Micro-gap anti-coincidence detector
By adopting the nesting structure and fixing method of the micro-slit inverse-conforming detector in the ΔE-E detector, the problems of false triggering and energy spectrum dispersion caused by the inverse-conforming detector gap are solved, and efficient scientific data acquisition is achieved.
Patent Information
- Application Number
- CN202510549159.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-28
- Publication Date
- 2025-08-29
AI Technical Summary
The gaps in the inversely consistent detectors in existing ΔE-E detectors lead to unexpected trigger events and energy spectrum dispersion, affecting the effectiveness of scientific data.
A micro-slit inverse conformity detector is designed, and the upper inverse conformity cup and lower inverse conformity cup nesting structure is adopted, with the gap less than 1mm, and combined with the fixing method of the detector bracket and the shell to eliminate the incident of charged particles and high-energy particles outside the field of view.
It effectively eliminates false triggering and energy spectrum diffusion events, while maintaining anti-compliance efficiency and meeting the structural reliability requirements of deep space exploration.
Smart Images
Figure CN120559700A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of charged particle environment detection, and in particular to a micro-gap anti-coincidence detector. Background Art
[0002] Charged particle detection in space is aimed at characterizing the energy and flux distribution of high-energy electrons, protons, and heavy ions in deep space. The ΔE-E telescope method is commonly used for space charged particle identification. The ΔE detector is thin enough to allow the particle being detected to pass through it, thereby detecting the specific energy loss in the particle. The E detector is thick enough to cover the range of high-energy particles and is designed to detect the total energy of the particle.
[0003] The combination of a ΔE detector and an E detector is called a ΔE-E detector, which is an effective means of identifying particles (Compact Multi-channel ΔEE Ionization Chamber Telescope System [J]. Atomic Energy Science and Technology, 1997, 31(2): 11-18. DOI: 10.7538 / yzk.1997.31.02.0011). Generally, an anti-coincidence detector is required to surround the ΔE-E detector to eliminate charged particles entering the detector from outside the field of view and high-energy charged particles penetrating the field of view. When a particle is incident from outside the field of view or its energy exceeds the detection limit, a pulse signal will be output on the anti-coincidence detector. After processing by the control readout module, an anti-coincidence hit signal is generated to eliminate false trigger events. However, when the measured particle is incident from the gap of the anti-coincidence detector, an unexpected trigger event may occur and be recorded by the detector, thereby forming a mass in the energy spectrum of the measured charged particle, which affects the subsequent processing of the particle energy spectrum. To ensure the validity of scientific data, a compact anti-coincidence detector with a small gap needs to be designed. Summary of the Invention
[0004] The present application provides a micro-slit anti-coincidence detector suitable for a deep space compact space charged particle analyzer, which can eliminate diffuse events without reducing the original anti-coincidence efficiency.
[0005] In order to achieve the above-mentioned purpose, the present application provides a micro-gap anti-coincidence detector, including a shell, an upper anti-coincidence cup, a lower anti-coincidence cup, a silicon detector, an E detector and a detector bracket, wherein: a fixed base plate is arranged at the lower part of the shell; the upper anti-coincidence cup is conical barrel-shaped, arranged around the inner wall of the shell, and its bottom is arranged on the fixed base plate; the lower anti-coincidence cup is round cake-shaped, arranged on the fixed base plate, and as a whole nested in the bottom of the upper anti-coincidence cup, and the gap between it and the lower anti-coincidence cup is less than 1mm; the detector bracket is arranged in the center of the shell; the silicon detector is arranged above the detector bracket, and the E detector is arranged below the detector bracket; the lower surface of the E detector contacts the upper surface of the lower anti-coincidence cup; the surface of the upper anti-coincidence cup is bonded with a first photomultiplier, and the rest is wrapped with a reflective film; the surface of the lower anti-coincidence cup is bonded with a second photomultiplier, and the rest is wrapped with a reflective film.
[0006] Furthermore, a collimator is provided on the top of the shell. The top of the shell is conical, and the inner side of the collimator horn fits with the outer structure of the shell cone.
[0007] Furthermore, a hollow annular cone is provided on the edge of the circuit board of the silicon detector, and the hollow annular cone is connected to the inner wall of the upper inverted conformal cup.
[0008] Furthermore, the front-end electronic board outside the E detector is arranged on the inner wall of the upper anti-coincidence cup.
[0009] Furthermore, the upper inverted coinciding cup and the lower inverted coinciding cup are plastic scintillators.
[0010] Furthermore, the E detector is an inorganic scintillator with a PD photomultiplier bonded to the surface and the rest of the part wrapped with a reflective film.
[0011] Furthermore, a shock-absorbing rubber pad is provided between the upper surface of the fixed bottom plate and the bottom surface of the lower inverted cup.
[0012] The present invention provides a micro-slit anti-coincidence detector with the following beneficial effects: This application is applicable to a deep space compact space charged particle analyzer. It adopts an inlaid installation of the upper anti-coincidence cup and the lower anti-coincidence cup, realizes the tiny gap installation of the anti-coincidence detector, can effectively eliminate the occurrence of false triggering and diffusion events, and will not reduce the original anti-coincidence efficiency; at the same time, it adopts a fixing method that combines the internal detector bracket with the external detector shell, which has high structural reliability and can well meet the requirements of space detection. BRIEF DESCRIPTION OF THE DRAWINGS
[0013] The drawings that constitute part of this application are used to provide a further understanding of this application and make other features, objects and advantages of this application more apparent. The illustrative embodiment drawings of this application and their descriptions are used to explain this application and do not constitute an improper limitation of this application. In the drawings: Figure 1 Schematic diagram of the internal structure of a micro-gap anti-coincidence detector according to an embodiment of the present application; Figure 2 1 is a schematic diagram of a micro-gap anti-coincidence detector housing provided according to an embodiment of the present application; Figure 3 1 is a top view of a micro-gap anti-coincidence detector E according to an embodiment of the present application; Figure 4 1. This is a bottom view of an anti-coincidence cup on a micro-gap anti-coincidence detector provided according to an embodiment of the present application; Figure 5 1 is a side view of a lower anti-coincidence cup of a micro-gap anti-coincidence detector provided according to an embodiment of the present application; Figure 6 1 is a top view of the lower anti-coincidence cup of the micro-gap anti-coincidence detector provided according to an embodiment of the present application; Figure 7 This is a schematic diagram of the simulation results of a gap anti-coincidence detector in the prior art when a complete spherical source is incident; Figure 8 2 is a schematic diagram of simulation results of a micro-slit anti-coincidence detector provided by an embodiment of the present application when a complete spherical source is incident; In the figure: 1-housing, 2-upper inverted coinciding cup, 3-lower inverted coinciding cup, 4-silicon detector, 5-E detector, 6-detector bracket, 7-fixed base plate, 8-collimator, 9-hollow annular cone, 10-electronics board, 11-first photomultiplier, 12-second photomultiplier, 13-PD photomultiplier, 14-mounting notch. DETAILED DESCRIPTION
[0014] In order to enable those skilled in the art to better understand the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments in the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts should fall within the scope of protection of this application.
[0015] It should be noted that the terms "first", "second", etc. in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequential order. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present application described here. In addition, the terms "including" and "having" and any of their variations are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.
[0016] In this application, terms such as "upper," "lower," "left," "right," "front," "back," "top," "bottom," "inner," "outer," "center," "vertical," "horizontal," "transverse," and "longitudinal" indicate positions or locations based on the positions or locations shown in the accompanying drawings. These terms are primarily intended to better describe this application and its embodiments and are not intended to limit the devices, elements, or components indicated to having a specific orientation, or to being constructed or operated in a specific orientation.
[0017] Furthermore, some of the above terms may be used to express other meanings besides indicating a position or location. For example, the term "on" may also be used to indicate a dependency or connection in certain circumstances. Those skilled in the art will understand the specific meanings of these terms in this application based on the specific circumstances.
[0018] Additionally, the term "plurality" shall mean two or more.
[0019] It should be noted that, in the absence of conflict, the embodiments and features of the embodiments in this application can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.
[0020] like Figure 1-2 As shown, the present application provides a micro-gap anti-conformity detector, including a shell 1, an upper anti-conformity cup 2, a lower anti-conformity cup 3, a silicon detector 4, an E detector 5 and a detector bracket 6, wherein: a fixed bottom plate 7 is arranged at the lower part of the shell 1; the upper anti-conformity cup 2 is conical barrel-shaped, arranged around the inner wall of the shell 1, and its bottom is arranged on the fixed bottom plate 7; the lower anti-conformity cup 3 is round cake-shaped, arranged on the fixed bottom plate 7, and is nested as a whole at the bottom of the upper anti-conformity cup 2, and the gap between it and the lower anti-conformity cup 3 is less than 1mm; the detector bracket 6 is arranged in the center of the shell 1; the silicon detector 4 is arranged above the detector bracket 6, and the E detector 5 is arranged below the detector bracket 6; the lower surface of the E detector 5 is in contact with the upper surface of the lower anti-conformity cup 3.
[0021] Specifically, the micro-gap anti-coincidence detector provided in the embodiment of the present application is mainly suitable for deep space compact charged particle analyzers. By setting an upper anti-coincidence cup 2 surrounding the periphery of the detector and a lower anti-coincidence cup 3 set at the bottom of the detector, charged particles entering the detector outside the field of view and high-energy charged particles penetrating the field of view are eliminated together, so as to eliminate false triggering events and ensure the validity of scientific data. Among them, the upper anti-coincidence cup 2 is conical barrel-shaped and is arranged around the inner wall of the shell 1. Its cone mouth is completely fitted with the inner cone mouth of the shell 1. It is connected to the shell 1 by locking screws, and the bottom is fixed to the two ends of the fixed base plate 7; the lower anti-coincidence cup 3 is round cake-shaped, and its bottom is fixed in the middle position of the fixed base plate 7. It is nested in the interior of the upper anti-coincidence cup 2 as a whole, covering all the space at the bottom of the upper anti-coincidence cup 2, and the contact gap between it and the inner walls on both sides of the upper anti-coincidence cup 2 is less than 1mm, thereby effectively eliminating the dispersion of the energy spectrum caused by particles entering from the gap; the fixed base plate 7 is set at the bottom of the shell 1, and is connected to the shell 1 by fastening screws on all sides. The shell body 1 is fixedly connected; the center of the interior of the shell body 1 is the detector body, and a detector bracket 6 is fixedly arranged in the middle. A silicon detector 4 is arranged above the detector bracket 6. A plurality of silicon detectors 4 can be provided according to actual conditions to deposit the energy loss of the measured particles to cover different energy zones and different particle types, preferably including an upper SD1 silicon detector 41 and a lower SD2 silicon detector 42; an E detector 5 is arranged below the detector bracket 6, and the lower surface of the E detector 5 is in contact with the upper surface of the lower anti-coincidence cup 3. The E detector 5 is mainly used to measure the total energy of the detected charged particles.
[0022] Furthermore, a collimator 8 is provided on the top of the shell 1. The top of the shell 1 is conical, and the inner side of the horn of the collimator 8 fits with the outer structure of the cone of the shell 1. The collimator 8 is provided on the top of the shell 1. The collimator 8, the silicon detector 4, and the E detector 5 together form a ΔE-E detection system with a telescope configuration, which realizes the detection of charged ions in space. When installing the collimator 8, use screws to install the light-blocking plate assembly at the cone of the collimator 8, place the shell 1 with the cone facing upwards, and then place the collimator 8 with the cone facing downwards, and slowly move downwards until the inner structure of the horn of the collimator 8 is completely fitted with the outer structure of the cone of the shell 1, and fix the collimator 8 to the cone of the shell 1 by tightening the screws.
[0023] Furthermore, a hollow annular tapered opening 9 is provided at the edge of the circuit board of the silicon detector 4, and the hollow annular tapered opening 9 is connected to the inner wall of the upper anti-conform cup 2. When installing the upper anti-conform cup 2, the shell 1 is placed with the tapered opening facing downward, and the upper anti-conform cup 2 is slowly moved downward with the tapered opening facing downward until the tapered opening of the upper anti-conform cup 2 is completely aligned with the tapered opening inside the shell 1. Then, the detector bracket 6 is slowly moved downward until the hollow annular tapered opening 9 at the edge of the silicon detector 4 is completely aligned with the inner surface of the upper anti-conform cup 2.
[0024] Furthermore, the front-end electronic board 10 outside the E detector 5 is arranged on the inner wall of the upper anti-coincidence cup 2. The front-end electronic board 10 is mainly used for signal processing.
[0025] Furthermore, the upper inverted coinciding cup 2 and the lower inverted coinciding cup 3 are plastic scintillators.
[0026] Furthermore, a first photomultiplier 11 is bonded to the surface of the upper anti-coincidence cup 2, with the remainder wrapped in a reflective film. A second photomultiplier 12 is bonded to the surface of the lower anti-coincidence cup 3, with the remainder wrapped in a reflective film. The upper anti-coincidence cup 2 preferably has one or more silicon photomultipliers bonded to its surface for reading the anti-coincidence signal, with the remainder wrapped in a high-reflectivity reflective film. Similarly, the lower anti-coincidence cup 3 preferably has one or more silicon photomultipliers bonded to its surface for reading the anti-coincidence signal, with the remainder wrapped in a high-reflectivity reflective film.
[0027] Specifically, such as Figure 4-6 As shown, the upper inverted conforming cup 2 and the lower inverted conforming cup 3 are both plastic scintillators. The surfaces of the upper inverted conforming cup 2 and the lower inverted conforming cup 3 are wrapped with a reflective film. The reflective material is cut into a template that matches the surface morphology of the upper inverted conforming cup 2 and the lower inverted conforming cup 3. The three diagonal positions at the bottom of the upper inverted conforming cup 2 are reserved for the bonding position of the first photomultiplier 11. The three diagonal positions at the outer circle of the lower inverted conforming cup 3 are reserved for the bonding position of the second photomultiplier 12. Optical adhesive is used to bond the cut template. The first photomultiplier 11 is bonded to the lower inverted conforming cup 3. The second photomultiplier 12 is bonded to the bonding positions of the upper inverted cup 2 and the lower inverted cup 3 using optical adhesive, and connected to the matching connector via wires. In addition, when installing the lower inverted cup 3, the lower inverted cup 3 is moved downward to the bottom of the upper inverted cup 2, aligned with the three mounting notches 14 of the second photomultiplier 12, and moved downward until the upper surface of the lower inverted cup 3 is in contact with the lower bottom surface of the E detector 5, and the relevant connecting wire bundle is led out from the groove of the lower inverted cup 3.
[0028] Further, such as Figure 3 As shown, the E detector 5 is an inorganic scintillator with a PD photomultiplier 13 bonded to its surface, and the rest of the surface wrapped in a reflective film. To improve the uniformity of scintillation light collection, the surface of the E detector 5 is coated with a high-reflectivity reflective film. The reflective material is cut into a template that matches the surface morphology of the E detector 5. Bonding locations for the PD photomultiplier 13 are reserved on the three diagonal surfaces of the E detector 5. The template is bonded to the surface of the E detector 5 using optical adhesive. After the reflective film is bonded, the PD photomultiplier 13 is bonded to the bonding locations on the three diagonal surfaces of the E detector 5 using optical adhesive and then connected to the supporting circuit board via wires.
[0029] Furthermore, a shock-absorbing rubber pad is installed between the upper surface of the fixed base plate 7 and the bottom surface of the lower inverted cup 3. The shock-absorbing rubber pad is bonded to the mounting groove on the upper surface of the fixed base plate 7. With the upper surface of the fixed base plate 7 facing downward, slowly move the shock-absorbing rubber pad downward until the shock-absorbing rubber pad fully contacts the bottom surface of the lower inverted cup 3, and then lead the wire harness out. Apply pressure to the fixed base plate 7 and check that the threaded holes around the fixed base plate 7 are aligned with the screw holes around the housing 1. If aligned, tighten with the set screws.
[0030] Specifically, in the prior art, there is generally a gap between the upper inverted conformal cup 2 and the lower inverted conformal cup 3. From the simulation results, it can be seen that a relatively obvious diffusion phenomenon occurs, such as Figure 7 In the embodiment of the present application, the upper inverted cup 2 and the lower inverted cup 3 are nested, with a gap of less than 1 mm. When other parameters remain unchanged, it can be seen from the simulation results that the diffusion phenomenon has basically disappeared. Figure 8 As shown; therefore, the micro-gap anti-coincidence detector provided in the embodiment of the present application can effectively eliminate the occurrence of false triggering and diffusion events without reducing the original anti-coincidence efficiency.
[0031] The foregoing description is merely a preferred embodiment of the present application and is not intended to limit the present application. Persons skilled in the art will readily appreciate that various modifications and variations are possible. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of the present application shall be included within the scope of protection of the present application.
Claims
1. A micro-slit anti-coincidence detector, characterized in that: It includes a shell, an upper inverted cup, a lower inverted cup, a silicon detector, an E detector and a detector bracket, wherein: A fixed bottom plate is provided at the lower part of the shell; The upper inverted cup is in a cone barrel shape and is arranged around the inner wall of the shell, with its bottom being arranged on a fixed bottom plate; The lower inverted cup is in the shape of a round cake and is arranged on a fixed bottom plate. The lower inverted cup is integrally nested on the bottom of the upper inverted cup, and the gap between the lower inverted cup and the upper inverted cup is less than 1 mm. The detector bracket is arranged in the center of the interior of the housing; The silicon detector is arranged above the detector bracket, and the E detector is arranged below the detector bracket; The lower surface of the E detector contacts the upper surface of the lower anti-coincidence cup; The surface of the upper inverted cup is bonded with a first photomultiplier, and the rest of the portion is wrapped with a reflective film; the surface of the lower inverted cup is bonded with a second photomultiplier, and the rest of the portion is wrapped with a reflective film.
2. The micro-gap anti-coincidence detector according to claim 1, characterized in that: A collimator is provided on the top of the shell. The top of the shell is conical, and the inner side of the horn mouth of the collimator is in contact with the outer structure of the cone mouth of the shell.
3. The micro-gap anti-coincidence detector according to claim 2, characterized in that: A hollow annular cone is provided at the edge of the circuit board of the silicon detector, and the hollow annular cone is connected to the inner wall of the upper inverted cup.
4. The micro-gap anti-coincidence detector according to claim 3, characterized in that: The front-end electronic board outside the E detector is arranged on the inner wall of the upper anti-coincidence cup.
5. The micro-gap anti-coincidence detector according to claim 4, characterized in that: The upper inverted coinciding cup and the lower inverted coinciding cup are plastic scintillators.
6. The micro-gap anti-coincidence detector according to claim 5, characterized in that: The E detector is an inorganic scintillator with a PD photomultiplier bonded to its surface and the rest of the detector wrapped with a reflective film.
7. The micro-gap anti-coincidence detector according to claim 6, characterized in that: A shock-absorbing rubber pad is provided between the upper surface of the fixed bottom plate and the bottom surface of the lower inverted cup.