Loading device for radioactive sample TEM-3DAP combined characterization

Abstract

The invention provides a loading device for radioactive sample TEM-3DAP combined characterization. The loading device comprises a loading sample fixing table, a sample clamping mechanism and a guide structure, the sample clamping mechanism is used for clamping an FIB carrying net with a radioactive three-dimensional atom probe tip sample; the sample clamping mechanism comprises a first clamping part and a second clamping part, the first clamping part is arranged on the second clamping part and rotates relative to the second clamping part, and the second clamping part is arranged on the loading sample fixing table, so that the sample clamping mechanism is mounted on the loading sample fixing table; the guide structure is arranged on the loading sample fixing table and is used for guiding the FIB carrying net with the radioactive three-dimensional atom probe tip sample to slide to the second clamping part. The guiding structure and the sample clamping mechanism form a guiding and positioning integrated channel, and the sample clamping mechanism rapidly clamps an FIB carrier net with a radioactive three-dimensional atom probe tip sample, so that the sample loading difficulty is greatly reduced, and the sample loading time is shortened.

Description

Technical Field

[0001] This application belongs to the field of post-irradiation detection and microscopic characterization technology of nuclear fuel and materials, specifically relating to a loading device for TEM-3DAP joint characterization of radioactive samples. Background Technology

[0002] In the field of material microstructure characterization, the combined technique of three-dimensional atomic probe microanalysis (3DAP), transmission electron microscopy (TEM), and focused ion beam scanning electron microscopy (FIB-SEM) has become a core method for resolving the atomic-level composition, structure, and property relationships of materials. The technique of using focused ion beam (FIB) to fabricate needle-shaped samples of 3D APs using FIB scanning electron microscopy is becoming increasingly mature. The method of fabricating 3D AP tips for radioactive samples, welding them onto an FIB grid, performing TEM first, and then characterizing them with 3D AP provides a new approach for comprehensively understanding the microstructure of materials.

[0003] Typically, the needle-shaped samples used for transmission electron microscopy and three-dimensional atom probe observation are relatively small in size, which makes sample loading difficult and operation time long. Summary of the Invention

[0004] Therefore, the purpose of this application is to provide a loading device for TEM-3DAP joint characterization of radioactive samples, which at least solves one of the technical problems mentioned in the background art.

[0005] To address the aforementioned issues, this application provides a loading device for joint TEM-3DAP characterization of radioactive samples, comprising a sample loading stage, a sample clamping mechanism, and a guiding structure. The sample clamping mechanism is used to clamp a FIB grid with a radioactive three-dimensional atomic probe tip sample. The sample clamping mechanism includes a first clamping part and a second clamping part, the first clamping part being disposed on the second clamping part and rotating relative to the second clamping part, and the second clamping part being disposed on the sample loading stage, so that the sample clamping mechanism is mounted on the sample loading stage. The guiding structure is disposed on the sample loading stage, and the guiding structure is used to guide the FIB grid with the radioactive three-dimensional atomic probe tip sample to slide onto the second clamping part.

[0006] Optionally, the surface of the first clamping part is provided with a pressure block, and the surface of the second clamping part is provided with a groove. The groove is used to place the FIB carrier with the radioactive three-dimensional atomic probe tip sample, so that the pressure block presses the FIB carrier with the radioactive three-dimensional atomic probe tip sample tightly.

[0007] Optionally, the sample clamping mechanism further includes a support shaft, the two ends of which are bent and disposed on the second clamping part. The surface of the first clamping part is provided with an ear seat, which is rotatably mounted on the support shaft so that the first clamping part rotates relative to the second clamping part with the support shaft as the rotation center.

[0008] Optionally, the sample clamping mechanism further includes an elastic element, which is sleeved on the support shaft. One end of the elastic element is fixed to the first clamping part, and the other end is fixed to the second clamping part, so that the first clamping part and the second clamping part cooperate to clamp the FIB carrier with the sample containing the radioactive three-dimensional atomic probe tip.

[0009] Optionally, the sample loading stage has a positioning groove on its surface, and the second clamping part of the sample clamping mechanism is disposed in the positioning groove so that the first clamping part is located outside the positioning groove.

[0010] Optionally, the guide structure includes at least two FIB mesh loading grooves, which are disposed within the positioning groove and are used to slide the FIB mesh with the sample containing the radioactive three-dimensional atomic probe tip onto the groove.

[0011] Optionally, when the FIB grid with the radioactive three-dimensional atomic probe tip sample is placed on the FIB grid loading groove, the lower surface of the FIB grid with the radioactive three-dimensional atomic probe tip sample is flush with the bottom surface of the groove.

[0012] Optionally, the sample clamping mechanism further includes a clamping handle, which is disposed at the end of the second clamping part and is used to fix the second clamping part in the positioning groove.

[0013] Optionally, the surface of the first clamping part is provided with a pressing groove.

[0014] Optionally, the loading device further includes a sample loading station base, wherein the sample loading station is disposed on the sample loading station base.

[0015] By employing the above technical solution, the present invention has at least the following beneficial effects:

[0016] This application provides a loading device for TEM-3DAP joint characterization of radioactive samples. The guiding structure and the sample clamping mechanism form an integrated channel for guidance and positioning, guiding the FIB grid with the radioactive three-dimensional atomic probe tip sample to move accurately to the clamping position. By pressing the first clamping part with a screwdriver or flat-head tweezers, the FIB grid with the radioactive three-dimensional atomic probe tip sample can be smoothly guided by the guiding structure to slide onto the second clamping part. Then, the first clamping part and the second clamping part cooperate to clamp the FIB grid with the radioactive three-dimensional atomic probe tip sample, which greatly reduces the sample loading difficulty and shortens the sample loading time. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of the loading device for TEM-3DAP joint characterization of radioactive samples according to an embodiment of this application.

[0018] Figure 2 This is a schematic diagram of the sample clamping mechanism of the loading device for TEM-3DAP joint characterization of radioactive samples according to an embodiment of this application.

[0019] Figure 3 This is a disassembled schematic diagram of the sample clamping mechanism of the loading device for TEM-3DAP joint characterization of radioactive samples according to an embodiment of this application.

[0020] Figure 4 This is a top view of the loading device structure for the joint TEM-3DAP characterization of radioactive samples according to an embodiment of this application;

[0021] Figure 5 This is a front view of the loading device structure for the joint TEM-3DAP characterization of radioactive samples according to an embodiment of this application;

[0022] Figure 6 This is a structural test diagram of the loading device for the joint TEM-3DAP characterization of radioactive samples according to an embodiment of this application.

[0023] The reference numerals in the attached figures are as follows:

[0024] 1. Sample mounting base; 11. Sample mounting platform; 111. Positioning pin; 12. Positioning groove; 121. FIB carrier loading slide.

[0025] 2. Sample clamping mechanism; 21. First clamping part; 211. Pressure block; 212. Pressing groove; 22. Elastic element; 23. Second clamping part; 231. Arc-shaped groove; 24. Clamping handle; 25. Pin hole;

[0026] 3. FIB grid with sample containing radioactive three-dimensional atomic probe tip. Detailed Implementation

[0027] In the description of this application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limiting the present invention.

[0028] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this invention, "a plurality of" means two or more, unless otherwise explicitly specified.

[0029] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0030] The preferred embodiments of the present invention will be described below with reference to the accompanying drawings. It should be understood that the preferred embodiments described herein are for illustration and explanation only and are not intended to limit the present invention.

[0031] See also Figures 1 to 6 As shown in the embodiments of this application, a loading device for TEM-3DAP joint characterization of radioactive samples is provided, including a sample loading stage 11, a sample clamping mechanism 2, and a guiding structure; the sample clamping mechanism 2 is used to clamp a FIB carrier 3 with a radioactive three-dimensional atomic probe tip sample; the sample clamping mechanism 2 includes a first clamping part 21 and a second clamping part 23, the first clamping part 21 is disposed on the second clamping part 23 and rotates relative to the second clamping part 23, the second clamping part 23 is disposed on the sample loading stage 11, so that the sample clamping mechanism 2 is mounted on the sample loading stage 11; the guiding structure is disposed on the sample loading stage 11, and the guiding structure is used to guide the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample to slide onto the second clamping part 23.

[0032] The guide structure and sample clamping mechanism 2 form an integrated channel for guidance and positioning, guiding the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample to move precisely to the clamping position. By pressing the first clamping part 21 with a screwdriver or flat-head tweezers, the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample can be smoothly guided by the guide structure to slide onto the second clamping part 23. Then, the first clamping part 21 and the second clamping part 23 cooperate to clamp the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample, which greatly reduces the sample loading difficulty and shortens the sample loading time.

[0033] In this embodiment, the sample loading station 11 is a cuboid structure, and the second clamping part 23 is disposed on the sample loading station 11 so that the sample clamping mechanism 2 is installed on the sample loading station 11; that is, the second clamping part 23 is arranged along the length direction of the sample loading station 11 and is detachably installed on the sample loading station 11 by means of pins or screws.

[0034] The sample clamping mechanism 2 includes a first clamping part 21 and a second clamping part 23. The first clamping part 21 is disposed on the second clamping part 23 and rotates relative to the second clamping part 23. That is, when the first clamping part 21 rotates along a first direction, an angle is formed between the first clamping part 21 and the second clamping part 23, which allows the FIB carrier 3 carrying the sample with the radioactive three-dimensional atomic probe tip to slide smoothly onto the second clamping part 23. When the first clamping part 21 rotates along a second direction, the first clamping part 21 and the second clamping part 23 cooperate to hold the sample... The FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample is clamped on the second clamping part 23; the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample can slide smoothly into the second clamping part 23 along the length direction, reducing the impact or displacement of the tip sample during loading, and reducing the risk of falling due to the tilt of the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample; at the same time, the cooperation of the first clamping part 21 and the second clamping part 23 can realize the rapid clamping and fixing of the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample.

[0035] Specifically, in this embodiment, the first direction and the second direction are opposite to each other.

[0036] The guide structure is mounted on the sample mounting stage 11. The guide structure guides the FIB carrier 3 carrying the radioactive three-dimensional atomic probe tip sample to slide onto the second clamping part 23. That is, the guide structure is located on one side of the clamping position of the sample clamping mechanism 2, and the end face of the guide structure is aligned with the second clamping part 23 of the sample clamping mechanism 2, so that the guide structure and the second clamping part 23 are seamlessly connected. When the FIB carrier 3 carrying the radioactive three-dimensional atomic probe tip sample slides onto the second clamping part 23, there is no jamming, further avoiding collisions.

[0037] Specifically, the surface of the guide structure that carries the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample is flush with the surface of the second clamping part 23, that is, the two are on the same horizontal plane, ensuring that the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample slides smoothly onto the second clamping part 23.

[0038] More specifically, the sample loading platform 11, the guide structure, and the sample clamping mechanism 2 are all made of stainless steel, which facilitates assembly and the manufacturing precision can reach more than 0.01 mm.

[0039] In another embodiment, the surface of the first clamping part 21 is provided with a pressure block 211, and the surface of the second clamping part 23 is provided with a groove 231. The groove 231 is used to place the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample, so that the pressure block 211 presses the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample.

[0040] The second clamping part 23 has a groove 231 at its clamping position for placing the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample. After the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample is placed in the groove 231, the sidewall of the groove 231 forms a lateral constraint. Then, the pressure block 211 at the clamping position of the first clamping part 21 presses the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample, forming a vertical clamping force. Combined with the lateral constraint of the groove 231, this achieves a dual fixation effect of vertically fixing and laterally limiting the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample. Even during device transportation (such as from the transmission electron microscope laboratory to the three-dimensional atomic probe laboratory), the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample will not fall out of the clamping area due to bumps, further ensuring sample safety.

[0041] Specifically, the shape of the groove 231 is consistent with the shape of the FIB carrier 3 carrying the sample with the radioactive three-dimensional atomic probe tip, achieving a high degree of morphological matching. Furthermore, in order to effectively apply the vertical clamping force, the pressure block 211 has the same shape as the groove 231.

[0042] In another embodiment, the sample clamping mechanism 2 further includes a support shaft with both ends bent and disposed on the second clamping part 23. The surface of the first clamping part 21 is provided with an ear seat, which is rotatably mounted on the support shaft so that the first clamping part 21 rotates relative to the second clamping part 23 with the support shaft as the rotation center.

[0043] The support shaft is bent at both ends and mounted on the second clamping part 23. In other words, the support shaft is U-shaped and its two ends are bent to fix the support shaft on the second clamping part 23. At the same time, it forms a height difference with the surface of the second clamping part 23, providing rotation space for the rotation of the first clamping part 21.

[0044] Specifically, the support shaft and the groove 231 are arranged opposite to each other on both sides of the second clamping part 23.

[0045] The first clamping part 21 has an ear seat on its surface, which is rotatably mounted on the support shaft. In other words, in order to improve the stability of the connection, the first clamping part 21 has at least two ear seats on its surface, which are fitted onto the support shaft and rotate relative to the support shaft.

[0046] Specifically, the ear seat and the pressure block 211 are arranged opposite each other on both sides of the first clamping part.

[0047] The specific implementation process is as follows: when loading the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample, the support shaft side of the first clamping part 21 is installed so that the first clamping part 21 can rotate relative to the second clamping part 23 in the first direction with the support shaft as the rotation center; after loading is completed, the first clamping part 21 can rotate relative to the second clamping part 23 in the second direction with the support shaft as the rotation center, and press the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample.

[0048] In another embodiment, the sample clamping mechanism 2 further includes an elastic element 22, which is sleeved on the support shaft. One end of the elastic element 22 is fixed to the first clamping part 21, and the other end is fixed to the second clamping part 23, so that the first clamping part 21 and the second clamping part 23 cooperate to clamp the FIB carrier 3 containing the radioactive three-dimensional atomic probe tip sample. The operator only needs to apply external force to the first clamping part 21 with a screwdriver or tweezers to make the first clamping part 21 rotate and open around the axis of the elastic element 22. At this time, the elastic element 22 undergoes torsional deformation and stores energy. After the FIB carrier 3 containing the radioactive three-dimensional atomic probe tip sample is placed in, there is no need to manually press the first clamping part 21. The elastic element 22 releases energy to drive the first clamping part 21 to automatically rotate and precisely fit and close with the second clamping part 23. This avoids the displacement of the FIB carrier 3 containing the radioactive three-dimensional atomic probe tip sample caused by uneven manual closing force in traditional sample loading, and achieves the purpose of reducing sample loading difficulty and rapid loading.

[0049] The second clamping part 23 is provided with a first fixing ring for fixing to one of the arms of the elastic member 22; the first clamping part 21 is provided with a second fixing ring for fixing to the other arm of the elastic member 22. The first fixing ring and the second fixing ring can realize the quick connection and fixation of the elastic member 22 with the first clamping part 21 and the second clamping part 23.

[0050] Specifically, in this embodiment, the elastic element 22 is a torsion spring.

[0051] In another embodiment, a positioning groove 12 is provided on the surface of the sample loading station 11, and the second clamping part 23 of the sample clamping mechanism 2 is disposed in the positioning groove 12 so that the first clamping part 21 is located outside the positioning groove 12.

[0052] The shape of the positioning groove 12 is consistent with the shape of the second clamping part 23, ensuring that the two are highly compatible, and the positioning groove 12 further constrains the position of the second clamping part 23.

[0053] In another embodiment, the guiding structure includes at least two FIB carrier loading grooves 121, which are disposed within the positioning groove 12. The FIB carrier loading grooves 121 are used to slide the FIB carrier 3 carrying the radioactive three-dimensional atomic probe tip sample onto the groove 231. After the operator uses a vacuum pen to place the FIB carrier 3 carrying the radioactive three-dimensional atomic probe tip sample into the FIB carrier loading groove 121, the edge of the FIB carrier 3 carrying the radioactive three-dimensional atomic probe tip sample is constrained by the sidewall of the FIB carrier loading groove 121, and can only move along the linear direction of the FIB carrier loading groove 121, preventing lateral displacement. This avoids the problem of skewing and misalignment of the FIB carrier 3 carrying the radioactive three-dimensional atomic probe tip sample due to uneven manual pushing force, ensuring that the FIB carrier 3 carrying the radioactive three-dimensional atomic probe tip sample can be accurately aligned with the sliding end of the groove 231 of the second clamping part 23, preventing the tip sample from being damaged by collision with device components due to path deviation, and directly improving the loading success rate.

[0054] Among them, the FIB carrier loading groove 121 is a long strip-shaped groove structure, and its groove width and length are precisely matched with the size of the FIB carrier 3 carrying the sample with the tip of the radioactive three-dimensional atomic probe.

[0055] In another embodiment, when the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample is disposed on the FIB carrier loading groove 121, the lower surface of the FIB carrier 3 with the radioactive three-dimensional atomic probe tip sample is flush with the bottom surface of the groove 231.

[0056] The lower surface of the FIB carrier 3 carrying the radioactive three-dimensional atomic probe tip sample is flush with the bottom surface of the groove 231, which allows the FIB carrier 3 carrying the radioactive three-dimensional atomic probe tip sample to slide smoothly onto the groove 231, thereby reducing the difficulty of sample loading and achieving rapid loading.

[0057] In another embodiment, the sample clamping mechanism 2 further includes a clamping handle 24, which is disposed at the end of the second clamping part 23 for fixing the second clamping part 23 in the positioning groove 12. By providing the clamping handle 24 to fix the second clamping part 23 on the positioning groove 12, the clamping position of the second clamping part 23 is isolated from the connection position, avoiding interference with the installation of the second clamping part 23 on the positioning groove 12 due to the presence of the first clamping part 21.

[0058] In this embodiment, the width of the clamping handle 24 is smaller than the width of the second clamping part 23, and a first pin hole 25 is provided on the side of the clamping handle 24 away from the second clamping part 23. Simultaneously, a second pin hole corresponding to the first pin hole 25 is provided at the bottom of the positioning groove 12. The positioning pin 111 passes through the first pin hole 25 and the second pin hole, fixing the clamping handle 24 onto the positioning groove 12, thus fixing the sample clamping mechanism 2 onto the sample loading station 11. In other embodiments, the first pin hole 25 on the second clamping part 23 and the second pin hole on the positioning groove 12 can also be replaced with threaded holes, and the sample clamping mechanism 2 can be fixed onto the sample loading station 11 by screw connection.

[0059] In another embodiment, a pressing groove 212 is provided on the surface of the first clamping part 21. The pressing groove 212 prevents the first clamping part 21 from slipping when the operator presses it with a screwdriver or flat-head tweezers.

[0060] The pressing groove 212 is provided on the surface of the first clamping part 21 that is away from the mounting ear. In this embodiment, the pressing groove 212 is a circular groove. In other embodiments, anti-slip texture can also be provided on the surface of the first clamping part 21 to prevent slippage during pressing.

[0061] In another embodiment, the loading device further includes a sample loading stage base 1, on which a sample loading stage 11 is disposed.

[0062] The specific implementation process of the loading device is as follows: Using a vacuum suction pen, the FIB carrier 3 containing the radioactive three-dimensional atomic probe tip sample is placed on the FIB carrier loading groove 121. Using antistatic tweezers, the FIB carrier 3 containing the radioactive three-dimensional atomic probe tip sample is slowly moved along the FIB carrier loading groove 121 towards the groove 231 on the second clamping part 23. Using a screwdriver or flat-headed tweezers, external force is applied to the pressing groove 212, causing the first clamping part 21 to rotate and open in the first direction, allowing the FIB carrier 3 containing the radioactive three-dimensional atomic probe tip sample to slide into the groove 231 on the second clamping part 23. The first clamping part 21 is slowly released, and under the action of the elastic potential energy released by the elastic element 22, the first clamping part 21 is driven to rotate in the second direction, closing with the second clamping part 23, and a vertical clamping force is applied to complete the clamping of the FIB carrier 3 containing the radioactive three-dimensional atomic probe tip sample. The entire loading device was transported to the 3D Atomic Probe Laboratory and placed on the sample loading stage of a transmission electron microscope for experimentation. Then, the loading device containing the radioactive 3D Atomic Probe tip sample of the FIB net 3 was removed with tweezers and loaded onto the 3D Atomic Probe transfer clamping stage. After being placed in the loading chamber, subsequent experiments were carried out. This process avoids the 3D Atomic Probe tip sample of the FIB net containing the radioactive 3D Atomic Probe tip sample that may fall off due to repeated sample loading, which could lead to radioactive contamination of the experimental operators and the sample loading table.

[0063] The sample clamping device 2 is used for the rapid clamping of the FIB carrier 3 containing a radioactive three-dimensional atomic probe tip, enabling sequential characterization of the radioactive sample using transmission electron microscopy and the three-dimensional atomic probe. It can rapidly clamp the FIB carrier 3 containing the radioactive three-dimensional atomic probe tip, reducing assembly steps, increasing the probability of successful loading on the first attempt, and effectively reducing the operation time of experimental personnel during sample loading and transportation, thereby reducing the radiation dose to personnel; at the same time, it greatly reduces the difficulty of sample loading and shortens the loading time.

[0064] It will be readily understood by those skilled in the art that the aforementioned advantageous methods can be freely combined and superimposed without conflict.

[0065] The above are merely preferred embodiments of this application and are not intended to limit this application. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this application should be included within the protection scope of this application. The above are merely preferred embodiments of this application. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the technical principles of this application, and these improvements and modifications should also be considered within the protection scope of this application.

Claims

1. A loading device for combined TEM-3DAP characterization of radioactive samples, characterized in that, include: Sample mounting station (11); A sample clamping mechanism (2) is used to clamp a FIB carrier (3) with a sample of a radioactive three-dimensional atomic probe tip. The sample clamping mechanism (2) includes a first clamping part (21) and a second clamping part (23). The first clamping part (21) is disposed on the second clamping part (23) and rotates relative to the second clamping part (23). The second clamping part (23) is disposed on the sample loading station (11) so that the sample clamping mechanism (2) is mounted on the sample loading station (11). A guide structure is provided on the sample loading stage (11) and is used to guide the FIB carrier (3) with the radioactive three-dimensional atomic probe tip sample to slide onto the second clamping part (23).

2. The loading device for TEM-3DAP combined characterization of radioactive samples according to claim 1, characterized in that, The first clamping part (21) has a pressure block (211) on its surface, and the second clamping part (23) has a groove (231) on its surface. The groove (231) is used to place the FIB carrier (3) with the radioactive three-dimensional atomic probe tip sample, so that the pressure block (211) presses the FIB carrier (3) with the radioactive three-dimensional atomic probe tip sample.

3. The loading device for combined TEM-3DAP characterization of radioactive samples according to claim 2, characterized in that, The sample clamping mechanism (2) further includes a support shaft, the two ends of which are bent and disposed on the second clamping part (23). The surface of the first clamping part (21) is provided with an ear seat, which is rotatably mounted on the support shaft so that the first clamping part (21) rotates relative to the second clamping part (23) with the support shaft as the rotation center.

4. The loading device for combined TEM-3DAP characterization of radioactive samples according to claim 3, characterized in that, The sample clamping mechanism (2) further includes an elastic element (22), which is sleeved on the support shaft. One end of the elastic element (22) is fixed on the first clamping part (21), and the other end is fixed on the second clamping part (23), so that the first clamping part (21) and the second clamping part (23) cooperate to clamp the FIB carrier (3) with the sample containing the radioactive three-dimensional atomic probe tip.

5. The loading device for TEM-3DAP combined characterization of radioactive samples according to any one of claims 1 to 4, characterized in that, The sample loading platform (11) has a positioning groove (12) on its surface. The second clamping part (23) of the sample clamping mechanism (2) is disposed in the positioning groove (12) so that the first clamping part (21) is located outside the positioning groove (12).

6. The loading device for combined TEM-3DAP characterization of radioactive samples according to claim 5, characterized in that, The guiding structure includes at least two FIB net loading grooves (121), which are disposed in the positioning groove (12). The FIB net loading grooves (121) are used to slide the FIB net (3) with the radioactive three-dimensional atomic probe tip sample onto the groove (231).

7. The loading device for combined TEM-3DAP characterization of radioactive samples according to claim 6, characterized in that, When the FIB carrier (3) with the radioactive three-dimensional atomic probe tip sample is placed on the FIB carrier loading groove (121), the lower surface of the FIB carrier (3) with the radioactive three-dimensional atomic probe tip sample is flush with the bottom surface of the groove (231).

8. The loading device for combined TEM-3DAP characterization of radioactive samples according to claim 5, characterized in that, The sample clamping mechanism (2) further includes a clamping handle (24), which is disposed at the end of the second clamping part (23) and is used to fix the second clamping part (23) in the positioning groove (12).

9. The loading device for combined TEM-3DAP characterization of radioactive samples according to claim 2, characterized in that, The surface of the first clamping part (21) is provided with a pressing groove (212).

10. The loading device for combined TEM-3DAP characterization of radioactive samples according to claim 1, characterized in that, The loading device further includes a loading sample fixing platform base (1), and the loading sample fixing platform (11) is disposed on the loading sample fixing platform base (1).

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