Infrared detector NETD uncertainty calculation method and device, equipment, storage medium and program product

Abstract

The invention relates to an infrared detector NETD uncertainty calculation method and device, equipment, a storage medium and a program product. The method comprises the following steps: firstly, acquiring test temperature, response voltage and noise voltage of each pixel on a target infrared device under the condition that test conditions are met, then, determining extension uncertainty of noise equivalent temperature difference of each pixel according to the test temperature, response voltage and noise voltage of each pixel, and finally, determining the extension uncertainty of the noise equivalent temperature difference of each pixel according to the extension uncertainty of the noise equivalent temperature difference of each pixel. And determining the extension uncertainty of the total noise equivalent temperature difference used for representing the credibility of the noise equivalent temperature difference of the target infrared equipment according to the extension uncertainty of the noise equivalent temperature difference of each pixel. By adopting the method, the calculation of the expansion uncertainty of the noise equivalent temperature difference of the target infrared equipment can be realized.

Description

Technical Field

[0001] The present application relates to the field of infrared detection technology, and in particular to a method, device, equipment, storage medium and program product for calculating NETD uncertainty of an infrared detector. Background Art

[0002] The infrared focal plane array detector (IFPAD) is a two-dimensional array composed of multiple infrared light sensor units on the focal plane of the infrared optical system. It can make each pixel in the observation field correspond to the sensitive element one by one, so as to realize the infrared imaging detection of the object. The infrared focal plane array detector is similar to the visible light CCD image sensor array structure. It is the core component of the infrared imaging system, responsible for detecting objects and obtaining infrared information, and can be widely used in various fields. Noise Equivalent Temperature Difference (NETD) is an important parameter to measure the performance of infrared thermal imaging system.

[0003] At present, the reliability of measurement results is generally characterized by uncertainty, but there is no relevant calculation method for the uncertainty of the noise equivalent temperature difference of infrared focal plane array detectors. Summary of the invention

[0004] Based on this, it is necessary to provide an infrared detector NETD uncertainty calculation method, device, equipment, storage medium and program product that can calculate the uncertainty of the noise equivalent temperature difference in response to the above technical problems.

[0005] In a first aspect, the present application provides a method for calculating the NETD uncertainty of an infrared detector, comprising:

[0006] When the test conditions are met, the test temperature, response voltage and noise voltage of each pixel on the target infrared device are obtained;

[0007] Determine the expanded uncertainty of the noise equivalent temperature difference of each pixel according to the test temperature, response voltage and noise voltage of each pixel;

[0008] The expanded uncertainty of the overall noise equivalent temperature difference is determined according to the expanded uncertainty of the noise equivalent temperature difference of each pixel. The expanded uncertainty of the overall noise equivalent temperature difference is used to characterize the credibility of the noise equivalent temperature difference of the target infrared equipment.

[0009] In one embodiment, the test temperature includes a first test temperature and a second test temperature, and obtaining the test temperature, response voltage, and noise voltage of each pixel on the target infrared device includes:

[0010] Acquire multiple first test temperatures of each pixel tested multiple times, and calculate the average first test temperature and the first test temperature standard deviation of each pixel according to the multiple first test temperatures;

[0011] Acquire multiple second test temperatures of each pixel tested multiple times, and calculate the average second test temperature and the second test temperature standard deviation of each pixel according to the multiple second test temperatures;

[0012] Acquire multiple response voltages of each pixel from multiple tests, and calculate the average response voltage and the response voltage standard deviation of each pixel according to the multiple response voltages;

[0013] A plurality of noise voltages of each pixel tested multiple times are obtained, and an average noise voltage and a standard deviation of the noise voltage of each pixel are calculated based on the plurality of noise voltages.

[0014] In one embodiment, determining the expanded uncertainty of the noise equivalent temperature difference of each pixel according to the test temperature, the response voltage and the noise voltage of each pixel includes:

[0015] Determine a measurement parameter transfer coefficient of each pixel according to an average first test temperature, an average second test temperature, an average response voltage, and an average noise voltage of each pixel;

[0016] Determine the standard uncertainty of the noise equivalent temperature difference of each pixel according to the measurement parameter transfer coefficient of each pixel;

[0017] Determine the degree of freedom of the noise equivalent temperature difference of each pixel according to the measurement parameter transfer coefficient of each pixel;

[0018] The expanded uncertainty of the noise equivalent temperature difference of each pixel is determined according to the standard uncertainty of the noise equivalent temperature difference of each pixel and the degree of freedom of the noise equivalent temperature difference.

[0019] In one embodiment, determining the standard uncertainty of the noise equivalent temperature difference of each pixel according to the measurement parameter transfer coefficient of each pixel includes:

[0020] The standard uncertainty of the noise equivalent temperature difference of each pixel is determined according to the measurement parameter transfer coefficient of each pixel, the first test temperature standard deviation, the second test temperature standard deviation, the response voltage standard deviation and the noise voltage standard deviation.

[0021] In one embodiment, the degree of freedom of the noise equivalent temperature difference of each pixel is determined according to the measurement parameter transfer coefficient of each pixel, including:

[0022] The degree of freedom of the noise equivalent temperature difference of each pixel is determined according to the measurement parameter transfer coefficient of each pixel, the first test temperature standard deviation, the second test temperature standard deviation, the response voltage standard deviation, the noise voltage standard deviation and the number of tests.

[0023] In one embodiment, determining the expanded uncertainty of the overall noise equivalent temperature difference according to the expanded uncertainty of the noise equivalent temperature difference of each pixel includes:

[0024] According to the standard uncertainty of the noise equivalent temperature difference of each pixel and the number of pixels of the target infrared device, the standard uncertainty of the overall noise equivalent temperature difference is determined;

[0025] Determine the degree of freedom of the overall noise equivalent temperature difference according to the standard uncertainty of the noise equivalent temperature difference of each pixel, the degree of freedom of the noise equivalent temperature difference and the number of pixels;

[0026] The expanded uncertainty of the overall noise equivalent temperature difference is determined based on the standard uncertainty of the overall noise equivalent temperature difference and the degrees of freedom of the overall noise equivalent temperature difference.

[0027] In a second aspect, the present application also provides an infrared detector NETD uncertainty calculation device, comprising:

[0028] An acquisition module is used to acquire the test temperature, response voltage and noise voltage of each pixel on the target infrared device when the test conditions are met;

[0029] A first determination module is used to determine the expanded uncertainty of the noise equivalent temperature difference of each pixel according to the test temperature, response voltage and noise voltage of each pixel;

[0030] The second determination module is used to determine the expanded uncertainty of the overall noise equivalent temperature difference according to the expanded uncertainty of the noise equivalent temperature difference of each pixel. The expanded uncertainty of the overall noise equivalent temperature difference is used to characterize the credibility of the noise equivalent temperature difference of the target infrared device.

[0031] In a third aspect, the present application further provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, the infrared detector NETD uncertainty calculation method described in any one of the first aspects above is implemented.

[0032] In a fourth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the infrared detector NETD uncertainty calculation method described in any one of the first aspects above is implemented.

[0033] In a fifth aspect, the present application further provides a computer program product, including a computer program, which, when executed by a processor, implements the infrared detector NETD uncertainty calculation method described in any one of the above-mentioned first aspects.

[0034] The infrared detector NETD uncertainty calculation method, device, equipment, storage medium and program product described above first obtain the test temperature, response voltage and noise voltage of each pixel on the target infrared device when the test conditions are met, then determine the expanded uncertainty of the noise equivalent temperature difference of each pixel according to the test temperature, response voltage and noise voltage of each pixel, and finally determine the expanded uncertainty of the overall noise equivalent temperature difference used to characterize the credibility of the noise equivalent temperature difference of the target infrared device according to the expanded uncertainty of the noise equivalent temperature difference of each pixel. In this way, after calculating the expanded uncertainty of the noise equivalent temperature difference of each pixel on the target infrared device, the expanded uncertainty of the overall noise equivalent temperature difference of all pixels of the target infrared device is further calculated, thereby realizing the calculation of the expanded uncertainty of the noise equivalent temperature difference of the target infrared device. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the drawings required for use in the embodiments of the present application or related technical descriptions will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0036] Figure 1 A schematic diagram of a flow chart of a method for calculating NETD uncertainty of an infrared detector in an embodiment;

[0037] Figure 2 A schematic diagram of the arrangement of pixels of a target infrared device in one embodiment;

[0038] Figure 3 A schematic diagram of a flow chart of a method for calculating NETD uncertainty of an infrared detector in another embodiment;

[0039] Figure 4 A schematic diagram of a flow chart of a method for calculating NETD uncertainty of an infrared detector in another embodiment;

[0040] Figure 5 A schematic diagram of a flow chart of a method for calculating NETD uncertainty of an infrared detector in another embodiment;

[0041] Figure 6 A schematic diagram of a flow chart of a method for calculating NETD uncertainty of an infrared detector in another embodiment;

[0042] Figure 7 A structural block diagram of an infrared detector NETD uncertainty calculation device in one embodiment;

[0043] Figure 8FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0044] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0045] In an exemplary embodiment, Figure 1 As shown, a method for calculating the NETD uncertainty of an infrared detector is provided. The method is applied to a terminal as an example for explanation. It can be understood that the method can also be applied to a server, and can also be applied to a system including a terminal and a server, and is implemented through the interaction between the terminal and the server, including the following steps:

[0046] Step 101, when the test conditions are met, obtain the test temperature, response voltage and noise voltage of each pixel on the target infrared device.

[0047] Among them, the target infrared device can be an infrared focal plane array detector, such as Figure 2 As shown, the target infrared device is composed of imaging units arranged in an array, the serial number of each imaging unit is represented by the row and column it is in, and each imaging unit is also a pixel.

[0048] The test conditions are in accordance with the test conditions specified in the infrared focal plane array parameter test method standard, such as stable blackbody temperature, unmodulated output, and blackbody radiation should ensure uniform irradiation of each pixel in the focal plane. When using a surface source blackbody test, the blackbody temperatures T0 and T for medium-wave and long-wave infrared focal plane device tests are recommended to be 293K and 308K respectively, and the blackbody temperatures T0 and T for short-wave infrared focal plane device tests are specified temperatures. When using a point source blackbody test, the blackbody temperature T0 is the ambient temperature, the blackbody temperature T for medium-wave and long-wave infrared focal plane device tests is recommended to be 500K, and the blackbody temperature T for short-wave infrared focal plane device tests is specified temperature.

[0049] By establishing a preset test system that complies with the infrared focal plane array parameter test method standard, the test temperature, response voltage and noise voltage of each pixel on the target infrared device can be obtained, wherein the test temperature is also the black body temperature T0 and the black body temperature T. The process of obtaining the response voltage and noise voltage may include the following steps.

[0050] (1) Adjust the test system and apply the specified voltage to the target infrared device so that the target infrared device is in normal working condition.

[0051] (2) Continuously collect F frames of data at blackbody temperature T0 and blackbody temperature T respectively. Optionally, F ≥ 100. If the target infrared device is a linear focal plane, continuously collect F rows of data. This application takes the array focal plane as an example to obtain two sets of F frame two-dimensional arrays. Under the conditions of blackbody temperature T0 and T, the F frame two-dimensional arrays measured respectively are V DS [(i,j),T0,f] and V DS [(i,j),T,f].

[0052] Calculate the signal voltage of each pixel at the black body temperature T0. The calculation formula is shown below.

[0053]

[0054] In the above formula: is the output signal voltage of the pixel in the i-th row and j-th column under the blackbody temperature T0, the average value of F measurements (in V). DS [(i,j),T0,f] is the f-th measured value (in V) of the output signal voltage of the pixel in the i-th row and j-th column under the black body temperature T0. F is the total number of sampling frames.

[0055] Calculate the signal voltage of each pixel at the black body temperature T. The calculation formula is shown below.

[0056]

[0057] In the above formula: is the output signal voltage of the pixel in the i-th row and j-th column under the condition of black body temperature T, the average value of F measurements (V). DS [(i,j),T,f] is the f-th measured value (V) of the output signal voltage of the pixel in the i-th row and j-th column under the condition of blackbody temperature T. F is the total number of sampling frames.

[0058] (3) Calculate the response voltage of each pixel. The calculation formula is shown below.

[0059]

[0060] In the above formula: K is the system gain, which is the amplification factor of the amplifier in the test system.

[0061] (4) According to the above conditions of black body temperature T0 and black body temperature T, the two-dimensional array V of F frames collected DS [(i,j),T0,f], and two-dimensional array Get the noise voltage V of each pixel N (i,j), the calculation formula is as follows.

[0062]

[0063] Step 102: determining the expanded uncertainty of the noise equivalent temperature difference of each pixel according to the test temperature, response voltage and noise voltage of each pixel.

[0064] Among them, the noise equivalent temperature difference is defined as the equivalent temperature difference between the target and the background when the signal-to-noise ratio (S / N) is 1. The noise equivalent temperature difference is a key indicator for evaluating medium-wave (MWIR) and long-wave (LWIR) infrared thermal imagers, reflecting the minimum temperature difference that the target infrared device can detect. Uncertainty assessment plays a vital role in production and life, and it affects many fields such as quality control, decision-making, scientific research, and engineering design. In the fields of science and engineering, uncertainty is usually given together with the measurement results and is an important indicator for evaluating the accuracy of the measurement results. The expanded uncertainty of the noise equivalent temperature difference of each pixel is used to evaluate the reliability and accuracy of the noise equivalent temperature difference of each pixel. According to the test temperature, response voltage and noise voltage of each pixel, the noise equivalent temperature difference of each pixel can be calculated, and the uncertainty of the noise equivalent temperature difference of each pixel can be further evaluated.

[0065] Step 103: Determine the expanded uncertainty of the overall noise equivalent temperature difference according to the expanded uncertainty of the noise equivalent temperature difference of each pixel.

[0066] Among them, the expanded uncertainty of the overall noise equivalent temperature difference is used to characterize the credibility of the noise equivalent temperature difference of the target infrared device. The overall noise equivalent temperature difference is the average value of the noise equivalent temperature difference of all pixels on the target infrared device. According to the expanded uncertainty of the noise equivalent temperature difference of each pixel, the expanded uncertainty of the overall noise equivalent temperature difference of the target infrared device can be calculated.

[0067] In the above embodiment, first, when the test conditions are met, the test temperature, response voltage and noise voltage of each pixel on the target infrared device are obtained, then the expanded uncertainty of the noise equivalent temperature difference of each pixel is determined according to the test temperature, response voltage and noise voltage of each pixel, and finally, the expanded uncertainty of the overall noise equivalent temperature difference used to characterize the credibility of the noise equivalent temperature difference of the target infrared device is determined according to the expanded uncertainty of the noise equivalent temperature difference of each pixel. In this way, after the expanded uncertainty of the noise equivalent temperature difference of each pixel on the target infrared device is calculated, the expanded uncertainty of the overall noise equivalent temperature difference of all pixels of the target infrared device is further calculated, thereby realizing the calculation of the expanded uncertainty of the noise equivalent temperature difference of the target infrared device.

[0068] In one embodiment, the test temperature includes a first test temperature and a second test temperature, and the test temperature, response voltage and noise voltage of each pixel on the target infrared device are obtained, such as Figure 3 As shown, including:

[0069] Step 301 : obtaining a plurality of first test temperatures of each pixel tested multiple times, and calculating an average first test temperature and a first test temperature standard deviation of each pixel according to the plurality of first test temperatures.

[0070] Step 302: Acquire multiple second test temperatures of each pixel tested multiple times, and calculate the average second test temperature and the second test temperature standard deviation of each pixel according to the multiple second test temperatures.

[0071] Step 303: Acquire multiple response voltages of each pixel tested multiple times, and calculate the average response voltage and the response voltage standard deviation of each pixel according to the multiple response voltages.

[0072] Step 304 , obtaining multiple noise voltages of each pixel tested multiple times, and calculating the average noise voltage and the standard deviation of the noise voltage of each pixel according to the multiple noise voltages.

[0073] According to the multiple first test temperatures T, multiple second test temperatures T0, and multiple response voltages V of each pixel for multiple tests S (i,j), multiple noise voltages V N (i, j), and the average values ​​are calculated to obtain the average first test temperature b1, the average second test temperature b2, the average response voltage b3, and the average noise power b4. The multiple tests can be n times, and optionally, n is at least greater than 20, in units of frames. At the same time, based on the Bessel formula, the unbiased estimated sub-sample standard deviations of the four measured parameters to be synthesized are calculated according to the test data of the above multiple tests, including the first test temperature standard deviation c1, the second test temperature standard deviation c2, the response voltage standard deviation c3, and the noise voltage standard deviation c4.

[0074] In the embodiment of the present application, the above step 102 can be performed as follows: Figure 4 As shown, including:

[0075] Step 401 : determining the measurement parameter transfer coefficient of each pixel according to the average first test temperature, the average second test temperature, the average response voltage and the average noise voltage of each pixel.

[0076] According to the response voltage of each pixel and the noise voltage of each pixel measured in step 101, the noise equivalent temperature difference of each pixel can be calculated according to the following formula.

[0077]

[0078] Among them, the first test temperature T, the second test temperature T0, the response voltage V S (i,j), noise voltage V N (i, j) are the four measurement parameters to be synthesized. Assume T, T0, V S(i,j), V N There is no correlation between (i, j), and the measurement error obeys the normal distribution. The transmission coefficients are a1, a2, a3, and a4 respectively, and the following equation can be obtained.

[0079]

[0080]

[0081]

[0082]

[0083] According to the above formula and the average first test temperature b1, the average second test temperature b2, the average response voltage b3, and the average noise power b4 of each pixel, the transfer coefficient of each measurement parameter is obtained as shown below.

[0084]

[0085]

[0086]

[0087]

[0088] Step 402: determine the standard uncertainty of the noise equivalent temperature difference of each pixel according to the measurement parameter transfer coefficient of each pixel.

[0089] Optionally, the standard uncertainty of the noise equivalent temperature difference of each pixel is determined based on the measurement parameter transfer coefficient of each pixel, the first test temperature standard deviation, the second test temperature standard deviation, the response voltage standard deviation and the noise voltage standard deviation.

[0090] Assume that the error term can discard high-order small quantities of the second order and above after Taylor expansion, as shown in the following formula.

[0091] δ(NETD(i,j))=a1δ(T)+a2δ(T0)+a3δ(V S (i,))+a4δ(V N (i, j))

[0092] The standard deviation of the noise equivalent temperature difference NETD(i,j), that is, the standard uncertainty, can be expressed as shown below.

[0093]

[0094] Step 403: Determine the degree of freedom of the noise equivalent temperature difference of each pixel according to the measurement parameter transfer coefficient of each pixel.

[0095] The degree of freedom of the noise equivalent temperature difference of each pixel is determined according to the measurement parameter transfer coefficient of each pixel, the first test temperature standard deviation, the second test temperature standard deviation, the response voltage standard deviation, the noise voltage standard deviation and the number of tests.

[0096] According to the relationship between the overall uncertainty and the degree of freedom of each uncertainty component, when the estimated value u of each uncertainty component i The degrees of freedom v i It is known that the combined standard uncertainty u can be calculated according to the Welch-Satterthwaite formula c The effective degrees of freedom v e , as shown below.

[0097]

[0098] In the above formula, each uncertainty component u i and the total uncertainty u c The relationship is as follows. i with u(x i ) should have the same degrees of freedom.

[0099]

[0100] Therefore, assuming that T, T0, V S (i,j), V N The degrees of freedom of the four measurement parameters to be synthesized (i, j) are v1, v2, v3, and v4 respectively. The degrees of freedom of the noise equivalent temperature difference NETD can be calculated according to the following formula.

[0101]

[0102] Since the number of measurements is n, T, T0, V S (i,j), V N The corrected unbiased estimated sample standard deviation of the four measurement parameters (i, j) to be synthesized is calculated based on the Bessel formula, so,

[0103] v1=v2=v3=v4=n-1

[0104] Then, the noise equivalent temperature difference NETD degree of freedom can be calculated according to the following formula.

[0105]

[0106] Step 404, determining the expanded uncertainty of the noise equivalent temperature difference of each pixel according to the standard uncertainty of the noise equivalent temperature difference of each pixel and the degree of freedom of the noise equivalent temperature difference.

[0107] The standard uncertainty s of the noise equivalent temperature difference of each pixel is calculated. NETD(i,j) and the degrees of freedom v of the noise equivalent temperature difference of each pixel NETD(i,j) Then, let the confidence level be p, so the expanded uncertainty of NETD(i,j) is:

[0108] U NETD(i，j) =s NETD(i，j) ×t α (p,v NETD(i，j) )

[0109] Among them, according to the degree of freedom v of the single pixel NETD NETD(i,j) , by querying the critical value table of the t distribution shown in Table 1, the corresponding critical value t α (p,v NETD(i,j) ).

[0110] Table 1 Critical value t of t distribution a (v: degrees of freedom, α: significance)

[0111]

[0112] The physical meaning of the expanded uncertainty of the noise equivalent temperature difference of the above pixels is as follows:

[0113] When the confidence level is p, the confidence interval of the measurement error δ(NETD(i,j)) of NETD(i,j) is: [-U NETD(i,j) ,U NETD(i,j) ].

[0114] If the mean of NETD(i,j) is Then, when the confidence level is p, the confidence interval of the measured value of NETD(i,j) is:

[0115] In one embodiment, the expanded uncertainty of the overall noise equivalent temperature difference is determined based on the expanded uncertainty of the noise equivalent temperature difference of each pixel, such as Figure 5 As shown, including:

[0116] Step 501, determining the standard uncertainty of the overall noise equivalent temperature difference according to the standard uncertainty of the noise equivalent temperature difference of each pixel and the number of pixels of the target infrared device.

[0117] First, the transfer coefficient of the overall NETD is determined, and the average noise equivalent temperature difference is calculated as follows.

[0118]

[0119] Among them, M×N is the total number of effective pixels of the target infrared device. ijis the transfer coefficient of each pixel, as shown in the following formula.

[0120]

[0121] Then, calculate the overall NETD standard uncertainty of the target infrared device, assuming that the NETD values ​​between pixels are uncorrelated and the errors obey a normal distribution. Then, the standard uncertainty of the overall NETD is u T It can be expressed as:

[0122]

[0123] Step 502, determining the degrees of freedom of the overall noise equivalent temperature difference according to the standard uncertainty of the noise equivalent temperature difference of each pixel, the degrees of freedom of the noise equivalent temperature difference, and the number of pixels.

[0124] Target infrared equipment overall NETD degrees of freedom v eT It can be calculated according to the following formula.

[0125]

[0126] Step 503: Determine the expanded uncertainty of the overall noise equivalent temperature difference according to the standard uncertainty of the overall noise equivalent temperature difference and the degree of freedom of the overall noise equivalent temperature difference.

[0127] The standard uncertainty u of the overall noise equivalent temperature difference calculated above is T and the degrees of freedom of the total noise equivalent temperature difference v eT , let the confidence level be p, we can query the critical value table of the t distribution in Table 1 above to get t α (p,v eT ). Then the expanded uncertainty of the overall NETD is U T for:

[0128] U T =u T ×t α (p,v eT )

[0129] The physical meaning is that when the confidence level is p, the measurement error of the overall NETD (NETD T ) has a confidence interval of [-U T ,U T ]. If the mean of the overall NETD is When the confidence level is p, the confidence interval of the measured value of the population NETD is

[0130] In the above embodiment, by testing the target infrared device under the condition that the test conditions are met, and obtaining the test documents, response voltage, noise voltage and other measurement parameters in the test process, the uncertainty of the noise equivalent temperature difference of each pixel of the target infrared device is calculated, and the expanded uncertainty of the overall noise equivalent temperature difference of the target infrared device is further obtained, and the confidence level and confidence interval of the expanded uncertainty are given. The above test method is simple and easy, low-cost, simple in calculation model and high in calculation accuracy.

[0131] In the embodiments of the present application, Figure 6 FIG. 1 is a schematic diagram of the infrared detector NETD uncertainty calculation method proposed in this application, and the steps include:

[0132] Step 601: Acquire multiple first test temperatures of each pixel tested multiple times, and calculate the average first test temperature and the first test temperature standard deviation of each pixel according to the multiple first test temperatures.

[0133] Step 602: Acquire multiple second test temperatures of each pixel tested multiple times, and calculate the average second test temperature and the second test temperature standard deviation of each pixel according to the multiple second test temperatures.

[0134] Step 603: Acquire multiple response voltages of each pixel tested multiple times, and calculate the average response voltage and the response voltage standard deviation of each pixel according to the multiple response voltages.

[0135] Step 604 , obtaining multiple noise voltages of each pixel tested multiple times, and calculating the average noise voltage and the standard deviation of the noise voltage of each pixel according to the multiple noise voltages.

[0136] Step 605 , determining the measurement parameter transfer coefficient of each pixel according to the average first test temperature, the average second test temperature, the average response voltage and the average noise voltage of each pixel.

[0137] Step 606: determine the standard uncertainty of the noise equivalent temperature difference of each pixel according to the measurement parameter transfer coefficient of each pixel.

[0138] Step 607, determining the degree of freedom of the noise equivalent temperature difference of each pixel according to the measurement parameter transfer coefficient of each pixel.

[0139] Step 608, determining the expanded uncertainty of the noise equivalent temperature difference of each pixel according to the standard uncertainty of the noise equivalent temperature difference of each pixel and the degree of freedom of the noise equivalent temperature difference.

[0140] Step 609, determining the standard uncertainty of the overall noise equivalent temperature difference according to the standard uncertainty of the noise equivalent temperature difference of each pixel and the number of pixels of the target infrared device.

[0141] Step 610, determining the degrees of freedom of the overall noise equivalent temperature difference according to the standard uncertainty of the noise equivalent temperature difference of each pixel, the degrees of freedom of the noise equivalent temperature difference, and the number of pixels.

[0142] Step 611, determining the expanded uncertainty of the overall noise equivalent temperature difference according to the standard uncertainty of the overall noise equivalent temperature difference and the degree of freedom of the overall noise equivalent temperature difference.

[0143] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0144] Based on the same inventive concept, the embodiment of the present application also provides an infrared detector NETD uncertainty calculation device for implementing the infrared detector NETD uncertainty calculation method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in one or more infrared detector NETD uncertainty calculation device embodiments provided below can refer to the limitations of the infrared detector NETD uncertainty calculation method above, and will not be repeated here.

[0145] In an exemplary embodiment, Figure 7 As shown, an infrared detector NETD uncertainty calculation device 700 is provided, comprising: an acquisition module, a first determination module and a second determination module, wherein:

[0146] An acquisition module is used to acquire the test temperature, response voltage and noise voltage of each pixel on the target infrared device when the test conditions are met;

[0147] A first determination module is used to determine the expanded uncertainty of the noise equivalent temperature difference of each pixel according to the test temperature, response voltage and noise voltage of each pixel;

[0148] The second determination module is used to determine the expanded uncertainty of the overall noise equivalent temperature difference according to the expanded uncertainty of the noise equivalent temperature difference of each pixel. The expanded uncertainty of the overall noise equivalent temperature difference is used to characterize the credibility of the noise equivalent temperature difference of the target infrared device.

[0149] In one embodiment, the test temperature includes a first test temperature and a second test temperature, and the acquisition module is specifically used to acquire multiple first test temperatures of each pixel tested multiple times, and calculate the average first test temperature and the first test temperature standard deviation of each pixel based on the multiple first test temperatures; acquire multiple second test temperatures of each pixel tested multiple times, and calculate the average second test temperature and the second test temperature standard deviation of each pixel based on the multiple second test temperatures; acquire multiple response voltages of each pixel tested multiple times, and calculate the average response voltage and the response voltage standard deviation of each pixel based on the multiple response voltages; acquire multiple noise voltages of each pixel tested multiple times, and calculate the average noise voltage and the noise voltage standard deviation of each pixel based on the multiple noise voltages.

[0150] In one embodiment, the first determination module is specifically used to determine the measurement parameter transfer coefficient of each pixel based on the average first test temperature, the average second test temperature, the average response voltage and the average noise voltage of each pixel; determine the standard uncertainty of the noise equivalent temperature difference of each pixel based on the measurement parameter transfer coefficient of each pixel; determine the degree of freedom of the noise equivalent temperature difference of each pixel based on the measurement parameter transfer coefficient of each pixel; determine the expanded uncertainty of the noise equivalent temperature difference of each pixel based on the standard uncertainty of the noise equivalent temperature difference of each pixel and the degree of freedom of the noise equivalent temperature difference.

[0151] In one embodiment, the first determination module is specifically used to determine the standard uncertainty of the noise equivalent temperature difference of each pixel based on the measurement parameter transfer coefficient of each pixel, the first test temperature standard deviation, the second test temperature standard deviation, the response voltage standard deviation and the noise voltage standard deviation.

[0152] In one embodiment, the first determination module is specifically used to determine the degrees of freedom of the noise equivalent temperature difference of each pixel based on the measurement parameter transfer coefficient of each pixel, the first test temperature standard deviation, the second test temperature standard deviation, the response voltage standard deviation, the noise voltage standard deviation and the number of tests.

[0153] In one embodiment, the second determination module is specifically used to determine the standard uncertainty of the overall noise equivalent temperature difference based on the standard uncertainty of the noise equivalent temperature difference of each pixel and the number of pixels of the target infrared device; determine the degree of freedom of the overall noise equivalent temperature difference based on the standard uncertainty of the noise equivalent temperature difference of each pixel, the degree of freedom of the noise equivalent temperature difference and the number of pixels; determine the expanded uncertainty of the overall noise equivalent temperature difference based on the standard uncertainty of the overall noise equivalent temperature difference and the degree of freedom of the overall noise equivalent temperature difference.

[0154] Each module in the above-mentioned infrared detector NETD uncertainty calculation device can be implemented in whole or in part by software, hardware and their combination. Each of the above-mentioned modules can be embedded in or independent of the processor in the computer device in the form of hardware, or can be stored in the memory in the computer device in the form of software, so that the processor can call and execute the corresponding operations of each of the above modules.

[0155] In an exemplary embodiment, a computer device is provided. The computer device may be a terminal, and its internal structure diagram may be as shown in FIG. Figure 8 As shown. The computer device includes a processor, a memory, an input / output interface, a communication interface, a display unit and an input device. The processor, the memory and the input / output interface are connected via a system bus, and the communication interface, the display unit and the input device are connected to the system bus via the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be implemented through WIFI, a mobile cellular network, near field communication (NFC) or other technologies. When the computer program is executed by the processor, a method for calculating the uncertainty of NETD of an infrared detector is implemented.

[0156] Those skilled in the art will understand that Figure 8 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0157] In an exemplary embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the following steps when executing the computer program: obtaining the test temperature, response voltage and noise voltage of each pixel on the target infrared device when the test conditions are met; determining the expanded uncertainty of the noise equivalent temperature difference of each pixel according to the test temperature, response voltage and noise voltage of each pixel; determining the expanded uncertainty of the overall noise equivalent temperature difference according to the expanded uncertainty of the noise equivalent temperature difference of each pixel, and the expanded uncertainty of the overall noise equivalent temperature difference is used to characterize the credibility of the noise equivalent temperature difference of the target infrared device.

[0158] In one embodiment, the test temperature includes a first test temperature and a second test temperature, and the processor further implements the following steps when executing the computer program: obtaining multiple first test temperatures of each pixel tested multiple times, and calculating the average first test temperature and the first test temperature standard deviation of each pixel based on the multiple first test temperatures; obtaining multiple second test temperatures of each pixel tested multiple times, and calculating the average second test temperature and the second test temperature standard deviation of each pixel based on the multiple second test temperatures; obtaining multiple response voltages of each pixel tested multiple times, and calculating the average response voltage and the response voltage standard deviation of each pixel based on the multiple response voltages; obtaining multiple noise voltages of each pixel tested multiple times, and calculating the average noise voltage and the noise voltage standard deviation of each pixel based on the multiple noise voltages.

[0159] In one embodiment, the processor further implements the following steps when executing the computer program: determining the measurement parameter transfer coefficient of each pixel based on the average first test temperature, the average second test temperature, the average response voltage and the average noise voltage of each pixel; determining the standard uncertainty of the noise equivalent temperature difference of each pixel based on the measurement parameter transfer coefficient of each pixel; determining the degree of freedom of the noise equivalent temperature difference of each pixel based on the measurement parameter transfer coefficient of each pixel; determining the expanded uncertainty of the noise equivalent temperature difference of each pixel based on the standard uncertainty of the noise equivalent temperature difference of each pixel and the degree of freedom of the noise equivalent temperature difference.

[0160] In one embodiment, when the processor executes the computer program, the following steps are also implemented: based on the measurement parameter transfer coefficient of each pixel, the first test temperature standard deviation, the second test temperature standard deviation, the response voltage standard deviation and the noise voltage standard deviation, the standard uncertainty of the noise equivalent temperature difference of each pixel is determined.

[0161] In one embodiment, when the processor executes the computer program, the following steps are also implemented: based on the measurement parameter transfer coefficient of each pixel, the first test temperature standard deviation, the second test temperature standard deviation, the response voltage standard deviation, the noise voltage standard deviation and the number of tests, the degrees of freedom of the noise equivalent temperature difference of each pixel are determined.

[0162] In one embodiment, when the processor executes the computer program, the following steps are also implemented: determining the standard uncertainty of the overall noise equivalent temperature difference based on the standard uncertainty of the noise equivalent temperature difference of each pixel and the number of pixels of the target infrared device; determining the degree of freedom of the overall noise equivalent temperature difference based on the standard uncertainty of the noise equivalent temperature difference of each pixel, the degree of freedom of the noise equivalent temperature difference and the number of pixels; determining the expanded uncertainty of the overall noise equivalent temperature difference based on the standard uncertainty of the overall noise equivalent temperature difference and the degree of freedom of the overall noise equivalent temperature difference.

[0163] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the following steps are implemented: when test conditions are met, the test temperature, response voltage and noise voltage of each pixel on the target infrared device are obtained; the expanded uncertainty of the noise equivalent temperature difference of each pixel is determined according to the test temperature, response voltage and noise voltage of each pixel; according to the expanded uncertainty of the noise equivalent temperature difference of each pixel, the expanded uncertainty of the overall noise equivalent temperature difference is determined, and the expanded uncertainty of the overall noise equivalent temperature difference is used to characterize the credibility of the noise equivalent temperature difference of the target infrared device.

[0164] In one embodiment, the test temperature includes a first test temperature and a second test temperature, and the computer program, when executed by the processor, also implements the following steps: obtaining multiple first test temperatures of each pixel tested multiple times, and calculating the average first test temperature and the first test temperature standard deviation of each pixel based on the multiple first test temperatures; obtaining multiple second test temperatures of each pixel tested multiple times, and calculating the average second test temperature and the second test temperature standard deviation of each pixel based on the multiple second test temperatures; obtaining multiple response voltages of each pixel tested multiple times, and calculating the average response voltage and the response voltage standard deviation of each pixel based on the multiple response voltages; obtaining multiple noise voltages of each pixel tested multiple times, and calculating the average noise voltage and the noise voltage standard deviation of each pixel based on the multiple noise voltages.

[0165] In one embodiment, when the computer program is executed by the processor, the following steps are also implemented: determining the measurement parameter transfer coefficient of each pixel based on the average first test temperature, the average second test temperature, the average response voltage and the average noise voltage of each pixel; determining the standard uncertainty of the noise equivalent temperature difference of each pixel based on the measurement parameter transfer coefficient of each pixel; determining the degree of freedom of the noise equivalent temperature difference of each pixel based on the measurement parameter transfer coefficient of each pixel; determining the expanded uncertainty of the noise equivalent temperature difference of each pixel based on the standard uncertainty of the noise equivalent temperature difference of each pixel and the degree of freedom of the noise equivalent temperature difference.

[0166] In one embodiment, when the computer program is executed by the processor, the following steps are also implemented: based on the measurement parameter transfer coefficient of each pixel, the first test temperature standard deviation, the second test temperature standard deviation, the response voltage standard deviation and the noise voltage standard deviation, the standard uncertainty of the noise equivalent temperature difference of each pixel is determined.

[0167] In one embodiment, when the computer program is executed by the processor, the following steps are also implemented: based on the measurement parameter transfer coefficient of each pixel, the first test temperature standard deviation, the second test temperature standard deviation, the response voltage standard deviation, the noise voltage standard deviation and the number of tests, the degrees of freedom of the noise equivalent temperature difference of each pixel are determined.

[0168] In one embodiment, when the computer program is executed by the processor, the following steps are also implemented: determining the standard uncertainty of the overall noise equivalent temperature difference based on the standard uncertainty of the noise equivalent temperature difference of each pixel and the number of pixels of the target infrared device; determining the degree of freedom of the overall noise equivalent temperature difference based on the standard uncertainty of the noise equivalent temperature difference of each pixel, the degree of freedom of the noise equivalent temperature difference and the number of pixels; determining the expanded uncertainty of the overall noise equivalent temperature difference based on the standard uncertainty of the overall noise equivalent temperature difference and the degree of freedom of the overall noise equivalent temperature difference.

[0169] In one embodiment, a computer program product is provided, including a computer program, which implements the following steps when executed by a processor: obtaining the test temperature, response voltage and noise voltage of each pixel on the target infrared device when the test conditions are met; determining the expanded uncertainty of the noise equivalent temperature difference of each pixel based on the test temperature, response voltage and noise voltage of each pixel; determining the expanded uncertainty of the overall noise equivalent temperature difference based on the expanded uncertainty of the noise equivalent temperature difference of each pixel, and the expanded uncertainty of the overall noise equivalent temperature difference is used to characterize the credibility of the noise equivalent temperature difference of the target infrared device.

[0170] In one embodiment, the test temperature includes a first test temperature and a second test temperature, and the computer program, when executed by the processor, also implements the following steps: obtaining multiple first test temperatures of each pixel tested multiple times, and calculating the average first test temperature and the first test temperature standard deviation of each pixel based on the multiple first test temperatures; obtaining multiple second test temperatures of each pixel tested multiple times, and calculating the average second test temperature and the second test temperature standard deviation of each pixel based on the multiple second test temperatures; obtaining multiple response voltages of each pixel tested multiple times, and calculating the average response voltage and the response voltage standard deviation of each pixel based on the multiple response voltages; obtaining multiple noise voltages of each pixel tested multiple times, and calculating the average noise voltage and the noise voltage standard deviation of each pixel based on the multiple noise voltages.

[0171] In one embodiment, when the computer program is executed by the processor, the following steps are also implemented: determining the measurement parameter transfer coefficient of each pixel based on the average first test temperature, the average second test temperature, the average response voltage and the average noise voltage of each pixel; determining the standard uncertainty of the noise equivalent temperature difference of each pixel based on the measurement parameter transfer coefficient of each pixel; determining the degree of freedom of the noise equivalent temperature difference of each pixel based on the measurement parameter transfer coefficient of each pixel; determining the expanded uncertainty of the noise equivalent temperature difference of each pixel based on the standard uncertainty of the noise equivalent temperature difference of each pixel and the degree of freedom of the noise equivalent temperature difference.

[0172] In one embodiment, when the computer program is executed by the processor, the following steps are also implemented: based on the measurement parameter transfer coefficient of each pixel, the first test temperature standard deviation, the second test temperature standard deviation, the response voltage standard deviation and the noise voltage standard deviation, the standard uncertainty of the noise equivalent temperature difference of each pixel is determined.

[0173] In one embodiment, when the computer program is executed by the processor, the following steps are also implemented: based on the measurement parameter transfer coefficient of each pixel, the first test temperature standard deviation, the second test temperature standard deviation, the response voltage standard deviation, the noise voltage standard deviation and the number of tests, the degrees of freedom of the noise equivalent temperature difference of each pixel are determined.

[0174] In one embodiment, when the computer program is executed by the processor, the following steps are also implemented: determining the standard uncertainty of the overall noise equivalent temperature difference based on the standard uncertainty of the noise equivalent temperature difference of each pixel and the number of pixels of the target infrared device; determining the degree of freedom of the overall noise equivalent temperature difference based on the standard uncertainty of the noise equivalent temperature difference of each pixel, the degree of freedom of the noise equivalent temperature difference and the number of pixels; determining the expanded uncertainty of the overall noise equivalent temperature difference based on the standard uncertainty of the overall noise equivalent temperature difference and the degree of freedom of the overall noise equivalent temperature difference.

[0175] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant regulations.

[0176] Those of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, an artificial intelligence (AI) processor, etc., but are not limited to this.

[0177] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0178] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A method for calculating the NETD uncertainty of an infrared detector, characterized in that: The method comprises: When the test conditions are met, the test temperature, response voltage and noise voltage of each pixel on the target infrared device are obtained; Determine the expanded uncertainty of the noise equivalent temperature difference of each pixel according to the test temperature, response voltage and noise voltage of each pixel; The expanded uncertainty of the overall noise equivalent temperature difference is determined according to the expanded uncertainty of the noise equivalent temperature difference of each pixel, and the expanded uncertainty of the overall noise equivalent temperature difference is used to characterize the credibility of the noise equivalent temperature difference of the target infrared device.

2. The method according to claim 1, characterized in that: The test temperature includes a first test temperature and a second test temperature, and the step of acquiring the test temperature, response voltage and noise voltage of each pixel on the target infrared device includes: Acquire a plurality of first test temperatures of the plurality of tests of the pixel, and calculate an average first test temperature and a first test temperature standard deviation of the pixel according to the plurality of first test temperatures; Acquire multiple second test temperatures of the pixel tested multiple times, and calculate the average second test temperature and the second test temperature standard deviation of the pixel according to the multiple second test temperatures; Acquire multiple response voltages of each pixel tested multiple times, and calculate the average response voltage and response voltage standard deviation of each pixel according to the multiple response voltages; A plurality of noise voltages of each pixel tested multiple times are obtained, and an average noise voltage and a standard deviation of the noise voltage of each pixel are calculated based on the plurality of noise voltages.

3. The method according to claim 2, characterized in that The method of determining the expanded uncertainty of the noise equivalent temperature difference of each pixel according to the test temperature, response voltage and noise voltage of each pixel includes: Determine a measurement parameter transfer coefficient of each pixel according to an average first test temperature, an average second test temperature, an average response voltage, and an average noise voltage of each pixel; Determine the standard uncertainty of the noise equivalent temperature difference of each pixel according to the measurement parameter transfer coefficient of each pixel; Determine the degree of freedom of the noise equivalent temperature difference of each pixel according to the measurement parameter transfer coefficient of each pixel; The expanded uncertainty of the noise equivalent temperature difference of each pixel is determined according to the standard uncertainty of the noise equivalent temperature difference of each pixel and the degree of freedom of the noise equivalent temperature difference.

4. The method according to claim 3, characterized in that Determining the standard uncertainty of the noise equivalent temperature difference of each pixel according to the measurement parameter transfer coefficient of each pixel includes: The standard uncertainty of the noise equivalent temperature difference of each pixel is determined according to the measurement parameter transfer coefficient of each pixel, the first test temperature standard deviation, the second test temperature standard deviation, the response voltage standard deviation and the noise voltage standard deviation.

5. The method according to claim 3, characterized in that: The degree of freedom of determining the noise equivalent temperature difference of each pixel according to the measurement parameter transfer coefficient of each pixel includes: The degree of freedom of the noise equivalent temperature difference of each pixel is determined according to the measurement parameter transfer coefficient of each pixel, the first test temperature standard deviation, the second test temperature standard deviation, the response voltage standard deviation, the noise voltage standard deviation and the number of tests.

6. The method according to claim 3, characterized in that Determining the expanded uncertainty of the overall noise equivalent temperature difference according to the expanded uncertainty of the noise equivalent temperature difference of each pixel includes: Determine the standard uncertainty of the overall noise equivalent temperature difference according to the standard uncertainty of the noise equivalent temperature difference of each pixel and the number of pixels of the target infrared device; Determine the degree of freedom of the overall noise equivalent temperature difference according to the standard uncertainty of the noise equivalent temperature difference of each pixel, the degree of freedom of the noise equivalent temperature difference and the number of pixels; The expanded uncertainty of the overall noise equivalent temperature difference is determined according to the standard uncertainty of the overall noise equivalent temperature difference and the degree of freedom of the overall noise equivalent temperature difference.

7. An infrared detector NETD uncertainty calculation device, characterized in that: The device comprises: An acquisition module is used to acquire the test temperature, response voltage and noise voltage of each pixel on the target infrared device when the test conditions are met; A first determination module, used to determine the expanded uncertainty of the noise equivalent temperature difference of each pixel according to the test temperature, response voltage and noise voltage of each pixel; The second determination module is used to determine the expanded uncertainty of the overall noise equivalent temperature difference according to the expanded uncertainty of the noise equivalent temperature difference of each pixel, and the expanded uncertainty of the overall noise equivalent temperature difference is used to characterize the credibility of the noise equivalent temperature difference of the target infrared device.

8. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 6 are implemented.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

10. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

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