HIL automatic test system based on multipath optical coupling isolation relay protection

Abstract

The invention belongs to the technical field of automatic test and safety protection, and particularly relates to an HIL automatic test system based on multipath optical coupling isolation relay protection, which comprises an HIL automatic test cabinet, an IO board card and an IO measurement board card are integrated in the HIL automatic test cabinet, and a tested module is arranged in a test circuit between the IO board card and the IO measurement board card. The HIL automatic test cabinet is connected with the power supply module in an external control manner, the multiple groups of optical coupling isolation relay modules are connected in parallel on multiple channels of the IO board card, and each group of optical coupling isolation relay module is also connected in series between the power supply module and the tested module. The optical coupling isolation relay module replaces the IO board card to work in the test of the tested module so as to realize complete isolation protection of the IO board card, and meanwhile, surge protection of the IO measurement board card is realized in a shunting mode, so that a high-precision control mode and a millisecond-level response function of the system are reserved, and the overall load capacity of the system is improved on the basis of low cost.

Description

Technical Field

[0001] This invention belongs to the field of automated testing and safety protection technology, and specifically relates to a HIL automated testing system based on multi-channel optocoupler isolation relay protection. Background Technology

[0002] With the rapid development of automotive electronics technology, Hardware-In-the-Loop (HIL) testing plays an increasingly important role in the development of automotive electronic control systems. Traditional HIL bench protection schemes often use mechanical relays or solid-state relays for direct control, which has the following technical drawbacks: 1. Insufficient electrical isolation makes the high-voltage circuit prone to interfering with the control circuit, affecting test accuracy and system stability; 2. The response speed is slow and cannot meet the requirements for rapid protection at the millisecond level, which may cause equipment damage under extreme operating conditions; 3. Limited number of channels and poor scalability make it difficult to meet the needs of simultaneous testing of multiple circuits; 4. It has weak anti-interference ability and is prone to malfunction in strong electromagnetic environments, which affects the reliability of the test.

[0003] In addition, the real-time processors and I / O boards for the HIL bench are expensive, costing up to tens of thousands of yuan.

[0004] In existing HIL testing, relays are typically integrated into I / O boards or used as standalone modules that only provide switching functionality.

[0005] This invention proposes an automated HIL testing system based on multi-channel optocoupler isolation relay protection. This system effectively protects test bench equipment from damage and enables precise control of the testing process, demonstrating significant technological innovation and practicality. Summary of the Invention

[0006] The technical problem to be solved by this invention is that the HIL automated testing system has insufficient isolation and protection effect, response speed, channel expansion and anti-interference ability, and the stability and security of the HIL automated testing system are limited during testing operations.

[0007] Therefore, this invention provides an automated HIL test system based on multi-channel optocoupler isolation relay protection. The multi-channel optocoupler isolation relay module is creatively connected in series in the test circuit. Through the high voltage and high current characteristics of the multi-channel optocoupler isolation relay module, a physical isolation barrier is formed to protect the IO board from high voltage / high current damage.

[0008] The technical solution adopted by this invention to solve its technical problem is: The HIL automated test system based on multi-channel optocoupler isolation relay protection includes an HIL automated test cabinet. In the prior art, the HIL automated test cabinet integrates IO boards, IO measurement boards, etc. The module under test is set on the test circuit led out from the IO board in the HIL automated test cabinet, and the data of the module under test is transmitted back to the HIL automated test cabinet through the IO measurement board on the test circuit.

[0009] The above is the circuit setup for a standard HIL automated test system. The surge current generated at the moment the circuit is turned on can damage the IO board and the IO measurement board.

[0010] To protect the IO board and IO measurement board, an optocoupler isolation relay module is connected in series in the circuit between the IO board channel and the module under test. The IO board controls the power supply to the optocoupler isolation relay module on the channel through its built-in board relay, causing it to work. At the same time, during the test, the optocoupler isolation relay module replaces the IO board in supplying current, so that the current no longer flows through the IO board during the test, thereby achieving isolation protection for the IO board. In addition, the optocoupler isolation relay module can also shunt current to the IO measurement board to achieve protection for the IO measurement board.

[0011] If the I / O boards and I / O measurement boards in a conventional HIL automated test system are directly replaced with optocoupler isolation relay modules, they can only perform circuit switching functions, losing the high-precision control mode and millisecond-level response capability of the boards. This solution, by connecting optocoupler isolation relay modules in series in the channel, protects the I / O boards and I / O measurement boards while retaining their high-precision control mode and millisecond-level response capability.

[0012] Furthermore, the HIL automated test cabinet is externally connected to a power module, which is used to supply power to the module under test. At the same time, the optocoupler isolation relay module is connected in series between the power module and the module under test, and the IO board is used to control the on / off operation of the optocoupler isolation relay module.

[0013] With the above settings, the current in the power module is directly supplied to the module under test through the conducting optocoupler isolation relay module, so that the current no longer flows through the IO board, thus forming a physical isolation barrier.

[0014] Furthermore, the IO board has multiple channels, and each channel is equipped with a set of board relays and a set of optocoupler isolation relay modules; Each pair of channels is connected to a group of the modules under test. One of the channels, through an optocoupler isolation relay module, is directly connected in series with the circuit between the power module and the module under test, replacing the I / O board. This protects the I / O board from damage without reducing the accuracy of the test. Meanwhile, the other channel, through the optocoupler isolation relay module, shunts the current in the circuit where the I / O measurement board is located, thereby avoiding the damage that the surge current generated at the moment the hard-wired circuit is turned on may cause to the I / O measurement board.

[0015] When multiple groups of modules need to be tested, twice the number of channels are required to achieve multi-channel optical coupler isolation protection.

[0016] Furthermore, the IO measurement board is connected in series between the module under test and the power module to monitor data such as the current of the module under test.

[0017] The IO measurement board sends the data back to the automated test cabinet for processing.

[0018] Furthermore, the withstand voltage and limiting current of the optocoupler isolation relay module are both greater than the maximum voltage and maximum current values ​​of the IO board and IO measurement board. Simultaneously, the optocoupler isolation relay module has a wide operating temperature range and excellent performance in supporting stable operation under strong electromagnetic environments. By using a low-cost optocoupler isolation relay module, not only is the safety and stability of the system effectively protected, but the overall load capacity is also improved compared to the original system.

[0019] Furthermore, the HIL automated test cabinet is also connected to a host computer. The HIL automated test cabinet accesses the equipment simulation model, and the host computer activates the automated test program loaded thereon, simulating the interaction between the equipment CAN signal and the HIL automated test cabinet.

[0020] The IO measurement board sends the data back to the automated test cabinet for processing, and then displays the test data and results on the host computer interface.

[0021] Furthermore, the power module is a programmable power supply, integrated into the testing system, and controlled by computer software to achieve unattended complex testing processes, thereby improving testing efficiency and consistency.

[0022] The beneficial effects of this invention are: 1. Through multi-channel optocoupler isolation design, the control circuit where the IO board and IO measurement board are located is electrically isolated and shunt from the high-voltage test circuit where the module under test is located. The response speed ensures that the protection action time is ≤1ms, which can quickly cut off the fault circuit and avoid equipment damage. 2. The multi-channel independent design can protect multiple test circuits simultaneously and supports multi-circuit collaborative testing under complex operating conditions; 3. The opto-isolation characteristic significantly improves the system's resistance to electromagnetic interference, enabling it to operate stably even in strong electromagnetic environments and reducing the malfunction rate; 4. The design with no mechanical contacts results in a long service life and low maintenance costs, making it suitable for the long-term continuous testing needs of HIL benches. 5. Modular design, easy to expand and maintain, the number of channels can be increased or protection parameters can be adjusted according to actual testing needs; 6. Supports automated test script invocation, which can be integrated into the HIL test process to improve test efficiency and reliability. Attached Figure Description

[0023] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0024] Figure 1 This is a schematic diagram of the structure of the present invention.

[0025] Figure 2 This is the control logic diagram of the present invention. Detailed Implementation

[0026] The invention will now be described in further detail with reference to the accompanying drawings. These drawings are simplified schematic diagrams, illustrating only the basic structure of the invention and therefore showing only the components relevant to the invention. It should be noted that, unless otherwise specifically stated, the relative arrangement, numerical expressions, and values ​​of the components and steps set forth in these embodiments do not limit the scope of this disclosure.

[0027] It should also be understood that, for ease of description, the dimensions of the various parts shown in the accompanying drawings are not drawn to actual scale. The following description of at least one exemplary embodiment is merely illustrative and is in no way intended to limit this disclosure or its application or use.

[0028] Techniques, methods, and apparatus known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and apparatus should be considered part of the specification. In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values.

[0029] In the description of this invention, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential," etc., indicating orientation or positional relationships, are based on the orientation or positional relationships shown in the accompanying drawings and are only for the convenience of describing the invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the invention. Furthermore, features defined with "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this invention, unless otherwise stated, "a plurality of" means two or more.

[0030] It should be noted that similar labels and letters in the following figures indicate similar items; therefore, once an item is defined in one figure, it does not need to be discussed further in subsequent figures.

[0031] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.

[0032] HIL testing is widely used in automotive electronics, aerospace, energy systems, and other fields. It is particularly suitable for verifying test scenarios that are difficult to achieve or costly in real-world vehicle environments, such as extreme weather conditions, system failure simulations, and high-risk operations. The modules under test include, but are not limited to, controllers.

[0033] Reference Figure 1 The HIL automated test system based on multi-channel optocoupler isolation relay protection includes a HIL automated test cabinet and a host computer. The host computer communicates with the HIL automated test cabinet via CAN signals. The host computer is also pre-loaded with test management and automated test programs to control the system. The HIL automated test cabinet is connected to a device simulation model. Depending on the device simulation model, the test management and automated test programs loaded on the host computer will change accordingly.

[0034] The test circuit of the HIL automated test cabinet contains I / O boards, modules under test (DUTs), and I / O measurement boards. The HIL automated test cabinet is equipped with a programmable power supply, which serves as the power module for the entire test system. The power module is connected to multiple relays on the I / O boards to supply power to the DUTs. I / O measurement boards are also connected in series between the power module and the DUTs to monitor data such as the DUTs' current. The I / O measurement boards transmit data back to the HIL automated test cabinet for processing. The processed data is then displayed on the host computer interface via CAN signals, showing the test data and results. Under normal circumstances, the I / O boards and I / O measurement boards are located on the control circuit. However, when the DUTs are high-voltage power components, they are located on the high-voltage test circuit. The surge current generated when the test circuit is activated can damage the I / O boards and I / O measurement boards.

[0035] To mitigate the surge current generated during the instantaneous conduction of hard-wired circuits, this solution incorporates optocoupler isolation relay modules on multiple channels of the I / O board. Each channel also includes a board-based relay, with its contacts connected to the terminals of the optocoupler isolation relay modules. These modules are also connected in series between the module under test (DUT) and the positive terminal of the power supply module. Furthermore, two optocoupler isolation relay modules in each channel are simultaneously connected to a set of DUT modules. During testing, one optocoupler relay module replaces the I / O board in direct series connection to the circuit. This allows the power supply module to supply DC current to the DUT without passing through the I / O board, protecting the I / O board from damage without compromising test accuracy. The remaining optocoupler relay module shunts the current in the I / O measurement board's circuit, further mitigating the surge current generated during the instantaneous conduction of hard-wired circuits.

[0036] The board relay controls the power supply of the optocoupler isolation relay module set on each channel according to the hard-wired signal issued by the IO board. That is, after the board relay is closed, it causes the optocoupler isolation relay module on the corresponding channel to work, and then the optocoupler isolation relay on the corresponding channel is also closed, realizing the circuit conduction.

[0037] Optical isolation relays installed on multiple channels form multiple circuits in parallel to enable testing of multiple modules under test.

[0038] Reference Figure 1 The optocoupler isolation relay module consists of an optocoupler relay module and an optocoupler relay switch.

[0039] It should be noted that the optocoupler isolation relay module can be implemented using existing technology, so its specific structure will not be described in detail in this solution.

[0040] The optocoupler isolation relay module uses high-performance components, featuring low loss and high isolation voltage. Its low-power design ensures fast response and high reliability, guaranteeing rapid power cut-off or load adjustment in abnormal situations, achieving complete electrical isolation between channels. This embodiment uses the JQC-3FF-SZ model optocoupler isolation relay module as an example, with the VT2820 I / O board and VT2816 I / O measurement board as examples. Each channel of the optocoupler isolation relay module has a load capacity of AC250V / 10A and DC30V / 10A, both exceeding the maximum voltage (60V) and maximum current (6A) of the VT2820 I / O board and VT2816 I / O measurement board, respectively. The optocoupler isolation relay module operates within a temperature range of -40℃ to 85℃, supporting stable operation in strong electromagnetic environments. By using a low-cost optocoupler isolation relay module, the safety and stability of the HIL test bench are effectively protected, and the load capacity of the entire test system is improved.

[0041] In this embodiment, a whole vehicle simulation model is used as the equipment simulation model, and the host computer enables the corresponding automated test program to simulate the whole vehicle CAN signal.

[0042] Reference Figure 1 , Figure 2 The specific operation includes the following steps: Step 1. Before the test begins, connect the circuit: Connect the negative terminals of all components in the system to the negative terminal of the power supply module. Connect one board relay (1a-1b) of the VT2820 board in series between the positive terminal of the power supply module and one optocoupler isolation relay module (N1, the optocoupler relay module and the optocoupler relay switch are integrated in the circuit, and are referred to as optocoupler isolation relay module below). Connect terminal 1a to the positive terminal of the power supply module and terminal 1b to the VCC terminal of the optocoupler isolation relay module (N1). When the VT2820 board relay (1a-1b) is closed, the circuit is connected and the optocoupler isolation relay module (N1) starts to work. Connect the positive terminal of the input terminal of position lamp 1 in the module under test to the NC terminal of the optocoupler isolation relay module (N1). Connect the COM terminal of the optocoupler isolation relay module (N1) to the power supply module. After the optocoupler isolation relay module (N1) works, position lamp 1 is connected to the power supply and the position lamp 1 lights up.

[0043] Step 2. Connect the current monitoring channel: Connect the negative terminals of all components in the system to the negative terminal of the power supply module. Connect one relay (2a-2b) of the VT2820 board in series between the positive terminal of the power supply module and one optocoupler isolation relay module (N2). Connect terminal 2a to the positive terminal of the power supply module and terminal 2b to the VCC terminal of the optocoupler isolation relay module (N2). When the VT2820 board relay (2a-2b) is closed, the circuit is turned on and the optocoupler isolation relay module (N2) starts working. Use one current measurement channel (Cin 1a-Cin 1b) of the VT2816 board. Connect terminal Cin 1a in series to the NC terminal of the optocoupler isolation relay module (N2) and terminal Cin 1b in series to the input terminal of position lamp 1. When the circuit is turned on, the loop current can be monitored in real time.

[0044] It is important to note that, Figure 2 The intermediate circuit 1 is GND - positive power supply - (1a-1b) - N1 - positive position light - GND; the intermediate circuit 2 is GND - positive power supply - (2a-2b) - N2 - positive position light - GND.

[0045] Step 3. The host computer controls the VT2820 board via CAN commands, starts the automated test script, and controls the VT2820 board relays to disconnect. Since the two optocoupler isolation relay modules (N1, N2) are not powered on, the optocoupler isolation relay modules are in a non-conducting state, and position light 1 is in a non-powered state. When the VT2820 board relays (1a-1b) close, the circuit is connected, the optocoupler isolation relay module (N1) closes, and position light 1 lights up. At the moment when position light 1 lights up, the entire circuit 1 will generate a momentary current of more than ten amperes. The circuit 1 is set to avoid the momentary current burning out the VT2820.

[0046] Step 4. After 5 seconds of circuit 1 being conducted, the T2820 board relays (2a-2b) close, the circuit is completed, the optocoupler isolation relay module (N2) closes, and position light 1 remains lit; at this time, both circuit 1 and circuit 2 remain conducted; the T2820 board relays (1a-1b) open, circuit 1 is broken, the optocoupler isolation relay module (N1) opens, and VT2816 (Cin 1a-Cin 1b) monitors the operating current of position light 1.

[0047] Step 5. VT2816 (Cin 1a-Cin 1b) transmits the detected current back to the host computer; the host computer judges the current by comparing it with the preset alarm value of the automated test program. If the preset alarm value is reached, the host computer controls the VT2820 board relay to disconnect, thereby protecting the test system.

[0048] Step 6. By repeating steps 1-5, you can add multiple VT2820 board relays ((2X-1)a-(2X-1)b) and ((2X)a-(2X)b), VT2816 (Cin Xa-Cin Xb), optocoupler relay modules (N(2x-1)) and (N(2x)), and optocoupler relay switches (N(2x-1)) and (N(2x)) to achieve simultaneous testing of multiple position lights (position lights X).

[0049] Step 7. The host computer outputs the test report.

[0050] Step 8. The script can repeatedly execute the above test steps to perform aging tests according to the configuration, maximizing the use of the test equipment and demonstrating flexibility.

[0051] This concludes the detailed description of the HIL automated test system based on multi-channel optocoupler isolation relay protection according to this disclosure. To avoid obscuring the concept of this disclosure, some details known in the art have not been described. Those skilled in the art will fully understand how to implement the technical solutions disclosed herein based on the above description.

[0052] Based on the above-described preferred embodiments of the present invention, and through the foregoing description, those skilled in the art can make various changes and modifications without departing from the inventive concept. The technical scope of this invention is not limited to the contents of the specification, but must be determined by the scope of the claims.

Claims

1. A HIL automation test system based on multi-path optical coupling isolation relay protection, comprising a HIL automation test cabinet, an IO board card and an IO measurement board card are integrated in the HIL automation test cabinet, and a measured module is arranged in a test circuit between the IO board card and the IO measurement board card, characterized in that, Also include A power module, which is connected to the HIL automation test cabinet outside control, and is used to supply power to the measured module; A plurality of groups of optocoupler isolation relay modules are connected in parallel on the multi-channel of the IO board card, and each group of optocoupler isolation relay modules is connected in series between the power module and the measured module; The optocoupler isolation relay module is used to supply current from the power module to the measured module without the IO board card when testing the measured module, so as to realize the isolation protection of the IO board card, and the optocoupler isolation relay module is also used to shunt the IO measurement board card during testing, so as to realize the surge protection of the IO measurement board card.

2. The HIL automation test system based on the multi-path optical coupling isolation relay protection of claim 1, wherein, The board card relay of the IO board card is also distributed on each channel, and the board card relays on the same channel are connected in series with the optocoupler isolation relay module.

3. The HIL automation test system based on multi-path opto-coupler isolation relay protection of claim 2, wherein, The optocoupler isolation relay modules on every two channels are connected with a group of measured modules, and the optocoupler isolation relay modules in the two channels are used to realize the protection of the IO board card and the IO measurement board card respectively.

4. The HIL automation test system based on multi-path opto-coupler isolation relay protection of claim 2, wherein, The board card relay controls the working state of the optocoupler isolation relay module arranged on each channel according to the hard-wired signal.

5. The HIL automation test system based on multi-path opto-coupler isolation relay protection of claim 1, wherein, The IO measurement board card is connected in series between the power module and the measured module, and the IO measurement board card is connected with a plurality of groups of measured modules through its multi-channel.

6. The HIL automation test system based on multi-path opto-coupler isolation relay protection of claim 1, wherein, The power module is a programmable power supply.

7. The HIL automation test system based on multi-path opto-coupler isolation relay protection of claim 5, wherein, The HIL automation test cabinet interacts with the upper computer through the can signal, and the upper computer is used to call the test degree.

8. The HIL automation test system based on multi-path opto-coupler isolation relay protection of claim 7, wherein, The HIL automation test cabinet is also used to access the device simulation model.

9. The HIL automation test system based on multi-path opto-coupler isolated relay protection of claim 1, wherein, The optocoupler isolation relay module selects a high-performance device with low loss and high isolation voltage characteristics.

10. The HIL automated test system based on multi-channel opto-coupler isolated relay protection of claim 9, wherein, The withstand voltage value and the limit current of the optocoupler isolation relay module are greater than the maximum voltage value and the maximum current value of the IO board card and the IO measurement board card.

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