Cable insulation deterioration degree evaluation method based on scattering test and related equipment

Abstract

The embodiment of the invention discloses a cable insulation degradation degree evaluation method based on a scattering test and related equipment, relates to the technical field of cable quality detection, and only needs to obtain the scattering intensity of a cable insulation material, so that a large number of samples and a complex sample treatment process are not needed, and the cable sample does not need to be destructively damaged. By constructing the first relation curve among the scattering intensity, the scattering vector and the interface phase thickness parameter, the correlation among the scattering intensity, the scattering vector and the interface phase thickness parameter can be comprehensively considered, and different preset interface phase thickness parameters, the first relation curve and the preset scattering vector range are utilized; the optimal interface phase thickness parameter is determined in different preset interface phase thickness parameters, and the optimal interface phase thickness parameter can accurately represent the microstructure degradation state of the cable insulation material, so that the optimal interface phase thickness parameter is used for evaluating the structure degradation degree of the to-be-evaluated cable insulation material; and the degradation condition of the cable insulation material can be accurately reflected.

Description

Technical Field

[0001] The present invention relates to the technical field of cable quality detection, and in particular to a cable insulation degradation degree assessment method based on a scattering test and related equipment. Background Art

[0002] In terms of detecting and evaluating the degradation of cable insulation microstructure, existing methods mostly rely on physical, chemical testing or electrical property measurements, and usually conduct microstructure degradation assessments based on the insulation performance and microstructure changes of the insulation material during the aging process. The above methods for evaluating insulation microstructure degradation all have their own defects, which bring varying degrees of limitations to the characterization of microstructure degradation status. For example, the characterization method based on the breakdown field strength characteristic quantity requires a large number of samples and causes irreparable damage to the samples; the characterization method based on the dielectric loss characteristic quantity has high requirements for the sample processing process and the test is time-consuming; methods such as X-ray diffraction and Fourier transform infrared spectroscopy based on microstructure changes can only calculate the characteristic parameters from a certain perspective to evaluate the microstructure degradation. In addition, the microstructure degradation process is very complex, and the degradation of cable insulation at different levels is usually not synchronized, so it is impossible to accurately characterize the degree of degradation of cable insulation. Summary of the Invention

[0003] In view of this, the present invention provides a cable insulation degradation degree assessment method based on a scattering test and related equipment.

[0004] The specific technical solution of the first embodiment of the present invention is: a method for evaluating the degree of degradation of the microstructure of cable insulation based on a scattering test, the method comprising: performing a small-angle scattering experiment on the cable insulation material to be evaluated to obtain the scattering intensity of the cable insulation material to be evaluated; constructing a first relationship curve between the scattering intensity, the scattering vector of the scattering intensity and the interface phase thickness parameter of the cable insulation material to be evaluated; the interface phase thickness parameter is the thickness of the transition region between the crystalline phase and the adjacent amorphous phase of the cable insulation material; using different preset interface phase thickness parameters, the first relationship curve and a preset scattering vector range, determining the optimal interface phase thickness parameter among the different preset interface phase thickness parameters; the optimal interface phase thickness parameter is the actual interface phase thickness parameter of the cable insulation material to be evaluated; and evaluating the degree of structural degradation of the cable insulation material to be evaluated based on the optimal interface phase thickness parameter.

[0005] Preferably, the method of using different preset interface phase thickness parameters, the first relationship curve and the preset scattering vector range to determine the optimal interface phase thickness parameter among the different preset interface phase thickness parameters includes: correcting the first relationship curve using different preset interface phase thickness parameters to obtain a second relationship curve corresponding to each preset interface phase thickness parameter; and fitting the second relationship curve within the preset scattering vector range to determine the optimal interface phase thickness parameter.

[0006] Preferably, fitting the second relationship curve within the preset scattering vector range to determine the optimal interface phase thickness parameter includes: fitting the second relationship curve within the preset scattering vector range to obtain a fitting straight line for each second relationship curve; obtaining the standard deviation between the fitting straight line and the second relationship curve; determining the second relationship curve corresponding to the smallest standard deviation as the optimal second relationship curve; the target preset interface phase thickness parameter in the optimal second relationship curve is the optimal interface phase thickness parameter.

[0007] Preferably, the first relationship curve is obtained using the following formula:

[0008] in, is a preset constant, is the correlation distance, which is a measure of the heterogeneity of a two-phase system. is the interface phase thickness parameter, is the scattering vector, is the scattering intensity.

[0009] Preferably, the evaluating the degree of microstructural degradation of the cable insulation material to be evaluated according to the optimal interface phase thickness parameter includes: obtaining the transition interface phase thickness of the cable insulation material to be evaluated according to the optimal interface phase thickness parameter; the transition interface phase thickness is the transition interface thickness from the crystalline region to the amorphous region of the cable insulation to be evaluated; and evaluating the degree of structural degradation of the cable insulation material to be evaluated according to the transition interface phase thickness and preset evaluation rules.

[0010] Preferably, the preset evaluation rules include: the greater the thickness of the transition interface phase, the lighter the degree of structural degradation of the cable insulation material to be evaluated; and the smaller the thickness of the transition interface phase, the more severe the degree of structural degradation of the cable insulation material to be evaluated.

[0011] Preferably, the thickness of the transition interface phase is obtained using the following formula:

[0012] in, is the thickness of the transition interface phase, is the optimal interface phase thickness parameter.

[0013] The specific technical solution of the second embodiment of the present application is: a cable insulation microstructure degradation degree evaluation system based on scattering test, the system comprising: a scattering intensity acquisition module, a relationship curve construction module, an optimal selection module and an evaluation module; the scattering intensity acquisition module is used to perform a small-angle scattering experiment on the cable insulation material to be evaluated to obtain the scattering intensity of the cable insulation material to be evaluated; the relationship curve construction module is used to construct a first relationship curve between the scattering intensity, the scattering vector of the scattering intensity and the interface phase thickness parameter of the cable insulation material to be evaluated; the interface phase thickness parameter is the thickness of the transition region between the crystalline phase and the adjacent amorphous phase of the cable insulation material; the optimal selection module is used to use different preset interface phase thickness parameters, the first relationship curve and a preset scattering vector range to determine the optimal interface phase thickness parameter among the different preset interface phase thickness parameters; the optimal interface phase thickness parameter is the actual interface phase thickness parameter of the cable insulation material to be evaluated; the evaluation module is used to evaluate the structural degradation degree of the cable insulation material to be evaluated based on the optimal interface phase thickness parameter.

[0014] The specific technical solution of the third embodiment of the present invention is: a cable insulation microstructure degradation degree assessment device based on a scattering test, comprising a memory and a processor, wherein the memory stores a computer program, and when the computer program is executed by the processor, the processor executes the steps of the method described in any one of the first embodiments of the present application.

[0015] The specific technical solution of the fourth embodiment of the present invention is: a computer-readable storage medium storing a computer program, which, when executed by a processor, enables the processor to perform the steps of the method described in any one of the first embodiments of the present application.

[0016] Implementing the embodiments of the present invention will have the following beneficial effects: The present invention only needs to obtain the scattering intensity of the cable insulation material, so there is no need for a large number of samples and a complex sample processing process, nor is there any need to destruct the cable sample. Different degrees of deterioration have different scattering intensity and interface phase thickness parameters. By constructing a first relationship curve between the scattering intensity, the scattering vector and the interface phase thickness parameter, the relationship between the scattering intensity, the scattering vector and the interface phase thickness parameter can be comprehensively considered. Using different preset interface phase thickness parameters, the first relationship curve and the preset scattering vector range, the optimal interface phase thickness parameter is determined among different preset interface phase thickness parameters. The optimal interface phase thickness parameter can accurately characterize the microstructural degradation state of the cable insulation material. Therefore, using the optimal interface phase thickness parameter to evaluate the structural degradation degree of the cable insulation material to be evaluated can accurately reflect the degradation condition of the cable insulation material. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0018] Figure 1 The present invention is a flowchart of the steps of the method for evaluating the degree of structural degradation of insulating materials based on scattering test; Figure 2 Schematic diagram of the scattering intensity curve of cable insulation materials after different heat treatment times; Figure 3 is a schematic diagram of a second relationship curve after correction of a cable insulation material that has not been heat-treated; Figure 4 A schematic diagram of a second relationship curve after correction of cable insulation materials subjected to different heat treatment times; Figure 5 Schematic diagram of the thickness change of the transition interface from the crystalline region to the amorphous region of the cable insulation material at different heat treatment stages; Figure 6 The schematic diagram of the insulation material structural degradation assessment system based on scattering test; Figure 7 A diagram of the internal structure of a computer device; Among them, 201 is a scattering intensity acquisition module; 202 is a relationship curve construction module; 203 is an optimal selection module; and 204 is an evaluation module. DETAILED DESCRIPTION

[0019] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0020] The terms "first," "second," and the like in the specification, claims, and drawings of this application are used to distinguish between different objects, not to describe a particular order. Furthermore, the terms "including," "having," and any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, product, or apparatus comprising a series of steps or modules is not limited to the listed steps or modules but may optionally include steps or modules not listed, or may optionally include other steps or modules inherent to the process, method, product, or apparatus.

[0021] References herein to "embodiments" mean that a particular feature, structure, or characteristic described in connection with the embodiments may be included in at least one embodiment of the present application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor does it constitute an independent or alternative embodiment that is mutually exclusive of other embodiments. It is understood, both explicitly and implicitly, by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0022] See also Figure 1 , is a flowchart of a method for evaluating the degree of cable insulation degradation based on a scattering test in the first embodiment of the present application, to estimate the degree of structural degradation of the cable insulation material, the method comprising: Step 101: Perform a small-angle scattering experiment on the cable insulation material to be evaluated to obtain the scattering intensity of the cable insulation material to be evaluated; Step 102: construct a first relationship curve between the scattering intensity, the scattering vector of the scattering intensity, and an interface phase thickness parameter of the cable insulation material to be evaluated; the interface phase thickness parameter is the thickness of the transition region between the crystalline phase and the adjacent amorphous phase of the cable insulation material; Step 103: using different preset interface phase thickness parameters, the first relationship curve, and a preset scattering vector range, determining an optimal interface phase thickness parameter among the different preset interface phase thickness parameters; the optimal interface phase thickness parameter is an actual interface phase thickness parameter of the cable insulation material to be evaluated; Step 104: Evaluate the structural degradation degree of the cable insulation material to be evaluated according to the optimal interface phase thickness parameter.

[0023] Specifically, a small-angle scattering experiment is performed on the cable insulation material to be evaluated (the small-angle scattering experiment can be a small-angle neutron scattering or a small-angle X-ray scattering experiment), the test angle range and the scattering source wavelength are set, and the obtained scattering information is subjected to background scattering removal and normalization processing to obtain the scattering intensity of the cable insulation material to be evaluated. I ( q ), the scattering intensity I ( q ) to perform mathematical transformation to obtain the scattering vector q , construct the scattering intensity I ( q ), scattering vector q and the interface phase thickness parameters of the cable insulation material to be evaluated The first relationship curve between them; starting from 0 and gradually taking different value, and calibrate the first relationship curve within the preset scattering vector range to determine the optimal interface phase thickness parameter , the structural degradation degree of the cable insulation material to be evaluated is evaluated based on the optimal interface phase thickness parameter.

[0024] The method in this embodiment only requires obtaining the scattering intensity of the cable insulation material, so there is no need for a large number of samples, no complex sample processing process, and no need to destructively treat the cable samples. Different degrees of deterioration have different scattering intensity and interface phase thickness parameters. By constructing a first relationship curve between the scattering intensity, scattering vector, and interface phase thickness parameter, the relationship between the scattering intensity, scattering vector, and interface phase thickness parameter can be comprehensively considered. Using different preset interface phase thickness parameters, the first relationship curve, and the preset scattering vector range, the optimal interface phase thickness parameter can be determined within different preset interface phase thickness parameters. The optimal interface phase thickness parameter can accurately characterize the microstructural degradation state of the cable insulation material. Therefore, using the optimal interface phase thickness parameter to evaluate the structural degradation degree of the cable insulation material to be evaluated can accurately reflect the degradation of the cable insulation material.

[0025] In a specific embodiment, the method of using different preset interface phase thickness parameters, the first relationship curve and the preset scattering vector range to determine the optimal interface phase thickness parameter among the different preset interface phase thickness parameters includes: correcting the first relationship curve using different preset interface phase thickness parameters to obtain a second relationship curve corresponding to each preset interface phase thickness parameter; and fitting the second relationship curve within the preset scattering vector range to determine the optimal interface phase thickness parameter.

[0026] Specifically, the first relationship curve is corrected. The correction method is: starting from 0 and gradually taking different Different second relationship curves are obtained, and the obtained second relationship curves are linearly fitted at the preset interface phase thickness parameters. When the standard deviation of the linear fitting is the smallest, the optimal interface phase thickness parameter is obtained. .

[0027] In a specific embodiment, fitting the second relationship curve within the preset scattering vector range to determine the optimal interface phase thickness parameter includes: fitting the second relationship curve within the preset scattering vector range to obtain a fitting straight line for each second relationship curve; obtaining the standard deviation between the fitting straight line and the second relationship curve; determining the second relationship curve corresponding to the smallest standard deviation as the optimal second relationship curve; the target preset interface phase thickness parameter in the optimal second relationship curve is the optimal interface phase thickness parameter.

[0028] Specifically, in characterizing the crystalline structure of insulating materials Linear fitting is performed on the value segment to obtain different The fitting line of the corresponding second relationship curve is traversed through all preset interface phase thickness parameters. The second relationship curve with the smallest standard deviation is selected as the optimal relationship curve. The corresponding target preset interface phase thickness parameter is the actual interface phase thickness parameter of the cable insulation material to be evaluated. If multiple candidate parameters have similar standard deviations, a scattering intensity gradient consistency constraint is further introduced (for example, the scattering intensity gradient ∇I(q) deviates from the theoretical gradient by less than 10%). By using the scattering vector range constraint and goodness of fit evaluation, the impact of noise interference on thickness parameter inversion is effectively reduced, improving the robustness and accuracy of interface phase thickness screening.

[0029] In a specific embodiment, the first relationship curve is obtained using the following formula:

[0030] in, is a preset constant, is the correlation distance, which is a measure of the heterogeneity of a two-phase system. is the interface phase thickness parameter, is the scattering vector, is the scattering intensity.

[0031] Specifically, by scattering vector and scattering intensity The coupling relationship between the interface phase thickness parameter The interface phase thickness heterogeneity parameter is directly correlated with the scattering experimental data, achieving quantitative inversion from scattering signals to microstructure parameters, breaking through the limitations of traditional methods that rely solely on empirical comparisons. Introduced The attenuation effect on the scattering intensity can effectively suppress high frequency noise (large q The interference of the value area) on the thickness inversion is improved under the condition of low signal-to-noise ratio. As a measure of the heterogeneity of the microstructure of the interface phase, the term and scattering vector The quadratic correlation can sensitively capture the spatial correlation of electron density fluctuations within the interface phase, providing key information for evaluating the degree of degradation of insulating materials (such as local defects or uneven aging). It can be flexibly adjusted to adapt to the microstructural regularity of different cable materials (such as polyethylene, cross-linked polyethylene, etc.), making the formula universal and at the same time calibrated by experiments and The accuracy of thickness screening can be further optimized.

[0032] In a specific embodiment, evaluating the degree of structural degradation of the cable insulation material to be evaluated based on the optimal interface phase thickness parameter includes: obtaining a transition interface phase thickness of the cable insulation material to be evaluated based on the optimal interface phase thickness parameter; the transition interface phase thickness is the thickness of the transition interface between the crystalline region and the amorphous region of the cable insulation to be evaluated; and evaluating the degree of structural degradation of the cable insulation material to be evaluated based on the transition interface phase thickness and a preset evaluation rule. Specifically, the transition interface phase thickness obtained by inverting the optimal interface phase thickness parameter can quantitatively describe the microscopic transition region between the crystalline region and the amorphous region in the cable insulation material. The degree of structural degradation of the cable insulation material to be evaluated is evaluated based on the transition interface phase thickness and the preset evaluation rule, thereby obtaining an accurate evaluation result.

[0033] In a specific embodiment, the preset evaluation rules include: the greater the thickness of the transition interface phase, the less severe the structural degradation of the cable insulation material being evaluated; the smaller the thickness of the transition interface phase, the more severe the structural degradation of the cable insulation material being evaluated. Specifically, an intuitive quantitative evaluation index is established based on the positive correlation between the thickness of the transition interface phase and the degree of structural degradation. When the thickness of the transition interface phase is small, it indicates that the boundary between the crystalline and amorphous regions is blurred and the chain segment arrangement is increasingly disordered (for example, due to crystalline region destruction caused by thermal aging or electrical stress), which directly reflects the intensification of the microstructural degradation of the cable insulation material. Conversely, a larger thickness indicates a denser interface structure and higher crystalline integrity. This rule simplifies the degradation diagnosis logic and avoids the complexity of traditional methods requiring comprehensive multi-parameter analysis.

[0034] In a specific embodiment, the thickness of the transition interface phase is obtained using the following formula:

[0035] in, is the thickness of the transition interface phase, is the optimal interface phase thickness parameter.

[0036] Specifically, an embodiment of the method for evaluating the degree of structural degradation of insulating materials based on scattering tests is as follows: 1. Sample Preparation: In this example, XLPE layers from 500 kV cable insulation were used as samples. XLPE samples with a thickness of 0.2–0.4 mm were obtained by ring cutting. The samples were cleaned in an ultrasonic cleaner filled with anhydrous ethanol for 30 minutes and then dried in a 60°C oven for 4 hours. Several samples were then heat-treated at 135°C for 336, 672, 1008, and 1344 hours. Square specimens approximately 10 mm wide were cut from the samples for later use.

[0037] 2. Perform X-ray scattering test on the sample: the test angle range is set to 0°~4°, and the wavelength of the double-slit collimated Cu-Kα X-ray source is λ=1.542 Å. The scattering image is obtained and the background scattering is deducted and then integrated to obtain the scattering vector Scattering intensity The one-dimensional curve of Figure 2 As shown by Figure 2 It can be seen that with the increase of heat treatment time, the scattering intensity peak first increases and then decreases.

[0038] 3. Obtained scattering intensity The parameters are mathematically transformed to obtain the square of the scattering vector right The mathematical transformation is based on the Debye formula for small-angle scattering in the quasi-two-phase structure of semi-crystalline polymers to determine the scattering intensity. and the scattering vector Establish the following relationship:

[0039] 4. For the obtained The correction method is: starting from 0 and gradually taking different Worth different Curve, the obtained curve is used to characterize the XLPE crystal structure The linear fitting is performed on the value segment. When the standard deviation of the linear fitting is the smallest, the desired value. Figure 3 Shows the unheated XLPE test The corrected curve changes in the process from 2.24 to 2.30. The corrected curve is used to characterize the XLPE crystal structure. The linear fitting is performed in the range of 0.20 to 0.80, and the minimum standard deviation (root mean square error) of the fitting is determined. The standard deviation of the fitting is shown in Table 1. When it is 2.27, the error is the smallest, so this The value is the desired value.

[0040] Table 1: Standard deviation of the squares of different optimal interfacial phase thickness parameters for unheat-treated cable insulation

[0041] The same method was used to analyze the XLPE samples at different heat treatment stages. The curve is corrected to obtain the required Value, the result is Figure 4 As shown by Figure 4 It can be seen that after the curve is corrected, The linear relationship is more obvious in the range of 0.2-0.8.

[0042] 5. Calculate the thickness of the transition interface phase from the XLPE crystalline region to the amorphous region based on the obtained σ value , the calculation formula is as follows: .

[0043] The calculation results are as follows Figure 5 As shown in the figure, after a short period of heat treatment, the XLPE sample undergoes molecular chain recrystallization, causing some of the amorphous molecular chains to refold and arrange regularly into the crystalline region, resulting in an increase in the thickness of the transition interface. This also indicates that the arrangement of the XLPE molecular chains tends to become more regular in the early stages of heat treatment, and its microstructural quality has improved. Instead of deteriorating, it has improved. As the heat treatment time increases, the XLPE molecular chains are gradually destroyed, the crystalline structure defects gradually increase, the transition interface thickness gradually decreases, and the XLPE microstructure gradually deteriorates. Therefore, the degree of degradation of the XLPE microstructure can be accurately assessed based on the change in the transition interface thickness E value: The larger the value, the less severe the degradation of XLPE microstructure and the better the performance quality of XLPE; The smaller the value, the more serious the deterioration of the XLPE microstructure and the worse the performance quality.

[0044] The method in this embodiment analyzes the changes in the crystalline region transition interface structure during the degradation process of XLPE. During the degradation process of XLPE, the microstructural changes at the transition interface between the crystalline region and the amorphous region will sensitively change with the degradation of the XLPE. Characterizing the changes in the crystalline region transition interface structure can accurately reflect the degree of degradation of the XLPE microstructure. The essence of XLPE structural degradation is the gradual reduction of relatively regular crystalline regions and the gradual increase of amorphous regions. This method can accurately characterize the changes in the molecular chain aggregation structure during the gradual transformation of crystalline regions into amorphous regions during the degradation of XLPE microstructure. This method has the advantages of simple operation, non-destructiveness, high accuracy, and small sample size. It also provides a new characteristic quantity for evaluating the degree of degradation of XLPE insulation microstructure and can serve as a good supplement to the XLPE insulation degradation assessment method.

[0045] In the specific embodiment, see Figure 6 , a structural schematic diagram of a cable insulation degradation degree assessment system based on a scattering test is provided for the second embodiment of the present application, the system comprising: a scattering intensity acquisition module 201, a relationship curve construction module 202, an optimal selection module 203 and an evaluation module 204; the scattering intensity acquisition module 201 is used to perform a small-angle scattering experiment on the cable insulation material to be evaluated to obtain the scattering intensity of the cable insulation material to be evaluated; the relationship curve construction module 202 is used to construct a first relationship curve between the scattering intensity, the scattering vector of the scattering intensity and the interface phase thickness parameter of the cable insulation material to be evaluated; the interface phase thickness parameter is the thickness of the transition region between the crystalline phase and the adjacent amorphous phase of the cable insulation material; the optimal selection module 203 is used to determine the optimal interface phase thickness parameter from the different preset interface phase thickness parameters using different preset interface phase thickness parameters, the first relationship curve and a preset scattering vector range; the optimal interface phase thickness parameter is the actual interface phase thickness parameter of the cable insulation material to be evaluated; the evaluation module 204 is used to evaluate the structural degradation degree of the cable insulation material to be evaluated based on the optimal interface phase thickness parameter.

[0046] The system in this embodiment only needs to obtain the scattering intensity of the cable insulation material, so there is no need for a large number of samples and a complex sample processing process, nor is there any need to destructively treat the cable samples. Different degrees of degradation have different scattering intensity and interface phase thickness parameters. By constructing a first relationship curve between the scattering intensity, the scattering vector, and the interface phase thickness parameter, the relationship between the scattering intensity, the scattering vector, and the interface phase thickness parameter can be comprehensively considered. Using different preset interface phase thickness parameters, the first relationship curve, and the preset scattering vector range, the optimal interface phase thickness parameter can be determined among different preset interface phase thickness parameters. The optimal interface phase thickness parameter can accurately characterize the microstructural degradation state of the cable insulation material. Therefore, using the optimal interface phase thickness parameter to evaluate the structural degradation degree of the cable insulation material to be evaluated can accurately reflect the degradation condition of the cable insulation material.

[0047] In a specific embodiment, the third embodiment of the present application provides a cable insulation degradation degree assessment based on a scattering test, including a memory and a processor, wherein the memory stores a computer program, and when the computer program is executed by the processor, the processor performs the steps of the method described in any one of the first embodiments of the present application.

[0048] In a specific embodiment, the fourth embodiment of the present application provides a computer-readable storage medium storing a computer program. When the computer program is executed by a processor, the processor performs the steps of the method described in any one of the first embodiments of the present application.

[0049] Figure 7 The internal structure of a computer device in one embodiment is shown. The computer device can be a terminal or a server. Figure 7 The computer device includes a processor, a memory, etc. connected via a system bus. The memory includes a non-volatile storage medium and an internal memory. The non-volatile storage medium of the computer device stores an operating system and may also store a computer program. When the computer program is executed by the processor, the processor can implement the method of this embodiment. The internal memory may also store a computer program. When the computer program is executed by the processor, the processor can implement the method of this embodiment. It will be understood by those skilled in the art that Figure 7 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different component arrangement.

[0050] The above embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present invention. It should be noted that a person skilled in the art could make various modifications and improvements without departing from the spirit of the present invention, all of which fall within the scope of protection of the present invention. Therefore, the scope of protection of the present invention shall be determined by the appended claims.

[0051] The above description is merely a preferred embodiment of the present invention and does not constitute any other form of limitation to the present invention. Any person skilled in the art may utilize the technical contents disclosed above to change or modify them into equivalent embodiments with equivalent changes for application in other fields. However, any simple modification, equivalent change, and modification of the above embodiments made in accordance with the technical essence of the present invention without departing from the technical solution of the present invention shall still fall within the scope of protection of the technical solution of the present invention.

Claims

1. A method for evaluating the degree of cable insulation degradation based on a scattering test, characterized in that: The method comprises: Performing a small-angle scattering experiment on the cable insulation material to be evaluated to obtain the scattering intensity of the cable insulation material to be evaluated; Constructing a first relationship curve between the scattering intensity, the scattering vector of the scattering intensity, and an interface phase thickness parameter of the cable insulation material to be evaluated; the interface phase thickness parameter is the thickness of a transition region between a crystalline phase and an adjacent amorphous phase of the cable insulation material; Determining an optimal interface phase thickness parameter among the different preset interface phase thickness parameters using different preset interface phase thickness parameters, the first relationship curve, and a preset scattering vector range; the optimal interface phase thickness parameter being the actual interface phase thickness parameter of the cable insulation material to be evaluated; The structural degradation degree of the cable insulation material to be evaluated is evaluated according to the optimal interface phase thickness parameter.

2. The cable insulation degradation degree assessment method based on scattering test according to claim 1, characterized in that: The method of using different preset interface phase thickness parameters, the first relationship curve, and a preset scattering vector range to determine an optimal interface phase thickness parameter among the different preset interface phase thickness parameters includes: Correcting the first relationship curve using different preset interface phase thickness parameters to obtain a second relationship curve corresponding to each preset interface phase thickness parameter; The second relationship curve is fitted within the preset scattering vector range to determine the optimal interface phase thickness parameter.

3. The cable insulation degradation degree assessment method based on scattering test according to claim 2, characterized in that: The fitting of the second relationship curve within the preset scattering vector range to determine the optimal interface phase thickness parameter includes: Fitting the second relationship curves within the preset scattering vector range to obtain a fitting straight line of each second relationship curve; Obtaining a standard deviation between the fitted straight line and the second relationship curve; The second relationship curve corresponding to the minimum standard deviation is determined as the optimal second relationship curve; the target preset interface phase thickness parameter in the optimal second relationship curve is the optimal interface phase thickness parameter.

4. The cable insulation degradation degree assessment method based on scattering test according to claim 1, characterized in that: The first relationship curve is obtained using the following formula: in, is a preset constant, is the correlation distance, which is a measure of the heterogeneity of a two-phase system. is the interface phase thickness parameter, is the scattering vector, is the scattering intensity.

5. The cable insulation degradation degree assessment method based on scattering test according to claim 1, characterized in that: The evaluating the microstructural degradation degree of the cable insulation material to be evaluated according to the optimal interface phase thickness parameter includes: Obtaining the transition interface phase thickness of the cable insulation material to be evaluated according to the optimal interface phase thickness parameter; the transition interface phase thickness is the thickness of the transition interface from the crystalline region to the amorphous region of the cable insulation to be evaluated; The structural degradation degree of the cable insulation material to be evaluated is evaluated according to the transition interface phase thickness and preset evaluation rules.

6. The cable insulation degradation degree assessment method based on scattering test according to claim 5, characterized in that: The preset evaluation rule includes: the greater the thickness of the transition interface phase, the lighter the degree of structural degradation of the cable insulation material to be evaluated; and the smaller the thickness of the transition interface phase, the more serious the degree of structural degradation of the cable insulation material to be evaluated.

7. The cable insulation degradation degree assessment method based on scattering test according to claim 5, characterized in that: The thickness of the transition interface phase is obtained using the following formula: in, is the thickness of the transition interface phase, is the optimal interface phase thickness parameter.

8. A cable insulation degradation degree assessment system based on scattering test, characterized in that: The system includes: a scattering intensity acquisition module, a relationship curve construction module, an optimal selection module and an evaluation module; The scattering intensity acquisition module is used to perform a small-angle scattering experiment on the cable insulation material to be evaluated to obtain the scattering intensity of the cable insulation material to be evaluated; The relationship curve construction module is used to construct a first relationship curve between the scattering intensity, the scattering vector of the scattering intensity and the interface phase thickness parameter of the cable insulation material to be evaluated; the interface phase thickness parameter is the thickness of the transition region between the crystalline phase and the adjacent amorphous phase of the cable insulation material; The optimal selection module is used to determine the optimal interface phase thickness parameter among the different preset interface phase thickness parameters using the first relationship curve and the preset scattering vector range; the optimal interface phase thickness parameter is the actual interface phase thickness parameter of the cable insulation material to be evaluated; The evaluation module is used to evaluate the structural degradation degree of the cable insulation material to be evaluated according to the optimal interface phase thickness parameter.

9. A device for evaluating the degree of cable insulation degradation based on a scattering test, comprising a memory and a processor, characterized in that: The memory stores a computer program, and when the computer program is executed by the processor, the processor is caused to perform the steps of the method according to any one of claims 1 to 7.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the processor is caused to perform the steps of the method according to any one of claims 1 to 7.

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