Ultrathin multi-layer memory chip stacking and packaging method and system
Through optical scanning and thickness optimization, configuration of intermediate layer materials and stacking path planning, the problems of uneven chip thickness and insufficient positioning accuracy in the prior art are solved, and high-precision chip stacking and packaging are realized, and packaging quality and stability are improved.
Patent Information
- Application Number
- CN202411822095.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-11
- Publication Date
- 2025-04-01
- Estimated Expiration
- 2044-12-11
AI Technical Summary
The existing ultra-thin multi-layer memory chip stacking packaging technology has problems such as uneven chip thickness, insufficient positioning accuracy, complex through-hole digging and metal layer deposition processes, and easy defects in welding, resulting in low packaging quality.
Through optical scanning, chip surface defects and circuit integrity are analyzed, chip quality division and thickness optimization are carried out, intermediate layer materials are configured for coating and curing, identification of identification attributes and intermediate layer positions are identified and stacking path planning is carried out, and high-precision chip stacking and packaging are achieved.
The accuracy and quality of chip stacking and packaging are improved, the connection problems caused by thickness differences and positioning deviations are reduced, and the bonding force between chips and the stability of the packaging structure is enhanced.