In-situ analysis detection method and device for electrical contact surface film damage

In-situ analysis and detection of surface film damage of electrical contacts through elliptical polarization technology, the problems of high cost and long detection cycle of existing detection methods are solved, and fast, accurate and lossless surface film damage detection of electrical contacts is achieved, which improves the reliability and service life of electrical devices.

CN119757232APending Publication Date: 2025-04-04XIAMEN UNIV OF TECH
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Patent Information

Application Number
CN202411813710.6
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-11
Publication Date
2025-04-04

AI Technical Summary

Technical Problem

The existing electrical contact detection methods are costly and have a long detection cycle, making it difficult to accurately detect damage to the surface film of the electrical contact, affecting the reliability and service life of electrical devices.

Method used

Elliptical polarization technology is used to conduct in-situ analysis and detection of surface film damage of electrical contacts, and the changes in surface materials of electrical contacts are accurately detected through elliptical polarization spectral testing and fitting analysis.

Benefits of technology

It realizes rapid, accurate and non-destructive testing of surface membrane damage of electrical contacts, reduces detection costs, improves detection efficiency, and helps optimize the maintenance plan of electrical equipment.

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Abstract

The invention relates to an in-situ analysis detection method and device for electrical contact surface film damage. The in-situ analysis detection method comprises the following steps: 1) adjusting the height and angle of a sample test platform to a proper position; 2) switching on an electric contact test platform circuit, simulating an in-situ working process of an electric contact, and obtaining electric contact information and elliptically polarized light detection information; (3) transmitting polarized light detection information to light source acquisition equipment, and (4) establishing a proper physical optical model and a vibrator model, and performing data fitting analysis to obtain the in-situ change condition of the surface of the electrical contact. By adopting a non-contact in-situ spectrum testing technology, the early-stage in-situ failure process of the electrical contact is accurately, quickly and nondestructively detected in real time, and an equipment means and a test basis are provided for research on an electrical contact early-stage failure mechanism of an electrical contact material.
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