Multi-channel test method, electronic equipment and test system thereof

Abstract

The embodiment of the invention discloses a multi-channel test method, electronic equipment and a test system thereof, and the method comprises the steps: receiving first identification information obtained by scanning of scanning equipment, and selecting a corresponding test channel according to the first identification information; the test channel is provided with a to-be-tested circuit board in advance; receiving second identification information obtained by scanning the to-be-tested circuit board by the scanning equipment; sending a test instruction to the test equipment on the corresponding test channel to enable the test equipment to test the to-be-tested circuit board according to a pre-configured test item to generate test data; and obtaining test data, and storing the test data according to the second identification information. By means of the mode, multi-channel parallel test preparation can be achieved, the test efficiency is improved, the overall test time is shortened, and therefore the test cost and human resource investment are reduced; and cloud storage and tracing of test data can be realized.

Description

Technical Field

[0001] The embodiments of the present invention relate to the field of functional testing, and in particular to a multi-channel testing method, electronic equipment and a testing system thereof. Background Art

[0002] A functional circuit tester (FCT) is a specialized testing device that simulates the operating environment of a printed circuit board assembly (PCBA) to verify its functional integrity. Based on the board's design requirements, the device operates in both normal operating mode and pre-set fault protection mode. By collecting key parameters such as voltage, current, and signal waveforms in real time under each state, the device systematically evaluates the board's functional performance, logical response, and protection mechanism effectiveness using pre-set criteria.

[0003] In the current FCT PCBA single board test, a single-channel test method and approach is used. This technical solution has the following defects:

[0004] Low test efficiency: Once a single-channel FCT system begins testing, other operations cannot be performed simultaneously. Therefore, operators must wait for the current PCBA to complete before beginning the next PCBA test. This primarily involves removing the upper and lower PCBAs from the fixture and wiring the test ports. This single-channel operation results in low test efficiency.

[0005] High testing costs: A single-channel FCT system usually requires a longer test cycle to complete the testing of the same number of PCBA boards. When the test cycle needs to be shortened, more FCT test platforms need to be built, which means more human resources and test equipment must be invested, resulting in an exponential increase in costs.

[0006] Most single-channel FCT systems have significant limitations and shortcomings in terms of efficiency and cost. For application scenarios that require high-efficiency, large-scale testing, the above problems are even more prominent. Summary of the Invention

[0007] The main technical problem solved by the embodiments of the present invention is to provide a multi-channel testing method, electronic equipment and testing system thereof, which can overcome at least some of the defects of existing testing systems.

[0008] In a first aspect, an embodiment of the present invention provides a multi-channel testing method, which is applied to a control device of a test system, wherein the test system also includes a scanning device and several test channels, including: receiving first identification information obtained by scanning by the scanning device, and selecting a corresponding test channel according to the first identification information; the test channel is pre-set with a circuit board to be tested; receiving second identification information obtained by scanning the circuit board to be tested by the scanning device; sending a test instruction to the test device on the corresponding test channel, so that the test device tests the circuit board to be tested according to pre-configured test items and generates test data; obtaining the test data, and storing the test data according to the second identification information.

[0009] Optionally, a first mapping relationship between a test channel and the first identification information is pre-stored in the control device; selecting the corresponding test channel according to the first identification information includes: determining the test channel corresponding to the first identification information according to the first mapping relationship; and sending a prompt message to the user, prompting the user to scan the circuit board to be tested set on the test channel corresponding to the first identification information.

[0010] Optionally, obtaining the test data and storing the test data according to the second identification information includes: obtaining the test data; establishing a second mapping relationship between the test data and the second identification information; and storing the test data in a cloud storage server according to a preset data storage structure.

[0011] Optionally, after acquiring the test data and storing the test data according to the second identification information, the multi-channel testing method further includes: acquiring the second identification information and outputting corresponding test data according to the second identification information.

[0012] Optionally, the test system also includes a display device, and obtaining the second identification information and outputting corresponding test data based on the second identification information includes: receiving the second identification information obtained by scanning by the scanning device; retrieving test data having a second mapping relationship with the second identification information from a cloud storage server based on the second identification information; outputting the retrieved test data to the display device in a preset display format; and exporting the retrieved test data to a designated storage location in a preset file format in response to a user's export instruction.

[0013] In a second aspect, an embodiment of the present invention provides an electronic device, comprising: at least one processor; at least one network interface, the network interface being communicatively connected to the corresponding processor; and a memory being communicatively connected to the at least one processor; wherein the network interface is used to establish a communication connection between the processor and other external devices; the memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the multi-channel testing method as described in the first aspect.

[0014] In a third aspect, an embodiment of the present invention provides a non-volatile computer storage medium, which stores computer-executable instructions. The computer-executable instructions are executed by one or more processors, enabling the one or more processors to execute the multi-channel testing method described in the first aspect.

[0015] In a fourth aspect, an embodiment of the present invention provides a test system, comprising: a plurality of test channels; corresponding test equipment is arranged on the test channels, and a fixing device is provided on the test equipment for fixing the circuit board to be tested on the test equipment; a scanning device for scanning the test equipment and outputting first identification information; and scanning the circuit board to be tested and outputting second identification information; a control device, which is communicatively connected to a cloud storage server and is also electrically connected to the scanning device and the test equipment on the plurality of test channels, for executing the multi-channel testing method as described in the first aspect.

[0016] Optionally, the test system also includes auxiliary equipment for providing power and load for the circuit board to be tested, and the test equipment includes a control module and several relay modules; the control module and the several relay modules are electrically connected, and the auxiliary equipment is electrically connected to the several relay modules; the control module controls the opening and closing of different relay modules to form a corresponding test loop between the auxiliary equipment and the circuit board to be tested.

[0017] Optionally, the test device also includes a transmission module and a burning module. The control module is connected to the several relay modules through the transmission module, and the control module is also connected to the burning module; the control module controls the opening and closing of different relay modules through the transmission module, so that the auxiliary equipment and the circuit board to be tested form a corresponding test loop; the control module also burns the configuration data or firmware corresponding to the test item to the circuit board to be tested by turning on the burning module.

[0018] Optionally, after receiving the test instruction sent by the control device, the control module establishes an electrical connection between the circuit board to be tested and the test device by controlling the corresponding relay module in accordance with the pre-configured test items to form a corresponding test loop; the control module tests the circuit board to be tested in accordance with the test items; when testing the circuit board to be tested on any test channel, fixing and wiring of the circuit boards to be tested on other test channels are allowed; the control module collects test data in real time during the test process, and transmits the test data to the control device.

[0019] Optionally, the test system further includes: a display device connected to the control device, configured to receive and display test data sent by the control device in a preset display format.

[0020] The beneficial effects of the embodiments of the present invention are: different from the existing technology, the embodiments of the present invention can realize multi-channel parallel test preparation, improve test efficiency, reduce overall test time, thereby reducing test costs and human resource investment; and can realize cloud storage and traceability of test data. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] One or more embodiments are exemplarily illustrated by corresponding drawings, which do not constitute limitations on the embodiments. Elements with the same reference numerals in the drawings are represented as similar elements, and unless otherwise stated, the figures in the drawings do not constitute proportional limitations.

[0022] Figure 1 1 is a flow chart of a multi-channel testing method provided by an embodiment of the present invention;

[0023] Figure 2 is a schematic structural diagram of an electronic device provided by an embodiment of the present invention;

[0024] Figure 3 is a structural diagram of a test system provided by an embodiment of the present invention;

[0025] Figure 4 It is a structural schematic diagram of a testing device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0026] In order to facilitate the understanding of the present application, the present application is described in more detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that when an element is described as being "fixed to" another element, it can be directly on the other element, or there can be one or more centered elements therebetween. When an element is described as being "connected to" another element, it can be directly connected to the other element, or there can be one or more centered elements therebetween. The terms "upper", "lower", "inner", "outer", "bottom" and the like used in this specification indicate an orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application. In addition, the terms "first", "second", "third" and the like are used for descriptive purposes only and cannot be understood as indicating or implying relative importance.

[0027] Unless otherwise defined, all technical and scientific terms used in this specification have the same meanings as those commonly understood by those skilled in the art to which this application belongs. The terms used in this specification and in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application. The term "and / or" as used in this specification includes any and all combinations of one or more of the relevant listed items.

[0028] In addition, the technical features involved in different embodiments of the present application described below can be combined with each other as long as they do not conflict with each other.

[0029] The technical solution in this application will be described below with reference to the accompanying drawings.

[0030] First embodiment

[0031] An embodiment of the present invention provides a multi-channel testing method applied to a control device of a test system. The test system also includes a scanning device and several test channels, each of which includes a test device and a corresponding fixture. One end of the test device is connected to an auxiliary device, such as an AC power supply, an AC load, a DC power supply, a DC load, etc.; the other end is connected to the fixture.

[0032] The test equipment controls the connection between the auxiliary device and the circuit board under test, executing the test tasks according to the test item sequence. After receiving commands from the control device, the test equipment controls the closing and opening of the relay module to establish or cut off the electrical connection between the auxiliary device and the circuit board under test, forming different test circuits and returning the test data to the control device.

[0033] A fixture is a fixture used to hold the circuit board under test. It's an auxiliary testing tool used to securely hold the board to the test equipment, ensuring a stable position and reliable connection during testing. Each fixture has an independent and complete set of test port connections for establishing electrical connections to the test points on the circuit board under test.

[0034] In the embodiment of the present application, the testing device is a functional testing device (FCT), which is a device that tests components, circuit boards, subsystems, etc. through computer control.

[0035] The flow chart of the multi-channel testing method is as follows: Figure 1 As shown, the specific steps include:

[0036] Step S100: receiving first identification information obtained by scanning a scanning device, and selecting a corresponding test channel according to the first identification information.

[0037] Because the test system is equipped with multiple test channels, the operator can fix and connect the circuit boards to be tested in other test channels while testing any of the test channels. Therefore, before testing each test channel, the test channel is pre-installed with the circuit boards to be tested.

[0038] The first identification information is typically a unique identifier for the test device on the test channel, and may be, for example, a QR code, barcode, or other machine-readable identifier. A first mapping relationship between the test channels and the first identification information is pre-stored in the control device. Upon receiving the first identification information from the scanning device, the control device can query the first mapping relationship to accurately determine the test channel corresponding to the first identification information, thereby accurately sending subsequent test instructions.

[0039] Step S200: receiving second identification information obtained by scanning a circuit board to be tested by a scanning device.

[0040] The second identification information is a unique identifier of the circuit board to be tested, which can also be a QR code, barcode or other machine-readable identifier. The purpose of scanning the second identification information is to associate subsequent test results with the corresponding circuit board to be tested, facilitating traceability and management of test data.

[0041] Step S300: Sending a test instruction to a test device on a corresponding test channel, so that the test device tests the circuit board to be tested according to pre-configured test items and generates test data.

[0042] The test instructions contain specific test item information. After receiving the test instructions, the test equipment will perform a series of tests according to the preset test process, such as voltage testing, current testing, and signal waveform testing. The test equipment controls the relay module to establish an electrical connection between the circuit board under test and the test instrument, forming a test loop and collecting test parameters in real time.

[0043] Step S400: Acquire test data, and store the test data according to the second identification information.

[0044] Specifically, the control device acquires test data and stores the test data according to the second identification information. The test device returns the test data to the control device in real time during the test process. The control device associates the test data with the second identification information and stores it in a system storage device, such as a cloud storage server, according to a preset data storage structure.

[0045] Step S500: Acquire second identification information, and output corresponding test data according to the second identification information.

[0046] Specifically, when it is necessary to query the test results of a circuit board to be tested, the second identification information on the circuit board to be tested can be scanned, and the control device retrieves the corresponding test data from the storage device according to the received second identification information, and outputs the test data to the display device according to the preset display format.

[0047] The core advantage of multi-channel testing lies in the independence of multiple test channels, allowing operations at different stages to proceed simultaneously. Specifically, while one test channel is performing a test, operators can perform preparatory work such as loading and unloading boards and connecting test circuits on other test channels. This allows for parallel execution of testing and preparation, eliminating the time wasted on preparation required for single-channel testing.

[0048] In some embodiments of the present application, step S100 specifically includes the following steps:

[0049] Step S110: receiving first identification information obtained by scanning with a scanning device.

[0050] In a multi-channel test system, each FCT test device on a test channel has unique identification information, such as a QR code or barcode. The operator uses a scanning device (such as a barcode scanner) to scan the FCT test device on a specific test channel and uploads the obtained identification information (i.e., first identification information) to a control device (such as a PC). This identification information serves as the unique identity of the test channel and is used for subsequent channel selection and test control.

[0051] In specific operation, the operator holds a handheld scanner and scans the identification code on the FCT test unit. The scanner reads the information contained in the identification code and transmits it to the control device via a wired or wireless connection. After receiving this information, the control device proceeds to the next step of channel identification and selection.

[0052] Step S120: Determine the test channel corresponding to the first identification information according to the first mapping relationship.

[0053] Specifically, during the initial configuration phase of the test system, a database of mappings between test channels and first identification information, i.e., a first mapping, is pre-established and stored in the control device. Upon receiving the first identification information from the scanning device, the control device queries the mapping database to determine the test channel corresponding to the first identification information.

[0054] For example, if the scan acquires identification information of "FCT test device 1", the control device will determine that this corresponds to "channel 1" based on the mapping relationship; if the scan acquires identification information of "FCT test device N", it will determine that this corresponds to "channel N".

[0055] In practical applications, the mapping relationship can be flexibly configured according to the actual test environment, supporting the addition, reduction and adjustment of test channels, and improving the adaptability of the test system.

[0056] Step S130: Sending a prompt message to the user, prompting the user to scan the circuit board to be tested set on the test channel corresponding to the first identification information.

[0057] Specifically, after the control device determines the target test channel, it displays a prompt to the operator on the display interface, instructing them to scan the circuit board (PCBA) to be tested, which is fixed to the selected test channel. The prompt may include the selected channel number, operation instructions, and the location of the circuit board to be scanned, guiding the operator to perform the correct operation.

[0058] The purpose of sending prompts to users is to ensure that operators perform subsequent operations on the correct test channel, avoiding confusion in test results due to operational errors. This prompt mechanism also improves the standardization and traceability of the test process, allowing operators to complete standardized test procedures according to the guidance of the control device.

[0059] When the operator receives the prompt information, he will proceed to the next step - scanning the identification code (i.e., the second identification information) on the circuit board to be tested, uploading the circuit board information to the control device, and thus starting the test process of the channel.

[0060] In some embodiments of the present application, step S400 specifically includes the following steps:

[0061] Step S410: Acquire test data.

[0062] During the test process, the test equipment (FCT tester) performs a comprehensive functional test on the circuit board under test according to preconfigured test items. The test equipment controls the opening and closing of each relay module through the I / O module, establishing an electrical connection between the auxiliary equipment and the circuit board under test, forming different test loops. The test equipment then measures key electrical parameters such as voltage, current, and signal waveforms to generate test data. This test data is transmitted in real time from the test equipment to the control device (a PC host computer). The control device then processes and stores this test data.

[0063] As an example and not a limitation, test data typically includes the results of multiple test items, such as voltage test, current test, signal integrity test, functional test, etc. Each test item has corresponding parameters and result values, as well as pass / fail judgment results.

[0064] Step S420: establishing a second mapping relationship between the test data and the second identification information.

[0065] After the control device acquires the test data, it needs to associate this data with the unique identifier of the tested circuit board (second identification information) to form a second mapping relationship. This mapping relationship is the basis for test data management and traceability, ensuring that the test results of each tested circuit board are accurately recorded and stored.

[0066] The specific implementation method is to create an association field in the data structure, use the unique identifier of the tested circuit board (such as the QR code information) as the primary key or index, and associate the corresponding test data records. The association can be implemented using a database table structure, JSON object, or other suitable data structure.

[0067] Step S430: Store the test data in a cloud storage server according to a preset data storage structure.

[0068] Once the mapping is established, the control device uploads and stores the test data to a cloud storage server according to a predefined data storage structure. This predefined data storage structure typically includes fields such as test item name, test parameters, test results, timestamp, operator information, and an index structure for fast retrieval.

[0069] Cloud storage offers several advantages over local storage: data can be shared and accessed across different locations and devices; it offers greater data security and backup mechanisms; and it facilitates big data analysis and quality tracking. With cloud storage, production managers can remotely query test results, conduct data analysis, and conduct quality control.

[0070] In some embodiments of the present application, step S500 specifically includes the following steps:

[0071] Step S510: receiving second identification information obtained by scanning with a scanning device.

[0072] To query the historical test records for a circuit board under test, a user can use a scanning device (such as a barcode scanner) to scan the unique identification code on the circuit board. This identification code is typically a QR code or barcode printed on the circuit board and contains information such as the serial number and batch number of the circuit board. After the scanning device reads the identification code, it transmits the information to the control device, forming the second identification information.

[0073] After receiving the second identification information, the control device uses it as a search condition to search for corresponding test data in the storage system. The method of obtaining identification information by scanning is more efficient than manual input and reduces the possibility of input errors, thereby improving the accuracy of data retrieval.

[0074] Step S520: According to the second identification information, test data having a second mapping relationship with the second identification information is retrieved from the cloud storage server.

[0075] After receiving the second identification information, the control device sends a data retrieval request to the cloud storage server. The cloud storage server uses the second mapping relationship to query the database for the corresponding test data record based on the received second identification information.

[0076] The retrieved test data typically includes the results of multiple test items, such as parameter values ​​and pass / fail status for voltage tests, current tests, signal integrity tests, etc. In addition, it may also include metadata such as test time, test channels, and operator information, providing complete information about the test environment.

[0077] Step S530: outputting the retrieved test data to a display device according to a preset display format.

[0078] After the cloud storage server returns the retrieved test data to the control device, the control device formats the data and outputs it to the display device according to a preset display format. The preset display format typically includes information such as the test item list, parameter values, standard ranges, and test result status (pass / fail), presented in a table, chart, or other intuitive format.

[0079] The display format is designed to focus on data readability and highlight key information. For example, color coding (green for pass, red for fail) may be used to visually display test results, or charts may be used to show how parameters compare to standard ranges. This intuitive data display helps testers and quality management personnel quickly determine the test status of the circuit board.

[0080] Step S540: In response to the user's export instruction, the retrieved test data is exported to a designated storage location in a preset file format.

[0081] In addition to viewing test data on the display, the control device also supports exporting test data to files for further analysis, recording, or sharing. When the user issues an export command (such as clicking the Export button), the control device converts the retrieved test data into a pre-defined file format, such as CSV, Excel, PDF, or XML, and saves the file to the user-specified storage location.

[0082] The choice of a pre-set file format typically considers data integrity, compatibility, and subsequent processing requirements. For example, CSV facilitates data analysis and processing, PDF is suitable for formal reporting and archiving, and XML is ideal for inter-system data exchange. Export functionality enhances the practicality of the test system and supports more flexible data management and application scenarios.

[0083] Different from the existing technology, the multi-channel testing method provided by the embodiment of the present application allows the operator to use the test time to perform PCBA board loading and unloading and wiring work in other channels while testing a certain channel, thereby avoiding waiting time and speeding up the overall testing process, thereby realizing the parallelization of the testing process and the preparation process, significantly improving the testing efficiency, and reducing the testing cost and human resource investment; at the same time, a complete mapping relationship between the test data and the circuit board identification is established, and the data is stored in the cloud server, realizing the efficient management and traceability of the test data, facilitating quality control and problem analysis.

[0084] Second embodiment

[0085] The embodiment of the present invention also provides an electronic device based on the above multi-channel testing method, and its structural diagram is as follows: Figure 2 As shown, the electronic device 600 includes:

[0086] One or more processors 601, network interface 602, and memory 603, Figure 2 In the figure, a processor 601, a network interface 602 and a memory 603 are taken as an example.

[0087] The network interface 602 is in communication with the corresponding processor 601, and the processor 601 and the memory 602 can be connected via a bus or other means. Figure 2 The bus connection is taken as an example.

[0088] The network interface 602 is used to establish a communication connection between the processor 601 and other external devices, including the following types: RJ-46 interface, SC fiber interface, AUI interface, FDDI interface, and Console interface.

[0089] Memory 603, as a non-volatile computer-readable storage medium, can be used to store non-volatile software programs, non-volatile computer executable programs, and modules. Processor 601 executes the non-volatile software programs, instructions, and units stored in memory 603 to perform various functional applications and data processing of the electronic device, thereby implementing the multi-channel testing method of the above-mentioned method embodiment.

[0090] The memory 603 may include a program storage area and a data storage area, wherein the program storage area may store an operating system and applications required for at least one function; the data storage area may store data created based on the use of the electronic device, etc. In addition, the memory 603 may include a high-speed random access memory, and may also include a non-volatile memory, such as at least one disk storage device, a flash memory device, or other non-volatile solid-state storage device. In some embodiments, the memory 603 may optionally include a memory remotely located relative to the processor, and these remote memories may be connected to the electronic device via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0091] The one or more units are stored in the memory 603 and, when executed by one or more processors, perform the multi-channel testing method in any of the above method embodiments, for example, performing the multi-channel testing method described above. Figure 1 Method steps S100 to S500.

[0092] The electronic device can execute the multi-channel testing method provided by the embodiment of the present invention, and has the corresponding program modules and beneficial effects of the execution method. For technical details not fully described in the electronic device embodiment, please refer to the multi-channel testing method provided by the embodiment of the present invention.

[0093] Third embodiment

[0094] Embodiments of the present invention also provide a non-volatile computer-readable storage medium. This non-volatile computer-readable storage medium may be included in the device described in the above embodiments, or may exist independently and not incorporated into the device. This non-volatile computer-readable storage medium carries one or more programs that, when executed, implement the multi-channel testing method of the disclosed embodiments.

[0095] Fourth embodiment

[0096] Reference Figure 3 , Figure 3 This is a schematic diagram of the structure of a test system provided by an embodiment of the present invention. Figure 3 As shown, the test system 10 includes multiple test channels 310 , 320 , . . . , 3N0 , a scanning device 200 , a control device 100 , a cloud storage server 20 and an auxiliary device 400 .

[0097] Each of the multiple test channels 310, 320, ..., 3N0 is equipped with a corresponding test device 3110, 3210, ..., 3N10. Each test device is equipped with a fixture 3120, 3220, ..., 3N20 for securing the circuit board (PCBA) under test to the test device. The test device is an FCT functional test device used to simulate the operating environment of the circuit board under test and verify its functional integrity. The fixture is a specialized fixture used to securely position the circuit board under test and ensure its reliable connection to the test port. Each fixture is equipped with an independent and complete set of test port connection circuits for establishing an electrical connection with the test points of the circuit board under test.

[0098] Multiple test channels are independent of each other but share the same set of test instrument resources and are controlled by the same control device. Through the multi-channel design, the test system 10 can simultaneously test one channel while operators can load materials and connect wires in other channels, thereby improving overall testing efficiency.

[0099] Scanning device 200 is used to scan the test equipment and output first identification information, and scan the circuit board to be tested and output second identification information. Scanning device 200 can be a barcode scanner or other suitable scanning device, capable of reading QR codes or barcodes on the test equipment and the circuit board to be tested, and uploading the read information to control device 100. The first identification information is used to identify and distinguish different test channels, and the second identification information is used to identify and distinguish different circuit boards to be tested.

[0100] The control device 100 is in communication with the cloud storage server 20 and is also electrically connected to the scanning device 200 and the test devices on multiple test channels. The control device 100 serves as the control center for the entire test system, responsible for receiving scan information, selecting test channels, issuing test instructions, and receiving and storing test data. The control device is typically a PC equipped with dedicated test software. It automatically selects the corresponding test channel based on the identification information obtained through scanning and executes the test process.

[0101] Specifically, the control device 100 receives the first identification information obtained by the scanning device 200 and selects the corresponding test channel based on the first identification information. The control device 100 also receives the second identification information obtained by the scanning device 200 when scanning the circuit board to be tested. The control device 100 then sends a test instruction to the test device on the corresponding test channel, causing the test device to test the circuit board to be tested according to pre-configured test items and generate test data. The control device 100 obtains the test data and stores the test data in the cloud storage server 20 based on the second identification information.

[0102] Cloud storage server 20 is used to store test data and establish a mapping relationship between test data and second identification information, enabling test data traceability. Through cloud storage, test system 10 makes test results accessible from multiple locations via the Internet, facilitating data management and analysis. Test results are stored one-to-one with the tested PCBA board information, and test results can be viewed at any time by scanning the PCBA board's QR code.

[0103] Auxiliary equipment 400 provides power and load for the circuit board under test. It can include test instruments such as an AC power supply, an AC load, a DC power supply, and a DC load. Auxiliary equipment 400 is electrically connected to the test equipment. Through the test equipment's internal relay module, it simulates the actual operating environment of the circuit board, forming different test loops with the circuit board under test to perform various test functions.

[0104] The test system may further include a display device 500 for receiving and displaying test data sent by the control device 100 in a preset display format. The display device 500 may display the real-time status of the test process and the test results, making it easier for operators to monitor the test progress and results.

[0105] In actual application, the workflow of the test system 10 is as follows: first, the operator uses the scanning device 200 to scan the identification code of the test device on a certain test channel, and uploads the first identification information to the control device 100; the control device 100 selects the corresponding test channel according to the first identification information; then, the operator fixes the circuit board to be tested on the test device, and uses the scanning device 200 to scan the identification code of the circuit board to be tested, and uploads the second identification information to the control device 100; the control device 100 sends a test instruction to the test device on the corresponding test channel to start the test process; the test device controls the auxiliary device 400 and the circuit board to be tested to form a test loop according to the test instruction, completes the pre-configured tests, and returns the test data to the control device 100 in real time; the control device 100 receives the test data, and stores the test data in the cloud storage server 20 after associating it with the second identification information; after the test is completed, the corresponding test data can be retrieved from the cloud storage server 20 by entering the second identification information, and displayed on the display device 500.

[0106] In some embodiments, the structural diagram of the test equipment is as follows: Figure 4 As shown, Figure 4 As shown, the test device 3110 includes a control module 301, a transmission module 302, a plurality of relay modules 3031, 3032, ..., 303M, and a programming module 304. The control module 301 is connected to the plurality of relay modules via the transmission module 302, and the control module 301 is also connected to the programming module 304. The auxiliary device 400 is electrically connected to the plurality of relay modules.

[0107] Auxiliary equipment 400 provides power and loads for the circuit board under test. These include AC power supplies, AC loads, DC power supplies, DC loads, and other auxiliary equipment such as PV sources and bidirectional sources. These devices provide the necessary operating conditions for the test process, simulating the various operating conditions of the circuit board in actual application environments, ensuring the comprehensiveness and effectiveness of the test.

[0108] The control module 301 is the core of the test equipment, typically implemented using an MCU (microcontroller unit). It is responsible for receiving test instructions from the control device and controlling the operating status of each functional module. The control module 301 is electrically connected to several relay modules 3031, 3032, ..., 303N, which are in turn electrically connected to the auxiliary device 400. By controlling the opening and closing of different relay modules, the control module 301 can form different test loops between the auxiliary device 400 and the circuit board to be tested, enabling testing of each functional point on the circuit board.

[0109] Transmission module 302, located between control module 301 and the relay module, serves as a bridge for signal transmission. Control module 301 controls the opening and closing of various relay modules through transmission module 302 to establish an electrical connection between auxiliary device 400 and the circuit board under test, forming a corresponding test loop. Transmission module 302 ensures accurate transmission of control signals, optimizes the control module's I / O resource allocation, and enhances system scalability.

[0110] Burning module 304 is directly connected to control module 301 and is used to burn configuration data or firmware to the circuit board under test during the test process. By connecting to burning module 304, control module 301 can establish a burning channel, write the configuration data or firmware corresponding to the test items into the memory of the circuit board under test, and complete the program initialization or update of the circuit board under test.

[0111] The working process of the test equipment is as follows: First, after the control module 301 receives the test instruction sent by the control device 100, it controls the corresponding relay module through the transmission module 302 according to the instruction content and the pre-configured test items, establishes an electrical connection between the circuit board to be tested and the test equipment, and forms a corresponding test loop.

[0112] Next, the control module 301 executes the test tasks sequentially. For example, the firmware might be burned first by the burning module 304, followed by power supply testing, signal testing, and functional testing. During the test, the control module 301 switches between different relay modules to establish different test loops, achieving comprehensive functional testing.

[0113] It should be noted that, when testing a circuit board to be tested on any test channel, the test system allows the operator to fix and connect the circuit boards to be tested on other test channels.

[0114] Finally, control module 301 collects test data in real time during the test, including key parameters such as voltage, current, and signal waveforms, and transmits the test data to the control device. The control device associates the received test data with the second identification information, the unique identifier of the circuit board under test, to form a complete test record.

[0115] Different from the existing technology, the test system provided by the embodiment of the present application allows the operator to use the test time to carry out PCBA board loading and unloading and wiring work in other channels while testing a certain channel, thereby avoiding waiting time and speeding up the overall testing process, thereby realizing the parallelization of the testing process and the preparation process, significantly improving the testing efficiency, and reducing the testing cost and human resource investment; at the same time, a complete mapping relationship between test data and circuit board identification is established, and the data is stored in the cloud server, realizing efficient management and traceability of test data, facilitating quality control and problem analysis.

[0116] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Based on the idea of ​​the present application, the technical features in the above embodiments or different embodiments can also be combined, the steps can be implemented in any order, and there are many other variations in different aspects of the present application as above, which are not provided in detail for the sake of simplicity. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A multi-channel testing method, applied to a control device of a test system, wherein the test system further comprises a scanning device and a plurality of test channels, characterized in that: include: receiving first identification information obtained by scanning the scanning device, and selecting a corresponding test channel according to the first identification information; The test channel is pre-set with a circuit board to be tested; Receiving second identification information obtained by scanning the circuit board to be tested by the scanning device; Sending a test instruction to the test equipment on the corresponding test channel, so that the test equipment tests the circuit board to be tested according to pre-configured test items and generates test data; The test data is acquired, and the test data is stored according to the second identification information.

2. The method according to claim 1, characterized in that The control device pre-stores a first mapping relationship between the test channel and the first identification information; and selecting the corresponding test channel according to the first identification information includes: Determining, according to the first mapping relationship, a test channel corresponding to the first identification information; A prompt message is sent to the user, prompting the user to scan the circuit board to be tested that is set on the test channel corresponding to the first identification information.

3. The method according to claim 1, characterized in that The acquiring the test data and storing the test data according to the second identification information includes: obtaining the test data; Establishing a second mapping relationship between the test data and the second identification information; The test data is stored in a cloud storage server according to a preset data storage structure.

4. The method according to any one of claims 1 to 3, characterized in that After acquiring the test data and storing the test data according to the second identification information, the method further includes: The second identification information is obtained, and corresponding test data is output according to the second identification information.

5. The method according to claim 4, characterized in that The test system further includes a display device, and the acquiring the second identification information and outputting corresponding test data according to the second identification information includes: Receiving the second identification information obtained by scanning by the scanning device; Retrieving, from the cloud storage server according to the second identification information, test data having a second mapping relationship with the second identification information; Outputting the retrieved test data to the display device according to a preset display format; In response to the user's export instruction, the retrieved test data is exported to a designated storage location in a preset file format.

6. An electronic device, characterized in that: include: at least one processor; at least one network interface, the network interface being communicatively connected to a corresponding processor; as well as, a memory communicatively connected to the at least one processor; wherein, The network interface is used to establish a communication connection between the processor and other external devices; The memory stores instructions that can be executed by the at least one processor. The instructions are executed by the at least one processor to enable the at least one processor to perform the multi-channel testing method according to any one of claims 1 to 5.

7. A non-volatile computer storage medium, characterized in that The computer storage medium stores computer-executable instructions, which are executed by one or more processors, enabling the one or more processors to execute the multi-channel testing method according to any one of claims 1 to 5.

8. A testing system, characterized in that: include: Several test channels; corresponding test equipment is set on the test channels, and the test equipment is provided with a fixing device for fixing the circuit board to be tested on the test equipment; A scanning device, configured to scan the test device and output first identification information; and scan the circuit board to be tested and output second identification information; The control device is communicatively connected to the cloud storage server and is also electrically connected to the scanning device and the test devices on the plurality of test channels, and is used to execute the multi-channel testing method according to any one of claims 1 to 5.

9. The system according to claim 8, characterized in that Also included is an auxiliary device for providing power and load to the circuit board to be tested, wherein the test device includes a control module and several relay modules; The control module is electrically connected to the plurality of relay modules, and the auxiliary device is electrically connected to the plurality of relay modules; The control module controls the opening and closing of different relay modules so that the auxiliary equipment and the circuit board to be tested form a corresponding test loop.

10. The system according to claim 9, characterized in that The test device further includes a transmission module and a burning module, the control module is connected to the plurality of relay modules via the transmission module, and the control module is also connected to the burning module; The control module controls the opening and closing of different relay modules through the transmission module, so that the auxiliary equipment and the circuit board to be tested form a corresponding test loop; The control module also burns the configuration data or firmware corresponding to the test item to the circuit board to be tested by turning on the burning module.

11. The system according to claim 9, wherein: After receiving the test instruction sent by the control device, the control module controls the corresponding relay module according to the pre-configured test items to establish an electrical connection between the circuit board to be tested and the test device to form a corresponding test loop; The control module tests the circuit board to be tested according to the test items; when the circuit board to be tested on any test channel is tested, the fixing and wiring work of the circuit boards to be tested on other test channels is allowed; The control module collects test data in real time during the test process and transmits the test data to the control device.

12. The system according to any one of claims 8 to 11, characterized in that: Also includes: The display device connected to the control device is used to receive and display the test data sent by the control device in a preset display format.

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