Test apparatus and method for an electronic device

Abstract

The embodiment of the application provides a kind of electronic equipment testing device and method, it is related to testing field, can greatly reduce the test cost of SAR value and other parameters, simply and quickly determine that SAR value and other parameters possibly do not meet the requirements of electronic equipment, with higher practicality.The device comprises: host computer, test box, test link.The test box is used to place multiple devices to be tested.The first end of the test link is wirelessly connected with the multiple devices to be tested, and the second end of the test link is connected with the host computer.The host computer is used to determine the total radiation power of each device to be tested through the test link.A first discrete value is calculated according to the total radiation power of each device to be tested.When the first discrete value is greater than a first preset value, a first contribution value of each device to be tested is calculated according to the total radiation power of each device to be tested.The device to be tested with a first contribution value greater than a second preset value is identified as not passing the test.

Description

TECHNICAL FIELD

[0001] Embodiments of the present application relate to the field of testing, and in particular to a testing device and method for electronic equipment. BACKGROUND

[0002] In line testing, the testing cost of some parameters of electronic equipment is very high. Taking the SAR value of electronic equipment as an example, SAR (Specific Absorption Rate) refers to the electromagnetic power absorbed or consumed by unit mass of human tissue, and is used to measure the influence of electromagnetic waves on the human body. For electronic equipment, the greater the SAR value, the greater the adverse effect on human health. Therefore, before electronic equipment is shipped, electronic equipment with an SAR value that does not meet the requirements needs to be screened out to reduce the risk of non-compliance of the SAR value of electronic equipment.

[0003] However, the scheme of directly measuring the SAR value and other parameters of electronic equipment has a long measurement period and a complex testing process, resulting in high testing cost and being not conducive to large-scale application. SUMMARY

[0004] Embodiments of the present application provide a testing device and method for electronic equipment, which can greatly reduce the testing cost of the SAR value and other parameters, simply and quickly determine electronic equipment that may not meet the requirements of the SAR value and other parameters, and have high practicality.

[0005] To achieve the above object, embodiments of the present application adopt the following technical solutions.

[0006] In a first aspect, a testing device for electronic equipment is provided, comprising a host, a test box, and a test link. The test box is used to place a plurality of devices to be tested. The first end of the test link is wirelessly connected to the plurality of devices to be tested, and the second end of the test link is connected to the host. The host is used to determine the total radiation power of each device to be tested through the test link. A first discrete value is calculated according to the total radiation power of each device to be tested. When the first discrete value is greater than a first preset value, a first contribution value of each device to be tested is calculated according to the total radiation power of each device to be tested. The device to be tested whose first contribution value is greater than a second preset value is identified as not passing the test. The first discrete value is used to indicate the dispersion degree of a first parameter of each device to be tested. The first parameter is positively correlated with the total radiation power. The first contribution value of the first device to be tested is used to indicate the contribution of the first device to be tested to the first discrete value, and the first device to be tested is any device to be tested. The first preset value and the second preset value are both positive numbers.

[0007] Based on the scheme, since the first parameter is positively correlated with the total radiation power, the first discrete value calculated according to the total radiation power of each to-be-tested device can reflect the discrete degree of the first parameter of each to-be-tested device. Since most of the to-be-tested devices in a batch should meet the requirements of various parameters, that is, the first parameters of most to-be-tested devices are relatively small, the to-be-tested device with a relatively large contribution to the discrete degree (that is, a relatively large first contribution value) can be screened out as a device that may not meet the requirements of the first parameter, and is marked as failed. In this way, the test cost of the SAR value and other parameters can be greatly reduced, and the electronic device that may not meet the requirements of the SAR value and other parameters can be determined simply and quickly, and has high practicability.

[0008] In a possible design, the test apparatus of the electronic device further includes a control link. A first end of the control link is connected with the host computer, and a second end of the control link is wirelessly connected with the plurality of to-be-tested devices. Therefore, the host computer is further configured to control the to-be-tested devices to enter a test state through the control link in response to receiving the test instruction. The to-be-tested devices have the capability of receiving radio frequency signals and the capability of transmitting radio frequency signals in the test state.

[0009] In a possible design, the control link includes a router and a first antenna. The host computer is connected with the first antenna through the router. The first antenna is arranged in the test box and is in communication connection with each to-be-tested device. Therefore, the host computer is specifically configured to control the to-be-tested devices to enter the test state through the router and the first antenna in response to receiving the test instruction.

[0010] In a possible design, the test link includes a router, a comprehensive tester, a radio frequency switch board, and a plurality of second antennas. The host computer is connected with the plurality of second antennas through the router, the comprehensive tester, and the radio frequency switch board in sequence. The host computer is further connected with the radio frequency switch board. The plurality of second antennas are arranged in the interior of the test box and are wirelessly connected with each to-be-tested device. The router is configured to implement communication between the host computer and the comprehensive tester. The comprehensive tester is configured to receive a test case sent by the host computer and output a radio frequency signal corresponding to the test case. The radio frequency switch board is configured to control the connection and disconnection between each second antenna and the comprehensive tester, and the connection and disconnection between each second antenna and the host computer.

[0011] In a possible design, the host computer is specifically configured to measure the receiving power of each to-be-tested device at different spatial positions through the test link. The gain of each to-be-tested device at different spatial positions is determined according to the receiving power of each to-be-tested device at different spatial positions. The transmitting power of each to-be-tested device at different spatial positions is determined according to the gain of each to-be-tested device at different spatial positions, the pre-stored input power of the antenna in each to-be-tested device, and the pre-stored feed line loss of the antenna in each to-be-tested device. The total radiation power of each to-be-tested device is obtained by integrating the transmitting power of each to-be-tested device at different spatial positions.

[0012] In a possible design, the host is further configured to identify each of the devices under test as passing the test when the first discrete value is less than a first preset value.

[0013] In a possible design, the test box is an electromagnetic wave shielding box. Inner walls of the test box are provided with wave-absorbing materials for shielding electromagnetic waves.

[0014] In a possible design, one or more placement tables are arranged in the test box. The placement tables are used to place one or more devices under test.

[0015] In a possible design, the test box is provided with a switch door. The switch door is connected to the host via a pneumatic cylinder. The host is further configured to control the switch door to open and close via the pneumatic cylinder. The switch door is opened to allow the devices under test to pass.

[0016] In a possible design, the first parameter is specific absorption rate. The first discrete value is variance or standard deviation.

[0017] In a second aspect, a test method of an electronic device is provided. The method is applied to a host of the test device of any one of the first aspect. The method comprises: determining total radiated power of each of the devices under test; calculating a first discrete value according to the total radiated power of each of the devices under test. The first discrete value is used to indicate a degree of dispersion of a first parameter of each of the devices under test. The first parameter is positively correlated with the total radiated power. When the first discrete value is greater than a first preset value, calculating a first contribution value of each of the devices under test according to the total radiated power of each of the devices under test. The first contribution value of a first device under test is used to indicate a contribution of the first device under test to the first discrete value. The first device under test is any one of the devices under test. Identifying a device under test with a first contribution value greater than a second preset value as failing. The first preset value and the second preset value are both positive numbers.

[0018] In a possible design, before determining the total radiated power of each of the devices under test, the method further comprises: in response to receiving a test instruction, controlling the devices under test to enter a test state.

[0019] In a possible design, determining the total radiated power of each of the devices under test comprises: obtaining received power of each of the devices under test at different spatial positions; determining gain of each of the devices under test at the different spatial positions according to the received power of each of the devices under test at the different spatial positions; determining transmitted power of each of the devices under test at the different spatial positions according to the gain of each of the devices under test at the different spatial positions, pre-stored input power of an antenna in each of the devices under test, and pre-stored feeder loss of the antenna in each of the devices under test; and integrating the transmitted power of each of the devices under test at the different spatial positions to obtain the total radiated power of each of the devices under test.

[0020] In a possible design, after the first discrete value is calculated according to the total radiation power of each device under test, the method further includes: identifying each device under test as passing the test when the first discrete value is less than a first preset value.

[0021] In a third aspect, an electronic device is provided, which includes one or more processors and one or more memories. The one or more memories are coupled to the one or more processors, and store computer instructions. When the one or more processors execute the computer instructions, the electronic device performs the test method of any of the electronic devices in the second aspect.

[0022] In a fourth aspect, a chip system is provided, which includes a processing circuit and an interface. The processing circuit is configured to invoke and run a computer program stored in a storage medium, so as to perform the test method of any of the electronic devices in the second aspect.

[0023] In a fifth aspect, a computer readable storage medium is provided, which includes computer instructions. When the computer instructions are executed, the test method of any of the electronic devices in the second aspect is performed.

[0024] In a sixth aspect, a computer program product is provided, which includes instructions. When the computer program product is executed on a computer, the computer can perform the test method of any of the electronic devices in the second aspect according to the instructions.

[0025] It should be understood that the technical solutions provided by the second aspect, the third aspect, the fourth aspect, the fifth aspect and the sixth aspect above all have the technical features corresponding to the test device of the electronic device provided in the first aspect and its possible designs, and thus can achieve similar beneficial effects, which will not be described here again. BRIEF DESCRIPTION OF DRAWINGS

[0026] Figure 1 FIG. 1 is a structural schematic diagram of an electronic device provided by an embodiment of the present application;

[0027] Figure 2 FIG. 2 is a schematic diagram of the relationship between a spherical coordinate system and a rectangular coordinate system;

[0028] Figure 3 FIG. 3 is a schematic diagram of a TRP curve and a SAR value curve of an electronic device provided by an embodiment of the present application;

[0029] Figure 4 FIG. 4 is a schematic diagram of a test device of an electronic device provided by an embodiment of the present application;

[0030] Figure 5 FIG. 5 is a schematic diagram of another test device of an electronic device provided by an embodiment of the present application;

[0031] Figure 6 A flow chart of a test method of an electronic device provided in an embodiment of the present application;

[0032] Figure 7 A composition schematic diagram of an electronic device provided in an embodiment of the present application;

[0033] Figure 8 A composition schematic diagram of a chip system provided in an embodiment of the present application. DETAILED DESCRIPTION

[0034] In the embodiments of the present application, “first”, “second”, “third” and the like are used to distinguish different objects, rather than to limit a specific sequence. In addition, “exemplary” or “for example” and the like are used to represent an example, illustration or description. Any embodiment or design scheme described as “exemplary” or “for example” in the embodiments of the present application should not be interpreted as more preferred or more advantageous than other embodiments or design schemes. Rather, the use of “exemplary” or “for example” and the like is intended to present the relevant concept in a specific manner.

[0035] For ease of illustration, the following embodiments take the SAR value of an electronic device as an example for introduction.

[0036] A too large SAR value of an electronic device will affect human health, and therefore SAR value detection is required before the electronic device is shipped, to screen out electronic devices with SAR values that do not meet the requirements.

[0037] Generally speaking, directly measuring the SAR value of an electronic device is relatively intuitive and accurate. However, the scheme of directly measuring the SAR value needs to use high-cost test equipment, and has defects such as a relatively long test period (usually 24 hours), a complex test case, a need for manual participation in the test process, and a relatively complex process, which is not suitable for large-scale test scenarios.

[0038] To solve the above problems, the test device and method of an electronic device provided in an embodiment of the present application can simply and quickly determine electronic devices with parameters such as SAR values that may not meet the requirements at a relatively low cost, and have relatively high practicality.

[0039] In the embodiments of the present application, the electronic device to be tested refers to a device provided with an antenna, such as a mobile phone, a tablet computer, a wearable device (such as a smart watch), a vehicle-mounted device, a laptop computer, a desktop computer, and the like. Exemplary embodiments of the terminal device include, but are not limited to, portable terminals carrying or other operating systems.

[0040] As an example, refer to Figure 1FIG. 1 shows a structural schematic diagram of an electronic device according to an embodiment of the present application.

[0041] As shown in FIG. 1, the electronic device 100 can include a processor 101 and a communication module 102, etc. Figure 1

[0042] The processor 101 can include one or more processing units. For example, the processor 101 can include an application processor (AP), a modem processor, a graphics processing unit (GPU), an image signal processor (ISP), a controller, a memory, a video stream codec, a digital signal processor (DSP), a baseband processor, and / or a neural-network processing unit (NPU), etc. Different processing units can be independent devices or integrated in one or more processors 101.

[0043] The communication module 102 can include an antenna x, an antenna y, a mobile communication module 102A, and / or a wireless communication module 102B. For example, the communication module 102 can include the antenna x, the antenna y, the mobile communication module 102A, and the wireless communication module 102B.

[0044] The wireless communication function of the electronic device 100 can be implemented by the antenna x, the antenna y, the mobile communication module 102A, the wireless communication module 102B, a modem processor, and a baseband processor, etc.

[0045] The antenna x and the antenna y are used for transmitting and receiving electromagnetic wave signals. Each antenna in the electronic device 100 can be used to cover a single or multiple communication frequency bands. Different antennas can also be multiplexed to improve the utilization rate of the antennas. For example, the antenna x can be multiplexed as a diversity antenna of a wireless local area network. In some other embodiments, the antennas can be used in combination with a tuning switch.

[0046] ​The mobile communication module 102A can provide a solution for wireless communication including 2G / 3G / 4G / 5G, etc. applied to the electronic device 100. The mobile communication module 102A can include at least one filter, a switch, a power amplifier, a low noise amplifier (LNA), etc. The mobile communication module 102A can receive an electromagnetic wave by the antenna x, and perform filtering, amplification, etc. on the received electromagnetic wave, and transfer the processed signal to the modem processor to be demodulated. The mobile communication module 102A can also amplify a signal modulated by the modem processor, and radiate the signal as an electromagnetic wave through the antenna x. In some embodiments, at least part of the function modules of the mobile communication module 102A can be disposed in the processor 101. In some embodiments, at least part of the function modules of the mobile communication module 102A can be disposed in the same device as at least part of the modules of the processor 101.

[0047] The wireless communication module 102B can provide a solution for wireless communication including wireless local area networks (WLAN) (e.g., wireless fidelity (Wi-Fi) network), Bluetooth (BT), global navigation satellite system (GNSS), frequency modulation (FM), near field communication (NFC), infrared (IR) technology, etc. applied to the electronic device 100. The wireless communication module 102B can be one or more devices integrating at least one communication processing module. The wireless communication module 102B receives an electromagnetic wave via the antenna y, performs frequency modulation and filtering on the electromagnetic wave signal, and transmits the processed signal to the processor 101. The wireless communication module 102B can also receive a signal to be transmitted from the processor 101, perform frequency modulation and amplification on the signal, and radiate the signal as an electromagnetic wave through the antenna y.

[0048] In some embodiments, the antenna x of the electronic device 100 and the mobile communication module 102A are coupled, and the antenna y and the wireless communication module 102B are coupled, so that the electronic device 100 can communicate with a network and other devices through wireless communication technologies. The wireless communication technologies can include global system for mobile communications (GSM), general packet radio service (GPRS), code division multiple access (CDMA), wideband code division multiple access (WCDMA), time-division code division multiple access (TD-SCDMA), long term evolution (LTE), BT, GNSS, WLAN, NFC, FM, and / or IR technologies, etc. The GNSS can include global positioning system (GPS), global navigation satellite system (GLONASS), beidou navigation satellite system (BDS), quasi-zenith satellite system (QZSS), and / or satellite based augmentation systems (SBAS).

[0049] The above describes the electronic device to be tested according to the embodiments of the present application. It should be understood that the structure illustrated in the embodiments does not constitute a specific limitation on the electronic device 100. In other embodiments, the electronic device 100 can include more or fewer components than illustrated, or combine certain components, or split certain components, or different arrangement of components. The illustrated components can be implemented in hardware, software, or a combination of software and hardware.

[0050] The following describes the testing device of the electronic device provided by the embodiments of the present application based on the above description of the electronic device to be tested.

[0051] The testing device of the electronic device is realized based on two factors. For ease of understanding, the two factors are first described.

[0052] In a first aspect, in order to control production cost and improve profit, the production manufacturer generally produces electronic devices with a high yield rate.

[0053] The yield rate refers to the proportion of electronic devices meeting the factory index among the produced electronic devices, and the factory index can include an SAR value index, an equivalent isotropically radiated power of a certain point in space, a radiation intensity, a hot spot distribution, a radiation direction, etc. Among them, meeting the SAR value index refers to that the SAR value of the electronic device is less than the SAR value index.

[0054] That is, most of the electronic devices produced by the production manufacturer should meet the SAR value index and other parameter indexes.

[0055] In a second aspect, the total radiated power (TRP) of the electronic device is positively correlated with the SAR value and other parameters.

[0056] The TRP of the electronic device refers to the power value obtained by area integration and averaging of the emission power of the entire radiation sphere of the electronic device, and can reflect the radio frequency radiation power integral value of the electronic device on the three-dimensional sphere in space, i.e., the emission characteristics of the electronic device in all directions.

[0057] A plurality of sampling points are arranged on the radiation sphere of the electronic device, and the measurement value of the TRP can be obtained by integrating and averaging the emission power of the plurality of sampling points. The specific process of calculating the TRP is described below taking the spherical coordinate system as an example.

[0058] Please refer to Figure 2 for a schematic diagram of the relationship between a spherical coordinate system and a rectangular coordinate system. As shown in Figure 2 , in the spherical coordinate system, the counterclockwise direction around the z-axis of the rectangular coordinate system is the direction of the φ-axis of the spherical coordinate system, and the clockwise direction around the origin O in the plane where the z-axis of the rectangular coordinate system is located is the direction of the θ-axis of the spherical coordinate system, and r represents the distance between a point and the origin O. In this way, the coordinates of any point A in space can be represented by r, θ, and φ.

[0059] The radiation sphere of the electronic device is placed in the spherical coordinate system, a fixed r value is taken, and a sampling point is taken every 15° along the direction of the φ-axis and the direction of the θ-axis, and then the measurement value of the TRP can be obtained according to the following formula (1).

[0060]

[0061] Wherein, N is the number of sampling points on the θ-axis, M is the number of sampling points on the φ-axis, and EIRP is the equivalent isotropically radiated power of a certain point in space (i.e., the emission power mentioned above).

[0062] The EIRP can be obtained by formula (2) as follows.

[0063] EIRP = P-loss + G formula (2).

[0064] Wherein, P is the input power of the antenna in the electronic device, loss is the feeder loss of the antenna, and G is the antenna gain.

[0065] Generally, the input power P and the feeder loss loss of the antenna are known, so the transmitting power of each sampling point can be obtained by measuring the antenna gain of each sampling point, and thus the TRP of the electronic device can be obtained.

[0066] The SAR value calculation formula is formula (3) as follows.

[0067]

[0068] Wherein, sigma is the conductivity of the human tissue fluid, rho is the density of the human tissue fluid, and E is the radiation electric field. The E can be obtained by formula (4) as follows.

[0069]

[0070] Based on the above formula (2), formula (3), and formula (4), the formula (5) representing the relationship between the EIRP and the SAR can be obtained as follows.

[0071]

[0072] The formula (5) is brought into the formula (1) to obtain the formula (6) as follows.

[0073]

[0074] Based on the formula (6), it can be seen that the TRP of the electronic device is positively correlated with the SAR value. This conclusion can be verified by simulation experiments.

[0075] Please refer to Figure 3 , which is a schematic diagram of the TRP curve and the SAR value curve of an electronic device provided by the embodiment of the present application. Wherein, the horizontal coordinate is the electronic device serial number, 1 to 12 respectively represent the electronic device with serial number 1 to the electronic device with serial number 12, the unit of the vertical coordinate is dBm, curve 1 is the TRP curve, and curve 2 is the SAR value curve.

[0076] It can be seen from Figure 3 that the change trend of the SAR value curve and the TRP curve is consistent. That is to say, the TRP of the electronic device is positively correlated with the SAR value.

[0077] Based on the above two factors, it should be understood that when testing whether the SAR values of multiple electronic devices meet the requirements, if the TRP of an electronic device is greatly different from the TRPs of most electronic devices, the SAR value of the electronic device is likely to not meet the requirements. In other words, the consistency of the SAR values of multiple electronic devices can be determined by measuring the consistency of the TRPs of the multiple electronic devices, and then the electronic devices with SAR values not meeting the requirements can be determined.

[0078] In addition, it should be understood that in addition to testing the SAR values, the testing device and method for electronic devices provided in the embodiments of the present application are applicable to testing any parameter positively correlated with the TRP, such as the EIRP, the conducted power, the antenna radiation direction of the electronic device, the radiation intensity, the hotspot distribution, and the like. The embodiments of the present application take testing the SAR values as an example, and subsequent descriptions will not be repeated.

[0079] The embodiments of the present application provide a testing device and method for electronic devices based on the above two factors. The TRP of an electronic device is taken as a simulated SAR value, the dispersion degree of the simulated SAR values of the electronic devices is measured, and the electronic devices greatly different from the simulated SAR values of most electronic devices are screened out, so that the electronic devices with SAR values possibly not meeting the requirements are screened out simply and quickly at a low cost, and the practicability is high. The following will be specifically introduced.

[0080] It should be noted that the testing device and method for electronic devices provided in the embodiments of the present application are mainly used to determine the electronic devices with SAR values possibly not meeting the requirements from multiple to-be-tested electronic devices. The multiple to-be-tested electronic devices refer to three or more to-be-tested electronic devices.

[0081] Please refer to Figure 4 , a schematic diagram of a testing device for electronic devices provided in the embodiments of the present application is shown. As shown in the figure, Figure 4 The testing device for electronic devices includes a host 401, a test box 402, a test link 403, and a control link 404. The host 401 is connected with the test box 402 through the test link 403 and the control link 404 respectively. The control link 404 is in communication connection with a to-be-tested electronic device 400 placed in the test box 402, and the test link 403 is in wireless communication connection with the to-be-tested electronic device 400 placed in the test box 402. The wireless communication connection can include WIFI, Bluetooth, NFC (Near Field Communication), and the like, which are not limited herein.

[0082] The test box 402 is used to place the electronic device 400 to be tested. In some possible implementation manners, the test box 402 can be a shielding box, which can shield the interference of signals outside the box on the electronic device 400 to be tested, thereby improving the test error of the test device of the electronic device and improving the test precision.

[0083] The test box 402 can be provided with a placement table used to place the electronic device 400 to be tested. In some possible implementation manners, the test box 402 can be provided with one placement table, and a plurality of electronic devices 400 to be tested can be placed on the placement table. In another possible implementation manner, the test box 402 can be provided with a plurality of placement tables, and one or more electronic devices 400 to be tested can be placed on each placement table, which is not limited herein.

[0084] The test box 402 can be further provided with a door that can be opened or closed. The electronic device 400 to be tested can be placed into or taken out of the test box 402 through the door. In some possible implementation manners, the door can be controlled to be opened and closed by a pneumatic cylinder.

[0085] The host 401 is used to control the state of the electronic device 400 to be tested through the control link 404 and test the TRP of the electronic device through the test link 403.

[0086] The state of the electronic device to be tested can include a standby state, a test state and the like. The standby state refers to a state in which the electronic device to be tested saves the data currently in a running state in a memory, and only the memory is powered by a battery, and the hard disk, the screen and the CPU (Central Processing Unit) are not powered. The test state refers to a state in which the electronic device can receive and send wireless radio frequency signals.

[0087] It should be understood that, in some possible implementation manners, the radio frequency parameters of the electronic device directly measured by the test link 403 can be the received power of the electronic device at different positions in space. Then, the host 401 determines the gain of the electronic device at different positions in space according to the received power of the electronic device at different positions in space, further obtains the transmit power of the electronic device at different positions in space according to the above formula (2), and finally obtains the TRP of the electronic device according to the above formula (1). The input power of the antenna in the electronic device, the feeder loss of the antenna and the like can be pre-stored in the host 401 or obtained by the host 401 from the electronic device 400 to be tested through the control link 404 or the test link 403, which is not limited herein.

[0088] The test process of the electronic device in the test state is introduced as follows.

[0089] Firstly, the host 401 can set the electronic device under test 400 to a test state through the control link 404 in response to a test instruction.

[0090] The test state is a state in which the electronic device under test can receive and send radio frequency signals. The test instruction can be used to instruct the host to start testing the electronic device under test. For example, a test software can be installed in the host, and a start test button is displayed on the interface of the test software. The test instruction can be a single click operation on the start test button.

[0091] Please refer to Figure 5 for another schematic diagram of a test device of an electronic device provided in the embodiments of the present application. As shown in Figure 5 The control link 404 can include a router 414 and a first antenna 424, and the host 401 is connected to the first antenna 424 through the router 414. The first antenna 424 is arranged in the test box 402. The first antenna 424 is wirelessly connected to each electronic device under test 400.

[0092] The host 401 can send a first instruction to the electronic device under test 400 through the router 414 and the first antenna 424 in response to receiving the test instruction. The first instruction is used to instruct the electronic device under test 400 to enter the test state.

[0093] After the electronic device under test 400 enters the test state, the electronic device under test 400 can send a first signaling to the host 401 through the first antenna 424 and the router 414. The first signaling indicates that the electronic device under test 400 has entered the test state.

[0094] In some possible implementations, the control link can also include a serial module. For example, the serial module can be a USB (Universal Serial Bus) serial port. The host is connected to each electronic device under test 400 through the serial module in a wired manner, so as to control the state of each electronic device under test 400.

[0095] Secondly, after the host 401 receives the first signaling sent by the electronic device under test 400, the host 401 can emit a test signal through the test link 403 and receive a feedback signal returned by the electronic device under test 400 based on the test signal.

[0096] As shown in Figure 5As shown, the test link 403 can include a router 414, a test instrument 413, a radio frequency switch board 423, and a plurality of second antennas 433. The host computer 401 is connected to the router 414, the test instrument 413, the radio frequency switch board 423, and the plurality of second antennas 433 in sequence. The second antennas 433 are arranged inside the test box 402 and distributed at various positions in the test box 402. The host computer 401 is also connected to the radio frequency switch board 423. The radio frequency switch board 423 is configured to control the connection and disconnection between the host computer 401 and any of the second antennas 433, and between the test instrument 413 and any of the second antennas 433. The test instrument 413 can also be referred to as a base station, and is configured to output radio frequency signals. The second antennas can also be referred to as antenna probes, sampling probes, omnidirectional antenna probes, etc., and are configured to perform TRP testing.

[0097] In addition, it should be noted that, Figure 5 In the connection lines between the devices in the test system 400, the thick lines represent network lines, the thin lines represent radio frequency lines, and the dashed lines represent wireless communication connections.

[0098] After the host computer receives the first signaling sent by the electronic device under test 400, the host computer can input a test case into the test instrument 413 through the router 414. The test case refers to a description of a test task for a specific software product, and embodies test plans, methods, techniques, and strategies. The content of the test case includes test objectives, test environments, input data, test steps, expected results, test scripts, etc., and finally forms a document.

[0099] The test instrument 413 outputs radio frequency signals according to the received test case.

[0100] The radio frequency switch board 423 can control the radio frequency signals generated by the test instrument 413 to be transmitted through which second antenna 433, and can also control the radio frequency signals transmitted by the electronic device under test 400 to be received by which second antenna 433 to be transmitted to the host computer 401. The second antennas 433 are configured to transmit or receive radio frequency signals. In some possible implementation manners, the radio frequency switch board 423 can be controlled by the host computer 401 to sequentially connect the test instrument 413 to different second antennas 433, so that the radio frequency signals generated by the test instrument 413 are sequentially transmitted through different second antennas 433, or so that the radio frequency signals transmitted by the electronic device under test 400 and received by different second antennas 433 are sequentially transmitted to the host computer 401. In other possible implementation manners, the radio frequency switch board 423 can also be controlled by the host computer 401 to simultaneously connect the test instrument 413 to different second antennas 433, so as to perform parallel testing.

[0101] In some possible implementation manners, after the second antennas 433 transmit the radio frequency signals transmitted by the test instrument 413, the second antennas 433 can transmit the feedback signals received from the electronic device under test 400 to the host computer 401.

[0102] In some possible implementation manners, the feedback signal transmitted by the electronic device under test 400 can be the received power of the electronic device at different positions in space. The host 401 can calculate the TRP of each electronic device under test 400 based on the feedback signal of the electronic device under test 400. The calculation process can refer to the foregoing embodiments, and will not be described here.

[0103] In some possible implementation manners, the feedback signal transmitted by the electronic device under test 400 can be the TRP of the electronic device under test 400.

[0104] After the host 401 determines the TRP of each electronic device under test 400, the analog SAR value of each electronic device under test 400 can be obtained according to the TRP of each electronic device under test 400.

[0105] As described in the foregoing embodiments, the TRP of the electronic device is positively correlated with the SAR value, and therefore a conversion relationship can be established for converting the TRP of the electronic device into the analog SAR value.

[0106] Exemplarily, the conversion relationship can be y = kt + m. Wherein, t is the TRP of the electronic device, y is the analog SAR value of the electronic device, and k and m are preset parameters, which can be calibrated in advance through the TRP and the SAR value of a plurality of electronic devices. For example, a plurality of groups of TRP and SAR value of electronic devices are measured in advance, and the foregoing k and t are obtained by linear fitting on the plurality of groups of TRP and SAR value.

[0107] It should be understood that the analog SAR value is only a simulation of the actual SAR value of the electronic device, and does not represent the actual SAR value of the electronic device. However, as described in the foregoing embodiments, the dispersion degree of the TRP of a plurality of electronic devices can indicate the dispersion degree of the actual SAR value of the plurality of electronic devices. Therefore, the dispersion degree of the analog SAR value linearly related to the TRP can also indicate the dispersion degree of the actual SAR value.

[0108] Wherein, the dispersion degree of each electronic device can be the variance, standard deviation, etc. of each electronic device, which will not be limited here.

[0109] After the host 401 determines the analog SAR value of each electronic device under test 400, the dispersion degree of the analog SAR value of each electronic device under test 400 can be calculated.

[0110] As described above, the dispersion degree can be the variance, standard deviation, etc. The calculation process of the variance and the standard deviation will not be described here.

[0111] The host 401 can determine the relationship between the dispersion degree of the analog SAR values of the electronic devices under test 400 and the first preset value. When the dispersion degree is variance, the first preset value can be 0.01. When the dispersion degree is standard deviation, the first preset value can be 0.1.

[0112] When the dispersion degree of the analog SAR values of the electronic devices under test 400 is less than the first preset value, it indicates that the analog SAR values of the electronic devices under test 400 have small fluctuations, and the analog SAR values of the electronic devices under test 400 are relatively small. In this case, it can be considered that the SAR values of the tested electronic devices meet the requirements, and the test is passed.

[0113] When the dispersion degree of the analog SAR values of the electronic devices under test 400 is greater than the first preset value, it indicates that the analog SAR values of the electronic devices under test 400 have large fluctuations, and there is a large difference between the analog SAR values of the electronic devices under test 400 and most of the electronic devices under test 400. In this case, it can be considered that there is an electronic device with SAR value that does not meet the requirements in the tested electronic devices, and the test is failed.

[0114] When the test is failed, the host 401 can calculate the contribution value of the analog SAR value of each electronic device under test 400 to the dispersion degree.

[0115] The contribution value of the analog SAR value of the electronic device under test to the dispersion degree refers to the absolute value of the difference between the dispersion degree of the analog SAR values of the electronic devices under test when the electronic device is included and the dispersion degree of the analog SAR values of the electronic devices under test when the electronic device is not included.

[0116] For example, when the dispersion degree is standard deviation, the analog SAR values of four electronic devices under test A, B, C, and D are a, b, c, and d, respectively. The standard deviation of a, b, c, and d is x. The standard deviation of b, c, and d is x1. The standard deviation of a, c, and d is x2. The standard deviation of a, b, and d is x3. The standard deviation of a, b, and c is x4. Then, the contribution value of the analog SAR value of the electronic device A to the dispersion degree is the absolute value of x-x1, the contribution value of the analog SAR value of the electronic device B to the dispersion degree is the absolute value of x-x2, the contribution value of the analog SAR value of the electronic device C to the dispersion degree is the absolute value of x-x3, and the contribution value of the analog SAR value of the electronic device D to the dispersion degree is the absolute value of x-x4.

[0117] It should be understood that in the above example, the dispersion degree can also be variance, which is not described here.

[0118] Then, the host 401 screens out the electronic devices under test with a contribution to the dispersion degree greater than a second preset value as electronic devices with failed tests.

[0119] The second preset value can be set according to actual needs.

[0120] As can be seen from the above description, when the test device of the electronic device performs the test, at least two test results are included. The first one is that the test passes, that is, the SAR values of the tested electronic devices all meet the requirements. The second one is that the test fails, and the identification of the electronic device that fails the test is listed, such as the product serial number (SN) of the electronic device. In the embodiment of the present application, the host 401 can include a display screen, and the above test results can be displayed in the form of text on the display screen of the host 401, which is not limited in the present application.

[0121] It should be understood that the above first calculates the simulated SAR value according to the TRP of each to-be-tested electronic device 400, and then obtains the test result according to the dispersion degree of the simulated SAR value. In some possible implementation manners, the test result can also be directly obtained according to the dispersion degree of the TRP of the to-be-tested electronic device 400, and the above process is similar and will not be repeated here.

[0122] In addition, it should be noted that in the above connection relationship, the host 401 and the router 414, the host 401 and the radio frequency switch board 423, and the router 414 and the comprehensive tester 413 can be connected through a network cable, a local area network and the like. The router 414 and the first antenna 424, the comprehensive tester 413 and the radio frequency switch board 423, and the radio frequency switch board 423 and the second antenna 433 can be connected through a radio frequency cable.

[0123] The above is the electronic device test device and its working principle provided by the embodiment of the present application. As can be seen, the electronic device test device has a simple structure, can simply and quickly determine the electronic device whose SAR value may not meet the requirements at a lower cost, and has high practicability.

[0124] The electronic device test method provided by the embodiment of the present application is based on the above electronic device test device, and can be applied to the host in the above electronic device test device. For the convenience of description, the to-be-tested electronic device is referred to as to-be-tested device.

[0125] Please refer to Figure 6 , the flowchart of the electronic device test method provided by the embodiment of the present application. As Figure 6 shown, the method includes the following steps.

[0126] S601, respectively determine the total radiation power of each to-be-tested device.

[0127] S602, calculate a first dispersion value according to the total radiation power of each to-be-tested device.

[0128] The first discrete value is used to indicate the discrete degree of the SAR value of each to-be-tested device. For example, the first discrete value can be the variance or standard deviation of the total radiated power of each to-be-tested device, or the variance or standard deviation of the simulated SAR value obtained according to the total radiated power of each to-be-tested device, which is not limited herein.

[0129] S603, when the first discrete value is greater than the first preset value, calculating a first contribution value of each to-be-tested device according to the total radiated power of each to-be-tested device.

[0130] The first contribution value is the contribution value of the TRP or the simulated SAR value of the to-be-tested electronic device in the foregoing embodiment to the discrete degree, which is not repeated herein.

[0131] S604, identifying the to-be-tested device whose first contribution value is greater than the second preset value as a device that fails the test.

[0132] It should be understood that when the first discrete value is less than the first preset value, each to-be-tested device can be identified as a device that passes the test.

[0133] All related contents of each step of the test method of the electronic device described above can be cited to the function description of the corresponding device, which is not repeated herein.

[0134] Please refer to Figure 7 , a schematic diagram of an electronic device provided in an embodiment of the present application. The electronic device 700 can be any of the electronic devices in the foregoing examples, for example, the electronic device 700 can be a mobile phone, a computer, etc. For example, as shown in Figure 7 , the electronic device 700 can include a processor 701 and a memory 702. The memory 702 is used to store computer execution instructions. For example, in some embodiments, when the processor 701 executes the instructions stored in the memory 702, the electronic device 700 can perform any of the functions of the electronic device in the foregoing embodiments to implement any of the antenna test methods in the foregoing examples.

[0135] It should be noted that all related contents of each step of the method embodiments described above can be cited to the function description of the corresponding function module, which is not repeated herein.

[0136] Figure 8A schematic diagram of a chip system 800 is shown. The chip system 800 can be disposed in an electronic device. For example, the chip system 800 can be disposed in a mobile phone. For example, the chip system 800 can include a processor 801 and a communication interface 802, which are configured to support the electronic device to implement the functions involved in the above embodiments. In a possible design, the chip system 800 further includes a memory configured to store program instructions and data necessary for the electronic device. The chip system can be composed of a chip, or can include a chip and other discrete devices. It should be noted that the communication interface 802 can also be referred to as an interface circuit in some implementations of the present application.

[0137] It should be noted that all related contents of each step involved in the above method embodiments can be referred to the function description of the corresponding function module, and will not be repeated here.

[0138] The embodiments of the present application further provide a computer storage medium, which stores computer instructions. When the computer instructions run on a terminal device, the terminal device executes the related method steps to implement the method in the above embodiments.

[0139] The embodiments of the present application further provide a computer program product. When the computer program product runs on a computer, the computer executes the related steps to implement the method in the above embodiments.

[0140] In addition, the embodiments of the present application further provide an apparatus, which can be a chip, a component or a module. The apparatus can include a processor and a memory connected to each other. The memory is configured to store computer execution instructions. When the apparatus runs, the processor can execute the computer execution instructions stored in the memory, so that the chip executes the method in the above method embodiments.

[0141] The terminal device, the computer storage medium, the computer program product or the chip provided by the embodiments of the present application are all used to execute the corresponding method provided above, and thus the beneficial effects that can be achieved are referred to the beneficial effects of the corresponding method provided above, which will not be repeated here.

[0142] The above mainly introduces the scheme provided by the embodiments of the present application from the perspective of the electronic device. In order to realize the above functions, it contains the hardware structure and / or software module corresponding to the execution of each function. Those skilled in the art should easily realize that, in combination with the units and algorithm steps of the examples described in the embodiments disclosed in the present application, the present application can be realized in the form of hardware or the combination of hardware and computer software. Whether a certain function is realized in the form of hardware or computer software driven hardware depends on the specific application and design constraints of the technical solution. The skilled person can use different methods to realize the described functions for each specific application, but such implementation should not be considered beyond the scope of the present application.

[0143] The embodiments of the present application can divide the functions of the devices involved in the above method examples into function modules, for example, each function module can be divided according to each function, or two or more functions can be integrated into one processing module. The above integrated module can be realized in the form of hardware or in the form of software function module. It should be noted that the division of the modules in the embodiments of the present application is illustrative, and is only a logical function division. When actually implemented, there can be another division method.

[0144] The functions or actions or operations or steps in the above embodiments can be realized by software, hardware, firmware or any combination thereof, in whole or in part. When realized by software, it can be realized in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the flow or function described in the embodiments of the present application is generated in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network or other programmable devices. The computer instructions can be stored in a computer readable storage medium or transferred from one computer readable storage medium to another, for example, the computer instructions can be transferred from one website, computer, server or data center to another website, computer, server or data center through wired (such as coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (such as infrared, wireless, microwave, etc.) mode. The computer readable storage medium can be any available medium that can be accessed by a computer or data storage device including one or more servers, data centers, etc. integrated with the medium. The available medium can be magnetic medium (such as floppy disk, hard disk, magnetic tape), optical medium (such as DVD), or semiconductor medium (such as solid state disk (SSD)) and the like.

[0145] Although the present application has been described in connection with certain specific features and embodiments thereof, it is to be understood that it is intended to cover all modifications and variations of this application which are within the scope of the appended claims and their equivalents. Accordingly, the description and drawings are to be regarded as illustrative in nature and not as restrictive. It will be apparent to those skilled in the art that various modifications and variations can be made to the present application without departing from the spirit or scope of the application. Thus, it is intended that the present application cover the modifications and variations of this application provided they come within the scope of the appended claims and their equivalents.

Claims

1. A testing apparatus of an electronic device, characterized by comprising: The test device comprises a host, a test box and a test link. The test box is used for placing a plurality of devices to be tested. The first end of the test link is wirelessly connected with the plurality of devices to be tested, and the second end of the test link is connected with the host. The host is used for determining total radiation power of each device to be tested through the test link, and calculating a first discrete value according to the total radiation power of each device to be tested. When the first discrete value is greater than a first preset value, a first contribution value of each device to be tested is calculated according to the total radiation power of each device to be tested. The device to be tested whose first contribution value is greater than a second preset value is identified as a device to be tested that fails to pass the test. The first discrete value is used for indicating a discrete degree of a first parameter of each device to be tested, the first parameter is specific absorption rate, the first parameter is positively correlated with the total radiation power, the first contribution value of the first device to be tested is used for indicating a contribution of the first device to be tested to the first discrete value, the first device to be tested is any device to be tested, and the first preset value and the second preset value are both positive numbers.

2. The apparatus of claim 1, wherein, The test device of the electronic device further comprises a control link. The first end of the control link is connected with the host, and the second end of the control link is wirelessly connected with the plurality of devices to be tested. Therefore, the host is further used for controlling the devices to be tested to enter a test state through the control link in response to receiving a test instruction, and the devices to be tested have the ability to receive and transmit radio frequency signals in the test state.

3. The apparatus of claim 2, wherein, The control link comprises a router and a first antenna, the host is connected with the first antenna through the router, and the first antenna is arranged in the test box and is connected with each device to be tested. Therefore, the host is specifically used for controlling the devices to be tested to enter the test state through the router and the first antenna in response to receiving the test instruction.

4. The device according to any of claims 1-3, characterized in that The test link comprises a router, a comprehensive tester, a radio frequency switch board and a plurality of second antennas, the host is connected with the plurality of second antennas through the router, the comprehensive tester and the radio frequency switch board in sequence. The host is further connected with the radio frequency switch board, and the plurality of second antennas are arranged in the test box and are wirelessly connected with each device to be tested. The router is used for realizing communication between the host and the comprehensive tester. The comprehensive tester is used for receiving a test case sent by the host and outputting a radio frequency signal corresponding to the test case. The radio frequency switch board is used for controlling connection and disconnection between each second antenna and the comprehensive tester and connection and disconnection between each second antenna and the host.

5. The apparatus of claim 1, wherein, The host is specifically configured to measure the receiving power of each of the devices under test at different spatial positions through the test link; determine the gain of each of the devices under test at different spatial positions according to the receiving power of each of the devices under test at different spatial positions; determine the transmitting power of each of the devices under test at different spatial positions according to the gain of each of the devices under test at different spatial positions, the pre-stored input power of the antenna in each of the devices under test, and the pre-stored feed line loss of the antenna in each of the devices under test; and integrate the transmitting power of each of the devices under test at different spatial positions to obtain the total radiation power of each of the devices under test.

6. The device of any of claims 1-3 or 5, wherein, The host is further configured to identify each of the devices under test as passing the test when the first discrete value is less than a first preset numerical value.

7. The apparatus of claim 1, wherein, The test box is an electromagnetic wave shielding box; and the inner wall of the test box is provided with a wave-absorbing material for shielding electromagnetic waves.

8. The apparatus of claim 1, wherein, The test box is provided with one or more placement tables; and the placement tables are used for placing one or more of the devices under test.

9. The apparatus of claim 1, wherein, The test box is provided with a switch door; the switch door is connected to the host through a pneumatic cylinder; and the host is further configured to control the switch door to open and close through the pneumatic cylinder. The switch door is opened to allow the devices under test to pass through.

10. The device of any of claims 1-3, 5, 8, or 9, wherein, The first discrete value is a variance or a standard deviation.

11. A test method of an electronic device, characterized by, The host is applied to a test device for testing an electronic device according to any one of claims 1-10; and the method comprises: determining the total radiation power of each of the devices under test; calculating a first discrete value according to the total radiation power of each of the devices under test; the first discrete value is used to indicate the dispersion degree of a first parameter of each of the devices under test; the first parameter is specific absorption rate; and the first parameter is positively correlated with the total radiation power; when the first discrete value is greater than a first preset numerical value, calculating a first contribution value of each of the devices under test according to the total radiation power of each of the devices under test; wherein the first contribution value of a first device under test is used to indicate the contribution of the first device under test to the first discrete value, and the first device under test is any one of the devices under test; identifying a device under test as failing when the first contribution value of the device under test is greater than a second preset numerical value; and the first preset numerical value and the second preset numerical value are both positive numbers.

12. The method of claim 11, wherein, Before the determination of the total radiation power of each of the devices under test, the method further comprises: in response to receiving a test instruction, controlling the devices under test to enter a test state.

13. The method of claim 11, wherein, The determination of the total radiation power of each of the devices under test comprises: obtaining the receiving power of each of the devices under test at different spatial positions; determining the gain of each of the devices under test at different spatial positions according to the receiving power of each of the devices under test at different spatial positions; determining the transmitting power of each of the devices under test at different spatial positions according to the gain of each of the devices under test at different spatial positions, the pre-stored input power of the antenna in each of the devices under test, and the pre-stored feed line loss of the antenna in each of the devices under test; integrating the transmitting power of each of the devices under test at different spatial positions to obtain the total radiation power of each of the devices under test.

14. The method according to any one of claims 11-13, characterized in that, After the first discrete value is calculated according to the total radiant power of each of the devices under test, the method further includes: When the first discrete value is less than a first preset value, identifying each of the devices under test as passing the test.

15. An electronic device, comprising: The electronic device includes one or more processors and one or more memories; the one or more memories are coupled to the one or more processors, and the one or more memories store computer instructions; When the one or more processors execute the computer instructions, the electronic device performs the test method of the electronic device as claimed in any one of claims 11-14.

16. A computer-readable storage medium, characterized in that, The computer readable storage medium includes computer instructions, which, when executed, perform the test method of the electronic device as claimed in any one of claims 11-14.

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