Automatic matching method of instrument resources and testing method based on station model

Abstract

The invention discloses a station model-based automatic matching method for instrument resources and test methods, which comprises the following steps of: scanning a serial number of a tested piece on a production line according to an issued test task, if a unique number of a product type corresponding to the serial number does not exist, reading and analyzing a product specification, and if the unique number of the product type corresponding to the serial number does not exist, reading and analyzing the product specification; selecting a corresponding test method from a test method library according to a test method required by a product specification, obtaining a corresponding station model according to the test method, configuring a test instrument required for testing the tested piece according to the station model, and planning a physical station; and connecting a required test instrument with the tested piece, and testing the tested piece through a test method determined by the station model. According to the application, the corresponding station model can be generated according to the type of the test product, the instrument resources are automatically allocated on the basis of the station model, the test method is generated, the production line management is optimized, and the automatic test in which the instrument resources are matched with the test method is realized.

Description

Technical Field

[0001] The present application relates to the technical field of radio frequency microwave electronic product testing, and in particular to an automatic matching method between instrument resources and testing methods based on a workstation model. Background Art

[0002] With the development of electronic technology, RF microwave electronic products are widely used in multiple industries, and the demand for testing is also growing. The characteristics of RF microwave electronic products are that there are many test items, many test instruments used, many manufacturers of similar test instruments, and many models. Whether it is directly developing test programs or configuring instrument parameters, the workload is large; the test instruments of RF microwave electronic products are of high value, and the value of instruments covering different frequency bands varies greatly. Therefore, it is necessary to reasonably configure test stations according to test tasks to avoid idle stations and reduce the use of high-end instruments.

[0003] The industry's typical approach for testing RF microwave electronic products is to divide the test batches into groups based on the DUT model, develop test cases, build physical workstations, and then switch lines to test the next batch of products. This approach is effective for long-run, high-volume production, but it is not applicable to testing microwave electronic products with multiple varieties and varying batch sizes. Frequent line changes can significantly impact the production line. Regarding production line configuration management, current research focuses on optimizing workstation layout and improving workstation utilization by adjusting and optimizing production batches. However, this approach lacks a mapping relationship between the DUT and test instruments, between test instruments and test stations, and between test stations and testing capabilities. This makes it difficult to optimize production line adjustments to the instruments at specific workstations, resulting in poor timeliness and limited granularity in production line management.

[0004] Existing technologies require configuration for any parameter change of test items, test equipment, test instruments, or devices under test. Radio frequency microwave products typically use a wide variety of instruments, many models of similar instruments, and many test indicators for devices under test. This results in a large configuration workload and does not resolve compatibility issues with similar test equipment and tester instruments, thereby reducing the configuration workload. It also fails to extract similar test methods to reduce the configuration workload. Furthermore, it fails to utilize configuration results to resolve production line configuration management issues for test equipment and test instruments. Summary of the Invention

[0005] In view of this, in the comprehensive production line of multiple varieties of microwave electronic products, the present application provides an automatic matching method of instrument resources and test methods based on the workstation model. According to the type of test product, the corresponding workstation model is generated. Based on the workstation model, instrument resources are automatically allocated, test methods are generated, and production line management is optimized to achieve automatic testing that matches instrument resources with test methods.

[0006] This application discloses a method for automatically matching instrument resources and test methods based on a workstation model, which includes: Based on the assigned test task, the serial number of the DUT on the production line is scanned. If the unique number for the product type does not exist, the product specification is read and parsed. The corresponding test method is selected from the test method library according to the test method required by the product specification. The corresponding workstation model is obtained based on the test method. The test instruments required to test the DUT are configured according to the workstation model, and the physical workstation is planned. The test cases for this product type number are stored for use. Connect the required test instruments to the device under test and test the device under test using the test method determined by the workstation model.

[0007] Furthermore, according to the instrument functions and usage scenarios, test instruments are divided into: signal generation, signal analysis, power supply, network parameter test, noise test, oscilloscope test, and power test; Each category of test instruments includes multiple types of instruments. Test instruments of the same category are divided into multiple types of test instruments according to their different characteristics; the characteristics include manufacturer, model version.

[0008] Furthermore, by abstracting each type of test instrument, extracting its common capabilities to establish a virtual class for program implementation, exposing the test control method interface provided by this type of instrument, and the same type of test instruments all inherit this virtual class, so that all test instruments in each type of test instrument have a unified interface and usage method in the system, and can realize the personalized testing capabilities of different instruments.

[0009] Furthermore, the method for obtaining the workstation model includes: There may be functional associations between different instruments, and the associations may be point-to-point, point-to-face, or face-to-face; when different test instruments are combined, different test capabilities may be generated to meet different test needs; different test instruments are combined into an array according to the coupling relationship, and the combination of different test instruments is functionally determined and recorded and stored in the database to form an underlying library that can be called at any time, which is the workstation model.

[0010] Furthermore, the production line consists of multiple physical workstations, and one physical workstation can realize the capabilities of multiple workstation models; each workstation has different instrument resources; each instrument has different test functions and capabilities, and different instruments will combine to create new test functions. The combination of instruments constitutes different workstation models; the workstation model is generated based on the physical workstation. A workstation may contain multiple workstation models, and a workstation model may correspond to multiple physical workstations.

[0011] Furthermore, different test instruments are combined with each other, and different combinations correspond to corresponding workstation models. Each workstation model has its corresponding test function, and a corresponding test method is required to realize this function. A product may correspond to one or more test methods, which is determined by the product test specifications; the operating process corresponding to each test function constitutes the test method.

[0012] Furthermore, instrument resources determine the corresponding workstation model, and the workstation model determines the corresponding test method, and the test method calls the instrument resources; a physical workstation can constitute multiple workstation models, and different workstation models can provide different testing capabilities; a series of test methods constitute a test sequence, and the test sequence is the test procedure for the device under test.

[0013] Furthermore, when the test instrument is transferred between physical workstations, the system identifies the unique code of the test instrument through the test program, locates the instrument position, and automatically updates the physical workstation and workstation model information stored in the database.

[0014] Furthermore, an information database is established for all types and models of test instruments, and the various parameter information of the test instruments is associated with the physical workstations through a database relational table; the various parameter information includes frequency band range, output power range and instrument options, which are used to match the test methods in the product specifications and plan the physical workstations.

[0015] Furthermore, a physical workstation refers to a fixed area assigned to an employee or operator in a designated workplace, equipped with the equipment, tools, space and infrastructure required to complete the assembly or designated work tasks.

[0016] Due to the adoption of the above technical solution, this application has the following advantages: (1) This application proposes a method for testing a variety of microwave electronic products based on a workstation model, which automatically matches the test method with the instrument resources, quickly locates the required instruments, and implements a test method for a variety of microwave electronic products.

[0017] (2) The concept of the workstation model proposed in this application is based on which the test method is automatically matched with the instrument resources, and the required instruments are quickly located. By reverse analyzing the workstation model, the test instrument type, frequency band and other parameters, as well as the test time of a single test item, are obtained, thereby realizing the rational allocation of instrument resources and the optimization of production lines in production activities.

[0018] (3) By abstracting a certain type of instrument, establishing a virtual class for program implementation, and implementing a unified platform call for instruments of different types, manufacturers, and versions through inheritance, the problem of cross-device collaboration difficulties caused by differences in hardware interfaces, communication protocols, data formats, test processes, control logic, and operating methods was solved.

[0019] (4) The workstation model concept proposed in this application is based on the physical workstation and can automatically match instrument resources with test methods.

[0020] (5) Through the framework form of separation of instrument resources, workstation models, method libraries, product configuration information, and test executors, modular management is achieved. The modules do not affect each other, are easy to expand and maintain, have strong versatility, and improve system security.

[0021] (6) The instruments and equipment involved, the types and quantity of databases, the types of products to be tested, the adaptation production lines, etc. can all be flexibly changed according to actual needs.

[0022] (7) This application involves the automatic configuration of instrument resources and the automatic generation of test cases, as well as the automatic matching between the two, and can be applied to the automatic testing of various types of differentiated microwave products. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments recorded in the embodiments of the present application. For ordinary technicians in this field, other drawings can also be obtained based on these drawings.

[0024] Figure 1 A flowchart of an automatic matching method between instrument resources and test methods based on a workstation model according to an embodiment of the present application; Figure 2 This is a diagram showing the structure of the instrument library according to an embodiment of the present application; Figure 3 A schematic diagram of the correspondence between a physical workstation and a workstation model according to an embodiment of the present application; Figure 4 This is another schematic diagram of the correspondence between physical workstations and workstation models according to an embodiment of the present application; Figure 5 A schematic diagram of the relationship between a workstation model, a test method, and instrument resources according to an embodiment of the present application; Figure 6 This is a schematic diagram of the relationship between another workstation model, test method, and instrument resources according to an embodiment of the present application; Figure 7 This is a schematic diagram of the operation logic based on instrument resources and test methods according to an embodiment of the present application; Figure 8 A schematic diagram of the connection relationship between a test instrument and a device under test according to an embodiment of the present application; Figure 9 This is a schematic diagram of the connection relationship between another test instrument and a device under test according to an embodiment of the present application. DETAILED DESCRIPTION

[0025] The present application is further described with reference to the accompanying drawings and embodiments. The embodiments described are only a part of the embodiments of the present application, not all of the embodiments. All other embodiments obtained by ordinary technicians in this field should fall within the scope of protection of the embodiments of the present application.

[0026] The workstation model is composed of a diverse array of instruments, including vector network analyzers, spectrum analyzers, signal generators, power meters, noise figure analyzers, microwave signal sources, oscilloscopes, modulation quality analyzers, switch matrices, phase noise meters, and temperature chambers. Test methods, including the required instrumentation, parameter settings, test metrics, workstation model requirements, data output, data processing, and test procedures for a specific product, are encapsulated in C# as a test method library. The ultimate goal is to achieve compatibility among various instruments through this technology, automatically allocating available resources, matching workstations, and automatically generating test methods, enabling rapid switching and automated testing of different products.

[0027] See also Figure 1 The present application provides an embodiment of a method for automatically matching instrument resources and test methods based on a workstation model, which includes: According to the assigned test task, the serial number of the DUT (product) on the production line is scanned. If the unique number corresponding to the product type does not exist, the product specification is read and parsed. The corresponding test method is selected from the test method library according to the test method required by the product specification. The corresponding workstation model is obtained based on the test method. The test instruments required to test the DUT are configured according to the workstation model, and the physical workstation is planned. The test case of this product type number is stored for use. Connect the required test instruments to the device under test and test the device under test using the test method determined by the workstation model.

[0028] Optionally, the method further includes: if a unique number of the product type corresponding to the serial number exists, it indicates that the product with the serial number has been tested before, and the device under test is directly tested according to the previous test process.

[0029] Optionally, test instruments can be divided into the following categories according to their functions and usage scenarios: signal generation, signal analysis, power supply, network parameter testing, noise testing, oscilloscope testing, and power testing. Each category of test instruments includes multiple instrument types, and the same category of test instruments is divided into multiple types based on their characteristics; these characteristics include manufacturer, model, and version. Specifically, in the field of microwave electronic product testing, instruments can be divided into the following categories based on their functions and usage scenarios: signal generation, signal analysis, power supply, network parameter testing, noise and sensitivity testing, and power testing. Each category of instruments includes multiple instrument types, and the same category of instruments is further divided into different manufacturers, models, and versions. For example, the signal generation category includes analog signal generators, vector signal generators, and pulse signal generators, among which analog signal generators include models such as the Keysight N5173B EXG and the Rohde & Schwarz SMA 100B.

[0030] Optionally, it is difficult to integrate the testing of test instruments of different models and manufacturers through a unified platform due to differences in hardware interfaces, communication protocols and data formats; at the data level, the differences in output formats (such as binary, ASCII, etc.), unit dimensions and sampling timings of various instruments increase the complexity of parsing and synchronization; the test processes and control logic of different types of instruments lack unified standards, making cross-device collaboration difficult to achieve. This application abstracts one type of device in each type of test equipment in the test instrument, extracts its common capabilities to establish a virtual class for program implementation, exposes the test method interface provided by this type of device, and other types of devices in each type of test equipment inherit this virtual class, so that all test devices in each type of test equipment have a unified interface and usage method in the system, and can realize the personalized testing capabilities of different instruments, such as Figure 2 shown.

[0031] Optionally, the method for obtaining the workstation model includes: Different instruments may have functional relationships, which may be point-to-point, point-to-face, or face-to-face. When different test instruments are combined, different test capabilities may be generated to meet different test requirements. Different test instruments are combined and arrayed according to their coupling relationships. Functional determinations are made for these combinations and recorded and stored in a database, forming a readily accessible underlying library, known as a workstation model. A workstation model is an abstract mathematical concept model.

[0032] Alternatively, see Figure 4The production line consists of multiple physical workstations, and one physical workstation can realize the capabilities of multiple workstation models. For example, a production line contains multiple workstations, such as static test stations, dynamic test stations, S-parameter test stations, frequency parameter test stations, high and low temperature test stations, etc. Each workstation has different instrument resources. For example, the static test station has a multimeter, and the dynamic test station has a vector network analyzer, spectrum analyzer, signal source, oscilloscope, power meter, power supply, etc. Each instrument has different test functions and capabilities, and different instruments will combine to create new test functions. This combination of instruments constitutes different workstation models. The workstation model is generated based on the physical workstation. A workstation may contain multiple workstation models, and a workstation model may correspond to multiple physical workstations.

[0033] Optionally, different test instruments can be combined with each other, and different combinations correspond to corresponding workstation models. Each workstation model has its corresponding test function, and the realization of this function requires a corresponding test method. A product may correspond to one or more test methods, which is determined by the product test specification, such as Figure 6 shown.

[0034] Optionally, the instrument resources include a vector network analyzer, a spectrum analyzer, a signal generator, a power meter, a noise figure analyzer, a microwave signal source, an oscilloscope, a modulation quality analyzer, a switch matrix, a phase noise tester, a temperature chamber, etc.

[0035] Optionally, the test instruments include but are not limited to: vector network analyzer, spectrum analyzer, signal generator, power meter, noise figure analyzer, microwave signal source, oscilloscope, modulation quality analyzer, switch matrix, phase noise tester, temperature chamber, etc. The test instruments and equipment are connected to the computer through GPIB and LAN interfaces.

[0036] Optionally, the test method is the required instruments and equipment, parameter settings, test indicators, workstation model requirements, data output, data processing, and test procedures for a certain product, which are encapsulated into a test method library through C#.

[0037] The ultimate goal of this application is to achieve compatibility among various instruments, automatically allocate vacant resources, match workstations, automatically generate test methods, and realize rapid switching and automatic testing of different products.

[0038] Optionally, instrument resources determine the corresponding workstation model, and the workstation model determines the corresponding test method, and the test method calls the instrument resources; a physical workstation can constitute multiple workstation models, and different workstation models can provide different testing capabilities; a series of test methods constitute a test sequence, and the test sequence is the test procedure for the device under test.

[0039] Optionally, when the test instrument is transferred between physical stations, the system identifies the unique code of the test instrument through the test program, locates the instrument position, and automatically updates the physical station and station model information stored in the database. The correspondence between the physical station and the station model is as follows: Figure 3 shown.

[0040] Alternatively, in the field of microwave electronic product testing, specific test instrument combinations determine corresponding test functions. For example, performance testing of microwave amplifiers, filters, antennas, and other devices requires the coordinated operation of a specific instrument combination (e.g., vector network analyzer, spectrum analyzer, signal generator, power meter, and noise figure analyzer) to accurately measure key parameters such as gain, standing wave ratio, noise figure, and linearity. The standardized operating procedures formed by this process constitute the test method. The integration of different test methods into a multi-dimensional, reusable system is known as a test method library.

[0041] Optionally, the instrument resource determines the corresponding station model, and the station model determines the corresponding test method, and the test method calls the instrument resource. The relationship between the three is as follows: Figure 5 Typically, a physical workstation can consist of multiple workstation models, each of which provides different test capabilities. A series of test methods constitute a test sequence, which is the test procedure for the device under test.

[0042] Optionally, a database can be established for all types and models of test instruments, linking instrument parameters to physical workstations via database relational tables. This information, including frequency band range, output power range, and instrument options, is used to match test methods in product specifications and plan physical workstations. Typically, a high-frequency instrument can cover the test items of a low-frequency instrument. When instruments are updated or replaced, parameters can be modified directly in the instrument database, increasing or decreasing the number or types of instruments, facilitating maintenance and updates.

[0043] Alternatively, a physical workstation refers to a fixed area in a designated workplace assigned to an employee or operator, equipped with the equipment, tools, space and infrastructure required to complete the assembly or designated work tasks.

[0044] In this application, the test methods in the test sequence are parsed, the workstation model is obtained, and then the workstation model is mapped to the composition of the physical workstation, which can achieve the optimal configuration of the test resources of the production line. Especially for small batch and multi-variety application scenarios, the composition of the physical workstation can be adjusted according to the task (usually issued by the manufacturing execution system MES) to optimize resource allocation. The operation logic is as follows Figure 7 shown.

[0045] In order to make the purpose, technical solutions and advantages of this application more clearly explained, this application is described in detail below in the form of embodiments.

[0046] Implementation Example 1: Production Line Resource Restructuring The on-site planner receives a batch of production orders from the MES system. The order includes 50 T / R components (2-18 GHz) (T1), 80 downconversion components (0.8-40 GHz) (T2), and 110 switching filters (6-8 GHz) (T3). The planner obtains a set of test sequence T / R components (S1) by matching with the product number in the order. 1..n ), down-conversion components (S2 1..n ), switch filter (S3 1..n ) and single indicator test time TS1 1..n TS2 1..n TS3 1..n and preparation time 、 、 .

[0047] By reading the station model in the test sequence, the instrument resources (including frequency bands) of the station model in this batch of orders are obtained; The test time for each product type, i.e. the test resource occupancy time, is calculated using the following formula: TT / R component = T1× (∑(TS1 1..n + )) T down-conversion component = T2× (∑(TS2 1..n + )) T switch filter = T3 × (∑(TS3 1..n + ) Restructure the production line to match production needs based on the order's workstation model and test resource occupancy time; Implementation Example 2: A certain downconversion component provides downconversion and self-test reporting for two RF channels. Each downconversion channel divides the 8GHz-12GHz RF input signal into three segments: 8GHz-10GHz, 9GHz-10GHz, and 10GHz-12GHz. The signal is then mixed with a 10.3GHz-13.3GHz local oscillator (LO) signal to produce output IF signals of 1.8GHz ±10MHz and 1.8GHz ±0.5GHz, respectively. Both IF outputs also provide analog SDLVA detection outputs and digital TTL self-test outputs. Testing is required for digitally controlled attenuation, LO signal leakage at the RF input, RF filter out-of-band rejection and channel isolation, intermodulation suppression, SDLVA video output, and self-test output. The following describes the general testing process, using digitally controlled attenuation and LO signal leakage at the RF input as examples.

[0048] Test item 1: CNC attenuation function Step 1: Prepare the test equipment as shown in Table 1. Use the variable frequency vector network to obtain the calibration curve with a frequency range of 10.13 GHz to 13.3 GHz.

[0049] Table 1 Prepared test instruments

[0050] Step 2: Test instrument and DUT as follows Figure 8 Connect the shown relationships.

[0051] Step 3: Start the operation. Set the preselect filter channel selection controls Si1, Si2, and Si3 to 110. First, set the attenuation control to 0dB. Then, adjust the attenuation control bits for RF1, RF2, and IF in sequence. The reduction in the small signal gain curve SC21 is the numerically controlled attenuation.

[0052] Step 4: Save the test results and determine whether the test is qualified.

[0053] Test item 2: Leakage of local oscillator signal at the RF input.

[0054] Step 1: Prepare the test equipment as shown in Table 2. Set the signal source output power to 12.3 GHz and 8 dBm.

[0055] Table 2 Prepared test instruments

[0056] Step 2: Test instrument and DUT as follows Figure 9 Connect the shown relationships.

[0057] Step 3: Start operation. Set the gain mode to broadband low-gain mode (Si4 and Si5 = 10), and the preselection filter channel to the 9-11 GHz band (Si1, Si2, and Si3 = 101). Observe the spectrum analyzer reading at 12.3 GHz, which is the leakage of the local oscillator signal at the RF input.

[0058] Step 4: The experimental record is scanned and stored by the instrument's matching curve scanning software (or other equivalent software). The test curve is saved on the test computer for subsequent use, analysis, printing, and inspection. Determine whether this item is qualified according to the requirements.

[0059] The remaining items are tested according to the above steps.

[0060] The product was tested using the technical method described in this application. The testing steps are as follows: Step 1: Run the test program. The test program obtains resource information such as power supply, vector network analyzer, signal source, and spectrum analyzer through the GPIB bus. The program then creates a test vector network station, spectrum analyzer, and signal source station. Step 2: The test program scans the product serial number, obtains the corresponding test case name, and downloads the correct version of the test case from the database; Step 3: The test program automatically loads the test case, extracts the vector network calibration file, 5-bit TTL control truth table, and test criteria of not more than -3dB and not less than -5dB for the digital controlled attenuation test method from the test case, and combines them into a set of test sequences. It also extracts the spectrum analyzer RBW, VBW, center frequency, SPAN frequency, signal source operating mode, frequency, power, 5-bit TTL control truth table, and test criteria of less than -45dB for the intrinsic leakage test method from the test case, and combines them into a set of test sequences. Step 4: The test program executes a test sequence based on the VN station, spectrum analyzer, and one signal source station. When testing the VN station, the calibration file is called. TTL Si1, Si2, and Si3 are set to 110 to operate the product in the 10.13 to 13.3 GHz frequency band. The product attenuation state is set sequentially. Test curves are obtained from the VN, compared with the test criteria, and stored. The program automatically switches the RF link to operate the product in the spectrum analyzer and one signal source station. TTL Si1, Si2, and Si3 are set to 101 to operate the product in the 9 to 12.3 GHz frequency band. TTL Si4 and Si5 are set to 10 to operate the product in broadband low-gain mode. The spectrum analyzer center frequency is set to 12.3 GHz. The signal source is set to operate in continuous wave mode, with a frequency of 12.3 GHz and a power of 8 dBm. Test curves are obtained from the spectrum analyzer, compared with the test criteria, and stored. Step 5: Produce a test report and give the test conclusion.

[0061] Through comparative analysis of the two methods, the comparative data are shown in Table 3.

[0062] Table 3 Comparative analysis of the two methods

[0063] It can be seen from the data in Table 3 that the total test time of the method described in the present application is only 5 times that of the conventional test method, and there is no need to repeatedly adjust the test instrument parameters and change the test instrument connection method during the test process. By rationally allocating instrument resources at different physical workstations, the instrument parameters can be initialized and the instrument connection method can be configured at one time, and the test can be completed by one tester. The tester does not need to have a high level of microwave theoretical knowledge, instrument operation experience, or programming ability, and the test can be completed with just one click.

[0064] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application and not to limit them. Although the present application has been described in detail with reference to the above embodiments, ordinary technicians in the relevant field should understand that the specific implementation methods of the present application can still be modified or replaced by equivalents. Any modification or equivalent replacement that does not depart from the spirit and scope of the present application should be included in the scope of protection of the claims of the present application.

Claims

1. A method for automatically matching instrument resources and test methods based on a workstation model, characterized in that: include: Based on the assigned test task, the serial number of the DUT on the production line is scanned. If the unique number for the product type does not exist, the product specification is read and parsed. The corresponding test method is selected from the test method library according to the test method required by the product specification. The corresponding workstation model is obtained based on the test method. The test instruments required to test the DUT are configured according to the workstation model, and the physical workstation is planned. The test cases for this product type number are stored for use. Connect the required test instruments to the device under test and test the device under test using the test method determined by the workstation model.

2. The automatic matching method of instrument resources and test methods based on a workstation model according to claim 1 is characterized in that: According to the instrument functions and usage scenarios, test instruments are divided into: signal generation, signal analysis, power supply, network parameter test, noise test, oscilloscope test, and power test; Each category of test instruments includes multiple types of instruments. Test instruments of the same category are divided into multiple types of test instruments according to their different characteristics; the characteristics include manufacturer, model version.

3. The automatic matching method of instrument resources and test methods based on a workstation model according to claim 2 is characterized in that: By abstracting each type of test instrument and extracting its common capabilities, a virtual class is established for program implementation, exposing the test control method interface provided by this type of instrument. All test instruments of the same type inherit this virtual class, so that all test instruments in each type of test instrument have a unified interface and usage method in the system, and can realize the personalized testing capabilities of different instruments.

4. The automatic matching method of instrument resources and test methods based on a workstation model according to claim 1 is characterized in that: The method for obtaining the workstation model includes: There may be functional associations between different instruments, and the associations may be point-to-point, point-to-face, or face-to-face; when different test instruments are combined, different test capabilities may be generated to meet different test needs; different test instruments are combined into an array according to the coupling relationship, and the combination of different test instruments is functionally determined and recorded and stored in the database to form an underlying library that can be called at any time, which is the workstation model.

5. The automatic matching method of instrument resources and test methods based on a workstation model according to claim 1 is characterized in that: The production line consists of multiple physical workstations, and one physical workstation can realize the capabilities of multiple workstation models; each workstation has different instrument resources; each instrument has different test functions and capabilities, and different instruments will combine to create new test functions. The combination of instruments constitutes different workstation models; the workstation model is generated based on the physical workstation. A workstation may contain multiple workstation models, and a workstation model may correspond to multiple physical workstations.

6. The method for automatically matching instrument resources and test methods based on a workstation model according to claim 1, characterized in that: Different test instruments are combined with each other, and different combinations correspond to corresponding workstation models. Each workstation model has its corresponding test function, and a corresponding test method is required to realize this function. A product may correspond to one or more test methods, which is determined by the product test specifications; the operating process corresponding to each test function constitutes the test method.

7. The method for automatically matching instrument resources and test methods based on a workstation model according to claim 1, characterized in that: Instrument resources determine the corresponding workstation model, and the workstation model determines the corresponding test method, and the test method calls the instrument resources; a physical workstation can constitute multiple workstation models, and different workstation models can provide different testing capabilities; a series of test methods constitute a test sequence, and the test sequence is the test procedure for the device under test.

8. The method for automatically matching instrument resources and test methods based on a workstation model according to claim 1, characterized in that: When the test instrument is transferred between physical workstations, the system identifies the unique code of the test instrument through the test program, locates the instrument position, and automatically updates the physical workstation and workstation model information stored in the database.

9. The method for automatically matching instrument resources and test methods based on a workstation model according to claim 3, characterized in that: An information database is established for all types and models of test instruments, and the various parameter information of the test instruments is associated with the physical workstations through a database relational table; the various parameter information includes frequency band range, output power range and instrument options, which are used to match the test methods in the product specifications and plan the physical workstations.

10. The method for automatically matching instrument resources and test methods based on a workstation model according to any one of claims 1 to 9, characterized in that: A physical workstation is a fixed area assigned to an employee or operator in a designated workplace, equipped with the equipment, tools, space and infrastructure required to complete assembly or designated work tasks.

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