Particle size measuring device based on combination of dynamic light scattering method and sedimentation method and measuring method thereof

By combining the particle size measurement device with dynamic light scattering method and sedimentation method, the problem that the prior art cannot simultaneously measure the particle size distribution in the nano-micron range is solved, and efficient and accurate particle size measurement is achieved.

CN120369550APending Publication Date: 2025-07-25DANDONG BETTERSIZE INSTR LTD +1
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Patent Information

Application Number
CN202510706754.7
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-05-29
Publication Date
2025-07-25

AI Technical Summary

Technical Problem

The existing particle size measurement methods cannot accurately measure the particle size distribution in the nano-micron range during a test process. The dynamic light scattering method cannot detect nano-scale particles suspended in liquid, and the sedimentation method cannot cover micro-scale particles.

Method used

The particle size measurement device combined with dynamic light scattering method and sedimentation method is used to measure large and small particles simultaneously through lasers, light intensity adjustment units, sample cells, PD detectors, optical fiber heads, APD detectors, data acquisition units and control units, and data processing is carried out using Mi's theory and autocorrelation technology.

Benefits of technology

It realizes efficient and accurate measurement of particle size distribution information in the nano-micron range of a wide distribution particle dispersion system during a test, with a wide measurement range, high accuracy and small sample volume.

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Abstract

The invention discloses a particle size measuring device based on combination of a dynamic light scattering method and a sedimentation method and a measuring method thereof. The particle size measuring device comprises a laser, a light intensity adjusting unit, a sample pool, a thermostatic bath, a PD detector, an optical fiber head, an APD detector, a data acquisition unit, a PC and a control unit. The laser emits incident laser, the incident laser passes through the light intensity adjusting unit, penetrates through the sample cell and a sample and then enters the PD detector, and a transmission light signal is collected through the data acquisition unit and transmitted to software for calculating the particle size and concentration of settled large particles; scattered light is received by an optical fiber head with a fixed angle of 90 degrees or 160-175 degrees and is converted into a digital signal by an APD detector, and the digital signal enters a data acquisition unit and is transmitted to software for calculating the particle size of particles in a non-settling nanometer range. According to the technical scheme provided by the invention, the particle size distribution information of the wide-distribution particle dispersion system in a nano-micron range can be measured in a testing process.
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