Business function test method and device, medium and product

Abstract

The invention discloses a service function test method and device, a medium and a product, and relates to the technical field of computers, a plurality of test hosts and a plurality of test devices are connected with a controller, and a target test host and at least one target test device are located in the same local area network. The problem that a plurality of test hosts and a plurality of test devices in a plurality of groups of test jigs are all connected with a central server, and the test hosts and the test devices are not in communication connection, so that all the test devices need to be traversed in the searching process, and the test efficiency is reduced is solved. Through direct communication connection between the target test host and the at least one target test device in the local area network, only the test progress of the target test device in the local area network needs to be concerned, and the search waiting range is narrowed; the technical effects of searching parallel processing for the target test equipment in each local area network and improving the test efficiency in each local area network are achieved.

Description

Technical Field

[0001] The present application relates to the field of computer technology, and in particular to a business function testing method, device, medium, and product. Background Art

[0002] When testing functional test fixtures, a one-to-many connection (one test host and multiple test devices) is typically used. Multiple groups of test fixtures are connected to a central server. Once a test device completes testing, it must wait for the other test devices in the same group to complete their tests before restarting the test host in the same group and testing the next function. During this waiting period, the central server must be checked to see if the test device is in the same group. Whenever a test device completes testing, the central server must be checked to see if it is in the same group, or if it corresponds to a server in the same group. This entire search process takes a considerable amount of time, reducing the overall efficiency of the test function.

[0003] Therefore, how to improve the efficiency of functional testing is an urgent problem that needs to be solved by those skilled in the art. Summary of the Invention

[0004] The present application provides a business function testing method, device, medium and product to at least solve the problem in the related art that multiple test hosts and multiple test devices in multiple groups of test fixtures are all connected to a central server, and there is no communication connection between the test host and the test device, which requires the search process to traverse all test devices, resulting in reduced testing efficiency.

[0005] The present application provides a service function testing method, which is applied to a service function testing apparatus, including a controller, multiple test hosts, and multiple test devices; the multiple test hosts and the multiple test devices are all connected to the controller, and a target test host of the multiple test hosts and at least one target test device of the multiple test devices are located in the same local area network; the method includes:

[0006] Determine the target test host and target test device in the current LAN;

[0007] When the control target test host completes the functional test on one target test device, it searches for and waits for other target test devices in the same local area network to perform functional tests;

[0008] After the target test device in the current LAN is tested, restart the target test host and the target test device in the same LAN to perform the next functional test.

[0009] The present application provides a service function testing device, comprising a controller, multiple test hosts, and multiple test devices;

[0010] The plurality of test hosts and the plurality of test devices are all connected to the controller, and a target test host of the plurality of test hosts and at least one target test device of the plurality of test devices are in the same local area network;

[0011] The controller is used to execute the steps of the business function testing method described above.

[0012] The present application also provides a computer-readable storage medium, in which a computer program is stored. When the computer program is executed by a processor, the steps of any of the above-mentioned business function testing methods are implemented.

[0013] The present application also provides a computer program product, including a computer program, which implements the steps of any of the above-mentioned business function testing methods when executed by a processor.

[0014] Through this application, since the conventional solution connects multiple test hosts and multiple test devices in multiple groups of test fixtures to the central server, after the test of one test device is completed, it is necessary to search and wait for the test devices in the same group to complete the test in all test devices before restarting. In this way, the search process takes up a lot of time, resulting in reduced test efficiency. On the one hand, the present application is applied to a business function testing device, multiple test hosts and multiple test devices are connected to a controller, and the target test host and at least one target test device are in the same local area network, forming a direct communication connection between the target test host and at least one target test device, so that during the functional test process, the target test host and at least one target test device in the same local area network are tested, and only the test progress of the target test device in the local area network needs to be paid attention to, thereby narrowing the search and waiting range. Compared with the conventional method of connecting all test hosts and all test devices to the central server, it is necessary to search and wait in all test devices through the central server, which increases the traversal search process for all test devices. The present application only needs to traverse and search within the local area network. On the second aspect, the target test host among the multiple test hosts and at least one target test device among the multiple test devices are in the same local area network, realizing a flexible division process of the test host and the test device. Through the isolation division within the local area network, the flexibility and diversity of the test can be improved according to different functional tests. On the third aspect, due to the existence of multiple local area networks, the controller can realize functional testing within multiple local area networks while also realizing parallel processing of searches for target test devices within each local area network. Control one of the target test devices in the current local area network to complete the functional test, search and wait for other target test devices in the same local area network to perform functional tests, and restart the target test host and the corresponding target test device after the test of the target test device in the current local area network is completed. Compared with the conventional solution in which only one test device can be searched at the same time, the present application also improves the efficiency of search testing when using local area network isolation.

[0015] Therefore, it is possible to solve the technical problem that multiple test hosts and multiple test devices in multiple groups of test fixtures are all connected to the central server, and there is no communication connection between the test hosts and the test devices, which requires the search process to traverse all test devices, resulting in reduced test efficiency. The target test host of multiple test hosts in a local area network and at least one target test device of multiple test devices can be directly connected to each other through communication. It is only necessary to pay attention to the test progress of the target test device in the local area network, while narrowing the search waiting range, and realizing parallel processing of searches for target test devices in each local area network in each local area network, thereby improving the technical effect of testing efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0017] Figure 1 This is a schematic diagram of the business function test scenario in the conventional technical solution;

[0018] Figure 2 A schematic diagram of a single-point interconnection between a test host and a test device in a conventional technical solution;

[0019] Figure 3 A schematic diagram of a one-to-two interconnection between a test host and a test device in a conventional technical solution;

[0020] Figure 4 A flowchart of a business function testing method provided in an embodiment of the present application;

[0021] Figure 5 A structural diagram of a service function testing device provided in an embodiment of the present application;

[0022] Figure 6 A flowchart of another business function testing method provided in an embodiment of the present application;

[0023] Figure 7 A structural diagram of another service function testing device provided in an embodiment of the present application;

[0024] Figure 8 A schematic diagram of communication interactions between two local area networks provided in an embodiment of the present application;

[0025] Figure 9 A pin diagram of a switch port provided in an embodiment of the present application;

[0026] Figure 10 This is a structural diagram of a business function testing device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0027] The following will be combined with the accompanying drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0028] It should be noted that, in the description of this application, the terms "comprises," "includes," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. The terms "first," "second," etc., in this application are used to distinguish similar objects, and are not used to describe a particular order or sequence.

[0029] In order to enable those skilled in the art to better understand the present application, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.

[0030] The data processing capabilities of Data Processing Unit (DPU) cards, the cornerstone of artificial intelligence, have become a crucial technology for companies to improve their competitiveness and seize opportunities. During DPU design, factories are integrating more and more functions into a single device to reduce R&D costs. These functions are then implemented by writing different software based on specific business scenarios, maximizing hardware utilization.

[0031] In traditional server production, functional circuit testing (FCT) plays a crucial role as the final step in quality control. During FCT testing of DPUs, engineers need to burn different firmware for different business scenarios and perform corresponding functional tests. Switching firmware or business scenarios requires a system restart, which means that a single board needs to be restarted or switched between itself and the server multiple times during testing. The network card and server state transitions are interdependent, and they lack direct communication. If a device fails, the entire process cannot execute correctly. This leads to increasingly complex programming tasks for developers and lower production yields. With daily production of thousands of units, FCT capacity becomes a bottleneck in the production process, severely impacting productivity. To increase output, factories prepare numerous FCT test stations and fixtures, each costing hundreds of thousands of yuan, significantly increasing the burden on the factory.

[0032] The conventional technical solution is to have one network card correspond to one server. Such a single point of interconnection will waste server resource utilization during functional business testing, so communication and interaction will be carried out in a way that corresponds to multiple network cards within a server. Figure 1 This is a schematic diagram of the business function test scenario in the conventional technical solution, such as Figure 1 As shown, each network card (test equipment, Figure 1 Device in the test) and each server (test host, Figure 1 All the network cards (replaced by host in the example) are connected to the central server. There is no connection between the network card and the server, and all communications are implemented through the central server. When performing business function testing, some network cards will correspond to server A for function testing, and some network cards will correspond to server B for function testing. In server A, multiple network cards are functionally tested at the same time. After network card 1 is tested, it will wait for network card 2, and then wait for network card 3, etc., until all network cards under server A have completed testing the current function, and then the server can be restarted. However, during the test waiting process, all network cards under all servers need to be traversed and searched, which requires manual intervention and collective waiting. While waiting for the setting, it is necessary to check the central server to see which network card it is and which server it corresponds to for function control. The entire traversal and search process takes a long time, even longer than the function test time, resulting in reduced overall test efficiency.

[0033] In the FCT detection solution, the test host and the test equipment are both connected at a single point. Figure 2 This is a schematic diagram of a single point of interconnection between a test host and a test device in a conventional technical solution, such as Figure 2 As shown, during the test, it is necessary to constantly confirm the status of the other end before proceeding to the next step of verification. If a device has a startup abnormality, manual intervention is required. In order to improve production efficiency, during the one-to-two test process, Figure 3 This is a schematic diagram of a one-to-two interconnection between a test host and a test device in a conventional technical solution, such as Figure 3 As shown, the test host must ensure that all DPUs are in normal status before continuing the test. If software or hardware abnormalities occur in individual devices, the test will be unable to continue. In the R&D stage, when the test yield is generally low, the test pass rate is very low and the production capacity is very poor.

[0034] The business function testing method provided in this application can solve the above technical problems.

[0035] The present application provides a service function testing method, which is applied to a service function testing apparatus, including a controller, multiple test hosts, and multiple test devices; the multiple test hosts and the multiple test devices are all connected to the controller, and a target test host of the multiple test hosts and at least one target test device of the multiple test devices are in the same local area network; Figure 4 A flow chart of a business function testing method provided in an embodiment of the present application is as follows: Figure 4 As shown, the method includes:

[0036] S11: Determine the target test host and target test device in the current local area network;

[0037] S12: When the target test host completes the functional test on one of the target test devices, searching for and waiting for other target test devices in the same local area network to perform functional tests;

[0038] S13: After the target test device in the current LAN is tested, the target test host and the target test device in the same LAN are restarted to perform the next functional test.

[0039] Specifically, the target test host and target test device within the current LAN are determined. It should be noted that this step already establishes the LAN and identifies the target test host and target test device for communication within the LAN. After the device is powered on, it first reads the current device configuration information, primarily including control instructions, the number of test hosts and test devices, input / output port (IO) device information, and LAN capabilities. The presence of the test host and test device is then checked to complete initialization.

[0040] When performing the current functional test in step S12, the target test host will perform synchronous functional tests on all target test devices connected in direct communication. If there is a target test device that has completed the functional test, that is, after the first target test device has completed the test, it is necessary to check whether other target test devices have also completed the functional test. The check here only checks the progress of the target test devices in the current local area network. If there are target test devices that have not completed the current functional test, it is necessary to wait. The check here needs to be judged by checking the device serial number of the completed target test device. After waiting for all target test devices in the current local area network to complete the test, the target test host and target test device can be restarted to perform the next functional test. The restart process here requires restarting the target test host first, and then restarting the target test device after the restart is successful.

[0041] Through this application, since the conventional solution connects multiple test hosts and multiple test devices in multiple groups of test fixtures to the central server, after the test of one test device is completed, it is necessary to search and wait for the test devices in the same group to complete the test in all test devices before restarting. In this way, the search process takes up a lot of time, resulting in reduced test efficiency. On the one hand, the present application is applied to a business function testing device, multiple test hosts and multiple test devices are connected to a controller, and the target test host and at least one target test device are in the same local area network, forming a direct communication connection between the target test host and at least one target test device, so that during the functional test process, the target test host and at least one target test device in the same local area network are tested, and only the test progress of the target test device in the local area network needs to be paid attention to, thereby narrowing the search and waiting range. Compared with the conventional method of connecting all test hosts and all test devices to the central server, it is necessary to search and wait in all test devices through the central server, which increases the traversal search process for all test devices. The present application only needs to traverse and search within the local area network. On the second aspect, the target test host among the multiple test hosts and at least one target test device among the multiple test devices are in the same local area network, realizing a flexible division process of the test host and the test device. Through the isolation division within the local area network, the flexibility and diversity of the test can be improved according to different functional tests. On the third aspect, due to the existence of multiple local area networks, the controller can realize functional testing within multiple local area networks while also realizing parallel processing of searches for target test devices within each local area network. Control one of the target test devices in the current local area network to complete the functional test, search and wait for other target test devices in the same local area network to perform functional tests, and restart the target test host and the corresponding target test device after the test of the target test device in the current local area network is completed. Compared with the conventional solution in which only one test device can be searched at the same time, the present application also improves the efficiency of search testing when using local area network isolation.

[0042] Therefore, it is possible to solve the technical problem that multiple test hosts and multiple test devices in multiple groups of test fixtures are all connected to the central server, and there is no communication connection between the test hosts and the test devices, which requires the search process to traverse all test devices, resulting in reduced test efficiency. The target test host of multiple test hosts in a local area network and at least one target test device of multiple test devices can be directly connected to each other through communication. It is only necessary to pay attention to the test progress of the target test device in the local area network, while narrowing the search waiting range, and realizing parallel processing of searches for target test devices in each local area network in each local area network, thereby improving the technical effect of testing efficiency.

[0043] In some embodiments, the system further includes a port expander and a logic device; the port expander includes a plurality of switches; the plurality of switches are sequentially connected to achieve communication between the switches; the plurality of test hosts and the plurality of test devices are connected to the ports of their respective switches; and the target test hosts of the plurality of test hosts and at least one target test device of the plurality of test devices are connected to the ports of the switch providing the same local area network; the logic device is connected to the plurality of test hosts and the plurality of test devices, and the logic device is connected to the controller; before controlling the target test host to complete a functional test on one of the target test devices, the system further includes:

[0044] Determine the device information of the target test device and the configuration information of the target test host;

[0045] If the device information matches the configuration information, determine that the device information meets the test conditions, and issue a startup command to the target test host to complete the startup of the target test host;

[0046] In the case that the device information does not match the configuration information, it is determined that the device status of the device information of the target test host is abnormal, the device status corresponding to the control logic device is displayed abnormally, and the functional test in the current local area network is stopped.

[0047] Specifically, before conducting a functional test, you need to verify the normal status of the target test host and target test device. Functional testing can only be performed if these conditions are normal. First, determine the target test device's device information and configuration information. The device information here can be the target test device's performance parameters. The configuration information refers to the performance parameters configured for the target test host, such as the Internet Protocol (IP) address, subnet mask, and gateway.

[0048] If the device information matches the configuration information, the test conditions are confirmed to be met and a power-on command is issued to the target test host to power it on. If the information does not match, the target test host's device status must be determined to be abnormal. In this case, the control logic device must indicate the abnormal device status, which can be displayed using a light-emitting diode (LED). Functional testing within the current LAN must be stopped to facilitate the replacement of the target test host.

[0049] Before performing a functional test, the embodiment provides that it is necessary to ensure that the device status of the target test host is normal, the target test host is initialized, and the target test device meets the test conditions, so as to provide a guarantee for subsequent functional testing.

[0050] In some embodiments, after the target test host is powered on, the method further includes:

[0051] Send a power-on command to the target test device to power on the target test device;

[0052] During the boot process, if the device status of the target test device is abnormal, the device status corresponding to the control logic device will be displayed as abnormal, and the functional test in the current LAN will be stopped;

[0053] If the device status of the target test device is normal, the process proceeds to a step of controlling the target test host to complete a functional test on one of the target test devices.

[0054] Specifically, after the target test host is powered on, a power-on command is issued to the target test device to power on. If the target test device's device status is abnormal, the control logic device's corresponding device status will be displayed as abnormal, and functional testing will be stopped. If the device status is normal, subsequent functional testing will proceed.

[0055] This embodiment provides that after the target test host is completely powered on, a power-on test is performed on the target test device to ensure that the subsequent functional test is performed under a normal device status of the target test device.

[0056] In some embodiments, a process of dividing a target test host among a plurality of test hosts and at least one target test device among a plurality of test devices includes:

[0057] Determine the business functions and / or product types that the functional tests correspond to;

[0058] Use the test equipment corresponding to the same business function and / or the same product type as the target test equipment;

[0059] Filter out the test host with the highest comprehensive capabilities from multiple test hosts based on business functions and / or product types to serve as the target test host;

[0060] Divide the target test device and target test host into the same local area network.

[0061] It should be noted that the matching of the target test device's device information and the target test host's configuration information in the above embodiment corresponds to the compatibility between the target test device and the target test host. The current partitioning process is targeted at partitioning within the same local area network (LAN) to determine the number of target test devices within that LAN. The basis for this partitioning can be based on business capabilities, product type, or a combination of both.

[0062] Test devices corresponding to the same business function and / or product type are designated as target test devices. Based on these factors, the test host with the highest overall capability is selected as the target test host. This selection process is based on the set of test hosts that the target test device can match. The target test devices and target test hosts are then assigned to the same local area network to complete the division process.

[0063] The division process provided in this embodiment uses business functions and / or product types as a basis for division, so as to realize flexible division processing of test hosts and test equipment in the same local area network, thereby improving the decoupling function of functional testing.

[0064] In some embodiments, searching for and waiting for other target test devices in the same local area network to perform functional testing includes:

[0065] Mapping the functional test constraints of the target test host and multiple target test devices in the current local area network in an instruction set manner in advance;

[0066] The power-on operation of the target test host in the current LAN is processed by setting the host power-on command, and the host power-on command is set to the command sequence number;

[0067] Determine the device serial numbers corresponding to the target test host and multiple target test devices;

[0068] Setting the dependency condition of the device serial numbers of the multiple target test devices as the instruction serial number of the host power-on instruction;

[0069] After the target test host is powered on by the host power-on command, multiple target test devices are powered on according to dependency conditions to perform current function tests;

[0070] One of the target test devices is used as a first target test device, and the other target test devices are used as second target test devices;

[0071] When the current functional test is completed in the second target test device, receiving a device serial number of the second target test device fed back by the target test host;

[0072] If the device serial number of the fed-back second target test device is the same as the device serial number of the recorded second target test device, it is determined that the plurality of second target test devices complete the current functional test.

[0073] Specifically, during the search wait period, a variety of common coordination command functions are provided, allowing you to focus solely on the service itself. Functional test constraints for the target test host and multiple target test devices within the current LAN are mapped in advance using an instruction set. The functional test constraint here requires that the target test device can only be restarted after the target test host has been restarted.

[0074] The target test host is powered on by mapping the target test host to a command, that is, a host power-on command, which is set as a command serial number. The target test host and the plurality of target test devices are each provided with a corresponding device serial number.

[0075] The dependency conditions of the device serial numbers of the multiple target test devices are set as the instruction serial numbers corresponding to the host power-on instruction. After the test host is powered on, the multiple target test devices are powered on according to the dependency conditions corresponding to the instruction serial numbers to complete the current function test.

[0076] Since there are multiple second target test devices, when a second target test device completes the current functional test, it receives feedback on the device serial number of the second target test device and determines whether it is the same as the recorded device serial number. If it is the same, it means that all test devices of the second target test device have completed the current functional test. Table 1 is an instruction function table. As shown in Table 1, sequence: a digital sequence of instructions, uniquely represented, providing a lookup for subsequent dependencies. Instruction identifier (ID): an identifier for execution, which calls instructions with the collaborative system work instruction ID. Instruction set: a combination of instructions under the Linux system, which can be multiple. Dependency condition: a condition that must be met before the current instruction is executed by setting the dependency. If the dependency value is not empty, the instruction sequence in the dependency must be executed before executing the changed instruction. Device: 1) represents the test host, 2) represents the test device.

[0077] Table 1

[0078] Currently, we take a test host and a test device as an example. For example, after the test device completes the firmware upgrade, it needs to be restarted. The business requirement is that all test devices must complete the restart operation before the test host can restart. After the restart is completed, the business test can be carried out. At this time, the configuration instruction sequences (3) and (4) can be completed. When the main device restarts (4), the test device must complete the restart (3) before the business test can continue.

[0079] The startup cooperative control method and functional testing method between the test host and the test equipment provided in this embodiment are completed through instruction functions, which simplifies the complexity of control operations and improves execution efficiency.

[0080] In some embodiments, restarting the target test host and the target test device in the same local area network to perform the next functional test includes:

[0081] The restart operation of the target test host in the current local area network is processed by setting the host restart instruction, and the host restart instruction is set to an instruction sequence number;

[0082] Setting the restart dependency conditions of the device serial numbers of the multiple target test devices as the instruction serial numbers of the host restart instruction;

[0083] After the target test host is restarted through the host restart instruction, multiple target test devices are restarted according to the restart dependency conditions to perform the next functional test.

[0084] As shown in Table 1, after completing the current functional test, it is necessary to restart the target test host and target test equipment before the next functional test. The restart operation is processed by the host restart instruction setting, such as Power cycle. The host restart instruction is set as the instruction sequence number, such as sequence number (7). The restart dependency condition of the device sequence number of multiple target test devices is set as the instruction sequence number of the host restart execution, and the sequence number (7) is relied upon in the secondary process. After the target test host is restarted by the host restart instruction, the multiple target test devices are restarted according to the restart dependency condition to perform the next functional test.

[0085] This embodiment provides that after the current function test is completed and before switching to the next function for testing, the target test host and target test equipment in the current local area network need to be restarted. The restart operation is limited by the restart dependency conditions and only focuses on the business itself, improving execution efficiency through instruction execution.

[0086] In some embodiments, a direct memory access configuration process corresponding to a functional test of a target test host and multiple target test devices includes:

[0087] Set up registers of multiple target test devices according to direct memory access configuration scenarios;

[0088] When the target test host is restarted, checking and processing the completion status of the registers of the plurality of target test devices according to the host restart instruction of the target test host;

[0089] If there is a target test device with an abnormal device status, the processing of the target test device with the abnormal device status is skipped;

[0090] If the completion setting of the register of the target test device is not completed, set the preset time;

[0091] If the completion setting of the register of the target test device is still not completed when the preset time is reached, it is determined that the device status of the target test device that has not completed the setting at the preset time is abnormal;

[0092] If the register setting of the target test device is not completed when the preset time is reached, a restart operation is performed on the target test host to complete the direct memory access configuration process.

[0093] Specifically, in Direct Memory Access (DMA) scenarios involving test equipment, the DPU must be instructed to set the Field-Programmable Gate Array (FPGA) registers. This means setting the registers of multiple target test equipment based on the DMA configuration scenario. The collaborative system is then notified of the need to reboot the host. Following the host reboot instructions from the target test host, the system checks the completion of the register setup for the multiple target test equipment.

[0094] When the collaborative system receives a host restart request, it will first check whether all target test devices have completed the FPGA register setting. The target test device that has failed the abnormal test will no longer be checked. That is, if there is a target test device with an abnormal device status, the target test device with an abnormal device status will be skipped.

[0095] If there is a target test device that has not completed the setting, continue to wait until the target test device that has not been notified of the timeout setting has a test exception. That is, if the completion setting of the register of the target test device is still not completed when the preset time is reached, it is determined that the device status of the target test device that has not completed the setting within the preset time is abnormal.

[0096] If all target test devices have completed the settings, the host starts to restart. After the restart is completed, the collaborative system notifies all target test devices to perform DMA testing, and the host configuration update status is completed.

[0097] This embodiment provides a DMA scenario test for host configuration changes. After the test is completed, it ensures that data can be transmitted quickly and efficiently, thereby enhancing system reliability. Through testing, problems with the test equipment can be discovered in a timely manner, avoiding functional test failures caused by test equipment failures.

[0098] In some embodiments, the service function testing apparatus further includes a video imaging device and a network card device; the controller is connected to the video imaging device, and the controller is connected to the network card device; and the method further includes:

[0099] Collecting a first test log during a current functional test of a target test host;

[0100] Collecting corresponding second test logs during current functional testing of multiple target test devices;

[0101] Merging the first test log and the plurality of second test logs to obtain a third test log;

[0102] The third test log is displayed through a video imaging device and uploaded to a central server through a network card device.

[0103] Specifically, it is necessary to collect test logs during the current functional test process of the target test host and multiple target test devices, and merge them so as to be displayed through a video imaging device and uploaded to a central server through a network card device.

[0104] Figure 5 A structural diagram of a service function test device provided in an embodiment of the present application, such as Figure 5 As shown, the device boards utilize RJ45 network ports, commonly found on graphics processing units (GPUs), DPUs, and test hosts, allowing for interconnection using standard network cables. For vulnerable device boards, a decoupled modular design reduces maintenance complexity and repair costs. The test setup uses a video graphics array (VGA) device to display the progress of each device in real time for easy observation by test personnel. Test logs are aggregated and uploaded to a central server via a virtual local area network (VLAN) port.

[0105] Figure 6 Another flow chart of a business function testing method provided in an embodiment of the present application is as follows: Figure 6 As shown, the steps are as follows:

[0106] 1. After the collaborative system is powered on, it first reads the configuration information of the current DPU test machine, including the control instructions, the number of target test hosts and target test devices, and the corresponding IO port device information. At the same time, through the VLAN function of the switch, each target test device and the target test host are interconnected. The status of each device is checked according to the number, and the indicator light is turned on to complete the initialization.

[0107] 2. The collaborative system reads the information of the target test host and the target test device, establishes a connection between the target test host and the target test device, and displays the link status of each device on the display.

[0108] 3. The collaborative system links to the central server system to confirm the device information of each target test device and ensure that the current device meets normal test conditions. The collaborative system sends a power-on command to the target test host to complete the power-on of the target test host. After the power-on is complete, it sends another command to notify the target test device to power on. If an abnormality occurs, the corresponding LED light of the corresponding device will light up and an alarm message will be displayed on the display, indicating that the current board test has failed. After the failure, the device of the corresponding port will no longer be tested in the subsequent process.

[0109] 4. Issue instructions: Based on diagnostic requirements, the collaborative system can query information or set status for the target test host out-of-band, and query information or set status for all target test devices in normal status.

[0110] 5. Business scenario update: When completing a business scenario test, each GPU / DPU card needs to update the firmware information. At this time, the collaborative system updates the firmware of all target test devices through the out-of-band system and monitors the update progress of each device. After completing the firmware update, it sends a wireless access controller (AC) instruction to the corresponding target test device to restart until the new business is replaced after the restart. The collaborative system needs to check that all devices have completed the restart and are in normal status before sending instructions to the target test host to restart and complete the initialization operation of the server-side device.

[0111] 6. Host configuration change: When it comes to DMA scenario testing of DPU, the collaborative system first informs DPU to set the FPGA registers, and then notifies the collaborative system that the host needs to be restarted. When the collaborative system receives the host restart request, it will first check whether all target test devices have completed the FPGA register settings. The target test devices that have failed the abnormal test will no longer be checked. If there are target test devices that have not completed the settings, continue to wait until the timeout setting and the target test device that has not been notified tests abnormally. If all target test devices have completed the settings, the host starts to restart. After the restart is complete, the collaborative system notifies all target test devices to perform DMA testing, and the host configuration update status is completed.

[0112] 7. The collaborative system repeats steps 4-6 for different business scenarios according to the user's settings until all instructions are executed.

[0113] 8. The collaborative system collects the test logs of the target test host, then queries the logs of each target test device in turn, and finally merges them into a completed test log, which is uploaded to the server system as the final test conclusion of the test device, and then the test results are output through VGA to inform the high-speed operator of the test status of each board.

[0114] The test log records corresponding to the target test host and target test device provided in this embodiment are displayed through video imaging equipment and uploaded to the central server through the network card device, which is convenient for test personnel to observe and integrate and reduce maintenance complexity and repair costs.

[0115] Furthermore, the present application also provides a service function testing device, Figure 7 This is a structural diagram of another service function testing device provided in an embodiment of the present application, such as Figure 7 As shown, the device includes a controller 1, multiple test hosts and multiple test devices;

[0116] Multiple test hosts and multiple test devices are all connected to the controller 1, and a target test host of the multiple test hosts and at least one target test device of the multiple test devices are in the same local area network;

[0117] Controller 1 is used to control the target test host in the current LAN to complete the functional test of one of the target test devices in the same LAN, search and wait for other target test devices in the same LAN to complete the functional test, restart the target test host and the target test device in the same LAN, and perform the next functional test.

[0118] Specifically, a controller connects multiple test hosts and multiple test devices. The number of test hosts and test devices connected here can be related to the number of ports provided by the controller. The controller can directly connect the test hosts and test devices. To reduce the number of ports occupied by the controller, a port expander can be added to occupy one port of the controller, and the test hosts and test devices can be connected to the port expander. This is not limited here and can be set according to actual conditions.

[0119] The target test host of the multiple test hosts and at least one target test device of the multiple test devices are located within the same local area network. It is understood that within the same local area network, the target test host and the at least one target test device both support Ethernet communication, etc., so a direct communication connection can be achieved, i.e., the at least one target test device is directly connected to the target test host. Compared to conventional technical solutions, the two are not directly connected, but are indirectly connected through a central server.

[0120] It should be noted here that there can be multiple LANs between multiple test hosts and multiple test devices. The test hosts and test devices between LANs are not occupied at the same time. If the test host or the test device is occupied in one LAN, it will not be called again in the subsequent LAN. In other words, a test host and a test device can only be in one LAN. There is no limit on the division of multiple test hosts and multiple test devices corresponding to the LAN. They can be based on the same or similar business, or test devices under the same product, etc. The selection of the test host can correspond to the test host with the performance required for the business or the product. The selection process here is not limited and can be set according to the actual situation.

[0121] Of course, the flexible division here is not fixed after the first division. After a batch of functional tests are completed, it can be divided and expanded again according to the current business or product needs. There is no limitation here.

[0122] Regarding the expansion of test hosts and test equipment, you can expand them as much as the number of ports can support them. Of course, you also need to consider the overall performance resources of the test equipment and expand them appropriately.

[0123] In the same LAN, there must be a target test host and at least one target test device to facilitate parallel business function testing in different LANs.

[0124] The controller is used to issue control instructions to control the target test host in the current LAN to perform functional tests on multiple target test devices in the same LAN. After testing one target test device, it is necessary to check whether there are other target test devices that have not yet been tested. If so, it is necessary to wait. This check only checks the test devices in the current LAN, unlike the conventional technical solution that requires checking the serial numbers and other information corresponding to the test devices in all LANs at the same time to identify the test status of specific test devices. During this search process, multiple LANs are searched and waited simultaneously, which narrows the search scope and simplifies the search process and time compared to the LAN.

[0125] If all target test devices in the same LAN have completed the functional test, it is necessary to restart the target test host and the corresponding target test devices to perform the next functional test.

[0126] The business function testing device provided in this application has the same beneficial effects as the above-mentioned business function testing method.

[0127] In some embodiments, considering that the controller's instructions are not only for issuing instructions for business function testing, but may also involve monitoring of device status and transmission interaction, the corresponding ports are limited. If all the controller ports are used for the test host and test equipment of the business function test, the number of ports will be insufficient and other normal operations cannot be completed. Therefore, a port expander 2 is also included;

[0128] Multiple test hosts and multiple test devices are connected to the port expander 2;

[0129] The controller 1 is connected to the port expander 2 .

[0130] Specifically, multiple test hosts and multiple test devices are connected to a port expander. The port expander can be an integrated circuit, a network interface card, a serial port, or a switch, without limitation. The port expander is connected to a controller to receive commands from the controller and subsequently transmit these commands to test hosts and test devices within different local area networks.

[0131] The connection relationship of the port expander provided in this embodiment reduces the port burden of the controller, realizes port expansion and management, and realizes a one-to-many connection relationship between controllers while ensuring that the controller can normally complete other operations of non-business function service testing.

[0132] In some embodiments, the port expander includes a plurality of switches; the plurality of switches are sequentially connected to enable communication between the switches;

[0133] The plurality of test hosts and the plurality of test devices are connected to ports of their respective corresponding switches, and the target test host of the plurality of test hosts and at least one target test device of the plurality of test devices are connected to ports of the switch providing the same local area network;

[0134] Multiple switches are connected to the controller.

[0135] like Figure 7 As shown, the port expander includes multiple switches. This is because the port expander not only expands the number of ports, but also expands the network ports and enables data exchange. The switches are connected to each other through their own internal ports, that is, they are connected in sequence.

[0136] Figure 8 The communication interaction diagram corresponding to the two local area networks provided in the embodiment of the present application is as follows: Figure 8 As shown, multiple test hosts and multiple test devices are connected to ports of their respective switches. One switch provides a local area network function, that is, one switch connects a target test host and at least one target test device. Multiple switches are connected to a controller.

[0137] by Figure 8 For example, the test device can support the control of multiple test equipment. Figure 8 Each of the two products requires a test host. Each host supports four test devices, which are connected to the test setup simultaneously. A switch provides seven ports, with internal interconnected ports and six external ports. To prevent traffic between devices from interfering with each other, the ports are automatically assigned corresponding VLANs based on the number of test services.

[0138] The port extender provided in this embodiment includes switch functionality and directly supports VLAN configuration. Network administrators can perform port expansion and VLAN assignment on a single device without configuring a separate switch. Configuration and monitoring can be performed through a unified management interface. Administrators can easily view and manage the status, traffic statistics, and VLAN configuration of all ports.

[0139] In some embodiments, further comprising a logic device;

[0140] The logic device 3 is connected to multiple test hosts and multiple test devices, and is used to determine the device status of the corresponding connected test hosts or test devices;

[0141] The logic device 3 is connected to the controller 1 .

[0142] It should be noted that the logic device can be a complex programmable logic device (CPLD) or other device, without limitation. The logic device connects to the test host and test equipment to determine the device status of each device. This primarily involves detecting device presence and controlling LEDs corresponding to device status, allowing the device to visually display test results for each device.

[0143] The logic device provided in this embodiment monitors device status in real time, promptly detecting whether a device is in place, effectively avoiding system interruptions caused by device loss or failure, and reducing the impact of failures on functional testing. At the same time, it can quickly respond to changes in device status.

[0144] In some embodiments, the ports connecting the plurality of test hosts and the plurality of test devices to the corresponding switches include power pins, switch pins, and status pins;

[0145] The power pin of the switch is also connected to the power supply pin of the controller;

[0146] The status pin of the logic device is connected to the status pin of the switch.

[0147] Specifically, a port is used to connect external devices or internal components to enable data transmission and communication. A port has multiple pins, each responsible for transmitting a specific signal. A pin is the physical connection point of a port that transmits electrical signals. A pin is a metal contact point, and each pin corresponds to a different function. Figure 9 The pin diagram of the switch port provided in the embodiment of the present application is as follows: Figure 9 As shown, it includes data / command pin (DC), power pin, switch pin and status pin. Figure 7 As can be seen, the power pin of the switch is also connected to the power supply pin of the controller, and the status pin of the logic device is connected to the status pin of the switch.

[0148] Peripheral interfaces are most susceptible to damage during factory production. To improve equipment durability and maintainability, the device board is decoupled and developed. The device board uses the controller's 3.3V power pins to transmit network information via the Media-Dependent Interface (MDI). To prevent operators from improperly installing the device, an in-place detection signal is provided. If the device information on the device and the configured device information are inconsistent, an alarm message is generated. The device board provides three LEDs: R, B, and G, to indicate different statuses. B indicates normal operation of the device, R indicates a test abnormality, and G indicates device test completion. This LED setting greatly facilitates operators in knowing the test status of each device.

[0149] The connection relationship between different pins in the port provided in this embodiment satisfies the power supply, switch communication, and device presence detection functions, thereby achieving port functional diversity while also saving port occupancy.

[0150] In some embodiments, a video image device and a network card device are also included;

[0151] The controller is connected to the video image device to display the test log and test progress of the functional test;

[0152] The controller is connected to the network card device and is used to interact with the central server through the network card device.

[0153] Figure 7 The controller is also used to connect to the video imaging device and the network card device. The video imaging device is a VGA device, which displays the specific test logs and different test progress for the user to view. The network card device interacts with the test device and the central server through the network.

[0154] The connection relationship between the video imaging device, the network card device and the controller provided in this embodiment ensures the smooth completion of the functional test while also facilitating user viewing and interaction with the central server, thereby improving the functional diversity of the test device.

[0155] Through the description of the above implementation methods, those skilled in the art can clearly understand that the method according to the above embodiment can be implemented by means of software plus the necessary general hardware platform, and of course it can also be implemented by hardware, but in many cases the former is a better implementation method.

[0156] The embodiment of the present application also provides a service function testing device, Figure 10 A structural diagram of a service function test device provided in an embodiment of the present application, such as Figure 10 As shown, the device includes:

[0157] Determination module 11, used to determine the target test host and target test device in the current local area network;

[0158] The search module 12 is used to search and wait for other target test devices in the same local area network to perform functional tests when the target test host completes the functional test on one target test device;

[0159] The restart module 13 is used to restart the target test host and the target test device in the same local area network after the test of the target test device in the current local area network is completed, and to perform the next functional test.

[0160] For the description of the features in the embodiment corresponding to the business function testing device, please refer to the relevant description of the embodiment corresponding to the business function testing method, and will not be repeated here.

[0161] An embodiment of the present application further provides an electronic device, comprising a memory and a processor, wherein the memory stores a computer program, and the processor is configured to run the computer program to execute the steps in any of the above-mentioned business function testing method embodiments.

[0162] An embodiment of the present application further provides a computer-readable storage medium, in which a computer program is stored, wherein the computer program is configured to execute the steps of any of the above-mentioned business function testing method embodiments when running.

[0163] In an exemplary embodiment, the computer-readable storage medium may include, but is not limited to, various media that can store computer programs, such as a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk, or an optical disk.

[0164] An embodiment of the present application further provides a computer program product, which includes a computer program. When the computer program is executed by a processor, the steps in any of the above-mentioned business function testing method embodiments are implemented.

[0165] An embodiment of the present application also provides another computer program product, including a non-volatile computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, it implements the steps in any of the above-mentioned business function testing method embodiments.

[0166] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the components and steps of each example according to their functions. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0167] The above is a detailed introduction to a business function testing device, method, medium and product provided by the present application. Specific examples are used herein to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only applicable to help understand the method and core idea of ​​the present application. It should be pointed out that for ordinary technicians in this technical field, without departing from the principles of the present application, several improvements and modifications can be made to the present application, and these improvements and modifications also fall within the scope of protection of the present application.

Claims

1. A business function testing method, characterized in that: Applicable to business function test equipment, including a controller, multiple test hosts and multiple test devices; A plurality of test hosts and a plurality of test devices are all connected to a controller, and a target test host of the plurality of test hosts and at least one target test device of the plurality of test devices are in the same local area network; the method comprises: Determine the target test host and target test device in the current LAN; When the control target test host completes the functional test on one target test device, it searches for and waits for other target test devices in the same local area network to perform functional tests; After the target test device in the current LAN is tested, restart the target test host and the target test device in the same LAN to perform the next functional test.

2. The service function testing method according to claim 1, characterized in that: The system further includes a port expander and a logic device; the port expander includes a plurality of switches; the plurality of switches are sequentially connected to achieve communication between the switches; the plurality of test hosts and the plurality of test devices are connected to the ports of their respective switches, and the target test hosts of the plurality of test hosts and at least one target test device of the plurality of test devices are connected to the ports of the switch providing the same local area network; the logic device is connected to the plurality of test hosts and the plurality of test devices, and the logic device is connected to the controller; Before controlling the target test host to complete the functional test on one of the target test devices, the method further includes: Determine the device information of the target test device and the configuration information of the target test host; If the device information matches the configuration information, determining that the device information meets the test condition, and issuing a power-on instruction to the target test host to complete the power-on of the target test host; In the case that the device information does not match the configuration information, it is determined that the device status of the device information of the target test host is abnormal, the device status corresponding to the logic device is controlled to display abnormality, and the functional test in the current local area network is stopped.

3. The service function testing method according to claim 2, characterized in that: After the target test host is started up, the method further includes: Sending a power-on command to a target test device to power on the target test device; During the boot process, if the device status of the target test device is abnormal, the device status corresponding to the logic device is controlled to display abnormality, and the functional test in the current local area network is stopped; If the device status of the target test device is normal, the step of controlling the target test host to complete a functional test on one of the target test devices is entered.

4. The business function testing method according to claim 1, characterized in that: The process of dividing a target test host among a plurality of test hosts and at least one target test device among a plurality of test devices includes: Determine the business functions and / or product types that the functional tests correspond to; Use the test equipment corresponding to the same business function and / or the same product type as the target test equipment; Filter out the test host with the highest comprehensive capabilities from multiple test hosts based on business functions and / or product types to serve as the target test host; The target test device and the target test host are divided into the same local area network.

5. The service function testing method according to claim 3, characterized in that: Find and wait for other target test devices in the same LAN to perform functional tests, including: Mapping the functional test constraints of the target test host and multiple target test devices in the current local area network in an instruction set manner in advance; The power-on operation of the target test host in the current local area network is processed by setting a host power-on instruction, and setting an instruction sequence number for the host power-on instruction; Determine the device serial numbers corresponding to the target test host and multiple target test devices; Setting the dependency conditions of the device serial numbers of the plurality of target test devices as the instruction serial number of the host power-on instruction; After the target test host is powered on by the host power-on instruction, a plurality of target test devices are powered on according to dependency conditions to perform a current function test; One of the target test devices is used as a first target test device, and the other target test devices are used as second target test devices; When the current functional test is completed in the second target test device, receiving a device serial number of the second target test device fed back by the target test host; If the device serial number of the fed-back second target test device is the same as the device serial number of the recorded second target test device, it is determined that a plurality of second target test devices have completed the current functional test.

6. The service function testing method according to claim 5, characterized in that: Restart the target test host and the target test device in the same LAN and proceed to the next functional test, including: The restart operation of the target test host in the current local area network is processed by setting a host restart instruction, and setting an instruction sequence number for the host restart instruction; Setting the restart dependency conditions of the device serial numbers of the plurality of target test devices as the instruction serial numbers of the host restart instruction; After the target test host is restarted by the host restart instruction, a restart operation is performed on multiple target test devices according to the restart dependency conditions to perform the next functional test.

7. The service function testing method according to claim 2, characterized in that: The direct memory access configuration process corresponding to the functional test of the target test host and multiple target test devices includes: Set up registers of multiple target test devices according to direct memory access configuration scenarios; When the target test host is restarted, checking and processing the completion status of the registers of the plurality of target test devices according to the host restart instruction of the target test host; If there is a target test device with an abnormal device status, the processing of the target test device with the abnormal device status is skipped; If the completion setting of the register of the target test device is not completed, set the preset time; If the completion setting of the register of the target test device is still not completed when the preset time is reached, it is determined that the device status of the target test device that has not completed the setting at the preset time is abnormal; If the register setting of the target test device is not completed when the preset time is reached, a restart operation is performed on the target test host to complete the direct memory access configuration process.

8. The service function testing method according to any one of claims 1 to 7, characterized in that: The service function testing device further includes a video imaging device and a network card device; the controller is connected to the video imaging device, and the controller is connected to the network card device; the method further includes: Collecting a first test log during a current functional test of a target test host; Collecting corresponding second test logs during current functional testing of multiple target test devices; Merging the first test log and the plurality of second test logs to obtain a third test log; The third test log is displayed through a video imaging device and uploaded to a central server through a network card device.

9. A service function testing device, characterized in that: Including a controller, multiple test hosts and multiple test devices; The plurality of test hosts and the plurality of test devices are all connected to the controller, and a target test host of the plurality of test hosts and at least one target test device of the plurality of test devices are in the same local area network; The controller is used to execute the steps of the business function testing method described in any one of claims 1 to 8.

10. The service function testing device according to claim 9, characterized in that: Also included is a port expander; Multiple test hosts and multiple test devices are connected to the port expander; The controller is connected to the port expander.

11. The service function testing device according to claim 10, characterized in that: The port expander includes a plurality of switches; the plurality of switches are connected in sequence to achieve communication between the switches; The plurality of test hosts and the plurality of test devices are connected to ports of their respective corresponding switches, and the target test host of the plurality of test hosts and at least one target test device of the plurality of test devices are connected to ports of the switch providing the same local area network; Multiple switches are connected to the controller.

12. The service function testing device according to claim 11, characterized in that: Also includes logic devices; The logic device is connected to a plurality of test hosts and a plurality of test devices, and is used to determine the device status of the corresponding connected test hosts or test devices; The logic device is connected to the controller.

13. The service function testing device according to any one of claims 9 to 12, characterized in that: It also includes video imaging equipment and network card equipment; The controller is connected to the video image device and is used to display the test log and test progress of the functional test; The controller is connected to the network card device and is used for performing interactive processing with the central server through the network card device.

14. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, wherein the computer program, when executed by a processor, implements the steps of the business function testing method according to any one of claims 1 to 8.

15. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the business function testing method according to any one of claims 1 to 8 are implemented.

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