Automatic aging test method and device for intelligent household equipment

Abstract

The invention provides an automatic aging test method and device for intelligent household equipment, and the method can enable a model to generate aging test parameters meeting preset requirements based on an input instruction, and carries out the aging test of to-be-tested equipment based on the aging test parameters through automatic test equipment. After the test result is obtained, the input instruction is iterated and updated for multiple times, and the test steps are executed again, so that the accurate test result is obtained. According to the scheme provided by the invention, the aging test is executed through the automatic test equipment, the test strategy can be automatically adjusted according to the test result so as to better adapt to the characteristics of different equipment, the automation degree of the test process is improved, the test can be performed more efficiently and accurately, meanwhile, manual intervention is reduced, and the test efficiency is improved. Errors caused by human factors are greatly reduced, potential problems of the smart home equipment can be found more quickly, and hidden troubles of faults are eliminated in advance, so that the overall quality and long-term stability of the equipment are improved.

Description

Technical Field

[0001] The present invention belongs to the technical field of aging test for household appliances, and in particular relates to an automatic aging test method and device for intelligent household appliances. Background Art

[0002] With the rapid development of smart home devices, their quality and stability have become key factors affecting user experience and market competitiveness. Aging testing is an indispensable part of the production process of smart home devices. It can simulate various environmental conditions and working conditions of the equipment during long-term use, so as to discover potential problems in advance and ensure the reliability and stability of the equipment in actual use.

[0003] However, traditional aging test methods have many shortcomings. On the one hand, manual operation accounts for a large proportion of the test process, which is not only inefficient but also easily interfered by human factors, making it difficult to ensure the accuracy and consistency of the test results. For example, manually setting test parameters, manually recording test data, and subjective judgment of test results may introduce errors. On the other hand, the test process often needs to be repeated many times, but due to the frequent manual intervention, it is difficult to ensure accurate test results.

[0004] In recent years, although some test systems have begun to introduce automated testing technology, there are still limitations. Most systems can only perform simple power-on and power-off tests, and the detection of equipment is not comprehensive enough. Although a few systems can perform simulation tests under complex conditions, the testing strategies are also relatively limited and cannot ensure that they can adapt to the characteristics of different smart home devices. Summary of the invention

[0005] In order to overcome the defects of the prior art, the present invention proposes an automatic aging test method for intelligent home appliances, the method comprising:

[0006] In response to an input instruction, the model generates an aging test parameter that meets a preset requirement based on the input instruction;

[0007] Performing an aging test on the device to be tested based on the aging test parameters by an automatic testing device;

[0008] The test results are obtained through the automatic testing equipment and a terminal that is communicatively connected to the equipment under test, so as to iteratively update the input instruction based on the test results and re-execute the step of "responding to the input instruction, causing the model to generate aging test parameters that meet preset requirements based on the input instruction" until the preset test end conditions are met.

[0009] Specifically, the “response to the input instruction, causing the model to generate aging test parameters that meet preset requirements based on the input instruction” includes:

[0010] Generate instruction information based on an instruction template including information about the device under test and test process information of an aging test; if the aging test has been performed before the start of the current test process, update the instruction information based on the test results of the previous aging test.

[0011] Use the current instruction information as the input instruction to input into the model, so that the model generates the aging test parameters meeting the preset requirements in response to the input instruction.

[0012] Specifically, the "obtaining test results through the automatic test device and a terminal communicatively connected to the device under test" includes:

[0013] Obtain the test time nodes and un-sent messages of the device under test by the automatic test device, and simultaneously obtain each message received by the terminal device from the device under test and the reception time of each message.

[0014] Correspond each message and its reception time to the test time nodes respectively to generate several groups of test data, and determine the test time nodes not used for generating the test data as event loss nodes.

[0015] Generate the test results based on each group of the test data, each of the un-sent messages, and each of the event loss nodes.

[0016] Further, the "responding to the input instruction to enable the model to generate aging test parameters meeting the preset requirements based on the input instruction" includes:

[0017] Respond to the input instruction to enable the model to generate aging test parameters meeting the preset requirements based on the input instruction, and correspondingly generate setting reasons for each of the aging test parameters.

[0018] Preferably, the preset requirements include that the aging test parameters include test method parameters, test times parameters, test interval time parameters, and single test duration parameters.

[0019] The preset test end conditions include that the number of rounds of the aging test reaches a preset number of rounds and / or the test results of the aging test for consecutive preset rounds are the same or the error does not exceed a preset value.

[0020] Preferably, the automatic test device and the terminal device are respectively connected to a server, so that the server obtains the test data of the automatic test device and the message data of the terminal device, and executes the step of "obtaining test results through the automatic test device and a terminal communicatively connected to the device under test".

[0021] The present invention also provides an automatic aging test device for intelligent home appliances, the device comprising:

[0022] An input module, configured to respond to an input instruction, and cause the model to generate aging test parameters meeting preset requirements based on the input instruction;

[0023] A test module, configured to perform an aging test on a device under test based on the aging test parameters through an automatic test device;

[0024] A processing module, configured to obtain a test result through the automatic test device and a terminal communicatively connected to the device under test, so as to iteratively update the input instruction based on the test result and cause the input module to re-execute preset steps until a preset test end condition is met.

[0025] Specifically, the input module includes:

[0026] A generating unit, configured to generate instruction information based on an instruction template including information of the device under test and test process information of the aging test;

[0027] An updating unit, configured to update the instruction information based on a test result of a previous aging test if an aging test has been performed before the start of the current test process;

[0028] An input unit, configured to input the current instruction information as the input instruction into the model, so that the model responds to the input instruction and generates the aging test parameters meeting preset requirements.

[0029] Specifically, the processing module includes:

[0030] An obtaining unit, configured to obtain a test time node and an un-sent message of the automatic test device for the device under test, and simultaneously obtain each message received by the terminal device from the device under test and a reception time of each message;

[0031] A dividing unit, configured to correspond each message and its reception time to the test time node respectively to generate several groups of test data, and determine a test time node not used for generating the test data as an event loss node;

[0032] A processing unit, configured to generate the test result based on each group of the test data, each of the un-sent messages and each of the event loss nodes.

[0033] The present invention also provides a storage medium, characterized in that computer instructions are stored thereon, and when the instructions are executed by a processor, the steps of the automatic aging test method for intelligent home appliances as described above are implemented.

[0034] The present invention has at least the following beneficial effects:

[0035] In the solution proposed by the present invention, the automated test generates test parameters by inputting instructions and automatically executes the test, reducing manual operations and interventions, improving the test efficiency, and being able to automatically update the input instructions and test parameters. The test iteration and feedback mechanism enable each test to be optimized and improved based on the previous test, making the entire test process intelligent and dynamic. It does not solely rely on fixed test parameters but can self-adjust according to real-time data, enhancing the accuracy of test results, avoiding repetitive inefficient operations, and being able to flexibly generate various aging test parameters according to different input instructions and requirements. The test scope is wider, applicable to a variety of smart home devices. With the iterative update of test conditions, it can gradually approach the actual usage environment and extreme conditions of the product, more comprehensively evaluating the performance and durability of the device;

[0036] Furthermore, the solution proposed by the present invention generates instruction information through instruction templates and preset test processes, which can ensure the standardization and consistency of the test process, avoiding errors that may occur when manually inputting instructions. Moreover, the instruction templates and test processes can be customized according to different devices and requirements, supporting the testing of different types of smart home devices, enhancing adaptability and flexibility; by updating the instruction information based on the results of the previous aging test, it can automatically learn and optimize the test parameters and optimize the test process, thereby improving the accuracy and pertinence of each round of testing;

[0037] At the same time, through the real-time data collection of the automatic test device and the terminal device in this solution, the device status and test results can be obtained in real time, facilitating the rapid diagnosis of the performance changes of the device during the aging process. By associating the test time node, message reception time, test data, and event loss node, a complete test data set can be constructed to ensure the comprehensiveness and accuracy of the data. And by automatically detecting and identifying anomalies or data loss in the test, it can help developers quickly locate potential problems, reducing errors and inconsistencies; by generating the setting reasons for the corresponding aging test parameters, it can provide a detailed explanation and description of the test decision and configuration, making the test process more transparent and facilitating decision-makers to understand the background and basis of each round of test settings, further enhancing the credibility of the test method;

[0038] In addition, in this solution, by centrally obtaining the data of the automatic test device and the terminal device through the server, centralized management and real-time update of the data can be achieved, avoiding the problem of data dispersion, improving the efficiency of data analysis and processing, ensuring that the test results are more comprehensive and accurate, evaluating the performance of the device from multiple dimensions, providing more data support, and also realizing remote monitoring and management, improving the flexibility and operability of the test system, and facilitating rapid response.

[0039] Therefore, the present invention provides an automatic aging test method and device for intelligent home appliances. The solution proposed by the present invention performs aging tests through an automatic test device, which can automatically adjust the test strategy according to the test results to better adapt to the characteristics of different devices, improve the automation level of the test process, enable the test to be carried out more efficiently and accurately, reduce manual intervention at the same time, greatly reduce the errors caused by human factors, and can discover potential problems of smart home appliances faster, eliminate potential faults in advance, thereby improving the overall quality and long-term stability of the devices. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0041] Figure 1 It is the overall flowchart of the automatic aging test method for intelligent home appliances provided in Embodiment 1;

[0042] Figure 2 It is the schematic diagram of the method flow of the automatic aging test method for intelligent home appliances provided in Embodiment 1;

[0043] Figure 3 It is the schematic diagram of the method flow for the model to generate aging test parameters;

[0044] Figure 4 It is the schematic diagram of the method flow for obtaining test results;

[0045] Figure 5 It is the schematic diagram of the module structure of the automatic aging test device for intelligent home appliances provided in Embodiment 2.

[0046] REFERENCE NUMERALS

[0047] 10 - Input module; 11 - Generation unit; 12 - Update unit; 13 - Input unit; 20 - Test module; 30 - Processing module; 31 - Acquisition unit; 32 - Division unit; 33 - Processing unit. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0048] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, rather than all of them. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present invention.

[0049] In the following, various embodiments of the present invention will be described more fully. The present invention may have various embodiments, and adjustments and changes may be made therein. However, it should be understood that there is no intention to limit the various embodiments of the present invention to the specific embodiments disclosed herein, but the present invention should be understood to cover all adjustments, equivalents and / or alternative options falling within the spirit and scope of the various embodiments of the present invention.

[0050] In the following, the term "comprising" or "may comprise" that may be used in various embodiments of the present invention indicates the presence of the disclosed functions, operations or elements, and does not limit the addition of one or more functions, operations or elements. Further, as used in various embodiments of the present invention, the terms "comprising", "having" and their cognates are only intended to represent a specific feature, number, step, operation, element, component or combination of the foregoing items, and should not be construed as precluding the existence or addition of one or more other features, numbers, steps, operations, elements, components or combinations of the foregoing items first.

[0051] In various embodiments of the present invention, the expression "or" or "at least one of A or / and B" includes any combination or all combinations of the listed words. For example, the expression "A or B" or "at least one of A or / and B" may include A, may include B, or may include both A and B.

[0052] Expressions (such as "first", "second", etc.) used in various embodiments of the present invention may modify various constituent elements in the various embodiments, but do not limit the corresponding constituent elements. For example, the above expressions do not limit the order and / or importance of the elements. The above expressions are only for the purpose of distinguishing one element from other elements. For example, the first user device and the second user device indicate different user devices, although both are user devices. For example, without departing from the scope of the various embodiments of the present invention, the first element may be referred to as the second element, and similarly, the second element may also be referred to as the first element.

[0053] It should be noted that in the present invention, unless otherwise clearly specified and defined, terms such as "installed", "connected", "fixed", etc. should be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or an integral connection; it may be a mechanical connection or an electrical connection; it may be a direct connection or an indirect connection through an intermediate medium; it may be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0054] In the present invention, those of ordinary skill in the art need to understand that the terms indicating orientation or positional relationship in the text are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as a limitation to the present invention.

[0055] The terms used in the various embodiments of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the various embodiments of the present invention. As used herein, the singular forms are also intended to include the plural forms unless the context clearly indicates otherwise. Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by those of ordinary skill in the art to which the various embodiments of the present invention pertain. The terms (such as those defined in a general use dictionary) will be interpreted as having the same meaning as the contextual meaning in the relevant technical field and will not be interpreted as having an idealized meaning or an overly formal meaning unless clearly defined in the various embodiments of the present invention.

[0056] Aging test is a test method used to evaluate the performance stability and reliability of a device under long-term use or specific environmental conditions. Aging test can make the device experience changes that may occur after years of normal use in a short period of time, presenting an effect similar to time acceleration.

[0057] For the test steps that need to be performed multiple times in the aging test, if completed manually, it will consume a long time and labor costs and is difficult to achieve precisely. Automated test is a software test method that automatically executes test tasks. By using specialized test tools and scripts to simulate user operations and performing tests based on software applications, it verifies whether aspects such as the function, performance, and reliability of the device meet the expectations.

[0058] Embodiment 1

[0059] This embodiment combines an automatic test device with a model and proposes an automatic aging test method for intelligent home devices. Please refer to Figure 1 - Figure 2 , and the method includes:

[0060] S100: In response to an input instruction, cause the model to generate aging test parameters that meet preset requirements based on the input instruction.

[0061] It should be noted that the model used in step S100 of this embodiment may include, but is not limited to, large language models including the chatgpt-4o model; large language models can deeply understand the semantic, syntactic, and pragmatic information of the scenarios described in the text, accurately grasp the core intention and key information of the scenarios described by users, can better analyze the work scenarios, and through the large language models, can analyze the scenarios of the device, so as to find more appropriate automated aging test parameter settings and return the reasons, so that the automated aging test can achieve better test results, and can make the device meet the effects that the aging test wants to achieve, reduce resource usage, and empower traditional automated aging tests.

[0062] Preferably, the aging test parameters generated in step S100 need to meet the conditions of the preset parameter range. And while the model generates aging test parameters that meet the preset requirements based on the input instruction, the model will correspondingly generate the setting reasons for the respective aging test parameters, so that the user can judge the rationality of the generated aging test parameters based on the setting reasons, and make corresponding optimization adjustments through understanding and learning the reasons. At the same time, the output format of the aging test parameters needs to be fixed in JSON format;

[0063] Exemplarily, when the user judges that there are aging test parameters with insufficient rationality based on the setting reasons, step S100 can be re-executed to regenerate new aging test parameters and their corresponding setting reasons.

[0064] S200: Execute an aging test on the device under test based on the aging test parameters through an automatic test device.

[0065] Optionally, in this embodiment, the preset requirements for the generated aging test parameters in step S100 further include having test method parameters, test times parameters, test interval time parameters, and single test duration parameters, so as to perform tests that meet the requirements of the test method parameters and test times parameters based on the single test duration test and test interval time test in step S200.

[0066] S300: Obtain the test results through the automatic test device and the terminal communicatively connected to the device under test, so as to iteratively update the input instruction based on the test results and re-execute step S100 until the preset test end condition is met.

[0067] It should be noted that in the same round of tests, the devices under test for which the aging test is performed each time step S200 is executed are different individual devices with the same state, that is, there are several devices under test with the same initial state preset. After step S200 is executed, the method proposed in this embodiment will select the devices under test that have not undergone the aging test to replace the devices under test that have undergone the aging test.

[0068] In this embodiment, the preset test end conditions in step S300 may include, but are not limited to, the number of rounds of aging test reaching the preset number of rounds, the test results of consecutive preset rounds of aging test being the same or the error not exceeding the preset value, etc.

[0069] In summary, in this embodiment, the test method of the automatic test equipment for the device under test may not be unique and unchangeable; in the method proposed in this embodiment, the automated aging test can be divided into multiple rounds of testing. In each round of testing, the actual test situation of this round will be sent to the large model as the result, and then appropriate parameters will be re-obtained from the large model as the parameters for the next round, so as to dynamically adjust the aging test parameters and then make corresponding adjustments to the test method.

[0070] In a specific embodiment, the input instruction may include Prompt. Prompt is a structured input format or sample preset when using an artificial intelligence or machine learning model, used to guide the model to generate an output that meets the requirements. The user can set a Prompt template containing some fillable variables or keywords, and these variables will be modified or replaced according to actual needs. Prompt will be passed as input to the model and split into basic language units such as words or symbols (Tokens) through tokenization, so as to generate different responses or results; please refer to Figure 3 , step S100 specifically includes:

[0071] S110: Generate instruction information based on the instruction template including the information of the device under test and the test process information of the aging test.

[0072] If the aging test has not been performed before the start of the test process in this round, execute step S130; if the aging test has been performed before the start of the test process in this round, execute step S120, and execute step S130 after step S120 is completed.

[0073] S120: Update the instruction information based on the test results of the previous aging test.

[0074] S130: Use the current instruction information as the input instruction to input into the model, so that the model generates aging test parameters that meet the preset requirements in response to the input instruction.

[0075] Preferably, in step S130, the method proposed in this embodiment can utilize the self-attention mechanism to enable the model to focus on the core information of Prompt and perform semantic analysis by associating the context, so as to extract the key elements affecting the parameter settings of the aging test parameters.

[0076] Specifically, please refer to Figure 4, the terminal device communicatively connected to the device under test in step S300 may include a mobile phone. The application of the mobile phone, i.e., the app side, is connected to the device under test and can receive the messages sent by the device under test, so as to generate a test result based on the data of the automatic test device, the time when the messages are received by the mobile phone app side, and the content of the messages. Thus, the "obtaining the test result through the automatic test device and the terminal communicatively connected to the device under test" described in step S300 specifically includes:

[0077] S310: Obtain the test time node of the automatic test device for the device under test and the unsent messages, and at the same time obtain each message received by the terminal device from the device under test and the reception time of each message.

[0078] Exemplarily, when the terminal device includes a mobile phone, the method proposed in this embodiment can use the subprocess module in python to execute the specified command "adb logcat -c" to clear the current log buffer of the mobile phone, and at the same time execute the specified command adb logcat>log.txt to capture the mobile phone logs for a period of time, so as to obtain all the messages received by the mobile phone process during this time interval.

[0079] In a specific embodiment, after the automatic test device tests the device under test, the device signal will be transmitted to the IPC server, and then transmitted to the HDMS server through the signal, so that the HDMS server can query through the interface to automatically check whether an event list appears on the mobile phone app side, and at the same time automatically capture the mobile phone logs to judge whether the message is sent and whether there is a message pop-up window. According to the time when the mobile phone sends the message, calculate the time interval from the time when the test tool presses to the time when the mobile phone sends the message. Record the results and relevant information of each test, and finally output an automated aging test report.

[0080] S320: Corresponding each message and its reception time to the test time node respectively to generate several groups of test data, and determining the test time nodes not used for generating test data as event loss nodes.

[0081] Specifically, the test time node of the automatic test device for the device under test includes the start time and end time of a single test. By recording the start time and end time of a single test and corresponding them to the messages, the time when the messages are sent to the mobile phone can be obtained, so as to calculate the full process time of the test operation.

[0082] S330: Generate a test result based on each group of test data, each unsent message, and each event loss node.

[0083] In this embodiment, the automated test device is communicatively connected to the remote server, and the server is connected to the mobile phone as the terminal device. Step S330 can save the recorded test results and relevant information using the xlwt module in Python, output an automated aging test report, summarize the overall situation and conclusions of the test. The automated aging test report can include, but is not limited to, information about the device under test, the Prompt template generated for the device under test in each round, the obtained automated aging test parameters and reasons; the test results of each test operation, including whether the occurrence of the server test event can be queried and displayed on the app side, whether a pop-up window can be obtained for the messages sent by the mobile phone, and the time of the entire process, so as to obtain the automated aging test report of the product.

[0084] Exemplarily, when the device under test includes a smart doorbell, the method proposed in this embodiment will set reasonable test parameters in each round of testing according to the situation of the smart doorbell, enable the device to perform multiple tests through instructions, and record signal transmission and log data. Thus, after each round of testing is completed, the test results are provided as input, and the model generates new test parameters;

[0085] In a specific embodiment, if the number of tests in a certain round is 50,000 times, including 50 loss events and 10 cases where messages are not sent, the automated aging test report will also include an event loss rate of 50 / 50,000 = 0.1%, a message non - sending rate of 10 / 50,000 = 0.02%, and that the log capture event obtained through each group of test data needs to exceed 10 seconds, etc. Combining the previously preset test effect goals such as ensuring high - frequency test coverage and avoiding device overload, the model infers the modification direction of balancing the test frequency and device performance, and then iteratively updates the input instruction, that is, the Prompt accordingly;

[0086] Thus, the model can gradually generate reasonable parameters through the built - in causal language modeling mechanism, combine the Prompt template with the task objective, generate dynamically reasonable parameter values, so as to achieve optimization goals such as reducing the failure rate, improving the test efficiency, and ensuring the stable operation of the device;

[0087] Exemplarily, the Prompt template used for smart doorbell testing can be:

[0088] product_name = "smart doorbell" / / Product name

[0089] product_type = "smart home products" / / Product type

[0090] product_feature = "pressing the doorbell" / / Product function

[0091] product_location = "placed at the door" / / Product placement location

[0092] product_scenario = "someone visits and presses the doorbell" / / Product usage scenario

[0093] test_description: "Perform multiple rounds of automated aging tests on the product. In each round, place the product in the automated aging test tool, set reasonable automated aging test parameters, and the computer sends command parameters to the automated aging test tool by executing the program. The automated aging test tool receives the command and performs multiple tests on the device. Each time the device sends a signal and each time the product is tested, it sends a signal to the server. The server sends a message to the mobile phone. The occurrence of the test event can be queried through the server interface. At this time, the mobile phone log will be captured for more than 10 seconds to determine whether the server message has been sent to the mobile phone. During this period, no testing can be performed."After this round of automated aging tests is completed, each test result and related information are recorded, and the execution status of this round of tests issent as a parameter to the large language model. The large language model regenerates the prompt template based on the product and calls the large language model for a new round of automated aging tests. When the number of iterations is exhausted, the automated aging test ends" / / Test process description.

[0094] number_of_test_rounds = "5" / / Number of test rounds

[0095] test_situation:"in this round of 50,000tests,the number of times themobile phone event list could not find the test event is:50times,and thenumber of times the server did not send a message to the mobile phone is:10times" / / Each round of test situation, the first round of test does not need to be used, each round of test after the first round of test can be combined with the execution of the previous round of test, so as to facilitate the model to analyze and optimize according to the actual test execution situation

[0096] Example 2

[0097] See also Figure 5 This embodiment proposes an automatic aging test device for intelligent home appliances, which is used to implement the automatic aging test method for intelligent home appliances proposed in Embodiment 1. The device includes:

[0098] An input module 10, configured to, in response to an input instruction, cause a model to generate aging test parameters that meet preset requirements based on the input instruction;

[0099] A test module 20, configured to perform an aging test on a device under test based on the aging test parameters through an automatic test device;

[0100] A processing module 30, configured to obtain test results through an automatic test device and a terminal communicatively connected to the device under test, so as to iteratively update the input instruction based on the test results and cause the input module 10 to re-execute preset steps until a preset test end condition is met.

[0101] In this embodiment, the model used by the input module 10 may include, but is not limited to, large language models including the ChatGPT-4o model; the aging test parameters generated by the input module 10 need to meet the preset parameter range conditions, and while causing the model to generate aging test parameters that meet preset requirements based on the input instruction, the model will be caused to generate setting reasons corresponding to the respective aging test parameters, so that the user can judge the rationality of the generated aging test parameters based on the setting reasons, and perform corresponding optimization adjustments through understanding and learning of the reasons. At the same time, the output format of the aging test parameters needs to be fixed in the JSON format;

[0102] Preferably, the preset requirements for the aging test parameters generated by the input module 10 further include having test method parameters, test times parameters, test interval time parameters, and single test duration parameters, so that the test module 20 performs tests that meet the requirements of the test method parameters and the test times parameters through the automatic test device based on the single test duration test and the test interval time test.

[0103] In this embodiment, the preset test end conditions of the processing module 30 may include, but are not limited to, the number of rounds of the aging test reaching a preset number of rounds, the test results of consecutive preset rounds of the aging test being the same or the error not exceeding a preset value, etc.

[0104] In a specific embodiment, the input instruction may include a Prompt. A Prompt is a structured input format or sample preset when using an artificial intelligence or machine learning model, used to guide the model to generate a compliant output. The user can set a Prompt template containing some fillable variables or keywords, and these variables will be modified or replaced according to actual needs. The Prompt will be passed as input to the model and will be split into basic language units (Tokens) such as words or symbols through tokenization, so as to generate different responses or results; specifically, the input module 10 includes:

[0105] A generation unit 11, configured to generate instruction information based on an instruction template including information of a device under test and test process information of an aging test;

[0106] An update unit 12, configured to update the instruction information based on the test result of the previous aging test if the aging test has been performed before the start of the current test process;

[0107] An input unit 13, configured to input the current instruction information as an input instruction into a model, so that the model generates aging test parameters meeting preset requirements in response to the input instruction.

[0108] Specifically, if the aging test has not been performed before the start of the current test process, after the generation unit 11 performs preset steps, the input unit 13 is made to perform preset steps; if the aging test has been performed before the start of the current test process, after the generation unit 11 performs preset steps, the update unit 12 is made to perform preset steps, and after the update unit 12 finishes performing the preset steps, the input unit 13 is made to perform preset steps.

[0109] Preferably, the input unit 13 can utilize the self-attention mechanism (Self-Attention) to enable the model to focus on the core information of the Prompt, and perform semantic analysis by associating with the context, so as to extract key elements affecting the parameter settings of the aging test parameters.

[0110] Specifically, the processing module 30 can use a mobile phone as a terminal device communicatively connected to the device under test. The application program of the mobile phone, i.e., the app side, is connected to the device under test and can receive messages sent by the device under test, so as to generate a test result based on the data of the automatic test device, the time when the mobile phone app side receives the message, and the content of the message. The processing module 30 includes:

[0111] An acquisition unit 31, configured to acquire the test time node of the device under test by the automatic test device and the unsent messages, and simultaneously acquire each message received by the terminal device from the device under test and the reception time of each message;

[0112] A division unit 32, configured to respectively correspond each message and its reception time to the test time node to generate several groups of test data, and determine the test time nodes not used for generating the test data as event loss nodes;

[0113] A processing unit 33, configured to generate a test result based on each group of test data, each unsent message, and each event loss node.

[0114] Exemplarily, when the terminal device includes a mobile phone, the device proposed in this embodiment can use the subprocess module in Python to execute the specified command "adb logcat -c" to clear the current log buffer of the mobile phone, and at the same time execute the specified command adb logcat>log.txt to capture the mobile phone logs for a period of time, so as to obtain all the messages received by the mobile phone process during this period of time.

[0115] Specifically, the test time nodes of the automatic test device for the device under test include the start time and end time of a single test. By recording the start time and end time of a single test and associating them with the messages, the time when the messages are sent to the mobile phone can be obtained, so as to calculate the full process time of the test operation.

[0116] In this embodiment, the automated test device is communicatively connected to the remote server, and the server is connected to the mobile phone as the terminal device. The processing unit 33 can save the recorded test results and relevant information using the xlwt module in Python, output an automated aging test report, summarize the overall situation and conclusions of the test. The automated aging test report may include, but is not limited to, information about the device under test, the Prompt template generated for each round based on the device under test, the obtained automated aging test parameters and reasons; the test results of each test operation, including whether the occurrence of the server test event can be queried and displayed on the app side, whether a pop-up window can be obtained for the messages sent by the mobile phone, and the full process time, so as to obtain an automated aging test report for the product.

[0117] Embodiment 3

[0118] This embodiment also proposes a computer-readable storage medium, on which computer instructions are stored. When the instructions are executed by a processor, the steps of the automatic aging test method for the intelligent home device proposed in the above Embodiment 1 are implemented.

[0119] Note that computer-readable media includes both permanent and non-permanent, removable and non-removable media that can store information by any method or technology. The information can be computer-readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, compact disc read-only memory (CD-ROM), digital versatile disc (DVD) or other optical storage, magnetic cassette tapes, disk storage, quantum memory, graphene-based storage media or other magnetic storage devices, or any other non-transmission media that can be used to store information accessible by a computing device. As defined herein, computer-readable media does not include transitory media such as modulated data signals and carrier waves.

[0120] In summary, the present invention provides an automatic aging test method and device for intelligent home devices. The solution proposed by the present invention performs aging tests through an automatic test device, can automatically adjust the test strategy according to the test results to better adapt to the characteristics of different devices, improves the automation degree of the test process, enables the test to be carried out more efficiently and precisely, reduces manual intervention at the same time, greatly reduces the errors caused by human factors, can discover potential problems of smart home devices faster, and eliminates potential fault hazards in advance, thereby improving the overall quality and long-term stability of the devices.

[0121] The above are only the preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. An automatic aging test method for intelligent home devices, characterized in that, The method includes: In response to an input instruction, causing a model to generate aging test parameters that meet preset requirements based on the input instruction; Performing an aging test on a device under test based on the aging test parameters by an automatic test device; Obtaining test results through the automatic test device and a terminal communicatively connected to the device under test, so as to iteratively update the input instruction based on the test results and re-perform the step of "in response to an input instruction, causing a model to generate aging test parameters that meet preset requirements" until a preset test end condition is satisfied.

2. The method according to claim 1, characterized in that, The step of "in response to an input instruction, causing a model to generate aging test parameters that meet preset requirements" includes: Generating instruction information based on an instruction template including information about the device under test and test process information of the aging test; if an aging test has been performed before the start of the current test process, updating the instruction information based on the test results of the previous aging test; Using the current instruction information as the input instruction and inputting it into the model, so that the model generates the aging test parameters that meet preset requirements in response to the input instruction.

3. The method according to claim 1, wherein The step of "obtaining test results through the automatic test device and a terminal communicatively connected to the device under test" includes: Obtaining the test time nodes and untransmitted messages of the automatic test device for the device under test, and simultaneously obtaining each message received by the terminal device from the device under test and the reception time of each message; Corresponding each message and its reception time to the test time nodes respectively to generate several groups of test data, and determining the test time nodes not used for generating the test data as event loss nodes; Generating the test results based on each group of the test data, each of the untransmitted messages, and each of the event loss nodes.

4. The method according to claim 1 or 2, characterized in that, The step of "in response to an input instruction, causing a model to generate aging test parameters that meet preset requirements" includes: In response to the input instruction, causing the model to generate aging test parameters that meet preset requirements based on the input instruction, and correspondingly generating setting reasons for each of the aging test parameters.

5. The method according to claim 1 or 2, characterized in that, The preset requirements include that the aging test parameters include test method parameters, test times parameters, test interval time parameters, and single test duration parameters; The preset test end conditions include that the number of rounds of the aging test reaches a preset number of rounds and / or the test results of consecutive preset rounds of aging tests are the same or the error does not exceed a preset value.

6. The method according to claim 1 or 3, characterized in that, The automatic test device and the terminal device are respectively connected to a server, so that the server obtains the test data of the automatic test device and the message data of the terminal device, and performs the step of "obtaining test results through the automatic test device and a terminal communicatively connected to the device under test".

7. An automatic aging test device for an intelligent home device, characterized in that, The device includes: An input module, configured to, in response to an input instruction, cause a model to generate aging test parameters that meet preset requirements based on the input instruction; A test module, configured to perform an aging test on a device under test based on the aging test parameters by an automatic test device; A processing module, configured to obtain test results through the automatic test device and a terminal communicatively connected to the device under test, so as to iteratively update the input instruction based on the test results and cause the input module to re-execute a preset step until a preset test end condition is met.

8. The device according to claim 7, characterized in that, The input module includes: A generating unit, configured to generate instruction information based on an instruction template including information of the device under test and test process information of the aging test; An updating unit, configured to update the instruction information based on the test results of the previous aging test if the aging test has been performed before the start of the current test process; An input unit, configured to input the current instruction information as the input instruction into the model, so that the model generates the aging test parameters meeting preset requirements in response to the input instruction.

9. The device according to claim 7, wherein The processing module includes: An obtaining unit, configured to obtain a test time node of the device under test by the automatic test device and untransmitted messages, and simultaneously obtain various messages received by the terminal device from the device under test and the reception time of each message; A dividing unit, configured to correspond each message and its reception time to the test time node respectively to generate several groups of test data, and determine a test time node not used for generating the test data as an event loss node; A processing unit, configured to generate the test results based on each group of the test data, each of the untransmitted messages, and each of the event loss nodes.

10. A storage medium, characterized in that, It stores computer instructions, which, when executed by a processor, implement the steps of the method according to any one of claims 1-6.

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