Quick connection testing device for printed circuit assembly board

Abstract

The invention discloses a rapid connection testing device for a printed circuit assembly board, and aims to solve the problems of high cost, low connection density, large occupied space, tedious operation and the like in the existing testing technology. The device comprises a quick-connection probe module, a positioning tray and a pull pin, the quick-connection probe module comprises a quick-connection probe seat module, a protective cover module and a spring, positioning and locking are realized by multiplexing existing mounting holes of a to-be-tested PCB, electrical connection is realized by utilizing contact of a spring probe and a test point, a quick-connection positioning guide sleeve, a lock bead and a quick-connection ring are combined to form a quick locking / unlocking structure, and the quick-connection probe seat module and the protective cover module are connected with the pull pin. The conductive bushing and the grounding support ring form a grounding loop in cooperation with auxiliary positioning of the guide pin. A special test connector is omitted, so that the material cost is reduced; the connection density and the signal rate are improved, and the PCB space is saved; the operation efficiency is improved through the quick connection structure, and the device is suitable for efficient mass production testing.

Description

Technical Field

[0001] This invention relates to the field of printed circuit board testing technology, and more particularly to a printed circuit board testing device, specifically a rapid connection testing device for printed circuit boards. Background Technology

[0002] Currently, in the testing process of printed circuit boards (PCBs), the existing technology usually involves placing one or more specialized connectors on the PCB, and using compatible connector cables to connect from the PCB connectors to the test instruments to achieve the testing purpose.

[0003] However, this existing technology has many shortcomings:

[0004] 1. Increased material costs, as these connectors are only for testing purposes and are not needed by end users.

[0005] 2. Commonly used low-cost connectors have low connection density and cannot transmit high-speed signals.

[0006] 3. Occupying valuable PCB space and increasing system size. Even if these connectors are not installed during mass production, the corresponding mounting pads on the PCB still exist. Saving this space can enable more functions for users or reduce system size and cost.

[0007] 4. Low connection efficiency: Traditional testing equipment requires manual plugging and unplugging of connectors to achieve connection, which is cumbersome. The connector alignment process is time-consuming, and in large-scale production testing, frequent plugging and unplugging operations can easily lead to operator fatigue, increase the probability of operation errors, and thus prolong the testing time and increase the testing cost. Summary of the Invention

[0008] The present invention aims to address the problems existing in the prior art by providing a rapid connection testing device for printed circuit boards. This device solves the problems of high material cost, low connection density, large PCB space occupation, limited signal transmission rate, and low operating efficiency in existing printed circuit board testing technologies. It provides a rapid connection testing device for printed circuit boards to meet the requirements of low cost, high density, small size, high speed, and high efficiency testing.

[0009] The technical solution adopted by the present invention to solve the problems of the prior art is as follows: This quick connection test device for printed circuit board assembly includes a quick connection probe module, a tray for positioning the PCB board under test and a pull pin. The quick connection probe module includes a quick connection probe base module and a protective cover module.

[0010] The quick-connect probe mount module includes a probe mount, a set of probes, a bushing, a quick-connect positioning guide sleeve, a test interface board, a fastening nut, and a quick-connect ring. The probes are installed in the probe holes of the probe mount, and their arrangement matches the arrangement of the test pads on the PCB under test. The bushing is installed and fixed in the corresponding mounting hole of the probe mount. The quick-connect positioning guide sleeve passes from bottom to top through the center hole of the bushing, the mounting hole of the test interface board, the fastening nut, and the quick-connect ring, until the shoulder of the quick-connect positioning guide sleeve abuts against the bushing. Specifically:

[0011] 1. The outer peripheral surface of the quick-connect positioning guide sleeve near the shaft shoulder forms a small clearance fit with the bushing center hole and the test plate mounting hole. Combined with the fit between the positioning notch of the test interface plate and the positioning protrusion of the probe seat, and the arrangement of the test plate of the test interface plate is consistent with the arrangement of the probe hole of the probe seat, it ensures that the probe tail end in the probe hole of the probe seat is accurately aligned with the corresponding test plate on the test interface plate.

[0012] 2. After the quick-connect positioning guide sleeve and the fastening nut are connected by threads and tightened, the bushing and test interface plate between the two are clamped together, so that the grounding ring and test plate of the test interface plate contact the upper end face of the bushing and the tail end of the probe, respectively.

[0013] 3. The quick-connect positioning guide sleeve and the quick-connect ring are sleeved together, and the locking ball installed in the locking ball hole of the quick-connect positioning guide sleeve is combined to form a quick connection structure in which the quick-connect ring can slide axially on the quick-connect positioning guide sleeve.

[0014] 4. The quick-connect positioning guide sleeve is a single-axis tubular structure. The crown-shaped barbs at both ends are cut into several segments by radial slots. For holes of components slightly smaller than the outer diameter of the barbs, such as the center hole of quick-connect rings and protective cover modules, the barbs will be squeezed and contracted when pressed into the sleeve. After the hole passes through, the barbs will immediately return to their original size, thus preventing the sleeved component from falling off. Similarly, by using a tapered sleeve of appropriate size to fit and press it in, the crown-shaped barbs will contract and contract, allowing the sleeved component to be removed.

[0015] 5. The longitudinal section of the quick-connect positioning guide sleeve, between the crown-shaped barbs, with the intermediate shoulder as the highest point, including the major diameter of the thread, presents...

[0016] The stepped shape with a gradually decreasing outer diameter ensures its assemblability with the bushing, test interface board, and fastening nut. Combining these component features and the connection methods between them, the probe's ends are precisely aligned with the PCB under test and the test interface board's test pad, providing a reliable and stable physical connection for signal transmission. The fixed connection between the bushing and the probe holder, and its contact with the grounding ring of the test interface board, not only enhances the rigidity of the assembled probe holder structure but also serves as a reference ground for the test signals of adjacent probes. The nut and quick-connect positioning guide sleeve are threaded together. After the nut is tightened, the probe is fixed in the probe hole of the probe holder by pressing against the test interface board. This installation method greatly improves the assemblability of the probe holder module and enables the module to replace probes at any time, improving the module's maintainability. The quick-connect positioning guide sleeve uses crown-shaped barbs at both ends instead of traditional snap rings for anti-dislodgement, making the structure more compact. The quick-connect structure significantly improves test connection efficiency and adapts to the rapid operation requirements of mass production.

[0017] The protective cover module includes a grounding support ring, an end cap, and two guide pins. The grounding support ring is fixedly installed in the center hole of the end cap, allowing the lower end of the probe to pass through the end cap and contact the test plate on the PCB under test. The two guide pins are inserted and fixed in the corresponding guide pin holes of the end cap, with one of them protruding from the end cap to engage with the auxiliary positioning hole of the PCB under test. The grounding support ring is sleeved on the outer circumference of the lower end of the quick-connect positioning guide sleeve, and its center hole engages with the crown-shaped barb feature of the quick-connect positioning guide sleeve. This allows for the limiting and anti-fall-off requirements when the protective cover module slides along the axial direction of the quick-connect positioning guide sleeve. If necessary, the crown-shaped barb can also be brought together by squeezing it with a tapered sleeve. The probe retracts to remove it from the quick-connect positioning guide sleeve; simultaneously, the conductive properties of the grounding support ring, together with the bushing, form a complete grounding loop, reducing signal interference and ensuring the stability of high-speed signal transmission; the fixed connection between the end cap and the grounding support ring provides protection for the probe. On the one hand, in the non-test state, the lower end of the probe is retracted into the end cap to prevent the probe from being deformed by collision or contamination, thus affecting contact reliability; on the other hand, in the test state, the grounding support ring abuts against the bushing to prevent the probe from being damaged by overpressure; the guide pin, through its cooperation with the auxiliary positioning hole of the PCB under test and the guide pin hole of the probe seat, realizes the auxiliary positioning of the quick-connect probe module.

[0018] The pull pin passes through the corresponding positioning hole on the tray, and its lower end connects to the actuator. Driven by the actuator, it can extend and retract along the axis. The pull pin passes upward through the mounting hole of the PCB under test and the center hole of the quick-connect positioning guide sleeve. The upper end of the pull pin and the quick-connect positioning guide sleeve utilize the axial movement of the quick-connect ring to control the radial movement of the locking ball, forming a connection structure that can be quickly locked and unlocked. The pull pin's passage through the mounting hole of the PCB under test and the center hole of the quick-connect positioning guide sleeve creates a hole-axis fit, which, in conjunction with the fit between the guide pin and the auxiliary positioning hole of the PCB under test, achieves precise positioning of the probe tip and the corresponding test tray of the PCB under test. The locking / unlocking structure formed by the axial movement of the quick-connect ring between the upper end of the pull pin and the quick-connect positioning guide sleeve allows for quick and stable connection and separation, eliminating the manual insertion, removal, and alignment steps of traditional connectors and significantly shortening test preparation time. In the locked state, it provides continuous pressure for the contact between the probe and the test tray, ensuring the stability of the electrical connection; in the unlocked state, the device can be easily separated, facilitating the removal, placement, and replacement of the PCB under test, adapting to the high-efficiency testing needs of large-scale production. In addition, the pull pins work in conjunction with the existing mounting holes on the PCB under test, reusing the existing structure on the board and eliminating the need to set up additional test holes, further saving PCB space and meeting the design goals of low cost and small size of the device.

[0019] As a further improvement of this invention, the probe is a spring probe, with its tail end connected to the test interface board; the other end, when tightened, abuts against the corresponding test pad of the board under test and retracts a short distance, with the internal spring maintaining a certain contact force with the test pad, thereby establishing a signal connection between the test interface board and the board under test. The retractable design at both ends allows for elastic contact at both ends: when the interface board probe contacts the test interface board, the elastic contact compensates for assembly errors and warping of the PCB under test, ensuring a stable electrical connection and preventing damage to the test pad from rigid contact. Simultaneously, the spring force maintains the contact force required for a reliable connection. The probe tube guides and limits the probes at both ends, preventing misalignment caused by excessive deviation from the axis or detachment from the probe tube. This retractable structure at both ends maintains low contact resistance throughout the testing process, reducing signal transmission loss and meeting the stability requirements of high-speed signal transmission.

[0020] As a further improvement of the present invention, the quick-connect positioning guide sleeve is provided with crown-shaped barbs near both ends. Each end has a through slot along the axial direction and is cut into several petals, with the slots located between adjacent petals. The outer circumferential surface of the upper end of the quick-connect positioning guide sleeve mates with the central hole of the quick-connect ring, while the outer circumferential surface of the lower end has a clearance fit with the central hole of the grounding support ring. The barbs at the upper and lower ends of the quick-connect positioning guide sleeve abut against the inner end faces of the quick-connect ring and the grounding support ring, respectively, to form an axial limiting and anti-detachment structure. The slot provides the petals with elastic deformation capability, allowing the barbs to pass through the mating parts by squeezing the petals during assembly. After the parts pass through, the petals immediately spring back. In this solution, the barbs abut against the inner end faces of the quick-connect ring and the grounding support ring to form an axial limiting, preventing the quick-connect ring and the grounding support ring from detaching from the quick-connect positioning guide sleeve and ensuring the structural integrity of the module assembly. The upper and lower outer circumferential surfaces are respectively matched with the center holes of the quick-connect ring and the grounding support ring. Combined with the elasticity of the petal body, the protective cover module and the quick-connect probe base module can be quickly disassembled and assembled. This avoids the use of traditional axial end limiting components such as snap rings, making the structure more compact and taking into account assemblability and maintainability.

[0021] As a further improvement of the present invention, on the upper half of the quick-connect positioning guide sleeve, on the outer periphery that sleeves the quick-connect ring, there are conical locking bead holes that are evenly distributed in a ring and communicate internally and externally. Locking beads are installed in the locking bead holes, and the diameter of the locking beads is slightly larger than the wall thickness of the guide sleeve. The pull pin has an annular groove near its upper outer periphery. When the quick-connect ring slides down along the quick-connect positioning guide sleeve and the small diameter section of the quick-connect ring is aligned with the locking bead hole, the inner wall of the small diameter section squeezes the locking bead to move towards the center and hugs the annular groove of the pull pin, thereby establishing the connection between the pull pin and the quick-connect positioning guide sleeve. At this time, the actuator drags the pull pin downward, and the pull pin will drive the quick-connect probe module where the quick-connect positioning guide sleeve is located to move downward to complete the fastening of the device. When the quick-connect ring slides upward along the quick-connect positioning guide sleeve and abuts against the upper barb, the large-diameter section of the quick-connect ring is directly opposite the locking ball hole. At this point, if the pull pin slightly contacts the locking ball, the locking ball will move outward within the locking ball hole until it abuts against the inner wall of the large-diameter section of the quick-connect ring, preventing it from falling out of the locking ball hole. This releases the connection between the pull pin and the quick-connect positioning guide sleeve, allowing the operator to remove the quick-connect probe module. The tapered locking ball hole and locking ball fit design ensure that the locking ball partially protrudes from the inner wall of the guide sleeve without dislodging from the inside, providing a contact basis for the engagement of the locking ball and the annular groove of the pull pin. The evenly distributed annular locking ball holes ensure balanced force on the locking ball, which helps maintain the coaxiality of the pull pin and the quick-connect positioning guide sleeve during locking. In applications, the tray is typically laid flat. With the right program, the control actuator moves the pull pin to the appropriate height. The sliding action of the quick-connect ring can be performed intuitively and almost imperceptibly during the device's loading and unloading process under the influence of gravity. This greatly improves the efficiency of the test device's assembly and disassembly, and adapts to the rapid switching requirements of high-frequency testing in large-scale production.

[0022] As a further improvement of the present invention, the probe holder is provided with an interface plate positioning protrusion, and the test interface plate is provided with a positioning notch that mates with the interface plate positioning protrusion. This mating, combined with the coaxial mating of the interface plate mounting hole and the probe holder mounting hole achieved with other components, ensures precise alignment of the two, preventing rotational misalignment of the test interface plate during assembly or use, and ensuring that the test disk on the test interface plate and the upper end of the probe always maintain accurate contact, preventing poor signal transmission due to alignment deviation. At the same time, this structure simplifies the installation process of the test interface plate, eliminating the need for complex alignment operations and improving assemblability and maintainability.

[0023] As a further improvement of the present invention, the bushing and grounding support ring are made of conductive metal. The bushing is fixed to the probe holder by pressing or gluing. The upper end face of the bushing abuts against the grounding ring on the bottom surface of the test interface board, and the lower end face of the grounding support ring abuts against the grounding plate of the mounting hole on the board under test. When the device is locked, the lower end face of the bushing abuts against the grounding support ring to form a grounding loop for the test signal. The bushing and grounding support ring are made of conductive metal, providing a low-impedance grounding path for the test signal. The bushing is fixed to the probe holder by pressing or gluing, which strengthens the probe holder and helps maintain the long-term contact alignment accuracy of the probe. In addition, the bushing and grounding support ring also limit the height direction during tightening and bear most of the tightening force, preventing the probe from being damaged by overpressure. More importantly, since the two together form a complete grounding loop for the test signal, no additional grounding connector is required, saving device space and cost.

[0024] As a further improvement of the present invention, the upper parts of the two guide pins are located within the guide pin holes of the probe holder and can slide within the guide pin holes of the probe holder. The lower part of one of the guide pins penetrates the end cap and inserts into the auxiliary positioning hole of the PCB under test to form a pin-hole fit. The cooperation between the pull pin and the center hole of the quick-connect positioning guide sleeve enables the entire module to achieve completely precise positioning with the PCB under test. This fit design is beneficial to the alignment accuracy of the probe and the pads of the board under test and the testing stability.

[0025] As a further improvement of the present invention, a spring is fitted onto the quick-connect positioning guide sleeve. The two ends of the spring abut against the quick-connect positioning guide sleeve and the grounding support ring, respectively, forming a protective probe structure that allows the probe to be submerged in the end cover in a relaxed state. The abutment structure between the spring and the quick-connect positioning guide sleeve and the grounding support ring stores elastic potential energy through compression when the device is locked. After the test is completed, the elastic force is released to push the quick-connect positioning guide sleeve back to its original position, causing the lower end of the probe to automatically retract into the end cover, preventing the probe from being exposed and damaged by accidental impacts, thereby improving the reliability of the device.

[0026] As a further improvement of the present invention, the lower end of the pull pin is connected to an actuator that causes it to reciprocate axially. In this example, the actuator is a cylinder. The connection structure between the lower end of the pull pin and the cylinder realizes the automatic reciprocating motion of the pull pin through the axial driving force provided by the cylinder, replacing the traditional manual operation of insertion and removal, reducing human intervention, and lowering operator fatigue and the probability of operation errors. The stable output force of the cylinder can ensure the consistency of the pull pin's movement stroke, ensuring uniform force for each locking / unlocking action, avoiding loosening or excessive compression caused by uneven force during manual operation, and ensuring the stability and reliability of the device connection during testing. At the same time, the automated reciprocating motion significantly shortens the connection time of a single test, adapting to the needs of high-efficiency testing in large-scale mass production, and effectively improving overall testing efficiency.

[0027] The beneficial effects of this invention are: ① It eliminates the need for on-board test connectors, which are replaced by this device during testing and removed after testing, thus saving on component costs.

[0028] ② The connection density is increased, and the use of surface test pads saves PCB area, thereby reducing the system size.

[0029] ③ The components in the device that enable positioning and rapid locking also function as a signal reference ground, reducing the signal return path and meeting the requirements for high-speed signal transmission.

[0030] ④ The locking action is achieved by using linear actuators such as cylinders, which saves time and effort, has good repeatability, and can meet the needs of production testing.

[0031] ⑤ It is equipped with a protective cover module. When not in use, the probe tip can be inserted into the hole of the end cover to protect the probe and prevent it from being damaged by accidental impact.

[0032] ⑥ The connection structure between the components is cleverly designed. For example, the cooperation between the quick-connect positioning guide sleeve and the quick-connect ring, locking ball, and pull pin enables quick connection and unlocking, making operation convenient and improving testing efficiency. Attached Figure Description

[0033] Figure 1 This is a schematic diagram of the structure of the present invention;

[0034] Figure 2 This is the left view of the present invention;

[0035] Figure 3 for Figure 2 A partial sectional view along the DD direction;

[0036] Figure 4 This is a schematic diagram of the quick-connect probe module.

[0037] Figure 5 This is a cross-sectional view of the quick-connect probe module;

[0038] Figure 6 This is a structural schematic diagram of the quick-connect positioning guide sleeve;

[0039] Figure 7 This is a schematic diagram of the probe structure.

[0040] Explanation of reference numerals in the attached drawings: Probe holder 1, Probe 2, Interface board needle 2-1, Needle tube 2-2, Probe spring 2-3, Test board needle 2-4, Bushing 3, Quick-connect positioning guide sleeve 4, Barb 4-1, Test interface board 5, Fastening nut 6, Quick-connect ring 7, Grounding support ring 8, End cap 9, Guide pin 10, Spring 11, Tray 12, Pull pin 13, Locking ball 14, Actuator 15. Detailed Implementation

[0041] The present invention will be further described below with reference to the accompanying drawings:

[0042] Referring to the accompanying drawings: This embodiment of the quick connection test device for printed circuit board assembly includes a quick-connect probe module, a tray 12 for positioning the PCB board under test, and a pull pin 13. The quick-connect probe module includes a quick-connect probe base module and a protective cover module.

[0043] The quick-connect probe base module includes a probe base 1, a set of probes 2, a bushing 3, a resettable quick-connect positioning guide sleeve 4, a test interface plate 5, a fastening nut 6, a locking ball 14, and a quick-connect ring 7. The probes 2 are inserted into the probe base 1 and arranged in the same way as the test pads on the PCB under test. The quick-connect positioning guide sleeve 4 and the probe base 1 are connected by the bushing 3. The quick-connect positioning guide sleeve 4 is threadedly connected to the fastening nut 6. The test interface plate 5 is sleeved on the quick-connect positioning guide sleeve 4 and located between the bushing and the nut. The fastening nut 6 presses it against the bushing 3. The test interface plate 5 contacts the upper end of the probes 2. The upper end of the quick-connect positioning guide sleeve 4 extends out of the fastening nut 6 and is sleeved with the quick-connect ring 7 to form a quick-connect structure in which the quick-connect ring 7 can slide axially on the quick-connect positioning guide sleeve 4 to control the radial position of the locking ball 14. In addition, the barb feature at the upper end of the quick-connect positioning guide sleeve 4 matches the center hole of the quick-connect ring 7 to play a role in limiting and preventing disengagement.

[0044] The protective cover module includes a grounding support ring 8, an end cap 9, and at least one guide pin 10 for positioning. The grounding support ring 8 and the crown-shaped barb at the lower end of the quick-connect positioning guide sleeve 4 cooperate to form an anti-detachment limiting structure. The end cap 9 is fixedly connected to the grounding support ring 8. The lower end of the probe 2 can pass through the end cap 9 and contact the test plate on the PCB board to be tested.

[0045] Pull pin 13 passes through tray 12 and can slide along the axis. Pull pin 13 is connected to the mounting hole of the PCB board under test and the inner side wall of the center hole of quick-connect positioning guide sleeve 4. The annular groove at the upper end of pull pin 13 and quick-connect positioning guide sleeve 4 are connected by the axial movement of quick-connect ring 7 to control the radial position of locking ball 14, forming a lockable and unlockable connection structure.

[0046] Probe 2 is a retractable probe, which includes a tail-end interface board needle 2-1, a needle tube 2-2, a probe spring 2-3, and a head-end test board needle 2-4. The interface board needle 2-1 and the test board needle 2-4 are located at both ends of the needle tube 2-2 and are axially connected with limited movement at both ends. The interface board needle 2-1 contacts the test interface board 5, and the test board needle 2-4 is used to contact the test pad on the PCB under test. The probe spring 2-3 is located inside the needle tube 2-2 and abuts against the interface board needle 2-1 and the test board needle 2-4 respectively.

[0047] The quick-connect positioning guide sleeve 4 has crown-shaped barbs 4-1 near both ends on its outer ring. The upper and lower ends of the quick-connect positioning guide sleeve 4 have through slots along the axial direction and are cut into several petals. The slots are located between adjacent petals. The outer circumferential surface of the upper end of the quick-connect positioning guide sleeve 4 is fitted with the center hole of the quick-connect ring 7, while the outer circumferential surface of the lower end is fitted with the center hole of the grounding support ring 8 with a clearance. The barbs 4-1 at the upper and lower ends of the quick-connect positioning guide sleeve 4 abut against the inner end faces of the quick-connect ring 7 and the grounding support ring 8, respectively, to form an axial limiting and anti-detachment structure.

[0048] The upper half of the quick-connect positioning guide sleeve 4 has conical locking ball holes that are evenly distributed in a ring and are connected internally and externally. Locking balls 14 are installed in the locking ball holes, and the diameter of the locking balls is slightly larger than the wall thickness of the guide sleeve. The pull pin 13 has an annular groove near the upper outer circumference. When the quick-connect ring 7 slides downward along the quick-connect positioning guide sleeve 4 and the small diameter section of the quick-connect ring is aligned with the locking ball hole, the inner wall of the small diameter section squeezes the locking ball 14 to move towards the center and hugs the annular groove of the pull pin 13, thereby establishing a connection with the pull pin 13. When the quick-connect ring 7 slides upward along the quick-connect positioning guide sleeve and abuts against the upper barb, the large diameter section of the quick-connect ring 7 is aligned with the locking ball hole. At this time, if the pull pin 13 slightly touches the locking ball 14, the locking ball 14 will move outward in the locking ball hole, and the locking ball 14 will release the annular groove of the pull pin 13, thereby releasing the connection with the pull pin 13.

[0049] The probe holder 1 is provided with an interface board positioning protrusion, and the test interface board 5 is provided with a positioning notch that cooperates with the interface board positioning protrusion.

[0050] The bushing 3 and the grounding support ring 8 are made of conductive metal. The bushing 3 is fixed to the probe seat 1 by pressing or glue. The upper end face of the bushing 3 abuts against the grounding ring on the bottom surface of the test interface plate 5. The lower end face of the grounding support ring 8 abuts against the grounding plate of the mounting hole of the board under test. When the device is locked, the lower end face of the bushing 3 abuts against the grounding support ring 8 to form a test signal grounding loop.

[0051] The upper part of the guide pin 10 is located in the guide pin hole of the probe base 1, and the lower part penetrates the end cap 9 and is inserted into the auxiliary positioning hole of the PCB to be tested. Together with the pull pin 13 and the center hole of the quick-connect positioning guide sleeve, a complete positioning structure is formed.

[0052] A spring 11 is fitted on the quick-connect positioning guide sleeve 4. The two ends of the spring 11 abut against the quick-connect positioning guide sleeve 4 and the grounding support ring 8 respectively to ensure that when the device is not locked, the head end of the probe 2 retracts into the probe hole of the end cover 9.

[0053] The lower end of the pull pin 13 is connected to an actuator 15 that makes it reciprocate axially. Preferably, the actuator 15 is a cylinder.

[0054] The specific steps for implementing this technical solution are as follows:

[0055] 1. In use, first align the mounting holes of the board under test with the pull pin 13 and positioning pin on the tray 12, then place it downwards onto the tray 12. Next, hold the knurled part of the quick-connect probe module quick-connect ring 7, aligning the center hole of the quick-connect positioning guide sleeve 4 with the pull pin 13, and lower it downwards. When the protruding part of its guide pin 10 is about to contact the board under test, ensure it is aligned with the auxiliary positioning hole of the board under test. Continue downwards until the lower end face of the grounding support ring 8 abuts against the grounding plate of the mounting hole on the board under test, completing the placement and positioning of the probe module. Then, release the quick-connect ring 7. The quick-connect ring 7 will fall under gravity until its lower end face abuts against the quick-connect positioning guide sleeve 4. At this point, the locking ball has gripped the groove of the pull pin 13, completing the connection between the probe module and the pull pin 13. Activate the actuator 15 (cylinder) to pull the pull pin 13 downwards, completing the locking of the device. Simultaneously, establish the signal connection of the probe 2, and the connection between the probe seat bushing 3, the grounding support ring 8, and the grounding plate of the board under test.

[0056] 2. After the test is completed, activate the actuator to pull the pin 13 back to its original position. At this time, the spring 11 in the quick-connect probe module will lift the probe seat module, causing the probe 2 to disengage from the test plate of the board under test. The probe 2 will retract into the probe hole of the protective cover, and at the same time, the probe seat bushing 3 will disengage from the grounding support ring 8. Then, lift the quick-connect ring 7 by hand along the knurled part. The quick-connect ring 7 will move upward relative to the quick-connect positioning guide sleeve 4 until it abuts against the upper barb of the quick-connect positioning guide sleeve 4. At this time, the large diameter section of the quick-connect ring 7 is opposite to the locking ball, and the connection between the quick-connect probe module and the pin 13 is released. Continue to lift the quick-connect ring 7, and the entire probe module will move upward relative to the pin 13. After it disengages from the pin 13 and is placed aside, finally remove the board under test from the tray 12 and proceed to test the next board.

[0057] Although the present invention has been illustrated and described with reference to preferred embodiments, those skilled in the art will understand that various changes in form and detail are possible within the scope of the claims.

Claims

1. A rapid connection testing device for printed circuit board assembly, characterized in that: It includes a quick-connect probe module, a tray (12) for positioning the PCB board under test, and a pull pin (13). The quick-connect probe module includes a quick-connect probe base module and a protective cover module. The quick-connect probe base module includes a probe base (1), a set of probes (2), a bushing (3), a quick-connect positioning guide sleeve (4), a test interface plate (5), a fastening nut (6), and a quick-connect ring (7). The probes (2) are inserted into the probe base (1) and arranged in the same way as the test pads on the PCB under test. The quick-connect positioning guide sleeve (4) and the probe base (1) are connected by the bushing (3). The quick-connect positioning guide sleeve (4) is threadedly connected to the fastening nut (6). The test interface plate (5) is sleeved on the quick-connect positioning guide sleeve (4) and pressed against the bushing (3) by the fastening nut (6). The test interface plate (5) is in contact with the upper end of the probes (2). The upper end of the quick-connect positioning guide sleeve (4) extends out of the probe base (1) and is sleeved with the quick-connect ring (7) to form a quick-connect structure in which the quick-connect ring (7) can slide axially on the quick-connect positioning guide sleeve (4). The protective cover module includes a grounding support ring (8), an end cap (9), and at least one guide pin (10) for positioning. The grounding support ring (8) cooperates with the lower end of the quick-connect positioning guide sleeve (4) to form a quick connection structure. The end cap (9) is fixedly connected to the grounding support ring (8). The lower end of the probe (2) can pass through the end cap (9) and contact the test plate on the PCB board to be tested. The pull pin (13) passes through the tray (12) and can slide along the axis. The pull pin (13) is connected to the center hole of the quick-connect positioning guide sleeve (4) and the inner side wall of the mounting hole of the PCB board to be tested. The upper end of the pull pin (13) and the quick-connect positioning guide sleeve (4) are connected by the quick-connect ring (7) moving axially to form a lockable and unlockable connection structure.

2. The rapid connection testing device for printed circuit board assembly according to claim 1, characterized in that: The probe (2) is a spring probe, with its tail end connected to the test interface board (4); when the other end is tightened, it abuts against the corresponding test plate of the board under test and retracts a small distance, and the internal spring keeps it in contact with the test plate to establish a certain contact force, thereby establishing a signal connection between the test interface board and the board under test.

3. The rapid connection testing device for printed circuit board assembly according to claim 1, characterized in that: The quick-connect positioning guide sleeve (4) has crown-shaped barbs (4-1) at both ends. The quick-connect positioning guide sleeve (4) has centrally symmetrical slots along the axial direction at its upper and lower ends and is cut into several pieces at its upper and lower ends. The outer circumferential surface of the upper end of the quick-connect positioning guide sleeve (4) is in clearance fit with the center hole of the quick-connect ring (7), while the outer circumferential surface of the lower end is in clearance fit with the center hole of the grounding support ring (8). The barbs (4-1) at the upper and lower ends of the quick-connect positioning guide sleeve (4) abut against the inner end faces of the quick-connect ring (7) and the grounding support ring (8) respectively, to prevent the quick-connect ring (7) and the grounding support ring (8) from detaching from both ends.

4. The rapid connection testing device for printed circuit board assembly according to claim 1 or 5, characterized in that: The upper half of the quick-connect positioning guide sleeve (4) has conical locking ball holes that are evenly distributed in an annular shape and are connected internally and externally. Locking balls (14) are installed in the locking ball holes, and the small diameter end of the conical locking ball hole faces the center hole of the quick-connect positioning guide sleeve (4), so that the locking ball (14) cannot be dislodged from the small diameter end of the locking ball hole. The pull pin (13) has an annular groove on its upper outer circumference. When the quick-connect ring (7) slides along the axial direction of the quick-connect positioning guide sleeve (4) to the inner side wall of the small diameter section and aligns with the locking ball hole, the inner side wall squeezes the locking ball (14) to move towards the center and hugs the annular groove of the pull pin (13), thereby establishing a connection with the pull pin. When the quick-connect ring (7) slides to the inner side wall of the large diameter section and aligns with the locking ball hole, the inner side wall no longer squeezes the locking ball (14) but only holds the locking ball (14) to prevent it from falling out of the locking ball hole. At this time, the locking ball cannot hug the annular groove of the pull pin (13), and the pull pin (13) can move in and out freely, and the connection between the two is released.

5. The rapid connection testing device for printed circuit board assembly according to claim 1, characterized in that: The probe holder (1) is provided with an interface board positioning protrusion, and the test interface board (5) is provided with a positioning notch that cooperates with the interface board positioning protrusion.

6. The rapid connection testing device for printed circuit board assembly according to claim 1, characterized in that: The bushing (3) and the grounding support ring (8) are made of conductive metal. The bushing (3) is fixed to the probe seat (1) by pressing or glue. The upper end face of the bushing (3) abuts against the grounding ring on the bottom surface of the test interface board (5), and the lower end face of the grounding support ring (8) abuts against the grounding plate of the mounting hole of the board under test. When the device is locked, the lower end face of the bushing (3) abuts against the grounding support ring (8) to form a test signal grounding loop from the test interface board (5) to the board under test.

7. The rapid connection testing device for printed circuit board assembly according to claim 1, characterized in that: The upper part of the guide pin (10) is located in the guide pin hole of the probe base (1) and the lower part penetrates the end cap (9) and is inserted into the auxiliary positioning hole of the PCB to be tested, and cooperates with the pull pin (13) to form a positioning structure.

8. The rapid connection testing device for printed circuit board assembly according to claim 1, characterized in that: A spring (11) is fitted on the quick-connect positioning guide sleeve (4). The two ends of the spring (11) abut against the quick-connect positioning guide sleeve (4) and the grounding support ring (8) respectively to form a protective probe structure that allows the probe to be inserted into the end cap in a relaxed state.

9. The rapid connection testing device for printed circuit board assembly according to claim 1, characterized in that: The lower end of the pull pin (13) is connected to an actuator (15) that makes it reciprocate axially, and the actuator (15) is a cylinder.

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