Power-resistant performance test system

Abstract

The invention provides a power-resistant performance test system. The system comprises a power source device, a detection device, a focusing field device, a tested piece moving device and an upper computer, the upper computer outputs an initial signal output instruction; the power source device outputs a radio frequency signal according to the initial signal output instruction; the focusing field device performs radiation processing and focusing processing on the radio frequency signal to form a focusing field test area; the upper computer generates a new signal output instruction according to the actual power density, detected by the detection device, of the focusing field test area, and forms a new focusing field test area meeting the target power density through the power source device and the focusing field device; after the detected piece moving device moves to the new focusing field test area, the detection device detects temperature rise information of the detected piece in the new focusing field test area; and the upper computer determines the power-resistant performance of the tested piece under the target power density according to the temperature rise information. And the method can adapt to higher-power and wider-range power-resistant performance tests.

Description

Technical Field

[0001] The present application relates to the field of antenna technology, and in particular to a power handling performance testing system. Background Art

[0002] For radar, the primary means of improving detection capabilities lies in increasing the array area and increasing the transmission power. To meet these requirements, the absorbing materials used around the radar antenna must possess higher power tolerance. When a material is exposed to high-energy electromagnetic radiation, it generates heat. When the maximum temperature the material can withstand is reached, the electromagnetic radiation power at that point is called the material's maximum power tolerance. Therefore, testing a material's maximum power tolerance performance is crucial for radar.

[0003] In existing technologies, power resistance performance testing typically involves directly irradiating the material surface with radar or multi-antenna simulated radar. Temperature detection equipment then measures the temperature change of the material under electromagnetic power radiation to determine the material's power resistance. Direct radar irradiation presents issues such as uncontrollable power range and irradiation range, making it impossible to accurately determine key performance parameters such as the material's power tolerance limit and power saturation characteristics, leading to discrepancies in test results. Multi-antenna simulated radar requires sufficient testing distance and site size, and the irradiation range is uncontrollable, making it impossible to distinguish between the material's intrinsic performance and overall structural performance. Summary of the Invention

[0004] The purpose of this application is to provide a power resistance performance testing system to address the deficiencies in the above-mentioned prior art, realize a test area with adjustable frequency, power and irradiation range, and adapt to higher power and wider range power resistance performance testing.

[0005] To achieve the above objectives, the technical solutions adopted in the embodiments of the present application are as follows: In a first aspect, an embodiment of the present application provides a power handling performance testing system, comprising: a power source device, a detection device, a focusing field device, a device under test moving device, and a host computer, wherein the device under test is fixedly placed on the device under test moving device; the power source device is connected to the focusing field device, and the host computer is in communication with the power source device and the detection device; The host computer outputs an initial signal output instruction corresponding to the target power density to the power source device, wherein the initial signal output instruction is used to indicate the signal power and signal frequency corresponding to the target power density; The power source device outputs a radio frequency signal to the focusing field device according to the initial signal output instruction; The focusing field device receives the radio frequency signal and performs radiation processing and focusing processing on the radio frequency signal to form a focusing field test area; The host computer generates a new signal output instruction according to the actual power density of the focusing field test area detected by the detection device, and forms a new focusing field test area that meets the target power density through the power source device and the focusing field device; After the device under test moving device moves to a new focusing field test area, the detection device detects temperature rise information of the device under test in the new focusing field test area and sends the temperature rise information to the host computer; the host computer determines the power resistance performance of the device under test at the target power density based on the temperature rise information.

[0006] Optionally, the host computer generates a new signal output instruction according to the actual power density of the focusing field test area detected by the detection device, including: The host computer compares the actual power density with the target power density; If the difference between the actual power density and the target power density is greater than a preset threshold, the host computer determines a new signal power based on the difference and sends a new signal output instruction to the power source device, where the new signal output instruction is used to indicate the new signal power.

[0007] Optionally, the focusing field device includes: a feed antenna and a focusing device; The feed antenna is connected to the power source device, and the focusing device is arranged in the electromagnetic wave emission direction of the feed antenna; The feed antenna is used to radiate the radio frequency signal output by the power source device and output electromagnetic waves; The focusing device is used to focus the electromagnetic waves output by the feed antenna to form the focusing field test area.

[0008] Optionally, the detection device includes: a radiation field power detection device; After the focus field test area is formed, the radiation field power detection device is placed in the focus field test area; The radiation field power detection device detects the energy of the electromagnetic wave in the focusing field test area and converts the energy of the electromagnetic wave into a power value; and divides the power value by the area of ​​the focusing field test area to obtain the actual power density.

[0009] Optionally, the detection device further comprises: a temperature detection device; the temperature detection device is arranged in front of the measured object or connected to the measured object; The detection device detects temperature rise information of the device under test in the focusing field test area, including: The temperature detection device detects the temperature of the measured object at preset time intervals to obtain a temperature sequence, and uses the temperature sequence as the temperature rise information.

[0010] Optionally, the host computer determines the power handling performance of the device under test at the target power density according to the temperature rise information, including: Determining whether a change curve of the temperature sequence meets a preset condition; If the preset condition is met, the highest temperature in the temperature sequence whose number of consecutive highest temperatures is greater than a preset number threshold is used as the target highest temperature of the device under test at the target power density; The power handling performance of the device under test at the target power density is determined according to the target maximum temperature and the maximum allowable temperature of the device under test.

[0011] Optionally, the detection apparatus further comprises: a link power detection device; The link power detection device is connected to the power source device; The link power detection device detects the actual frequency and actual power of the radio frequency signal output by the power source device, and sends the actual frequency and the actual power to the host computer; The host computer determines whether the radio frequency signal output by the power source device is normal according to the actual frequency and the actual power.

[0012] Optionally, the host computer outputs an initial signal output instruction corresponding to the target power density to the power source device, including: The host computer obtains configuration parameters corresponding to the target power density input by the user; The host computer generates and outputs the initial signal output instruction according to the configuration parameters.

[0013] Optionally, it also includes: a power-resistant microwave darkroom; The power source device, the detection device, the focusing field device and the device for moving the test piece are all arranged in the power-resistant microwave darkroom.

[0014] Optionally, the power-resistant microwave darkroom includes a shielding shell and a power-resistant absorbing material inside the power-resistant microwave darkroom; The power-resistant wave-absorbing material is used to absorb redundant electromagnetic waves.

[0015] The beneficial effects of this application are: The present application provides a power handling performance testing system in which a host computer outputs an initial signal output instruction corresponding to a target power density to a power source device. The power source device then outputs a radio frequency signal to a focusing field device based on the initial signal output instruction. The focusing field device receives the radio frequency signal and performs radiation and focusing processing on the radio frequency signal to form a focused field test area. The focusing field device can focus the radio frequency signal output by the power source device, thereby achieving higher power density illumination conditions compared to existing direct illumination by a radar antenna. This system is suitable for power handling performance testing of higher power and a wider range of materials, and reduces the testing distance. The host computer generates a new signal output instruction based on the actual power density of the focused field test area detected by a detection device. The power source device and the focusing field device form a new focused field test area that meets the target power density. After a device moving the device under test moves to the new focused field test area, the detection device detects temperature rise information of the device under test within the new focused field test area and transmits the temperature rise information to the host computer. Based on the temperature rise information, the host computer determines the power handling performance of the device under test at the target power density. By forming a new focused field test area that meets the target power density and then moving the DUT into the new focused field test area for testing, the power handling performance test results can be more accurate. Furthermore, the power source device can output different RF signals based on the received signal output instructions, achieving controllable adjustment of the RF signal, thereby accurately measuring the power handling performance of the DUT. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without creative work.

[0017] Figure 1 A schematic diagram of the architecture of a power handling performance testing system provided in an embodiment of the present application; Figure 2 A schematic diagram of the architecture of another power handling performance testing system provided in an embodiment of the present application; Figure 3 A schematic diagram of the architecture of another power handling performance testing system provided in an embodiment of the present application; Figure 4 A schematic diagram of the architecture of another power handling performance testing system provided in an embodiment of the present application. DETAILED DESCRIPTION

[0018] In order to make the purpose, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. It should be understood that the drawings in the present application only serve the purpose of illustration and description and are not used to limit the scope of protection of the present application. In addition, it should be understood that the schematic drawings are not drawn to scale. The flowcharts used in this application illustrate the operations implemented according to some embodiments of the present application. It should be understood that the operations of the flowcharts can be implemented out of sequence, and steps without logical context can be reversed or implemented simultaneously. In addition, those skilled in the art, under the guidance of the contents of this application, can add one or more other operations to the flowchart, or remove one or more operations from the flowchart.

[0019] In addition, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. The components of the embodiments of the present application generally described and shown in the drawings here can be arranged and designed in various configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the claimed application, but merely represents selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative work are within the scope of protection of the present application.

[0020] It should be noted that the term "comprising" will be used in the embodiments of the present application to indicate the existence of the features declared thereafter, but does not exclude the addition of other features.

[0021] Figure 1 A schematic diagram of the architecture of a power handling performance test system provided in an embodiment of the present application is shown in FIG. Figure 1 As shown, the power withstand performance test system may include: a power source device 10, a detection device 11, a focusing field device 12, a DUT moving device 13, and a host computer 14. The DUT is fixedly placed on the DUT moving device 13, the power source device 10 may be connected to the focusing field device 12, and the host computer 14 may be communicatively connected to the power source device 10 and the detection device 11. Specifically, the host computer 14 may be communicatively connected to the power source device 10 and may also be communicatively connected to the detection device 11. The detection device 11 may include a variety of different types of detection equipment, and the detection results of different types of detection equipment may be different. The detection device 11 may be connected to the DUT in the DUT moving device 13 and may also be connected to the power source device 10.

[0022] The host computer 14 may be a terminal device with computing and display capabilities, such as a mobile phone, tablet computer, laptop computer, PDA, desktop computer, or a server. Specifically, it may be an application in the terminal device, such as a mobile phone application (APP) or a computer application system.

[0023] Optionally, the host computer 14 can output an initial signal output instruction corresponding to the target power density to the power source device 10, and the initial signal output instruction is used to indicate the signal power and signal frequency corresponding to the target power density, wherein the target power density refers to the power density of the test area indicated in advance by the user. When testing the power resistance performance of a device under test, it may be necessary to test the power resistance performance of the device under test at multiple power densities. Therefore, in the specific implementation process, multiple power densities can be tested one by one. For example, assuming that for a certain device under test, it is necessary to test the power resistance performance of the device under test at power density 1, power density 2 and power density 3. Then, according to the user's instructions, power density 1, power density 2 and power density 3 can be tested in turn. For example, first, power density 1 is used as the above-mentioned target power density, and the power resistance test system of the embodiment of the present application is used to test and obtain the power resistance performance of the device under test at power density 1. Then, power density 2 is used as the above-mentioned target power density, and the power resistance test system of the embodiment of the present application is used to test and obtain the power resistance performance of the device under test at power density 2. Then, power density 3 is used as the above-mentioned target power density, and the power resistance test system of the embodiment of the present application is used to test and obtain the power resistance performance of the device under test at power density 3.

[0024] Optionally, after receiving the initial signal output instruction, the power source device 10 may output a radio frequency signal to the focusing field device 12 according to the initial signal output instruction, wherein the power and frequency of the radio frequency signal output by the power source device 10 are the signal power and signal frequency corresponding to the target power density in the initial signal output instruction. The formed focusing field test area may be a cylindrical area with a depth, wherein the depth of the cylindrical area refers to the height of the cylinder, the height of the cylinder is at least 1 mm, and the diameter of the cylindrical area ranges from 1 mm to 2000 mm. The frequency range of the radio frequency signal output by the power source device 10 is the P to Ka band, and the power range of the output frequency signal is 1 W to 5 kW.

[0025] The power source device 10 includes one of the following: a solid-state power amplifier, a multi-stage amplifier cascade, and a vacuum tube amplifier. The power source device 10 can output different radio frequency signals according to different received signal output instructions.

[0026] For example, if the target power density is power density 1, the host computer 14 can output an initial signal output instruction 1 corresponding to the power density 1 to the power source device 10. After the power source device 10 receives the initial signal output instruction 1, the power source device 10 can output the radio frequency signal 1 to the focusing field device 12 according to the initial signal output instruction 1, wherein the signal power of the radio frequency signal 1 is power P1 and the signal frequency is frequency F1.

[0027] Optionally, the focusing field device 12 receives the radio frequency signal and performs radiation processing and focusing processing on the radio frequency signal to form a focusing field test area.

[0028] The host computer 14 generates a new signal output instruction according to the actual power density of the focusing field test area detected by the detection device 11, and forms a new focusing field test area that meets the target power density through the power source device 10 and the focusing field device 12.

[0029] Optionally, after the power source device 10 outputs the RF signal according to the initial signal output instruction, the actual power density of the focused field test generated after the focusing field device 12 performs radiation processing and focusing processing on the RF signal may differ from the target power density. Therefore, after forming the focused field test area, the detection device 11 first detects the actual power density of the focused field test area and generates a new signal output instruction based on the detected actual power density using a preset method. A new focused field test area that meets the target power density is formed by the power source device 10 and the focusing field device 12. The actual power density of the formed new focused field test area meets the target power density requirement. Optionally, when the formed new focused field test area meets the target power density, the DUT moving device 13 is moved to the new focused field test area. After the DUT moving device 13 moves to the new focused field test area, the detection device 11 detects the temperature rise information of the DUT in the new focused field test area and transmits the temperature rise information to the host computer 14. The host computer 14 can determine the power withstand performance of the DUT at the target power density based on the temperature rise information. The target power density may be any power density preset by the user.

[0030] For example, the entire testing process is described in detail through the following steps A to E: A: When the focusing field device 12 receives the radio frequency signal 1 , it performs radiation processing and focusing processing on the radio frequency signal 1 to form a focusing field test area 1 .

[0031] B: The detection device 11 detects the actual power density of the focusing field test area 1 to obtain the actual power density 1 of the focusing field test area 1.

[0032] C: Determine whether there is a difference between actual power density 1 and power density 1.

[0033] If there is a difference between the actual power density 1 and the power density 1, step D is executed. If there is no difference between the actual power density 1 and the power density 1, there is no need to generate a new focusing field test area, and the device moving device 13 under test is directly moved to the focusing field test area 1 for testing. D: The host computer generates a new signal output instruction 1 using a preset method according to the actual power density 1 and the power density 1, and forms a new focusing field test area 1 through the power source device 10 and the focusing field device 12.

[0034] Optionally, in step A, the power of the RF signal 1 forming the focusing field test area 1 is P1 and the frequency is F1. If the actual power density of the focusing field test area 1 formed in step A differs from the power density 1, the host computer generates a new signal output instruction 1, wherein the power of the RF signal in the new signal output instruction 1 is P2 and the frequency is F1, where P1 and P2 are different. Based on the power P2 and frequency F1 of the RF signal in the new signal output instruction 1, a new focusing field test area 1 is formed by the power source device 10 and the focusing field device 12.

[0035] E: Determine whether the actual power density of the new focusing field test area 1 is different from power density 1.

[0036] If the actual power density of the new focus field test area 1 differs from power density 1, the actual power density 1 in step D is replaced with the actual power of the new focus field test area 1, and the process returns to step D to iteratively generate new focus field test areas until the actual power density of the new focus field test area does not differ from power density 1. If the actual power density of the new focus field test area 1 does not differ from power density 1, the device under test moving device 13 is moved to the new focus field test area 1 for testing.

[0037] In this embodiment, a host computer outputs an initial signal output instruction corresponding to a target power density to a power source device. The power source device then outputs a radio frequency signal to a focusing field device based on the initial signal output instruction. The focusing field device receives the radio frequency signal and performs radiation and focusing processing on the radio frequency signal to form a focused field test area. The focusing field device can focus the radio frequency signal output by the power source device, achieving higher power density compared to conventional direct radiation via a radar antenna. This allows for testing the power withstand performance of higher power materials and a wider range of materials while reducing the testing distance. Furthermore, the host computer generates a new signal output instruction based on the actual power density of the focused field test area detected by a detection device. The power source device and the focusing field device then form a new focused field test area that meets the target power density. After the DUT moving device moves to the new focused field test area, the detection device detects the temperature rise of the DUT within the new focused field test area and transmits this temperature rise information to the host computer. Based on this temperature rise information, the host computer determines the power withstand performance of the DUT at the target power density. By forming a new focused field test area that meets the target power density and then moving the DUT into the new focused field test area for testing, the power handling performance test results can be more accurate. Furthermore, the power source device can output different RF signals based on the received signal output instructions, achieving controllable adjustment of the RF signal, thereby accurately measuring the power handling performance of the DUT.

[0038] In this embodiment, the power of the RF signal is controlled by adjusting its power and frequency, and the size of the focused field test area is controlled by a focused field device. Thus, by controlling both the power of the RF signal and the size of the focused field test area, precise control of the power density incident on the DUT is achieved. This makes the temperature rise effect on the DUT more significant, helps discover subtle performance differences in the DUT, improves test sensitivity, and enables accurate measurement of the DUT's power handling performance.

[0039] Optionally, the host computer generates a new signal output instruction according to the actual power density of the focusing field test area detected by the detection device, which may include: Specifically, the host computer 14 compares the actual power density with the target power density to obtain a difference between the actual power density and the target power density.

[0040] If the difference between the actual power density and the target power density is greater than a preset threshold, the host computer 14 can determine a new signal power based on the difference and send a new signal output instruction to the power source device 10. The new signal output instruction refers to a new signal power. The power source device 10 can then output a new RF signal based on the new signal output instruction. The focusing field device then receives the new RF signal and performs radiation processing and focusing processing on the new RF signal to form a new focusing field test area until the actual power density of the new focusing field test area meets the target power density. The power of the new RF signal is different from the power of the RF signal in the initial signal output instruction, but the frequency remains unchanged.

[0041] After the power source device 10 outputs the radio frequency signal according to the initial signal output instruction, the actual power density of the focusing field test formed after the focusing field device 12 performs radiation processing and focusing processing on the radio frequency signal is different from the target power density. Therefore, the host computer first determines the difference between the actual power density and the target power density, and determines the new signal power based on the difference, thereby generating a new signal output instruction, so as to form a new focusing field test area that meets the target power density based on the new signal output instruction through the power source device 10 and the focusing field device 12.

[0042] In this embodiment, the position machine generates a new signal output instruction based on the difference between the actual power density and the target power density, that is, adjusts the power of the radio frequency signal output by the power source device, so that the power of the radio frequency signal can be adjusted according to the test requirements, which can meet the test requirements, and the formed focused field test area meets the target power density, which can make the performance test environment of the device under test more accurate, thereby making the performance test results more accurate.

[0043] Figure 2 This is a schematic diagram of the architecture of another power handling performance testing system provided in an embodiment of the present application, such as Figure 2 As shown, the focusing field device 12 may include: a feed antenna 121 and a focusing device 122 .

[0044] The feed antenna 121 may be connected to the power source device 10 . Specifically, the feed antenna 121 may be connected to the output end of the power source device 10 . The focusing device 122 may be arranged in the signal transmission direction of the feed antenna 121 .

[0045] The focusing device 122 may include one or more of the following: a double-sided focusing lens, a Huygens lens, a Luneburg lens, a parabolic reflector, and a metamaterial.

[0046] Optionally, the feed antenna 121 can radiate the radio frequency signal output by the power source device 10. Specifically, the radio frequency signal output by the power source can be radiated into space to output electromagnetic waves. The focusing device 122 can focus the electromagnetic waves radiated into space by the feed antenna 121 to form a focusing field test area.

[0047] Different devices under test require different power densities in the test area. The power density of the focused field test area affects the temperature rise of the device under test. Therefore, by using a focusing device to form a controllable focused field test area, the power density of the test area can be increased. Specifically, different focusing devices can produce different sizes of focused field test areas. Specifically, by controlling the parameters of the focusing device or using different focusing devices, the spatial distribution of the electromagnetic wave, that is, the size of the focused field test area, can be controlled.

[0048] In this embodiment, the focusing device 122 can be used to focus the radio frequency signal to a point, thereby enhancing the power density of the focus field test area, thereby forming an irradiation condition with higher power density, and adapting to the power resistance performance test of the higher power DUT.

[0049] Figure 3 A schematic diagram of the architecture of another power handling performance test system provided in an embodiment of the present application is shown in FIG. Figure 3 As shown, the above-mentioned detection device 11 may include: a radiation field power detection device 111.

[0050] After the focused field test area is formed, the radiation field power detection device 111 is set in the focused field test area. The radiation field power detection device 111 detects the energy of the electromagnetic waves in the focused field test area and converts the energy of the electromagnetic waves into a power value; and then divides the power value by the area of ​​the focused field test area to obtain the actual power density.

[0051] The radiated field power detection device 111 can detect power density by matching an antenna probe with a receiving link, or by using a field strength detection probe. Specifically, during testing, if the antenna probe matches the receiving link, the antenna probe can be placed in the focused field test area for testing, and the receiving link can be placed in the focused field test area or elsewhere. If the field strength detection probe is used, the field strength detection probe is placed in the focused field test area for testing.

[0052] Continue as Figure 3 As shown, the detection device 11 may further include a temperature detection device 112 , wherein the temperature detection device 112 may be disposed in front of the device under test or connected to the device under test.

[0053] The temperature detection equipment includes non-contact and contact temperature detection equipment. Non-contact temperature detection equipment includes, for example, infrared temperature probes and infrared temperature imagers, while contact temperature detection equipment includes, for example, thermocouples and fiber optic thermometers. Non-contact temperature detection equipment can be positioned in front of the device under test, i.e., on the same side as the focusing field device 12. Contact temperature detection equipment is connected to the device under test, for example, by being positioned on the device under test moving device 13.

[0054] Optionally, the detection device 11 detects temperature rise information of the device under test in the focusing field test area, including: Specifically, the temperature detection device 112 can detect the temperature of the device under test at preset time intervals to obtain a temperature sequence, which is used as temperature rise information. When the device under test is irradiated by electromagnetic waves of a target power density, the temperature of the device under test changes. Therefore, the temperature detection device 112 can detect the temperature of the device under test at preset time intervals to obtain the temperature rise information of the device under test at the target power density. The temperature sequence represents the temperature change over time.

[0055] Optionally, the host computer determines the power handling performance of the device under test at the target power density based on the temperature rise information, which may include: Specifically, the host computer may first determine a change curve of the temperature sequence, and determine whether the change curve meets a preset condition, wherein the preset condition may be that the temperature changes with time in a pattern of first rising and then flattening.

[0056] Then, if the temperature sequence detected by the temperature detection device 112 is a changing sequence that first rises and then flattens, the temperature sequence meets the preset conditions, and the highest temperature whose consecutive number of highest temperatures in the temperature sequence is greater than the preset number threshold is used as the target maximum temperature of the device under test at the target power density. Among them, the preset number threshold can be set according to actual needs. If the consecutive number of highest temperatures in the temperature sequence is greater than the preset number threshold, it means that the highest temperature is a stable temperature. At this time, the highest temperature can be used as the target maximum temperature of the device under test at the target power density. For example, the preset number threshold can be set to 20. If the temperature of the device under test is collected once every second, the preset number threshold is 20s. If the highest temperature in the temperature sequence is 60°C for 25 consecutive seconds, that is, 25s is greater than the preset number threshold 20, then the target maximum temperature of the device under test at the target power density is 60°C.

[0057] Then, based on the target maximum temperature and the maximum allowable temperature of the device under test, the power resistance performance of the device under test at the target power density is determined. Specifically, if the target maximum temperature is less than or equal to the maximum allowable temperature of the device under test, it means that the device under test meets the tolerance range at the target power density; if the target maximum temperature is greater than the maximum allowable temperature of the device under test, it means that the device under test does not meet the tolerance range at the target power density. Among them, the maximum allowable temperature of the device under test refers to the maximum limit of the temperature resistance of the device under test. The maximum allowable temperature of the device under test can be known in advance or obtained based on the results of the power resistance performance test in this application.

[0058] For example, if the maximum allowable temperature of the device under test is known in advance, such as the maximum allowable temperature of the device under test is 80°C, if under the target power density A, the target maximum temperature of the device under test is detected to be 60°C, and the maximum allowable temperature of the device under test is 80°C, then it means that under the target power density A, the device under test has good power resistance performance; if under the target power density B, the target maximum temperature of the device under test is detected to be 95°C, and the maximum allowable temperature of the device under test is 80°C, then it means that under the target power density B, the tolerance limit of the device under test is exceeded.

[0059] For example, if the maximum allowable temperature of the DUT is unknown, i.e., it needs to be determined through the power withstand test described in this application, the target power density in the focused field test area is varied to measure the target maximum temperature of the DUT at different target power densities. If the DUT exhibits performance degradation or failure, smoke, burning, or fire during the target maximum temperature test at a certain target power density, the DUT is determined to be intolerant to the target power density. For example, if power density 1, power density 2, and power density 3 are set, with power density 1 < power density 2 < power density 3, and the DUT does not suffer physical damage under both power density 1 and power density 2, the DUT is tolerant to the power density under both power density 1 and power density 2; if physical damage occurs at power density 3, the DUT is intolerant to the power density under power density 3.

[0060] Continue as Figure 3 As shown, the detection device 11 may further include: a link power detection device 113. Figure 3 As shown, the link power detection device 113 can be connected to the power source device 10 , specifically, can be connected to the output end of the power source device 10 .

[0061] The link power detection device includes one of the following: a power meter matched with a power sensor, a spectrum analyzer, a directional coupler matched with a detector, and a power detection chip.

[0062] Optionally, the link power detection device 113 can detect the actual frequency and actual power of the radio frequency signal output by the power source device 10, and send the actual frequency and actual power to the host computer 14. After the host computer 14 receives the actual frequency and actual power of the radio frequency signal output by the power source device 10 detected by the link power detection device 113, the host computer 14 can determine whether the radio frequency signal output by the power source device 10 is normal based on the actual frequency and actual power.

[0063] For example, if the power source device 10 outputs the radio frequency signal 1 based on the initial signal output instruction, the link power detection device 113 detects the actual power and actual frequency of the radio frequency signal 1, and sends the actual frequency and actual power to the host computer 14. The host computer 14 can determine whether the radio frequency signal 1 output by the power source device 10 is normal based on the actual frequency and actual power.

[0064] Specifically, if it is determined that the radio frequency signal output by the power source device 10 is abnormal, the host computer 14 may control the power source device 10 to re-output the radio frequency signal or stop outputting the radio frequency signal.

[0065] In this embodiment, the link power detection device can ensure that the radio frequency signal output by the power source device is a normal signal.

[0066] Optionally, the host computer outputting an initial signal output instruction corresponding to the target power density to the power source device may include: Specifically, the host computer 14 may obtain configuration parameters corresponding to the target power density input by the user, wherein the configuration parameters may be the signal power and signal frequency corresponding to the target power density. After the host computer 14 obtains the configuration parameters, it generates and outputs an initial signal output instruction based on the obtained configuration parameters.

[0067] Figure 4 A schematic diagram of the architecture of another power handling performance test system provided in an embodiment of the present application is shown as follows: Figure 4 As shown, the power resistance performance test system may further include: a power resistance microwave darkroom 15.

[0068] The power source device 10 , the detection device 11 , the focusing field device 12 and the device under test moving device 13 are all disposed in the power-resistant microwave darkroom 15 .

[0069] The power-resistant microwave darkroom 15 may include a shielding shell and a power-resistant wave-absorbing material 151 inside the power-resistant microwave darkroom. The power-resistant wave-absorbing material may be arranged in the electromagnetic wave emission direction of the feed antenna to absorb redundant electromagnetic waves.

[0070] The power-resistant absorbing material 151 can be used to absorb redundant electromagnetic waves. The power-resistant absorbing material 151 can include one of the following: an absorbing cone, an absorbing honeycomb, an absorbing coating, a non-woven fiber-based material, a magnetic material, or a metamaterial.

[0071] Optionally, during the power handling performance test of the device under test, the power and frequency of the RF signal output by the power source device can be adjusted to achieve power handling performance testing of the device under test at different target power densities. The above specific embodiment describes the power handling performance test of the device under test at one target power density. The power handling performance test of the device under test at other target power densities is similar to the process in the above specific embodiment and is not described in detail here.

[0072] In this application, a focusing device is used to focus electromagnetic waves, forming a test area with adjustable frequency, power, and irradiation range. This allows for systematic and accurate characterization of the power withstand performance and temperature rise information of the device under test. This makes it suitable for power withstand performance testing of higher power and wider range devices under test.

[0073] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working process of the system and device described above can refer to the corresponding process in the method embodiment, and will not be repeated in this application. In the several embodiments provided in this application, it should be understood that the disclosed system, device and method can be implemented in other ways. The device embodiments described above are merely schematic. For example, the division of the modules is only a logical function division. There may be other division methods in actual implementation. For example, multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, indirect coupling or communication connection of devices or modules, which can be electrical, mechanical or other forms.

[0074] In addition, the functional units in the various embodiments of the present application can be integrated into a single processing unit, each unit can exist physically separately, or two or more units can be integrated into a single unit. If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the portion that contributes to the prior art, or the portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the method described in the various embodiments of the present application. The aforementioned storage medium includes various media that can store program code, such as a USB flash drive, a mobile hard drive, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk.

[0075] The above is only a specific implementation method of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with this technical field can easily think of changes or replacements within the technical scope disclosed in this application, which should be covered by the protection scope of the present application.

Claims

1. A power handling performance testing system, characterized in that: The power resistance performance test system includes: a power source device, a detection device, a focusing field device, a device for moving a test piece, and a host computer, wherein the test piece is fixedly placed on the device for moving a test piece; the power source device is connected to the focusing field device, and the host computer is in communication with the power source device and the detection device; The host computer outputs an initial signal output instruction corresponding to the target power density to the power source device, wherein the initial signal output instruction is used to indicate the signal power and signal frequency corresponding to the target power density; The power source device outputs a radio frequency signal to the focusing field device according to the initial signal output instruction; The focusing field device receives the radio frequency signal and performs radiation processing and focusing processing on the radio frequency signal to form a focusing field test area; The host computer generates a new signal output instruction according to the actual power density of the focusing field test area detected by the detection device, and forms a new focusing field test area that meets the target power density through the power source device and the focusing field device; After the device under test moving device moves to a new focusing field test area, the detection device detects temperature rise information of the device under test in the new focusing field test area and sends the temperature rise information to the host computer; the host computer determines the power resistance performance of the device under test at the target power density based on the temperature rise information.

2. The power handling performance testing system according to claim 1, characterized in that: The host computer generates a new signal output instruction according to the actual power density of the focusing field test area detected by the detection device, including: The host computer compares the actual power density with the target power density; If the difference between the actual power density and the target power density is greater than a preset threshold, the host computer determines a new signal power based on the difference and sends a new signal output instruction to the power source device, where the new signal output instruction is used to indicate the new signal power.

3. The power handling performance testing system according to claim 1, characterized in that: The focusing field device includes: a feed antenna and a focusing device; The feed antenna is connected to the power source device, and the focusing device is arranged in the electromagnetic wave emission direction of the feed antenna; The feed antenna is used to radiate the radio frequency signal output by the power source device and output electromagnetic waves; The focusing device is used to focus the electromagnetic waves output by the feed antenna to form the focusing field test area.

4. The power handling performance testing system according to claim 1, characterized in that: The detection device includes: a radiation field power detection device; After the focus field test area is formed, the radiation field power detection device is placed in the focus field test area; The radiation field power detection device detects the energy of the electromagnetic wave in the focusing field test area and converts the energy of the electromagnetic wave into a power value; and divides the power value by the area of ​​the focusing field test area to obtain the actual power density.

5. The power handling performance testing system according to claim 1, characterized in that: The detection device further includes: a temperature detection device; the temperature detection device is arranged in front of the measured object or connected to the measured object; The detection device detects temperature rise information of the device under test in the focusing field test area, including: The temperature detection device detects the temperature of the measured object at preset time intervals to obtain a temperature sequence, and uses the temperature sequence as the temperature rise information.

6. The power handling performance testing system according to claim 5, characterized in that: The host computer determines the power handling performance of the device under test at the target power density according to the temperature rise information, including: Determining whether a change curve of the temperature sequence meets a preset condition; If the preset condition is met, the highest temperature in the temperature sequence whose number of consecutive highest temperatures is greater than a preset number threshold is used as the target highest temperature of the device under test at the target power density; The power handling performance of the device under test at the target power density is determined according to the target maximum temperature and the maximum allowable temperature of the device under test.

7. The power handling performance testing system according to claim 1, characterized in that: The detection device further comprises: a link power detection device; The link power detection device is connected to the power source device; The link power detection device detects the actual frequency and actual power of the radio frequency signal output by the power source device, and sends the actual frequency and the actual power to the host computer; The host computer determines whether the radio frequency signal output by the power source device is normal according to the actual frequency and the actual power.

8. The power handling performance testing system according to claim 1, characterized in that: The host computer outputs an initial signal output instruction corresponding to the target power density to the power source device, including: The host computer obtains configuration parameters corresponding to the target power density input by the user; The host computer generates and outputs the initial signal output instruction according to the configuration parameters.

9. The power handling performance testing system according to claim 1, characterized in that: Also includes: Power-resistant microwave darkroom; The power source device, the detection device, the focusing field device and the device for moving the test piece are all arranged in the power-resistant microwave darkroom.

10. The power handling performance testing system according to claim 9, characterized in that: The power-resistant microwave darkroom comprises a shielding shell and a power-resistant absorbing material inside the power-resistant microwave darkroom; The power-resistant wave-absorbing material is used to absorb redundant electromagnetic waves.

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