Test apparatus for sensor, test method for sensor, and storage medium

Abstract

This invention relates to a sensor testing device, a testing method, and a storage medium. The testing device includes: an identification unit for identifying the sensor type of the sensor under test and generating a sensor type signal; a control unit for receiving and generating a calibration transmission signal based on the sensor type signal; a carrying unit including multiple test areas corresponding to various sensor types; a transmission unit for transmitting the sensor under test to a first target test area corresponding to the calibration transmission signal among the multiple test areas; and a setting unit for acquiring and providing multiple different target test parameters to the sensor under test located in the first target test area according to a setting signal. The control unit acquires characteristic data signals of the sensor under test located in the first target test area under each target test parameter and calibrates the sensor under test based on each target test parameter and each characteristic data signal. This improves the reusability of the testing device.

Description

Technical Field

[0001] This application relates to the field of testing technology, and in particular to a testing device for a sensor, a testing method thereof, and a storage medium thereof. Background Technology

[0002] Different types of sensors are used to detect different parameters. Different test equipment and test systems are required during the design verification and parameter evaluation stages, as well as the production line calibration and testing stages during mass production. Corresponding test equipment needs to be built in advance for different types of sensors, which is costly and has a low reusability rate. Summary of the Invention

[0003] Based on this, this disclosure provides a sensor testing device, a testing method, and a storage medium, which can be used to test different types of sensors, improving the reusability of the testing device and reducing the testing cost of sensors.

[0004] A sensor testing device, comprising:

[0005] The identification unit is used to identify the sensor type of the sensor under test and generate a sensor type signal;

[0006] A control unit is configured to receive and generate a calibration transmission signal based on the sensor type signal;

[0007] The carrier unit includes multiple test areas corresponding to various sensor types;

[0008] A transmission unit is used to transmit the sensor under test to a first target test area among the plurality of test areas that corresponds to the calibration transmission signal;

[0009] A setting unit, corresponding to the carrying unit, is configured to acquire and provide multiple different target test parameters to the sensor under test located in the first target test area according to the setting signal;

[0010] The control unit is used to acquire characteristic data signals of the sensor under test located in the first target test area under each of the target test parameters, and to calibrate the sensor under test according to each of the target test parameters and each of the characteristic data signals.

[0011] In one embodiment, the identification unit includes:

[0012] An industrial camera is used to perform image recognition on the sensor under test to confirm the sensor type.

[0013] In one embodiment, the control unit is further configured to read the stored information of the sensor under test, obtain type storage information characterizing the sensor type of the sensor under test, and generate the calibration transmission signal based on the type storage information and the sensor type signal.

[0014] In one embodiment, each test area includes a plurality of test stations spaced apart;

[0015] The setting unit is used to provide different target test parameters to different test stations in the first target test area; the transmission unit is used to transmit the sensor under test sequentially to each of the test stations in the first target test area.

[0016] In one embodiment, the carrier unit includes:

[0017] The track structure includes multiple track substructures arranged at intervals in a first direction and connected sequentially; the multiple test areas are respectively disposed on the multiple track substructures.

[0018] The transmission unit controls the sensor under test to be transmitted along the track structure to the first target test area according to the calibration transmission signal.

[0019] In one embodiment, the carrier unit further includes:

[0020] A temperature chamber, in which the plurality of test areas are housed;

[0021] The control unit is also used to acquire and control the temperature chamber to be at different chamber temperatures according to the heating signal, so as to obtain the characteristic data signals of the sensor under test at different chamber temperatures.

[0022] In one embodiment, the setting unit includes:

[0023] Multiple parameter control modules are configured to correspond to the multiple test areas respectively;

[0024] The parameter control module corresponding to the first target test area is used to provide multiple target test parameters to the sensor under test located in the first target test area according to the setting signal.

[0025] In one embodiment, it further includes:

[0026] Multiple connection units are respectively configured to correspond to multiple test areas;

[0027] The control unit is used to control the connection between the connection unit and the sensor under test, so as to obtain the characteristic data signal of the sensor under test under the target test parameters.

[0028] In one embodiment, the control unit is further configured to calibrate the sensor under test when the connection unit and the sensor under test are connected.

[0029] In one embodiment, the control unit is further configured to mark the calibrated sensor under test as a sensor to be retested; the control unit is further configured to generate a retest transmission signal according to the sensor type of the sensor to be retested; the transmission unit is further configured to transmit the sensor to be retested to a second target test area corresponding to the sensor type of the sensor to be retested according to the retest transmission signal; the setting unit is further configured to provide retest test parameters to the sensor to be retested in the second target test area; the control unit is further configured to acquire retest characteristic data signals of the sensor to be retested located in the second target test area under the retest test parameters; the control unit is further configured to determine the state of the sensor to be retested according to the retest characteristic data signals, the calibration information of the sensor to be retested, and the retest test parameters;

[0030] The calibration information represents the correspondence between the test parameters and characteristic data signals of the sensor to be retested.

[0031] In one embodiment, the control unit includes: a controller, a level conversion module, a waveform generator, and an adapter module;

[0032] The level conversion module is connected to the controller and the waveform generator respectively, and is used to convert the received signal; the conversion module is connected to the controller, the identification unit, the transmission unit and the setting unit respectively.

[0033] The controller is configured to control the waveform generator to send a test waveform signal to the sensor under test, and to receive the output level signal of the sensor under test under each of the target test parameters to obtain the characteristic data signal; the controller is also configured to control the waveform generator to calibrate the sensor under test; the controller is also configured to receive the sensor type signal, and to send the calibration transmission signal and the setting signal.

[0034] A method for testing a sensor, comprising:

[0035] Identify the sensor type of the sensor under test and generate a sensor type signal;

[0036] A calibration transmission signal is generated based on the sensor type signal;

[0037] The sensor under test is transmitted to the first target test area corresponding to the calibration transmission signal in one of the multiple test areas;

[0038] Acquire and provide multiple different target test parameters to the sensor under test located in the first target test area according to the setting signal;

[0039] Acquire characteristic data signals of the sensor under test located in the first target test area under each of the target test parameters;

[0040] The sensor under test is calibrated based on the target test parameters and characteristic data signals.

[0041] In one embodiment, calibrating the sensor under test based on each of the target test parameters and each of the characteristic data signals includes:

[0042] Based on each of the target test parameters and each of the characteristic data signals, a target calibration curve is obtained, wherein the target calibration curve characterizes the correspondence between the test parameters and the characteristic data signals;

[0043] The target calibration curve is written into the sensor under test to calibrate the sensor under test.

[0044] A computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the above-described sensor testing method.

[0045] In the aforementioned sensor testing equipment, the carrying unit includes multiple test areas corresponding to various sensor types. After the identification unit identifies the sensor type of the sensor under test, the transmission unit transmits the sensor under test to the first target test area corresponding to its sensor type via the transmission unit, thereby calibrating the sensor under test. The testing equipment of this application can test sensors of multiple sensor types corresponding to the test areas, improving the reusability of the testing equipment and reducing the cost of calibrating sensors. Furthermore, the testing equipment of this application, by transmitting the sensor under test to the first target test area corresponding to it via the transmission unit, reduces the probability of human error, increases the real-time performance of big data processing and the reliability of system control, and improves the production efficiency of the testing equipment.

[0046] In the aforementioned sensor testing method, the sensor under test is transmitted to a first target test area corresponding to the sensor type of the sensor under test among multiple test areas, according to the sensor type of the sensor under test. Multiple different target test parameters are provided to the sensor under test located in the first target test area, and the characteristic data signals of the sensor under test under each target test parameter are acquired. The sensor under test is calibrated according to each target test parameter and each characteristic data signal. The testing method in this application can realize the testing and calibration of sensors of various sensor types, simplifying the steps of the sensor testing method and reducing the probability of human error in the sensor testing process. Attached Figure Description

[0047] To more clearly illustrate the technical solutions in the embodiments of this application or the conventional technology, the drawings used in the description of the embodiments or the conventional technology will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0048] Figure 1 This is a schematic diagram of the structure of the sensor testing equipment in some embodiments;

[0049] Figure 2 This is a side view schematic diagram of the test equipment for the sensor in some embodiments;

[0050] Figure 3 This is a front view schematic diagram of the sensor testing equipment in some embodiments;

[0051] Figure 4 This is a schematic diagram of the control unit structure in some embodiments;

[0052] Figure 5 This is a flowchart illustrating the sensor testing method in some embodiments.

[0053] Explanation of reference numerals in the attached figures:

[0054] Sensor under test 10; Identification unit 100; Industrial camera 102; Light source device 104; Control unit 200; Controller 202; Level conversion module 204; Waveform generator 206; Adapter module 208; Adapter communication module 210; Industrial controller 212; Communication module 214; Bearing unit 300; Test areas 302, 304, 306, 308; Test stations 3041, 3042, 3043, 3061 3062, 3063, 3081, 3082, 3083; track structure 310; track substructures 312, 3121, 3122, 3123; temperature chamber 314; transmission unit 400; setting unit 500; parameter control modules 502, 504, 506, 508; feed inlet 602; sealing unit 604; connection unit 606; first chamber 608; second chamber 610; central control server 612. Detailed Implementation

[0055] To facilitate understanding of this application, a more complete description will be provided below with reference to the accompanying drawings, which illustrate embodiments of the present application. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the disclosure of this application will be thorough and complete.

[0056] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.

[0057] It is understood that the terms “first,” “second,” etc., used in this application may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another.

[0058] Spatial relation terms such as “below,” “under,” “below,” “under,” “above,” “above,” etc., are used herein to describe the relationship between one element or feature shown in the figure and other elements or features. It should be understood that, in addition to the orientation shown in the figure, spatial relation terms also include different orientations of the device in use and operation. For example, if the device in the figure is flipped, the element or feature described as “below,” “under,” or “below” will be oriented “above” the other element or feature. Therefore, the exemplary terms “below” and “under” can include both above and below orientations. Furthermore, the device may also include other orientations (e.g., rotated 90 degrees or other orientations), and the spatial descriptive terms used herein will be interpreted accordingly.

[0059] It should be noted that when one element is considered to be "connected" to another element, it can be directly connected to the other element or connected to the other element through an intermediary element. Furthermore, in the following embodiments, "connection" should be understood as "electrical connection," "communication connection," etc., if there is transmission of electrical signals or data between the connected objects.

[0060] When used herein, the singular forms of “a,” “an,” and “the” may also include the plural forms unless the context clearly indicates otherwise. It should also be understood that terms such as “comprising / including” or “having” specify the presence of the stated features, wholes, steps, operations, components, parts, or combinations thereof, but do not preclude the possibility of the presence or addition of one or more other features, wholes, steps, operations, components, parts, or combinations thereof. Meanwhile, the term “and / or” as used in this specification includes any and all combinations of the associated listed items.

[0061] Common environmental sensors include pressure sensors, thermopile sensors, temperature sensors, and humidity sensors. Each type of sensor requires different equipment and different test system hardware and software during the design verification, parameter evaluation, and mass production line calibration and testing phases. Typically, during the design evaluation and mass production calibration and testing phases, pressure sensors require a high-low temperature alternating chamber, pressure source controller, pressure chamber, calibration and test control board, and industrial control computer; thermopile sensors require a high-low temperature alternating chamber, thermal radiation blackbody, calibration and test control board, and industrial control computer; humidity sensors require a high-low temperature alternating chamber, humidity generator, calibration and test control board, and industrial control computer; and temperature sensors require a high-low temperature alternating chamber, calibration and test control board, and industrial control computer. Different sensors require calibration and testing of different parameters. Using multiple sets of corresponding test equipment for various sensors results in low equipment reuse and high costs. Using test equipment specific to one sensor requires modification and adjustment when switching to different sensor types, leading to low production efficiency and a high risk of errors.

[0062] Figure 1 This is a schematic diagram of the structure of the sensor testing equipment in some embodiments, see [link / reference]. Figure 1To address the aforementioned problems, this embodiment provides a sensor testing device, comprising: an identification unit 100, a control unit 200, a carrier unit 300, a transmission unit 400, and a setting unit 500. The identification unit 100 identifies the sensor type of the sensor under test and generates a sensor type signal. The control unit 200 receives and generates a calibration transmission signal based on the sensor type signal. The carrier unit 300 includes multiple test areas corresponding to various sensor types. The transmission unit 400 transmits the sensor under test to a first target test area corresponding to the calibration transmission signal among the multiple test areas. The setting unit 500 is correspondingly configured with the carrier unit 300 and is used to acquire and provide multiple different target test parameters to the sensor under test located in the first target test area based on a setting signal. The control unit 200 acquires characteristic data signals of the sensor under test located in the first target test area under each target test parameter and calibrates the sensor under test based on each target test parameter and each characteristic data signal.

[0063] The identification unit 100 identifies the sensor type of the sensor under test, including pressure sensors, thermopile sensors, temperature sensors, and humidity sensors; and generates a sensor type signal based on the identified sensor type.

[0064] The control unit 200 is connected to the identification unit 100, receives the sensor type signal generated by the identification unit 100, and generates a calibration transmission signal according to the sensor type signal. The calibration transmission signal characterizes the position of the corresponding test area (first target test area) of the sensor under test. The carrier unit 300 includes multiple test areas, which correspond to multiple sensor types respectively. Different test areas are used to calibrate and test sensors of different sensor types.

[0065] The transmission unit 400 is connected to the control unit 200 and transmits the sensor under test to the first target test area among multiple test areas according to the calibration transmission signal. The sensor type corresponding to the first target test area is the same as the sensor type of the sensor under test.

[0066] The setting unit 500 receives and provides multiple different target test parameters to the sensor under test in the first target test area according to the setting signal. The sensor under test receives different target test parameters at different times. The setting signal defines the number and value of the target test parameters. The more target test parameters there are, the higher the calibration accuracy of the sensor under test. As an example, the setting unit 500 is connected to the control unit 200 and receives the setting signal generated by the control unit 200. It is understood that this application does not limit the source of the setting signal, and the setting unit 500 can also receive setting signals generated by a signal generating device other than the test equipment.

[0067] The control unit 200 acquires the characteristic data signals of the sensor under test in the first target test area under various target test parameters, and then calibrates the sensor under test according to each target test parameter and its corresponding characteristic data signal.

[0068] In the aforementioned sensor testing equipment, the carrier unit 300 includes multiple test areas corresponding to various sensor types. After the identification unit 100 identifies the sensor type of the sensor under test, it transmits the sensor under test to the first target test area corresponding to the sensor type of the sensor under test via the transmission unit 400, thereby achieving the calibration of the sensor under test. The testing equipment of this application can test sensors of various sensor types corresponding to the test areas, improving the reusability of the testing equipment and reducing the cost of calibrating sensors. Furthermore, the testing equipment of this application, by transmitting the sensor under test to the first target test area corresponding to the sensor under test via the transmission unit 400, reduces the probability of human error, increases the real-time performance of big data processing and the reliability of system control, and improves the production efficiency of the testing equipment.

[0069] Figure 2 This is a side view schematic diagram of the test equipment for the sensor in some embodiments. Figure 3 This is a front view schematic diagram of the sensor testing equipment in some embodiments, see [link / reference]. Figure 2 , Figure 3 In one embodiment, the identification unit 100 includes an industrial camera 102, used to perform image recognition on the sensor under test 10 to confirm the sensor type of the sensor under test 10. Specifically, the industrial camera 102 performs image recognition on the sensor under test 10 entering the sensor testing equipment, and identifies the sensor type of the sensor under test 10 according to the different sensor packaging types.

[0070] See Figure 2 , Figure 3 In one embodiment, the identification unit 100 further includes a light source device 104 located on the side of the industrial camera 102 facing the sensor under test 10, for providing illumination to the industrial camera 102 to facilitate identification of the sensor under test 10 by the industrial camera 102. As an example, the light source device 104 is located between the industrial camera 102 and the feed inlet 602 of the sensor testing equipment. The feed inlet 602 is the loading area for the sensor under test 10 to enter the sensor testing equipment.

[0071] In one embodiment, the identification unit 100 further includes a signal generation module connected to the industrial camera 102, used to generate a sensing type signal according to the sensor type of the sensor under test 10.

[0072] In one embodiment, the control unit 200 is further configured to read the stored information of the sensor under test 10 to obtain type storage information characterizing the sensor type of the sensor under test 10, and generate the calibration transmission signal based on the type storage information and the sensor type signal. By generating the calibration sensing signal using the type storage information and the sensor type signal, the influence of the identification deviation of the identification unit 100 on confirming the first target test area corresponding to the sensor under test 10 can be eliminated.

[0073] It is understood that the sensor under test (SUT) contains stored information. The control unit 200 reads the stored information of the SUT 10 to obtain type storage information characterizing the sensor type of the SUT 10. For example, the type storage information for a pressure sensor is 1, for a thermopile sensor it is 2, for a humidity sensor it is 3, and for a temperature sensor it is 4. When the type storage information and the sensor type represented by the sensing type signal are the same, the control unit 200 generates a calibration transmission signal characterizing the position of the first target test area based on the sensing type signal.

[0074] See Figure 2 The carrier unit 300 includes multiple test areas 302, such as test area 304, test area 306, and test area 308. In some embodiments, each test area 302 includes one test station, and the setting unit 500 provides different target test parameters to the sensor under test 10 located at the test station at different times, thereby reducing the size of the carrier unit 300 and reducing the footprint of the sensor testing equipment.

[0075] See Figure 2 , Figure 3 In one embodiment, each test area 302 includes a plurality of test stations spaced apart; such as Figure 3Test area 304 includes test stations 3041, 3042, and 3043; test area 306 includes test stations 3061, 3062, and 3063; and test area 308 includes test stations 3081, 3082, and 3083. The setting unit 500 provides different target test parameters to different test stations in the first target test area. The transmission unit 400 sequentially transmits the sensor under test 10 to each of the test stations in the first target test area. The sensor under test 10 receives corresponding target test parameters at different test stations in the first target test area. Within the same test cycle, multiple sensors of the same type can be tested at multiple test stations in the same test area 302, shortening the testing time, increasing the utilization rate of the testing equipment, and reducing the testing cost of the sensors. As an example, the number of test stations is the same as the number of target test parameters, improving the testing efficiency of the testing equipment.

[0076] See Figure 2 In some embodiments, the sensor testing equipment further includes a test chamber and a sealing unit 604; multiple measurement areas are respectively located in multiple test chambers, and the sealing unit 604 is connected to the control unit 200, with the sealing unit 604 corresponding to the multiple test chambers; wherein, the control unit 200 controls the sealing unit 604 to seal the test chamber corresponding to the first target test area according to a sealing signal, and the sealing signal indicates that the sensor under test is located in the test chamber corresponding to the first target test area. As an example, the sealing unit 604 includes a detachably connected rubber ring and a sealing ring device, the rubber ring being connected to the control unit 204, and the sealing unit 604 is configured to avoid the influence of the external environment on the target test parameters received by the sensor under test.

[0077] Furthermore, the test chamber includes multiple test sub-cavities corresponding to multiple test stations. When the sensor under test is located at a test station in the first target test area, the control unit 200 controls the sealing unit 604 to seal the test sub-cavity where the sensor under test is located.

[0078] As an example, test area 302 includes a pressure sensor test area, a thermopile sensor test area, and a humidity sensor test area. The pressure sensor test area includes multiple pressure test stations, which are located in multiple pressure source cavities. The thermopile sensor test area includes multiple thermal radiation test stations, which are located in multiple thermopile cavities. The humidity sensor test area includes multiple humidity test stations, which are located in multiple humidity cavities.

[0079] Taking the first target test area as an example of the pressure sensor test area, the setting unit 500 provides different pressure test parameters to the sensors under test at multiple pressure test stations according to the setting signal, and the control unit 200 acquires the characteristic data signals of the sensors under test under different pressure test parameters.

[0080] As an example, when a sensor testing device tests multiple sensors of different sensor types, the first target test area includes multiple test areas corresponding to the multiple sensors under test. The setting unit 500 provides target test parameters of the same sensor type to different first target test areas according to the setting signal. For example, if the sensors under test include a pressure sensor and a humidity sensor, the first target test area includes a pressure test area and a humidity test area. The transmission unit 400 transmits the pressure sensor to the pressure test area and the humidity sensor to the humidity test area. The setting unit 500 provides multiple different target pressure test parameters to the pressure sensor in the pressure test area and multiple different target humidity test parameters to the humidity sensor in the humidity test area according to the setting signal.

[0081] See Figure 3 In one embodiment, the carrying unit 300 includes: a track structure 310, which includes a plurality of track substructures 312 arranged at intervals in a first direction X and connected sequentially, such as track substructures 3121, 3122, and 3123; a plurality of test areas 302 are respectively disposed on the plurality of track substructures 312; different track substructures 312 correspond to test areas 302 of different sensor types; wherein, the transmission unit 200 controls the sensor under test 10 to be transmitted along the track structure 310 to the first target test area according to the calibration transmission signal. This arrangement simplifies the transmission of the sensor under test and reduces the footprint of the sensor testing equipment.

[0082] As an example, multiple track substructures 312 extend along the second direction Y, and multiple test stations in the test area 302 are arranged at intervals along the second direction Y on the track substructures 312, wherein the second direction Y intersects with the first direction X, thereby reducing the size of the sensor test equipment.

[0083] See Figure 2 , Figure 3In one embodiment, the carrier unit 300 further includes a temperature cavity 314, in which the plurality of test areas 302 are housed; wherein, the control unit 200 is further configured to acquire and control the temperature cavity 314 to be at different cavity temperatures according to the heating signal, so as to obtain characteristic data signals of the sensor under test 10 at different cavity temperatures, and the setting of the temperature cavity 314 realizes the testing and calibration of the sensor under test at different cavity temperatures.

[0084] It is understood that the temperature of the test area 302 is the same as the cavity temperature of the temperature chamber 314. The control unit 200 controls the temperature chamber 314 to be at a cavity temperature T1. The setting unit 500 provides multiple different target test parameters to the sensor under test 10 located in the first target test area at temperature T1. The control unit 200 acquires the characteristic data signals of the sensor under test 10 located in the first target test area at temperature T1 under each target test parameter. The control unit 200 controls the temperature chamber 314 to be at a cavity temperature T2. The control unit 200 then obtains the characteristic data signals of the sensor under test 10 located in the first target test area at temperature T2 under each target test parameter. The target test parameters provided by the cavity temperature T1 and cavity temperature T2 setting units 500 to the sensor under test 10 are the same.

[0085] See Figure 2 , Figure 3 In one embodiment, the setting unit 500 includes: multiple parameter control modules 502; the multiple parameter control modules 502 are respectively configured corresponding to multiple test areas 302; wherein, the parameter control module 502 corresponding to the first target test area is used to provide multiple target test parameters to the sensor under test 10 located in the first target test area according to the setting signal. When the parameter control module 504 provides target test parameters to the sensor under test located in the test area 304, it does not affect the parameter control module 506 providing target test parameters to the sensor under test located in the test area 306, nor does it affect the parameter control module 508 providing target test parameters to the sensor under test located in the test area 308. By setting multiple parameter control modules 502, individual control of multiple test areas 302 is achieved, improving the testing efficiency of the sensor testing equipment. As an example, the multiple parameter control modules 502 are arranged at intervals along the first direction X. Further, the multiple parameter control modules 502 are housed in the first cavity 608, and the control unit 200 is housed in the second cavity 610.

[0086] Specifically, parameter control module 504 is configured to correspond with test area 304, parameter control module 506 is configured to correspond with test area 306, and parameter control module 508 is configured to correspond with test area 308. When test area 304 is the first target test area, parameter control module 504 provides multiple target test parameters corresponding to the sensor type corresponding to test area 304 to the sensor under test 10 located in test area 304 according to the setting signal. When test area 306 is the first target test area, parameter control module 506 provides multiple target test parameters corresponding to the sensor type corresponding to test area 306 to the sensor under test 10 located in test area 306 according to the setting signal. When test area 308 is the first target test area, parameter control module 508 provides multiple target test parameters corresponding to the sensor type corresponding to test area 308 to the sensor under test 10 located in test area 308 according to the setting signal.

[0087] As an example, the parameter control module 502 includes a pressure source controller, a thermal radiation blackbody controller, and a humidity generator controller. The pressure source controller is correspondingly set to the pressure sensor test area, the thermal radiation blackbody controller is correspondingly set to the thermopile sensor test area, and the humidity generator controller is correspondingly set to the humidity sensor test area. When the sensor under test is a pressure sensor, the pressure source controller provides different target pressure test parameters to the sensor under test located in the pressure sensor test area according to the setting signal. For example, it provides different target pressure test parameters to sensors under test located at the same pressure test station, or provides different target pressure test parameters to sensors under test located at different pressure test stations, and provides the same target pressure test parameter to the same pressure test station.

[0088] See Figure 2 In one embodiment, the sensor testing equipment further includes: a plurality of connection units 606; the plurality of connection units 606 are respectively configured with a plurality of test areas 302; wherein, the control unit 200 is used to control the connection units 606 and the sensor under test 10 to obtain the characteristic data signal of the sensor under test 10 under the target test parameters.

[0089] Furthermore, the connection unit 606 includes a reciprocating cylinder device and a probe. The control unit 200 controls the reciprocating cylinder device to move back and forth, so as to drive the probe and the pin of the sensor under test 10 in the first target test area to contact or separate. When the probe and the pin of the sensor under test 10 are in contact, the control unit 200 acquires the characteristic data signal of the sensor under test 10 under the target test parameters. When the probe and the pin of the sensor under test 10 are separated, the control unit 200 stops acquiring the characteristic data signal of the sensor under test 10 under the target test parameters.

[0090] As an example, the probes include contact-type telescopic probes, which ensure good contact between the sensor under test (SUT) and the control unit 200 while preventing damage to the SUT. Furthermore, the probes are adjustable; by adjusting the spacing between the probes, the connection unit 606 can contact the pins of SUTs with different pin pitches, thus expanding the applicability of the sensor testing equipment.

[0091] As an example, the connecting units 606 are arranged at intervals along the first direction X. Furthermore, the connecting units 606 are respectively set to correspond to multiple test stations in the test area 302, thereby enabling individual testing of the test stations.

[0092] In one embodiment, the control unit 200 is further configured to calibrate the sensor under test 10 when the connection unit 606 and the sensor under test 10 are connected.

[0093] In one embodiment, the control unit 200 is further configured to mark the calibrated sensor under test 10 as a sensor to be retested; the control unit 200 is further configured to generate a retest transmission signal according to the sensor type of the sensor to be retested; the transmission unit 400 is further configured to transmit the sensor to be retested to a second target test area corresponding to the sensor type of the sensor to be retested according to the retest transmission signal; the setting unit 500 is further configured to provide retest test parameters to the sensor to be retested in the second target test area; the control unit 200 is further configured to acquire the retest characteristic data signal of the sensor to be retested located in the second target test area under the retest test parameters; the control unit 200 is further configured to determine the state of the sensor to be retested according to the retest characteristic data signal, the calibration information of the sensor to be retested, and the retest test parameters; wherein, the calibration information characterizes the correspondence between the test parameters and characteristic data signals of the sensor to be retested. It can be understood that the state of the sensor to be retested includes good and defective products.

[0094] Figure 4 This is a schematic diagram of the control unit structure in some embodiments, see [link / reference]. Figure 4In one embodiment, the control unit 200 includes: a controller 202, a level conversion module 204, a waveform generator 206, and an adapter module 208. The level conversion module 204 is connected to the controller 202 and the waveform generator 206, respectively, and is used to convert the received signals. The adapter module 208 is connected to the controller 202, the identification unit 100, the transmission unit 400, and the setting unit 500, respectively. The controller 202 is used to control the waveform generator 206 to send test waveform signals to the sensor under test 10, and to receive the output level signals of the sensor under test 10 under various target test parameters to obtain the characteristic data signals. The controller 202 is also used to control the waveform generator 206 to calibrate the sensor under test 10. The controller 202 is also used to receive the sensor type signal and send the calibration transmission signal and the setting signal. The level conversion module 204 and the waveform generator 206 enable the sensor testing equipment to be compatible with sensors under test with different communication interfaces.

[0095] Specifically, the controller 202 includes a microcontroller (MCU Core); the level conversion module 204 converts the signals sent by the controller 202 and sends them to the waveform generator 206, and also converts the characteristic data signals sent by the waveform generator 206 and sends them to the controller 202; the adapter module 208 is a communication adapter module that enables communication between the controller 202 and peripheral modules via UART and RS485. The peripheral modules include an identification unit 100, a transmission unit 400, a setting unit 500, and a connection unit 606; after the controller 202 controls the connection unit 606 to connect with the sensor under test 10; the waveform generator 206 and the sensor under test 10 are connected through the connection unit 606. The controller 202 controls the waveform generator 206 to send test waveform signals to the sensor under test 10 under the target test parameters, receives the output level signals output by the sensor under test 10 based on the received test waveform signals, and obtains the characteristic data signals corresponding to the target test parameters based on the output level signals. The controller 202 is also used to control the waveform generator 206 to send a calibration waveform signal to the sensor under test in order to calibrate the sensor under test 10.

[0096] See Figure 4The control unit 200 also includes a communication adapter 210, an industrial controller 212, and a communication module 214. The communication adapter 210 is connected to the controller 202 and the industrial controller 212 respectively, and is used to realize the communication connection between the controller 202 and the industrial controller 212. The communication adapter 210 enables the controller 202 and the industrial controller 212 to communicate via UART and USB. The communication module 214 is a module based on the TCP / IP industrial Ethernet protocol, and the communication between the industrial controller 212 and the central control server 612 is realized through the communication module 214.

[0097] Figure 3 The arrows in the diagram illustrate the transmission direction of the sensor 10 under test on the track structure 310; see [link / reference] Figure 2 , Figure 3 , Figure 4The following is an exemplary description of a sensor testing device, which includes: a setting unit 500, a support unit 300, and a connection unit 606 arranged sequentially along a third direction Z; the setting unit 500 includes a parameter control module 502, and parameter control modules 504, 506, and 508 are arranged along a first direction X; the support unit 300 includes multiple test areas 302, a "2"-shaped track structure 310, and a temperature chamber 314, the test areas 304, 306, and 308 are arranged along the first direction X, and the track structure 310 includes components arranged along the first direction X and integrally connected. The track substructures 3121, 3122, and 3123 are connected, and all three extend along the second direction Y. Three test stations 3041, 3042, and 3043 in test area 304 are arranged at intervals along the second direction Y on track substructure 3121. Three test stations 3061, 3062, and 3063 in test area 306 are arranged at intervals along the second direction Y on track substructure 3122. Three test stations 3081, 3082, and 3083 in test area 308 are arranged at intervals along the second direction Y on track substructure 3123. The test stations in the test area 302 and the parameter control module 502 in the same layer are arranged at intervals on the structure 3123. The multiple test areas 302 are located in the temperature chamber 314. When the temperature chamber 314 is at the target temperature, each test station in the temperature chamber 314 is also at the target temperature. The temperature chamber 314 is externally connected to liquid nitrogen or a heating wire. The controller 202 controls the liquid nitrogen and heating wire according to the heating signal to adjust the temperature of the temperature chamber 314. The connecting units 606 are arranged in a column along the first direction X and in a row along the second direction Y. Multiple connecting units 606 are arranged in a row. The test stations in the same test area 302 are respectively set up; assuming that the test area 304 is a pressure sensor test area, used to test the sensor under test which is a pressure sensor, the test stations 3041, 3042 and 3043 are all pressure test stations, which provide different target pressure test parameters to the sensor under test located at the test station. The test stations 3041, 3042 and 3043 are respectively located in three pressure source cavities arranged along the second direction Y. The parameter control module 504 is a pressure source controller, which controls the three pressure source cavities to be at different pressures according to the setting signal.Test area 306 is the thermopile sensor test area, used to test the sensor under test (SUT) which is a thermopile sensor. Test stations 3061, 3062, and 3063 are all thermal radiation test stations, providing different target thermal radiation test parameters to the SUT located at each test station. Test stations 3061, 3062, and 3063 are located in three thermopile cavities (thermal radiation blackbodies) arranged along the second direction Y. The parameter control module 506 is a thermal radiation blackbody controller, which controls the radiation intensity of the three thermal radiation sources according to the set signal, so that the thermopile cavities are subjected to different thermal radiation conditions. Radiation value; Test area 308 is the humidity sensor test area, used to test the sensor under test which is a humidity sensor. Test station 3081, test station 3082 and test station 3083 are all humidity test stations, which provide different target humidity test parameters to the sensor under test located at the test station. Test station 3081, test station 3082 and test station 3083 are located in three humidity chambers (humidity generators) arranged along the second direction Y. Parameter control module 508 is a humidity generator controller, which controls the humidity of the three humidity generators according to the setting signal, so that the humidity chambers are at different humidity values. In the first direction X, the control unit 200 is located in the second cavity 610 of the parameter control module 504 on the side away from the parameter control module 506, and the identification unit 100 is located on the side of the test area 304 away from the test area 306. The control unit 200 includes a controller 202, a level conversion module 204, a waveform generator 206, a converter module 208, a converter communication module 210, the identification unit 100, and a communication module 214. The controller 202 is connected to the pressure source controller, the thermal radiation blackbody controller, the humidity generator controller, the industrial camera 102, the temperature cavity 314, and the connection unit 606 through the converter module 208. The controller 202 and the waveform generator 206 are connected through the level conversion module 204, and the other end of the waveform generator 206 is connected to multiple connection units 606.

[0098] After the sensor under test 10 enters the testing equipment, the controller 202 controls the industrial camera 102 in the identification unit 100 to perform image recognition on the sensor under test 10. Based on the sensor's packaging type, the controller identifies the sensor type of the sensor under test 10. The identification unit 100 generates a sensing type signal based on the sensor type of the sensor under test 10 identified by the industrial camera 102 and sends it to the controller 202. The controller 202 controls the temperature chamber 314 to be at the first chamber temperature based on the heating signal. The controller 202 controls the sensor under test 10 to be transmitted along the track structure 310 to the testing station 3041. The controller 202 reads the stored information (ROM information) inside the sensor under test 10 located at the testing station 3041 to obtain the type stored information (flag information) characterizing the sensor type of the sensor under test 10. Among them, the flag information corresponding to the pressure sensor is 1; the flag information corresponding to the thermopile sensor is 2; and the flag information corresponding to the humidity sensor is 3. The controller 202 determines the sensor type of the sensor under test 10 based on the sensing type signal and the type stored information and generates a calibration transmission signal. The transmission unit 400 receives the calibration transmission signal sent by the controller 202 and transmits the sensor under test 10 along the track structure 310 to the first target test area corresponding to the calibration transmission signal among the multiple test areas 302. When the sensor under test 10 is a pressure sensor, the test area 304 is the first target test area. When the sensor under test 10 is at the test station 3041, the controller 202 sends a setting signal to the pressure source controller, and the pressure source controller provides the first target pressure to the sensor under test 10 located at the test station 3041 according to the setting signal. The test parameters are as follows: Controller 202 controls the reciprocating cylinder device in the connection unit 606 corresponding to the test station 3041 to move closer to the test station 3041. The probes in the connection unit 606 contact the test pins of the sensor under test 10 located at the test station 3041. Controller 202 controls the adjustment of the pin spacing between the probes in the connection unit 606 to match the spacing between the test pins of the sensor under test 10. Waveform generator 206 is connected to the test pins of the sensor under test 10 through connection unit 606. Controller 202 controls the waveform generator 206 to send a test waveform signal to the sensor under test 10 under the first target pressure test parameters, receives the output level signal output by the sensor under test 10 based on the received test waveform signal, and obtains the first characteristic data signal based on the output level signal. Controller 202 also controls the reciprocating cylinder device in the connection unit 606 corresponding to the test station 3041 to move away from the test station 3041, disconnecting the electrical connection between controller 202 and the sensor under test 10.The transmission unit 400 transmits the sensor under test 10 to the test station 3042 along the track structure 310. The pressure source controller provides the second target pressure test parameter to the sensor under test 10 located at the test station 3042 according to the setting signal. The controller 202 controls the reciprocating cylinder device in the connection unit 606 corresponding to the test station 3042 to move closer to the test station 3042. The probe in the connection unit 606 contacts the test pin of the sensor under test 10 located at the test station 3042. The controller 202 controls the adjustment of the pin spacing between the probes in the connection unit 606 to match the spacing between the test pins of the sensor under test 10. The waveform generator 206 is connected to the test pin of the sensor under test 10 through the connection unit 606. The controller 202 controls the waveform generator 206 to send a test waveform signal to the sensor under test 10 under the second target pressure test parameters, receives the output level signal output by the sensor under test 10 according to the received test waveform signal, and obtains the second characteristic data signal based on the output level signal. The controller 202 controls the reciprocating cylinder device in the connection unit 606 corresponding to the test station 3042 to move away from the test station 3042, disconnecting the electrical connection between the controller 202 and the sensor under test 10. Similarly, the transmission unit 400 transmits the sensor under test 10 to the test station 3043 along the track structure 310. The pressure source controller provides the third target pressure test parameters to the sensor under test 10 located at the test station 3043 according to the setting signal, and the controller 202 obtains the third characteristic data signal corresponding to the third target pressure test parameters. The transmission unit 400 transmits the sensor under test 10 to the discharge port along the track structure 310. The sensor under test 10 is then transmitted sequentially along the track structure 310 through track substructures 3122 and 3123 to the discharge port without stopping, obtaining the first characteristic data signal of the sensor under test 10 under the first target pressure test parameter, the second characteristic data signal under the second target pressure test parameter, and the third characteristic data signal under the third target pressure test parameter at the first chamber temperature. After the controller 202 controls the temperature chamber 314 to reach the second chamber temperature according to the heating signal, the above steps are repeated to obtain the fourth characteristic data signal of the sensor under test 10 under the first target pressure test parameter, the fifth characteristic data signal under the second target pressure test parameter, and the sixth characteristic data signal under the third target pressure test parameter at the second chamber temperature. At the third chamber temperature, the seventh characteristic data signal of the sensor under test 10 under the first target pressure test parameter, the eighth characteristic data signal under the second target pressure test parameter, and the ninth characteristic data signal under the third target pressure test parameter are obtained. The controller 202 obtains the target calibration curve of the sensor under test 10 based on multiple cavity temperatures, multiple target pressure test parameters and multiple characteristic data signals; and controls the waveform generator 206 to calibrate the sensor under test 10 according to the target calibration curve.

[0099] Figure 5 This is a flowchart illustrating the sensor testing method in some embodiments. See [link / reference] Figure 2 , Figure 3 and Figure 5 In this embodiment, a sensor testing method is provided, including:

[0100] S102 identifies the sensor type of the sensor under test and generates a sensor type signal.

[0101] After the sensor under test 10 enters the testing equipment from the feed port 602 of the sensor testing equipment, the identification unit 100 identifies the sensor type of the sensor under test 10 and generates a sensor type signal.

[0102] S104 generates a calibration transmission signal based on the sensor type signal.

[0103] The control unit 200 in the sensor testing equipment receives the sensing type signal and generates a calibration transmission signal based on the sensing type signal. The sensor testing equipment includes multiple test areas, and multiple test areas and sensors of various sensor types are respectively set up. The multiple test areas limit the sensor types of the sensor under test that the sensor testing equipment can test. The calibration transmission signal characterizes the position of the test area corresponding to the sensor type of the sensor under test 10.

[0104] S106, transmit the sensor under test to the first target test area corresponding to the calibration transmission signal among multiple test areas.

[0105] The transmission unit 400 in the sensor testing equipment transmits the sensor under test 10 to the first target test area corresponding to the calibration transmission signal among the multiple test areas of the testing equipment, according to the calibration transmission signal.

[0106] S108, acquire and provide multiple different target test parameters to the sensor under test located in the first target test area according to the setting signal.

[0107] The setting unit 500 in the sensor testing equipment acquires the setting signal and provides multiple different target test parameters to the sensor under test 10 located in the first target test area according to the setting signal. The number of target test parameters provided by the setting unit 500 to the sensor under test 10 in the first target test area is positively correlated with the accuracy of subsequent calibration of the sensor under test 10.

[0108] S110: Acquire the characteristic data signals of the sensor under test located in the first target test area under various target test parameters.

[0109] After the setting unit 500 in the sensor testing equipment provides a target test parameter to the sensor under test 10 in the first target test area, the position of the sensor under test 10 remains unchanged, and the control unit 200 in the sensor testing equipment acquires the characteristic data signal of the sensor under test 10 under the target test parameter; the setting unit 500 sequentially provides different target test parameters to the sensor under test 10 in the first target test area, and acquires the characteristic data signal corresponding to different target test parameters through the control unit 200; wherein, the number of characteristic data signals acquired by the control unit 200 is the same as the number of target test parameters, and multiple characteristic data signals correspond to multiple target test parameters respectively.

[0110] S112, calibrate the sensor under test according to the test parameters and characteristic data signals of each target.

[0111] The control unit 200 in the sensor testing equipment calibrates the sensor under test 10 according to multiple different target test parameters and multiple characteristic data signals, so as to write the correspondence between the test parameters and characteristic data signals of the sensor under test into the sensor under test 10.

[0112] In the aforementioned sensor testing method, the sensor under test is transmitted to a first target test area corresponding to the sensor type of the sensor under test among multiple test areas, according to the sensor type of the sensor under test. Multiple different target test parameters are provided to the sensor under test located in the first target test area, and the characteristic data signals of the sensor under test under each target test parameter are acquired. The sensor under test is calibrated according to each target test parameter and each characteristic data signal. The testing method in this application can realize the testing and calibration of sensors of various sensor types, simplifying the steps of the sensor testing method and reducing the probability of human error in the sensor testing process.

[0113] In one embodiment, the calibration of the sensor under test based on each target test parameter and each characteristic data signal includes steps S202-S204.

[0114] S202. Based on each target test parameter and each characteristic data signal, the target calibration curve is obtained. The target calibration curve represents the correspondence between the test parameters and the characteristic data signals.

[0115] S204, Write the target calibration curve into the sensor under test to calibrate the sensor under test.

[0116] Steps S202-S204 specifically involve the control unit 200 obtaining a target calibration curve based on multiple target test parameters and the corresponding characteristic data signals. For example, the target calibration curve is obtained through data fitting. The target calibration curve characterizes the correspondence between the test parameters and characteristic data signals of the sensor under test. The more target test parameters there are, the smaller the deviation between the obtained target calibration curve and the actual calibration curve of the sensor under test. Then, the control unit 200 writes the obtained target calibration curve into the sensor under test for calibration.

[0117] In one embodiment, generating a calibration transmission signal based on a sensing type signal includes: reading the stored information of the sensor under test to obtain type storage information characterizing the sensor type of the sensor under test; and generating a calibration transmission signal based on the type storage information and the sensing type signal. Generating a calibration sensing signal using the type storage information and the sensing type signal reduces the impact of deviations in identifying the sensing type of the sensor under test on the generated calibration transmission signal, thereby improving the accuracy of calibrating the sensor under test.

[0118] In one embodiment, acquiring the characteristic data signal of the sensor under test located in the first target test area under various target test parameters includes: acquiring the characteristic data signal of the sensor under test under various target test parameters in the first target test area under multiple different cavity temperatures; calibrating the sensor under test according to each target test parameter and each characteristic data signal includes: calibrating the sensor under test according to each target test parameter and each characteristic data signal under multiple cavity temperatures.

[0119] It should be understood that, although Figure 5 The steps in the flowchart are shown sequentially as indicated by the arrows, but these steps are not necessarily executed in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order in which these steps are executed, and they can be performed in other orders. Figure 5 At least some of the steps in the process may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but may be executed at different times. The execution order of these steps or stages is not necessarily sequential, but may be executed in turn or alternately with other steps or at least some of the steps or stages in other steps.

[0120] This disclosure provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the sensor testing method described above.

[0121] In one embodiment, a computer device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps of the sensor testing method described above.

[0122] Those skilled in the art will understand that all or part of the testing processes for the sensors described in the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments described above. Any references to memory, storage, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, or optical storage, etc. Volatile memory can include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc.

[0123] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features of the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0124] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A test apparatus for a sensor, characterized by, include: The identification unit is used to identify the sensor type of the sensor under test and generate a sensor type signal; A control unit is configured to receive and generate a calibration transmission signal based on the sensor type signal; The carrier unit includes multiple test areas corresponding to various sensor types; A transmission unit is used to transmit the sensor under test to a first target test area among the plurality of test areas that corresponds to the calibration transmission signal; A setting unit, corresponding to the carrying unit, is configured to acquire and provide multiple different target test parameters to the sensor under test located in the first target test area according to the setting signal; The control unit is used to acquire characteristic data signals of the sensor under test located in the first target test area under each of the target test parameters, and to calibrate the sensor under test according to each of the target test parameters and each of the characteristic data signals.

2. The test apparatus for a sensor according to claim 1, characterized by, The identification unit includes: An industrial camera is used to perform image recognition on the sensor under test to confirm the sensor type.

3. The test apparatus for a sensor according to claim 2, characterized in that, The control unit is also used to read the stored information of the sensor under test, obtain the type storage information characterizing the sensor type of the sensor under test, and generate the calibration transmission signal according to the type storage information and the sensor type signal.

4. The test apparatus for a sensor according to claim 1, characterized by, Each of the test areas includes multiple test stations spaced apart; The setting unit is used to provide different target test parameters to different test stations in the first target test area; the transmission unit is used to transmit the sensor under test sequentially to each of the test stations in the first target test area.

5. The test apparatus for a sensor according to claim 1, characterized by, The carrier unit includes: The track structure includes multiple track substructures arranged at intervals in a first direction and connected sequentially; the multiple test areas are respectively disposed on the multiple track substructures. The transmission unit controls the sensor under test to be transmitted along the track structure to the first target test area according to the calibration transmission signal.

6. The test apparatus of claim 1, wherein The carrier unit further includes: A temperature chamber, in which the plurality of test areas are housed; The control unit is also used to acquire and control the temperature chamber to be at different chamber temperatures according to the heating signal, so as to obtain the characteristic data signals of the sensor under test at different chamber temperatures.

7. The test apparatus of claim 1, wherein The setting unit includes: Multiple parameter control modules are configured to correspond to the multiple test areas respectively; The parameter control module corresponding to the first target test area is used to provide multiple target test parameters to the sensor under test located in the first target test area according to the setting signal.

8. The test apparatus of claim 1, wherein, Also includes: Multiple connection units are respectively configured to correspond to multiple test areas; The control unit is used to control the connection between the connection unit and the sensor under test, so as to obtain the characteristic data signal of the sensor under test under the target test parameters.

9. The test apparatus for a sensor according to claim 8, characterized in that, The control unit is also used to calibrate the sensor under test when the connection unit and the sensor under test are connected.

10. The test apparatus of claim 1, wherein, The control unit is further configured to mark the calibrated sensor under test as a sensor to be retested; the control unit is further configured to generate a retest transmission signal according to the sensor type of the sensor to be retested; the transmission unit is further configured to transmit the sensor to be retested to a second target test area corresponding to the sensor type of the sensor to be retested according to the retest transmission signal; the setting unit is further configured to provide retest test parameters to the sensor to be retested in the second target test area; the control unit is further configured to acquire the retest characteristic data signal of the sensor to be retested located in the second target test area under the retest test parameters; the control unit is further configured to determine the state of the sensor to be retested according to the retest characteristic data signal, the calibration information of the sensor to be retested, and the retest test parameters; The calibration information represents the correspondence between the test parameters and characteristic data signals of the sensor to be retested.

11. The test apparatus of claim 1, wherein, The control unit includes: a controller, a level conversion module, a waveform generator, and an adapter module; The level conversion module is connected to the controller and the waveform generator respectively, and is used to convert the received signal; the conversion module is connected to the controller, the identification unit, the transmission unit and the setting unit respectively. The controller is configured to control the waveform generator to send a test waveform signal to the sensor under test, and to receive the output level signal of the sensor under test under each of the target test parameters to obtain the characteristic data signal; the controller is also configured to control the waveform generator to calibrate the sensor under test; the controller is also configured to receive the sensor type signal, and to send the calibration transmission signal and the setting signal.

12. A method of testing a sensor, characterized by, include: Identify the sensor type of the sensor under test and generate a sensor type signal; A calibration transmission signal is generated based on the sensor type signal; The sensor under test is transmitted to the first target test area corresponding to the calibration transmission signal in one of the multiple test areas; Acquire and provide multiple different target test parameters to the sensor under test located in the first target test area according to the setting signal; Acquire characteristic data signals of the sensor under test located in the first target test area under each of the target test parameters; The sensor under test is calibrated based on the target test parameters and characteristic data signals.

13. The method of testing a sensor of claim 12, wherein, The calibration of the sensor under test based on each of the target test parameters and each of the characteristic data signals includes: Based on each of the target test parameters and each of the characteristic data signals, a target calibration curve is obtained, wherein the target calibration curve characterizes the correspondence between the test parameters and the characteristic data signals; The target calibration curve is written into the sensor under test to calibrate the sensor under test.

14. A computer readable storage medium having stored thereon a computer program, characterized in that, When the computer program is executed by the processor, it implements the steps of the testing method for the sensor as described in claim 12 or 13.

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