Transverse bright line defect detection method, device, equipment and storage medium

Abstract

The application discloses a transverse bright line defect detection method and device, equipment and a storage medium, and relates to the technical field of image processing. The method comprises the following steps: acquiring original image information; processing a preset cropping region image based on detection channel information in the original image information to obtain image processing information and corresponding background information; determining difference information based on the image processing information and the background information; calculating the energy parameters of each row based on the difference information to determine energy parameter information; and iteratively detecting corresponding transverse bright line defect indicators based on the energy parameter information until a preset termination condition is met to obtain a transverse bright line defect indicator detection result. The preset cropping region image is processed to iteratively detect the transverse bright line defect indicators until the termination condition is met, so that the real bright line and the abnormality can be effectively distinguished without additional targets, and the defects can be accurately detected under low computing power conditions.

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