System and method for determining basis weight of coating material using radiation basis weight meter

Abstract

Example systems, computer-implemented methods, and computer program products are provided for determining a basis weight of a coating material on a substrate material using a radiation basis weight meter. An example system includes a radiation basis weight meter and a controller. The radiation basis weight meter is configured to direct measurement particles at a coated material, which includes a base material and a coating material, and determine an uncorrected basis weight of the coated material based on a number of measurement particles received at the radiation detector. The controller is configured to determine an uncorrected basis weight of the matrix material based on the corrected basis weight of the matrix material. The controller is further configured to determine a basis weight of the coating material based on a difference between the uncorrected basis weight of the coating material and the uncorrected basis weight of the matrix material using the coating material correction factor.

Description

Technical Field

[0001] The embodiments of this disclosure generally relate to determining the basis weight of a coating material on a substrate material, and more specifically to determining the weight of the coating material using an X-ray and / or beta radiation gravimeter. Background Technology

[0002] The applicant has identified numerous technical challenges and difficulties associated with accurately measuring the basis weight of coating materials using a radiation gravimeter. Through effort, ingenuity, and innovation, the applicant has addressed these problems by developing solutions embodied in this disclosure, which are described in detail below. Summary of the Invention

[0003] Various embodiments relate to example systems, computer-implemented methods, and computer program products for determining the calibrated basis weight of a coating material on a substrate material using a radiation metric meter. The example system includes a radiation metric meter and a controller. The radiation metric meter is configured to direct measurement particles to a coated material comprising both the substrate material and the coating material, and to determine the uncalibrated basis weight of the coated material based on the number of measurement particles received at a radiation detector. The controller is configured to determine the uncalibrated basis weight of the substrate material based on the calibrated basis weight of the substrate material. The controller is also configured to determine the calibrated basis weight of the coating material based on the difference between the uncalibrated basis weight of the coated material and the uncalibrated basis weight of the substrate material, and a coating material correction factor.

[0004] In some implementations, the uncorrected basis weight of the matrix material is determined based on the matrix material correction factor.

[0005] In some implementations, the matrix material correction factor represents the ratio of the corrected basis weight of the matrix material to the uncorrected basis weight of the matrix material.

[0006] In some implementations, a coating material correction factor is determined based on measurements of the substrate material and the coated material performed by a radiation gravimeter.

[0007] In some implementations, the coating material correction factor is determined based on the following ratios: (1) the difference in corrected basis weight between the corrected basis weight of the coating material and the corrected basis weight of the substrate material; and (2) the difference in uncorrected basis weight between the uncorrected basis weight of the coating material and the uncorrected basis weight of the substrate material.

[0008] In some implementations, the coating material correction factor is determined based on X-ray computer modeling.

[0009] In some implementations, the atomic weight of the coating material differs from that of the base material.

[0010] In some implementations, the substrate material is a metal and the coating material is a silicon-graphite composite material.

[0011] In some embodiments, at least one of the atomic weights of the coating material and the substrate material is at least twice the atomic weight of the other.

[0012] In some implementations, the coated material is used as the anode for the battery cell.

[0013] In some implementations, the radiation gravimeter includes a beta transilluminator.

[0014] In some implementations, the radiation gravimeter includes an X-ray transilluminator.

[0015] In some implementations, the system also includes a second radiation gravimeter configured to direct the measuring particles to the matrix material and determine the calibrated gravimeter of the matrix material.

[0016] A computer-implemented method for determining a calibrated basis weight of a coating material on a substrate material, the computer-implemented method comprising: receiving a calibrated basis weight of the substrate material; determining an uncalibrated basis weight of the substrate material corresponding to a radiation turbidimeter based on the calibrated basis weight of the substrate material; receiving an uncalibrated basis weight of the coating material from the radiation turbidimeter, wherein the radiation turbidimeter is configured to direct measurement particles to the coating material comprising the substrate material and the coating material, and determining the uncalibrated basis weight of the coating material based on the number of measurement particles received at a radiation detector; and determining a calibrated basis weight of the coating material based on the difference between the uncalibrated basis weight of the coating material and the uncalibrated basis weight of the substrate material and a coating material correction factor.

[0017] In some implementations, the uncorrected basis weight of the matrix material is determined based on the matrix material correction factor.

[0018] In some implementations, the matrix material correction factor represents the ratio of the corrected basis weight of the matrix material to the uncorrected basis weight of the matrix material.

[0019] In some embodiments, the method further includes determining a corrected basis weight difference, which represents the difference between the corrected basis weight of the coating material and the corrected basis weight of the substrate material; determining an uncorrected basis weight difference, which represents the difference between the uncorrected basis weight of the coating material and the uncorrected basis weight of the substrate material; and determining a coating material correction factor based on the ratio of the corrected basis weight difference to the uncorrected basis weight difference.

[0020] In some implementations, the coated material is used as the anode for the battery cell.

[0021] In some embodiments, the method further includes receiving a calibrated matrix weight from a second radiation tome configured to direct a measuring particle to the matrix material to determine the calibrated matrix weight.

[0022] The present invention also provides a computer program product for determining a calibrated basis weight of a coating material on a substrate material. In some embodiments, the computer program product includes at least one non-transitory computer-readable storage medium storing a portion of computer-readable program code, the portion including an executable portion configured to: receive a calibrated basis weight of the substrate material; determine an uncalibrated basis weight of the substrate material corresponding to a radiation tilometer based on the calibrated basis weight of the substrate material; receive an uncalibrated basis weight of the coated material from the radiation tilometer, wherein the radiation tilometer is configured to direct measurement particles to the coated material comprising the substrate material and the coating material, and determine the uncalibrated basis weight of the coated material based on the number of measurement particles received at a radiation detector; and determine a calibrated basis weight of the coating material based on the difference between the uncalibrated basis weight of the coated material and the uncalibrated basis weight of the substrate material and a coating material correction factor. Attached Figure Description

[0023] Reference will now be made to the accompanying drawings. In some embodiments described herein, the components illustrated in the drawings may or may not be present. Some embodiments may include fewer (or more) components than those shown in the figures of the exemplary embodiments according to this disclosure.

[0024] Figure 1 An example radiation gravimeter configured to determine the basis weight of a base material and a coated material, according to an example embodiment of the present disclosure, is shown.

[0025] Figure 2 An example coated material comprising a base material and a coating material is shown according to an example embodiment of the present disclosure.

[0026] Figure 3 An example block diagram of a coating basis weight measurement system according to an example embodiment of the present disclosure is shown.

[0027] Figure 4 An example flowchart is shown of an example coating basis weight measurement system configured to generate a corrected basis weight of coating material according to an example embodiment of the present disclosure.

[0028] Figure 5 A flowchart is shown of an example method for determining the corrected basis weight of a coating material according to an example embodiment of the present disclosure.

[0029] Figure 6A block diagram of an example computing component of a controller according to an example embodiment of the present disclosure is depicted. Detailed Implementation

[0030] Example embodiments will be described more fully below with reference to the accompanying drawings, which illustrate some, but not all, embodiments of the invention disclosed herein. In fact, embodiments of this disclosure may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided to enable this disclosure to meet applicable legal requirements. The same reference numerals always refer to the same elements.

[0031] Various example implementations address technical problems associated with using X-ray and / or beta radiation gravimeters to determine the accurate basis weight (weight per unit area) and / or thickness of coating materials. As those skilled in the art to which this disclosure pertains will understand, there are numerous example scenarios where accurate determination of the basis weight of coating materials may be necessary.

[0032] It is generally desirable to coat a substrate material (e.g., paper, plastic, metal) with a precise amount of uniform coating material. For example, certain components of a lithium-ion battery, such as the anode and cathode layers, may be coated with a material that facilitates the transfer of ions between the positively charged cathode and the negatively charged anode. Uniform coating material may be necessary for the efficient operation of a lithium-ion battery cell. Furthermore, uniform coating within the battery cell ensures the separation of internal components. Failure to separate internal components can lead to internal short circuits, resulting in a dangerous battery condition. Additionally, coating materials can be expensive. Uniform coating minimizes wasted coating material in certain application areas, thereby reducing overall manufacturing costs.

[0033] Measurements of coating materials on the surface of a substrate material can be performed using X-ray and / or beta radiation tylmeters. A tylmeter can determine the basis weight (or thickness) of a target material by utilizing the absorption and scattering of accelerated particles (e.g., beta particles). For example, in some embodiments, the tylmeter may include a radiation source aligned with the target material and configured to emit particles toward it. The tylmeter may also include a radiation detector configured to receive particles passing through the target material. The basis weight of the target material can be determined based on the number of particles absorbed and / or scattered by the target material.

[0034] Typically, a radiation tregometer is calibrated using a known material such as polyethylene terephthalate (PET), aluminum, or another material. A correction factor for each target material is then determined based on its relationship to the calibration material (e.g., PET). For example, in some embodiments, the correction factor can be determined first, and then operations using a sample of the target material can be performed. The actual basal weight of the target material can be determined using the accurately known area of ​​the material weighed on a laboratory balance. The uncalibrated basal weight can then be determined using a PET-calibrated radiation tregometer. The correction factor for the target material is determined based on the ratio of the actual weight of the sample to the uncalibrated basal weight returned by the PET-calibrated radiation tregometer. Therefore, during operation, the calibrated basal weight of the target material can be determined using the correction factor of the sample target material based on the uncalibrated basal weight returned by the radiation tregometer. The calibrated basal weight is an approximation of the actual basal weight of the target material based on the correction factor.

[0035] In some previous examples, the principle employed by radiation treadmills has been used to determine the basis weight of the coating material on the substrate material. For example, in some applications, a coating apparatus may be used to apply a coating material to a continuously moving sheet of substrate material. The substrate material passes through the coating apparatus such that the coating material is applied to the surface of the substrate material. In such previous examples, two or more radiation treadmills are used to determine the weight of the coating material. The weight of the substrate material is determined before the coating apparatus, and a second weight measurement is performed by a radiation treadmill downstream of the coating apparatus. The first weight measurement is of the substrate material. The second radiation treadmill is configured to measure the weight of the coated material (e.g., the substrate material with a coating material layer). The weight of the coating material can then be determined by subtracting the weight of the substrate material from the weight of the coated material.

[0036] However, using only subtraction to determine the weight of the coating material can lead to inaccuracies, for example, when the substrate material and the coating material have different correction factors. As mentioned above, correction factors are typically measured in a laboratory and used to configure a radiation gravimeter. In the case of the substrate material, the substrate material can be measured and its correction factor determined. Similarly, the weight of the coated material (e.g., both the substrate and the coating material) can be measured and its correction factor determined. Unfortunately, the correction factor for the coated material may vary based on the ratio of the coating material to the substrate material. Furthermore, it may be difficult to measure the correction factor for the coating material alone, especially when the coating material includes powder, liquid, or similar substances. Therefore, in some examples, the weight of the coated material can be used to approximate the changes in the coating material during operation.

[0037] Using correction factors for coated materials to determine changes in the basis weight of the coating material can be problematic, especially when the atomic weights of the coating and base materials are significantly different. For example, a coated material (e.g., comprising both base and coating materials) might exhibit a correction factor of 1 for the base material, 0.5 for the coated material, and 0.125 for the coating material. If the actual weight of the coated material changes by 1 gram, but this change is solely due to a change in the amount of coating material, the uncorrected basis weight should be recorded as a change of 1 gram / (0.125) = 8 grams due to the change in the coating material. However, if the correction factor for the coated material is used when the calibrated weight changes by 8 grams, the determined change in the corrected basis weight is 8 grams * (0.5) = 4 grams. Therefore, a 1-gram change in the coating material might actually be reported as a 4-gram change.

[0038] The various example implementations described herein utilize various techniques to accurately determine the calibrated basis weight of a coating material disposed on a substrate material using a downstream radiation tregometer. For example, in some implementations, the basis weight (or an approximation of the actual basis weight) of the substrate material may be determined, for example, using an upstream radiation tregometer, based on substrate material documentation provided by the vendor, or in any other manner. The (actual or approximate) substrate material basis weight can be converted to the uncalibrated basis weight of the substrate material corresponding to the downstream radiation tregometer using a substrate material correction factor of the downstream radiation tregometer.

[0039] In addition, the uncalibrated basis weight of the coated material can be received from a downstream radiation tregometer. By determining the difference between the uncalibrated basis weight of the coated material and the uncalibrated basis weight of the substrate material, the artificial uncalibrated basis weight of the coating material corresponding to the downstream radiation tregometer can be determined using the uncalibrated basis weight of the coated material. Once the uncalibrated basis weight of the coating material is determined, the calibrated basis weight of the coating material can be determined by applying a coating material calibration factor to the uncalibrated basis weight of the coating material.

[0040] The uncorrected basis weight of the coating material can be isolated by converting various weights of the material to the uncorrected basis weight corresponding to the downstream radiation tachometer and performing a difference operation based on the uncorrected basis weight. This allows the corrected basis weight of the coating material to be determined using a coating material correction factor. The corrected basis weight of the coating material represents a more accurate approximation of the actual basis weight of the coating material.

[0041] In some implementations, a correction factor associated with the coating material corresponding to a downstream radiometric tregometer can be determined based on the corrected and uncorrected basis weights of the substrate and coating materials. For example, the coating material correction factor corresponding to the downstream radiometric tregometer can be equal to the ratio of the difference between the corrected basis weights of the coating material and the substrate material to the difference between the uncorrected basis weights associated with the downstream radiometric tregometer of the coating material and the substrate material.

[0042] Because of the example embodiments described herein, and in some examples, the accuracy of determining the basis weight (e.g., thickness) of the coating material on the substrate material can be achieved. Accurate determination of the coating material weight allows for more efficient and safer operation of equipment utilizing the coated material. Additionally, in some embodiments, waste of coating material during manufacturing can be minimized, reducing costs.

[0043] Now for reference Figure 1 An example coating apparatus 102 and an accompanying radiation gravimeter (e.g., a downstream radiation gravimeter 110) are provided. Figure 1 As depicted, the example coating apparatus 102 is configured to apply coating material 106 to a substrate material 104, thereby forming a coated material 108 comprising the substrate material 104 and the coating material 106. Figure 1 Further depicted, the downstream radiation gravimeter 110 includes a radiation source 110a on a first side of the coated material 108 and a radiation detector 110b on the side of the coated material 108 opposite to the radiation source 110a.

[0044] like Figure 1 The depicted coating basis weight measurement system includes a coating apparatus 102. The coating apparatus 102 includes any system or mechanism configured to apply a coating material to the surface of a substrate material. The coating apparatus 102 can utilize any mechanism to apply the coating to the substrate material surface. For example, the coating apparatus 102 can utilize mechanical metering, including knife-to-roll coating, comma-to-roll coating, roller coating; volumetric coating, including slot die coating; spraying; aerosol coating; brush coating; dip coating; and so on.

[0045] like Figure 1Further described, the coating basis weight measurement system includes a radiation tylene 110. The radiation tylene 110 is any system or device configured to transmit measuring particles toward a target material (e.g., the coated material 108) to determine one or more physical properties (e.g., basis weight) of the target material. The basis weight of the target material is the weight per unit of material. For example, the basis weight of the coated material 108 can be measured in grams per square meter. The radiation tylene 110 includes a radiation source 110a and a radiation detector 110b, the radiation source being configured to direct measuring particles toward the target material, and the radiation detector being configured to receive a portion of the transmitted measuring particles. In some embodiments, the radiation tylene 110 may include a beta particle radiation source 110a. In such cases, the radiation source 110a may utilize a radioactive isotope source to emit beta rays. In some embodiments, the radiation tylene 110 may include an x-ray radiation source 110a. In such cases, the radiation source 110a may generate x-rays to be transmitted at the target material.

[0046] A portion of the measurement particles transmitted by radiation source 110a are scattered and / or absorbed by the target material. Radiation tylene meter 110 uses the absorption and scattering of the measurement particles to determine the material's basis weight. For example, radiation tylene meter 110 may determine the material's basis weight based on the number of particles received at radiation detector 110b. In some embodiments, radiation tylene meter 110 may determine the target material's basis weight based on the ratio of transmitted measurement particles received at radiation detector 110b where the target material is present between radiation source 110a and radiation detector 110b to those where the target material is not present.

[0047] The radiation gravimeter 110 responds differently to materials with different atomic weights. For example, high atomic number (Z) materials absorb and / or scatter more measurement particles transmitted by the radiation source 110a than low atomic number materials. Therefore, the radiation gravimeter 110 is calibrated based on the target material. Typically, calibration of the radiation gravimeter 110 may include a configuration based on known materials such as polyethylene terephthalate (PET), aluminum, or other materials. The gravimeter weight of the target material relative to the calibration material is then determined using a correction factor. The correction factor can be determined first, and then operations using a sample of the target material can be performed. A scale can be used to determine the actual gravimeter weight of the target material. The uncalibrated gravimeter weight can then be determined using the radiation gravimeter 110 configured for the calibrated material. The correction factor of the target material is determined based on the ratio of the actual gravimeter weight of the sample of the target material to the uncalibrated gravimeter weight returned by the radiation gravimeter 110. Therefore, during operation, the calibrated gravimeter weight of the target material can be determined using the correction factor of the sample target material based on the uncalibrated gravimeter weight returned by the radiation gravimeter. Therefore, the corrected basis weight is the determined value of the actual basis weight of the target material as determined by the radiation gravimeter 110.

[0048] As described herein, the actual basis weight of the target material refers to the weight of the material's known area when weighed on a scale. The corrected basis weight of the target material can be determined by multiplying the uncorrected basis weight by a correction factor for the target material on a specific radiation tilometer 110, as depicted in Equation 1:

[0049] (1)CORRECTED_BASIS_WEIGHT=UNCORRECTED_BASIS_WEIGHT*CORRECTION_FACTOR

[0050] As described herein, the uncorrected basis weight of the target material refers to the weight output by a radiation treadmeter (e.g., radiation treadmeter 110) before the application of a correction factor.

[0051] As described in this article, the correction factor is the ratio of the actual basis weight of the target material to its uncorrected basis weight. In most cases, the correction factor can be determined first, and then the coating basis weight measurement equipment can be operated.

[0052] Now for reference Figure 2 An example of a coated material 108 is provided, comprising a substrate material 104 and a coating material 106 disposed on the surface of the substrate material 104.

[0053] like Figure 2 As depicted, the substrate material 104 includes any material configured to receive the coating material 106. The substrate material 104 may include paper, plastic, metal, or other materials. In some embodiments, the substrate material 104 with the coating material 106 may include the anode or cathode of a battery cell or fuel cell. For example, in some embodiments, the substrate material 104 may include conductive metals such as copper, aluminum, polymer films, gold, silver, etc.

[0054] The matrix material 104 includes a calibrated matrix material weight, an uncalibrated matrix material weight, and a matrix material correction factor. The calibrated matrix material weight corresponds to the actual weight of the matrix material as determined by the radiometric tregometer 110 with the applied matrix material correction factor. The uncalibrated matrix material weight is a sensor output corresponding to the weight of the matrix material determined by the radiometric tregometer before the application of the matrix material correction factor. A radiometric tregometer-specific correction factor can be applied to the uncalibrated matrix material weight to determine the calibrated matrix material weight. The uncalibrated matrix material weight depends on the radiometric tregometer and the calibration material used to calibrate it. The matrix material correction factor is multiplied by the uncalibrated matrix material weight to determine the value of the calibrated matrix material weight. The matrix material correction factor can be specific to the radiometric tregometer and its configuration (e.g., calibration material). The matrix material correction factor can be determined before operation by weighing a sample of the matrix material to determine the uncorrected basis weight of the sample, and by calculating the ratio of the actual basis weight of the matrix material to the uncorrected basis weight of the matrix material.

[0055] like Figure 2 Further described, the coating material 106 includes materials, fluids, or other substances configured to be disposed on the surface of the coating material 106. For example, the coating material 106 may be disposed on the surface of a copper layer to form the anode of a battery cell. In such cases, the coating material 106 may comprise a silicon-graphite material or platinum powder. The coating material 106 may facilitate the transfer of ions between a positively charged cathode and a negatively charged anode. Uneven distribution or defects in the distribution of the coating material 106 may cause a short circuit in the battery cell or fuel cell, leading to a catastrophic battery condition.

[0056] The coating material 106 includes a calibrated basis weight, an uncalibrated basis weight, and a calibration factor. The calibrated basis weight corresponds to the actual weight of the coating material as determined by a tachometer 110 with the applied calibration factor. The uncalibrated basis weight corresponds to the sensor output of the weight of the coating material determined by the tachometer before the application of the calibration factor. A tachometer-specific calibration factor can be applied to the uncalibrated basis weight to determine the calibrated basis weight. The uncalibrated basis weight depends on the tachometer and the calibration material used to calibrate it. The calibration factor is multiplied by the uncalibrated basis weight to determine the value of the calibrated basis weight. The calibration factor can be specific to the tachometer and its configuration (e.g., calibration material). The calibration factor can be determined prior to operation by weighing a sample of the coating material, determining the uncalibrated basis weight of the sample, and calculating the ratio of the actual basis weight to the uncalibrated basis weight.

[0057] The coating material correction factor is determined by multiplying the uncorrected basis weight of the coating material by the corrected basis weight of the coating material. The coating material correction factor may be specific to the tilometer and its configuration (e.g., calibration material). Since the coating material may comprise powder or liquid and may be unmeasurable without a substrate support, the coating material correction factor may be difficult or impossible to determine prior to operation. Therefore, the coating material correction factor can be determined based on the determined properties of the coating material 108 and the substrate material 104. For example, the coating material correction factor (CORRECTION_FACTOR) can be approximately calculated according to equation (2). CM ):

[0058] (2)

[0059]

[0060] Among them, CORRECTED_BASIS_WEIGHT COATED -CORRECTED_BASIS_WEIGHT BASE This represents the difference in calibrated basis weight between the calibrated basis weight of the coated material and the calibrated basis weight of the substrate material, and also represents the calibrated basis weight of the measuring radiometric gravimeter 110 for the coated material. Additionally, UNCORRECTED_BASIS_WEIGHT COATED -UNCORRECTED_BASIS_WEIGHT BASE It is the uncorrected basis weight difference, which represents the difference between the uncorrected basis weight of the coated material and the uncorrected basis weight of the base material, and represents the response of the radiation tilometer to the coated material.

[0061] The coating material correction factor determined in Equation (2) represents a non-limiting approximation of the coating material correction factor. Other operations can be used to determine the coating material correction factor, for example, based on chemical composition. In some embodiments, the coating material correction factor can be approximated as a constant value, such as 1. In some embodiments, the correction factor associated with the coating material corresponding to the downstream radiation-based gravimeter can be determined based on x-ray computer modeling, wherein the x-ray computer modeling determines the correction factor based on the interaction between x-rays and the material.

[0062] like Figure 2Further described, the coated material 108 comprises a combination of coating materials 106 on the surface of the substrate material 104. The coated material 108 includes a calibrated basis weight, an uncalibrated basis weight, and a calibration factor. The calibrated basis weight corresponds to the actual weight of the coated material as determined by a turbidimeter 110 with the applied calibration factor. The uncalibrated basis weight corresponds to a sensor output of the weight of the coated material determined by the turbidimeter before the application of the calibration factor. A turbidimeter-specific calibration factor can be applied to the uncalibrated basis weight to determine the calibrated basis weight. The uncalibrated basis weight depends on the turbidimeter and the calibration material used to calibrate it. The calibration factor is multiplied by the uncalibrated basis weight to determine the value of the calibrated basis weight. The calibration factor can be specific to the turbidimeter and its configuration (e.g., calibration material). Before operation, the correction factor for coated materials can be determined by weighing a sample of the coated material to determine the uncorrected basis weight of the sample, and by calculating the ratio of the actual basis weight of the coated material to the uncorrected basis weight of the coated material.

[0063] However, during operation, the coating material correction factor can vary based on the ratio of coating material 106 to substrate material 104. Therefore, as the distribution of coating material 106 changes, the coating material correction factor also changes. Consequently, relying on the coating material correction factor to determine changes in the coating material basis weight can lead to inaccuracies. This inaccuracy is particularly prevalent when the atomic weight of coating material 106 differs from that of substrate material 104. For example, in some embodiments, the atomic weight of substrate material 104 can be more than twice the atomic weight of coating material 106. In such cases, neither the coating material correction factor nor the substrate material correction factor is sufficient to approximate the coating material correction factor. Therefore, as disclosed herein, when the atomic weight of coating material 106 differs from that of substrate material 104, the corrected basis weight of coating material 106 can be determined without relying on the coating material correction factor.

[0064] Now for reference Figure 3 An example coating basis weight measurement system 300 is provided. For example... Figure 3The depicted coating basis weight measurement system 300 includes a tack meter 330 configured to transmit a basis weight 336 (actual basis weight or approximate basis weight, e.g., calibrated basis weight) to a controller 332. The coating basis weight measurement system 300 also includes a coated radiation tack meter 110 configured to transmit an uncalibrated basis weight 338 of the coated material and an associated correction factor 337 to the controller 332. Based on the basis weight 336 of the substrate material, the correction factor 337, and the uncalibrated basis weight 338 of the coated material, the controller 332 is configured to output a calibrated basis weight 334 of the coating material.

[0065] like Figure 3 The illustrated example coating basis weight measurement system 300 includes a tack gauge 330. The tack gauge 330 includes any device, system, or other mechanism for determining the basis weight 336 of the substrate material 104. (As described above...) Figure 4 As further described herein, the tack meter 330 may include a radiation tack meter configured to determine the calibrated basis weight of the matrix material 104. However, the tack meter 330 may include any other mechanism for determining the basis weight 336 of the matrix material 104. For example, the tack meter 330 may be an input mechanism configured to receive automatic or manual input specifying the basis weight 336 of the matrix material 104.

[0066] like Figure 3 Further described, the example coating basis weight measurement system 300 includes a coated radiation gravimeter 110. The coated radiation gravimeter 110 is positioned to determine the absorption and scattering characteristics of a coated material 108 comprising a substrate material 104 and a coating material 106. For example, in some embodiments, this can be achieved using a coating apparatus (e.g., such as...) Figure 1 The coating apparatus 102) positions the coated radiation gravimeter 110 after the coating material 106 has been applied to the surface of the substrate material 104.

[0067] The coated radiation tregularity meter 110 is configured to transmit the uncalibrated basis weight 338 of the coated material to the controller 332. The uncalibrated basis weight 338 corresponds to the weight determined by the coated radiation tregularity meter 110 before a calibration factor has been applied. The uncalibrated basis weight 338 depends on the calibration performed on the coated radiation tregularity meter 110. In some embodiments, the uncalibrated basis weight 338 can be determined by dividing the calibrated basis weight of the coated material by the coated material calibration factor of the coated radiation tregularity meter 110.

[0068] The coated radiometric gravimeter 110 is also configured to transmit a correction factor 337 to a controller 332. The correction factor 337 includes a matrix material correction factor for the coated radiometric gravimeter 110 and a coating material correction factor for the coated radiometric gravimeter 110. (As with...) Figure 1 As described above, the matrix material correction factor can be determined based on a sample of the matrix material, and then the operation can be performed. Similarly, the coating material correction factor can be determined based on samples of both the matrix material and the coating material.

[0069] like Figure 3 Further depicted, the example coating basis weight measurement system 300 includes a controller 332. The controller 332 includes any component such as a processor, device, microcontroller, or circuitry embodied in hardware, software, or a combination thereof, configured to receive the basis weight 336 of the substrate material, a correction factor 337, and the uncorrected basis weight 338 of the coating material to generate a corrected basis weight 334 of the coating material.

[0070] Controller 332 is configured to determine the uncorrected basis weight of the matrix material in the context of the coated radiometer 110 based on a correction factor 337 provided by the coated radiometer 110. For example, the coated radiometer 110 is configured to transmit a matrix material correction factor as part of a correction factor 337 specific to the coated radiometer 110. The matrix material correction factor enables controller 332 to determine the uncorrected basis weight of the matrix material as if determined by the coated radiometer 110. Controller 332 may determine the uncorrected basis weight of the matrix material (UNCORRECTED_BASIS_WEIGHT) for example, according to equation (3). BASE ):

[0071] (3) Among them, CORRECTED_BASIS_WEIGHT BASE It is the calibrated basis weight of the matrix material provided by the basis weight meter 330, and CORRECTION_FACTOR BASE This is the correction factor corresponding to the substrate material of the coated basity meter 110. Once the uncorrected basis weight relative to the substrate material of the coated basity meter 110 is determined, the uncorrected basis weight relative to the coating material of the coated basity meter 110 can be determined. The uncorrected basis weight (UNCORRECTED_BASIS_WEIGHT) of the coating material is determined according to equation (4). COATING ):

[0072] (4) UNCORRECTED_BASIS_WEIGHT COATING =UNCORRECTED_BASIS_WEIGHTCOATED -UNCORRECTED_BASIS_WEIGHT BASE

[0073] Among them, UNCORRECTED_BASIS_WEIGHT COATED It is the uncorrected basis weight of the coated material as provided by the coated radiation basometer 110, and UNCORRECTED_BASIS_WEIGHT BASE The uncorrected basis weight of the matrix material is determined by controller 332 based on correction factor 337 corresponding to the coated radiation gravimeter 110. Controller 332 may include components such as those used with... Figure 6 The forms shown and described are relevant. Although Figure 6 A sample controller 332 is provided, but it should be noted that the scope of this disclosure is not limited to this. Figure 6 The example shown.

[0074] like Figure 3 Further described, the example coating basis weight measurement system 300 is configured to generate a calibrated basis weight 334 for the coating material. The calibrated basis weight 334 corresponds to the calibrated basis weight of the coating material disposed on the surface of the substrate material. The calibrated basis weight 334 for the coating material can be detected by determining the uncalibrated basis weight of the substrate material against the background of the coating radiation tilometer 110. For example, the uncalibrated basis weight of the coating material can be multiplied by a coating material calibration factor corresponding to the coating radiation tilometer 110, as shown in equation (5):

[0075] (5) CORRECTED_BASIS_WEIGHT COATING =UNCORRECTED_BASIS_WEIGHT COATING *CORRECTION_FACTOR COATING

[0076] Among them, CORRECTED_BASIS_WEIGHT COATING This is the corrected basis weight of the coating material, UNCORRECTED_BASIS_WEIGHT. COATING It is the uncorrected basis weight of the coated material generated by the coated radiation tachometer 110, and CORRECTION_FACTOR COATING This is the coating material correction factor corresponding to the coated radiation gravimeter 110. For example, as shown in equation (2), the coating material correction factor can be determined first, and then the operation can be performed.

[0077] Now for reference Figure 4 An example implementation of a coating basis weight measurement system 400, including an upstream radiation turbidimeter 440 and a downstream radiation turbidimeter 110, is provided. Figure 4 The depicted upstream treadmill 440 includes a radiation source 440a and a radiation detector 440b, the detector being positioned to detect the basis weight of the substrate material 104 before the coating material 106 is applied by the coating apparatus 102. The downstream treadmill 110 includes a radiation source 110a and a radiation detector 110b, the detector being positioned to detect the basis weight of the coated material 108 after the coating apparatus 102 has applied the coating material 106 to the substrate material 104. A controller 332 is configured to receive a correction factor 337 and an uncorrected basis weight 338 of the coated material from the downstream treadmill 110. The controller 332 is also configured to receive a corrected basis weight 442 of the substrate material from the upstream treadmill 440. The controller 332 determines a corrected basis weight 334 of the coating material based on the correction factor 337, the uncorrected basis weight 338 of the coated material, and the corrected basis weight 442 of the substrate material.

[0078] like Figure 4 The illustrated example coating basis weight measurement system 400 includes an upstream radiation treadmill 440. The upstream radiation treadmill 440 uses a radiation source 440a and a radiation detector 440b to direct measurement particles toward a substrate material 104. The upstream radiation treadmill 440 can determine the basis weight of the substrate material 104 using the absorption and scattering of the measurement particles. The upstream radiation treadmill 440 is calibrated separately from the downstream radiation treadmill 110 and can be configured according to a different set of correction factors. Therefore, the upstream radiation treadmill 440 determines the calibrated basis weight 442 of the substrate material according to its own correction factors. The calibrated basis weight 442 indicates the actual weight of the substrate material 104 as determined by the upstream radiation treadmill 440. The upstream radiation treadmill 440 transmits the calibrated basis weight 442 to a controller 332 to assist in determining the calibrated basis weight 334 of the coating material.

[0079] like Figure 4 Further described, the example coating basis weight measurement system 400 includes a downstream radiation treadmill 110. The downstream radiation treadmill 110 is configured to measure the basis weight of the coated material 108 after the coating apparatus 102 has deposited the coating material 106 onto the substrate material 104. The downstream radiation treadmill 110 is calibrated separately from the upstream radiation treadmill 440 and can be configured according to a different set of correction factors 337. The correction factors 337 of the downstream radiation treadmill 110 include a substrate material correction factor and a coating material correction factor. (As described above...) Figure 1As described, a matrix material correction factor can be determined based on a sample of the matrix material before proceeding with the operation. Similarly, a coating material correction factor can be determined based on samples of both the matrix material and the coating material. The correction factor 337 of the downstream radiation gravimeter 110 is transmitted to the controller 332 to assist in determining the corrected gravimetric weight 334 of the coating material.

[0080] like Figure 4 Further described, the downstream radiation tregister 110 is configured to generate an uncalibrated basis weight 338 for the coated material. This uncalibrated basis weight 338 corresponds to the weight determined by the downstream radiation tregister 110 before a calibration factor has been applied. The uncalibrated basis weight 338 depends on the calibration performed on the downstream radiation tregister 110. The downstream radiation tregister 110 provides the uncalibrated basis weight 338 for the coated material, along with a calibration factor 337, to the controller 332.

[0081] As with Figure 4 As further described, the example coating basis weight measurement system 400 includes a controller 332 configured to receive a calibrated basis weight 442 of the substrate material from an upstream radiation tregometer 440, an uncalibrated basis weight 338 of the coated material from a downstream radiation tregometer 110, and a correction factor 337 from the downstream radiation tregometer 110. (As described above...) Figure 3 As described herein, controller 332 is configured to determine the uncorrected basis weight of the matrix material in the context of downstream tilometer 110 based on a correction factor 337 provided by downstream tilometer 110. The matrix material correction factor of downstream tilometer 110 enables controller 332 to determine the uncorrected basis weight of the matrix material as if determined by downstream tilometer 110.

[0082] As with Figure 3 As further described herein, the uncorrected basis weight of the coating material can be determined by calculating the difference between the uncorrected basis weight of the coating material and the uncorrected basis weight of the substrate material. The uncorrected basis weight of the coating material approximates the output of the downstream radiation pyrometer 110, as if the coating material were exposed alone to the measuring particles transmitted by the radiation source 110a.

[0083] The controller 332 also determines the corrected basis weight 334 of the coating material by applying a coating material correction factor to the uncorrected basis weight of the coating material.

[0084] Now for reference Figure 5An example method 500 is provided for determining the corrected basis weight (e.g., corrected basis weight 334) of a coating material (e.g., coating material 106 on a substrate material (e.g., substrate material 104)). At block 502, a controller (e.g., controller 332) receives the corrected basis weight (e.g., corrected basis weight 442) of the substrate material. The corrected basis weight represents the actual weight of the substrate material as determined by a radiometric tachometer. In some embodiments, a second radiometric tachometer (e.g., upstream radiometric tachometer 440) may be positioned to detect the basis weight of the substrate material before the coating material is applied. In such cases, the second radiometric tachometer may apply a calibrated correction factor specific to the upstream radiometric tachometer to determine the corrected basis weight of the substrate material. However, in some embodiments, an alternative representation of the actual basis weight of the substrate material may be provided. For example, the actual basis weight of the base material can be obtained before operation and input into the coating basis weight measurement system (e.g., coating basis weight measurement system 300, 400) using an input mechanism.

[0085] At box 504, the controller determines the uncalibrated basis weight of the substrate material corresponding to the radiation tachometer (e.g., radiation tachometer 110) based on the calibrated basis weight of the substrate material. The coating basis weight measurement system determines the uncalibrated basis weight of the substrate material based on the received calibrated basis weight of the substrate material. The uncalibrated basis weight of the substrate material is associated with a radiation tachometer positioned to measure coated materials (e.g., coated material 108). Therefore, if the radiation tachometer directly measures the substrate material, the determined uncalibrated basis weight of the substrate material is approximately the same as the uncalibrated basis weight that would be generated by a radiation tachometer positioned to measure coated materials. The uncalibrated basis weight of the substrate material can be determined by dividing the calibrated basis weight of the substrate material by the substrate material calibration factor corresponding to the radiation tachometer positioned to measure coated materials, as shown in equation (3). For example, the substrate material calibration factor corresponding to the radiation tachometer positioned to measure coated materials can be determined by a calibration process prior to operation.

[0086] At block 506, the controller receives the uncorrected basis weight of the coated material (e.g., uncorrected basis weight 338 of the coated material) from a radiation tylene meter, wherein the radiation tylene meter is configured to direct the measurement particles to the coated material, which includes both the substrate material and the coating material, and to determine the uncorrected basis weight of the coated material (e.g., uncorrected basis weight 338 of the coated material) based on the number of measurement particles received at a radiation detector (e.g., radiation detector 110b). After the coating material is applied to the substrate material, the radiation tylene meter, positioned close to the coated material, determines the uncorrected basis weight of the coated material using the principles of absorption and scattering. The uncorrected basis weight of the coated material is the uncorrected basis weight of the coated material generated by the radiation tylene meter positioned to measure the coated material before applying a correction factor. Therefore, both the uncorrected basis weight of the coated material and the uncorrected basis weight of the substrate material represent the uncorrected basis weight generated or to be generated by the radiation tylene meter positioned to measure the coated material before applying a correction factor.

[0087] At box 508, the controller determines the calibrated basis weight of the coating material based on the difference between the uncalibrated basis weight of the coating material and the uncalibrated basis weight of the substrate material, as well as the coating material calibration factor. By determining the uncalibrated basis weights of the coating material and the substrate material in the context of a tibial barometer positioned to measure the coating material, the uncalibrated basis weight of the coating material can be determined simply by subtraction at the tibial barometer positioned to measure the coating material. For example, as shown in equation (4). Alternatively, the calibrated basis weight of the coating material can be determined by multiplying the uncalibrated basis weight of the coating material by the coating material calibration factor corresponding to the tibial barometer positioned to measure the coating material, for example, as shown in equation (5).

[0088] Now for reference Figure 6 , Figure 6 An example controller 332 according to at least some example embodiments of the present disclosure is shown. Controller 332 includes a processor 602, an input / output circuitry 604, a data storage medium 606, and a communication circuitry 608. In some embodiments, controller 332 is configured to perform and implement the operations described herein using one or more of the circuitry groups 602, 604, 606, and 608.

[0089] While the components are described with respect to functional limitations, it should be understood that a particular implementation must include the use of specific computing hardware. It should also be understood that in some implementations, certain components described herein include similar or common hardware. For example, two circuit system groups may utilize the same processor, network interface, storage medium, etc., to perform their associated functions, such that each circuit system group does not require duplicate hardware. Therefore, it should be understood that the term "circuit system," as used herein with respect to components of the apparatus described herein, includes specific hardware configured to perform functions associated with a particular circuit system described herein.

[0090] Specifically, the term "circuit system" should be broadly understood to include hardware, and in some embodiments, to include software used to configure the hardware. For example, in some embodiments, "circuit system" includes processing circuitry, storage media, network interfaces, input / output devices, etc. Alternatively or additionally, in some embodiments, other elements of controller 332 provide or supplement the functionality of other specific groups of circuitry. For example, in some embodiments, processor 602 provides processing functionality to any group of circuitry, data storage medium 606 provides storage functionality to any group of circuitry, communication circuitry 608 provides network interface functionality to any group of circuitry, etc.

[0091] In some embodiments, processor 602 (and / or a coprocessor or any other processing circuitry system that assists the processor or is otherwise associated with the processor) communicates with data storage medium 606 via a bus for transferring information between components of controller 332. In some embodiments, for example, data storage medium 606 is non-transitory and may include, for example, one or more volatile and / or non-volatile memories. In other words, for example, in some embodiments, data storage medium 606 includes or embodies an electronic storage device (e.g., a computer-readable storage medium). In some embodiments, data storage medium 606 is configured to store information, data, content, applications, instructions, etc., that enable controller 332 to perform various functions according to example embodiments of this disclosure.

[0092] Processor 602 may be embodied in several different ways. For example, in some example embodiments, processor 602 includes one or more processing devices configured to execute independently. Additionally or alternatively, in some embodiments, processor 602 includes one or more processors configured in series via a bus to enable independent execution of instructions, pipelined processes, and / or multithreading. The terms “processor” and “processing circuitry system” should be understood to include single-core processors, multi-core processors, multiple processors within controller 332, and / or one or more remote processors or “cloud” processors external to controller 332.

[0093] In example embodiments, processor 602 is configured to execute instructions stored in data storage medium 606 or otherwise accessible to the processor. Alternatively or additionally, in some embodiments, processor 602 is configured to perform hard-coded functionality. Thus, whether configured by hardware or software methods, or by a combination thereof, processor 602 represents an entity (e.g., physically embodied in circuit form) capable of performing operations according to embodiments of this disclosure. Alternatively or additionally, as another example, in some example embodiments, when processor 602 is specifically embodied as an executor of software instructions, the instructions specifically configure processor 602 to execute the algorithms described herein in specific operations when executing such instructions.

[0094] In some embodiments, controller 332 includes an input / output circuitry system 604 that provides output to a user and, in some embodiments, receives indications of user input. In some embodiments, the input / output circuitry system 604 communicates with processor 602 to provide such functionality. Input / output circuitry system 604 may include one or more user interfaces (e.g., user interfaces) and, in some embodiments, includes a display that includes an interface presented as a web user interface, application user interface, user device, or backend system, etc. Processor 602 and / or the input / output circuitry system 604 including the processor may be configured to control one or more functions of one or more user interface elements via computer program instructions (e.g., software and / or firmware) stored in processor-accessible memory (e.g., data storage medium 606, etc.). In some embodiments, input / output circuitry system 604 includes or utilizes user-oriented applications to provide input / output functionality to client devices and / or other displays associated with a user.

[0095] In some embodiments, controller 332 includes a communication circuitry 608. Communication circuitry 608 includes any component, such as a device or circuitry specifically embodied in hardware or a combination of hardware and software, configured to receive and / or transmit data from / to a network and / or to / from any other device, circuitry, or module communicating with controller 332. In this regard, for example, in some embodiments, communication circuitry 608 includes a network interface for enabling communication with wired or wireless communication networks. Additionally or alternatively, in some embodiments, communication circuitry 608 includes one or more network interface cards, antennas, buses, switches, routers, modems, and any other supporting hardware, firmware, and / or software, or devices suitable for enabling communication via one or more communication networks. Additionally or alternatively, communication circuitry 608 includes circuitry for interacting with antennas and / or other hardware or software to transmit signals via the antenna or to process signals received via the antenna. In some embodiments, communication circuitry 608 enables the transmission of data to and / or the reception of data from client devices communicating with controller 332.

[0096] Additionally or alternatively, in some embodiments, one or more of the circuit system groups 602 to 608 are combinable. Additionally or alternatively, in some embodiments, one or more of the circuit system groups perform some or all of the aforementioned functionalities associated with another component. For example, in some embodiments, one or more groups of circuit systems 602 to 608 are combined into a single module embodied in hardware, software, firmware, and / or combinations thereof. Similarly, in some embodiments, one or more of the circuit system groups are combined such that processor 602 performs one or more of the operations described above individually for each of these circuit systems.

[0097] Those skilled in the art will recognize many modifications and other embodiments of the invention set forth herein, which benefit from the teachings presented in the foregoing description and associated drawings. Although the drawings show only certain components of the apparatus and systems described herein, it should be understood that various other components may be used in conjunction with the system. Therefore, it should be understood that the invention is not limited to the specific embodiments disclosed, and modifications and other embodiments are intended to be included within the scope of the appended claims. Furthermore, the steps in the described methods may not necessarily occur in the order depicted in the drawings, and in some cases, one or more of the depicted steps may occur substantially simultaneously, or additional steps may be involved. Although specific terms are used herein, they are used only in a general and descriptive sense and not for limiting purposes.

[0098] Although various embodiments based on the principles disclosed herein have been shown and described above, modifications can be made by those skilled in the art without departing from the spirit and teachings of this disclosure. The embodiments described herein are representative only and not intended to be limiting. Many variations, combinations, and modifications are possible and are within the scope of this disclosure. For example, those skilled in the art will recognize that such principles can be applied to any coated material in which the atomic weights of the base material and the coating material are different. Alternative embodiments obtained by merging, integrating, and / or omitting features of the embodiments are also within the scope of this disclosure. Therefore, the scope of protection is not limited by the foregoing statements.

[0099] Additionally, the section headings used herein are intended to be consistent with the recommendations of 37C.FR1.77 or otherwise provide organizational clues. These headings should not limit or characterize any invention that may be set forth in any of the claims disclosed in this disclosure.

[0100] The use of broad terms such as “comprising,” “including,” and “having” should be understood to provide support for narrower terms such as “consisting of,” “substantially composed of,” and “substantially constituted by.” The use of terms such as “optionally,” “may,” “possibly,” and “capable,” relating to any element of the implementation, implies that the element is not essential, or alternatively, that the element is essential, both of which are within the scope of the implementation. Furthermore, references to examples are for illustrative purposes only and are not intended to be exclusive.

Claims

1. A system comprising: A radiation gravimeter configured to direct measurement particles to a coated material comprising a matrix material and a coating material, and to determine the uncorrected basis weight of the coated material based on the number of measurement particles received at a radiation detector; and The controller is configured to: Determine the uncorrected basis weight of the matrix material based on its basis weight; and The corrected basis weight of the coating material is determined based on the difference between the uncorrected basis weight of the coated material and the uncorrected basis weight of the substrate material, as well as the correction factor of the coating material.

2. The system according to claim 1, wherein, Based on the matrix material correction factor, the uncorrected basis weight of the matrix material is determined, wherein the matrix material correction factor represents the ratio of the actual basis weight of the matrix material to the uncorrected basis weight of the matrix material.

3. The system according to claim 1, wherein, The correction factor for the coating material is determined based on the following ratios: (1) the difference in corrected basis weight between the corrected basis weight of the coating material and the corrected basis weight of the substrate material; and (2) the difference in uncorrected basis weight between the uncorrected basis weight of the coating material and the uncorrected basis weight of the substrate material.

4. The system according to claim 1, wherein, The correction factor for the coating material was determined based on X-ray computer modeling.

5. The system according to claim 1, wherein, The atomic weight of the coating material is different from that of the base material.

6. The system according to claim 5, wherein, At least one of the atomic weights of the coating material and the substrate material is at least twice the atomic weight of the other.

7. The system according to claim 1, wherein, The coated material is used as the anode for the battery cell.

8. The system according to claim 1, wherein, The radiation basis meter includes a β-transmitter.

9. The system according to claim 1, wherein, The radiation gravimeter includes an X-ray transilluminator.

10. The system according to claim 1, further comprising: A second radiation gravimeter is configured to direct a measuring particle to the matrix material and to determine the matrix material gravimeter based on the calibrated gravimeter of the matrix material.

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