Test method and device, chip and storage medium

Abstract

The invention relates to the field of image processing, and provides a test method and device, a chip and a storage medium, and the method comprises the steps: obtaining first image data with at least one column of sub-pixels as a test column; wherein the brightness of the sub-pixels in the test column is different from the brightness of the sub-pixels in the non-test column; obtaining a target vertical resolution; generating second image data with the same target vertical resolution according to the first image data; wherein the number and the column number of the test columns in the second image data are the same as those of the first image data; and outputting the second image data to a display screen for displaying. According to the method, the first image data can be directly received, the second image data is generated and displayed on the display screen, a test chart and an external test box do not need to be manually generated to test the display screen, and the test time and the test cost are saved.

Description

Technical Field

[0001] The present invention relates to the field of image processing, and in particular to a testing method, a device, a chip and a storage medium. Background Art

[0002] When the types of the display driver chip (DDIC) and the display screen are different, the display driver chip cannot control the display screen. In this case, a test pattern needs to be output to the display screen to derive a rearrangement rule of sub-pixels of the display screen.

[0003] However, in the prior art, it is necessary to draw a test pattern manually and connect an external test box to output the test pattern for testing, which is cumbersome and time-consuming. Summary of the invention

[0004] In view of the deficiencies in the prior art, the present application provides a testing method, device, chip and storage medium, which are conducive to directly outputting a test chart to a display screen for display without an external test box, so as to derive rearrangement rules.

[0005] To solve the above problems, the present invention provides the following technical solutions:

[0006] In a first aspect, an embodiment of the present application provides a testing method, the method comprising:

[0007] Acquire first image data in which at least one column of sub-pixels is a test column; wherein the brightness of the sub-pixels in the test column is different from the brightness of the sub-pixels in the non-test column;

[0008] Get the target vertical resolution;

[0009] Generate second image data according to the first image data; wherein the vertical resolution of the second image data is the same as the target vertical resolution, and the number of test columns and the number of columns in the second image data are the same as those in the first image data;

[0010] The second image data is output to a display screen for display.

[0011] In some embodiments, the method further comprises:

[0012] Acquire original image data of at least one column of sub-pixels as a test column;

[0013] Determine the size of the target horizontal resolution and the preset resolution;

[0014] When the target horizontal resolution is less than or equal to the preset resolution, writing the original image data into a random access memory;

[0015] When the target horizontal resolution is greater than the preset resolution, extracting image data having a horizontal resolution equal to the preset resolution and including the test column from the original image data, and writing the image data into a random access memory;

[0016] The step of acquiring first image data of at least one column of sub-pixels as a test column comprises:

[0017] The original image data or the image data stored in the random access memory is read.

[0018] In some implementations, outputting the second image data to a display screen for display includes:

[0019] When the target horizontal resolution is less than or equal to the preset resolution, outputting the second image data to a display screen for display;

[0020] When the target horizontal resolution is greater than the preset resolution, adding a non-test column to the second image data to obtain third image data having a horizontal resolution equal to the target horizontal resolution;

[0021] The third image data is output to a display screen for display.

[0022] In some implementations, generating second image data according to the first image data includes:

[0023] The first image data is magnified in the vertical direction by using the image magnification function of the chip to generate second image data.

[0024] In some embodiments, acquiring first image data of at least one column of sub-pixels as a test column includes:

[0025] Acquire the first image data of the Nth column of sub-pixels as the test column; wherein the initial value of N is a positive integer;

[0026] After outputting the second image data to a display screen for display, the method further includes:

[0027] Determine whether N is equal to Nmax. When N is less than Nmax, set N=N+1, and return to the execution step to obtain the first image data with the Nth column of sub-pixels as the test column;

[0028] When N is equal to Nmax, the process ends.

[0029] In some embodiments, the difference between Nmax and the initial value of N plus one is greater than or equal to the number of sub-pixels corresponding to the sub-pixel rearrangement rule of the display screen.

[0030] In a second aspect, an embodiment of the present application provides a testing device, the device comprising:

[0031] A first acquisition unit, acquiring first image data of at least one column of sub-pixels as a test column; wherein the brightness of the sub-pixels in the test column is different from the brightness of the sub-pixels in the non-test column;

[0032] A second acquisition unit acquires a target vertical resolution;

[0033] A generating unit, generating second image data having the same vertical resolution as the target according to the first image data; wherein the number of test columns and the number of columns in the second image data are the same as those in the first image data;

[0034] The display unit is used to output the second image data to a display screen for display.

[0035] In a third aspect, an embodiment of the present application provides a chip, the chip comprising:

[0036] at least one processor; and,

[0037] a memory communicatively connected to the at least one processor; wherein,

[0038] The memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the testing method according to the first aspect.

[0039] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores an executable program, and the executable program is executed by a processor to implement the testing method of the first aspect.

[0040] The present application provides a test method, device, chip and storage medium, the method comprising: obtaining first image data in which at least one column of sub-pixels is a test column; wherein the brightness of the sub-pixels in the test column is different from the brightness of the sub-pixels in the non-test column; obtaining a target vertical resolution; generating second image data with the same target vertical resolution according to the first image data; wherein the number of test columns and the number of columns in the second image data are the same as the first image data; and outputting the second image data to a display screen for display. In the present application, the first image data can be directly received, and the second image data can be generated to be displayed on the display screen, without the need to manually generate a test chart and an external test box to test the display screen, thus saving test time and test costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] Figure 1 It is a schematic diagram of an application scenario provided in an embodiment of the present application.

[0042] Figure 2 It is a flow chart of a testing method provided in an embodiment of the present application.

[0043] Figure 3 It is a schematic diagram of the first image data provided in an embodiment of the present application.

[0044] Figure 4 It is a schematic diagram of the second image data provided in an embodiment of the present application.

[0045] Figure 5 This is a schematic diagram of image data before adding a non-test column provided in an embodiment of the present application.

[0046] Figure 6 It is a schematic diagram of image data after adding non-test columns provided in an embodiment of the present application.

[0047] Figure 7 It is a structural schematic diagram of a testing device provided in an embodiment of the present application.

[0048] Figure 8 It is a schematic diagram of the structure of a chip provided in an embodiment of the present application.

[0049] Fig. 9 It is a structural block diagram of a computer-readable storage medium provided in an embodiment of the present application. DETAILED DESCRIPTION

[0050] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0051] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0052] When the types of the display driver chip (DDIC) and the display screen are different, the display driver chip cannot control the display screen. In this case, a test pattern needs to be output to the display screen to derive a rearrangement rule of sub-pixels of the display screen.

[0053] For example, when controlling an RGBG display screen through an RGB DDIC, because the RGB DDIC is designed for RGB displays and does not have specific control logic or algorithms for RGBG displays, it is necessary to output a test chart and infer the rearrangement rules by manually observing the display effect of the RGBG display screen.

[0054] For example, the data format of the DDIC of the display screen is RGB, and the data format of the screen of the display screen is RGBG. The data displayed by the DDIC on the screen will be mapped according to the rearrangement rule. The rearrangement rule is determined by the source line from the DDIC to the display screen and the mux switch, which will not be elaborated here.

[0055] This means that the image processing chip needs to sort the raw data sent to the DDIC according to the rearrangement rules, and then send it to the DDIC to display the correct image on the screen. The test pattern is to send data with a certain position, observe the position displayed on the screen, and deduce the mapping relationship, that is, the rearrangement rules.

[0056] However, the prior art requires redrawing and routing to produce a through screen and a flexible printed circuit (FPC). The through screen is connected to a test box via the FPC. The test pattern is manually drawn and the external test box outputs the test pattern to the display screen for testing. The test is cumbersome and time-consuming.

[0057] See also Figure 1 , Figure 1 Schematic diagram of the application scenario provided by the embodiment of the present application. Figure 1 As shown, the application scenario 1 includes: a device to be repaired 10 , an FPC 20 , and a display screen 30 .

[0058] In some embodiments, the original display screen in the device 10 to be repaired is removed, and the device 10 to be repaired after the display screen is removed is connected to the FPC 20, specifically to the chip in the FPC 20. The chip is used to execute the test method in the embodiment of the present application. The device 10 to be repaired outputs first image data to the chip in the FPC 20, and the chip processes the first image data and outputs second image data, that is, a test image to the display screen 30 for display.

[0059] Optionally, the chip in the FPC 20 is a scaler chip, that is, an image processing chip.

[0060] Scaler chip is a chip used for video processing, mainly used to adjust the resolution of video signals to adapt to different display devices. Scaler chip can convert high-definition video signals into standard-definition signals, and can also convert standard-definition video signals into high-definition signals. It can also perform operations such as image zooming in, zooming out, and cropping.

[0061] Exemplarily, the display screen 30 includes an RGB DDIC, and the screen of the display screen 30 is an RGBG display screen. When the original display screen of the electronic device is damaged, the user needs to replace the display screen, for example, replace the RGBG screen, which is called a repair screen, and the electronic device with the damaged original display screen is called a device to be repaired. At this time, the original display screen of the electronic device is disassembled, and the electronic device with the original display screen removed and the repair screen are connected through an FPC with a Scaler chip. The test chart is output to the repair screen through the Scaler chip for testing, and the rearrangement rule is manually derived through the display result on the repair screen.

[0062] This eliminates the need to manufacture a direct-through screen and an external test box for testing, saving testing time and testing costs.

[0063] It can be understood that the device to be repaired 10 in the present application is an electronic device, which may be, but is not limited to, various personal computers, laptops, smart phones, tablet computers, Internet of Things devices and portable wearable devices. The Internet of Things devices may be smart speakers, smart TVs, smart air conditioners, smart car-mounted devices, etc., and the portable wearable devices may be smart watches, smart bracelets, head-mounted devices, etc.

[0064] For ease of explanation, the subsequent embodiments of this application will introduce the use of RGB DDIC to control an RGBG display screen, but it can be understood that the present application is not limited to this. When the DDIC and the display screen do not match, the test method provided in this application can be used, such as using RGB DDIC to control an LED display screen.

[0065] When using RGB DDIC to control an RGBG display, it is necessary to derive the sub-pixel rearrangement rule of the RGBG display. The sub-pixel rearrangement rule of the RGBG display is generally a maximum of 24 sub-pixels per group. When the sub-pixel rearrangement rule of the RGBG display is unknown, a 24*2 test image can be generated for safety reasons to prevent the number of sub-pixels corresponding to the sub-pixel rearrangement rule from being greater than 24.

[0066] See also Figure 2 , Figure 2 Schematic diagram of a test method provided in the embodiment of the present application. Figure 2 As shown, the testing method 100 includes: steps 110 to 140 .

[0067] Step 110: Acquire first image data in which at least one column of sub-pixels is a test column; wherein the brightness of the sub-pixels in the test column is different from the brightness of the sub-pixels in the non-test column.

[0068] In some embodiments, the brightness of the sub-pixels in the test column is greater than the brightness of the sub-pixels in the non-test column, thereby facilitating observation.

[0069] Each sub-pixel has a settable pixel value, and the pixel value corresponds to the display brightness of the corresponding sub-pixel on the screen, and the pixel value ranges from 0 to 0xFF. Therefore, the pixel value of the sub-pixel in the test column is set to be greater than the pixel value of the sub-pixel in the non-test column, so that the brightness of the sub-pixel in the test column is set to be greater than the brightness of the sub-pixel in the non-test column. Exemplarily, the pixel value of a certain column of sub-pixels can be preset to 0xFF (brightest), and the pixel value of the sub-pixel in other columns can be preset to 0x80 (dark, easy to observe). The position of the 0xFF sub-pixel can be obtained by observing the brightness of different sub-pixels with an optical microscope.

[0070] Furthermore, the brightness of the sub-pixels in the non-test column should not only be smaller than that in the test column, but also should not be too dark. For example, the pixel value should not be 0x00, i.e. completely black. Otherwise, it will be impossible to observe which row and column the illuminated sub-pixels are located in, which will affect the derivation of the rearrangement rules.

[0071] Optionally, the pixel value range of the sub-pixels in the non-test column is [0x10, 0x90]. Preferably, the pixel value range of the sub-pixels in the non-test column is [0x20, 0x80].

[0072] In some embodiments, when the first image data includes a plurality of test columns, the brightness of each test column is different.

[0073] It is understandable that if the brightness of the test columns is the same, the pixels corresponding to the first test column and the second test column cannot be distinguished when the output image is displayed on the display screen, so the obtained test image cannot be used to derive the sub-pixel rearrangement rule.

[0074] In some embodiments, the first image data does not need to be a prepared test pattern. For example, the vertical resolution of the first image data may be smaller than the vertical resolution required by the DDIC in the display screen, thereby reducing the time required for image data transmission.

[0075] For ease of explanation, in any A*B resolution mentioned in the subsequent parts of the specification, A represents the number of columns and B represents the number of rows.

[0076] Optionally, the vertical resolution of the first image data is 1, that is, the first image data only carries one line of data, for example, the resolution of the first image data is 1080*1.

[0077] Step 120: Obtain the target vertical resolution.

[0078] The target vertical resolution is pre-stored in a memory of a device executing the test method; illustratively, the memory includes a random access memory (RAM), a flash memory, and the like.

[0079] The target vertical resolution is the vertical resolution required by the DDIC in the display screen.

[0080] In some embodiments, the vertical resolution required by the DDIC in the display screen is not equal to the vertical resolution of the screen, because one pixel in an RGB image includes three sub-pixels, and one pixel in an RGBG image includes only two sub-pixels. Therefore, when an RGB DDIC is matched with an RGBG screen, the resolution is inconsistent because the amount of data of one pixel is inconsistent. For example, if the resolution of the RGB image of the DDIC is 800*1600, the resolution displayed on the screen should be 1200*1600, because the number of sub-pixels is equal: 800*3=1200*2.

[0081] However, in other implementations, by means of frame dropping or the like, the vertical resolution of the RGB image of the DDIC displayed on the screen can be made equal to the vertical resolution of the RGB image.

[0082] Step 130: Generate second image data having the same vertical resolution as the target according to the first image data; wherein the number of test columns and the number of columns in the second image data are the same as those in the first image data.

[0083] In some implementations, the vertical resolution required by DDIC is 2400 as an example. Figure 3 and Figure 4 , Figure 3 is a schematic diagram of first image data provided in an embodiment of the present application, Figure 4 is a schematic diagram of the second image data provided by the embodiment of the present application. Figure 3 As shown, the resolution of the first image data is 1080*1, and the test column is the first column. The resolution of the second image data is 1080*2400, and the test column is the first column.

[0084] Among them, the pixel value of the sub-pixel point is 0xFF, which means the sub-pixel brightness value is the maximum, and the pixel value of the sub-pixel point is 0x00, which means the sub-pixel brightness value is the minimum. Figure 3 and Figure 4The pixel value of the sub-pixel in the non-test column is 0x80. The pixel value 0x80 can make the non-test sub-pixel glow slightly so as to clearly observe the row and column number of the sub-pixel in the test column, and the brightness is not too bright to make it difficult to distinguish the sub-pixel in the test column from the sub-pixel in the non-test column.

[0085] Furthermore, three sub-pixels in the first row and the first column to the first row and the third column constitute a pixel point in the RGB image.

[0086] In some embodiments, step 130 includes the following steps.

[0087] The first image data is magnified in the vertical direction by using the image magnification function of the chip to generate second image data.

[0088] Among them, the image magnification function of the chip is not the function of zooming in and out for observation on computers and mobile phones, but is used to convert images from low resolution to high resolution.

[0089] By utilizing the image magnification function of the chip to magnify the first image data in the vertical direction, it is unnecessary to prepare a complete test chart in advance, thereby improving the test efficiency.

[0090] Step 140: Output the second image data to a display screen for display.

[0091] In the present application, the first image data can be directly received and the second image data can be generated and displayed on the display screen. There is no need to manually generate a test chart and an external test box to test the display screen, thus saving test time and test costs.

[0092] In some embodiments, after acquiring the image data, the image data is stored in a RAM, and the image data is read from the RAM through a first-in-first-out data buffer (FIFO). However, the FIFO has a depth limitation. When the horizontal resolution of the image data is too large, the FIFO cannot read the image data at one time, and multiple reads will cause the read image data to be disordered. Based on this, the test method 100 provided in the embodiment of the present application also includes the following steps.

[0093] (1) obtaining original image data of at least one column of sub-pixels as a test column;

[0094] (2) Obtain target horizontal resolution;

[0095] (3) determining the size of the target horizontal resolution and the preset resolution;

[0096] (4) when the target horizontal resolution is less than or equal to the preset resolution, writing the original image data into a random access memory;

[0097] In some embodiments, step (4) includes the following steps.

[0098] (5) When the target horizontal resolution is less than or equal to the preset resolution, the image data in the first row of the original image data is written into a random access memory.

[0099] (6) when the target horizontal resolution is greater than the preset resolution, extracting image data having a horizontal resolution equal to the preset resolution and including the test column from the original image data, and writing the image data into a random access memory;

[0100] In some embodiments, step (6) includes the following steps.

[0101] When the target horizontal resolution is greater than the preset resolution, image data of the first X columns of the first row of the original image data is extracted, and image data of the first X rows of the first row is written into a random access memory; wherein X is a positive integer and X is equal to the depth of a first-in-first-out data buffer.

[0102] Based on the above steps (1) to (6), step 110 includes the following steps.

[0103] (7) Reading the original image data or the image data stored in the random access memory.

[0104] In some implementations, the preset resolution is determined by the depth of the FIFO, for example, the size of the preset resolution is equal to the depth of the FIFO.

[0105] Specifically, FIFO includes the following parameters.

[0106] Width parameter: The width parameter indicates the data width stored in the FIFO, that is, the number of data bits that can be stored in each storage unit.

[0107] Depth parameter: The depth parameter indicates the amount of data that the FIFO can store, that is, the size of the address. The depth parameter determines how much data the FIFO can cache.

[0108] Exemplarily, the depth of the FIFO is 960 and the preset resolution is 960. When the resolution of the first image data is 1080*A, the image data from the 1st column to the 960th column in the first row of the first image data is written into the RAM; wherein A is a positive integer.

[0109] By adopting the above method, it is possible to prevent the problem that the horizontal resolution of the image data stored in the RAM is greater than the depth of the FIFO, resulting in disorder of the read image data.

[0110] In some implementations, based on the above steps (1) to (7), the testing method 100 provided in the embodiment of the present application further includes the following steps.

[0111] (8) When the target horizontal resolution is less than or equal to the preset resolution, output the second image data to a display screen for display.

[0112] (9) When the target horizontal resolution is greater than the preset resolution, a non-test column is added to the second image data to obtain third image data having a horizontal resolution equal to the target horizontal resolution.

[0113] (10) Outputting the third image data to a display screen for display.

[0114] Specifically, when the target horizontal resolution is greater than the preset resolution, the image data stored in the RAM is only a part of the original image data, so it is necessary to add non-test columns to the second image data, which can be understood as a black filling operation.

[0115] Assume that the resolution required by DDIC is 1800*960 and the depth of FIFO is 960. Figure 5 and Figure 6 , Figure 5 is a schematic diagram of image data before adding a non-test column provided in an embodiment of the present application, Figure 6 It is a schematic diagram of image data after adding non-test columns provided in an embodiment of the present application.

[0116] like Figure 5 As shown, the resolution of the second image data before adding the non-test column is 960*960. Figure 6 As shown, the resolution of the third image data after adding the non-test column is 1800*960.

[0117] Further, Figure 5 and Figure 6 The pixel values ​​of the sub-pixels in the non-test columns are all the same, which is 0x80, but the present application is not limited to this. For example, the sub-pixels in the non-test columns are all the same but are 0xAB, etc., or the pixel values ​​of the sub-pixels in the non-test columns are not completely different, for example, the pixel values ​​of some sub-pixels are 0x80, and the pixel values ​​of some sub-pixels are 0XAB. The present application does not impose any restrictions.

[0118] In order to derive the rearrangement rule of the RGBG screen, at least a number of test images equal to the number of sub-pixels corresponding to the rearrangement rule needs to be generated. Therefore, in some embodiments, step 110 includes the following steps.

[0119] (1) Acquire the first image data in which the Nth column of sub-pixels is a test column; wherein the initial value of N is a positive integer.

[0120] Based on step (1), the method further includes the following steps.

[0121] (2) Obtain the target vertical resolution.

[0122] (3) Generating second image data having the same vertical resolution as the target according to the first image data; wherein the number of test columns and the number of columns in the second image data are the same as those in the first image data.

[0123] (4) Outputting the second image data to a display screen for display.

[0124] (5) Determine whether N is equal to Nmax. When N is less than Nmax, set N=N+1, and return to the execution step to obtain the first image data with the Nth column of sub-pixels as the test column.

[0125] (6) When N equals Nmax, the process ends.

[0126] In some implementations, the present application does not limit the size of the initial value of N.

[0127] Exemplarily, when the rearrangement rule is to group 24 sub-pixels, the initial value of N can be 1, generating the first image data of the sub-pixels in the 1st to 24th columns as test columns respectively; the initial value of N can be 2, generating the first image data of the sub-pixels in the 2nd to 25th columns as test columns respectively. Because the rearrangement rule is to group 24 sub-pixels, the rearrangement rules corresponding to the 25th column and the 1st column are the same.

[0128] In some implementations, the image data stored in the RAM is read out through the FIFO, so N is less than the FIFO depth.

[0129] In some embodiments, the difference between Nmax and the initial value of N plus one is greater than or equal to the number of sub-pixels corresponding to the sub-pixel rearrangement rule of the display screen.

[0130] Specifically, the difference between Nmax and the initial value of N plus one is the number of test images generated, in order to meet the requirements of deriving the rearrangement rule.

[0131] In some embodiments, step (5) includes the following steps.

[0132] Determine whether N is equal to Nmax. When N is less than Nmax and a switching instruction is received, set N=N+1, and return to the execution step to obtain the first image data with the Nth column of sub-pixels as the test column.

[0133] Specifically, the switching instruction may be a timing instruction. After the display time of the output image reaches a preset time, the timing instruction is triggered to make N=N+1, and the execution step is returned to obtain the first image data with the Nth column of sub-pixels as the test column.

[0134] Specifically, the switching instruction can be a trigger instruction, which can be triggered by triggering a button in the display screen, such as a power button, a volume button, a return button, etc. in the display screen, to generate a trigger instruction, so that N=N+1, and return to the execution step to obtain the first image data of the Nth column sub-pixel as the test column.

[0135] Through the above method, multiple test images are generated in sequence and output to the display screen in sequence for display. Rearrangement rules can be derived without external test images and direct screen production, thereby reducing test time.

[0136] See also Figure 7 , Figure 7 Schematic diagram of a test device provided in an embodiment of the present application. Figure 7 As shown, the testing device 200 includes: a first acquiring unit 210 , a second acquiring unit 220 , a generating unit 230 and a display unit 240 .

[0137] The first acquisition unit 210 acquires first image data in which at least one column of sub-pixels is a test column; wherein the brightness of the sub-pixels in the test column is different from the brightness of the sub-pixels in the non-test column.

[0138] The second acquisition unit 220 acquires a target vertical resolution.

[0139] The generating unit 230 generates second image data having the same vertical resolution as the target according to the first image data; wherein the number of test columns and the number of columns in the second image data are the same as those in the first image data.

[0140] The display unit 240 is used to output the second image data to a display screen for display.

[0141] See also Figure 8 , Figure 8 Schematic diagram of the structure of a chip provided in an embodiment of the present application. Figure 8 As shown, the chip 300 includes: one or more processors 310 and a memory 320, Figure 8 A processor 310 is taken as an example.

[0142] In some implementations, the processor 310 and the memory 320 may be connected via a bus or other means. Figure 8 The example of connecting through bus is taken in the following.

[0143] In some embodiments, the processor 310 is used to obtain first image data in which at least one column of sub-pixels is a test column; wherein the brightness of the sub-pixels in the test column is different from the brightness of the sub-pixels in a non-test column; obtain a target vertical resolution; generate second image data with the same target vertical resolution based on the first image data; wherein the number of test columns and the number of columns in the second image data are the same as those of the first image data; and output the second image data to a display screen for display.

[0144] In some embodiments, the memory 320 is a non-volatile computer-readable storage medium that can be used to store non-volatile software programs, non-volatile computer executable programs and modules, such as program instructions / modules of the detection method in the embodiment of the present application. The processor 310 executes various functional applications and data processing of the chip by running the non-volatile software programs, instructions and modules stored in the memory 320, that is, implementing the test method of the above method embodiment.

[0145] In some embodiments, the memory 320 may include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application required by at least one function; the data storage area may store data created according to the use of the chip, etc. In addition, the memory 320 may include a high-speed random access memory, and may also include a non-volatile memory, such as at least one disk storage device, a flash memory device, or other non-volatile solid-state storage device. In some embodiments, the memory 320 may optionally include a memory remotely arranged relative to the processor 310, and these remote memories may be connected to the controller via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0146] In some embodiments, one or more modules are stored in the memory 320, and when executed by one or more processors 310, the test method in any of the above method embodiments is executed, for example, the test method described above is executed. Figure 2 Method steps 110 to 140 in.

[0147] Please refer to Fig. 9 , Fig. 9 The computer-readable storage medium 400 stores program code 410, which can be called by a processor to execute the test method described in the above method embodiment.

[0148] The computer readable storage medium 400 can be an electronic memory such as a flash memory, an EEPROM (electrically erasable programmable read-only memory), an EPROM, a hard disk, or a ROM. Optionally, the computer readable storage medium includes a non-volatile computer readable medium (nontransitory computerreadable storage medium). The computer readable storage medium 400 has a storage space for program codes that execute any method steps in the above control method. These program codes can be read from or written to one or more computer program products. The program code can be compressed, for example, in an appropriate form.

[0149] In summary, the present application provides a test method, device, chip and storage medium, the method comprising: obtaining first image data in which at least one column of sub-pixels is a test column; wherein the brightness of the sub-pixels in the test column is different from the brightness of the sub-pixels in the non-test column; obtaining a target vertical resolution; generating second image data with the same target vertical resolution according to the first image data; wherein the number of test columns and the number of columns in the second image data are the same as the first image data; and outputting the second image data to a display screen for display. In the present application, the first image data can be directly received, and the second image data can be generated to be displayed on the display screen, without the need to manually generate a test chart and an external test box to test the display screen, thus saving test time and test costs.

[0150] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit it. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A testing method, characterized in that: The method comprises: Acquire first image data in which at least one column of sub-pixels is a test column; wherein the brightness of the sub-pixels in the test column is different from the brightness of the sub-pixels in the non-test column; Get the target vertical resolution; generating second image data having the same vertical resolution as the target according to the first image data; wherein the number of test columns and the number of columns in the second image data are the same as those in the first image data; The second image data is output to a display screen for display.

2. The method according to claim 1, characterized in that: The method further comprises: Acquire original image data of at least one column of sub-pixels as a test column; Get the target horizontal resolution; Determine the size of the target horizontal resolution and the preset resolution; When the target horizontal resolution is less than or equal to the preset resolution, writing the original image data into a random access memory; When the target horizontal resolution is greater than the preset resolution, extracting image data having a horizontal resolution equal to the preset resolution and including the test column from the original image data, and writing the image data into a random access memory; The step of acquiring first image data of at least one column of sub-pixels as a test column comprises: The original image data or the image data stored in the random access memory is read.

3. The method according to claim 2, characterized in that Outputting the second image data to a display screen for display includes: When the target horizontal resolution is less than or equal to the preset resolution, outputting the second image data to a display screen for display; When the target horizontal resolution is greater than the preset resolution, adding a non-test column to the second image data to obtain third image data having a horizontal resolution equal to the target horizontal resolution; The third image data is output to a display screen for display.

4. The method according to claim 3, characterized in that The size of the preset resolution is equal to the depth of the first-in-first-out data buffer.

5. The method according to claim 1, characterized in that The step of generating second image data according to the first image data comprises: The first image data is magnified in the vertical direction by using the image magnification function of the chip to generate second image data.

6. The method according to any one of claims 1 to 5, characterized in that: The step of acquiring first image data of at least one column of sub-pixels as a test column comprises: Acquire the first image data of the Nth column of sub-pixels as the test column; wherein the initial value of N is a positive integer; After outputting the second image data to a display screen for display, the method further includes: Determine whether N is equal to Nmax. When N is less than Nmax, set N=N+1, and return to the execution step to obtain the first image data with the Nth column of sub-pixels as the test column; When N is equal to Nmax, the process ends.

7. The method according to claim 6, characterized in that The difference between Nmax and the initial value of N plus one is greater than or equal to the number of sub-pixels corresponding to the sub-pixel rearrangement rule of the display screen.

8. A testing device, characterized in that: The device comprises: A first acquisition unit, acquiring first image data of at least one column of sub-pixels as a test column; wherein the brightness of the sub-pixels in the test column is different from the brightness of the sub-pixels in the non-test column; A second acquisition unit acquires a target vertical resolution; A generating unit, generating second image data having the same vertical resolution as the target according to the first image data; wherein the number of test columns and the number of columns in the second image data are the same as those in the first image data; The display unit is used to output the second image data to a display screen for display.

9. A chip, characterized in that: The chip comprises: at least one processor; and, a memory communicatively connected to the at least one processor; wherein, The memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can perform the testing method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores an executable program, and the executable program is executed by a processor to implement the testing method according to any one of claims 1 to 7.

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