagrams shown in the accompanying drawings are merely functional entities and do not necessarily correspond to physically independent entities. That is, these functional entities may be implemented in software form, or in one or more hardware modules or integrated circuits, or in different networks and / or processor devices and / or microcontroller devices.

[0038] The flowcharts shown in the accompanying drawings are only exemplary and do not necessarily include all the contents and operations / steps, nor must they be executed in the order described. For example, some operations / steps can be decomposed, and some operations / steps can be combined or partially combined, so the actual execution order may change according to actual conditions.

[0039] The following is a detailed description of this application:

[0040] Figure 1 The flowchart of the method for calculating the reflectance of vitrinite in hydrocarbon source rock in the embodiment of the present application is shown. The method for calculating the reflectance of vitrinite in hydrocarbon source rock can be executed by a device with a computing and processing function, such as a device for calculating the reflectance of vitrinite in hydrocarbon source rock. Figure 1 As shown, the method for calculating the source rock vitrinite reflectance includes at least steps 110 to 170, which are described in detail as follows:

[0041] Step 110, by analyzing the core of the source rock formation, obtaining the vitrinite reflectance measurement values ​​corresponding to the core of the source rock formation at different well points.

[0042] Step 120, establishing a multivariate regression equation by performing depth tracing on the source rock formation core, standardizing the density logging curve of the source rock formation core, and combining the vitrinite reflectance measurement values ​​corresponding to the source rock formation core at different well points.

[0043] Step 130, based on the three-dimensional seismic data, and after the top interface of the source rock and the bottom interface of the source rock are calibrated, the seismic reflections of the top interface of the source rock and the bottom interface of the source rock are interpreted to obtain the time horizon of the top interface of the source rock and the bottom interface of the source rock.

[0044] Step 140, based on the time horizon of the top interface of the source rock and the bottom interface of the source rock, and combined with the time-depth conversion method, the vertical depth horizon of the top interface of the source rock and the bottom interface of the source rock are obtained, so as to calculate the intermediate vertical depth horizon corresponding to each calculation unit.

[0045] Step 150, by performing density inversion on the standardized acoustic wave time difference curve and the standardized density curve, a three-dimensional density data volume of the source rock is obtained.

[0046] Step 160, combining the time horizon of the source rock top interface and the source rock bottom interface, and the density three-dimensional data volume, to obtain the volume density horizon corresponding to each calculation unit.

[0047] Step 170, calculating the vitrinite reflectance corresponding to each calculation unit according to the multivariate regression relationship, the intermediate vertical depth layer, and the volume density layer.

[0048] In this application, according to the research needs, all source rock formation cores in the study area are sampled at fixed depth intervals and prepared as samples for analysis and testing. The source rock formation cores are analyzed by a microphotometer to obtain the vitrinite reflectance measurement values ​​corresponding to the source rock formation cores at different well points.

[0049] On the basis of step 110, the source rock formation core is depth-relocated, and the density logging curve of the source rock formation core is standardized. According to the logging data, the vertical depth layer corresponding to each source rock formation core and the response value of the standardized density logging curve are counted. The multivariate regression method is used to establish a multivariate regression relationship between vitrinite reflectance, vertical depth layer, and volume density of the source rock formation core. It should be noted that the depth-relocation of the source rock formation core refers to matching the depth of the source rock formation core with the logging data. The vertical depth layer refers to the vertical depth from the surface to a certain point underground.

[0050] Further, in one embodiment of the present application, the multivariate regression equation is R o =a×ρ+b×TVD+c, where a, b, c are characteristic coefficients of source rock formations, ρ is the core volume density of source rock formations, TVD is the vertical depth layer, R o is the vitrinite reflectance.

[0051] Then, based on the three-dimensional seismic data, after the top interface and the bottom interface of the source rock are calibrated, the seismic reflections of the top interface and the bottom interface of the source rock are interpreted to obtain the time horizon of the top interface and the bottom interface of the source rock. Based on the time horizon of the top interface and the bottom interface of the source rock, a velocity field is established to perform time-depth conversion on the time horizon of the top interface and the bottom interface of the source rock. For example, the time horizons of the top interface and the bottom interface of the source rock are H tt and H tb After time-depth conversion, the vertical depth of the source rock top interface and the source rock bottom interface is obtained as H dt and H db The velocity field refers to a physical field composed of the velocity at each point at each moment in three-dimensional space, and the seismic reflection refers to the line connecting the extreme values ​​of the same vibration phase on each trace in the seismic record.

[0052] Reference Figure 2 , shows the calculation unit division and intermediate vertical depth diagram in the embodiment of the present application. After obtaining the vertical depth layer of the source rock top interface and the source rock bottom interface, the source rock formation can be divided into calculation units according to the actual source rock thickness and research needs. For example, the source rock formation is divided into n calculation units, and the thickness T of each calculation unit is the depth layer H of the source rock bottom interface. db Subtract the depth of the top interface of the source rock H dt Obtain the total thickness of the source rock, and then divide the total thickness of the source rock by the preset number of calculation units n. Figure 3 , shows a schematic diagram of the intermediate vertical depth layer of the calculation unit 1 in the embodiment of the present application. After obtaining the thickness T of each calculation unit, the thickness of the calculation unit is divided by 2 to obtain T / 2, and T / 2 is added to the top surface depth layer of the source rock to obtain the intermediate vertical depth layer H of the calculation unit 1. d1 , calculate the intermediate depth layer H of unit 1 d1 Added to T, the intermediate vertical depth layer H of calculation unit 2 is obtained d2 , and so on, until the middle vertical depth layer H of the last calculation unit is obtained dn .

[0053] Furthermore, in one embodiment of the present application, the interpretation density of the seismic reflection interpretation of the top interface and the bottom interface of the source rock is 1×1.

[0054] On the basis of standardizing the acoustic time difference curve and the density curve, density inversion is performed to obtain the density three-dimensional data volume of the source rock. Then, according to the time horizon H of the top interface of the source rock obtained in step 130, tt The time horizon H of the interface between the source rock and the bottom tb, so as to obtain the volume density layer corresponding to each calculation unit.

[0055] Furthermore, in one embodiment of the present application, the obtaining of the volume density horizon corresponding to each calculation unit may include the following steps: calculating the time thickness of each calculation unit according to the time horizon of the top interface of the source rock and the bottom interface of the source rock, and in combination with a preset number of calculation units; calculating the time horizon of the top interface and the bottom interface corresponding to each calculation unit according to the time horizon of the top interface of the source rock and the time thickness, thereby determining the plane distribution horizon corresponding to each calculation unit, and then using the plane distribution horizon corresponding to each calculation unit as the volume density horizon corresponding to each calculation unit.

[0056] Specifically, refer to Figure 4 , showing a schematic diagram of the volume density horizon of the calculation unit 1 in the embodiment of the present application. tb Subtract the time horizon H of the top interface of source rock tt Get the source rock time thickness T t Then use the source rock time thickness T t Divide by the preset number of calculation units n, and get the time thickness T of each calculation unit te , the time thickness T te The time horizon H of the top interface with the source rock tt Add together to get the bottom interface time horizon H of calculation unit 1 t1 , the time thickness T te The time horizon H of the bottom interface of calculation unit 1 t1 Add together to get the bottom time horizon H of calculation unit 2 t2 , and so on, until the bottom time horizon H of the last calculation unit is obtained tn Based on this, the top interface time horizon and the bottom interface time horizon of each calculation unit are used as constraints to extract the plane distribution horizon of the average density of each calculation unit as the volume density horizon H of each calculation unit. ρn .

[0057] The density inversion refers to a technique for obtaining the volume density of underground geological bodies based on seismic data and well logging data by using a principal component analysis algorithm or geostatistics principles.

[0058] The vitrinite reflectance corresponding to each calculation unit is calculated based on the above-calculated or obtained multiple regression relationship, intermediate vertical depth layer, and volume density layer.

[0059] Further, in one embodiment of the present application, the vitrinite reflectance corresponding to each calculation unit is calculated by the following formula:

[0060] Ron =a×H ρn +b×H dn +c

[0061] Among them, R on is the vitrinite reflectance corresponding to each calculation unit, H ρn is the volume density horizon, H dn is the intermediate vertical depth layer, and a, b, c are characteristic coefficients of the source rock formation.

[0062] At the same time, you can refer to Figure 5 , shows a schematic diagram of spectrum slicing of the amplitude tuning body in an embodiment of the present application. Figure 5 The planar distribution of the vitrinite reflectance of the source rock formation can be clearly known.

[0063] In the present application, after calculating the vitrinite reflectance corresponding to each calculation unit, the method for calculating the vitrinite reflectance of the source rock may further include steps 210 to 220:

[0064] Step 210: Calculate the average measured value of the vitrinite reflectance measured value corresponding to any calculation unit according to the vitrinite reflectance measured value.

[0065] Step 220 calculates the absolute error and relative error corresponding to the arbitrary calculation unit according to the average measured value and the vitrinite reflectance corresponding to the arbitrary calculation unit, thereby correcting the vitrinite reflectance corresponding to the arbitrary calculation unit according to the absolute error and the relative error.

[0066] Specifically, taking any calculation unit as an example, the vitrinite reflectance measurement values ​​obtained in step 110 are divided according to the calculation unit thickness at the location of the coring well, and the vitrinite reflectance measurement values ​​are plotted into a histogram according to the division result, and the vitrinite reflectance measurement values ​​of the area with the highest frequency of vitrinite reflectance measurement values ​​in the histogram are averaged, so that the average value of the above vitrinite reflectance measurement values ​​is used as the vitrinite reflectance measurement value R of the calculation unit at the well point. onc1 . onc1 The calculated value R calculated according to the method for calculating the vitrinite reflectance of the source rock at the well point on1 Compare and calculate the absolute error ε of the calculation unit at the well point n1 and relative error δ n1 , thereby correcting the vitrinite reflectance calculated by any calculation unit according to the method for calculating the vitrinite reflectance of source rocks according to the absolute error and relative error. n1 =R on1 -R onc1 , δ n1 =εn1 / R onc1 ×100%.

[0067] Furthermore, in one embodiment of the present application, if the absolute error is greater than a preset absolute error, and the relative error is greater than a preset relative error, a vitrinite reflectance fitting curve is constructed based on the average measurement value and the vitrinite reflectance corresponding to any one of the calculation units, thereby correcting the vitrinite reflectance corresponding to any one of the calculation units based on the vitrinite reflectance fitting curve.

[0068] For example, the absolute error calculated by any calculation unit is 0.008%, and the relative error is 1.63%. Since the absolute error of the current calculation unit is 0.008% greater than the preset absolute error, and the relative error is 1.63% greater than the preset relative error, it is necessary to calculate the vitrinite reflectance value R at all well points. onci and the vitrinite reflectance R calculated according to the method for calculating the vitrinite reflectance of the source rock oni , make R onci With R oni The scatter plot of the vitrinite reflectance is constructed. Figure 6 , shows the vitrinite reflectance fitting curve in the embodiment of the present application. According to the fitting, the vitrinite reflectance fitting curve is obtained for the vitrinite reflectance calculation result R on Correction is performed to obtain the final result R onf Wherein, the vitrinite reflectance fitting curve can be y=0.9883x+0.0008. 0.9883 and 0.0008 are the fitting coefficients of the vitrinite reflectance fitting curve. Based on this, the calculation formula of the vitrinite reflectance after correction in this application is R onf =0.9883×R on +0.0008. Based on this, Figure 7 The plan distribution diagram of the corrected vitrinite reflectance in the embodiment of the present application is shown.

[0069] Based on the same inventive concept, the present application also provides a device for calculating the reflectance of vitrinite in source rock, referring to Figure 8, showing a schematic diagram of the structure of the device for calculating the vitrinite reflectivity of source rock in an embodiment of the present application. The device for calculating the vitrinite reflectivity of source rock 800 includes: a measuring unit 801, used to obtain the vitrinite reflectivity measurement values ​​corresponding to the source rock formation cores of different well points by analyzing the source rock formation cores; a first data processing unit 802, used to establish a multivariate regression relationship by performing depth homing on the source rock formation cores, standardizing the density logging curves of the source rock formation cores, and combining the vitrinite reflectivity measurement values ​​corresponding to the source rock formation cores of different well points; a second data processing unit 803, used to interpret the seismic reflections of the top interface and the bottom interface of the source rock according to the three-dimensional seismic data, and after the layer position of the top interface and the bottom interface of the source rock are calibrated, so as to obtain the time layer position of the top interface and the bottom interface of the source rock; a data conversion unit 804, used to obtain the time layer position of the top interface and the bottom interface of the source rock based on the three-dimensional seismic data; a first data processing unit 802, used to obtain the time layer position of the top interface and the bottom interface of the source rock based on the three-dimensional seismic data; a second data processing unit 803, used to interpret the seismic reflections of the top interface and the bottom interface of the source rock according to the three-dimensional seismic data, and after the layer position of the top interface and the bottom interface of the source rock are calibrated, so as to obtain the time layer position of the top interface and the bottom interface of the source rock; a second data processing unit 803, used to obtain the time layer position of the top interface and the bottom interface of the source rock based on the three-dimensional seismic data; a first data processing unit 802, used to obtain the time layer position of the top interface and the bottom interface of the source rock based on the three-dimensional seismic data; a first data processing unit 802, used to obtain the time The time horizon of the top interface of the source rock and the bottom interface of the source rock are obtained by combining the time-depth conversion method to obtain the vertical depth horizon of the top interface of the source rock and the bottom interface of the source rock, so as to calculate the intermediate vertical depth horizon corresponding to each calculation unit; the third data processing unit 805 is used to obtain the density three-dimensional data body of the source rock by performing density inversion on the standardized acoustic wave time difference curve and the standardized density curve; the fourth data processing unit 806 is used to obtain the volume density horizon corresponding to each calculation unit in combination with the time horizon of the top interface of the source rock and the bottom interface of the source rock, and the density three-dimensional data body; the fifth data processing unit 807 is used to calculate the vitrinite reflectance corresponding to each calculation unit according to the multivariate regression relationship, the intermediate vertical depth horizon, and the volume density horizon.

[0070] For details not disclosed in the embodiments of the device of the present application, please refer to the embodiments of the above method of the present application.

[0071] Based on the same inventive concept, the present application may also provide a computer-readable storage medium, characterized in that at least one program code is stored in the computer-readable storage medium, and the at least one program code is loaded and executed by a processor to implement the operations performed by the method described.

[0072] Based on the same inventive concept, the present application also provides an electronic device, referring to Fig. 9 , Fig. 9 A schematic diagram of the structure of an electronic device in an embodiment of the present application is shown.

[0073] The electronic device includes one or more memories 904, one or more processors 902, and at least one computer program (program code) stored in the memory 904 and executable on the processor 902. When the processor 902 executes the computer program, the method described above is implemented.

[0074] Among them, Fig. 9 In the embodiment of the present invention, a bus architecture (represented by bus 900) is shown, which may include any number of interconnected buses and bridges, and bus 900 links various circuits including one or more processors represented by processor 902 and memory represented by memory 904. Bus 900 may also link various other circuits such as peripherals, voltage regulators, and power management circuits, which are well known in the art and are therefore not further described herein. Bus interface 905 provides an interface between bus 900 and receiver 901 and transmitter 903. Receiver 901 and transmitter 903 may be the same element, namely a transceiver, providing a unit for communicating with various other devices over a transmission medium. Processor 902 is responsible for managing bus 900 and general processing, while memory 904 may be used to store data used by processor 902 when performing operations.

[0075] The functions described herein may be implemented in hardware, software executed by a processor, firmware, or any combination thereof. If implemented in software executed by a processor, the functions may be stored as one or more instructions or codes on a computer-readable medium or transmitted via a computer-readable medium. Other examples and implementations are within the scope and spirit of the present application and the appended claims. For example, due to the nature of software, the functions described above may be implemented using software executed by a processor, hardware, firmware, hard wiring, or a combination of any of these. In addition, each functional unit may be integrated into a processing unit, each unit may exist physically separately, or two or more units may be integrated into one unit.

[0076] In the several embodiments provided in this application, it should be understood that the disclosed technical content can be implemented in other ways. Among them, the device embodiments described above are only schematic. For example, the division of the units can be a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of units or modules, which can be electrical or other forms.

[0077] The units described as separate components may or may not be physically separated, and the components of the control device may or may not be physical units, that is, they may be located in one place or distributed in multiple units. Some or all of the units may be selected according to actual needs to achieve the purpose of the present embodiment.

[0078] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions to enable a computer device (which can be a personal computer, a server or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), mobile hard disk, disk or optical disk and other media that can store program codes.

[0079] The above description is only an embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent substitution, improvement, etc. made within the spirit and principle of the present application shall be included in the scope of the claims of the present application.

Claims

1. A method for calculating the reflectance of vitrinite of source rock, characterized in that: The method comprises: By analyzing the cores of the source rock formation, the vitrinite reflectance measurement values ​​corresponding to the cores of the source rock formation at different well points are obtained; A multivariate regression equation is established by performing depth tracing on the core of the source rock formation, standardizing the density logging curve of the core of the source rock formation, and combining the vitrinite reflectance measurement values ​​corresponding to the core of the source rock formation at different well points; Based on the three-dimensional seismic data, after the top interface and the bottom interface of the source rock are calibrated, the seismic reflections of the top interface and the bottom interface of the source rock are interpreted to obtain the time horizon of the top interface and the bottom interface of the source rock; Based on the time horizon of the top interface of the source rock and the bottom interface of the source rock, and in combination with the time-depth conversion method, the vertical depth horizon of the top interface of the source rock and the bottom interface of the source rock are obtained, so as to calculate the intermediate vertical depth horizon corresponding to each calculation unit; By performing density inversion on the standardized acoustic time difference curve and the standardized density curve, the density three-dimensional data volume of the source rock is obtained; Combining the time horizons of the top interface of the source rock and the bottom interface of the source rock, and the three-dimensional density data volume, obtaining the volume density horizon corresponding to each calculation unit; The vitrinite reflectance corresponding to each calculation unit is calculated according to the multivariate regression relationship, the intermediate vertical depth layer, and the volume density layer.

2. The method according to claim 1, characterized in that The calculating of the intermediate vertical depth layer corresponding to each calculation unit includes: Calculate the thickness of each calculation unit according to the vertical depth layer of the top interface of the source rock and the bottom interface of the source rock and the preset number of calculation units; The intermediate vertical depth layer of each calculation unit is calculated according to the vertical depth layer of the top interface of the source rock and the thickness of the calculation unit.

3. The method according to claim 1, characterized in that: The step of obtaining the volume density layer corresponding to each calculation unit includes: According to the time horizon of the top interface of the source rock and the bottom interface of the source rock, and in combination with the preset number of calculation units, the time thickness of each calculation unit is calculated; According to the time horizon of the top interface of the source rock and the time thickness, the time horizon of the top interface and the bottom interface corresponding to each calculation unit is calculated, so as to determine the average density corresponding to each calculation unit, and then the average density corresponding to each calculation unit is used as the volume density horizon corresponding to each calculation unit.

4. The method according to claim 1, characterized in that: After calculating the vitrinite reflectance corresponding to each calculation unit, the method further includes: According to the vitrinite reflectance measurement values, calculating an average measurement value of the vitrinite reflectance measurement values ​​corresponding to any calculation unit; According to the average measured value and the vitrinite reflectance corresponding to the arbitrary calculation unit, the absolute error and the relative error corresponding to the arbitrary calculation unit are calculated, so as to correct the vitrinite reflectance corresponding to the arbitrary calculation unit according to the absolute error and the relative error.

5. The method according to claim 4, characterized in that The correcting the vitrinite reflectance corresponding to any one of the calculation units comprises: If the absolute error is greater than the preset absolute error, and the relative error is greater than the preset relative error, a vitrinite reflectance fitting curve is constructed according to the average measured value and the vitrinite reflectance corresponding to any one of the calculation units, thereby correcting the vitrinite reflectance corresponding to any one of the calculation units according to the vitrinite reflectance fitting curve.

6. The method according to claim 1, characterized in that The interpretation density of the seismic reflection interpretation of the top interface and the bottom interface of the source rock is 1×1.

7. The method according to claim 1, characterized in that The vitrinite reflectance corresponding to each calculation unit is calculated by the following formula: R on =a×H ρn +b×H dn +c Among them, R on is the vitrinite reflectance corresponding to each calculation unit, H ρn is the volume density horizon, H dn is the intermediate vertical depth layer, and a, b, c are characteristic coefficients of the source rock formation.

8. A device for calculating the reflectance of vitrinite of source rock, characterized in that: The device comprises: A measuring unit, used for obtaining vitrinite reflectance measurement values ​​corresponding to the cores of the source rock formations at different well points by analyzing the cores of the source rock formations; The first data processing unit is used to establish a multivariate regression equation by performing depth homing on the core of the source rock formation, standardizing the density logging curve of the core of the source rock formation, and combining the vitrinite reflectance measurement values ​​corresponding to the core of the source rock formation at different well points; The second data processing unit is used to interpret the seismic reflections of the top interface and the bottom interface of the source rock according to the three-dimensional seismic data after the top interface and the bottom interface of the source rock are calibrated, so as to obtain the time horizon of the top interface and the bottom interface of the source rock; A data conversion unit is used to obtain the vertical depth layer of the top interface of the source rock and the bottom interface of the source rock based on the time layer of the top interface of the source rock and the bottom interface of the source rock, and in combination with the time-depth conversion method, so as to calculate the intermediate vertical depth layer corresponding to each calculation unit; A third data processing unit is used to obtain a three-dimensional density data volume of the source rock by performing density inversion on the standardized acoustic wave time difference curve and the standardized density curve; A fourth data processing unit is used to obtain a volume density layer corresponding to each calculation unit by combining the time layer of the top interface of the source rock and the bottom interface of the source rock and the three-dimensional density data body; The fifth data processing unit is used to calculate the vitrinite reflectance corresponding to each calculation unit according to the multivariate regression relationship, the intermediate vertical depth layer, and the volume density layer.

9. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores at least one program code, and the at least one program code is loaded and executed by a processor to implement the operations performed by the method according to any one of claims 1 to 7.

10. An electronic device, characterized in that: The electronic device includes one or more processors and one or more memories, wherein the one or more memories store at least one program code, and the at least one program code is loaded and executed by the one or more processors to implement the operations performed by the method according to any one of claims 1 to 7.

Citation Information

Patent Citations

  • Probabilistic neural network algorithm-based source rock prediction method and device

    CN107436452A

  • Vitrinite reflectance calibration method based on mathematical statistics

    CN109633122A

  • Microseism stratum velocity calibration method and system

    CN110967762A

  • Hydrocarbon source rock maturity prediction method and device based on three-dimensional seismic data

    CN112327357A

  • Prediction method for favorable metallogenic zone of interlayer oxidation zone sandstone type uranium deposit

    CN114139328A