Intelligent testing method and system for connection state of electric connector

Abstract

The invention relates to the technical field of electric connector testing, in particular to an intelligent testing method and system for the connection state of an electric connector, and the method comprises the steps: obtaining the resistance values and temperature parameters of the electric connector and a circuit at all moments in a vibration testing process; acquiring the resistance coefficient of each moment according to the difference between the resistance value of each moment and the initial resistance value; obtaining a circuit state coefficient of each moment according to the change of the resistance value of each moment and the adjacent moment, the change of the resistance coefficient and the difference of the temperature data, and marking the corresponding moment; obtaining a change stability parameter of each marked moment; screening all marked moments to obtain stable moments; and obtaining an overall fluctuation index of the circuit according to the number of all the stable moments and the distribution condition of the change stable parameters, and testing the connection state of the electric connector. The invention aims to improve the accuracy of the connection state test of the electric connector.

Description

Technical Field

[0001] The present application relates to the technical field of electrical connector testing, and in particular to an intelligent testing method and system for the connection status of an electrical connector. Background Art

[0002] Electrical connectors are used in a variety of electronic devices to achieve electrical connectivity between circuits. Testing the connection status of electrical connectors is essential to ensure the safe, stable and efficient operation of electrical systems. By regularly testing connectors, problems such as poor contact, looseness or corrosion can be discovered in a timely manner, and faults such as current interruption, overheating or signal distortion can be avoided, thereby improving system reliability and performance, extending the service life of equipment, and complying with industry standards to ensure the safety and long-term stability of equipment.

[0003] In some devices, due to vibration or movement of the device, the electrical connector may be displaced, resulting in friction and vibration between the connector and the circuit. This friction can cause fluctuations in contact resistance, resulting in unstable circuit connection, which in turn distorts the connection status test results of the electrical connector, affecting the working efficiency and overall performance of the electrical connector. Summary of the invention

[0004] In view of the above, it is necessary to provide an intelligent testing method and system for the connection status of an electrical connector to solve the above problems.

[0005] A first aspect of the present application provides an intelligent testing method for a connection state of an electrical connector, the method comprising:

[0006] Obtaining the initial resistance value of the electrical connector to be tested before the vibration test and the resistance value and temperature parameters at each moment during the vibration test;

[0007] The resistance coefficient at each moment is obtained by comparing the resistance value at each moment with the initial resistance value; the circuit state coefficient at each moment is obtained by comparing the resistance value, resistance coefficient and temperature parameters between each moment and the adjacent moments;

[0008] Based on the numerical characteristics of the circuit state coefficient, the corresponding moment is marked; the change of the current state coefficient of the marked moment and its adjacent moments is compared to obtain the change stability parameter of each marked moment;

[0009] Based on the changing stability parameter, all marked moments are screened to obtain stable moments; according to the number of all stable moments and the distribution of stable moments, combined with the overall distribution characteristics of the changing stability parameter, the overall circuit fluctuation index is obtained to test the connection status of the electrical connector.

[0010] The obtaining of the resistivity at each moment is specifically as follows:

[0011] The difference between the resistance value at each moment in the vibration test and the initial resistance value is calculated and recorded as the first difference; the normalized value after the negative correlation mapping result of the initial resistance value is fused with the first difference is used as the resistance coefficient at each moment.

[0012] The specific process of obtaining the circuit state coefficient at each moment is as follows:

[0013] The wear coefficient at each moment is obtained by the change of the resistance value at each moment and the adjacent moment and the change of the resistivity;

[0014] The difference between the temperature parameters at each moment and the adjacent moments is recorded as the temperature rise value at each moment;

[0015] Based on the wear coefficient and the temperature rise value at each moment, the circuit state coefficient at each moment is obtained; wherein the circuit state coefficient is positively correlated with the wear coefficient and negatively correlated with the temperature rise value at each moment.

[0016] The wear coefficient at each moment is obtained as follows:

[0017] The resistance value ratio of each moment to the moment before each moment is calculated, and the difference between the resistivity of each moment and the resistivity of the moment before each moment is recorded as the second difference; the resistance value ratio and the second difference are merged to obtain the wear coefficient of each moment.

[0018] The marking of the corresponding moments specifically includes: marking the moments when the circuit state coefficient is less than a preset value.

[0019] The formula of the change stability parameter of each marked moment is: Where v represents the change stability parameter at each marked moment; g represents the current state coefficient at each marked moment; g′ represents the current state coefficient at the moment after each marked moment; softsign ′ () represents the derivative function of the softsign function; Δg represents the absolute value of the difference between the current state coefficient at each marked moment and the next moment.

[0020] The stable moment is specifically a marked moment when the change stability parameter is greater than or equal to a preset stability threshold.

[0021] The circuit overall fluctuation index is obtained as follows:

[0022] The number of all stable moments during the vibration test is counted and recorded as the duration number; the number of all moments before the first stable moment is counted and recorded as the transition number: the ratio of the transition number to the duration number is calculated, and the negative correlation mapping of the mean value of the changing stability parameters of all marked moments is combined to obtain the overall circuit fluctuation index.

[0023] The process of testing the connection status of the electrical connector is specifically as follows:

[0024] When the circuit overall fluctuation index is greater than a preset fluctuation threshold, it is determined that the connection state of the electrical connector is abnormal; otherwise, it is determined that the connection state of the electrical connector is normal.

[0025] In a second aspect, an embodiment of the present application also provides an intelligent testing system for the connection status of an electrical connector, comprising a memory, a processor, and a computer program stored in the memory and running on the processor, wherein the processor implements the steps of any one of the above methods when executing the computer program.

[0026] In the above scheme, the resistance value and temperature parameters of the electric connector during the vibration test are analyzed, and the circuit state coefficient is obtained by comparing the change characteristics of the resistance value and the temperature parameters at adjacent moments, combined with the change characteristics of the resistance value at each moment relative to the change characteristics before the vibration test. The beneficial effect is to measure the relationship between the degree of wear of the electric connector and the current contact surface and the change of the temperature parameter; as the temperature parameter increases, the wear debris generated by the wear of the electric connector and the circuit contact surface will soften, and the resistance value will decrease at this time. Therefore, based on the numerical characteristics of the circuit state coefficient, the corresponding moments are marked, which helps to find the moment when the resistance value decreases after wear occurs, so as to facilitate subsequent analysis based on these moments; taking into account the contact surface As the temperature parameters increase, wear and tear occurs, the chips soften, and then the chips form abrasive particles. The resistance value is affected in the process. Therefore, the change of the current state coefficient at the marked moment and its adjacent moment is compared to obtain the change stability parameter of each marked moment. The beneficial effect is that the vibration resistance of the electrical connector during the vibration process when it is loaded is analyzed; based on the change stability parameter, all marked moments are screened to obtain stable moments, which is convenient for subsequent analysis based on the distribution of stable moments to obtain the overall circuit fluctuation index. The beneficial effect is that the contact resistance and temperature rise resistance on the load circuit are distinguished, so as to obtain the real test results of the electrical connector and improve the accuracy of the connection state test of the electrical connector. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 A flowchart of the steps of an intelligent testing method for the connection status of an electrical connector provided by one embodiment of the present application;

[0028] Figure 2A schematic diagram of obtaining the overall fluctuation index of a circuit provided in one embodiment of the present application. DETAILED DESCRIPTION

[0029] In the description of the embodiments of the present application, words such as "exemplary", "or", "for example" and the like are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary", "or", "for example" and the like is intended to present related concepts in a concrete manner.

[0030] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art in the present application. The terms used in the specification of the present application are only for the purpose of describing specific embodiments and are not intended to limit the present application.

[0031] It should also be noted that the terms "first" and "second" in this application and the accompanying drawings are used to distinguish similar objects, rather than to describe a specific order or sequence. The method disclosed in the embodiments of the present application or the method shown in the flow chart includes one or more steps for implementing the method. Without departing from the scope of protection of the present application, the execution order of multiple steps can be interchanged with each other, and some steps can also be deleted.

[0032] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.

[0033] The specific scheme of an intelligent testing method and system for the connection status of an electrical connector provided by the present application is described in detail below with reference to the accompanying drawings.

[0034] See also Figure 1 , which shows a flowchart of a method for intelligently testing the connection status of an electrical connector provided by an embodiment of the present application, the method comprising the following steps:

[0035] The first step is to obtain the initial resistance value of the electrical connector to be tested before the vibration test and the resistance value and temperature parameters at each moment during the vibration test.

[0036] For electrical connectors working in a vibration environment, long-term vibration may have an adverse effect on their safety and stability. Therefore, when performing intelligent testing on the connection state of the electrical connector, it is necessary to analyze the impact of vibration on the connection state of the electrical connector: first, install a vibration drive module, which can adjust the vibration frequency and vibration amplitude to simulate the vibration state of the electrical connector in different environments; then connect the electrical connector to be tested with the test circuit, and before performing the vibration test, detect the connected circuit to ensure the stability and effectiveness of the vibration test; secondly, monitor the circuit by using current sensors and voltage sensors to obtain the current parameters and voltage parameters at each moment, and use Ohm's law to calculate the resistance value between the electrical connector and the circuit at each moment. It should be noted that the connection position of the current sensor and the voltage sensor is placed outside the vibration drive module to prevent vibration from causing vibration between the sensor and the circuit to affect the accuracy of the experimental results; an infrared temperature sensor is used to obtain the temperature parameters of the electrical connector pins at each moment during the test.

[0037] It should be noted that the current parameters, voltage parameters, and temperature parameters are collected synchronously, the time interval for collecting data is 1 minute, and the duration of the vibration test is 10 hours. The implementer can adjust it according to the actual situation; the resistance value when no vibration test is performed is recorded as the initial resistance value.

[0038] The second step: obtain the resistance coefficient at each moment by comparing the resistance value at each moment with the initial resistance value; obtain the circuit state coefficient at each moment by comparing the resistance value, resistance coefficient and temperature parameters between each moment and the adjacent moments.

[0039] During the use of electrical connectors, although electrical connection is formed between the pins and the circuit interface, from a microscopic perspective, the contact between the pins and the interface is not completely flat and perfect. In fact, the contact surface usually has a certain surface roughness, which is manifested as irregular ups and downs and unevenness. Due to the uneven contact surface, the contact resistance between the contact points may be uneven, which will affect the electrical and thermal performance of the electrical connector, especially under high current load, which may cause the contact point temperature to rise or the risk of poor contact.

[0040] When the electrical connector generates vibration and friction during use, the peaks of the contact surface will collide with each other, thereby generating wear debris. The wear debris may exist at the top of the peak or at the bottom of the valley, thereby reducing the contact area and increasing the contact resistance, affecting the overall working efficiency of the circuit. The resistance coefficient at each moment is obtained by the difference between the resistance value at each moment and the initial resistance value: the difference between the resistance value at each moment and the resistance value before the vibration test is calculated, recorded as the first difference; the normalized value after the negative correlation mapping result of the initial resistance value is fused with the first difference is used as the resistance coefficient at each moment.

[0041] In this embodiment, the initial resistance value is recorded as R o , the resistance value at each moment is recorded as R, and the formula of the resistivity at each moment is: Among them, norm() represents the normalization function.

[0042] During the use of electrical connectors, if they are in a vibrating environment for a long time, the friction on the contact interface caused by the vibration will produce tiny wear debris. These wear debris may accumulate between the contact points or contact surfaces, causing the gap between the electrical connector and the circuit to increase, the contact surface to decrease, and the contact resistance to increase.

[0043] Based on this, the wear coefficient at each moment is obtained by analyzing the changes in the resistance value between each moment and the adjacent moment and the changes in the resistivity: the resistance value ratio between each moment and the moment before is calculated, and the difference between the resistivity at each moment and the resistivity at the moment before each moment is recorded as the second difference; the resistance value ratio and the second difference are merged to obtain the wear coefficient at each moment.

[0044] In this embodiment, the difference between the resistance coefficients is measured by the difference; multiple variables are integrated by multiplication, that is, the wear coefficient is specifically the product of the resistance value ratio and the second difference.

[0045] It should be understood that a larger wear coefficient means that more wear debris is generated due to friction between the contact surface of the electrical connector and the circuit connection part, and a greater impact on the contact surface.

[0046] Continuous circuit load causes the circuit temperature to rise, especially the connection part between the electrical connector and the circuit. Due to the existence of contact resistance, the temperature rise phenomenon of the contact part is more obvious. The temperature rise phenomenon is accompanied by the increase of the resistance of the circuit conductor, which further increases the resistance of the contact part.

[0047] Based on this, according to the difference between the temperature data at each moment and the adjacent moments, combined with the wear coefficient, the circuit state coefficient at each moment is obtained: the difference between the temperature parameters at each moment and the previous moment is recorded as the temperature rise value at each moment; based on the wear coefficient and the temperature rise value at each moment, the circuit state coefficient at each moment is obtained; wherein, the circuit state coefficient is positively correlated with the wear coefficient, and negatively correlated with the temperature rise value at each moment.

[0048] In this embodiment, the wear coefficient at each moment is recorded as F, the temperature rise value at each moment is recorded as T, and the formula form of the circuit state coefficient at each moment is: ε represents a parameter preset to be greater than zero to prevent the denominator from being 0. The circuit state coefficient is used to represent the corresponding relationship between the wear coefficient and the temperature rise of the circuit at each moment and the previous moment.

[0049] The third step: based on the numerical characteristics of the circuit state coefficient, mark the corresponding moment; compare the change of the current state coefficient of the marked moment with that of the adjacent moment to obtain the change stability parameter of each marked moment.

[0050] The temperature rise caused by the continuous connection of current during the vibration process of the circuit will soften the wear debris generated by vibration wear. The softened wear debris is squeezed by the electrical connector pins and the circuit interface to deform, thereby increasing the contact area between the pins and the interface and reducing the contact resistance. Therefore, in view of the resistance change fluctuation under this phenomenon, the moment when the circuit state coefficient is less than the preset value is marked; in this embodiment, the preset value is 0. When the circuit state index is less than the preset value, the additional resistance of the overall circuit decreases, that is, the contact resistance decreases by more than the temperature rise resistance increases.

[0051] Furthermore, under the temperature rise phenomenon, the softened wear debris will accelerate oxidation and form abrasive particles. While increasing the resistance, the contact surface is reduced due to the accumulation of abrasive particles, increasing the contact resistance. In this state, the additional resistance of the circuit increases, thereby affecting the output efficiency of the overall circuit. Based on this, the change of the current state coefficient at the marked moment and its adjacent moments is compared to obtain the change stability parameter of each marked moment, and its formula form is: Where g represents the current state coefficient at each marked moment; g′ represents the current state coefficient at the moment after each marked moment; Δg represents the absolute value of the difference between the current state coefficient at each marked moment and the moment after it; softsign ′ () represents the derivative of the softsign function. The closer the independent variable value is to 0, the larger the derivative value is and the closer it is to 1. It should be understood that The closer Δg is to 0, the closer the circuit state at the marked moment is to its adjacent moment, and the greater the change stability parameter is.

[0052] The fourth step: based on the changing stability parameter, all marked moments are screened to obtain stable moments; according to the number of all stable moments and the distribution of stable moments, combined with the overall distribution characteristics of the changing stability parameter, the overall circuit fluctuation index is obtained to test the connection status of the electrical connector.

[0053] During use, electrical connectors need to have a long lifespan, and the current will be connected for a long time. To ensure the safety and efficiency of the circuit, the current of the electrical connector should be ensured to be continuously stable during use, and the transition time from the fluctuation of the circuit connected current to the stabilization of the current should be as short as possible and the duration should be as long as possible. Therefore, the change stability parameters of all marked moments are obtained, and the marked moments with change stability parameters greater than or equal to the preset stability threshold are taken as stable moments. The number of all stable moments is counted and recorded as the continuous number; the number of all moments before the first stable moment is counted and recorded as the transition number: the ratio of the transition number to the continuous number is calculated, and the negative correlation mapping of the mean of the change stability parameters of all marked moments is combined to obtain the overall circuit fluctuation index.

[0054] In this embodiment, the number of continuations is recorded as A, the number of transitions is recorded as B, and the average value of the change stability parameters of all marked moments is recorded as The formula form of the overall fluctuation index of the circuit is: Among them, the schematic diagram of obtaining the overall fluctuation index of the circuit is as follows Figure 2 shown.

[0055] It should be understood that It can be used to express the ratio of transition duration to duration. The larger the value is, the greater the circuit fluctuation is and the more unstable the connection state of the electrical connector is, that is, the greater the overall circuit fluctuation index is. The larger the overall change stability parameter is, the smaller the overall circuit fluctuation is, that is, the smaller the overall circuit fluctuation index is.

[0056] According to the preset fluctuation threshold, the connection state of the electrical connector is tested based on the overall fluctuation index of the circuit: when the overall fluctuation index of the circuit is greater than the preset fluctuation threshold, the connection state of the electrical connector is judged to be abnormal; otherwise, the connection state of the electrical connector is judged to be normal. In this embodiment, the fluctuation threshold is 0.6, and the implementer can adjust it according to the actual situation.

[0057] Based on the same inventive concept as the above method, an embodiment of the present application also provides an intelligent testing system for the connection status of an electrical connector, comprising a memory, a processor, and a computer program stored in the memory and running on the processor, wherein the processor implements the steps of any one of the above-mentioned intelligent testing methods for the connection status of an electrical connector when executing the computer program.

[0058] In summary, the present application analyzes the resistance value and temperature parameters during the vibration test of the electric connector, and obtains the circuit state coefficient by comparing the change characteristics of the resistance value and temperature parameters at adjacent moments, combined with the change characteristics of the resistance value at each moment relative to the change characteristics before the vibration test. The beneficial effect is to measure the relationship between the degree of wear of the electric connector and the current contact surface and the change of the temperature parameter; as the temperature parameter increases, the wear debris generated by the wear on the contact surface between the electric connector and the circuit will soften, and the resistance value will decrease at this time. Therefore, based on the numerical characteristics of the circuit state coefficient, the corresponding moments are marked, which helps to find the moment when the resistance value decreases after wear occurs, so as to facilitate subsequent analysis based on these moments; taking into account the contact As the temperature parameters increase, the surface wears and produces debris, the debris softens, and then the debris forms abrasive particles. The resistance value is affected in the process. Therefore, the change of the current state coefficient of the marked moment and its adjacent moment is compared to obtain the change stability parameter of each marked moment. The beneficial effect is that the vibration resistance of the electrical connector during the vibration process when it is loaded is analyzed; based on the change stability parameter, all the marked moments are screened to obtain the stable moment, which is convenient for subsequent analysis according to the distribution of the stable moment to obtain the overall circuit fluctuation index. The beneficial effect is that the contact resistance and temperature rise resistance on the load circuit are distinguished, so as to obtain the real test result of the electrical connector and improve the accuracy of the connection state test of the electrical connector.

[0059] The flowchart and block diagram in the accompanying drawings show the possible architecture, function and operation of the system, method and computer program product according to the embodiment of the present application. In this regard, each box in the flowchart or block diagram can represent a module, a program segment or a part of the code, and the module, the program segment or a part of the code contains one or more executable instructions for realizing the specified logical function. In some alternative implementations, the function marked in the box can also occur in a different order from the order marked in the accompanying drawings. For example, two continuous boxes can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, which can depend on the functions involved. In the description corresponding to the flowchart and the block diagram in the accompanying drawings, the operations or steps corresponding to different boxes can also occur in a different order from the order disclosed in the description, and sometimes there is no specific order between different operations or steps. For example, two continuous operations or steps can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, which can depend on the functions involved. Each block in the block diagrams and / or flowcharts, and combinations of blocks in the block diagrams and / or flowcharts, may be implemented by a dedicated hardware-based system that performs the specified functions or actions, or may be implemented by a combination of dedicated hardware and computer instructions.

[0060] For those skilled in the art, it is obvious that the present application is not limited to the details of the above exemplary embodiments, and the present application can be implemented in other specific forms without departing from the basic features of the present application. Therefore, no matter from which point of view, the above embodiments of the present application should be regarded as exemplary and non-restrictive; the technical solutions recorded in the above embodiments are modified, or some of the technical features are replaced by equivalents, which does not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application, and should be included in the protection scope of the present application.

Claims

1. An intelligent testing method for the connection status of an electrical connector, characterized in that: The method comprises the following steps: Obtaining the initial resistance value of the electrical connector to be tested before the vibration test and the resistance value and temperature parameters at each moment during the vibration test; The resistance coefficient at each moment is obtained by comparing the resistance value at each moment with the initial resistance value; the circuit state coefficient at each moment is obtained by comparing the resistance value, resistance coefficient and temperature parameters between each moment and the adjacent moments; Based on the numerical characteristics of the circuit state coefficient, the corresponding moment is marked; the change of the current state coefficient of the marked moment and its adjacent moments is compared to obtain the change stability parameter of each marked moment; Based on the changing stability parameter, all marked moments are screened to obtain stable moments; according to the number of all stable moments and the distribution of stable moments, combined with the overall distribution characteristics of the changing stability parameter, the overall circuit fluctuation index is obtained to test the connection status of the electrical connector.

2. An intelligent testing method for the connection status of an electrical connector according to claim 1, characterized in that: The resistivity at each moment is obtained as follows: The difference between the resistance value at each moment in the vibration test and the initial resistance value is calculated and recorded as the first difference; the normalized value after the negative correlation mapping result of the initial resistance value is fused with the first difference is used as the resistance coefficient at each moment.

3. The intelligent testing method for the connection status of an electrical connector according to claim 1, characterized in that: The specific process of obtaining the circuit state coefficient at each moment is: The wear coefficient at each moment is obtained by the change of the resistance value at each moment and the adjacent moment and the change of the resistivity; The difference between the temperature parameters at each moment and the adjacent moments is recorded as the temperature rise value at each moment; Based on the wear coefficient and the temperature rise value at each moment, the circuit state coefficient at each moment is obtained; wherein the circuit state coefficient is positively correlated with the wear coefficient and negatively correlated with the temperature rise value at each moment.

4. The intelligent testing method for the connection status of an electrical connector according to claim 3, characterized in that: The wear coefficient obtained at each moment is specifically: The resistance value ratio of each moment to the moment before each moment is calculated, and the difference between the resistivity of each moment and the resistivity of the moment before each moment is recorded as the second difference; the resistance value ratio and the second difference are merged to obtain the wear coefficient of each moment.

5. The intelligent testing method for the connection status of an electrical connector according to claim 1, characterized in that: The marking of the corresponding moments specifically includes: marking the moments when the circuit state coefficient is less than a preset value.

6. The intelligent testing method for the connection status of an electrical connector according to claim 1, characterized in that: The formula of the change stability parameter of each marked moment is: Where v represents the change stability parameter at each marked moment; g represents the current state coefficient at each marked moment; g′ represents the current state coefficient at the moment after each marked moment; softsign ′ () represents the derivative function of the softsign function; Δg represents the absolute value of the difference between the current state coefficient at each marked moment and the next moment.

7. The intelligent testing method for the connection status of an electrical connector according to claim 1, characterized in that: The stable moment is specifically a marked moment when the change stability parameter is greater than or equal to a preset stability threshold.

8. The intelligent testing method for the connection status of an electrical connector according to claim 1, characterized in that: The circuit overall fluctuation index is obtained as follows: The number of all stable moments during the vibration test is counted and recorded as the duration number; the number of all moments before the first stable moment is counted and recorded as the transition number: the ratio of the transition number to the duration number is calculated, and the negative correlation mapping of the mean value of the changing stability parameters of all marked moments is combined to obtain the overall circuit fluctuation index.

9. The intelligent testing method for the connection status of an electrical connector according to claim 1, characterized in that: The process of testing the connection status of the electrical connector is specifically as follows: When the circuit overall fluctuation index is greater than a preset fluctuation threshold, it is determined that the connection state of the electrical connector is abnormal; otherwise, it is determined that the connection state of the electrical connector is normal.

10. An intelligent testing system for the connection status of an electrical connector, comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 9 are implemented.

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