Automatic test method for high and low temperature experiment of multi-serial port card

Abstract

The invention discloses an automatic test method for high and low temperature experiments of a multi-serial-port card, which relates to the technical field of PC (Personal Computer) equipment testing and comprises the following steps of: setting a test data packet, performing transmission test on the multi-serial-port card, and outputting a performance transmission rate and a delay judgment threshold value; acquiring target test parameters of the multi-serial-port card, and performing automatic high and low temperature test on the multi-serial-port card; performing a transmission test on the multi-serial port card after the automatic high and low temperature test, analyzing a transmission test result, and outputting test judgment information; the method is used for solving the problems that in the prior art, due to the lack of a high and low temperature detection method capable of automatically carrying out multiple times of high and low temperature tests on the multi-serial-port cards, when batch tests are carried out on the multi-serial-port cards, an incubator needs to be frequently opened for testing, the operation steps are tedious, and the test efficiency is low.

Description

Technical Field

[0001] The invention relates to the technical field of PC equipment testing, in particular to an automatic high and low temperature experiment testing method for a multi-serial port card. Background Art

[0002] In the design of embedded computer systems, serial port communication is an important bus for interconnecting the motherboard and peripheral devices. In computer systems, it is often necessary to mount many low-speed serial port devices. Therefore, multi-serial port cards become a bridge module to meet the needs of a large number of serial port peripherals. Multi-serial port cards usually have a large number of serial ports, often 10 or 20 or even more.

[0003] The existing improvement for high and low temperature testing of multi-serial port cards is usually to optimize the high and low temperature testing device so that the high and low temperature control is more accurate and the environmental pollution is less. For example, in the Chinese patent with the invention publication number CN113533935A, a high and low temperature testing device for PCB board is disclosed. This scheme is to build a high and low temperature testing device and optimize the PCB board and the high and low temperature testing device, so as to monitor the temperature of the PCB board more accurately and comprehensively. In the equipment testing process, the batch testing of the multi-serial port cards is very cumbersome, especially in the high and low temperature experiment, frequently opening the temperature box for testing will greatly prolong the testing time. There is a lack of a high and low temperature detection method that can automatically perform multiple high and low temperature tests on the multi-serial port cards. In view of this, it is necessary to improve the existing high and low temperature testing of the multi-serial port cards. Summary of the invention

[0004] The present invention aims to solve one of the technical problems in the prior art to at least a certain extent. By improving the high and low temperature test, the present invention is used to solve the problem in the prior art that there is a lack of a high and low temperature detection method that can automatically perform multiple high and low temperature tests on a multi-serial port card, resulting in the need to frequently open a temperature box for testing when batch testing the multi-serial port cards, making the operation steps cumbersome and the test efficiency low.

[0005] To achieve the above objectives, in a first aspect, the present application provides a high and low temperature experiment automatic testing method for a multi-serial port card, comprising the following steps:

[0006] Set a test data packet, use the test data packet to perform transmission test on the multi-serial port card, calculate the transmission test results, and output the performance transmission rate and delay judgment threshold based on the calculation results;

[0007] Obtain target test parameters of the multi-serial port card, and perform automatic high and low temperature tests on the multi-serial port card based on the target test parameters;

[0008] Perform transmission test on the multi-serial port card after automatic high and low temperature test, analyze the transmission test results based on the delayed communication threshold, and output performance detection signal or communication fault information based on the analysis results;

[0009] The transmission test results are analyzed based on the performance detection signal and the performance transmission rate, and the test judgment information is output based on the analysis results.

[0010] Further, the multi-serial port card includes a multi-channel serial port communication circuit and a relay element, the multi-channel serial port communication circuit includes a first serial port communication circuit, a second serial port communication circuit, and an nth serial port communication circuit, wherein n is a positive integer; the multi-channel serial port communication circuit can receive and send data packets;

[0011] The relay element can control the power supply of the multi-serial port card.

[0012] Further, setting a test data packet and using the test data packet to perform a transmission test on the multi-serial port card includes:

[0013] Install the multi-serial port card into the high and low temperature test device, set the data size to a data packet of the first size, and mark it as a test data packet;

[0014] A transmission test process is performed at room temperature, the transmission test process comprising:

[0015] The relay element is used to control the power supply to the multi-serial port card, and a test data packet is sent to the first serial port communication circuit and the timing is started; when the multi-serial port card completely receives the test data packet, a completion signal is output and the test data packet is sent outward;

[0016] When the completion signal is received, the timing is stopped, the timing reading is marked as the first receiving time, and outputted; then the timing is started again, and the test data packet sent by the multi-serial port card is received;

[0017] When the test data packet sent by the multi-serial port card is completely received, the timing is stopped, and the timing reading is marked as the first sending time and output;

[0018] Perform transmission test processing at room temperature on other serial port communication circuits, which is different from the transmission test processing of the first serial port communication circuit. The second serial port communication circuit outputs a second receiving time and a second sending time, and so on, until n serial port communication circuits all perform a transmission test processing, and the control relay element stops powering the multi-serial port card.

[0019] Further, the performance transmission rate includes a performance receiving rate and a performance sending rate, and the delay judgment threshold includes a receiving judgment threshold and a sending judgment threshold; calculating the transmission test result, and outputting the performance transmission rate and the delay judgment threshold based on the calculation result includes:

[0020] Calculate the average value and standard deviation from the first receiving time to the nth receiving time, marked as the receiving mean and the receiving standard deviation respectively;

[0021] Calculate the sum of the received mean and the received standard deviation, and mark it as the performance received rate;

[0022] Calculate the average value and standard deviation from the first sending time to the nth sending time, and mark them as the sending mean and the sending standard deviation respectively;

[0023] Calculate the sum of the sending mean and the sending standard deviation, and mark it as the performance sending rate;

[0024] The maximum receiving time is marked as the receiving judgment threshold; the maximum sending time is marked as the sending judgment threshold;

[0025] Output performance transmission rate and delay judgment threshold.

[0026] Furthermore, the target test parameters include a target test temperature, a target test number, and a high and low temperature duration. Obtaining the target test parameters of the multi-serial port card and automatically performing a high and low temperature test on the multi-serial port card based on the target test parameters includes:

[0027] Obtain target test parameters of the multi-serial port card, wherein the target test temperature includes a target high temperature and a target low temperature; and the high and low temperature duration includes a high temperature duration and a low temperature duration;

[0028] Performing a high and low temperature test process on the multi-serial port card, the high and low temperature test process comprising:

[0029] The temperature of the high and low temperature test device is set to the target high temperature, and the high and low temperature test device is controlled to start heating up. When the temperature in the high and low temperature test device reaches the target high temperature, the timing is started, and the timing reading is monitored. When the timing reading is equal to the high temperature duration, the temperature of the high and low temperature test device is set to the target low temperature;

[0030] The high and low temperature test device is controlled to start cooling down. When the temperature inside the high and low temperature test device reaches the target low temperature, the timing is started and the timing reading is monitored. When the timing reading is equal to the low temperature duration, the high and low temperature test device is controlled to restore to room temperature and the target test number is updated to the target test number minus one.

[0031] Further, obtaining target test parameters of the multi-serial port card, and automatically performing high and low temperature tests on the multi-serial port card based on the target test parameters further includes:

[0032] The number of times of execution is judged, and the number of times of execution judged includes:

[0033] Compare the target test times with 0. If the target test temperature is greater than 0, perform the high and low temperature test process and the times determination process again.

[0034] If the target test number is equal to 0, a communication test signal is output.

[0035] Further, a transmission test is performed on the multi-serial port card after the automatic high and low temperature test, and the transmission test result is analyzed based on the delayed communication threshold. The performance detection signal or communication fault information is output based on the analysis result, including:

[0036] When receiving the communication test signal, a transmission test process is performed on the multi-serial port card. Different from the transmission test process at normal temperature, the first serial port communication circuit outputs a first connection test time and a first transmission test time after performing the transmission test process; the second serial port communication circuit outputs a second connection test time and a second transmission test time after performing the transmission test process, and so on.

[0037] Compare each connection test time with the receiving judgment threshold. If the connection test time is greater than the receiving judgment threshold, mark the serial communication circuit corresponding to the connection test time as a fault circuit; if the connection test time is less than or equal to the receiving judgment threshold, no processing is performed;

[0038] Compare each test time with the sending judgment threshold. If the test time is greater than the sending judgment threshold, mark the serial communication circuit corresponding to the test time as a fault circuit; if the test time is less than or equal to the sending judgment threshold, no processing is performed.

[0039] The serial communication circuit of the multi-serial port card is judged, and if there is no fault circuit in the multi-serial port card, a performance detection signal is output; if there is a fault circuit, a communication fault signal and the fault circuit are output.

[0040] Further, the test judgment information includes good test information and bad test information, and the transmission test result is analyzed based on the performance detection signal and the performance transmission rate, and the test judgment information output based on the analysis result includes:

[0041] When receiving the performance detection signal, compare each connection test time with the performance receiving rate. If the connection test time is less than or equal to the performance receiving rate, mark the corresponding serial communication circuit as a smooth circuit; if the connection test time is greater than the performance receiving rate, no processing is performed;

[0042] Compare each test time with the performance sending rate. If the test time is less than or equal to the performance sending rate, mark the corresponding serial communication circuit as a smooth circuit; if the test time is greater than the performance sending rate, no processing is performed.

[0043] Calculate the ratio of the sum of the unblocked circuits to the total number of circuits in the multi-serial port card, and mark it as the unblocked ratio;

[0044] If the patency ratio is greater than or equal to the patency threshold, good test information is output; if the patency ratio is less than the patency threshold, bad test information is output.

[0045] The beneficial effects of the present invention are as follows: the present invention can perform a single high and low temperature test on the multi-serial port card by acquiring the target test parameters of the multi-serial port card and setting the target temperature of the high and low temperature test device; and update the target test times, and judge whether it is necessary to continue the high and low temperature test based on the target test times; this method can realize the free setting of high and low temperature duration and automatic test times, realize automatic testing of the multi-channel serial port card device to be tested in high and low temperature environments, can greatly improve the test efficiency of the multi-serial port card, save test time, reduce frequent manual testing in high and low temperature environments, and improve the intelligence of high and low temperature testing.

[0046] The present invention also sets a test data packet and performs a transmission test on the multi-serial port card before the test to obtain a performance transmission rate and a delay judgment threshold for reference; then performs a transmission test on the multi-serial port card after the high and low temperature test, analyzes the transmission test result based on the performance transmission rate and the delay judgment threshold, and outputs the test result; this method can more accurately judge the impact of the high and low temperature test on the performance of the multi-serial port card by comparing the transmission rate change of the same multi-serial port card before and after the test, thereby outputting more accurate test results, and improving the accuracy of detection after the high and low temperature test. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] Figure 1 is a flow chart of the steps of the method of the present invention;

[0048] Figure 2 Flow chart of the testing process of the present invention. DETAILED DESCRIPTION

[0049] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0050] Example 1, please refer to Figure 1 as well as Figure 2 As shown, the present application provides a high and low temperature experiment automatic testing method for a multi-serial port card, comprising the following steps:

[0051] Step S1, setting a test data packet, using the test data packet to perform a transmission test on the multi-serial port card, calculating the transmission test result, and outputting a performance transmission rate and a delay judgment threshold based on the calculation result;

[0052] The multi-serial port card includes a multi-channel serial port communication circuit and a relay element, wherein the multi-channel serial port communication circuit includes a first serial port communication circuit, a second serial port communication circuit, and an nth serial port communication circuit, wherein n is a positive integer; the multi-channel serial port communication circuit can receive and send data packets; the relay element can control the power supply of the multi-serial port card;

[0053] Step S1 also includes the following sub-steps:

[0054] Step S101, installing the multi-serial port card into a high and low temperature testing device, setting the data size to a data packet of a first size, and marking it as a test data packet;

[0055] In specific implementation, the first size needs to be determined by comprehensively considering the transmission rates of the local area network and the multi-serial port card. If it is set too small, the transmission will be completed in a short time, and it will be difficult to analyze the results before and after the test through calculation; and a data packet that is too large will require a long time to transmit, which will lead to low test efficiency. A feasible implementation method is: if the transmission rate of the local area network is lower than the receiving rate of the multi-serial port card, the first size is set to 10 times the maximum transmission rate of the local area network; if the receiving rate of the multi-serial port card is lower than or equal to the transmission rate of the local area network, the first size is set to 10 times the receiving rate of the multi-serial port card; so that each time a test data packet is sent, the multi-serial port card takes at least 10 seconds to complete the reception;

[0056] Step S102, performing a transmission test process at room temperature;

[0057] Step S102 also includes the following sub-steps:

[0058] Step S1021, using a relay element to control the supply of power to the multi-serial port card, sending a test data packet to the first serial port communication circuit and starting timing; when the multi-serial port card completely receives the test data packet, it outputs a completion signal and sends the test data packet outward;

[0059] Step S1022, when the completion signal is received, stop timing, mark the timing reading as the first receiving time, and output it; then start timing again, and receive the test data packet sent by the multi-serial port card;

[0060] Step S1023, when the test data packet sent by the multi-serial port card is completely received, the timing is stopped, and the timing reading is marked as the first sending time, and outputted;

[0061] Step S1024, performing transmission test processing at room temperature on other serial port communication circuits, which is different from the transmission test processing of the first serial port communication circuit, the second serial port communication circuit outputs a second receiving time and a second sending time, and so on, until n serial port communication circuits all perform a transmission test processing, and the relay element is controlled to stop supplying power to the multi-serial port card;

[0062] Step S103, calculating the average value and standard deviation from the first receiving time to the nth receiving time, which are marked as the receiving mean value and the receiving standard deviation respectively;

[0063] Step S104, calculating the sum of the received mean and the received standard deviation, and marking it as obtaining the performance receiving rate;

[0064] Step S105, calculating the average value and standard deviation from the first sending time to the nth sending time, which are marked as the sending mean value and the sending standard deviation respectively;

[0065] Step S106, calculating the sum of the sending mean and the sending standard deviation, and marking it as the performance sending rate;

[0066] Step S107, marking the maximum receiving time as the receiving judgment threshold; marking the maximum sending time as the sending judgment threshold;

[0067] It should be noted that the delay judgment threshold is the limit value for judging whether the communication is abnormal, and the performance transmission rate is the judgment value for judging whether the communication is normal; by subsequently comparing the delay judgment threshold in priority, it is possible to find out in advance whether the communication circuit of the multi-serial port card has a fault circuit and timely standardize it; if no fault circuit is found, the relationship between the communication circuit data transmission speed and the performance transmission rate is further compared to judge whether the performance of the multi-serial port card is affected;

[0068] Step S108: output the performance transmission rate and the delay judgment threshold.

[0069] Step S2, obtaining target test parameters of the multi-serial port card, and performing automatic high and low temperature tests on the multi-serial port card based on the target test parameters; Step S2 also includes the following sub-steps:

[0070] Step S201, obtaining target test parameters of the multi-serial port card, the target test temperature includes a target high temperature and a target low temperature; the high and low temperature duration includes a high temperature duration and a low temperature duration;

[0071] It should be noted that the target test parameters are specific values ​​set manually before the test;

[0072] Step S202, performing high and low temperature test processing on the multi-serial port card; Step S202 also includes the following sub-steps:

[0073] Step S2021, setting the temperature of the high and low temperature test device to the target high temperature, controlling the high and low temperature test device to start heating, and when the temperature in the high and low temperature test device reaches the target high temperature, starting timing, and monitoring the timing reading, when the timing reading is equal to the high temperature duration, setting the temperature of the high and low temperature test device to the target low temperature;

[0074] Step S2022, controlling the high and low temperature test device to start cooling down, when the temperature in the high and low temperature test device reaches the target low temperature, starting timing, and monitoring the timing reading, when the timing reading is equal to the low temperature duration, controlling the high and low temperature test device to restore to room temperature, and updating the target test number to the target test number minus one;

[0075] Step S203, execution times determination process: Step S203 also includes the following sub-steps:

[0076] Step S2031, comparing the target test times with 0, if the target test temperature is greater than 0, executing steps S202 and S203 again;

[0077] Step S2032: if the target test number is equal to 0, output a communication test signal.

[0078] Step S3, performing a transmission test on the multi-serial port card after the automatic high and low temperature test, analyzing the transmission test result based on the delayed communication threshold, and outputting a performance detection signal or communication fault information based on the analysis result; Step S3 also includes the following sub-steps:

[0079] Step S301, when receiving a communication test signal, performing a transmission test process on the multi-serial port card, which is different from the transmission test process at normal temperature. After the first serial port communication circuit performs the transmission test process, it outputs a first connection test time and a first transmission test time; after the second serial port communication circuit performs the transmission test process, it outputs a second connection test time and a second transmission test time, and so on.

[0080] Step S302, comparing each connection test time with the receiving judgment threshold, if the connection test time is greater than the receiving judgment threshold, marking the serial communication circuit corresponding to the connection test time as a fault circuit; if the connection test time is less than or equal to the receiving judgment threshold, no processing is performed;

[0081] Step S303, comparing each test time with the sending judgment threshold, if the test time is greater than the sending judgment threshold, marking the serial communication circuit corresponding to the test time as a fault circuit; if the test time is less than or equal to the sending judgment threshold, no processing is performed;

[0082] Step S304, judging the serial communication circuit of the multi-serial port card, if there is no faulty circuit in the multi-serial port card, outputting a performance detection signal; if there is a faulty circuit, outputting a communication fault signal and the faulty circuit;

[0083] It should be noted that, since the comparison is based on the transmission rate of the multi-serial port card before and after the high and low temperature test, the transmission rate of the LAN and the hardware parameters of the multi-serial port card have not changed. Under this premise, if the sending test time is greater than the sending judgment threshold or the receiving test time is greater than the receiving judgment threshold, it can directly indicate that after multiple high and low temperature tests, the serial port communication circuit of the multi-serial port card is damaged. At this time, the corresponding serial port communication circuit is marked as a fault circuit, and a communication fault signal is output, indicating that hardware optimization is needed.

[0084] Step S4, analyzing the transmission test results based on the performance detection signal and the performance transmission rate, and outputting test judgment information based on the analysis results; Step S4 also includes the following sub-steps:

[0085] Step S401, when a performance detection signal is received, each connection test time is compared with the performance receiving rate. If the connection test time is less than or equal to the performance receiving rate, the corresponding serial port communication circuit is marked as a smooth circuit; if the connection test time is greater than the performance receiving rate, no processing is performed;

[0086] Step S402, compare each test time with the performance transmission rate. If the test time is less than or equal to the performance transmission rate, mark the corresponding serial communication circuit as a smooth circuit; if the test time is greater than the performance transmission rate, no processing is performed;

[0087] Step S403, calculating the ratio of the sum of the unblocked circuits to the total number of circuits in the multi-serial port card, which is marked as the unblocked ratio;

[0088] Step S404, if the patency ratio is greater than or equal to the patency threshold, output good test information; if the patency ratio is less than the patency threshold, output bad test information;

[0089] In specific implementation, the threshold is usually set to 0.5; when there is no faulty circuit after the multi-serial port card has undergone multiple high and low temperature tests, and the transmission rate of more than half of the serial port communication circuits is normal, it can be said that the multi-serial port card has passed the high and low temperature test; the test good information is output; on the contrary, if after the multi-serial port card has undergone multiple high and low temperature tests, the transmission rate of more than half of the serial port communication circuits is lower than the performance transmission rate before the test, it means that the high and low temperature test has a small impact on the multi-serial port card, and the test bad information is output at this time.

[0090] Through the description of the above implementation methods, the embodiments of the present invention can be provided as methods, systems or computer program products. Based on such an understanding, the above technical solutions can be essentially or partly contributed to the prior art in the form of software products, which can be stored in a computer-readable storage medium, such as ROM / RAM, a magnetic disk, an optical disk, etc., and include several instructions for enabling a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or some parts of the embodiments.

[0091] In the embodiments provided in the present application, it should be understood that the disclosed system or method can be implemented in other ways. The embodiments described above are merely schematic. For example, the division of modules or units is only a logical function division. There may be other division methods in actual implementation. For example, multiple modules or units can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, and the indirect coupling or communication connection of systems, modules and units can be electrical, mechanical or other forms.

[0092] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit it. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A high and low temperature test automatic test method for a multi-serial port card, characterized in that: The steps include: Set a test data packet, use the test data packet to perform transmission test on the multi-serial port card, calculate the transmission test results, and output the performance transmission rate and delay judgment threshold based on the calculation results; Obtain target test parameters of the multi-serial port card, and perform automatic high and low temperature tests on the multi-serial port card based on the target test parameters; Perform transmission test on the multi-serial port card after automatic high and low temperature test, analyze the transmission test results based on the delayed communication threshold, and output performance detection signal or communication fault information based on the analysis results; The transmission test results are analyzed based on the performance detection signal and the performance transmission rate, and the test judgment information is output based on the analysis results.

2. The high and low temperature automatic testing method of a multi-serial port card according to claim 1, characterized in that: The multi-serial port card includes a multi-channel serial port communication circuit and a relay element, wherein the multi-channel serial port communication circuit includes a first serial port communication circuit, a second serial port communication circuit, and an nth serial port communication circuit, wherein n is a positive integer; The multi-channel serial communication circuit can receive and send data packets; The relay element can control the power supply of the multi-serial port card.

3. The high and low temperature automatic testing method of a multi-serial port card according to claim 2 is characterized in that: Set the test data packet and use the test data packet to perform transmission test on the multi-port card, including: Install the multi-serial port card into the high and low temperature test device, set the data size to a data packet of the first size, and mark it as a test data packet; A transmission test process is performed at room temperature, the transmission test process comprising: The relay element is used to control the power supply to the multi-serial port card, and a test data packet is sent to the first serial port communication circuit and the timing is started; when the multi-serial port card completely receives the test data packet, a completion signal is output and the test data packet is sent outward; When the completion signal is received, the timing is stopped, the timing reading is marked as the first receiving time, and outputted; then the timing is started again, and the test data packet sent by the multi-serial port card is received; When the test data packet sent by the multi-serial port card is completely received, the timing is stopped, and the timing reading is marked as the first sending time and output; Perform transmission test processing at room temperature on other serial port communication circuits, which is different from the transmission test processing of the first serial port communication circuit. The second serial port communication circuit outputs a second receiving time and a second sending time, and so on, until n serial port communication circuits all perform a transmission test processing, and the control relay element stops powering the multi-serial port card.

4. The high and low temperature automatic testing method of a multi-serial port card according to claim 3 is characterized in that: The performance transmission rate includes a performance receiving rate and a performance sending rate, and the delay judgment threshold includes a receiving judgment threshold and a sending judgment threshold; The transmission test results are calculated, and the performance transmission rate and delay judgment thresholds are output based on the calculation results, including: Calculate the average value and standard deviation from the first receiving time to the nth receiving time, marked as the receiving mean and the receiving standard deviation respectively; Calculate the sum of the received mean and the received standard deviation, and mark it as the performance received rate; Calculate the average value and standard deviation from the first sending time to the nth sending time, and mark them as the sending mean and the sending standard deviation respectively; Calculate the sum of the sending mean and the sending standard deviation, and mark it as the performance sending rate; The maximum receiving time is marked as the receiving judgment threshold; the maximum sending time is marked as the sending judgment threshold; Output performance transmission rate and delay judgment threshold.

5. The high and low temperature automatic testing method of a multi-serial port card according to claim 4 is characterized in that: The target test parameters include target test temperature, target test times, and high and low temperature durations. Obtaining the target test parameters of the multi-serial port card and automatically performing high and low temperature tests on the multi-serial port card based on the target test parameters includes: Obtain target test parameters of the multi-serial port card, wherein the target test temperature includes a target high temperature and a target low temperature; and the high and low temperature duration includes a high temperature duration and a low temperature duration; Performing a high and low temperature test process on the multi-serial port card, the high and low temperature test process comprising: The temperature of the high and low temperature test device is set to the target high temperature, and the high and low temperature test device is controlled to start heating up. When the temperature in the high and low temperature test device reaches the target high temperature, the timing is started, and the timing reading is monitored. When the timing reading is equal to the high temperature duration, the temperature of the high and low temperature test device is set to the target low temperature; The high and low temperature test device is controlled to start cooling down. When the temperature inside the high and low temperature test device reaches the target low temperature, the timing is started and the timing reading is monitored. When the timing reading is equal to the low temperature duration, the high and low temperature test device is controlled to restore to room temperature and the target test number is updated to the target test number minus one.

6. The high and low temperature automatic testing method of a multi-serial port card according to claim 5, characterized in that: Obtaining target test parameters of the multi-serial port card, and automatically performing high and low temperature tests on the multi-serial port card based on the target test parameters also includes: The number of times of execution is judged, and the number of times of execution judged includes: Compare the target test times with 0. If the target test temperature is greater than 0, perform the high and low temperature test process and the times determination process again. If the target test number is equal to 0, a communication test signal is output.

7. The high and low temperature automatic testing method of a multi-serial port card according to claim 6, characterized in that: Perform transmission test on the multi-serial port card after automatic high and low temperature test, analyze the transmission test results based on the delayed communication threshold, and output performance detection signal or communication fault information based on the analysis results, including: When receiving the communication test signal, a transmission test process is performed on the multi-serial port card. Different from the transmission test process at normal temperature, the first serial port communication circuit outputs a first connection test time and a first transmission test time after performing the transmission test process; the second serial port communication circuit outputs a second connection test time and a second transmission test time after performing the transmission test process, and so on. Compare each connection test time with the receiving judgment threshold. If the connection test time is greater than the receiving judgment threshold, mark the serial communication circuit corresponding to the connection test time as a fault circuit; if the connection test time is less than or equal to the receiving judgment threshold, no processing is performed; Compare each test time with the sending judgment threshold. If the test time is greater than the sending judgment threshold, mark the serial communication circuit corresponding to the test time as a fault circuit; if the test time is less than or equal to the sending judgment threshold, no processing is performed. The serial communication circuit of the multi-serial port card is judged, and if there is no fault circuit in the multi-serial port card, a performance detection signal is output; if there is a fault circuit, a communication fault signal and the fault circuit are output.

8. The high and low temperature automatic testing method of a multi-serial port card according to claim 7, characterized in that: The test judgment information includes good test information and bad test information. The transmission test result is analyzed based on the performance detection signal and the performance transmission rate. The test judgment information output based on the analysis result includes: When receiving the performance detection signal, compare each connection test time with the performance receiving rate. If the connection test time is less than or equal to the performance receiving rate, mark the corresponding serial communication circuit as a smooth circuit; if the connection test time is greater than the performance receiving rate, no processing is performed; Compare each test time with the performance sending rate. If the test time is less than or equal to the performance sending rate, mark the corresponding serial communication circuit as a smooth circuit; if the test time is greater than the performance sending rate, no processing is performed. Calculate the ratio of the sum of the unblocked circuits to the total number of circuits in the multi-serial port card, and mark it as the unblocked ratio; If the patency ratio is greater than or equal to the patency threshold, good test information is output; if the patency ratio is less than the patency threshold, bad test information is output.

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