Novel special sample table for freezing scanning electron microscope
By designing an adjustable cryo-scanning electron microscope (CSE) stage, the problem of strict requirements on sample size and shape was solved, enabling adaptability to testing multiple samples and simplifying fixation, while reducing consumable costs.
Patent Information
- Application Number
- CN202423161182.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-20
- Publication Date
- 2025-12-23
- Estimated Expiration
- 2034-12-20
AI Technical Summary
Existing cryo-scanning electron microscopes have stage designs that can only accommodate 3mm microgratings that are pressed against the C-clip ring, which imposes strict requirements on sample size and morphology, and the consumables are expensive, thus limiting the range of samples that can be tested.
A novel sample stage for cryo-scanning electron microscopy has been designed, comprising square and circular sample slots. The adjustability of the sample slots is achieved through an adjustable slide, an adjusting ring, and a spring structure, avoiding the use of cumbersome cryo-conductive adhesive for fixation.
It expands the testing range of samples, adapts to samples of different sizes and types, simplifies the fixation process, and reduces costs.
Smart Images
Figure CN223711640U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to experimental equipment technical field, concretely is a novel sample stage special for frozen scanning electron microscope. BACKGROUND
[0002] Cryo-electron microscopy was proposed in the 1970s. Aquilos is a multifunctional scanning electron microscope applied to observing the micro-morphology of biological samples in a low-temperature state (-181 DEG C) and carrying out micro-nano processing to prepare for further characterization under a cryo-transmission electron microscope. However, due to the special structure of the electron microscope and the sensitive nature of the sample, many liquid samples, semi-liquid samples, samples with instability sensitive to the electron beam, and magnetic material samples are difficult to characterize under normal temperature conditions without damaging the sample and the instrument. Therefore, it is desirable to characterize such samples under cryogenic conditions. However, the current design of the Aquilos cryogenic sample stage can only hold a 3mm micro-grid pressed by a C-clip ring, so it can only be used for samples that can be prepared on the micro-grid, and the size and shape of the sample are strictly required. Moreover, the C-clip ring is expensive, so many samples cannot be tested.
[0003] Therefore, the present application proposes to modify the sample stage to expand the characterization efficiency and application range of the electron microscope. SUMMARY
[0004] (I) Technical problem solved
[0005] In view of the deficiencies of the prior art, the utility model provides a novel sample stage special for frozen scanning electron microscope, which solves the problems proposed in the background.
[0006] (II) Technical scheme
[0007] To achieve the above purpose, the utility model discloses a novel sample stage special for frozen scanning electron microscope, which comprises a base and a sample stage body, the upper surface of the sample stage body is provided with a square sample groove, the inside of the square sample groove is slidably connected with an adjusting slide plate, the inside of the sample stage body is provided with an adjusting bin, the inside of the adjusting bin is provided with a supporting shaft, the outer surface of the supporting shaft is rotatably connected with an adjusting gear, the outer surface of the adjusting gear is engaged with an adjusting rack, one end of the adjusting rack is provided with a connecting plate, one end of the connecting plate is arranged on the outer surface of the adjusting slide plate, the inner wall of the adjusting bin is provided with a limiting slide rod, the limiting slide rod is slidably connected to one end of the connecting plate, one end of the limiting slide rod is provided with a limiting piece, the upper surface of the sample stage body is provided with a circular sample groove, the inside of the circular sample groove is sleeved with a first adjusting ring, and the inside of the first adjusting ring is sleeved with a second adjusting ring.
[0008] Optionally, the upper surface of the sample stage body is provided with an adjusting sliding groove, a connecting sliding block is slidably connected in the adjusting sliding groove, the connecting sliding block is arranged on the upper surface of the adjusting rack, a sliding groove is formed in the connecting sliding block, a guide sliding rod is arranged in the sliding groove, a control sliding block is slidably connected to the outer surface of the guide sliding rod, and a first spring is arranged on the outer surface of the control sliding block.
[0009] Optionally, the upper surface of the sample stage body is provided with a limiting frame, a limiting clamping groove is formed in the limiting frame, and the position of the limiting clamping groove is matched with the position of the control sliding block.
[0010] Optionally, the number of the adjusting sliding plates and the adjusting racks is two, and the two adjusting racks are symmetrically arranged about the center of the adjusting gear.
[0011] Optionally, the lower surface of the first adjusting ring is provided with a fixed sliding rod, a limiting piece is arranged at the end of the fixed sliding rod away from the first adjusting ring, a second spring is arranged on the outer surface of the limiting piece, and the end of the second spring away from the limiting piece is arranged on the lower surface of the sample stage body.
[0012] Optionally, the inside of the sample stage body is provided with an adjusting groove, a plug-in rod is slidably connected in the adjusting groove, a positioning piece is arranged on the outer surface of the plug-in rod, a control ring is arranged at one end of the plug-in rod, a limiting insertion hole is formed in the first adjusting ring, and the position of the limiting insertion hole is matched with the position of the plug-in rod.
[0013] Optionally, the outer structure of the second adjusting ring is the same as that of the first adjusting ring.
[0014] Optionally, the upper surface of the sample stage body is provided with a supporting sliding rod, a sliding ring is sleeved on the outer surface of the supporting sliding rod, an adjusting pressing piece is rotatably connected to the outer surface of the sliding ring, a third spring is arranged on the outer surface of the adjusting ring, a limiting seat is arranged at the end of the third spring away from the adjusting ring, and the limiting seat is arranged at the upper end of the supporting sliding rod.
[0015] Optionally, the upper surface of the base is provided with a connecting seat, a connecting shaft is rotatably connected in the connecting seat, and the sample stage body is arranged at the upper end of the rotating shaft.
[0016] The novel frozen scanning electron microscope special sample stage has the following beneficial effects:
[0017] 1. The novel frozen scanning electron microscope special sample stage has the effects of facilitating the testing of samples of different sizes and types, due to the cooperation of the square sample groove, the adjusting sliding plate, the circular sample groove, the first adjusting ring and the second adjusting ring.
[0018] 2. The novel sample stage for the frozen scanning electron microscope has the effect of avoiding the complicated frozen conductive glue fixing process through the cooperation of the supporting slide rod, the adjusting ring, the adjusting pressing sheet and the third spring. BRIEF DESCRIPTION OF DRAWINGS
[0019] Figure 1 It is a three-dimensional structure schematic diagram of the utility model;
[0020] Figure 2 It is a three-dimensional structure schematic diagram of the utility model Figure 1 It is an enlarged structure schematic diagram of A in the utility model;
[0021] Figure 3 It is an internal structure schematic diagram of the sample stage body from the top view of the utility model;
[0022] Figure 4 It is an internal structure schematic diagram of the circular sample groove in the sample stage body of the utility model;
[0023] Figure 5 It is a top view structure schematic diagram of the utility model;
[0024] Figure 6 It is a side view structure schematic diagram of the utility model.
[0025] In the drawing: 1, base; 2, sample stage body; 3, square sample groove; 4, adjusting slide plate; 5, adjusting gear; 6, adjusting rack; 7, limiting slide rod; 8, circular sample groove; 9, first adjusting ring; 10, second adjusting ring; 11, connecting slide block; 12, control slide block; 13, first spring; 14, limiting frame; 15, limiting clamping groove; 16, fixed slide rod; 17, second spring; 18, control ring; 19, plug-in rod; 20, limiting insertion hole; 21, sliding ring; 22, adjusting pressing sheet; 23, third spring; 24, connecting seat; 25, connecting shaft. DETAILED DESCRIPTION
[0026] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all the embodiments.
[0027] EMBODIMENT
[0028] The utility model provides a novel sample stage special for frozen scanning electron microscope, including base 1 and sample stage body 2, the upper surface of sample stage body 2 is provided with square sample groove 3, the inside sliding connection of square sample groove 3 has the adjusting sliding plate 4, the inside of sample stage body 2 is opened and has the adjusting storehouse, the inside of adjusting storehouse is provided with support axle rod, the outer surface of support axle rod is rotatably connected with adjusting gear 5, the outer surface of adjusting gear 5 is engaged with adjusting rack 6, and one end of adjusting rack 6 is provided with connecting plate, and one end of connecting plate is set on the outer surface of adjusting sliding plate 4, and the inner wall of adjusting storehouse is provided with limiting slide rod 7, and limiting slide rod 7 is slidingly connected at one end of connecting plate, and one end of limiting slide rod 7 is provided with limiting sheet, and the upper surface of sample stage body 2 is opened and has circular sample groove 8, and the inside of circular sample groove 8 is sleeved with first adjusting ring 9, and the inside of first adjusting ring 9 is sleeved with second adjusting ring 10, and the upper surface of sample stage body 2 is opened and has adjusting sliding slot, and the inside of adjusting sliding slot is slidingly connected with connecting sliding block 11, and connecting sliding block 11 is set on the upper surface of adjusting rack 6, and the inside of connecting sliding block 11 is opened and has sliding groove, and the inside of sliding groove is provided with guide slide rod, and the outer surface of guide slide rod is slidingly connected with control sliding block 12, and the outer surface of control sliding block 12 is provided with first spring 13, and one end of first spring 13 away from control sliding block 12 is set on the inner wall of sliding groove, and the upper surface of sample stage body 2 is provided with limiting frame 14, and the inside of limiting frame 14 is opened and has limiting clamping groove 15, and the position of limiting clamping groove 15 is adapted to the position of control sliding block 12, and the number of adjusting sliding plate 4 and adjusting rack 6 is two, and two adjusting rack 6 are about the center of adjusting gear 5 symmetry, and the lower surface of first adjusting ring 9 is provided with fixed slide rod 16, and one end of fixed slide rod 16 away from first adjusting ring 9 is provided with limiting sheet, and the outer surface of limiting sheet is provided with second spring 17, and one end of second spring 17 away from limiting sheet is set on the lower surface of sample stage body 2, and the inside of sample stage body 2 is opened and has adjusting groove, and the inside of adjusting groove is slidingly connected with plug-in rod 19, and the outer surface of plug-in rod 19 is provided with positioning sheet, and one end of plug-in rod 19 is provided with control ring 18, and the inside of first adjusting ring 9 is opened and has limiting insertion hole 20, and the position of limiting insertion hole 20 is adapted to the position of plug-in rod 19, and the external structure of second adjusting ring 10 is same with the external structure of first adjusting ring 9, and the upper surface of sample stage body 2 is provided with support slide rod, and the outer surface of support slide rod is sleeved with sliding ring 21, and the outer surface of sliding ring 21 is rotatably connected with adjusting wafer 22, and the outer surface of adjusting ring is provided with third spring 23, and one end of third spring 23 away from adjusting ring is provided with limiting seat, and limiting seat is set on the upper end of support slide rod, and the upper surface of base 1 is provided with connecting seat 24, and connecting seat 24 is rotatably connected with connecting shaft 25 in the inside, and sample stage body 2 is set on the upper end of rotating shaft.
[0029] In order to make the new type of frozen scanning electron microscope special sample table has the effect of convenient different size and type sample test and make the new type of frozen scanning electron microscope special sample table has the effect of avoiding using complex frozen conductive glue fixed process, as shown in the figure Figures 1-6 As shown in the figure, the application adopts the following structure: through the cooperation of the square sample groove 3, the adjusting slide plate 4, the circular sample groove 8, the first adjusting ring 9 and the second adjusting ring 10, the support slide rod, the adjusting ring, the adjusting pressing piece 22 and the third spring 23, in the process of use, by observing the size of the sample, then sliding the control slide block 12, extruding the first spring 13, making the control slide block 12 disengage from the corresponding limiting clamping groove 15, then sliding the control slide block 12, driving the adjusting rack 6 to slide, driving the adjusting slide plate 4 to slide, thereby changing the position of the adjusting slide plate 4 in the square sample groove 3, changing the size of the sample groove (under the action of the adjusting gear 5, cooperating with the adjusting rack 6, making the two adjusting slide plates 4 slide in opposite directions synchronously), after the change is completed, the control slide block 12 is loosened, under the elastic force of the first spring 13, the control slide block 12 is clamped into the corresponding limiting clamping groove 15, fixing the position of the adjusting slide plate 4, then the corresponding sample is placed into the square sample groove 3, then the sliding ring 21 is slid, extruding the third spring 23, making the adjusting pressing piece 22 move above the sample, then rotating the adjusting pressing piece 22, making the adjusting pressing piece 22 rotate directly above the square sample groove 3, loosening the sliding ring 21, under the elastic force of the third spring 23, the adjusting pressing piece 22 is pressed tightly against the sample, fixing it, similarly, when the circular sample groove 8 needs to be used, by observing the size of the sample, then by pressing the second adjusting ring 10 (or simultaneously pressing the first adjusting ring 9 and the second adjusting ring 10), the second adjusting ring 10 is pressed into the inside of the sample table body 2 (the upper side of the second adjusting ring 10 is flush with the circular sample groove 8 at this time), stretching the second spring 17, then by controlling the ring 18 to push the plug-in rod 19, making the plug-in rod 19 plug into the corresponding limiting insertion hole 20 (the fixed slide rod 16 and the plug-in rod 19 are mutually staggered), fixing the position of the second adjusting ring 10, thereby changing the position of the circular sample groove 8, after completion, the corresponding sample is placed into the circular sample groove 8, then the sliding ring 21 is slid, extruding the third spring 23, making the adjusting pressing piece 22 move above the sample, then rotating the adjusting pressing piece 22, making the adjusting pressing piece 22 rotate directly above the circular sample groove 8, loosening the sliding ring 21, under the elastic force of the third spring 23, the adjusting pressing piece 22 is pressed tightly against the sample, fixing it, thereby making the new type of frozen scanning electron microscope special sample table have the effect of convenient different size and type sample test and making the new type of frozen scanning electron microscope special sample table have the effect of avoiding using complex frozen conductive glue fixed process.
[0030] The above merely describes a preferred embodiment of the present application, and the protection scope of the present application is not limited thereto, and any skilled person in the art, according to the technical scheme and the inventive concept of the present application, makes equivalent replacement or change within the technical range disclosed by the present application, which should be covered within the protection scope of the present application.
Claims
1. A novel cryo-scanning electron microscope dedicated sample stage comprising a base and a sample stage body, characterized in that: The upper surface of the sample stage body is provided with a square sample groove, the inside of the square sample groove is slidably connected with an adjusting sliding plate, the inside of the sample stage body is provided with an adjusting bin, the inside of the adjusting bin is provided with a supporting shaft, the outer surface of the supporting shaft is rotatably connected with an adjusting gear, the outer surface of the adjusting gear is engaged with an adjusting rack, one end of the adjusting rack is provided with a connecting plate, one end of the connecting plate is arranged on the outer surface of the adjusting sliding plate, the inner wall of the adjusting bin is provided with a limiting slide rod, the limiting slide rod is slidably connected at one end of the connecting plate, one end of the limiting slide rod is provided with a limiting piece, the upper surface of the sample stage body is provided with a circular sample groove, the inside of the circular sample groove is sleeved with a first adjusting ring, the inside of the first adjusting ring is sleeved with a second adjusting ring.
2. A novel cryo scanning electron microscope (SEM) dedicated sample stage as claimed in claim 1, wherein: The upper surface of the sample stage body is provided with an adjusting sliding groove, the inside of the adjusting sliding groove is slidably connected with a connecting sliding block, the connecting sliding block is arranged on the upper surface of the adjusting rack, the inside of the connecting sliding block is provided with a sliding groove, the inside of the sliding groove is provided with a guide slide rod, the outer surface of the guide slide rod is slidably connected with a control sliding block, the outer surface of the control sliding block is provided with a first spring, one end of the first spring away from the control sliding block is arranged on the inner wall of the sliding groove.
3. A novel cryo scanning electron microscope dedicated sample stage as claimed in claim 1, wherein: The upper surface of the sample stage body is provided with a limiting frame, the inside of the limiting frame is provided with a limiting clamping groove, the position of the limiting clamping groove is matched with the position of the control sliding block.
4. A novel cryo-scanning electron microscope (SEM) sample holder as claimed in claim 1, wherein: The number of the adjusting sliding plate and the adjusting rack is two, the two adjusting racks are symmetrically arranged about the center of the adjusting gear.
5. A novel cryo-scanning electron microscope (SEM) sample holder as claimed in claim 1, wherein: The lower surface of the first adjusting ring is provided with a fixed slide rod, one end of the fixed slide rod away from the first adjusting ring is provided with a limiting piece, the outer surface of the limiting piece is provided with a second spring, one end of the second spring away from the limiting piece is arranged on the lower surface of the sample stage body.
6. A novel cryo-scanning electron microscope (SEM) sample holder as claimed in claim 1, wherein: The inside of the sample stage body is provided with an adjusting groove, the inside of the adjusting groove is slidably connected with a plug-in rod, the outer surface of the plug-in rod is provided with a positioning piece, one end of the plug-in rod is provided with a control ring, the inside of the first adjusting ring is provided with a limiting insertion hole, the position of the limiting insertion hole is matched with the position of the plug-in rod.
7. A novel cryo scanning electron microscope dedicated sample stage as claimed in claim 1, wherein: The outer structure of the second adjusting ring is same with the outer structure of the first adjusting ring.
8. A novel cryo-scanning electron microscope (SEM) sample holder as claimed in claim 1, wherein: The upper surface of the sample stage body is provided with a supporting slide rod, the outer surface of the supporting slide rod is sleeved with a sliding ring, the outer surface of the sliding ring is rotatably connected with an adjusting pressing piece, the outer surface of the adjusting ring is provided with a third spring, one end of the third spring away from the adjusting ring is provided with a limiting seat, the limiting seat is arranged at the upper end of the supporting slide rod.
9. A novel cryo scanning electron microscope dedicated sample stage as claimed in claim 1, wherein: The upper surface of the base is provided with a connecting seat, the inside of the connecting seat is rotatably connected with a connecting shaft, the sample stage body is arranged at the upper end of the rotating shaft.