Double-GM tube fault detection system and method, electronic equipment and storage medium

Abstract

The invention provides a double-GM tube fault detection system and method, electronic equipment and a storage medium, and relates to the technical field of ionizing radiation detection, and the system comprises a single-chip microcomputer, a coincidence circuit and an anti-coincidence circuit. The single-chip microcomputer sends a first preset level signal to the anti-coincidence circuit within a preset time, so that the coincidence circuit stops working, and the anti-coincidence circuit starts working; the anticoincidence circuit obtains the first GM signal and the second GM signal, and sends a first fault detection signal or a second fault detection signal to the single-chip microcomputer according to the first GM signal and the second GM signal; when a first fault detection signal is received, the single-chip microcomputer determines the first GM tube as an abnormal GM tube, and when a second fault detection signal is received, the single-chip microcomputer determines the second GM tube as an abnormal GM tube; and when a second preset level signal is received and the gas collection card is inserted into the measurement chamber, the coincidence circuit starts to work. According to the invention, automatic diagnosis and rapid positioning of faults of the double GM tubes are realized, and the troubleshooting efficiency is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of ionizing radiation detection, in particular to a double GM tube fault detection system and method, electronic equipment and storage medium. BACKGROUND

[0002] GM (Geiger-Miller counter tube) tube as a kind of efficient and economical ionizing radiation detection equipment, has been widely used in medical health, nuclear science research and other fields. Its working principle is based on the interaction of ionizing radiation and gas in the tube, and the measurement of radiation intensity is realized by outputting pulse signal.

[0003] In order to improve the measurement reliability, the existing technology usually adopts double GM tube for electric power radiation measurement. For the structure of double GM tube, the traditional fault detection method cannot quickly locate the specific fault GM tube. When fault diagnosis, it needs to rely on manual disassembly of instrument, measurement of high voltage circuit and GM signal waveform, which is tedious and time-consuming. SUMMARY

[0004] Therefore, the purpose of the present application is to overcome the deficiencies in the prior art, and provide a double GM tube fault detection system, method, electronic equipment and storage medium. The present application provides the following technical solutions: In a first aspect, the present application provides a double GM tube fault detection system, which comprises a single-chip microcomputer, a coincidence circuit and an anticoincidence circuit. The coincidence circuit is electrically connected with the first GM tube, the second GM tube and the single-chip microcomputer respectively. The anticoincidence circuit is electrically connected with the first GM tube, the second GM tube and the single-chip microcomputer respectively. In response to the fault detection requirement, the single-chip microcomputer is used to send a first preset level signal to the anticoincidence circuit within a preset time. The anticoincidence circuit is used to acquire a first GM signal from the first GM tube and a second GM signal from the second GM tube when receiving the first preset level signal, and to judge whether the first GM tube is normal according to the first GM signal and whether the second GM tube is normal according to the second GM signal. If the first GM tube is normal and the second GM tube is abnormal, a first fault detection signal is sent to the single-chip microcomputer. If the first GM tube is abnormal and the second GM tube is normal, a second fault detection signal is sent to the single-chip microcomputer. The coincidence circuit is used to enter working mode when receiving a second preset level signal, and to read the data of two GM tubes detecting the gas collection card when the gas collection card is inserted into the measurement chamber. The single-chip microcomputer is configured to determine the second GM tube as an abnormal GM tube when the first fault detection signal is received, and determine the first GM tube as an abnormal GM tube when the second fault detection signal is received.

[0005] In an embodiment, the system further comprises an in-position sensor electrically connected to the single-chip microcomputer. The in-position sensor is configured to send a missing detection signal to the single-chip microcomputer when the gas collecting card is not in position. The single-chip microcomputer is further configured to send the first preset level signal to the anticoincidence circuit within the preset time after receiving the missing detection signal.

[0006] In an embodiment, the anticoincidence circuit is further configured to send a third fault detection signal to the single-chip microcomputer if the first GM tube is abnormal and the second GM tube is abnormal. The single-chip microcomputer is further configured to determine the first GM tube and the second GM tube as abnormal GM tubes respectively when the third fault detection signal is received.

[0007] In an embodiment, the anticoincidence circuit is further configured to send a fourth fault detection signal to the single-chip microcomputer if the first GM tube is normal and the second GM tube is normal. The single-chip microcomputer is further configured to determine the first GM tube and the second GM tube as normal GM tubes respectively when the fourth fault detection signal is received. The single-chip microcomputer is further configured to send the second preset level signal to the coincidence circuit if the fourth fault detection signal is received after the preset time ends.

[0008] In an embodiment, the system further comprises an interaction module electrically connected to the single-chip microcomputer. The single-chip microcomputer is further configured to send a pre-warning signal when determining that the first GM tube is abnormal and / or the second GM tube is abnormal. The interaction module is configured to determine and display pre-warning information according to the pre-warning signal, the pre-warning information comprising identification information and position information of the abnormal GM tube.

[0009] In an embodiment, the system further comprises a power supply, a voltage dividing circuit and an analog-to-digital converter. The power supply is electrically connected to the first GM tube, the second GM tube and the voltage dividing circuit respectively. The voltage dividing circuit is further electrically connected to the analog-to-digital converter. The analog-to-digital converter is further electrically connected to the single-chip microcomputer. The power supply is configured to supply power to the first GM tube and the second GM tube. The voltage dividing circuit is configured to obtain a power supply voltage from the power supply, divide the power supply voltage, and output a divided voltage to the analog-to-digital converter. The analog-to-digital converter is configured to convert the divided voltage into a digital signal and send the digital signal to the single-chip microcomputer. The single-chip microcomputer is configured to determine whether the power supply is normal based on the digital signal. In an embodiment, the determination of whether the power supply is normal based on the digital signal includes: determining the power supply voltage based on the digital signal, determining whether the power supply voltage belongs to a preset voltage range, and determining that the power supply is normal if the power supply voltage belongs to the preset voltage range. If the power supply voltage does not belong to the preset voltage range, it is determined that the power supply is abnormal, and a voltage abnormality signal is sent to the interaction module. In a second aspect, the application provides a double-GM tube fault detection method, which is applied to the double-GM tube fault detection system described in any of the preceding embodiments, and the method includes: In response to a fault detection requirement, the single-chip microcomputer sends a first preset level signal to the anticoincidence circuit within a preset time. When the first preset level signal is received, the anticoincidence circuit obtains a first GM signal from the first GM tube and a second GM signal from the second GM tube, determines whether the first GM tube is normal based on the first GM signal, determines whether the second GM tube is normal based on the second GM signal, sends a first fault detection signal to the single-chip microcomputer if the first GM tube is normal and the second GM tube is abnormal, and sends a second fault detection signal to the single-chip microcomputer if the first GM tube is abnormal and the second GM tube is normal. When the second preset level signal is received, the coincidence circuit enters a working mode, and reads data of the two GM tubes for detecting the gas collection card when the gas collection card is inserted into the measurement chamber. When the first fault detection signal is received, the single-chip microcomputer determines that the second GM tube is an abnormal GM tube, and when the second fault detection signal is received, the single-chip microcomputer determines that the first GM tube is an abnormal GM tube.

[0010] In a third aspect, the application provides an electronic device including a memory and a processor, wherein the memory stores a computer program, and the computer program performs the double-GM tube fault detection method described in the preceding embodiments when running on the processor.

[0011] Fourthly, the present invention provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the dual GM tube fault detection method described in the foregoing embodiments.

[0012] The beneficial effects of the embodiments of this application are: this application realizes the automated diagnosis and rapid location of dual GM tube faults, and the detection can be completed without manual disassembly, which improves the efficiency of fault diagnosis and reduces labor costs.

[0013] To make the above-mentioned objects, features and advantages of the present invention more apparent and understandable, preferred embodiments are described below in detail with reference to the accompanying drawings. Attached Figure Description

[0014] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of the present invention and should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0015] Figure 1 A schematic diagram of the dual GM tube fault detection system provided in an embodiment of this application is shown. Figure 2 Another structural schematic diagram of the dual GM tube fault detection system provided in this application embodiment is shown; Figure 3 This shows another structural schematic diagram of the dual GM tube fault detection system provided in an embodiment of this application; Figure 4 A flowchart of a dual GM tube fault detection method provided in an embodiment of this application is shown; Figure 5 A schematic diagram of the structure of an electronic device provided in an embodiment of this application is shown.

[0016] Explanation of key component symbols: 100 - Dual GM tube fault detection system; 110 - Microcontroller; 120 - Synchronization circuit; 130 - Anti-synchronization circuit; 140 - In-situ sensor; 150 - Interaction module; 210 - First GM tube; 220 - Second GM tube; 500 - Electronic equipment; 501 - Transceiver; 502 - Processor; 503 - Memory. Detailed Implementation

[0017] Embodiments of the present invention are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and should not be construed as limiting the present invention.

[0018] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this invention, "a plurality of" means two or more, unless otherwise explicitly specified.

[0019] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the template description is for the purpose of describing particular embodiments only and is not intended to limit the invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0020] Example 1 GM (Geiger-Miller counter tube) is a cost-effective and convenient ionizing radiation detection device widely used in medical and health fields, nuclear science research, and other areas. Over time, GM tubes are prone to mica window cracking and leakage, leading to a failure to output GM signals or the output of large amounts of GM signals in a short period. To improve the reliability and stability of measurements, current technology typically uses dual GM tubes for ionizing radiation measurement. However, the dual GM tube structure is symmetrical, and traditional GM fault detection methods cannot distinguish which specific GM tube is malfunctioning. For further information, please refer to [link to relevant documentation]. Figure 1 This application provides a dual GM transistor fault detection system 100, including: a microcontroller 110, a coincidence circuit 120, and an anti-coincidence circuit 130; the coincidence circuit 120 is electrically connected to a first GM transistor 210, a second GM transistor 220, and the microcontroller 110 respectively; the anti-coincidence circuit 130 is electrically connected to the first GM transistor 210, the second GM transistor 220, and the microcontroller 110 respectively. In response to the fault detection requirement, the microcontroller 110 is used to send a first preset level signal to the anti-concordance circuit 130 within a preset time. The anti-concordance circuit 130 is used to, when receiving the first preset level signal, obtain a first GM signal from the first GM transistor 210 and a second GM signal from the second GM transistor 220; determine whether the first GM transistor 210 is normal based on the first GM signal and whether the second GM transistor 220 is normal based on the second GM signal; if the first GM transistor 210 is normal and the second GM transistor 220 is abnormal, then send a first fault detection signal to the microcontroller 110; if the first GM transistor 210 is abnormal and the second GM transistor 220 is normal, then send a second fault detection signal to the microcontroller 110.

[0021] The matching circuit 120 is used to enter the working mode when it receives the second preset level signal, and read the data of the two GM tubes detecting the gas collection card after the gas collection card is inserted into the measuring chamber. The microcontroller 110 is configured to determine the second GM transistor 220 as an abnormal GM transistor when it receives the first fault detection signal, and to determine the first GM transistor 210 as an abnormal GM transistor when it receives the second fault detection signal.

[0022] In this embodiment, in response to the user's fault detection needs, the microcontroller 110 sends a first preset level signal, such as a high level signal, to the anti-coincidence circuit 130 within a preset time, such as 20 seconds, to control the anti-coincidence circuit 130 to enter the working mode, and the dual GM tube fault detection system 100 enters the fault diagnosis working mode.

[0023] In the fault diagnosis mode, the anti-concordance circuit 130 acquires the first GM signal from the first GM transistor 210 and the second GM signal from the second GM transistor 220. It then determines whether the first GM transistor 210 is functioning correctly based on the first GM signal and whether the second GM transistor 220 is functioning correctly based on the second GM signal. Specifically, this includes: counting the number of first GM signals within a preset time period and determining whether the number of first GM signals falls within a preset threshold range. If it does, the first GM transistor 210 is determined to be functioning correctly; otherwise, it is determined to be malfunctioning. Similarly, it counts the number of second GM signals within the preset time period and determines whether the number of second GM signals falls within a preset threshold range. If it does, the second GM transistor 220 is determined to be functioning correctly; otherwise, it is determined to be malfunctioning.

[0024] When it is determined that the first GM transistor 210 is normal and the second GM transistor 220 is abnormal, the anti-concurrency circuit 130 sends a first fault detection signal to the microcontroller 110. Based on the first fault detection signal, the microcontroller 110 can determine that the first GM transistor 210 is normal and the second GM transistor 220 is abnormal.

[0025] After a preset time, if the microcontroller 110 receives the fourth fault detection signal, it sends a second preset level signal to the coincidence circuit 120, switching the coincidence circuit 120 into its working mode. At this time, the dual GM tube fault detection system 100 no longer performs fault diagnosis; the coincidence circuit 120 checks the gas collecting card after it has been inserted. It should be noted that the fourth fault detection signal is sent to the microcontroller 110 by the anti-coincident circuit 130. Specifically, if the first GM tube 210 and the second GM tube 220 are both normal, the fourth fault detection signal is sent to the microcontroller 110.

[0026] The microcontroller 110 determines the operating status of the first GM tube 210 and the second GM tube 220 based on the received first fault detection signal and second fault detection signal.

[0027] For ease of understanding, Table 1 below shows the fault logic truth table for the anti-coincidence circuit.

[0028] Table 1 Truth Table for Fault Diagnosis of Anti-Concurrent Circuits

[0029] It can be understood that the first, second, third, and fourth fault detection signals output by the anti-coincidence circuit 130 in Table 1 correspond to the digital values ​​1 and 0, 0 and 1, 0 and 0, and 1 and 1 of the square wave of the anti-coincidence output GM tube, respectively.

[0030] It should be noted that the anti-coincidence circuit 130 and the coincidence circuit 120 do not operate simultaneously. Within a preset time period, the microcontroller 110 sends a first preset level signal to the anti-coincidence circuit 130 to start operating, and simultaneously sends a first preset level signal to the coincidence circuit 120 to stop operating. Similarly, the microcontroller 110 sends a second preset level signal to the coincidence circuit 120 to start operating, and simultaneously sends a second preset level signal to the anti-coincidence circuit 130 to stop operating.

[0031] In one implementation, please refer to Figure 2 The dual GM tube fault detection system 100 further includes: an in-situ sensor 140, which is electrically connected to the microcontroller 110; the in-situ sensor 140 is used to send a missing detection signal to the microcontroller 110 when the gas collection card is not in place; the microcontroller 110 is also used to send a first preset level signal to the anti-congruence circuit 130 within a preset time after receiving the missing detection signal.

[0032] In this embodiment, the in-situ sensor 140 uses a non-contact detection method to sense in real time whether the gas collection card is in the correct installation position. When it is confirmed that the gas collection card is not in place, it outputs a missing detection signal to the microcontroller 110. The microcontroller 110 will only start sending a first preset level signal to the anti-congruence circuit 130 after receiving the missing detection signal, triggering the anti-congruence circuit 130 to start collecting the signals of the first GM tube 210 and the second GM tube 220 to perform fault detection.

[0033] It is understandable that by using the pre-detection of the in-situ sensor 140, fault diagnosis can be performed first after the dual GM tubes are powered on, and the fault can be displayed immediately, which further enhances the reliability and practicality of the dual GM tube fault detection system 100.

[0034] In one embodiment, the anti-concordance circuit 130 is further configured to send a third fault detection signal to the microcontroller 110 if the first GM transistor 210 is faulty and the second GM transistor 220 is faulty; the microcontroller 110 is further configured to, upon receiving the third fault detection signal, determine the first GM transistor 210 and the second GM transistor 220 as faulty GM transistors respectively.

[0035] In this embodiment, please refer to Table 1 again. After acquiring the signals of the first GM transistor 210 and the second GM transistor 220, the anti-concordance circuit 130 will independently determine the working state of the first GM transistor 210 and the second GM transistor 220. When it is detected that both the first GM transistor 210 and the second GM transistor 220 meet the abnormal characteristics, it will output a third fault detection signal to the microcontroller 110.

[0036] In one embodiment, the anti-concordance circuit 130 is further configured to send a fourth fault detection signal to the microcontroller 110 if the first GM transistor 210 is normal and the second GM transistor 220 is normal; the microcontroller 110 is further configured to determine the first GM transistor 210 and the second GM transistor 220 as normal GM transistors when the fourth fault detection signal is received. The microcontroller 110 is also used to send the second preset level signal to the comparator circuit 120 if the fourth fault detection signal is received after the preset time has elapsed.

[0037] In one implementation, please refer to Figure 3The dual GM tube fault detection system 100 further includes: an interaction module 150, which is electrically connected to the microcontroller 110; the microcontroller 110 is also used to issue a warning signal when it is determined that the first GM tube 210 is abnormal and / or the second GM tube 220 is abnormal; the interaction module 150 is used to determine and display warning information based on the warning signal, the warning information including: the identification information and location information of the abnormal GM tube.

[0038] In this embodiment, when the microcontroller 110 determines that the first GM transistor 210 and / or the second GM transistor 220 are abnormal through the dual detection signals of the coincidence circuit 120 and the anti-coincidence circuit 130, it sends a warning signal to the interaction module 150. After receiving the warning signal, the interaction module 150 generates clear warning information. The warning information includes identification information to correspond to the number of the abnormal GM transistor, and location information associated with the physical installation interface and connection line identification of the abnormal GM transistor. This information is presented intuitively through a visual method (display pop-up window, host computer pop-up window, etc.). Furthermore, the microcontroller 110 can also send a warning signal to a remote terminal through a 4G gateway. The remote terminal determines and displays the warning information based on the warning signal.

[0039] Its advantage lies in the fact that the location of the fault can be determined without the need for on-site operation by technical personnel, ensuring that the fault of the abnormal GM tube can be responded to and handled in a timely manner.

[0040] In one embodiment, the dual GM transistor fault detection system 100 further includes: a power supply, a voltage divider circuit, and an analog-to-digital converter; the power supply is electrically connected to the first GM transistor 210, the second GM transistor 220, and the voltage divider circuit respectively; the voltage divider circuit is also electrically connected to the analog-to-digital converter; the analog-to-digital converter is also electrically connected to the microcontroller 110; The power supply is used to supply power to the first GM tube 210 and the second GM tube 220; The voltage divider circuit is used to obtain the supply voltage from the power supply, divide the supply voltage, and output the divided voltage to the analog-to-digital converter. The analog-to-digital converter is used to convert the voltage divider into a digital signal and send it to the microcontroller 110; The microcontroller 110 is used to determine whether the power supply is normal based on the digital signal.

[0041] In this embodiment, the power supply serves as the operating power source for the first GM transistor 210 and the second GM transistor 220, and is also electrically connected to a voltage divider circuit. The high-voltage DC output from the power supply is stepped down by the voltage divider circuit and converted into a divided voltage. The voltage divider circuit is electrically connected to an analog-to-digital converter (ADC), transmitting the analog divided voltage to the ADC, which then converts the analog signal to a digital signal and sends it to the microcontroller 110. After receiving the digital signal, the microcontroller 110 calculates the actual output voltage of the power supply based on a preset voltage division ratio. By determining whether this voltage falls within the preset voltage range required for the normal operation of the GM transistors, the microcontroller determines whether the power supply is functioning correctly.

[0042] Its beneficial effects are that it enables automated and non-intrusive detection of power supply status, reducing the manpower and time costs of troubleshooting; at the same time, by monitoring the power supply voltage, it can effectively distinguish between GM tube signal abnormalities caused by power supply abnormalities and GM tube failures themselves, avoiding misjudging power supply problems as GM tube failures and significantly improving the accuracy of the entire fault diagnosis.

[0043] In one embodiment, determining whether the power supply is normal based on the digital signal includes: determining the power supply voltage based on the digital signal; determining whether the power supply voltage falls within a preset voltage range; if it does, determining that the power supply is normal; if it does not, determining that the power supply is abnormal and sending a voltage abnormality signal to the interaction module 150. In this embodiment, after receiving the digital signal transmitted by the analog-to-digital converter, the microcontroller 110 reversely calculates the actual output voltage of the power supply based on the preset fixed voltage division ratio of the voltage divider circuit, such as 1:250. Then, it compares the actual power supply voltage with the preset voltage range required for the normal operation of the GM tube. If the actual power supply voltage falls within the range, the power supply is determined to be working normally; if it exceeds the range, the power supply is determined to be abnormal, and a voltage abnormality signal including voltage abnormality information is immediately sent to the interaction module 150.

[0044] Its beneficial effect is that it enables automated judgment of the power supply status, effectively distinguishing between power supply abnormalities and GM tube malfunctions.

[0045] The dual GM transistor fault detection system 100 provided in this application embodiment includes: a microcontroller 110, a coincidence circuit 120, and an anti-coincidence circuit 130; the coincidence circuit 120 is electrically connected to a first GM transistor 210, a second GM transistor 220, and the microcontroller 110 respectively; the anti-coincidence circuit 130 is electrically connected to the first GM transistor 210, the second GM transistor 220, and the microcontroller 110 respectively; in response to a fault detection requirement, the microcontroller 110 is used to send a first preset level signal to the anti-coincidence circuit 130 within a preset time; the anti-coincidence circuit 130 is used to, when receiving the first preset level signal, obtain a first GM signal from the first GM transistor 210 and a second GM signal from the second GM transistor 220; and determine the first GM signal based on the first GM signal. The GM tube 210 is checked for proper function, and the second GM tube 220 is checked for proper function based on the second GM signal. If both the first GM tube 210 and the second GM tube 220 are normal, a first fault detection signal is sent to the microcontroller 110. If the first GM tube 210 is abnormal but the second GM tube 220 is normal, a second fault detection signal is sent to the microcontroller 110. The matching circuit 120 is used to enter the working mode when it receives a second preset level signal, and read the data of the two GM tubes to detect the gas collection card after the gas collection card is inserted into the measuring chamber. The microcontroller 110 is used to determine the second GM tube 220 as an abnormal GM tube when it receives the first fault detection signal, and to determine the first GM tube 210 as an abnormal GM tube when it receives the second fault detection signal. This application realizes automated diagnosis and rapid location of dual GM tube faults, and can complete the detection without manual disassembly, improving the efficiency of fault diagnosis and reducing labor costs.

[0046] Example 2 In addition, please see Figure 4 This application also provides a dual GM tube fault detection method, applied to the dual GM tube fault detection system 100 described in Embodiment 1, the method including steps S410~S450.

[0047] In step S410, in response to the fault detection requirement, the microcontroller 110 sends a first preset level signal to the anti-contrast circuit 130 within a preset time.

[0048] In step S420, when the first preset level signal is received, the anti-concurrent circuit 130 obtains the first GM signal from the first GM transistor 210 and the second GM signal from the second GM transistor 220; it determines whether the first GM transistor 210 is normal based on the first GM signal and whether the second GM transistor 220 is normal based on the second GM signal; if the first GM transistor 210 is normal and the second GM transistor 220 is abnormal, it sends a first fault detection signal to the microcontroller 110; if the first GM transistor 210 is abnormal and the second GM transistor 220 is normal, it sends a second fault detection signal to the microcontroller 110. Step S430: When the first fault detection signal is received, the microcontroller 110 determines the second GM transistor 220 as an abnormal GM transistor; when the second fault detection signal is received, the microcontroller 110 determines the first GM transistor 210 as an abnormal GM transistor. In step S440, when the second preset level signal is received, the coincidence circuit 120 enters the working mode. After the gas collection card is inserted into the measuring chamber, the data of the gas collection card detected by the two GM tubes is read.

[0049] The dual GM tube fault detection method provided in this application embodiment is applied to the dual GM tube fault detection system 100 provided in Embodiment 1 above. To avoid repetition, it will not be described again here.

[0050] Example 3 Furthermore, this embodiment of the invention provides an electronic device 500, including a memory 503 and a processor 502. The memory 503 stores a computer program, and the computer program executes the dual GM tube fault detection method provided in Embodiment 2 when it runs on the processor 502.

[0051] For details, please see Figure 5The electronic device 500 includes a transceiver 501, a bus interface, and a processor 502. The processor 502 is used to respond to fault detection requirements. The microcontroller 110 is used to send a first preset level signal to the anti-concordance circuit 130 within a preset time. The anti-concordance circuit 130 is used to, when receiving the first preset level signal, obtain a first GM signal from the first GM transistor 210 and a second GM signal from the second GM transistor 220; determine whether the first GM transistor 210 is normal based on the first GM signal, and determine whether the second GM transistor 220 is normal based on the second GM signal; if the first GM transistor 210 is normal and the second GM transistor 220 is abnormal, then send a first fault detection signal to the microcontroller 110; if the first GM transistor 210 is abnormal and the second GM transistor 220 is normal, then send a second fault detection signal to the microcontroller 110. The matching circuit 120 is used to enter the working mode when it receives the second preset level signal, and read the data of the two GM tubes detecting the gas collection card after the gas collection card is inserted into the measuring chamber; the microcontroller 110 is used to determine the second GM tube 220 as an abnormal GM tube when it receives the first fault detection signal; and to determine the first GM tube 210 as an abnormal GM tube when it receives the second fault detection signal.

[0052] In this embodiment of the invention, the electronic device 500 further includes a memory 503. Figure 5 In this context, the bus architecture can include any number of interconnected buses and bridges, specifically linking various circuits of one or more processors 502 (represented by processor 502) and memory 503 (represented by memory 503). The bus architecture can also link various other circuits such as peripheral devices, voltage regulators, and power management circuits, which are well known in the art and therefore will not be described further herein. The bus interface provides an interface. The transceiver 501 can be multiple elements, including transmitters and receivers, providing a unit for communicating with various other devices over a transmission medium. Processor 502 is responsible for managing the bus architecture and general processing, and memory 503 can store data used by processor 502 during operation.

[0053] The electronic device 500 provided in this application embodiment can execute the dual GM tube fault detection method provided in the above method embodiment 2. To avoid repetition, it will not be described again here.

[0054] Example 4 Furthermore, embodiments of the present invention provide a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the dual GM tube fault detection method provided in Embodiment 2.

[0055] In this embodiment, the computer-readable storage medium may be a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk, etc.

[0056] The computer-readable storage medium provided in this embodiment can implement the dual GM tube fault detection method provided in Embodiment 2. To avoid repetition, it will not be described again here.

[0057] In all examples shown and described herein, any specific values ​​should be interpreted as merely exemplary and not as limitations; therefore, other examples of exemplary embodiments may have different values.

[0058] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0059] The above-described embodiments are merely illustrative of several implementations of the present invention, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of the invention. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of the present invention, and these modifications and improvements all fall within the scope of protection of the present invention.

Claims

1. A dual GM tube fault detection system, characterized in that, The system includes: a microcontroller, a coincidence circuit, and an anti-coincidence circuit; The circuit is electrically connected to the first GM transistor, the second GM transistor, and the microcontroller, respectively. The anti-coincidence circuit is electrically connected to the first GM transistor, the second GM transistor, and the microcontroller, respectively. In response to the fault detection requirement, the microcontroller is used to send a first preset level signal to the anti-concordance circuit within a preset time. The anti-concordance circuit is used to, when receiving the first preset level signal, obtain a first GM signal from the first GM transistor and a second GM signal from the second GM transistor; determine whether the first GM transistor is normal based on the first GM signal and whether the second GM transistor is normal based on the second GM signal; if the first GM transistor is normal and the second GM transistor is abnormal, send a first fault detection signal to the microcontroller; if the first GM transistor is abnormal and the second GM transistor is normal, send a second fault detection signal to the microcontroller. The circuit is used to enter the working mode when it receives the second preset level signal, and to read the data of the gas collection card detected by the two GM tubes after the gas collection card is inserted into the measuring chamber. The microcontroller is configured to determine the second GM transistor as an abnormal GM transistor when it receives the first fault detection signal, and to determine the first GM transistor as an abnormal GM transistor when it receives the second fault detection signal.

2. The dual GM tube fault detection system according to claim 1, characterized in that, The system further includes: an in-situ sensor, which is electrically connected to the microcontroller; The in-situ sensor is used to send an absence detection signal to the microcontroller when the gas collection card is not in place. The microcontroller is also used to send the first preset level signal to the anti-congruence circuit within the preset time after receiving the missing detection signal.

3. The dual GM tube fault detection system according to claim 2, characterized in that, The anti-concordance circuit is also used to send a third fault detection signal to the microcontroller if both the first GM transistor and the second GM transistor are faulty. The microcontroller is also used to identify the first GM transistor and the second GM transistor as abnormal GM transistors when it receives the third fault detection signal.

4. The dual GM tube fault detection system according to claim 3, characterized in that, The anti-coincidence circuit is also used to send a fourth fault detection signal to the microcontroller if the first GM transistor is normal and the second GM transistor is normal. The microcontroller is also used to determine the first GM transistor and the second GM transistor as normal GM transistors when it receives the fourth fault detection signal; The microcontroller is also used to send the second preset level signal to the conformal circuit if it receives the fourth fault detection signal after the preset time has elapsed.

5. The dual GM tube fault detection system according to any one of claims 1-4, characterized in that, The system further includes: an interaction module, which is electrically connected to the microcontroller; The microcontroller is also used to issue an early warning signal when it is determined that the first GM transistor is abnormal and / or the second GM transistor is abnormal; The interaction module is used to determine and display warning information based on the warning signal. The warning information includes the identification information and location information of the abnormal GM tube.

6. The dual GM tube fault detection system according to claim 5, characterized in that, The system also includes: a power supply, a voltage divider circuit, and an analog-to-digital converter; The power supply is electrically connected to the first GM transistor, the second GM transistor, and the voltage divider circuit, respectively. The voltage divider circuit is also electrically connected to the analog-to-digital converter; The analog-to-digital converter is also electrically connected to the microcontroller; The power supply is used to supply power to the first GM tube and the second GM tube; The voltage divider circuit is used to obtain the supply voltage from the power supply, divide the supply voltage, and output the divided voltage to the analog-to-digital converter. The analog-to-digital converter is used to convert the voltage divider into a digital signal and send it to the microcontroller. The microcontroller is used to determine whether the power supply is normal based on the digital signal.

7. The dual GM tube fault detection system according to claim 6, characterized in that, The step of determining whether the power supply is normal based on the digital signal includes: Based on the digital signal, the power supply voltage is determined, and it is determined whether the power supply voltage falls within a preset voltage range. If it does, the power supply is determined to be normal. If it does not belong to the category, then the power supply is determined to be abnormal, and a voltage abnormality signal is sent to the interaction module.

8. A method for detecting faults in dual GM transistors, characterized in that, The method applied to the dual GM tube fault detection system according to any one of claims 1-7, the method comprising: In response to the fault detection requirement, the microcontroller sends a first preset level signal to the anti-concordance circuit within a preset time. When the first preset level signal is received, the anti-concurrent circuit obtains the first GM signal from the first GM transistor and the second GM signal from the second GM transistor; it determines whether the first GM transistor is normal based on the first GM signal and whether the second GM transistor is normal based on the second GM signal; if the first GM transistor is normal and the second GM transistor is abnormal, it sends a first fault detection signal to the microcontroller; if the first GM transistor is abnormal and the second GM transistor is normal, it sends a second fault detection signal to the microcontroller. When the first fault detection signal is received, the microcontroller determines the second GM transistor as an abnormal GM transistor; when the second fault detection signal is received, the microcontroller determines the first GM transistor as an abnormal GM transistor. When the second preset level signal is received, the coincidence circuit enters the working mode. After the gas collection card is inserted into the measuring chamber, the data of the gas collection card detected by the two GM tubes is read.

9. An electronic device, characterized in that, It includes a memory and a processor, wherein the memory stores a computer program, and the computer program executes the dual GM tube fault detection method of claim 8 when it is run on the processor.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements the dual GM tube fault detection method of claim 8.

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