Method and device for calculating microwave transmission characteristics of dielectric-embedded multilayer metal mesh

Abstract

The present invention provides a method and device for calculating the microwave transmission characteristics of a dielectric-inlaid multilayer metal mesh. The method comprises: equating the dielectric-inlaid multilayer metal mesh to a single-layer Drude dispersion model; obtaining the incident wave angular frequency under the single-layer Drude dispersion model; substituting the incident wave angular frequency into a preset final dispersion equivalent formula to calculate the relative dielectric constant of the single-layer Drude dispersion model; and calculating the microwave transmission characteristics of the dielectric-inlaid multilayer metal mesh based on the relative dielectric constant and the SO-FDTD method. By equating the dielectric-inlaid multilayer metal mesh to a single-layer Drude dispersion model and calculating the overall transmission coefficient using the final dispersion equivalent formula obtained by the final fitting, the complex electromagnetic response of the multilayer structure can be simplified into a single and easy-to-process model while maintaining consistency in physical properties. This improves computational efficiency and reduces resource consumption while maintaining sufficient physical accuracy.

Description

Technical Field

[0001] The present invention relates to the technical field of electromagnetic transmission characteristic calculation, and in particular to a method and device for calculating microwave transmission characteristics of a dielectric-inlaid multi-layer metal mesh. Background Art

[0002] Dielectric-embedded multilayer metal mesh structures, due to their unique properties, are widely used in various fields, such as reinforced concrete in the construction industry, metal mesh filters in electronic equipment, and radar stealth materials in the military. This structure is not only simple and inexpensive to prepare, but also possesses excellent mechanical stability and electromagnetic shielding effectiveness. In particular, dielectric-embedded multilayer metal meshes have demonstrated exceptional performance in electromagnetic shielding and absorbing materials, becoming an indispensable component of modern scientific and technological development. However, due to their complex internal structure, encompassing multi-scale features from the macroscopic to the microscopic, accurate calculation of their electromagnetic transmission characteristics is extremely difficult.

[0003] Existing numerical methods for studying the electromagnetic transmission characteristics of dielectric-embedded multilayer metal mesh structures primarily include the finite element method (FEM), the finite-difference time-domain method (FDTD), and the method of moments (MoM). These methods are commonly used in engineering practice, enabling accurate modeling of complex geometries and material properties and providing detailed simulation results. The FDTD method, in particular, is widely used in time-domain analysis of electromagnetic fields due to its ease of parallel computing, effectively simulating the propagation of electromagnetic waves through various media.

[0004] While the aforementioned numerical methods perform well for general electromagnetic problems, they face significant limitations for multi-scale structures such as dielectric-embedded multilayer metal meshes. First, traditional numerical algorithms require a very fine discretized mesh to capture the fine structure within the metal mesh, which greatly increases the computational complexity and time required. Second, when the macroscopic dimensions of the dielectric-embedded multilayer metal mesh differ significantly from the microscopic dimensions of the internal metal mesh, the computational task may be impossible to complete due to insufficient memory or excessive computational time. These issues severely restrict the effectiveness and practicality of these methods in practical engineering applications. Summary of the Invention

[0005] In order to solve the above problems existing in the prior art, the present invention provides a method and device for calculating the transmission characteristics of a dielectric-inlaid multi-layer metal mesh in the microwave band.

[0006] The technical problem to be solved by the present invention is achieved through the following technical solutions:

[0007] In a first aspect, the present invention provides a method for calculating the microwave transmission characteristics of a dielectric-inlaid multilayer metal mesh, comprising:

[0008] The medium embedded with multi-layer metal mesh is equivalent to a single-layer Drude dispersion model;

[0009] Under the single-layer Drude dispersion model, obtain the incident wave angular frequency;

[0010] Substitute the incident wave angular frequency into the preset final dispersion equivalent formula to calculate the relative dielectric constant of the single-layer Drude dispersion model;

[0011] The overall transmission coefficient is calculated based on the relative dielectric constant and the SO-FDTD method, and is used as the result of the microwave transmission characteristics of the dielectric-embedded multilayer metal mesh.

[0012] Among them, the preset final dispersion equivalent formula is the error between the equivalent transmission coefficient calculated based on the single-layer Drude dispersion model under the structure of the test medium inlaid with multi-layer metal mesh and the standard transmission coefficient calculated by the analytical model, which is obtained by combining the SO-FDTD method and genetic algorithm fitting; the analytical model adopts the analytical model corresponding to the medium inlaid with multi-layer metal mesh.

[0013] Optionally, the calculation process of the preset final dispersion equivalent formula includes:

[0014] S201, obtaining a standard transmission coefficient corresponding to a test medium inlaid with a multi-layer metal mesh based on an analytical model;

[0015] S202, embedding the test medium with multiple layers of metal mesh into a single-layer Drude dispersion model, and obtaining an initial dispersion equivalent formula using the single-layer Drude dispersion model;

[0016] S203, randomly generating Drude frequencies through a genetic algorithm, and obtaining equivalent transmission coefficients using the Drude frequencies and the SO-FDTD method;

[0017] S204, calculating the coefficient error between the equivalent transmission coefficient and the standard transmission coefficient, and determining the final Drude frequency according to the coefficient error;

[0018] S205: Substitute the final Drude frequency into the initial dispersion equivalent formula to obtain a preset dispersion equivalent formula.

[0019] Optionally, the preset final dispersion equivalent formula is expressed as:

[0020]

[0021] Among them, ε r (ω) represents the relative dielectric constant, ε ∞ represents the relative permittivity at infinite frequency, ω p represents the final Drude frequency, j represents the imaginary unit, ν crepresents the collision frequency, and ω represents the incident wave angular frequency.

[0022] Alternatively, the parsing model is represented as:

[0023] T=(T1T3…T 2n+1 )(T2T4…T 2n )((C1 / 2)C3…C 2n-1 (C 2n+1 / 2);

[0024] Where T represents the standard transmission coefficient, T 2n+1 represents the standard transmission coefficient of the dielectric layer in the analytical model, T 2n represents the standard transmission coefficient of the metal mesh in the analytical model, C 2n+1 It represents the correction coefficient of the dielectric layer in the analytical model, n represents the nth layer in the analytical model; n is a positive integer greater than or equal to 0;

[0025]

[0026] Where t represents the thickness of the 2n+1th layer in the analytical model, f represents the frequency of the incident wave into the test medium embedded with the multilayer metal mesh, μ represents the magnetic permeability, σ represents the electrical conductivity, γ represents the propagation constant, η0 represents the wave impedance in free space, and η 2n+1 represents the wave impedance of the 2n+1th layer in the analytical model, η 2n represents the wave impedance of the 2nth layer in the analytical model, η 2n+2 represents the wave impedance of the 2n+2th layer in the analytical model, e represents the base of the natural logarithm, j represents the imaginary unit, ω' represents the angular frequency of the incident wave into the test medium embedded with the multilayer metal mesh, μ0 represents the vacuum permeability, ε0 ​​represents the vacuum dielectric constant,

[0027]

[0028] Among them, D 2n Indicates the diameter of the metal mesh, w 2n Indicates the mesh size of the metal mesh.

[0029] Optionally, a coefficient error between the equivalent transmission coefficient and the standard transmission coefficient is calculated, and a final Drude frequency is determined based on the coefficient error, including:

[0030] Calculate the difference between the equivalent transmission coefficient and the standard transmission coefficient to obtain the coefficient error;

[0031] When the coefficient error is less than the error threshold, the Drude frequency corresponding to the equivalent transmission coefficient less than the error threshold is used as the final Drude frequency.

[0032] Optionally, after calculating the difference between the equivalent transmission coefficient and the standard transmission coefficient to obtain the coefficient error, the method for calculating the microwave transmission characteristics of the dielectric-embedded multilayer metal mesh further includes:

[0033] When the coefficient error is greater than the error threshold, steps S203 - S204 are repeatedly performed until the coefficient error is less than the error threshold.

[0034] Optionally, the collision frequency ν c The value is 10 5 , ε ∞ The value is 1.

[0035] In a second aspect, the present invention provides a device for calculating the microwave transmission characteristics of a dielectric-embedded multilayer metal mesh, the device comprising: an equivalent unit, an acquisition unit, and a calculation unit;

[0036] The equivalent unit is used to: convert the medium embedded with multi-layer metal mesh into a single-layer Drude dispersion model;

[0037] The acquisition unit is used to: obtain the incident wave angular frequency under the single-layer Drude dispersion model;

[0038] The calculation unit is used to: substitute the incident wave angular frequency into the preset final dispersion equivalent formula to calculate the relative dielectric constant of the single-layer Drude dispersion model;

[0039] The overall transmission coefficient is calculated based on the relative dielectric constant and the SO-FDTD method, and is used as the result of the microwave transmission characteristics of the dielectric-embedded multilayer metal mesh.

[0040] Among them, the preset final dispersion equivalent formula is the error between the equivalent transmission coefficient calculated based on the single-layer Drude dispersion model under the structure of the test medium inlaid with multi-layer metal mesh and the standard transmission coefficient calculated by the analytical model, which is obtained by combining the SO-FDTD method and genetic algorithm fitting; the analytical model adopts the analytical model corresponding to the medium inlaid with multi-layer metal mesh.

[0041] In a third aspect, the present invention provides a computing device for the microwave band transmission characteristics of a dielectric-inlaid multilayer metal mesh, comprising: a processor, a storage medium and a bus, wherein the storage medium stores machine-readable instructions executable by the processor. When the computing device for the microwave band transmission characteristics of a dielectric-inlaid multilayer metal mesh is running, the processor and the storage medium communicate via the bus, and the processor executes the machine-readable instructions to execute the steps of the method for computing the microwave band transmission characteristics of a dielectric-inlaid multilayer metal mesh as described in the first aspect above.

[0042] The present invention provides a method and device for calculating the microwave transmission characteristics of a dielectric-embedded multilayer metal mesh. The method comprises: treating the dielectric-embedded multilayer metal mesh as equivalent to a single-layer Drude dispersion model; obtaining the incident wave angular frequency under the single-layer Drude dispersion model; substituting the incident wave angular frequency into a preset final dispersion equivalent formula to calculate the relative dielectric constant of the single-layer Drude dispersion model; calculating the overall transmission coefficient based on the relative dielectric constant and the SO-FDTD method, and using the overall transmission coefficient as the result of the microwave transmission characteristics of the dielectric-embedded multilayer metal mesh; wherein the preset final dispersion equivalent formula is the error between the equivalent transmission coefficient calculated based on the single-layer Drude dispersion model and the standard transmission coefficient calculated by the analytical model under the structure of the dielectric-embedded multilayer metal mesh, obtained by combining the SO-FDTD method and genetic algorithm fitting; and the analytical model adopts the analytical model corresponding to the dielectric-embedded multilayer metal mesh. In this paper, by equating a dielectric-embedded multilayer metal mesh to a single-layer Drude dispersion model and calculating the overall transmission coefficient using the final dispersion equivalent formula obtained through fitting, the complex electromagnetic response of the multilayer structure can be simplified into a single, easy-to-handle model while maintaining consistency in physical properties. This eliminates the need for detailed simulation of each layer of the dielectric-embedded multilayer metal mesh while maintaining sufficient physical accuracy. This improves computational efficiency, reduces resource consumption, and overcomes the challenges posed by the macro- and micro-scale differences, enabling the processing of larger or more complex problems within limited computing resources.

[0043] The present invention will be further described in detail below with reference to the accompanying drawings and embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] Figure 1 A schematic flow chart of a method for calculating microwave transmission characteristics of a dielectric-embedded multi-layer metal mesh provided in an embodiment of the present invention;

[0045] Figure 2 The equivalent schematic diagram of the dielectric embedded multi-layer metal mesh to the single-layer Drude dispersion model is shown as an example;

[0046] Figure 3 Schematically shows a graph showing the real and imaginary parts of the relative permittivity of a single-layer Drude dispersion model as a function of the angular frequency of the incident wave;

[0047] Figure 4 The schematic diagram of the structure of a dielectric embedded multi-layer metal mesh is shown as an example;

[0048] Figure 5 The comparison between the inversion results and CST simulation results under different layers of metal mesh is shown as an example;

[0049] Figure 6 The comparison between the inversion results and the CST simulation results under different relative permittivities is shown as an example;

[0050] Figure 7 The comparison between the inversion results and the CST simulation results under different wire diameter ratios is shown as an example;

[0051] Figure 8 The following is a schematic diagram showing the structure of a device for calculating the transmission characteristics of a dielectric-embedded multi-layer metal mesh in the microwave band;

[0052] Figure 9 A schematic diagram of the structure of a device for calculating microwave transmission characteristics of a dielectric-inlaid multi-layer metal mesh provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0053] The present invention will be further described in detail below with reference to specific examples, but the embodiments of the present invention are not limited thereto.

[0054] Existing technologies can only perform equivalent calculations for metal meshes. However, common actual structures, such as reinforced concrete, metal mesh filters, and metal mesh flexible transparent absorbers, all contain dielectrics. Existing methods are unable to perform equivalent calculations for structures containing dielectrics and have great limitations. They are no longer suitable for calculating the transmission characteristics of dielectric-embedded multi-layer metal mesh structures.

[0055] In order to improve calculation efficiency and reduce resource consumption while maintaining the physical accuracy of the overall transmission coefficient, an embodiment of the present invention provides a method for calculating the transmission characteristics of a dielectric-inlaid multi-layer metal mesh in the microwave band. Figure 1 The present invention provides a flow chart of a method for calculating the microwave transmission characteristics of a dielectric embedded multi-layer metal mesh. Figure 1 As shown, including:

[0056] S101. The medium embedded with multi-layer metal mesh is equivalent to a single-layer Drude dispersion model.

[0057] Among them, dielectric inlaid multi-layer metal mesh is widely used in urban life and industrial production, such as reinforced concrete, metal mesh filters and metal mesh flexible transparent absorbers.

[0058] The single-layer Drude dispersion model is a physical model used to describe the behavior of free electrons in metals. It is generally constructed based on the free electron assumptions, damped motion, and linear response assumptions.

[0059] Free Electron Hypothesis: Electrons in metals are free and can move freely within the metal without being restrained. Damped Motion: Electrons experience damped motion when subjected to an external electric field, meaning their movement encounters a certain resistance. Linear Response: The metal's response to an external electric field is linear, meaning parameters such as the dielectric constant and conductivity are proportional to the strength of the external electric field.

[0060] Figure 2 The equivalent schematic diagram of the dielectric embedded multi-layer metal mesh to the single-layer Drude dispersion model is shown as an example. Figure 2 The left side shows a schematic diagram of a dielectric-embedded multilayer metal mesh 3D structure, while the right side shows a schematic diagram of a single-layer Drude dispersion structure. The dielectric-embedded multilayer metal mesh contains multiple metal mesh structures, while the equivalent single-layer Drude dispersion structure is a uniform structure.

[0061] It is understandable that since the dielectric-inlaid multilayer metal mesh contains multiple metal mesh structures, these metal mesh structures are embedded in the dielectric material in a certain regular or random distribution in space. This multilayer metal mesh structure often exhibits complex behavior in terms of electromagnetic characteristics, because each layer of metal mesh will produce reflection, transmission and absorption effects on electromagnetic waves. These effects are superimposed on each other, making the electromagnetic response of the overall structure complex. The single-layer Drude dispersion model in this embodiment is assumed to have uniform electromagnetic characteristics, that is, its parameters such as dielectric constant and conductivity are uniform in space. By equating the dielectric-inlaid multilayer metal mesh to a single-layer Drude dispersion model, a simple single-layer Drude dispersion model can be used to approximately describe the electromagnetic response characteristics of the multilayer metal mesh structure, simplifying the calculation process.

[0062] S102. Under the single-layer Drude dispersion model, obtain the incident wave angular frequency.

[0063] It should be noted that the angular frequency of the incident wave can be calculated by measuring the wavelength of light and using the relationship between the speed of light and wavelength, or it can be indirectly measured using a photoelectric effect experiment. In practical applications, high-precision instruments such as spectrometers and monochromators can also be used for measurement.

[0064] S103. Substitute the incident wave angular frequency into a preset final dispersion equivalent formula to calculate the relative dielectric constant of the single-layer Drude dispersion model.

[0065] Optionally, the calculation process of the preset final dispersion equivalent formula includes:

[0066] S201, obtaining a standard transmission coefficient corresponding to a test medium inlaid with a multi-layer metal mesh based on an analytical model;

[0067] S202, embedding the test medium with multiple layers of metal mesh into a single-layer Drude dispersion model, and obtaining an initial dispersion equivalent formula using the single-layer Drude dispersion model;

[0068] S203, randomly generating Drude frequencies through a genetic algorithm, and obtaining equivalent transmission coefficients using the Drude frequencies and the SO-FDTD method;

[0069] S204, calculating the coefficient error between the equivalent transmission coefficient and the standard transmission coefficient, and determining the final Drude frequency according to the coefficient error;

[0070] S205: Substitute the final Drude frequency into the initial dispersion equivalent formula to obtain a preset dispersion equivalent formula.

[0071] Optionally, the preset final dispersion equivalent formula is expressed as:

[0072]

[0073] Among them, ε r (ω) represents the relative dielectric constant, ε ∞ represents the relative permittivity at infinite frequency, ω p represents the final Drude frequency, j represents the imaginary unit, ν c represents the collision frequency, and ω represents the incident wave angular frequency.

[0074] It should be noted that the final Drude frequency ω p Obtained by pre-fitting.

[0075] In the following embodiment, the complete process of obtaining the final Drude frequency is described:

[0076] (1) Obtain standard results using an analytical algorithm for dielectric inlaid multilayer metal mesh;

[0077] (2) Generate a random number within a certain range as the final Drude frequency ω p The initial value of

[0078] (3) Use the SO-FDTD method to calculate the transmission coefficient of a single-layer dispersive medium with a given Drude frequency, compare the result with the standard result, and obtain the error value.

[0079] (4) Determine whether the error is less than 10 -4 , if the conditions are met, then end.

[0080] (5) If the conditions are not met, a better random number is generated through recombination and mutation, and the process returns to step 3.

[0081] When the loop ends, the condition ω is satisfied.p is the final Drude frequency.

[0082] The single-layer Drude dispersion model is selected as the equivalent model in the embodiment of the present invention mainly because:

[0083] Through a large number of experiments, it is found that when the relative dielectric constant ε of the single-layer Drude dispersion model is r When the real and imaginary parts of ε' and ε' are expressed as ε' and ε' respectively, the curves of ε' and ε' changing with the angular frequency of the incident wave are as follows: Figure 3 As shown, this

[0084] This is consistent with the law of transmission characteristics change of dielectric embedded multi-layer metal mesh. Therefore, the embodiment of the present invention uses a single-layer Drude dispersion model to equivalent dielectric embedded multi-layer metal mesh structure.

[0085] S104. Calculate the overall transmission coefficient based on the relative dielectric constant and the SO-FDTD method, and use the overall transmission coefficient as the result of the microwave transmission characteristics of the dielectric-embedded multi-layer metal mesh.

[0086] Among them, the preset final dispersion equivalent formula is the error between the equivalent transmission coefficient calculated based on the single-layer Drude dispersion model under the structure of the test medium inlaid with multi-layer metal mesh and the standard transmission coefficient calculated by the analytical model, which is obtained by combining the SO-FDTD method and genetic algorithm fitting; the analytical model adopts the analytical model corresponding to the medium inlaid with multi-layer metal mesh.

[0087] An embodiment of the present invention provides a method for calculating the microwave transmission characteristics of a dielectric-embedded multilayer metal mesh. By equating the dielectric-embedded multilayer metal mesh to a single-layer Drude dispersion model and calculating the overall transmission coefficient using the final dispersion equivalent formula obtained through fitting, the complex electromagnetic response of the multilayer structure can be simplified into a single, easy-to-handle model while maintaining consistency in physical properties. Because detailed simulation of each layer of the dielectric-embedded multilayer metal mesh is no longer necessary while maintaining sufficient physical accuracy, computational efficiency is improved, resource consumption is reduced, and the challenges posed by the macro- and micro-scale differences are overcome, enabling the processing of larger or more complex problems within limited computing resources.

[0088] Figure 4 The schematic diagram of the structure of the dielectric embedded multi-layer metal mesh is shown as an example. Figure 4 , the analytical model of dielectric embedded multilayer metal mesh is expressed as:

[0089] T=(T1T3…T 2n+1 )(T2T4…T 2n )((C1 / 2)C3…C 2n-1 (C 2n+1 / 2);

[0090] Where T represents the standard transmission coefficient, T 2n+1 represents the standard transmission coefficient of the dielectric layer in the analytical model, T 2n represents the standard transmission coefficient of the metal mesh in the analytical model, C 2n+1 represents the correction coefficient of the dielectric layer in the analytical model, n represents the nth layer in the analytical model; n is a positive integer greater than or equal to 0;

[0091]

[0092] Where t represents the thickness of the 2n+1th layer in the analytical model, f represents the frequency of the incident wave into the test medium embedded with the multilayer metal mesh, μ represents the magnetic permeability, σ represents the electrical conductivity, γ represents the propagation constant, η0 represents the wave impedance in free space, and η 2n+1 represents the wave impedance of the 2n+1th layer in the analytical model, η 2n represents the wave impedance of the 2nth layer in the analytical model, η 2n+2 represents the wave impedance of the 2n+2th layer in the analytical model, e represents the base of the natural logarithm, j represents the imaginary unit, ω' represents the angular frequency of the incident wave into the test medium embedded with the multilayer metal mesh, μ0 represents the vacuum permeability, ε0 ​​represents the vacuum dielectric constant,

[0093]

[0094] Among them, D 2n Indicates the diameter of the metal mesh, w 2n Indicates the mesh size of the metal mesh. Specifically, the mesh size of the metal mesh is the side length of the mesh of the metal mesh.

[0095] Optionally, a coefficient error between the equivalent transmission coefficient and the standard transmission coefficient is calculated, and a final Drude frequency is determined based on the coefficient error, including:

[0096] Calculate the difference between the equivalent transmission coefficient and the standard transmission coefficient to obtain the coefficient error;

[0097] When the coefficient error is less than the error threshold, the Drude frequency corresponding to the equivalent transmission coefficient less than the error threshold is used as the final Drude frequency.

[0098] Optionally, after calculating the difference between the equivalent transmission coefficient and the standard transmission coefficient to obtain the coefficient error, the method for calculating the microwave transmission characteristics of the dielectric-embedded multilayer metal mesh further includes:

[0099] When the coefficient error is greater than the error threshold, steps S203 - S204 are repeatedly performed until the coefficient error is less than the error threshold.

[0100] Optionally, the collision frequency ν c The value is 10 5 , ε ∞ The value is 1.

[0101] In addition, the embodiment of the present invention also selects the shift operator method to process the single-layer Drude dispersion model. Since the collision frequency, Drude frequency, thickness of the single-layer equivalent medium and the mesh size during SO-FDTD calculation will affect the transmission characteristics of the equivalent medium. Through experiments, it is determined that the incident wave frequency (frequency) has little effect on the transmission coefficient, and the transmission coefficient of the medium-inlaid multi-layer metal mesh structure decreases with the increase of the Drude frequency and the thickness of the single-layer equivalent medium and the decrease of the mesh size. Finally, it is determined that the collision frequency ν c The value is 10 5 , ε ∞ The value is 1.

[0102] Furthermore, the equivalent transmission coefficient T1 calculated using the shift operator finite-difference time-domain method SO-FDTD can be expressed as:

[0103]

[0104] Where E(f) 透射 represents the electric field strength of the transmitted wave, E(f) 入射 In this embodiment, the electric field intensity of the transmitted wave and the electric field intensity of the incident wave can be calculated using the Drude frequency and the SO-FDTD calculation formula.

[0105] In order to verify the effectiveness of the method for calculating the microwave transmission characteristics of the dielectric-inlaid multi-layer metal mesh provided in the embodiment of the present invention, a simulation experiment was also conducted in the embodiment of the present invention.

[0106] Specifically, the transmission coefficients of dielectric embedded multilayer metal mesh under different situations when plane wave is incident perpendicular to the interface are inverted by genetic algorithm and compared with the simulation results of CST.

[0107] CST uses a frequency domain solver with a periodic boundary condition and a minimum periodic size of one mesh. In the following cases, the metal mesh is considered as an ideal conductor and a lossless medium is used. The Drude frequency is set as the inversion parameter (ε ∞ =1,ν c =10 5 ,δ=0.5mm).

[0108] Experiment 1: Metal mesh with different layers

[0109] In this example, the transmission coefficient of a metal mesh with different numbers of layers was inverted. The metal mesh diameter D is 0.1 mm, the mesh size w is 1 mm, and the interlayer spacing is 1 mm. The relative dielectric constant of the medium is 2. The inversion results (Drude dispersion medium / model of the present invention) and the CST simulation results are shown in Figure 2. Figure 5 The horizontal axis represents the incident wave frequency, and the vertical axis represents the transmission coefficient (overall transmission coefficient). The equivalent parameters of the multi-layer metal mesh with different numbers of dielectric layers are shown in Table 1.

[0110] Table 1 Equivalent parameters of dielectric inlaid multilayer metal mesh with different layers

[0111]

[0112] based on Figure 5 It can be seen that the results of the equivalent solution of the present invention are consistent with the CST simulation results, which verifies that the method of the present invention has good adaptability to the number of layers of the metal mesh.

[0113] Experiment 2: Media containing different materials

[0114] In this example, the inversion results were compared with the CST results when the relative permittivity of the contained medium was changed. Specifically, the relative permittivity of the medium was set to 6 (ε r =6), and invert the transmission coefficients of different layers of dielectric inlaid multilayer metal mesh respectively. The inversion results are similar to those of CST. Figure 6 The equivalent parameters of the dielectric-inlaid multilayer metal mesh structure with different dielectrics are shown in Table 2.

[0115] Table 2 Equivalent parameters of dielectric-inlaid multilayer metal mesh structures with different dielectrics

[0116]

[0117] Depend on Figure 6 As can be seen, as the relative permittivity of the dielectric layer increases, the transmission coefficient curve exhibits a certain degree of curvature, and the curve becomes more pronounced with higher frequencies. The results of the analytical algorithm cannot be accurately fitted using a single-layer Drude medium of the same thickness. The applicants have explored adjusting the fitting results by increasing the thickness of the equivalent medium. Clearly, the inversion results after adjusting the thickness of the equivalent medium are consistent with the CST calculation results.

[0118] Experiment 3: Metal Meshes with Different Wire Diameter Ratios

[0119] To demonstrate the adaptability of the method to metal meshes with different wire diameter ratios, the transmission coefficients of double-layer dielectric embedded multi-layer metal meshes with wire diameter ratios D / w (the ratio of the metal mesh diameter D to the mesh opening w) of 0.08, 0.1, and 0.2 were calculated. The mesh opening w of the metal mesh was 1 mm, and the diameter D was 0.08 mm, 0.1 mm, and 0.2 mm, respectively. The inversion results are compared with CST. Figure 7 The transmission coefficients of double-layer dielectric inlaid with multi-layer metal mesh with different wire diameter ratios are shown in Table 3.

[0120] Table 3 Transmission coefficients of double-layer dielectric inlaid with multi-layer metal mesh with different wire diameter ratios

[0121] Wire diameter ratio D / w Total thickness / mm Equivalent thickness / mm <![CDATA[ω p ]]> 0.08 2 2 <![CDATA[5.31×10 11 ]]> 0.1 2 2 <![CDATA[5.7×10 11 ]]> 0.2 2 2 <![CDATA[7.639×10 11 ]]>

[0122] Figure 7 The results show that the equivalent scheme is applicable to dielectric-inlaid multilayer metal meshes with different wire diameter ratios, and is consistent with the CST simulation results. For the same frequency, the transmission coefficient of the dielectric-inlaid multilayer metal mesh layer decreases as the wire diameter ratio of the metal mesh increases. Figure 5-Figure 7 It is shown that the method proposed in the present invention has good adaptability to the number of metal mesh layers, the relative dielectric constant of the medium and the wire diameter ratio of the metal mesh.

[0123] Therefore, the proposed method for calculating the microwave transmission characteristics of a dielectric-embedded multilayer metal mesh is highly adaptable to the number of mesh layers, the relative dielectric permittivity of the dielectric, and the mesh diameter ratio. In experiments, the mesh diameters were 0.08mm, 0.1mm, and 0.2mm. Using a traditional algorithm, the maximum mesh size would be one mesh diameter. However, when equivalent to a single-layer Drude dielectric, the mesh size was reduced to 0.5mm, significantly improving the calculation speed. Simulation results show that the transmission characteristics of this equivalent dielectric are consistent with those obtained using CST.

[0124] In summary, the method for calculating the microwave transmission characteristics of a dielectric-embedded multi-layer metal mesh provided by the embodiments of the present invention has the following technical advantages:

[0125] 1. Reduce computational complexity

[0126] Traditional numerical algorithms require very fine discretized meshes to capture the fine structure within the metal mesh, which leads to a sharp increase in the amount of computation. By using the equivalent single-layer Drude dispersion model, it is no longer necessary to simulate each layer of the multi-layer metal mesh in detail, thereby greatly reducing the number of meshes and the complexity of the computation. Secondly, the Drude model itself is a relatively simple physical model that describes the response of free electrons in a metal to electromagnetic waves without considering the complex structure within the metal mesh. This simplification makes the computational process more efficient while maintaining sufficient accuracy to simulate the electromagnetic properties of the material.

[0127] 2. Improving Computational Efficiency

[0128] By reducing the number of meshes and simplifying the physical model, equivalent models can significantly reduce computational resources, including memory and computation time. This enables larger or more complex problems to be processed within limited computing resources. Furthermore, the simplified model enables faster computation, which is particularly important for applications requiring rapid iteration and optimization.

[0129] For example, in areas such as electromagnetic compatibility analysis, antenna design, and electromagnetic scattering simulation, fast computing power can significantly improve the efficiency of design and optimization.

[0130] 3. Overcoming the Challenges of Scale Differences

[0131] When the macroscale of a dielectric embedded with a multilayer metal mesh differs significantly from the microscale of the internal metal mesh, traditional numerical algorithms may be unable to complete the calculation due to insufficient memory or excessive computation time. By using the equivalent single-layer Drude dispersion model, this scale difference can be bridged, integrating macro- and micro-scale information into a single model, thus overcoming these issues.

[0132] Secondly, the equivalent model simplifies the complexity of the problem while maintaining physical consistency. Through reasonable assumptions and approximations, it equates the electromagnetic properties of the multi-layer metal mesh to a single Drude model, thus maintaining the accuracy and reliability of the calculation.

[0133] Therefore, by equating this to a single-layer Drude dispersion model, computational complexity can be significantly reduced, efficiency can be improved, and the challenges posed by multi-scale structures such as dielectric-embedded multilayer metal meshes can be overcome. This method has broad application prospects in fields such as electromagnetics, optics, and materials science, significantly improving design and optimization efficiency, reducing computational costs, and promoting the development and innovation of related technologies.

[0134] The method provided in the embodiment of the present invention can be applied to electronic devices. Specifically, the electronic devices can be desktop computers, portable computers, smart mobile terminals, servers, etc., which are not limited in the embodiment of the present invention.

[0135] Based on the same inventive concept, an embodiment of the present invention further provides a device for calculating the transmission characteristics of a dielectric-inlaid multi-layer metal mesh in the microwave band. Figure 8 The following is a schematic diagram showing the structure of a device for calculating the microwave transmission characteristics of a dielectric embedded multi-layer metal mesh. Figure 8 As shown, it includes: an equivalent unit 601, an acquisition unit 602 and a calculation unit 603;

[0136] The equivalent unit 601 is used to: convert the medium embedded with multi-layer metal mesh into a single-layer Drude dispersion model;

[0137] The acquisition unit 602 is used to: acquire the incident wave angular frequency under the single-layer Drude dispersion model;

[0138] The calculation unit 603 is used to: substitute the incident wave angular frequency into the preset final dispersion equivalent formula to calculate the relative dielectric constant of the single-layer Drude dispersion model;

[0139] The overall transmission coefficient is calculated based on the relative dielectric constant and the SO-FDTD method, and is used as the result of the microwave transmission characteristics of the dielectric-embedded multilayer metal mesh.

[0140] Among them, the preset final dispersion equivalent formula is the error between the equivalent transmission coefficient calculated based on the single-layer Drude dispersion model under the structure of the test medium inlaid with multi-layer metal mesh and the standard transmission coefficient calculated by the analytical model, which is obtained by combining the SO-FDTD method and genetic algorithm fitting; the analytical model adopts the analytical model corresponding to the medium inlaid with multi-layer metal mesh.

[0141] Figure 9 A schematic diagram of the structure of a device for calculating the microwave transmission characteristics of a dielectric-embedded multilayer metal mesh, provided in an embodiment of the present invention, includes: a processor 710, a storage medium 720, and a bus 730. The storage medium 720 stores machine-readable instructions executable by the processor 710. When the device for calculating the microwave transmission characteristics of a dielectric-embedded multilayer metal mesh is in operation, the processor 710 and the storage medium 720 communicate via the bus 730, and the processor 710 executes the machine-readable instructions to perform the steps of the above-described method embodiment. The specific implementation methods and technical effects are similar and will not be repeated here.

[0142] The storage medium may include random access memory (RAM) or non-volatile memory (NVM), such as at least one disk storage. Alternatively, the storage medium may be at least one storage device located away from the processor.

[0143] The above-mentioned processor can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it can also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, and discrete hardware components.

[0144] It should be noted that the terms "first," "second," and the like are used to distinguish similar objects and are not necessarily used to describe a particular order or precedence. It should be understood that the terms used in this manner are interchangeable where appropriate, so that the embodiments of the present invention described herein can be implemented in sequences other than those illustrated or described herein. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present invention. Instead, they are merely examples of devices and methods consistent with some aspects of the present invention.

[0145] In the description of this specification, the reference terms "one embodiment," "some embodiments," "examples," "specific examples," or "some examples" mean that the specific features or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features or characteristics described can be combined in any suitable manner in any one or more embodiments or examples. In addition, those skilled in the art can combine and combine different embodiments or examples described in this specification.

[0146] Although the present invention is described herein in conjunction with various embodiments, in the process of implementing the claimed invention, those skilled in the art can understand and implement other variations of the above-mentioned disclosed embodiments by viewing the drawings and the disclosed content. In the description of the present invention, the word "comprising" does not exclude other components or steps, "one" or "an" does not exclude multiple situations, and the meaning of "multiple" is two or more, unless otherwise clearly and specifically defined. In addition, certain measures are recorded in different embodiments, but this does not mean that these measures cannot be combined to produce good results.

[0147] The above is a further detailed description of the present invention in conjunction with specific preferred embodiments, and the specific implementation of the present invention cannot be considered to be limited to these descriptions. For those skilled in the art of the present invention, several simple deductions or substitutions can be made without departing from the concept of the present invention, and all of these should be considered to fall within the scope of protection of the present invention.

Claims

1. A method for calculating the microwave transmission characteristics of a dielectric-inlaid multilayer metal mesh, characterized in that: include: The medium embedded with multi-layer metal mesh is equivalent to a single-layer Drude dispersion model; Under the single-layer Drude dispersion model, obtaining the incident wave angular frequency; Substituting the incident wave angular frequency into a preset final dispersion equivalent formula to calculate the relative permittivity of the single-layer Drude dispersion model; The overall transmission coefficient is calculated based on the relative dielectric constant and the SO-FDTD method, and the overall transmission coefficient is used as the result of the microwave transmission characteristics of the dielectric-embedded multi-layer metal mesh; The calculation process of the preset final dispersion equivalent formula includes: S201, obtaining a standard transmission coefficient corresponding to a test medium inlaid with a multi-layer metal mesh based on an analytical model; S202, embedding the test medium with multiple layers of metal mesh into a single-layer Drude dispersion model, and obtaining an initial dispersion equivalent formula using the single-layer Drude dispersion model; S203, randomly generating a Drude frequency through a genetic algorithm, and obtaining an equivalent transmission coefficient using the Drude frequency and the SO-FDTD method; S204, calculating a coefficient error between the equivalent transmission coefficient and the standard transmission coefficient, and determining a final Drude frequency according to the coefficient error; S205, substituting the final Drude frequency into the initial dispersion equivalent formula to obtain a preset final dispersion equivalent formula; The preset final dispersion equivalent formula is expressed as: ； in, represents the relative permittivity, represents the relative permittivity at infinite frequency, represents the final Drude frequency, represents the imaginary unit, represents the collision frequency, represents the incident wave angular frequency; Calculating a coefficient error between the equivalent transmission coefficient and the standard transmission coefficient, and determining a final Drude frequency according to the coefficient error, includes: Calculating the difference between the equivalent transmission coefficient and the standard transmission coefficient to obtain the coefficient error; When the coefficient error is less than an error threshold, the Drude frequency corresponding to the equivalent transmission coefficient less than the error threshold is used as the final Drude frequency.

2. The method for calculating microwave transmission characteristics of dielectric-inlaid multilayer metal mesh according to claim 1, characterized in that: The analytical model is expressed as: ； in, represents the standard transmission coefficient, represents the standard transmission coefficient of the dielectric layer in the analytical model, represents the standard transmission coefficient of the metal mesh in the analytical model, C 2n+1 represents the correction coefficient of the dielectric layer in the analytical model, Indicates the first layer; is a positive integer greater than or equal to 0; ； in, Indicates the first The thickness of the layer, represents the frequency of the incident wave incident on the test medium inlaid with the multi-layer metal mesh, represents the magnetic permeability coefficient, represents the conductivity, represents the propagation constant, represents the wave impedance in free space, Indicates the first The wave impedance of the layer, Indicates the first The wave impedance of the layer, Indicates the first The wave impedance of the layer, represents the base of natural logarithms, , represents the imaginary unit, represents the angular frequency of the incident wave incident on the test medium embedded with the multi-layer metal mesh, represents the vacuum permeability coefficient, represents the vacuum dielectric constant, ； in, Indicates the diameter of the metal mesh, Indicates the mesh size of the metal mesh.

3. The method for calculating microwave transmission characteristics of dielectric-inlaid multilayer metal mesh according to claim 1, characterized in that: After calculating the difference between the equivalent transmission coefficient and the standard transmission coefficient to obtain the coefficient error, the method for calculating the microwave transmission characteristics of the dielectric-embedded multilayer metal mesh further includes: When the coefficient error is greater than the error threshold, steps S203 - S204 are repeatedly performed until the coefficient error is less than the error threshold.

4. The method for calculating microwave transmission characteristics of dielectric-inlaid multilayer metal mesh according to claim 1, characterized in that: The collision frequency The value is 10 5 , The value is 1.

5. A device for calculating the microwave transmission characteristics of a dielectric-embedded multi-layer metal mesh, characterized in that: The device for calculating the microwave transmission characteristics of the dielectric-inlaid multi-layer metal mesh comprises: an equivalent unit, an acquisition unit and a calculation unit; The equivalent unit is used to: convert the medium inlaid with multi-layer metal mesh into a single-layer Drude dispersion model; The acquisition unit is used to: acquire the incident wave angular frequency under the single-layer Drude dispersion model; The calculation unit is used to: substitute the incident wave angular frequency into a preset final dispersion equivalent formula to calculate the relative dielectric constant of the single-layer Drude dispersion model; The overall transmission coefficient is calculated based on the relative dielectric constant and the SO-FDTD method, and the overall transmission coefficient is used as the result of the microwave transmission characteristics of the dielectric-embedded multi-layer metal mesh; The calculation process of the preset final dispersion equivalent formula in the calculation unit includes: S201, obtaining a standard transmission coefficient corresponding to a test medium inlaid with a multi-layer metal mesh based on an analytical model; S202, embedding the test medium with multiple layers of metal mesh into a single-layer Drude dispersion model, and obtaining an initial dispersion equivalent formula using the single-layer Drude dispersion model; S203, randomly generating a Drude frequency through a genetic algorithm, and obtaining an equivalent transmission coefficient using the Drude frequency and the SO-FDTD method; S204, calculating a coefficient error between the equivalent transmission coefficient and the standard transmission coefficient, and determining a final Drude frequency according to the coefficient error; S205, substituting the final Drude frequency into the initial dispersion equivalent formula to obtain a preset final dispersion equivalent formula; The preset final dispersion equivalent formula is expressed as: ； in, represents the relative permittivity, represents the relative permittivity at infinite frequency, represents the final Drude frequency, represents the imaginary unit, represents the collision frequency, represents the incident wave angular frequency; Calculating the coefficient error between the equivalent transmission coefficient and the standard transmission coefficient, and determining the final Drude frequency according to the coefficient error, includes: Calculating the difference between the equivalent transmission coefficient and the standard transmission coefficient to obtain the coefficient error; When the coefficient error is less than an error threshold, the Drude frequency corresponding to the equivalent transmission coefficient less than the error threshold is used as the final Drude frequency.

6. A device for calculating the microwave transmission characteristics of a dielectric-embedded multi-layer metal mesh, characterized in that: include: A processor, a storage medium and a bus, wherein the storage medium stores machine-readable instructions executable by the processor. When the computing device for the microwave transmission characteristics of the medium-embedded multi-layer metal mesh is running, the processor communicates with the storage medium via the bus, and the processor executes the machine-readable instructions to perform the steps of the method for computing the microwave transmission characteristics of the medium-embedded multi-layer metal mesh as described in any one of claims 1 to 4.

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