Spectral analysis device and control method thereof

Abstract

The invention discloses a spectral analysis device and a control method thereof, and relates to the technical field of spectral analysis. The spectral analysis device comprises a spectral analysis chamber, a measuring gas chamber and a sample loading device. A light source and a detector are arranged in the spectrum analysis chamber; the measuring gas chamber is adjacent to the spectral analysis chamber and is used for providing required adjustable atmosphere conditions for a sample to be detected, and an optical window for an optical signal to pass through is arranged between the measuring gas chamber and the spectral analysis chamber; a to-be-tested sample is placed on the sample loading device. The measuring gas chamber is additionally arranged at the position adjacent to the spectral analysis chamber, and can provide required adjustable atmosphere conditions for the sample to be detected, so that the stability of environmental conditions in the analysis process is ensured. When XRF or LIBS spectral analysis is carried out, absorption of the atmosphere to spectral signals in a light path can be effectively reduced. The arrangement of the measuring air chamber can separate the sample to be measured from the optical window, so that attenuation and distortion of spectral signals caused by attachment of external dust are effectively avoided, and the acquired spectral data are ensured to be more accurate.

Description

Technical Field

[0001] The present invention relates to the technical field of spectrum analysis, and in particular to a spectrum analysis device and a control method thereof. Background Art

[0002] Spectroscopic analysis is an instrument that uses the spectral information generated by the interaction between matter and light to obtain the composition and characteristics of the substance. Spectroscopic analysis has been widely used in many industries such as chemical industry, energy, pharmaceuticals, food and environmental protection. Compared with traditional analysis methods, spectral analysis has the advantages of fast testing speed and accurate results.

[0003] The spectral analysis device in the prior art is usually composed of a light source, a detector and a sample cup, and mainly adopts the method of direct measurement in the atmosphere. Specifically, the light emitted by the light source is incident on the sample in the sample cup, and the detector then analyzes the spectral information reflected by the sample. However, the current spectral analysis device faces the following technical problems when performing spectral analysis: (1) Changes in atmospheric temperature and humidity will affect the spectral analysis process, resulting in unstable analysis results.

[0004] (2) When performing X-ray fluorescence spectrometry (XRF) or laser induced breakdown spectroscopy (LIBS) spectral analysis, the atmosphere in the optical path will absorb part of the test spectrum, thus affecting the accuracy of the analysis results.

[0005] (3) Dust in the atmosphere will adhere to the window of the spectral analysis device, causing attenuation and distortion of the spectral signal, thereby affecting the final analysis results.

[0006] Therefore, there is an urgent need for a new type of spectral analysis device to improve the stability and accuracy of the analysis results. Summary of the invention

[0007] In order to solve the above technical problems, the purpose of the present invention is to provide a spectrum analysis device and a control method thereof, aiming to improve the stability and accuracy of the analysis results.

[0008] The technical solution provided by the present invention is as follows: A spectrum analysis device, comprising: A spectral analysis chamber, wherein a light source and a detector are arranged inside, wherein the light source is used to emit a light signal to illuminate the sample to be tested, and the detector is used to receive and analyze the light signal generated after passing through the sample to be tested, so as to obtain the spectral information of the sample to be tested; A measuring gas chamber is arranged adjacent to the spectral analysis chamber, and is used to provide the required adjustable atmosphere conditions for the sample to be tested, and an optical window for light signals to pass through is arranged between the measuring gas chamber and the spectral analysis chamber; The sample loading device is used to place the sample to be tested.

[0009] Further, the sample loading device is arranged outside the measuring gas chamber; The measuring air chamber comprises an air inlet end and an air outlet end, wherein the air inlet end is communicated with an external air source, and the air outlet end is arranged corresponding to the sample to be measured so as to provide the sample to be measured with required adjustable atmosphere conditions.

[0010] Furthermore, the air inlet end is provided with an air inlet pipe, and the air inlet pipe is provided with a flow controller to adjust the flow of the gas entering the measuring air chamber.

[0011] Furthermore, a heater is provided on the air inlet pipe, and a temperature measuring probe is provided in the measuring air chamber. The heater and the temperature measuring probe work together to adjust the temperature of the gas entering the measuring air chamber.

[0012] Further, the external gas source is selected from one of the following: helium, nitrogen or compressed air; And / or, the air outlet end is provided with an air chamber door, and the air chamber door has an open state and a closed state.

[0013] Furthermore, the spectral analysis chamber is a closed box; When the light source is a near-infrared light source, the material of the optical window is quartz material; or, when the light source is an X-ray, the material of the optical window is polyester film.

[0014] Furthermore, the detector includes a receiving module, a signal processing module and an analysis module, the receiving module is used to receive the optical signal generated after passing through the sample to be tested, the signal processing module is used to convert the optical signal into an electrical signal, and the analysis module is used to analyze and process the electrical signal to obtain the spectral information of the sample to be tested.

[0015] On the other hand, the present invention further provides a control method for a spectral analysis device. Based on the spectral analysis device as described in any one of the above embodiments, the control method comprises the following steps: S1, receiving the incoming signal; S2, turn on the flow controller, heater and temperature probe; S3, open the air chamber door; S4, determining whether the flow rate and temperature of the gas in the measuring chamber are stable, if so, executing step S5, if not, continuing to adjust; S5, turn on the light source and detector; S6, determine whether the analysis process is completed, if so, execute step S7, if not, continue the analysis; S7, close the air chamber door; S8. Turn off the flow controller, heater and temperature probe.

[0016] Furthermore, step S4 specifically includes: The flow rate of the gas in the gas chamber is monitored in real time and compared with the preset flow stability threshold range. If the monitored flow rate fluctuates within the preset flow stability threshold range, it is determined to be stable; if the monitored flow rate exceeds the preset flow stability threshold range, it is determined to be unstable; The temperature of the gas in the gas chamber is monitored in real time and compared with the preset temperature stability threshold range. If the monitored temperature fluctuates within the preset temperature stability threshold range, it is determined to be stable; if the monitored temperature exceeds the preset temperature stability threshold range, it is determined to be unstable; If both the flow rate and the temperature of the gas in the measuring chamber are determined to be stable, step S5 is executed. If at least one of the flow rate and the temperature of the gas in the measuring chamber is determined to be unstable, the opening of the flow controller and / or the power of the heater are continuously and automatically adjusted until both the flow rate and the temperature of the gas in the measuring chamber reach a stable state.

[0017] Further, step S6 specifically includes: Whether the analysis is completed is determined according to the preset analysis conditions or time parameters. If the analysis is confirmed to be completed, step S7 is executed. If the analysis is not completed, the analysis is continued.

[0018] Compared with the prior art, the spectral analysis device and control method thereof provided by the embodiments of the present invention have at least the following technical effects: The spectral analysis device includes a spectral analysis chamber, a measuring gas chamber and a sample loading device. A light source and a detector are arranged inside the spectral analysis chamber. The light source is used to emit a light signal to illuminate the sample to be tested, and the detector is used to receive and analyze the light signal generated after passing through the sample to be tested to obtain the spectral information of the sample to be tested; the measuring gas chamber is arranged adjacent to the spectral analysis chamber, and is used to provide the required adjustable atmosphere conditions to the sample to be tested, and an optical window for the light signal to pass through is arranged between the measuring gas chamber and the spectral analysis chamber; the sample loading device is used to place the sample to be tested. By adding a measuring gas chamber at an adjacent position to the spectral analysis chamber, the measuring gas chamber can provide the required adjustable atmosphere conditions to the sample to be tested, ensuring the stability of the environmental conditions during the analysis process, thereby improving the stability of the spectral analysis results. Furthermore, the measuring gas chamber can provide the required adjustable atmosphere conditions, and when performing X-ray fluorescence spectrometry (XRF) or laser induced breakdown spectrometry (LIBS) spectral analysis, an inert gas (such as helium) can be selected to be filled to effectively reduce the absorption of the spectral signal by the atmosphere in the optical path, thereby improving the analysis accuracy of XRF and LIBS technology. Furthermore, the setting of the measuring chamber can separate the sample to be tested from the optical window, effectively avoiding the attenuation and distortion of the spectral signal caused by external dust adhesion, ensuring that the acquired spectral data is more accurate. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0020] Figure 1 A schematic diagram of the structure of a spectrum analysis device according to an embodiment of the present invention; Figure 2 Schematic diagram of the control method of the spectrum analysis device in an embodiment of the present invention.

[0021] Reference numerals: 1. Spectral analysis room; 11. Light source; 12. Detector; 2. Measuring gas chamber; 21. Inlet pipe; 22. Flow controller; 23. Heater; 24. Gas chamber door; 25. Temperature measuring probe; 3. Optical window; 4. Sample loading device. DETAILED DESCRIPTION

[0022] In order to enable those skilled in the art to better understand the technical solutions in the present invention, the technical solutions in the embodiments of the present invention are clearly and completely described below. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in the field without creative work are within the scope of protection of the present invention.

[0023] It should be noted that when an element is referred to as being "fixed on" or "set on" another element, it can be directly on the other element or indirectly set on the other element; when an element is referred to as being "connected to" another element, it can be directly connected to the other element or indirectly connected to the other element.

[0024] It should be understood that the orientation or position relationship indicated by terms such as "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside" and "outside" are based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operate in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0025] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, the meaning of "multiple" and "several" is two or more, unless otherwise clearly and specifically defined.

[0026] It should be noted that the structures, proportions, sizes, etc. illustrated in the drawings of this specification are only used to match the contents disclosed in the specification so as to facilitate understanding and reading by persons familiar with this technology. They are not used to limit the conditions under which the present invention can be implemented, and therefore have no substantive technical significance. Any structural modification, change in proportional relationship, or adjustment of size, without affecting the effects and purposes that can be achieved by the present invention, should still fall within the scope of the technical contents disclosed by the present invention.

[0027] Please see attached Figure 1As shown, an embodiment of the present invention provides a spectral analysis device, including a spectral analysis chamber 1, a measuring gas chamber 2 and a sample loading device 4. A light source 11 and a detector 12 are arranged inside the spectral analysis chamber 1. The light source 11 is used to emit a light signal to illuminate the sample to be tested, and the detector 12 is used to receive and analyze the light signal generated after passing through the sample to be tested, so as to obtain the spectral information of the sample to be tested; the measuring gas chamber 2 is arranged adjacent to the spectral analysis chamber 1, and is used to provide the required adjustable atmosphere conditions to the sample to be tested, and an optical window 3 for the light signal to pass through is arranged between the measuring gas chamber 2 and the spectral analysis chamber 1; the sample loading device 4 is used to place the sample to be tested. Among them, the required adjustable atmosphere conditions refer to that the measuring gas chamber 2 can flexibly adjust the atmosphere type (such as helium, nitrogen, etc.), temperature, humidity and flow rate according to different experimental requirements, so as to provide suitable atmosphere conditions during the analysis process, thereby improving the accuracy and stability of the spectral analysis. This flexible adjustment capability enables the spectral analysis device to meet the analysis requirements of different types of samples, and improves its applicability and versatility.

[0028] In this embodiment, the spectral analysis device includes a spectral analysis chamber 1, a measuring gas chamber 2 and a sample loading device 4. A light source 11 and a detector 12 are provided inside the spectral analysis chamber 1. The light source 11 is used to emit a light signal to illuminate the sample to be tested, and the detector 12 is used to receive and analyze the light signal generated after passing through the sample to be tested, so as to obtain the spectral information of the sample to be tested; the measuring gas chamber 2 is arranged adjacent to the spectral analysis chamber 1, and is used to provide the required adjustable atmosphere conditions to the sample to be tested, and an optical window 3 for the light signal to pass through is arranged between the measuring gas chamber 2 and the spectral analysis chamber 1; the sample loading device 4 is used to place the sample to be tested. By adding the measuring gas chamber 2 at an adjacent position to the spectral analysis chamber 1, the measuring gas chamber 2 can provide the required adjustable atmosphere conditions to the sample to be tested, ensure the stability of the environmental conditions during the analysis process, and thus improve the stability of the spectral analysis results. Furthermore, by providing the required adjustable atmosphere conditions through the measurement chamber 2, when performing X-ray fluorescence spectrometry (XRF) or laser induced breakdown spectrometry (LIBS) spectrometry analysis, you can choose to use inert gas (such as helium) to fill it, so as to effectively reduce the absorption of spectral signals by the atmosphere in the optical path, and improve the analysis accuracy of XRF and LIBS technology. Furthermore, the setting of the measurement chamber 2 can separate the sample to be tested from the optical window 3, effectively avoiding the attenuation and distortion of the spectral signal caused by the adhesion of external dust, and ensuring that the acquired spectral data is more accurate.

[0029] In some optional embodiments, the sample loading device 4 is arranged outside the measuring gas chamber 2; the measuring gas chamber 2 includes an air inlet end and an air outlet end, the air inlet end is connected to an external air source, and the air outlet end is arranged corresponding to the sample to be tested to provide the required adjustable atmosphere conditions to the sample to be tested.

[0030] In some optional embodiments, an air inlet pipe 21 is provided at the air inlet end, and a flow controller 22 is provided on the air inlet pipe 21 to adjust the flow of gas entering the measuring air chamber 2 .

[0031] In some optional embodiments, a heater 23 is further provided on the air inlet pipe 21 , and a temperature measuring probe 25 is provided in the measuring air chamber 2 . The heater 23 and the temperature measuring probe 25 work together to adjust the temperature of the gas in the measuring air chamber 2 .

[0032] In some optional embodiments, the external gas source is selected from one of the following: helium, nitrogen or compressed air. Specifically, when performing spectral analysis such as X-ray fluorescence spectroscopy (XRF) or laser induced breakdown spectroscopy (LIBS), using helium as the external gas source is a preferred solution. Helium does not absorb or scatter light, thereby reducing interference with spectral analysis and improving the accuracy and reliability of the analysis results.

[0033] In some optional embodiments, a gas chamber door 24 is provided at the gas outlet, and the gas chamber door 24 has an open state and a closed state. It should be further explained that the gas chamber door 24 has an automatic control function. When the measuring gas chamber 2 needs to flow out gas, the gas chamber door 24 will automatically open to allow the gas to flow out smoothly. On the contrary, when the measuring gas chamber 2 does not need to flow out gas, the gas chamber door 24 will automatically close to ensure the sealing of the measuring gas chamber 2. This automatic opening and closing mechanism can be implemented in a variety of ways, such as using an electric drive device, a pneumatic actuator or a mechanical spring system, combined with a control system to achieve intelligent operation.

[0034] In some optional embodiments, the spectral analysis chamber 1 is a closed box that can effectively isolate external factors, such as changes in temperature, humidity, and airflow, thereby reducing the impact of these factors on the spectral analysis results.

[0035] In a specific embodiment, when the light source 11 is a near-infrared light source, the optical window 3 is made of quartz material. Among them, the transmittance of quartz material in the near-infrared band (usually 750 nm to 2500 nm) is relatively high, which means that the light emitted by the near-infrared light source can effectively penetrate the optical window 3, thereby reducing signal loss and ensuring the intensity and clarity of the spectral signal. This feature is crucial to improving the sensitivity of spectral analysis, especially when analyzing low-concentration samples. It should be further explained that the near-infrared light source can be a tungsten lamp or a laser.

[0036] In another specific embodiment, when the light source 11 is an X-ray, the material of the optical window 3 is a polyester film. The polyester film has good transmission performance in the X-ray band and can effectively transmit X-rays. This transmission characteristic allows the fluorescent signal to fully pass through the optical window 3, ensuring that the acquired signal intensity is high enough, thereby improving the reliability of the analysis result.

[0037] In some optional embodiments, the detector 12 includes a receiving module, a signal processing module and an analysis module. The receiving module is used to receive the optical signal generated after passing through the sample to be tested, the signal processing module is used to convert the optical signal into an electrical signal, and the analysis module is used to analyze and process the electrical signal to obtain the spectral information of the sample to be tested.

[0038] On the other hand, please see the attached Figure 2 As shown, an embodiment of the present invention provides a control method for a spectral analysis device. Based on the spectral analysis device of any one of the above embodiments, the control method includes the following steps: S1, receiving the incoming signal; S2, turn on the flow controller 22, the heater 23 and the temperature probe 25; S3, open the air chamber door 24; S4, determining whether the flow rate and temperature of the gas in the measuring chamber 2 are stable, if so, executing step S5, if not, continuing to adjust; S5, turning on the light source 11 and the detector 12; S6, determine whether the analysis process is completed, if so, execute step S7, if not, continue the analysis; S7, closing the air chamber door 24; S8, turn off the flow controller 22, the heater 23 and the temperature measuring probe 25.

[0039] The control method is based on the spectrum analysis device of any one of the above embodiments, and therefore has the technical effects corresponding to the spectrum analysis device embodiments, which will not be described in detail herein. In addition, the control method improves the automation level of spectrum analysis.

[0040] Specifically, step S1 includes: the system receives the sample information of the sample to be tested through the sensor or interface device. Specifically, step S2 includes: turning on the flow controller 22 to adjust the flow of the gas entering the measuring chamber 2, and turning on the heater 23 and the temperature probe 25 to adjust the temperature of the gas entering the measuring chamber 2. Specifically, step S3 includes: opening the chamber door 24 to ensure that the gas in the measuring chamber 2 can provide the required adjustable atmosphere conditions for the sample to be tested.

[0041] In some optional embodiments, step S4 specifically includes: The flow rate of the gas in the gas chamber 2 is monitored in real time, and the flow rate is compared with the preset flow rate stability threshold range. If the monitored flow rate fluctuates within the preset flow rate stability threshold range, it is determined to be stable; if the monitored flow rate exceeds the preset flow rate stability threshold range, it is determined to be unstable; The temperature of the gas in the gas chamber 2 is monitored in real time and compared with a preset temperature stability threshold. If the monitored temperature fluctuates within the temperature stability threshold, it is determined to be stable. If the monitored temperature exceeds the preset temperature stability threshold, it is determined to be unstable. If both the flow rate and the temperature of the gas in the measuring chamber 2 are determined to be stable, step S5 is executed. If at least one of the flow rate and the temperature of the gas in the measuring chamber 2 is determined to be unstable, the opening of the flow controller 22 and / or the power of the heater 23 are continuously and automatically adjusted until both the flow rate and the temperature of the gas in the measuring chamber 2 reach a stable state.

[0042] By implementing the above steps, the gas flow and temperature in the measuring chamber 2 can be accurately controlled, the overall performance of the spectral analysis device can be improved, the impact of changes in ambient temperature and humidity on the analysis results can be effectively reduced, and the analysis results can be ensured to be more accurate and reliable.

[0043] It should be further explained that step S5 specifically includes: turning on the light source 11 and the detector 12; after the flow rate and temperature of the gas in the measuring chamber 2 are stable, the system will turn on the light source 11 to emit light of a specific wavelength to illuminate the sample to be tested, and at the same time turn on the detector 12 to receive and analyze the light signal generated after passing through the sample to be tested, so as to obtain the spectral information of the sample to be tested.

[0044] In some optional embodiments, step S6 specifically includes: judging whether the analysis is completed according to preset analysis conditions or time parameters; if it is confirmed that the analysis is completed, executing step S7; if the analysis is not completed, continuing the analysis.

[0045] Step S7 is specifically as follows: after confirming that the analysis is completed, the system will automatically close the air chamber door 24 to prevent the external environment from affecting the measurement air chamber 2 and the optical window 3. Step S8 is specifically as follows: after the air chamber door 24 is closed, the system will turn off the flow controller 22, the heater 23 and the temperature probe 25 in sequence, ending the entire analysis process, ensuring that the device is in a low energy consumption state when not in use, and preparing for the next analysis.

[0046] The above description of the disclosed embodiments enables one skilled in the art to implement or use the present invention. Various modifications to these embodiments will be apparent to one skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to the embodiments shown herein, but rather to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A spectrum analysis device, characterized in that: include: A spectral analysis chamber, wherein a light source and a detector are arranged inside, wherein the light source is used to emit a light signal to illuminate the sample to be tested, and the detector is used to receive and analyze the light signal generated after passing through the sample to be tested, so as to obtain the spectral information of the sample to be tested; A measuring gas chamber is arranged adjacent to the spectral analysis chamber, and is used to provide the required adjustable atmosphere conditions for the sample to be tested, and an optical window for light signals to pass through is arranged between the measuring gas chamber and the spectral analysis chamber; The sample loading device is used to place the sample to be tested.

2. The spectrum analysis device according to claim 1, characterized in that: The sample loading device is arranged outside the measuring gas chamber; The measuring air chamber comprises an air inlet end and an air outlet end, wherein the air inlet end is communicated with an external air source, and the air outlet end is arranged corresponding to the sample to be measured so as to provide the sample to be measured with required adjustable atmosphere conditions.

3. The spectrum analysis device according to claim 2, characterized in that: The air inlet end is provided with an air inlet pipe, and the air inlet pipe is provided with a flow controller to adjust the flow of the gas entering the measuring air chamber.

4. The spectrum analysis device according to claim 3, characterized in that: A heater is also provided on the air inlet pipe, and a temperature measuring probe is provided in the measuring air chamber. The heater and the temperature measuring probe work together to adjust the temperature of the gas entering the measuring air chamber.

5. The spectrum analysis device according to claim 2, characterized in that: The external gas source is selected from one of the following: helium, nitrogen or compressed air; And / or, the air outlet end is provided with an air chamber door, and the air chamber door has an open state and a closed state.

6. The spectrum analysis device according to claim 1, characterized in that: The spectrum analysis chamber is a closed box; When the light source is a near-infrared light source, the material of the optical window is quartz material; or, when the light source is an X-ray, the material of the optical window is polyester film.

7. The spectrum analysis device according to claim 1, characterized in that: The detector includes a receiving module, a signal processing module and an analysis module. The receiving module is used to receive the optical signal generated after passing through the sample to be tested, the signal processing module is used to convert the optical signal into an electrical signal, and the analysis module is used to analyze and process the electrical signal to obtain the spectral information of the sample to be tested.

8. A control method for a spectral analysis device, characterized in that: Based on the spectral analysis device according to any one of claims 1 to 7, the control method comprises the following steps: S1, receiving the incoming signal; S2, turn on the flow controller, heater and temperature probe; S3, open the air chamber door; S4, determining whether the flow rate and temperature of the gas in the measuring chamber are stable, if so, executing step S5, if not, continuing to adjust; S5, turn on the light source and detector; S6, determine whether the analysis process is completed, if so, execute step S7, if not, continue the analysis; S7, close the air chamber door; S8. Turn off the flow controller, heater and temperature probe.

9. The control method of the spectrum analysis device according to claim 8, characterized in that: Step S4 specifically includes: The flow rate of the gas in the gas chamber is monitored in real time and compared with the preset flow stability threshold range. If the monitored flow rate fluctuates within the preset flow stability threshold range, it is determined to be stable; if the monitored flow rate exceeds the preset flow stability threshold range, it is determined to be unstable; The temperature of the gas in the gas chamber is monitored in real time and compared with the preset temperature stability threshold range. If the monitored temperature fluctuates within the preset temperature stability threshold range, it is determined to be stable; if the monitored temperature exceeds the preset temperature stability threshold range, it is determined to be unstable; If both the flow rate and the temperature of the gas in the measuring chamber are determined to be stable, step S5 is executed. If at least one of the flow rate and the temperature of the gas in the measuring chamber is determined to be unstable, the opening of the flow controller and / or the power of the heater are continuously and automatically adjusted until both the flow rate and the temperature of the gas in the measuring chamber reach a stable state.

10. The control method of the spectrum analysis device according to claim 8, characterized in that: Step S6 specifically includes: Whether the analysis is completed is determined according to the preset analysis conditions or time parameters. If the analysis is confirmed to be completed, step S7 is executed. If the analysis is not completed, the analysis is continued.

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