High-temperature aging device applied to electric power measurement and acquisition equipment and temperature control method and system thereof

Abstract

The invention belongs to the technical field of temperature control, and particularly relates to a high-temperature aging device applied to electric power measurement and acquisition equipment and a temperature control method and system thereof. The method comprises the steps that S1, according to the internal temperature of a device cavity at the current moment, the heating power output by heating equipment at the current moment and a thermodynamic model of the device cavity, the internal temperature of the device cavity at the next moment is obtained; s2, inputting the deviation between the internal temperature of the cavity of the device at the next moment and the set temperature into a closed-loop temperature controller to obtain a heating power reference value of the heating equipment at the next moment; and S3, the heating power output by the heating equipment is adjusted according to the heating power reference value, so that the temperature in the cavity of the device is maintained at the set temperature. According to the invention, the technical problem of high invalid energy consumption caused by temperature response lag in the prior art is solved.

Description

Technical Field

[0001] The present invention belongs to the technical field of temperature control, and in particular relates to a high-temperature aging device applied to power metering and acquisition equipment, and a temperature control method and system thereof. Background Art

[0002] Smart energy meters and data collection terminals are core components of the new power system's metering and data collection, respectively. Their performance stability and reliability are directly related to the accuracy of the new power system and the safe and efficient operation of the grid. Aging testing of smart energy meters and data collection terminals in high-temperature environments is a key step in verifying their reliability. Existing high-temperature aging testing technologies have the following issues:

[0003] The energy meters and data collection terminals under test also generate some heat during operation, causing dynamic interference to the temperature control system. This heat is not incorporated into the control system's regulation, leading to temperature overshoot and test errors. Furthermore, temperature response often exhibits significant hysteresis, causing the heating device to frequently start and stop, resulting in inefficient energy consumption, which can reach 20% to 30%. This hysteresis also leads to insufficient control accuracy, resulting in overshoot or underregulation.

[0004] In addition, when testing the load under test (i.e., the electricity meter and the collection terminal), it is often necessary to test the load under various extreme working conditions, causing a sudden change in the load under test. However, after the load changes suddenly, a rapid temperature response is required to restore the temperature.

[0005] The Chinese invention patent application, with publication number CN119847246A and publication date April 18, 2025, discloses a method and system for controlling the ambient temperature of a test chamber used in high-temperature aging tests. This system uses the significant softening factor (SMF) derived from the local stability of the ambient temperature and the rate of change of the heating power to adjust the ambient temperature data of the test chamber at the next instant. This results in a smoother control output, reduces overshoot and oscillation, and helps optimize control performance. Summary of the Invention

[0006] The purpose of the present invention is to provide a high-temperature aging device and a temperature control method and system for power metering and collection equipment, so as to solve the technical problem in the prior art of high ineffective energy consumption due to delayed temperature response.

[0007] To solve the above technical problems, the present invention provides a technical solution for a temperature control method of a high-temperature aging device applied to an electric power meter box collection device: a temperature control method of a high-temperature aging device applied to an electric power meter box collection device, the method comprising:

[0008] S1. Obtaining the internal temperature of the device cavity at the next moment based on the internal temperature of the device cavity at the current moment, the heating power output by the heating device at the current moment, and the thermodynamic model of the device cavity;

[0009] S2. Inputting the deviation between the temperature inside the cavity of the device at the next moment and the set temperature into a closed-loop temperature controller to obtain a heating power reference value of the heating device at the next moment;

[0010] S3. Adjust the heating power output by the heating device according to the heating power reference value so that the temperature inside the device cavity is maintained at the set temperature.

[0011] The beneficial effect of the above technical solution is that the technical solution of the temperature control method of a high-temperature aging device applied to power metering and collection equipment of the present invention belongs to an improved invention. Different from the existing technology, the present invention introduces a feedforward prediction link, predicts the future temperature changes of the device cavity based on the thermodynamic model, and adjusts the controller output in advance according to the predicted temperature. Compared with the traditional method of closed-loop feedback control based on the measured temperature, the present invention can suppress the error change in advance before the control error occurs, avoid overshoot, avoid frequent start and stop of the heating device, reduce invalid heating, and reduce the proportion of invalid energy consumption. The present invention solves the technical problem of high invalid energy consumption due to temperature response lag in the existing technology.

[0012] Furthermore, the thermodynamic model is: the heat change rate of the device cavity is equal to the difference between the heat power input into the device cavity and the heat power dissipated to the environment from the cavity surface; the heat power input into the device cavity includes the heating power output by the heating equipment and the heat power generated when the measured load is working.

[0013] Furthermore, the thermodynamic model is:

[0014]

[0015] Wherein, T(t+Δt) is the internal temperature of the device cavity at time t+Δt; T(t) is the internal temperature of the device cavity at time t; Δt is the control period; C is the heat capacity of the device cavity; P heat (t) is the heating power output by the heating equipment at time t; T env is the ambient temperature outside the device cavity; k is the heat dissipation coefficient; β is the heat conversion coefficient of the measured load; I(t) is the operating current of the measured load at time t; V(t) is the operating voltage of the measured load at time t.

[0016] Furthermore, the method of adjusting the heating power output by the heating device according to the heating power reference value includes: in the heating power reference value, the remaining heating power after deducting the equivalent power of the thermal power generated when the measured load is working is used as the target heating power, and the heating power output by the heating device is adjusted to the target heating power.

[0017] Furthermore, the equivalent power of the thermal power generated by the measured load during operation is obtained according to the following formula:

[0018]

[0019] Among them, P γ It is the equivalent power of the heat power generated when the measured load is working; P is the rate of change of the electric power when the measured load is working; load is the electric power of the measured load when it is working; γ is the compensation gain coefficient.

[0020] Furthermore, the compensation gain coefficient γ is calibrated by the following step load experiment:

[0021] (1) When the temperature inside the device cavity stabilizes at the set temperature T set When the electric power of the load being measured is P load Jump from 0 to the maximum value P max and maintain; recording the temperature response curve T(t) inside the cavity of the device;

[0022] (2) According to (1), the temperature response curve T(t) inside the device cavity is fitted with the following equation to determine the values ​​of β and γ:

[0023]

[0024] Where, ΔT actual is the difference between the measured temperature in the cavity and the set temperature T in the step load experiment set Deviation value; β is the heat conversion coefficient of the measured load;

[0025] (3) Based on the γ value obtained in (2), re-execute (1) and adjust the γ value according to the overshoot of the temperature response until the overshoot meets the preset requirements.

[0026] Furthermore, the heat conversion coefficient β of the measured load is obtained by calibrating the following step load experiment:

[0027] 1) When the temperature inside the device cavity stabilizes at the set temperature T set When the electric power of the load being measured is P load Jump from 0 to the maximum value P max and maintain; recording the temperature response curve T(t) inside the cavity of the device;

[0028] 2) The temperature response curve T(t) inside the device cavity obtained in 1) is fitted with the following equation to determine the values ​​of β and γ:

[0029]

[0030] Where, ΔT actual is the difference between the measured temperature in the cavity and the set temperature T in the step load experiment set Deviation value; γ is the compensation gain coefficient.

[0031] Furthermore, the closed-loop temperature controller includes a fuzzy PID controller composed of a fuzzy controller and a PID controller; the fuzzy controller obtains the change of the control parameter based on the error and the rate of change of the error, and corrects the control parameter in the PID controller based on the change of the control parameter; the error is the difference between the set temperature and the temperature inside the device cavity at the next moment.

[0032] The present invention also provides a technical solution for a temperature control system of a high-temperature aging device applied to power metering and collection equipment: a temperature control system of a high-temperature aging device applied to power metering and collection equipment, comprising a processor, which is used to execute a computer program to implement the steps of the temperature control method of a high-temperature aging device applied to power metering and collection equipment as described above.

[0033] The present invention also provides a technical solution for a high-temperature aging device applied to power metering and collection equipment: a high-temperature aging device applied to power metering box collection equipment, including a temperature controller, the temperature controller including a processor, the processor being used to execute a computer program to implement the steps of the temperature control method of the high-temperature aging device applied to power metering and collection equipment as described above. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] Figure 1 A schematic diagram of the components of an embodiment of the high-temperature aging device of the present invention applied to power metering and collection equipment;

[0035] Figure 2 This is a flow chart of the control algorithm in an embodiment of the high-temperature aging device of the present invention applied to power metering and collection equipment. DETAILED DESCRIPTION

[0036] Unlike existing technologies, the present invention introduces a feedforward prediction mechanism, predicting future temperature changes in the device cavity based on a thermodynamic model and adjusting the controller output in advance based on the predicted temperature. Compared to traditional closed-loop feedback control methods based on measured temperatures, the present invention can suppress error changes before control errors occur, avoiding overshoot, preventing frequent starting and stopping of the heating device, reducing ineffective heating, and lowering the proportion of ineffective energy consumption. This invention solves the technical problem in the prior art of high ineffective energy consumption due to delayed temperature response.

[0037] Implementation methods of high temperature aging devices for power metering and collection equipment:

[0038] like Figure 1 As shown, the high temperature aging device applied to the power meter box collection equipment of the present invention includes:

[0039] (1) Device cavity: provides a stable test environment and equipment protection, generally 1 cubic meter.

[0040] (2) Temperature control system: accurately controls the temperature inside the device cavity to simulate a high temperature environment.

[0041] (3) Power source: Provides working power for the load being measured (such as an energy meter or a data acquisition terminal).

[0042] (4) Data acquisition module: synchronously collects the temperature of the device cavity, as well as the voltage, current, power and other parameters of the load being measured.

[0043] (5) Display system: displays temperature curve, load parameters, alarm information, and supports test program editing.

[0044] (6) Safety protection module: over-temperature protection, over-current protection, short-circuit protection, and leakage protection.

[0045] Among them, the temperature control system includes a heating device for providing heat to the device cavity and its temperature controller. The temperature controller includes a processor, which is used to execute a computer program to implement the steps of the temperature control method of the high-temperature aging device applied to the power meter box collection device as described below.

[0046] The temperature control method of the high temperature aging device applied to the power meter box acquisition device of this embodiment includes feedforward prediction, fuzzy-PID control, dynamic load compensation and safety protection mechanism, such as Figure 2 As shown, the specific process is as follows:

[0047] Feedforward prediction: Predict future temperature change trends based on thermodynamic models and adjust control strategies in advance.

[0048] (1) Thermodynamic modeling:

[0049] According to the law of conservation of energy, the rate of change of thermal energy in the device cavity is equal to the difference between the input energy and the output energy. That is, the rate of change of heat in the device cavity is equal to the difference between the heat power input into the device cavity and the heat power dissipated to the environment from the cavity surface. The established thermodynamic model is shown as follows:

[0050]

[0051] Where C is the cavity heat capacity, which indicates the ability of the cavity material to absorb or release heat (unit: J / ℃); P heat is the output power of the heating equipment in the temperature control system (unit: W); Q loss is the heat power dissipated to the environment through the surface of the device cavity (unit: W); Q load It is the heat power generated by the measured electric energy meter or acquisition terminal when it is working (unit: W);

[0052] Among them, Q loss Satisfy the following formula:

[0053] Q loss =k·(TT env )

[0054] Where, T is the real-time temperature of the cavity (unit: °C); T env is the ambient temperature outside the cavity (unit: °C); k is the heat dissipation coefficient (unit: W / °C), which is related to the cavity material, surface area, and thermal insulation performance.

[0055] Q load Satisfy the following formula:

[0056] Q load =βP load =β(I×V)

[0057] β is the heat conversion coefficient of the load under test; I is the operating current of the load under test; V is the operating voltage of the load under test.

[0058] In summary, the dynamic equation of the temperature in the device cavity is:

[0059]

[0060] (2) Discretization of thermodynamic models

[0061] To facilitate real-time control, the continuous differential equation in (1) is discretized to obtain the difference equation as shown below:

[0062]

[0063] Wherein, T(t+Δt) is the internal temperature of the device cavity at time t+Δt; T(t) is the internal temperature of the device cavity at time t; Δt is the control period, such as 1 second; C is the heat capacity of the device cavity; P heat (t) is the heating power output by the heating equipment at time t; T env is the ambient temperature outside the device cavity; k is the heat dissipation coefficient; β is the heat conversion coefficient of the measured load; I(t) is the operating current of the measured load at time t; V(t) is the operating voltage of the measured load at time t.

[0064] Fuzzy-PID control

[0065] The closed-loop temperature controller of this embodiment adopts a fuzzy-PID controller, which combines the flexibility of fuzzy control with the stability of PID. The fuzzy controller dynamically adjusts the PID parameters according to the temperature error to achieve fast response and high-precision stable control.

[0066] First, the fuzzy controller fuzzifies the input variables. In this embodiment, the fuzzy controller's additional inputs include: temperature error e and the rate of change of temperature error Δe. The temperature error refers to the difference between the temperature inside the device cavity at the future moment output by the feedforward prediction and the set temperature of the device cavity, that is:

[0067] e(t)=T set -T real

[0068] Where e(t) is the temperature error at time t, T set T is the set temperature of the device cavity, which is the temperature that the tester has set in advance and that the device cavity needs to maintain; real It is the temperature inside the device cavity at the future moment output by the feedforward prediction, that is, T(t+Δt) mentioned above.

[0069] The rate of change of temperature error Δe:

[0070] Δe(t)=e(t)-e(t-1)

[0071] The output variable of the fuzzy controller is the change of the three control parameters including PID control, namely: ΔK p , ΔT i , ΔT d .

[0072] In this embodiment, the fuzzy set of the error e includes {Negative Large (NB), Negative Small (NS), Zero (ZO), Positive Small (PS), Positive Large (PB)}, the domain is [-10°C to +10°C], and the membership function can be a triangular membership function, a trapezoidal membership function, or a Gaussian membership function. Specifically, in this embodiment, the membership function is set as follows:

[0073] e_NB=trapmf(e,[-15,-15,-10,-5])#Negative large: trapezoidal function

[0074] e_NS=trimf(e,[-7,-3,0]) #Negative small: trigonometric function

[0075] e_ZO=trimf(e,[-2,0,2]) #Zero: trigonometric function

[0076] e_PS=trimf(e,[0,3,7]) #positive small: trigonometric function

[0077] e_PB=trapmf(e,[5,10,15,15]) # Positive: trapezoidal function

[0078] The fuzzy set of the error change rate Δe includes {negative (B), zero (Z), positive (P)}, the domain is [-2°C / s to +2°C / s], and the membership function can be a triangular membership function, a trapezoidal membership function, or a Gaussian membership function. Specifically, in this embodiment, the membership function is set as follows:

[0079] Δe_N=trimf(Δe,[-3,-1,0]) #Negative: trigonometric function

[0080] Δe_Z=trimf(Δe,[-0.5,0,0.5]) #Zero: trigonometric function

[0081] Δe_P=trimf(Δe,[0,1,3]) # Positive: trigonometric function

[0082] The fuzzy rule base is shown in Table 1:

[0083] Table 1

[0084]

[0085]

[0086] Example of rule explanation:

[0087] When e=PB and Δe=P: the temperature is far below the set value and continues to rise slowly → negative proportional, strong integral, strong differential, accelerated temperature rise.

[0088] When e = NS and Δe = N: The temperature is close to the set value but drops rapidly → medium proportional / integral, weakly suppressed derivative.

[0089] The percentages in Table 1 represent the change in the control parameter relative to the previous moment, for example, ΔKp=+30% means that Kp needs to be adjusted to a value that is 30% higher than the previous moment.

[0090] According to the output of the fuzzy controller, adjust the PID controller parameters as follows:

[0091] K p (t) = K p0 +ΔK p

[0092] T i (t) = T i0 +ΔT i

[0093] T d (t) = T d0 +ΔT d

[0094] Among them, the initial value K p0 、T i0 、T d0 All calibrations were performed through experiments.

[0095] The output P of the PID controller PID (t) is:

[0096]

[0097] Dynamic load compensation:

[0098] In order to quantify the heating interference of the measured load (such as the energy meter or the acquisition terminal), this embodiment uses nonlinear compensation to offset its transient impact on the temperature. The compensation principle is to deduct the equivalent heating power (i.e., P γ ), and at the same time, in order to more accurately compensate for the impact of load mutation, a nonlinear term is introduced and a nonlinear compensation formula is established:

[0099]

[0100] Where, γ is the compensation gain coefficient (fitted by the least squares method); It is the load power change rate, reflecting transient thermal interference. The purpose of the square term design is to enhance the compensation intensity of sudden load (for example, when the load suddenly increases, the compensation amount increases quadratically) and suppress the interference of small fluctuations on the control (the compensation amount is small at a low change rate).

[0101] Security protection mechanism:

[0102] Monitor abnormal conditions (overtemperature, overcurrent) in real time, trigger protection actions and record data.

[0103] Dual-stage over-temperature protection: T real ≥T set Power reduction at +1℃, T real ≥T set Heating is switched off at +2°C.

[0104] Overcurrent protection: When the current exceeds 120% of the rated value, an audible and visual alarm is triggered.

[0105] Parameter calibration process:

[0106] 1. Calibrate the cavity heat capacity C and heat dissipation coefficient k through no-load test.

[0107] The test steps are as follows:

[0108] Step 1: Turn off the device under test (i.e. load =0), set the heating power P heat is a fixed value.

[0109] Step 2: Record the cavity temperature rise curve T(t) until the temperature stabilizes.

[0110] Step 3: Fit the equation using the least squares method:

[0111]

[0112] Obtain the cavity heat capacity C and heat dissipation coefficient k.

[0113] 2. Calibrate the load-heat conversion coefficient β and compensation gain coefficient γ through step load experiments.

[0114] The test steps are as follows:

[0115] Step 1: Keep the cavity temperature stable at the set temperature T set (T set =50℃).

[0116] Step 2: Keep the heating power rate constant P heat , sudden load (P load Jump from 0 to the maximum value P max , such as P max =1000W), and record the temperature response curve in the cavity during this process, as shown in Table 2:

[0117] Table 2

[0118]

[0119] Step 3:

[0120] Determine β and γ according to the following fitting equations:

[0121]

[0122] Where, ΔT actual It is the deviation between the measured temperature and the set temperature in the step load experiment.

[0123] Step 4: γ value verification and optimization;

[0124] The γ value verification method is as follows: (1) Substitute the calibrated γ into the control system (i.e., at the heating power P heat Real-time offset ); (2) Repeat the step load test; (3) Compare the temperature fluctuations before and after compensation. γ value optimization strategy: If the overshoot is >0.5℃, increase the γ value (+10% to 20%); if the temperature undershoots (i.e., is lower than the set temperature), reduce the γ value (-10% to 15%); if the overshoot is ≤0.5℃, it means that the current γ value meets the requirements.

[0125] The β value is based on the first step load test without γ (i.e. without dynamic load compensation).

[0126] Implementation method of temperature control method for high temperature aging device applied to power metering and collection equipment:

[0127] A temperature control method for a high-temperature aging device used in power metering and data collection equipment, the method comprising: S1, obtaining the internal temperature of the device cavity at the next moment based on the current internal temperature of the device cavity, the heating power output by the heating device at the current moment, and the thermodynamic model of the device cavity; S2, inputting the deviation between the internal temperature of the device cavity at the next moment and the set temperature into a closed-loop temperature controller to obtain a heating power reference value for the heating device at the next moment; S3, adjusting the heating power output by the heating device based on the heating power reference value to maintain the internal temperature of the device cavity at the set temperature. The specific temperature control method for a high-temperature aging device used in power metering and data collection equipment has been described in sufficient detail in the above-mentioned embodiment of a high-temperature aging device used in power metering and data collection equipment and will not be repeated here.

[0128] Implementation method of temperature control system for high temperature aging device used in power metering and collection equipment:

[0129] A temperature control system for a high-temperature aging device for use in power metering and collection equipment includes a processor configured to execute a computer program to implement the steps of the temperature control method for a high-temperature aging device for use in power metering and collection equipment. The specific temperature control method for a high-temperature aging device for use in power metering and collection equipment has been described in sufficient detail in the aforementioned embodiment of the high-temperature aging device for use in power metering and collection equipment and will not be repeated here.

[0130] Finally, it should be noted that the above description is merely a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments without inventive effort, or replace some of the technical features therein with equivalents. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention shall be included within the scope of protection of the present invention.

Claims

1. A temperature control method for a high-temperature aging device used in power metering and acquisition equipment, characterized in that: The method includes: S1. Obtaining the internal temperature of the device cavity at the next moment based on the internal temperature of the device cavity at the current moment, the heating power output by the heating device at the current moment, and the thermodynamic model of the device cavity; S2. Inputting the deviation between the temperature inside the cavity of the device at the next moment and the set temperature into a closed-loop temperature controller to obtain a heating power reference value of the heating device at the next moment; S3. Adjust the heating power output by the heating device according to the heating power reference value so that the temperature inside the device cavity is maintained at the set temperature.

2. The temperature control method for a high-temperature aging device for electric power metering and acquisition equipment according to claim 1, characterized in that: The thermodynamic model is as follows: the heat change rate of the device cavity is equal to the difference between the heat power input into the device cavity and the heat power dissipated to the environment from the cavity surface; the heat power input into the device cavity includes the heating power output by the heating equipment and the heat power generated when the measured load is working.

3. The temperature control method for a high-temperature aging device applied to power metering and acquisition equipment according to claim 1 or 2, characterized in that: The thermodynamic model is: Wherein, T(t+Δt) is the internal temperature of the device cavity at time t+Δt; T(t) is the internal temperature of the device cavity at time t; Δt is the control period; C is the heat capacity of the device cavity; P heat (t) is the heating power output by the heating equipment at time t; T env is the ambient temperature outside the device cavity; k is the heat dissipation coefficient; β is the heat conversion coefficient of the measured load; I(t) is the operating current of the measured load at time t; V(t) is the operating voltage of the measured load at time t.

4. The temperature control method for a high-temperature aging device for electric power metering and acquisition equipment according to claim 1, characterized in that: The method of adjusting the heating power output by the heating device according to the heating power reference value includes: in the heating power reference value, the remaining heating power after deducting the equivalent power of the thermal power generated when the measured load is working is used as the target heating power, and the heating power output by the heating device is adjusted to the target heating power.

5. The temperature control method for a high-temperature aging device for electric power metering and acquisition equipment according to claim 4, characterized in that: The equivalent power of the thermal power generated by the measured load during operation is obtained according to the following formula: Among them, P γ It is the equivalent power of the heat power generated when the measured load is working; P is the rate of change of the electric power when the measured load is working; load is the electric power of the measured load when it is working; γ is the compensation gain coefficient.

6. The temperature control method for a high-temperature aging device for electric power metering and acquisition equipment according to claim 5, characterized in that: The compensation gain coefficient γ is obtained by calibrating the following step load experiment: (1) When the temperature inside the device cavity stabilizes at the set temperature T set When the electric power of the load being measured is P load Jump from 0 to the maximum value P max and maintain; recording the temperature response curve T(t) inside the cavity of the device; (2) According to (1), the temperature response curve T(t) inside the device cavity is fitted with the following equation to determine the values ​​of β and γ: Where ΔT actual is the difference between the measured temperature in the cavity and the set temperature T in the step load experiment set Deviation value; β is the heat conversion coefficient of the measured load; (3) Based on the γ value obtained in (2), re-execute (1) and adjust the γ value according to the overshoot of the temperature response until the overshoot meets the preset requirements.

7. The temperature control method for a high-temperature aging device for electric power metering and acquisition equipment according to claim 3, characterized in that: The heat conversion coefficient β of the measured load is obtained by calibrating the following step load experiment: 1) When the temperature inside the device cavity stabilizes at the set temperature T set When the electric power of the load being measured is P load Jump from 0 to the maximum value P max and maintain; recording the temperature response curve T(t) inside the cavity of the device; 2) The temperature response curve T(t) inside the device cavity obtained in 1) is fitted with the following equation to determine the values ​​of β and γ: Where ΔT actual is the difference between the measured temperature in the cavity and the set temperature T in the step load experiment set Deviation value; γ is the compensation gain coefficient.

8. The temperature control method for a high-temperature aging device for electric power metering and acquisition equipment according to claim 1, characterized in that: The closed-loop temperature controller includes a fuzzy PID controller composed of a fuzzy controller and a PID controller; the fuzzy controller obtains the change of the control parameter based on the error and the rate of change of the error, and corrects the control parameter in the PID controller based on the change of the control parameter; the error is the difference between the set temperature and the temperature inside the device cavity at the next moment.

9. A temperature control system for a high-temperature aging device used in power metering and acquisition equipment, comprising a processor, characterized in that: The processor is used to execute a computer program to implement the steps of the temperature control method of a high-temperature aging device applied to power metering and collection equipment according to any one of claims 1 to 8.

10. A high-temperature aging device for power metering and collection equipment, comprising a temperature controller, the temperature controller comprising a processor, characterized in that: The processor is used to execute a computer program to implement the steps of the temperature control method for a high-temperature measurement and acquisition aging device applied to electric power equipment as described in any one of claims 1 to 8.

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