Large-breadth assembly PL test system

Abstract

The utility model relates to the field of photovoltaic cell panel testing, and discloses a large-breadth assembly PL testing system which comprises a profile frame, two ends of the profile frame are fixedly connected with first linear guide rails, and the top ends of the first linear guide rails are connected with metal plate supporting vertical plates in a front-back sliding mode. A first linear guide rail is fixedly connected to the top end of the metal plate supporting vertical plate, a rectangular groove is formed in the middle of the second linear guide rail, a ruler is fixedly connected to the front end of the second linear guide rail, and the first linear guide rail, the metal plate supporting vertical plate, the second linear guide rail, a Y-axis crank handle and an X-axis lead screw are arranged; the positions of the optical fiber coupling laser and the CCD infrared camera can be adjusted, the operation is simple, and the movable range is not less than 1000 * 1000 mm.

Description

Technical Field

[0001] This utility model relates to the field of photovoltaic panel testing, specifically a large-format module PL testing system. Background Technology

[0002] In recent years, the photovoltaic industry has experienced rapid development. To pursue higher efficiency and reduce production costs, the industry's production processes and technologies are constantly evolving. During the production of photovoltaic panels, problems such as microcracks, uneven diffusion, and false printing may occur. These defects can affect the photoelectric conversion efficiency of photovoltaic cells, reduce cell lifespan, and impact the stability of the photovoltaic system. Photoluminescence (PL) testing can detect and analyze various process stages, including silicon wafers, diffusion, etching, electrode printing, and cell fabrication. It can quickly and effectively locate problems in the production process, providing a reliable guarantee for product quality. The principle of PL photoluminescence is as follows: using a laser of a specific wavelength as the excitation source, it provides photons of a certain energy. Ground-state electrons in the silicon wafer absorb these photons and enter the excited state, releasing near-infrared light with a peak at around 1150nm. A high-sensitivity, high-resolution CCD infrared camera is then used for photosensitive imaging. After imaging, the light intensity is proportional to the non-equilibrium minority carrier concentration at the corresponding location. Since defects will reduce the minority carrier concentration in the region, thus weakening its fluorescence effect, it will appear as dark dots, lines or certain areas after imaging. Therefore, photoluminescence can be used to determine whether there are defects, impurities, and other factors that ultimately affect the battery efficiency.

[0003] Traditional EL testing methods are inefficient, inconvenient, and inaccurate. With the increasing prevalence of cadmium telluride and perovskite solar cells and the gradual increase in module size, EL testing methods are becoming more limited. Therefore, a large-format module PL testing system is proposed to address these issues. Utility Model Content

[0004] The purpose of this invention is to provide a large-format component PL testing system to solve the problems mentioned in the background art.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a large-format component PL testing system, comprising a profile frame,

[0006] The two ends of the profile frame are fixedly connected to a first linear guide rail. The top of the first linear guide rail is slidably connected to a sheet metal support plate. The top of the sheet metal support plate is fixedly connected to a second linear guide rail. A rectangular groove is provided in the middle of the second linear guide rail. A ruler is fixedly connected to the front end of the second linear guide rail.

[0007] Furthermore, a bracket is fixedly connected to the middle top of the profile frame, and a first support plate is fixedly connected to one side of the top of the bracket.

[0008] Furthermore, a Y-axis lead screw is rotatably connected to the middle of the first support plate, and a Y-axis hand crank is fixedly connected to the front end of the Y-axis lead screw.

[0009] Furthermore, the Y-axis lead screw is threaded with a first ball nut seat in the middle, and a U-shaped connecting plate is fixedly connected to the bottom end of the first ball nut seat. The bottom end of the U-shaped connecting plate is fixedly connected to both ends of the second linear guide rail.

[0010] Furthermore, a second support plate is fixedly connected to the left and right ends of the second linear guide rail, and an X-axis lead screw is rotatably connected to the middle of the second support plate. An X-axis hand crank is fixedly connected to both ends of the X-axis lead screw.

[0011] Furthermore, the X-axis lead screw is threaded with a second ball nut seat in the middle, and a slider is fixedly connected to the bottom end of the second ball nut seat. The slider is slidably connected to the second linear guide rail.

[0012] Furthermore, a profile connecting base plate is fixedly connected to the bottom end of the slider, and a camera mounting base plate is fixedly connected to one end of the profile connecting base plate.

[0013] Furthermore, a CCD infrared camera is fixedly connected to one side of the camera mounting base, and a 25mm lens is fixedly connected to the bottom of the CCD infrared camera.

[0014] Furthermore, one end of the profile connecting base plate is rotatably connected to a laser fixture via a fixed shaft.

[0015] Furthermore, the intermediate clamp of the laser fixture holds an optical fiber coupled laser.

[0016] Compared with the prior art, the beneficial effects of this utility model are:

[0017] By setting up a first linear guide rail, a sheet metal support plate, a second linear guide rail, a Y-axis hand crank, and an X-axis lead screw, the positions of the fiber-coupled laser and the CCD infrared camera can be adjusted via the X / Y-axis hand crank. The operation is simple, and the movable range is no less than 1000x1000mm. By setting up the fiber-coupled laser and the CCD infrared camera, a laser of a specific wavelength is used as the excitation source to provide photons of a certain energy. After absorbing these photons, the ground-state electrons in the silicon wafer enter the excited state and release near-infrared light with a peak at around 1150nm. Then, a high-sensitivity, high-resolution camera is used for photosensitive imaging. After imaging, the light intensity is proportional to the non-equilibrium minority carrier concentration at the corresponding location. Since defects will reduce the minority carrier concentration in the region, thus weakening its fluorescence effect, it will appear as dark dots, lines or certain areas after imaging. Therefore, photoluminescence can be used to determine whether there are defects, impurities and other factors that ultimately affect the cell efficiency. It is efficient, convenient and accurate. Moreover, with the popularization of cadmium telluride and perovskite solar cells, the module size is gradually increasing, and the demand for PL testing equipment is increasing. Attached Figure Description

[0018] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort. In all drawings, similar elements or parts are generally identified by similar reference numerals. In the drawings, the elements or parts are not necessarily drawn to scale.

[0019] Figure 1 This is a three-dimensional structural diagram of the present invention;

[0020] Figure 2 This is a schematic diagram of the front structure of this utility model;

[0021] Figure 3 This is a top view of the structure of this utility model;

[0022] Figure 4 This is a partial three-dimensional structural diagram of the present invention.

[0023] In the diagram: 1. Profile frame; 2. First linear guide rail; 3. Sheet metal support plate; 4. Second linear guide rail; 5. Ruler; 6. Bracket; 7. First support plate; 8. Y-axis lead screw; 9. Y-axis hand crank; 10. First ball nut seat; 11. U-shaped connecting plate; 12. Second support plate; 13. X-axis lead screw; 14. Second ball nut seat; 15. Slider; 16. Profile connecting base plate; 17. Camera mounting base plate; 18. CCD infrared camera; 19. 25mm lens; 20. Laser fixture; 21. Fiber-coupled laser; 22. X-axis hand crank. Detailed Implementation

[0024] In the description of this utility model, it should be noted that the terms "upper," "lower," "inner," "outer," "front end," "rear end," "both ends," "one end," and "the other end," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model. In addition, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0025] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installed," "equipped with," and "connected," etc., should be interpreted broadly. For example, "connected" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be a connection within two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0026] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0027] Please see Figure 1-4This utility model provides a technical solution for a large-format component PL testing system: A large-format component PL testing system includes a profile frame 1, with first linear guide rails 2 fixedly connected to both ends of the profile frame 1. By setting the first linear guide rail 2, sheet metal support plate 3, second linear guide rail 4, Y-axis hand crank 9, and X-axis lead screw 13, the positions of the fiber-coupled laser 21 and the CCD infrared camera 18 can be adjusted via the X / Y axis hand crank 9. The system is simple to operate and allows for a movable range of not less than 1000x1000mm. The top of the first linear guide rail 2 is slidably connected to the sheet metal support plate 3. A second linear guide rail 4 is fixedly connected to the top of plate 3. A rectangular groove is provided in the middle of the second linear guide rail 4. A scale 5 is fixedly connected to the front end of the second linear guide rail 4. A bracket 6 is fixedly connected to the top of the middle of the profile frame 1. A first support plate 7 is fixedly connected to one side of the top of the bracket 6. A Y-axis screw 8 is rotatably connected to the middle of the first support plate 7. A Y-axis hand crank 9 is fixedly connected to the front end of the Y-axis screw 8. A first ball nut seat 10 is threadedly connected to the middle of the Y-axis screw 8. A U-shaped connecting plate 11 is fixedly connected to the bottom end of the first ball nut seat 10. The bottom end of the U-shaped connecting plate 11 is fixedly connected to both ends of the second linear guide rail 4.

[0028] The left and right ends of the second linear guide rail 4 are respectively fixedly connected to the second support plate 12. The middle of the second support plate 12 is rotatably connected to the X-axis lead screw 13. The left and right ends of the X-axis lead screw 13 are fixedly connected to the X-axis hand crank 22. The middle of the X-axis lead screw 13 is threadedly connected to the second ball nut seat 14. The bottom end of the second ball nut seat 14 is fixedly connected to the slider 15. The slider 15 is slidably connected to the second linear guide rail 4. The bottom end of the slider 15 is fixedly connected to the profile connecting base plate 16. One end of the profile connecting base plate 16 is fixedly connected to the camera mounting base plate 17. One side of the camera mounting base plate 17 is fixedly connected to... There is a CCD infrared camera 18, and a 25mm lens 19 is fixedly connected to the bottom of the CCD infrared camera 18. One end of the profile connecting base plate 16 is rotatably connected to a laser fixture 20 through a fixed shaft. The middle clamp of the laser fixture 20 holds a fiber-coupled laser 21. By setting up the fiber-coupled laser and the CCD infrared camera 18, a laser of a specific wavelength is used as an excitation source to provide photons of a certain energy. After absorbing these photons, the ground-state electrons in the silicon wafer enter the excited state and release near-infrared light with a peak of about 1150nm. Then, a high-sensitivity and high-resolution camera is used for photosensitive imaging. After imaging, the light intensity is proportional to the non-equilibrium minority carrier concentration at the corresponding location. Since defects will reduce the minority carrier concentration in the region, thus weakening its fluorescence effect, it will appear as dark dots, lines or certain areas after imaging. Therefore, photoluminescence can be used to determine whether there are defects, impurities and other factors that ultimately affect the cell efficiency. It is efficient, convenient and accurate. Moreover, with the popularization of cadmium telluride and perovskite solar cells, the module size is gradually increasing, and the demand for PL testing equipment is increasing.

[0029] In use, this utility model is equipped with a first linear guide rail 2, a sheet metal support plate 3, a second linear guide rail 4, a Y-axis hand crank 9, and an X-axis lead screw 13. The positions of the fiber-coupled laser 21 and the CCD infrared camera 18 can be adjusted via the X / Y axis hand crank 9. The operation is simple, and the movable range is not less than 1000x1000mm. By setting up the fiber-coupled laser and the CCD infrared camera 18, a laser of a specific wavelength is used as the excitation source to provide photons of a certain energy. After absorbing these photons, the ground-state electrons in the silicon wafer enter the excited state and release near-infrared light with a peak at about 1150nm. Then, a high-sensitivity, high-resolution camera is used for photosensitive imaging. After imaging, the light intensity is proportional to the non-equilibrium minority carrier concentration at the corresponding location. Since defects will reduce the minority carrier concentration in the region, thus weakening its fluorescence effect, it will appear as dark dots, lines or certain areas after imaging. Therefore, photoluminescence can be used to determine whether there are defects, impurities and other factors that ultimately affect the cell efficiency. It is efficient, convenient and accurate. Moreover, with the popularization of cadmium telluride and perovskite solar cells, the module size is gradually increasing, and the demand for PL testing equipment is increasing.

[0030] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A large-format component PL test system, comprising a profile frame (1), characterized in that: Both ends of the profile frame (1) are fixedly connected with first linear guides (2), the top ends of the first linear guides (2) are slidably connected with sheet metal support vertical plates (3) from front to back, the top ends of the sheet metal support vertical plates (3) are fixedly connected with second linear guides (4), the middle of the second linear guides (4) is provided with a rectangular groove, and the front end of the second linear guides (4) is fixedly connected with a scale (5).

2. The large format assembly PL test system of claim 1, wherein: The middle top end of the profile frame (1) is fixedly connected with a support (6), and the top end of one side of the support (6) is fixedly connected with a first support plate (7).

3. The large format assembly PL test system of claim 2, wherein: The middle of the first support plate (7) is rotatably connected with a Y-axis lead screw (8), and the front end of the Y-axis lead screw (8) is fixedly connected with a Y-axis hand crank (9).

4. The large format assembly PL test system of claim 3, wherein: The middle of the Y-axis lead screw (8) is threadedly connected with a first ball nut seat (10), the bottom end of the first ball nut seat (10) is fixedly connected with a U-shaped connecting plate (11), and the bottom end of the U-shaped connecting plate (11) is fixedly connected with both ends of the second linear guide (4).

5. The large format assembly PL test system of claim 1, wherein: Both ends of the second linear guide (4) are fixedly connected with second support plates (12), respectively, the middle of each second support plate (12) is rotatably connected with an X-axis lead screw (13), and both ends of the X-axis lead screw (13) are fixedly connected with X-axis hand cranks (22).

6. The large format assembly PL test system of claim 5, wherein: The middle of the X-axis lead screw (13) is threadedly connected with a second ball nut seat (14), the bottom end of the second ball nut seat (14) is fixedly connected with a sliding block (15), and the sliding block (15) is slidably connected with the second linear guide (4).

7. The large format assembly PL test system of claim 6, wherein: The bottom end of the sliding block (15) is fixedly connected with a profile connecting bottom plate (16), one end of the profile connecting bottom plate (16) is fixedly connected with a camera mounting bottom plate (17).

8. The large format assembly PL test system of claim 7, wherein: One side of the camera mounting bottom plate (17) is fixedly connected with a CCD infrared camera (18), and the bottom end of the CCD infrared camera (18) is fixedly connected with a 25mm lens (19).

9. The large format assembly PL test system of claim 8, wherein: One end of the profile connecting bottom plate (16) is rotatably connected with a laser clamp (20) through a fixed shaft.

10. The large format assembly PL test system of claim 9, wherein: The middle of the laser clamp (20) clamps an optical fiber coupled laser (21).

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