Sensitivity calibration device for high-temperature piezoelectric sensitive element

Abstract

The invention belongs to the technical field of piezoelectric element testing, and particularly relates to a high-temperature piezoelectric sensitive element sensitivity calibration device which comprises a frame, a plurality of test benches vertically arranged in the height direction of the frame at equal intervals, a heating unit in the frame, a measuring circuit, a processing unit and prompt units on the test benches. Each test board is provided with a piezoelectric element fixing seat and a force applying device, the measuring circuit is connected with the fixing seat to collect output signals, the processing unit calculates sensitivity deviation and temperature deviation and obtains a reminding coefficient by establishing a unified reference and calibrating the measuring circuit, periodically collecting the output signals and temperature data, and when the coefficient meets a preset condition, the force applying device is started. And the control prompt unit gives an adjustment instruction, and after adjustment, resetting and data recording are performed. The device realizes multi-element synchronous calibration through parallel layout of multiple test benches and independent temperature control, combines temperature and attitude real-time compensation, not only improves calibration efficiency, but also guarantees calibration precision, and is suitable for sensitivity calibration of piezoelectric sensitive elements in a high-temperature environment.

Description

Technical Field

[0001] This invention relates to the field of piezoelectric element testing technology, and in particular to a sensitivity calibration device for high-temperature piezoelectric sensitive elements. Background Technology

[0002] Piezoelectric sensing elements are widely used in sensors, actuators, and other devices, and their sensitivity is a key performance parameter. Sensitivity calibration is usually performed at room temperature, but many applications involve high-temperature environments, such as aerospace, automotive engines, and industrial heat treatment. The performance of piezoelectric elements can change significantly at high temperatures, including sensitivity drift, temperature dependence, and the effects of thermal stress; therefore, accurate calibration in high-temperature environments is necessary.

[0003] In existing technologies, high-temperature calibration devices are typically simple in structure, lack the ability to calibrate multiple components simultaneously, and rely on manual operation, resulting in low efficiency and poor consistency. High-temperature environments introduce problems such as temperature gradients, thermal drift, and material expansion, affecting calibration accuracy. Existing devices lack automatic compensation, intelligent prompts, and data analysis functions, leading to unreliable calibration results and poor traceability.

[0004] Therefore, there is an urgent need in this field for a device that can automatically, accurately, and efficiently calibrate the sensitivity of high-temperature piezoelectric components in order to solve the above-mentioned technical bottlenecks. Summary of the Invention

[0005] Based on the technical problems existing in the prior art, this invention proposes a high-temperature piezoelectric sensing element sensitivity calibration device.

[0006] The high-temperature piezoelectric sensing element sensitivity calibration device proposed in this invention includes: A frame; multiple test stands arranged vertically at equal intervals along the height of the frame; a heating unit disposed inside the frame for providing a high-temperature environment; each test stand including a piezoelectric element holder and a force applicator mounted on a test base; a measurement circuit connected to each piezoelectric element holder for measuring the output signal of the piezoelectric element; a processing unit connected to the measurement circuit and the force applicator; and a prompting unit disposed on each test stand and connected to the processing unit. The processing unit is configured as follows: a. Establish a unified geometric and temperature reference, and calibrate the measurement circuit under no-load and load conditions, and preset the sensitivity deviation threshold and the shortest dwell time; b. Periodically collect the piezoelectric element output signals and temperature data from each test bench; c. Calculate the current sensitivity based on the output signal, and calculate the sensitivity deviation between the current sensitivity and the reference sensitivity, as well as the temperature deviation between the current temperature and the set temperature; d. Calculate the alert coefficient by weighted summation of the sensitivity deviation and the temperature deviation, and compare the alert coefficient with a preset threshold; e. When the reminder coefficient continuously exceeds the preset threshold and reaches the predetermined minimum dwell time, a prompt instruction containing the adjustment direction and adjustment amount is generated, and the prompt unit on the target test bench is controlled to provide a prompt. f. After the adjustment is completed, execute the reset procedure and record the relevant data of this calibration event to non-volatile memory; The processing unit is programmed to implement a complete set of automated calibration control logic. It first performs system initialization and benchmark establishment, laying a unified judgment standard for the entire calibration process. Subsequently, it periodically collects and monitors data, not only acquiring raw electrical signals but also calculating the deviations of key performance indicators (sensitivity, temperature) in real time. By introducing a comprehensive alert coefficient, multiple influencing factors (such as sensitivity deviation and temperature deviation) are quantified and integrated into a single decision indicator, improving the comprehensiveness and accuracy of the judgment. Its decision-making mechanism incorporates time-dimensional stability judgment, namely "continuously exceeding the threshold and reaching the shortest dwell time," effectively filtering out instantaneous interference and making the final prompt instructions (including adjustment of direction and value) more reliable. Finally, the device has event closed-loop management capabilities. After each calibration event is completed, the system is reset and complete data is recorded, ensuring process traceability and providing support for subsequent data analysis and parameter optimization.

[0007] Preferably, the force applicator includes a piezoelectric actuator and a force sensor, and the processing unit is further configured to control the piezoelectric actuator based on feedback from the force sensor to apply a precise force value; The force applicator itself constitutes a high-precision closed-loop control system. The piezoelectric actuator is responsible for performing precise micro-displacements to generate force, while the force sensor monitors the actual output force value in real time. The processing unit dynamically adjusts the drive signal by comparing the set force value with the feedback force value, ensuring that the force applied to the piezoelectric element always maintains high precision and high repeatability, thus guaranteeing the accuracy of sensitivity calibration from the source.

[0008] Preferably, each of the test benches integrates a temperature sensor, and the processing unit is configured to: perform temperature compensation on the sensitivity based on the data from the temperature sensor, and determine the temperature uniformity; The temperature sensor integrated into each test station enables accurate local temperature measurement. The processing unit uses this data to perform two key functions: first, to perform temperature compensation on the calculated sensitivity to eliminate the influence of temperature changes on the piezoelectric output itself and obtain a more realistic sensitivity value; second, to monitor the temperature field uniformity of the heating unit. If the temperature of a certain test station deviates abnormally from the set value, the processing unit can identify it as a source of deviation and reflect it in the prompt instruction.

[0009] Preferably, the processing unit is configured to calculate the sensitivity deviation by: acquiring the instantaneous sensitivity of the current cycle, and taking the average value of the instantaneous sensitivity of multiple consecutive cycles as the current sensitivity; calculating the relative deviation between the current sensitivity and a pre-stored reference sensitivity as the sensitivity deviation. The method for calculating sensitivity deviation by the processing unit takes into account both real-time performance and stability. By calculating instantaneous sensitivity, it can respond quickly to changes. By averaging data from multiple consecutive cycles (e.g., 10 cycles, approximately 1 ms), it effectively smooths out random noise and obtains a stable current sensitivity. Finally, by calculating the relative deviation from the pre-stored reference sensitivity, the judgment criteria are normalized to adapt to piezoelectric elements with different sensitivity levels.

[0010] Preferably, the processing unit is configured to generate prompt instructions in the following ways: continuously monitoring the reminder coefficient, and only confirming the need to generate a prompt instruction when it continuously exceeds the preset threshold and reaches the preset minimum dwell time; the adjustment direction is determined based on the relationship between the sensitivity deviation and the temperature deviation: if the sensitivity deviation is dominant, prompting to check the component or recalibrate; if the temperature deviation is dominant, prompting to adjust the temperature control. The logic for generating prompts emphasizes "stability and accuracy." The continuous monitoring and dwell judgment mechanism embodies "stability," while the logic for preventing false alarms and adjusting the direction is the core of "accuracy." By analyzing the main sources of deviation (whether it is a component performance problem or an ambient temperature problem), it provides clear and targeted operational guidance rather than a general alarm, greatly improving the effectiveness of prompts and operational efficiency.

[0011] Preferably, the adjustment amount is a discrete integer step size, the magnitude of which is determined by the over-threshold amplitude and the normalized sensitivity deviation, and an upper limit constraint is applied to this value; the processing unit generates a prompt instruction based on the adjustment direction and the integer step size; The quantization process of the adjustment amount (loop step size) embodies intelligent decision-making. The processing unit maps the continuous, simulated deviation signal (over-threshold amplitude, normalized sensitivity deviation) into a discrete, executable integer step size through a linear quantization model. The upper limit constraint ensures the safety of the operation and prevents over-adjustment due to excessive single deviation. This makes the prompts not only directional but also quantitative, which can directly guide the operation.

[0012] Preferably, the processing unit is further configured to: after the prompt instruction is issued, the system enters a latching state, in which no new prompts are repeatedly generated until the operation execution result is received or the safe clearing time is reached; The latching state design is an effective anti-interference mechanism. Once a valid prompt instruction is issued, the processing unit will temporarily "ignore" the continuous triggering of the same problem until the operator completes the adjustment or the system waits for a timeout. This avoids the prompt unit from flashing or beeping frequently during the adjustment period and improves the human-computer interaction experience.

[0013] Preferably, the device further includes an attitude sensor, and the processing unit is configured to: compensate for the direction of the force applied by the force applicator based on the attitude information output by the attitude sensor, so as to ensure that the force is always perpendicular to the surface of the piezoelectric element; The introduction of attitude sensors solves the problem of difficulty in ensuring absolute verticality during actual installation. The processing unit reads attitude information (such as tilt angle), calculates the angle between the direction of the actual applied force and the ideal normal, and performs cosine compensation on the force sensor reading accordingly to obtain the true normal force acting on the surface of the piezoelectric element, thus eliminating the system error introduced by installation tilt.

[0014] Preferably, the heating unit includes multiple independently temperature-controlled heating zones, each heating zone corresponding to one test bench, and the processing unit is configured to perform independent PID control on each heating zone; The multi-zone independent temperature control architecture enables the device to handle complex situations. The processing unit runs an independent PID control algorithm for each heating zone, which can accurately adjust the power of the corresponding heater based on the feedback from the respective temperature sensors. This ensures that even if the heat load of each test bench is different, the temperature uniformity and stability of the entire working space can be maintained, thus guaranteeing the consistency of parallel calibration.

[0015] Preferably, the data recording module integrated in the processing unit is configured to record the prompt direction, adjustment step size, sensitivity deviation and temperature deviation before and after adjustment, peak value and duration of the reminder coefficient during the calibration process; The data logging module is key to achieving traceability. The processing unit not only records the final result, but also the prompt direction, adjustment step size, key parameters before and after adjustment (sensitivity deviation, temperature deviation), as well as the peak value and duration during the event. This complete data chain allows each calibration event to be reviewed in detail afterward, which can be used to analyze the cause of failure, optimize calibration parameters (such as threshold, dwell time), and meet the quality system's requirements for inspection and test records.

[0016] Compared with the prior art, the present invention provides a high-temperature piezoelectric sensing element sensitivity calibration device, which has the following beneficial effects: By employing a multi-test bench layout and independent temperature control, parallel calibration of multiple components is achieved, improving efficiency; temperature and attitude sensors provide real-time compensation to ensure calibration accuracy.

[0017] The processing unit calculates the alert coefficient based on a weighted algorithm, and combines it with a dwell time judgment mechanism to avoid false triggers and make the alerts more reliable.

[0018] The traffic lights provide intuitive guidance and reduce manual intervention; data recording supports traceability and analysis, facilitates parameter tuning, and the device has a robust structure and a clamping mechanism that is easy to install and adapts to industrial environments. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the first angle structure of the high-temperature piezoelectric sensitive element sensitivity calibration device proposed in this invention; Figure 2 This is a schematic diagram of the second angle structure of the high-temperature piezoelectric sensitive element sensitivity calibration device proposed in this invention; Figure 3 This is a schematic diagram of the test bench structure of the high-temperature piezoelectric sensitive element sensitivity calibration device proposed in this invention; Figure 4 This is a control flowchart of the high-temperature piezoelectric sensitive element sensitivity calibration device proposed in this invention.

[0020] In the diagram: 1. Frame; 2. Test bench; 3. Heating unit; 4. Piezoelectric element holder; 5. Force applicator; 6. Measurement circuit; 7. Test base; 8. Indication unit; 9. Temperature sensor; 10. Base; 11. Clamping mechanism. Detailed Implementation

[0021] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments.

[0022] In the description of this invention, it should be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention.

[0023] Example 1, referring to Figures 1-3 The high-temperature piezoelectric sensitive element sensitivity calibration device consists of a frame 1, a test platform 2, a heating unit 3, a piezoelectric element fixing seat 4, a force applicator 5, a measurement circuit 6, a test base 7, a processing unit, a prompting unit 8, a temperature sensor 9, a base 10, a clamping mechanism 11, and an attitude sensor 12.

[0024] The frame 1 is made of stainless steel rectangular profile, with a height of approximately 1.2m and a width of approximately 0.5m. The test benches 2 are arranged equidistantly along the height of the frame, with a spacing of 0.2m. Each test bench 2 includes a piezoelectric element mounting base 4 and a force applicator 5. The force applicator 5 includes, but is not limited to, a piezoelectric stack drive. The force sensor has a range of 0–100N and an accuracy of ±0.1%. The heating unit 3 includes, but is not limited to, a ceramic heater with zoned temperature control, a temperature range of room temperature–500°C, and an accuracy of ±1°C. The measurement circuit 6 integrates a charge amplifier and a voltage amplifier with a sampling rate of 1kHz. The processing unit includes, but is not limited to, an ARM Cortex-M7 microprocessor with a storage module and a data logging module. The prompting unit 8 includes, but is not limited to, an RGB LED indicator light. The temperature sensor 9 includes, but is not limited to, a K-type thermocouple. The base 10 includes, but is not limited to, a cast iron platform. The clamping mechanism 11 includes, but is not limited to, a G-type clamp. The attitude sensor 12 includes, but is not limited to, an MPU-6050 six-axis sensor.

[0025] Working process: The piezoelectric element to be tested is installed on the piezoelectric element fixing base 4 and fixed by the clamping mechanism 11. The target temperature is set, the heating unit 3 heats up to a stable temperature, the force applicator 5 applies a standard force, the measuring circuit 6 collects the output, the processing unit calculates the sensitivity and compares it, and the result is indicated by the indicator light. The whole process is automated and supports parallel calibration of multiple elements.

[0026] Example 2, refer to Figure 4 A high-temperature piezoelectric sensing element sensitivity calibration device, wherein the processing unit is configured to perform the following steps: Step S1: System Initialization and Calibration After the device is powered on, it enters the initialization phase to establish a unified geometric, temperature and electrical reference. Taking the center of the piezoelectric element fixing seat 4 of each test bench 2 as the origin, the direction of force application is defined as the Z-axis to establish a local coordinate system. The local coordinate system is aligned with the gravity direction of the world coordinate system through the attitude quaternion output by the attitude sensor 12 to ensure that the direction of force application is consistent with the direction of gravity, and to provide a unified reference for calibration under different installation attitudes. After coordinate alignment is completed, the system registers sensor and channel information. The measurement circuit 6 of each test station 2 contains multiple channels for acquiring the charge and voltage output of the piezoelectric element. The total number of channels is denoted as K, and the sequence number of each channel is marked as k=1,2,…,K. A mapping table from hardware to logic channels is established, and time synchronization detection is performed. A unified control period Ts=10ms is set to ensure that data from multiple channels enters a circular buffer with the same time base. Then, no-load calibration is performed. Under no external force applied, raw output data is continuously collected for a period of time, and the zero-point bias bk and noise level σk of each channel are calculated. The zero-point bias bk refers to the steady-state output value when there is no input, and the noise level σk refers to the standard deviation of the random fluctuations of the output. The no-load calibration formula is as follows: in, Let N be the i-th sample value of the k-th channel, and N be the number of sampling points. If the noise σk of a certain channel exceeds the preset limit, the system determines that the channel is abnormal and prompts for maintenance. After completing the no-load calibration, perform the load calibration by applying a known standard force Fstd through force applicator 5, recording the piezoelectric output Vout or Qout, and calculating the sensitivity coefficient K. Voltage sensitivity:

[0027] Charge sensitivity:

[0028] During the calibration process, the linear range and saturation point are checked simultaneously, and abnormal channels are isolated. Temperature calibration is performed using temperature sensor 9. The load calibration is repeated at different temperature points Tj to establish a sensitivity-temperature model. Where K0 is the sensitivity at reference temperature T0, and γ is the temperature coefficient; The system has preset threshold parameters: sensitivity deviation threshold HS, temperature deviation threshold HT, minimum dwell time Tmin=1s, and safe clear time Tclear=2s. All parameters are stored in non-volatile memory.

[0029] Step S2: Data Acquisition and Signal Processing The system synchronously acquires the piezoelectric output signals, temperature data, and attitude data of each test station 2 at a control cycle Ts, and performs baseline removal and normalization processing on the raw output: Apply first-order low-pass filtering to smooth the data: Where α = 0.8 is the smoothing coefficient; Based on the tilt angle θ output by attitude sensor 12, the actual applied force is corrected: , where Fapplied is the force sensor reading; Calculate the instantaneous sensitivity for the current cycle: Voltage sensitivity:

[0030] Charge sensitivity:

[0031] Step S3: Sensitivity Calculation and Bias Determination The system calculates the average sensitivity based on data from M=10 consecutive periods: Calculate the sensitivity deviation ΔS and temperature deviation ΔT: Where Sref is the reference sensitivity and Tset is the set temperature. Calculate the reminder coefficient Q: Where w1=0.7 and w2=0.3 are weighting coefficients, if Q exceeds the preset threshold H=0.1, the system enters the pre-prompt state.

[0032] Step S4: Residential Determination and Prompt Generation The system continuously monitors the alert coefficient Q. Only when Q continuously exceeds the threshold H and reaches the minimum dwell time Tmin will a prompt command be generated. The prompt command includes adjusting the direction and the amount of adjustment. The adjustment direction is determined based on the source of the deviation: if ΔS>ΔT, the prompt is "Check components or recalibrate"; if ΔT>ΔS, the prompt is "Adjust temperature"; if both are high, the prompt is "Comprehensive adjustment". The adjustment amount is quantized using a ring-level step size Δk, and the over-threshold amplitude is recorded. Tightness Index Then the nominal step size is: Where k0=1 is the minimum ring step size base, kQ=0.5 is the over-threshold amplitude quantization gain, kT=0.5 is the tightness exponential quantization gain, and the actual step size is processed by rounding and saturation: Where, round(·) is the rounding function; clip(x,1,Kmax) restricts x to the interval [1,Kmax]; Kmax=3 is the maximum step size; After the prompt command is issued, the indicator light on target test bench 2 flashes, with the color depending on the deviation type: red indicates sensitivity deviation, yellow indicates temperature deviation, and purple indicates overall deviation. The system enters latching mode and will not be triggered again within Tclear.

[0033] Step S5: Reset and Record When the adjustment is complete or the safe clearing time is reached, the system performs a reset: clears the over-threshold count, releases the latch state, and records the event data to non-volatile memory, including: prompt direction and step size, sensitivity deviation ΔS and temperature deviation ΔT before and after adjustment, peak value and duration of the reminder coefficient Q, and channel health status.

[0034] If a channel fault or temperature exceeding the limit is detected during data acquisition, the system enters conservative mode: the threshold H is increased, the step size Δk is reduced, only directional prompts are provided, and alarms continue until the fault is resolved.

[0035] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0036] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.

[0037] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0038] In addition, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.

[0039] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A high-temperature piezoelectric sensitive element sensitivity calibration device, characterized in that, include: Framework (1); Multiple test benches (2) are arranged vertically at equal intervals along the height direction of the frame (1); A heating unit (3) is disposed inside the frame (1) to provide a high-temperature environment; Each of the test benches (2) includes a piezoelectric element holder (4) and a force applicator (5) mounted on a test base (7); The measuring circuit (6) is connected to each of the piezoelectric element holders (4) and is used to measure the output signal of the piezoelectric element; The processing unit is connected to the measuring circuit (6) and the force applicator (5); A prompting unit (8) is provided on each of the test benches (2) and connected to the processing unit; The processing unit is configured as follows: a. Establish a unified geometric and temperature reference, and perform no-load and load calibration on the measurement circuit (6), and preset the sensitivity deviation threshold and the shortest dwell time; b. Periodically collect the piezoelectric element output signals and temperature data of each test bench (2); c. Calculate the current sensitivity based on the output signal, and calculate the sensitivity deviation between the current sensitivity and the reference sensitivity, as well as the temperature deviation between the current temperature and the set temperature; d. Calculate the alert coefficient by weighted summation of the sensitivity deviation and the temperature deviation, and compare the alert coefficient with a preset threshold; e. When the reminder coefficient continuously exceeds the preset threshold and reaches the predetermined minimum dwell time, a prompt instruction containing the adjustment direction and adjustment amount is generated, and the prompt unit (8) on the target test bench (2) is controlled to provide a prompt. f. After the adjustment is completed, execute the reset procedure and record the relevant data of this calibration event to non-volatile memory.

2. The high-temperature piezoelectric sensitive element sensitivity calibration device according to claim 1, characterized in that, The force applicator (5) includes a piezoelectric actuator and a force sensor, and the processing unit is further configured to control the piezoelectric actuator based on feedback from the force sensor to apply a precise force value.

3. The high-temperature piezoelectric sensitive element sensitivity calibration device according to claim 1, characterized in that, Each of the test benches (2) is equipped with a temperature sensor, and the processing unit is configured to: perform temperature compensation on the sensitivity based on the data of the temperature sensor, and determine the temperature uniformity.

4. The high-temperature piezoelectric sensitive element sensitivity calibration device according to claim 1, characterized in that, The processing unit is configured to calculate the sensitivity deviation by: acquiring the instantaneous sensitivity of the current cycle and taking the average value of the instantaneous sensitivity of multiple consecutive cycles as the current sensitivity; and calculating the relative deviation between the current sensitivity and a pre-stored reference sensitivity as the sensitivity deviation.

5. The high-temperature piezoelectric sensitive element sensitivity calibration device according to claim 1, characterized in that, The processing unit is configured to generate prompt instructions in the following ways: continuously monitoring the reminder coefficient, and only confirming the need to generate a prompt instruction when it continuously exceeds the preset threshold and reaches the preset minimum dwell time; the adjustment direction is determined based on the relationship between the sensitivity deviation and the temperature deviation: if the sensitivity deviation is dominant, prompting to check the component or recalibrate; if the temperature deviation is dominant, prompting to adjust the temperature control.

6. The high-temperature piezoelectric sensitive element sensitivity calibration device according to claim 5, characterized in that, The adjustment amount is a discrete integer step size, the magnitude of which is determined by the over-threshold amplitude and the normalized sensitivity deviation, and an upper limit constraint is imposed on this value; the processing unit generates a prompt instruction based on the adjustment direction and the integer step size.

7. The high-temperature piezoelectric sensitive element sensitivity calibration device according to claim 1, characterized in that, The processing unit is further configured to: after the prompt instruction is issued, the system enters a latching state, in which no new prompts are repeatedly generated until the operation execution result is received or the safe clearing time is reached.

8. The high-temperature piezoelectric sensitive element sensitivity calibration device according to claim 1, characterized in that, The device also includes an attitude sensor, and the processing unit is configured to compensate for the direction of the force applied by the force applicator (5) based on the attitude information output by the attitude sensor, so as to ensure that the force is always perpendicular to the surface of the piezoelectric element.

9. The high-temperature piezoelectric sensitive element sensitivity calibration device according to claim 1, characterized in that, The heating unit (3) includes multiple independently temperature-controlled heating zones, each heating zone corresponding to a test bench (2), and the processing unit is configured to perform independent PID control on each heating zone.

10. The high-temperature piezoelectric sensitive element sensitivity calibration device according to claim 1, characterized in that, The data recording module integrated in the processing unit is configured to record the prompt direction, adjustment step size, sensitivity deviation and temperature deviation before and after adjustment, peak value and duration of the reminder coefficient during the calibration process.

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