Angle incidence detector splicing method

Abstract

The invention discloses an angular incidence detector splicing method, and belongs to the technical field of optical remote sensing, the angular incidence detector splicing method comprises a focal panel assembly, a splicing base and a splicing instrument, the focal panel assembly comprises a focal plane substrate, and three detectors and a repairing and grinding pad which are connected to the focal plane substrate; the splicing base is a high-rigidity and high-precision process tool developed for realizing the splicing of the angular incidence detector; the splicing instrument is a core optical instrument for realizing high-precision splicing of focal panel assemblies, can realize high-precision three-dimensional translation, and provides a high-precision fixing platform for a splicing base. The angle incidence detector splicing method adapts to more comprehensive scenes, on the basis that the detector splicing coplanar requirement is met, it can be guaranteed that the whole image plane is not shielded, the splicing effect can be rechecked through two kinds of angle detection, and the imaging effect is improved.

Description

Technical Field

[0001] The invention relates to the technical field of optical remote sensing, and in particular to a method for splicing detectors with angled incidence. Background Art

[0002] The detector is the core component of the optical remote sensing camera. With the demand for higher resolution and larger field of view in the field of space optical remote sensing, the scale of the focal plane is getting larger and larger. However, due to the constraints of detector size and cost-effectiveness of development, small-size detectors are generally used to achieve large-scale focal plane usage scenarios. As a core technology in the field of space optical remote sensing, focal plane stitching has particularly high requirements for stitching accuracy. Generally, a high-precision visual stitching instrument is used to achieve micron-level stitching accuracy.

[0003] The current method is to level the entire detector mounting surface based on the base surface of the splicing instrument, and then perform coplanar splicing of the detectors. However, in actual optical systems, considering the field of view requirements, the focal plane may have a certain angle with the optical axis, that is, the detector mounting surface is not perpendicular to the optical axis. Limited by the size, weight, structural stability and stray light suppression requirements of space optical remote sensing, the edge of the detector is very close to the structural parts, and there is a certain height difference. In this case, if the traditional splicing method is continued, the focal plane after splicing may have the phenomenon of structural parts blocking the imaging light, affecting the imaging effect.

[0004] Based on the above technical problems, technicians in this field urgently need to develop a method for splicing detectors with angled incidence, which can ensure that there is no occlusion on the entire image surface while meeting the coplanarity of the detector splicing, and can verify the stitching effect through two angle detections. Summary of the invention

[0005] The purpose of the present invention is to provide a method for splicing detectors with angled incidence, which can ensure that the entire image surface will not be blocked on the basis of satisfying the coplanarity of the detector splicing, and can verify the splicing effect through two angle detections.

[0006] In order to achieve the above object, the present invention provides the following technical solutions:

[0007] A method for splicing an angled incident detector of the present invention comprises a focal panel assembly, a splicing base and a splicing instrument, wherein the focal panel assembly comprises a focal plane substrate and three detectors and a grinding pad connected to the focal plane substrate. The splicing method comprises the following steps:

[0008] S1: Use a microscope to detect the relationship between the marking points and pixel positions of each detector, correct the designed theoretical data, and establish the actual relationship between the marking points and pixel positions;

[0009] S2: Connect the focal plane substrate to the splicing base, and use three-dimensional coordinate measurement to measure the angle between the installation surface of the grinding pad on the focal plane substrate and the bottom surface of the splicing base;

[0010] S3: Use the three-dimensional model to establish a model of the splicing state of the three detectors at the angle measured in step S2, and ensure that the direction of the coordinate system is consistent with the direction of the splicing instrument coordinate system, and record the XYZ coordinates of all the marking points of the three detectors;

[0011] S4: Remove the focal plane substrate, and install the three detectors and the grinding pad on the focal plane substrate to form a focal plane assembly;

[0012] S5: Install the splicing base on the plane of the splicing instrument and align it to ensure that it is consistent with the 3D modeling direction;

[0013] S6: Integrate the focus panel assembly with the assembly of the splicing base, install them on the splicing instrument platform, and align them to ensure that they are consistent with the direction of 3D modeling;

[0014] S7: Use the stitching instrument to find a marking point, and clear the coordinates of the point on the stitching instrument to zero, which is the origin;

[0015] S8: Test the coordinates of all the marked points and compare them with the model coordinates. By plane fitting, calculate the amount and direction of each detector.

[0016] S9: Process the repair pad according to the calculated value;

[0017] S10: Install the spliced ​​focus panel assembly onto the six-dimensional adjustment frame, and then place the assembly onto the splicing instrument platform. By adjusting the angle of the six-dimensional adjustment frame, verify the coplanarity data of the marking points of the three detectors.

[0018] Furthermore, after recording the coordinates in step S3, a marking point on one of the detectors is used as the coordinate origin, and the direction of the coordinate axis remains unchanged, and new XYZ coordinates of other marking points are recalculated;

[0019] In step S7, the marking point which is the origin of the coordinates is found by the stitching instrument.

[0020] Furthermore, after the processing in step S9 is completed, the focus panel assembly is restored and steps S6-S9 are repeated until the index requirements are met.

[0021] Furthermore, the detector includes a plurality of photosensitive surfaces and marking points, and the photosensitive surface is composed of a plurality of pixels for collecting light information.

[0022] In the above technical solution, the present invention provides a method for splicing detectors with angled incidence, which has the following beneficial effects:

[0023] The angled incident detector splicing method of the present invention is more adaptable to scenes, and on the basis of satisfying the detector splicing coplanarity, it can ensure that the entire image plane will not be blocked, and can verify the splicing effect through two angle detections, thereby improving the imaging effect. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in the present invention. For ordinary technicians in this field, other drawings can also be obtained based on these drawings.

[0025] Figure 1 A schematic diagram of the detector splicing structure provided by an embodiment of the present invention;

[0026] Figure 2 A structural diagram of a detector in a method for splicing detectors with angled incidence provided by an embodiment of the present invention;

[0027] Figure 3 A schematic diagram of a focal panel assembly in a method for splicing detectors with angled incidence provided by an embodiment of the present invention;

[0028] Figure 4 A side view of a focal panel assembly in a method for splicing detectors with angled incidence provided by an embodiment of the present invention.

[0029] Description of reference numerals:

[0030] 1. Focus panel assembly; 2. Splicing base; 3. Splicing instrument;

[0031] 101, focal plane substrate; 102, detector; 103, grinding pad;

[0032] 1021. Photosensitive surface; 1022. Marking point. DETAILED DESCRIPTION

[0033] In order to enable those skilled in the art to better understand the technical solution of the present invention, the present invention will be further described in detail below with reference to the accompanying drawings.

[0034] See also Figure 1 to Figure 4 As shown;

[0035] A method for splicing detectors with angled incidence according to the present invention comprises the following steps:

[0036] The invention comprises a focal panel assembly 1, a splicing base 2 and a splicing instrument 3. The focal panel assembly 1 comprises a focal plane substrate 101 and three detectors 102 and a grinding pad 103 connected to the focal plane substrate 101. The splicing method comprises the following steps:

[0037] S1: Use a microscope to detect the relationship between the marking points and the pixel positions of each detector 102, correct the designed theoretical data, and establish the actual relationship between the marking points and the pixel positions;

[0038] S2: Connect the focal plane substrate 101 to the splicing base 2, and use three-dimensional coordinate measurement to measure the angle between the mounting surface of the grinding pad 103 on the focal plane substrate 101 and the bottom surface of the splicing base 2;

[0039] S3: Use the three-dimensional model to establish a model of the splicing state of the three detectors 102 at the angle measured in step S2, and ensure that the direction of the coordinate system is consistent with the direction of the coordinate system of the splicing instrument 3, and record the XYZ coordinates of all the marking points of the three detectors 102;

[0040] S4: Remove the focal plane substrate 101, and install the three detectors 102 and the grinding pad 103 on the focal plane substrate 101 to form a focal plane assembly 1;

[0041] S5: Install the splicing base 2 on the plane of the splicing instrument 3 and align it to ensure that it is consistent with the three-dimensional modeling direction;

[0042] S6: Integrate the focus panel assembly 1 with the assembly of the splicing base 2, and install them on the platform of the splicing instrument 3, align them to ensure that they are consistent with the direction of the three-dimensional modeling;

[0043] S7: Use the stitching device 3 to find a marking point, and clear the coordinates of the point on the stitching device 3 to zero, which is the origin;

[0044] S8: testing the coordinates of all the marking points, comparing them with the model coordinates, and calculating the amount and direction of the grinding of each detector 102 through plane fitting;

[0045] S9: Processing the repair pad 103 according to the calculated value;

[0046] S10: Install the spliced ​​focus panel assembly 1 onto the six-dimensional adjustment frame, and then place the assembly onto the platform of the splicing instrument 3. By adjusting the angle of the six-dimensional adjustment frame, the coplanar data of the marking points of the three detectors 102 are checked.

[0047] It should be noted that there are strict positioning relationships between the focus panel assembly 1 and the splicing base 2, the detector 102 and the grinding pad 103, and the grinding pad 103 and the focus plane substrate 101. The relative positions must remain consistent for each installation; the torque applied must be the same for each installation and integration to ensure that the stress state of the components is consistent for each operation.

[0048] As a further introduction to this embodiment, after recording the coordinates in step S3, a marking point of one of the detectors 102 is used as the coordinate origin, and the direction of the coordinate axis remains unchanged, and the new XYZ coordinates of the other marking points are recalculated;

[0049] In step S7, the marking point which is the origin of the coordinates is found by the stitching device 3.

[0050] As a further introduction to this embodiment, after the processing of step S9 is completed, the focus panel assembly 1 is restored and steps S6-S9 are repeated until the index requirements are met.

[0051] As a further introduction to this embodiment, the detector 102 includes multiple photosensitive surfaces 1021 and marking points 1022. The photosensitive surface 1021 is composed of a large number of small-sized pixels (usually micrometers), which is an important interface for the detector's photoelectric conversion. The interface collects light information and forms electrical signals through a series of photoelectric conversions; the marking points 1022 are some marks etched around the photosensitive surface. These marking points 1022 have a predetermined relative position relationship with the pixels, and the marking points 1022 will be larger than the pixel size. When the detector is integrated, the marking points are generally used to replace the pixels for splicing. The splicing base 2 is a high-rigidity, high-precision process tooling developed to achieve the splicing of angled incident detectors. The upper end of the splicing base 2 is arranged with the mechanical structure mounting holes of the focus panel assembly 1, and the lower end is arranged with the mounting holes for the splicing instrument 3. The stitching instrument 3 is the core optical instrument for realizing high-precision stitching of the focal panel assembly 1. It is usually composed of a marble platform, a motion track, an optical microscope and other auxiliary components. It can realize high-precision three-dimensional translation (XYZ) and provide a high-precision fixed platform for the stitching base 2.

[0052] In the above technical solution, the present invention provides a method for splicing detectors with angled incidence, which has the following beneficial effects:

[0053] The angled incident detector splicing method of the present invention is more adaptable to scenes, and on the basis of satisfying the detector splicing coplanarity, it can ensure that the entire image plane will not be blocked, and can verify the splicing effect through two angle detections, thereby improving the imaging effect.

[0054] The above description is only by way of illustration of certain exemplary embodiments of the present invention. It is undoubted that those skilled in the art can modify the described embodiments in various ways without departing from the spirit and scope of the present invention. Therefore, the above drawings and descriptions are illustrative in nature and should not be construed as limiting the scope of protection of the claims of the present invention.

Claims

1. A method for splicing detectors with angled incidence, characterized in that: The invention comprises a focal panel assembly (1), a splicing base (2) and a splicing apparatus (3), wherein the focal panel assembly (1) comprises a focal plane substrate (101) and three detectors (102) and a grinding pad (103) connected to the focal plane substrate (101), and the splicing method comprises the following steps: S1: using a microscope to detect the position relationship between the marking points and the pixels of each detector (102), correcting the designed theoretical data, and establishing the actual position relationship between the marking points and the pixels; S2: Connect the focal plane substrate (101) to the splicing base (2), and use three-coordinate measurement to measure the angle between the mounting surface of the grinding pad (103) on the focal plane substrate (101) and the bottom surface of the splicing base (2); S3: using a three-dimensional model to establish a model of the splicing state of the three detectors (102) at the angle measured in step S2, and ensuring that the direction of the coordinate system is consistent with the direction of the coordinate system of the splicing instrument (3), and recording the XYZ coordinates of all the marking points of the three detectors (102); S4: Remove the focal plane substrate 101, and install the three detectors 102 and the grinding pad 103 on the focal plane substrate 101 to form a focal plane assembly 1; S5: Install the splicing base (2) on the plane of the splicing instrument (3) and align it to ensure that it is consistent with the three-dimensional modeling direction; S6: Integrate the focus panel assembly (1) and the assembly of the splicing base (2), install them on the platform of the splicing instrument (3), and align them to ensure that they are consistent with the direction of the three-dimensional modeling; S7: Use the stitching device (3) to find a marking point, and clear the coordinates of the point on the stitching device (3) to zero, which is the origin; S8: testing the coordinates of all the marked points and comparing them with the model coordinates, and calculating the amount and direction of the grinding of each detector (102) through plane fitting; S9: Processing the grinding pad (103) according to the calculated value; S10: Install the spliced ​​focus panel assembly (1) onto a six-dimensional adjustment frame, then place the assembly onto a platform of a splicing apparatus (3), and check the coplanarity data of the marking points of the three detectors (102) by adjusting the angle of the six-dimensional adjustment frame.

2. The method for splicing detectors with angled incidence according to claim 1, characterized in that: After recording the coordinates in step S3, a marking point on one of the detectors (102) is used as the coordinate origin, the direction of the coordinate axis remains unchanged, and new XYZ coordinates of other marking points are recalculated; In step S7, the marking point which is the origin of the coordinates is found by the stitching device (3).

3. The method for splicing detectors with angled incidence according to claim 1, characterized in that: After the processing in step S9 is completed, the focus panel assembly (1) is restored and steps S6-S9 are repeated until the index requirements are met.

4. The method for splicing detectors with angled incidence according to claim 1, characterized in that: The detector (102) comprises a plurality of photosensitive surfaces (1021) and marking points (1022); the photosensitive surface (1021) is composed of a plurality of picture elements and is used to collect light information.

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