High-temperature gas temperature measuring equipment

Abstract

The invention discloses high-temperature gas temperature measuring equipment, and relates to the technical field of gas temperature detection. Through the design of the rotary shifting piece and the baffle plate, the air in the rotary chamber can generate an obvious centrifugal force effect under the condition of high-speed rotation, so that the air with lower temperature quickly flows to the edge of the inner wall of the rotary chamber under the centrifugal force effect, and the air with higher temperature is gathered to the axis position of the rotary chamber. According to the design, flowing of air and gathering of hot air can be completed in a relatively short time, and the accuracy and efficiency of air temperature measurement are greatly improved; due to the fact that the light emitted by the semiconductor laser can generate wavelength red shift after being heated, the laser is guided to the optical wavelength detector through the light guide optical fiber to be detected, and the temperature of air can be accurately measured. And reliable and accurate temperature data can be provided in an occasion with a high-precision measurement requirement, and measurement errors of a traditional temperature sensor in a high-temperature or complex environment are effectively avoided.

Description

Technical Field

[0001] The present invention relates to the technical field of gas temperature detection, and in particular to a high-temperature gas temperature measuring device. Background Art

[0002] Most existing air temperature measurement devices use traditional temperature sensors such as thermocouples or thermistors. These sensors are easily disturbed in high temperature or complex environments and have low measurement accuracy. In addition, traditional temperature sensors need to be placed in the environment during the measurement process and are easily affected by environmental factors, resulting in unstable measurement data. Especially when measuring high-temperature gas, high-temperature gas will increase the internal resistance of the equipment, resulting in a loss of measurement accuracy and failure to meet measurement requirements in high-temperature environments. Summary of the invention

[0003] In order to overcome the defects of the above-mentioned prior art, the present invention provides the following technical solutions: a high-temperature gas temperature measuring device, comprising an installation shell, a rotating chamber is rotatably installed in the installation shell through a rotating chamber bracket, a plurality of rotating paddles arranged in a circular equidistant array are fixed on the circumferential surface of the inner wall of the rotating chamber, a plurality of flow holes are also opened on the rotating chamber, a shielding plate for shielding the flow holes is also rotatably provided on the rotating chamber, the shielding plate is provided with air holes with the same number and shape as the flow holes, a shielding ring plate is fixed on one end of the rotating chamber away from the shielding plate in a manner that is easy to disassemble, a heated shell is provided at the axis center of the rotating chamber, a semiconductor laser is fixedly provided inside the heated shell, and a collimating lens is also fixed inside the heated shell for collimating the light emitted by the semiconductor laser.

[0004] Preferably, the heated shell is fixed on the support tube, an avoidance through hole is opened at the intersection of the rotating chamber and the support tube, a sealing sheet is provided for sliding sealing at the avoidance through hole, the sealing sheet is fixed on the support tube, and a support ring frame is fixed at the coaxial position of the avoidance through hole, and a symmetrically arranged movable rack bracket is fixed on the support ring frame.

[0005] Preferably, a gear ring is rotatably mounted on the support ring frame, and two movable racks symmetrical about the origin of the support ring frame are slidably mounted on the two movable rack brackets, a counterweight block is fixed to one end of the movable rack, and two extension arms symmetrical about the origin of the support ring frame are also fixedly mounted on the two movable rack brackets, a tension spring is fixed between the extension arm and the other end of the movable rack, the two movable racks are meshed with the gear ring for transmission, and the gear ring is fixedly matched with the baffle plate.

[0006] Preferably, a mounting base is fixedly mounted on the mounting shell, and a threaded boss is provided on the mounting base, and a mounting tube can be threadedly fixedly sleeved on the threaded boss.

[0007] Preferably, a driving motor is fixedly mounted on the rotating chamber bracket, and an output shaft of the driving motor is connected to the circumferential surface of the rotating chamber via a transmission belt.

[0008] Preferably, a light-guiding optical fiber is fixedly mounted on the rotating chamber bracket, one end of which is connected to the heated shell, and the other end of which is connected to the optical wavelength tester for guiding the light emitted by the semiconductor laser to the optical wavelength tester.

[0009] Preferably, a light-guiding channel can also be fixed on the mounting shell, and a black matte coating is provided on the inner and outer surfaces of the light-guiding channel. A second reflector and a first reflector are fixedly installed in the light-guiding channel, wherein the first reflector and the second reflector are vertically arranged, and the first reflector is used to reflect the light emitted by the semiconductor laser vertically onto the second reflector, and the second reflector is used to reflect the light reflected by the first reflector vertically out of the light-guiding channel.

[0010] Preferably, a shading shell is arranged on the path of light reflected by the second reflector, a shading plate is fixed on the inner wall of the shading shell, two light sensors are opened on the shading plate, and double slits are fixed inside the shading shell for observing and recording light stripes passing through the light sensors.

[0011] Compared with the prior art, the present invention has the following beneficial effects: (1) Through the design of the rotating paddle and the baffle, the air in the rotating chamber can generate obvious centrifugal force under high-speed rotation, so that the air with lower temperature quickly flows to the inner wall edge of the rotating chamber under the action of centrifugal force, while the air with higher temperature gathers at the axis position of the rotating chamber. This design can complete the flow of air and the gathering of hot air in a relatively short time, greatly improving the accuracy and efficiency of air temperature measurement; (2) Since the light emitted by the semiconductor laser will undergo a red shift in wavelength after being heated, the present invention uses a light-guiding optical fiber to guide the laser to the optical wavelength detector for detection, so that the temperature of the air can be accurately measured. Especially in situations where high-precision measurement is required, this device can provide reliable and accurate temperature data, effectively avoiding the measurement errors of traditional temperature sensors in high temperature or complex environments; (3) The design of the present invention takes into account the needs of different measurement environments and provides a variety of installation and use methods, such as installing a collimating lens in the rotating chamber to directly output light, or guiding light to a distant light-shielding shell for measurement through a light-guiding channel and a reflector system. This flexible installation method can adapt to various complex on-site environments and improve the applicability and operability of the equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 It is a schematic diagram of the overall structure of the present invention.

[0013] Figure 2It is a schematic diagram of the light-shielding shell structure of the present invention.

[0014] Figure 3 It is a schematic diagram of the light-guiding channel structure of the present invention.

[0015] Figure 4 This is a schematic diagram of the mounting base structure of the present invention.

[0016] Figure 5 It is a schematic diagram of the structure of the rotating chamber support of the present invention.

[0017] Figure 6 It is a schematic diagram of the structure of the shielding ring plate of the present invention.

[0018] Figure 7 It is a schematic diagram of the structure of the rotating chamber of the present invention.

[0019] Figure 8 It is a structural schematic diagram of the support ring frame of the present invention.

[0020] Fig. 9 For the present invention Figure 8 Schematic diagram of the structure at point A in the middle.

[0021] Fig.10 It is a schematic diagram of the structure of the tension spring of the present invention.

[0022] In the figure: 101-rotating chamber; 102-rotating paddle; 103-shielding plate; 104-vent hole; 105-flow hole; 106-avoidance hole; 107-sealing sheet; 108-support tube; 109-heating shell; 110-semiconductor laser; 111-collimating lens; 112-support ring frame; 113-tooth ring; 114-counterweight block; 115-movable rack; 116-movable rack bracket; 117- Extension arm; 118-tension spring; 119-shielding ring plate; 120-light-guiding optical fiber; 121-rotating chamber bracket; 122-transmission belt; 123-driving motor; 124-mounting shell; 125-mounting base; 126-mounting tube; 127-light-guiding channel; 128-second reflector; 129-first reflector; 130-light-shielding shell; 131-light-shielding plate; 132-double slit hole; 133-light sensor. DETAILED DESCRIPTION

[0023] The following is combined with Figure 1-10 , and further illustrate the technical solution of the present invention through specific implementation methods.

[0024] The present invention provides a high-temperature gas temperature measuring device, comprising an installation shell 124, in which a rotating chamber 101 is rotatably installed through a rotating chamber bracket 121, a plurality of rotating paddles 102 arranged in a circular equidistant array are fixed on the circumferential surface of the inner wall of the rotating chamber 101, a plurality of flow holes 105 are also provided on the rotating chamber 101, a shielding plate 103 for shielding the flow holes 105 is also rotatably provided on the rotating chamber 101, and air holes 104 having the same number and shape as the flow holes 105 are provided on the shielding plate 103, a shielding ring plate 119 is fixed at one end of the rotating chamber 101 away from the shielding plate 103 in a manner that is easy to disassemble, a heated shell 109 is provided at the axis center inside the rotating chamber 101, a semiconductor laser 110 is fixedly provided inside the heated shell 109, and a collimating lens 111 is also fixed inside the heated shell 109 for collimating the light emitted by the semiconductor laser 110. The heated shell 109 is fixed on the support tube 108, and an avoidance hole 106 is opened at the intersection of the rotating chamber 101 and the support tube 108. A sealing sheet 107 is provided for sliding sealing at the avoidance hole 106. The sealing sheet 107 is fixed on the support tube 108, and a support ring frame 112 is fixed at a coaxial position of the avoidance hole 106, and a symmetrically arranged movable rack bracket 116 is fixed on the support ring frame 112. A gear ring 113 is rotatably mounted on the support ring frame 112, and two movable racks 115 symmetrical about the origin of the support ring frame 112 are slidably mounted on the two movable rack brackets 116, and a counterweight 114 is fixed to one end of the movable rack 115. Two extension arms 117 symmetrical about the origin of the support ring frame 112 are also fixedly mounted on the two movable rack brackets 116, and a tension spring 118 is fixed between the extension arm 117 and the other end of the movable rack 115. The two movable racks 115 are meshed and transmitted with the gear ring 113, wherein the gear ring 113 is fixedly matched with the shielding plate 103. A mounting base 125 is also fixedly mounted on the mounting housing 124, and a threaded boss is provided on the mounting base 125, and a mounting tube 126 can be threadedly fixedly mounted on the threaded boss. A driving motor 123 is fixedly mounted on the rotating chamber bracket 121, and the output shaft of the driving motor 123 is connected to the circumferential surface of the rotating chamber 101 through a transmission belt 122. A light-guiding optical fiber 120 is fixedly mounted on the rotating chamber bracket 121 , one end of which is connected to the heated shell 109 , and the other end of which is connected to the optical wavelength tester for guiding the light emitted by the semiconductor laser 110 to the optical wavelength tester.A light-guiding channel 127 can also be fixed on the mounting shell 124. A black matte coating is provided on the inner and outer surfaces of the light-guiding channel 127. A second reflector 128 and a first reflector 129 are fixedly installed in the light-guiding channel 127. The first reflector 129 and the second reflector 128 are vertically arranged. The first reflector 129 is used to vertically reflect the light emitted by the semiconductor laser 110 to the second reflector 128. The second reflector 128 is used to vertically reflect the light reflected by the first reflector 129 out of the light-guiding channel 127. A light-shielding shell 130 is arranged on the path of the light reflected by the second reflector 128. A light-shielding plate 131 is fixed on the inner wall of the light-shielding shell 130. Two light sensors 133 are provided on the light-shielding plate 131. A double slit hole 132 is also fixedly arranged inside the light-shielding shell 130 for observing and recording light stripes passing through the light sensor 133.

[0025] The working principle of a high-temperature gas temperature measuring device disclosed in the present invention is as follows: the whole is installed in an environment where the temperature needs to be measured, and then the drive motor 123 is started. The output shaft of the drive motor 123 drives the rotating chamber 101 to rotate through the transmission belt 122 (the rotating chamber 101 rotates on the rotating chamber bracket 121), and the rotating paddle 102 inside the rotating chamber 101 rotates with the rotating chamber 101. At this time, the rotating paddle 102 will drive the air inside the rotating chamber 101 to rotate, and the rotating air will flow toward the inner wall edge of the rotating chamber 101 under the action of centrifugal force, so that the air passes through the baffle ring plate 119 and then enters the center position inside the rotating chamber 101, and then flows along the radial direction of the rotating chamber 101 to the inner wall of the rotating chamber 101, and flows to the outside of the rotating chamber 101 through the flow hole 105 and the air vent 104 under the action of pressure (when the flow hole 105 and the air vent 104 are aligned, that is, when the rotation speed of the rotating chamber 101 is low).In this process, the external air will flow into the rotating chamber 101 along the air flow, and then the speed of the output shaft of the driving motor 123 will be increased, which will also increase the speed of the rotating chamber 101. At this time, the rotating paddle 102 inside the rotating chamber 101 will accelerate the rotation speed of the air, thereby increasing the centrifugal force on the air inside the rotating chamber 101. At the same time, the counterweight 114 will also rotate with the rotating chamber 101. This is because the counterweight 114 is fixed on the moving rack 115, and the moving rack 115 is installed on the moving rack bracket 116. The moving rack bracket 116 is fixed on the rotating chamber 101 through the supporting ring frame 112. At this time, the counterweight 114 will rotate with the rotating chamber 101 (the counterweight 114 always rotates with the rotating chamber 101. At the beginning, due to the slow rotation speed of the rotating chamber 101, the centrifugal force on the counterweight 114 cannot pull the tension spring 118). At this time, the high-speed rotating counterweight 114 will pull the tension spring 118 through the moving rack 115 under the action of centrifugal force, and then the moving rack 115 will slide on the moving rack bracket 116. The sliding of the moving rack 115 will drive the gear ring 113 to rotate. The rotation of the gear ring 113 will drive the shielding plate 103 to rotate. At this time, the air vent 104 will be aligned with the flow hole 105. The air in the rotating chamber 101 is staggered, thereby blocking the flow hole 105, so that the air in the rotating chamber 101 cannot flow, and the hot air will accumulate in the rotating chamber 101. Due to the high-speed rotation of the air, the air is gathered to the edge of the inner wall of the rotating chamber 101 under the action of centrifugal force, especially the air with relatively low temperature, because of its high density, while the air with higher temperature will gather to the axial position of the rotating chamber 101 (not only due to the action of centrifugal force, but also due to the density difference between cold air and hot air, the hot air will diffuse towards the axial position with lower density). At this time, all the hot air in the air sucked into the rotating chamber 101 will gather in the rotating chamber 101 axial position (suitable for detecting an environment with relatively low air temperature, not a high temperature environment. If the air in a high temperature environment can directly rotate the rotating chamber 101, the hot air can be sucked in to heat the heated shell 109. If the ambient air temperature is not high, the sucked hot air needs to be gathered to the axial position of the rotating chamber 101 to improve the heating efficiency of the heated shell 109. Moreover, since the rotation speed of the rotating chamber 101 is known, the ratio of the hot air in the middle to the hot air outside the rotating chamber 101 is determined. Therefore, the temperature of the ambient air outside the rotating chamber 101 can be measured by measuring the temperature at the axial position of the rotating chamber 101).

[0026] After the heated shell 109 is heated, the temperature will be transferred to the semiconductor laser 110. After the semiconductor laser 110 is heated, as the temperature rises, the band gap width of the semiconductor material will decrease, resulting in a decrease in the energy of the emitted photons, thereby lengthening the laser wavelength (red shift). Therefore, the temperature of the air can be measured by only detecting the wavelength of the light emitted by the semiconductor laser 110. Therefore, the temperature can be obtained by leading the light emitted by the semiconductor laser 110 to the optical wavelength detector through the light guide fiber 120. If the light guide fiber 120 cannot be inserted into the place where the temperature needs to be detected, the semiconductor laser 110 can be turned around, and the collimating lens 111 can be installed to align with the support tube 108, and the light passes through the support tube 108 and then emits, or a light guide channel 127 is installed on the installation shell 124, and the light is emitted through the refraction of the light by the first reflector 129 and the second reflector 128 (the collimating lens 111 is installed in a direction away from the support tube 108 at this time). At this time, the shading shell 130 set at a distance is aligned with the light emitted from the support tube 108 or the light guide channel 127, so that the light passes through the light sensor 133 (in order to reduce the influence of other light sources and increase the intensity of the light emitted by the semiconductor laser 110). At this time, the light forms interference fringes after passing through the light sensor 133. The interference fringes will be projected onto the double slit hole 132. The distance between adjacent bright stripes or dark stripes can be known through the light received by the pixel points at the corresponding position on the double slit hole 132. Since the double slit spacing of the light sensor 133 is known, the distance from the shading plate 131 to the double slit hole 132 is also known. At this time, the wavelength of the light can be obtained, and then the temperature of the air can be obtained.

Claims

1. A high temperature gas temperature measuring device, characterized in that: The invention comprises a mounting shell (124), wherein a rotating chamber (101) is rotatably mounted in the mounting shell (124) via a rotating chamber bracket (121), a plurality of rotating paddles (102) arranged in a circular equidistant array are fixed on the circumferential surface of the inner wall of the rotating chamber (101), a plurality of flow holes (105) are also provided on the rotating chamber (101), a shielding plate (103) for shielding the flow holes (105) is also rotatably provided on the rotating chamber (101), and a shielding plate (103) is provided on the shielding plate (103) which is parallel to the flow holes. (105) air vents (104) of the same number and shape, a baffle ring plate (119) is fixed to one end of the rotating chamber (101) away from the baffle plate (103) in a manner that is easy to disassemble, a heated shell (109) is provided at the axis of the rotating chamber (101), a semiconductor laser (110) is fixedly provided inside the heated shell (109), and a collimating lens (111) is also fixed inside the heated shell (109) for collimating light emitted by the semiconductor laser (110).

2. A high temperature gas temperature measuring device according to claim 1, characterized in that: The heated shell (109) is fixed on the support tube (108); an avoidance through hole (106) is provided at the intersection of the rotating chamber (101) and the support tube (108); a sealing sheet (107) is provided as a sliding seal at the avoidance through hole (106); the sealing sheet (107) is fixed on the support tube (108); a support ring frame (112) is fixed at a coaxial position of the avoidance through hole (106); and a symmetrically arranged movable rack bracket (116) is fixed on the support ring frame (112).

3. A high temperature gas temperature measuring device according to claim 2, characterized in that: A gear ring (113) is rotatably mounted on the support ring frame (112), and two movable racks (115) are slidably mounted on the two movable rack brackets (116) respectively, which are symmetrical about the origin of the support ring frame (112), and a counterweight (114) is fixed to one end of the movable rack (115). Two extension arms (117) are also fixedly mounted on the two movable rack brackets (116) respectively, which are symmetrical about the origin of the support ring frame (112), and a tension spring (118) is fixed between the extension arm (117) and the other end of the movable rack (115), and the two movable racks (115) are meshed with the gear ring (113) for transmission, wherein the gear ring (113) is fixedly matched with the shielding plate (103).

4. A high temperature gas temperature measuring device according to claim 3, characterized in that: A mounting base (125) is also fixedly mounted on the mounting housing (124), and a threaded boss is provided on the mounting base (125). A mounting tube (126) is threadedly fixedly sleeved on the threaded boss.

5. A high temperature gas temperature measuring device according to claim 4, characterized in that: A driving motor (123) is fixedly mounted on the rotating chamber bracket (121), and an output shaft of the driving motor (123) is drivingly connected to the circumferential surface of the rotating chamber (101) via a driving belt (122).

6. A high temperature gas temperature measuring device according to claim 5, characterized in that: A light-guiding optical fiber (120) is fixedly mounted on the rotating chamber bracket (121); one end of the light-guiding optical fiber (120) is connected to the heated shell (109); the other end of the light-guiding optical fiber (120) is connected to an optical wavelength tester, and is used to guide light emitted by the semiconductor laser (110) to the optical wavelength tester.

7. A high temperature gas temperature measuring device according to claim 6, characterized in that: A light guiding channel (127) can also be fixed on the mounting housing (124), and a black matte coating is provided on the inner and outer surfaces of the light guiding channel (127). A second reflector (128) and a first reflector (129) are fixedly installed in the light guiding channel (127), wherein the first reflector (129) and the second reflector (128) are vertically arranged, and the first reflector (129) is used to vertically reflect the light emitted by the semiconductor laser (110) onto the second reflector (128), and the second reflector (128) is used to vertically reflect the light reflected by the first reflector (129) out of the light guiding channel (127).

8. A high temperature gas temperature measuring device according to claim 7, characterized in that: A light shielding shell (130) is arranged on the path of light reflected by the second reflector (128), a light shielding plate (131) is fixed on the inner wall of the light shielding shell (130), two light sensors (133) are provided on the light shielding plate (131), and double slit holes (132) are also fixedly arranged inside the light shielding shell (130) for observing and recording light stripes passing through the light sensors (133).

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