Sensor impact force testing device

Abstract

The utility model discloses a sensor impact force testing device, which comprises an equipment base provided with a multi-station replaceable efficient testing structure. The multi-station replacement type efficient testing structure comprises a mounting groove, a pair of driving motors, a pair of adjusting screw rods, two pairs of moving blocks, a pair of sliding rails, two pairs of sliding blocks, a mounting table, three rapid clamping assemblies, a mounting frame and a tester. The utility model relates to the technical field of sensor impact force testing devices, and has the beneficial effects of solving the problems that the conventional sensor impact force testing device generally adopts a single-station testing mode, the testing efficiency is low, the requirements of the modern semiconductor industry on high-efficiency and high-precision testing are difficult to meet, the clamping structure is tedious to operate, the cost is high, and the like. The problems that frequent manual clamping is needed, the function of rapidly replacing stations is lacked, the test period is prolonged, and the production efficiency is affected are solved.

Description

Technical Field

[0001] This utility model relates to the technical field of sensor impact force testing devices, specifically a sensor impact force testing device. Background Technology

[0002] With the development of technology, sensors are being used more and more widely in daily life, especially pressure sensors or force sensors. For sensors used for transient measurement, how to quickly and initially evaluate the dynamic characteristics of the produced sensors, how to test the consistency of batch sensors, whether the sensor can output and respond, and whether it can adapt to the impact environment all require us to evaluate and further determine the dynamic quality of the sensor. Existing sensor impact force testing devices usually adopt a single-station testing mode, which has low testing efficiency and cannot meet the needs of the modern semiconductor industry for efficient and high-precision testing. Moreover, the clamping structure is cumbersome to operate, requiring frequent manual clamping and lacking the function of quick station change, which leads to extended testing cycles and affects production efficiency. Utility Model Content

[0003] To achieve the above objectives, this utility model is implemented through the following technical solution: a sensor impact force testing device, comprising: a device base, on which a multi-station replacement high-efficiency testing structure is installed;

[0004] The multi-station replaceable high-efficiency test structure includes: a mounting slot, a pair of drive motors, a pair of adjusting screws, two pairs of moving blocks, a pair of sliding rails, two pairs of sliding blocks, a mounting platform, three quick-clamping assemblies, a mounting frame, and a tester;

[0005] The mounting slot is located inside the equipment base. A pair of drive motors are mounted on the left side wall of the equipment base. A pair of adjusting screws are embedded in the mounting slot and one end is connected to the output end of the pair of drive motors. Two pairs of moving blocks are mounted on the pair of adjusting screws by threaded engagement. A pair of sliding rails are mounted on the equipment base. Two pairs of sliding blocks are movably mounted on a pair of sliding rails. The mounting platform is mounted on the two pairs of sliding blocks and is connected to the two pairs of moving blocks. Three quick clamping assemblies are mounted on the upper wall of the mounting platform. The mounting frame is mounted on the outside of the equipment base. The tester is mounted on the lower top wall of the mounting frame.

[0006] Each of the three quick-clamping assemblies includes: a fixed base, a mounting cavity, a telescopic push rod, a pair of transmission connecting rods, a pair of connecting brackets, a pair of adjusting slides, two pairs of adjusting blocks, and a pair of fixed clamping plates.

[0007] Preferably, a pair of drive motors are mounted on the equipment base by fixing bolts.

[0008] Preferably, a pair of sliding rails are mounted on the equipment base via mounting blocks.

[0009] Preferably, the mounting bracket is equipped with reinforcing ribs.

[0010] Preferably, the fixed base is installed on the mounting platform, the mounting cavity is opened inside the fixed base, the telescopic push rod is installed inside the mounting cavity, one end of a pair of transmission connecting rods is movably installed on the output end of the telescopic push rod, a pair of adjusting slides are opened on the upper wall of the fixed base, two pairs of adjusting blocks are embedded in a pair of adjusting slides, a pair of connecting frames are connected to two pairs of adjusting blocks, a pair of transmission connecting rods are connected to a pair of connecting frames, and a pair of fixed clamps are installed on two pairs of adjusting blocks.

[0011] Preferably, the telescopic push rod is installed inside the mounting cavity via a support frame.

[0012] Preferably, the adaptation mechanism includes an outer plate, a middle plate, and an inner plate. The four corners of the outer plate and the middle plate are hinged to each other. The four corners of the other side of the middle plate are hinged with telescopic rods, and the other ends of the four telescopic rods are hinged to the four corners of one side of the inner plate. Beneficial effects

[0013] This utility model provides a sensor impact force testing device with the following advantages: This solution uses a multi-station interchangeable high-efficiency testing structure. By setting up a multi-station interchangeable high-efficiency testing structure, the drive motor, adjusting screw, and sliding rail work together to achieve rapid switching between multiple stations, significantly improving testing efficiency and adapting to the continuous testing needs of large batches of semiconductor devices. The threaded engagement of the adjusting screw and the moving block, combined with the guiding effect of the sliding rail and the sliding block, ensures the precise movement of the mounting platform and the device under test, avoiding positional deviations and improving testing accuracy. Furthermore, the linkage structure of the telescopic push rod, transmission connecting rod, and fixed clamping plate in the quick clamping assembly enables rapid clamping and release of semiconductor devices, reducing manual operation time. At the same time, the design of the protective pad avoids damage to the device surface and ensures clamping stability. This solves the problems of existing sensor impact force testing devices that typically adopt a single-station testing mode, resulting in low testing efficiency, making it difficult to meet the needs of the modern semiconductor industry for high-efficiency and high-precision testing. Moreover, the clamping structure is cumbersome to operate, requiring frequent manual clamping and lacking the function of quick station switching, leading to extended testing cycles and affecting production efficiency. Attached Figure Description

[0014] Figure 1 This is a front-view three-dimensional structural diagram of the sensor impact force testing device described in this utility model.

[0015] Figure 2 This is a schematic diagram of the adaptation mechanism of the sensor impact force testing device of this utility model.

[0016] Figure 3This is a schematic diagram of the main cross-sectional structure of the base of the sensor impact force testing device of this utility model.

[0017] Figure 4 This is a side cross-sectional view of the mounting base of the sensor impact force testing device of this utility model.

[0018] In the diagram: 1-Equipment base; 2-Mounting slot; 3-Drive motor; 4-Adjusting screw; 5-Moving block; 6-Sliding rail; 7-Sliding block; 8-Mounting platform; 9-Mounting frame; 10-Tester; 11-Fixing bolt; 12-Mounting block; 13-Reinforcing rib; 14-Fixing seat; 15-Mounting cavity; 16-Telescopic push rod; 17-Transmission connecting rod; 18-Connecting frame; 19-Adjusting slide; 20-Adjusting block; 21-Fixing clamp; 22-Support frame; 23-Adaptive mechanism; 231-Inner plate; 232-Telescopic rod; 233-Middle plate; 234-Outer plate; 25-Buffer cavity. Detailed Implementation

[0019] Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.

[0020] Example: Please refer to Figure 1-4 This utility model provides a technical solution: a sensor impact force testing device. This solution takes into account that the existing sensor impact force testing devices require manual testing and clamping, which is cumbersome, inefficient, and cannot achieve automatic fixing. Moreover, the testing operation is only carried out through a single station, which is inefficient and affects the testing efficiency. Based on the above, this invention sets up the following technical means.

[0021] Specifically, this device includes at least an equipment base 1, a mounting slot 2, a pair of drive motors 3, a pair of adjusting screws 4, two pairs of moving blocks 5, a pair of sliding rails 6, two pairs of sliding blocks 7, a mounting platform 8, three quick clamping assemblies, a mounting frame 9, and a testing instrument 10.

[0022] Each of the three quick-clamping assemblies includes: a fixed base 14, a mounting cavity 15, a telescopic push rod 16, a pair of transmission connecting rods 17, a pair of connecting brackets 18, a pair of adjusting slides 19, two pairs of adjusting blocks 20, and a pair of fixed clamping plates 21.

[0023] The equipment base 1 provides overall support for the equipment. During testing, the semiconductor device to be tested is placed on the fixed base 14. The output end of the telescopic push rod 16, which is installed in the mounting cavity 15 by the support frame 22, retracts. The telescopic push rod 16 drives the adjusting block 20 to move towards the center in the adjusting slide 19 through the transmission connecting rod 17 and the connecting frame 18. The adjusting block 20 drives the fixed clamping plate 21 to move, thereby automatically clamping and fixing the semiconductor device. At the same time, the drive motor 3 starts, and the drive motor 3 drives the adjusting screw 4 to rotate, which drives the moving block 5 to move on it. This, together with the sliding rail 6 and the sliding block 7, drives the mounting table 8 to move left and right, moving the clamped semiconductor workpiece to the tester 10 installed on the mounting frame 9 for power-on testing. During testing, parts on other quick clamping components are loaded and unloaded, thereby realizing multi-station rapid testing.

[0024] More specifically, the mounting slot 2 is opened inside the equipment base 1, a pair of drive motors 3 are installed on the left side wall of the equipment base 1, a pair of adjusting screws 4 are embedded in the mounting slot 2 and one end is connected to the output end of the pair of drive motors 3, two pairs of moving blocks 5 are installed on the pair of adjusting screws 4 by threaded engagement, a pair of sliding rails 6 are installed on the equipment base 1, two pairs of sliding blocks 7 are movably installed on the pair of sliding rails 6, the mounting platform 8 is installed on the two pairs of sliding blocks 7 and is connected to the two pairs of moving blocks 5, three quick clamping components are installed on the upper wall of the mounting platform 8, the mounting frame 9 is installed on the outside of the equipment base 1, and the tester 10 is installed on the lower top wall of the mounting frame 9;

[0025] The fixed base 14 is installed on the mounting platform 8. The mounting cavity 15 is opened inside the fixed base 14. The telescopic push rod 16 is installed inside the mounting cavity 15. One end of a pair of transmission connecting rods 17 is movably installed on the output end of the telescopic push rod 16. A pair of adjusting slides 19 are opened on the upper wall of the fixed base 14. Two pairs of adjusting blocks 20 are embedded in a pair of adjusting slides 19. A pair of connecting frames 18 are connected to the two pairs of adjusting blocks 20. A pair of transmission connecting rods 17 are connected to the pair of connecting frames 18. A pair of fixed clamps 21 are installed on the two pairs of adjusting blocks 20.

[0026] In the specific implementation process, a pair of drive motors 3 are further mounted on the equipment base 1 by fixing bolts 11.

[0027] In the specific implementation process, a pair of sliding rails 6 are further installed on the equipment base 1 via mounting blocks 12.

[0028] In the specific implementation process, furthermore, reinforcing ribs 13 are installed on the mounting frame 9.

[0029] In the specific implementation process, the telescopic push rod 16 is further installed inside the mounting cavity 15 via the support frame 22.

[0030] In the specific implementation process, the side wall of the fixed clamping plate 21 is further provided with a buffer cavity 25, and an adaptation mechanism 23 is installed in the buffer cavity 25. The adaptation mechanism 23 includes an outer plate 234, a middle plate 233 and an inner plate 231. The four corners of the outer plate 234 and the middle plate 233 are hinged to each other. The four corners of the other side of the middle plate 233 are hinged with telescopic rods 232, and the other ends of the four telescopic rods 232 are hinged to the four corners of one side of the inner plate 231.

[0031] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A sensor impact force testing apparatus, comprising: The utility model discloses a device base (1), its characterized in that, the device base (1) is installed with multi -position replacement type high -efficient test structure, Multi -position replacement type high -efficient test structure contains: installation groove (2), a pair of drive motor (3), a pair of adjusting screw rod (4), two pairs of moving block (5), a pair of sliding rail (6), two pairs of sliding block (7), installation platform (8), three quick clamping assemblies, mounting bracket (9) and tester (10), The installation groove (2) is set up in the device base (1), a pair of drive motor (3) is installed on the left side wall of the device base (1), a pair of adjusting screw rod (4) is embedded in the installation groove (2) and is connected with a pair of drive motor (3) output end in one end, two pairs of moving block (5) are installed on a pair of adjusting screw rod (4) through the thread cooperation, a pair of sliding rail (6) is installed on the device base (1), two pairs of sliding block (7) are movably installed on a pair of sliding rail (6), installation platform (8) is installed on two pairs of sliding block (7), installation platform (8) is connected with two pairs of moving block (5), three quick clamping assemblies are installed on the upper wall of installation platform (8), mounting bracket (9) is installed on the outside of the device base (1), tester (10) is installed on the top lower wall of mounting bracket (9), Three quick clamping assemblies all contain: fixed seat (14), installation cavity (15), telescopic push rod (16), a pair of transmission connecting rod (17), a pair of connecting frame (18), a pair of adjusting sliding groove (19), two pairs of adjusting block (20) and a pair of fixed clamping plate (21), the side wall of fixed clamping plate (21) is provided with buffer cavity (25), and adaptive mechanism (23) is installed in buffer cavity (25).

2. The sensor impact force testing device of claim 1, wherein, A pair of drive motor (3) is installed on the device base (1) through fixed bolt (11).

3. The sensor impact force testing device of claim 1, wherein, A pair of sliding rail (6) is installed on the device base (1) through mounting block (12).

4. The sensor impact force testing device of claim 1, wherein, Mounting bracket (9) is installed with reinforcing rib plate (13).

5. The sensor impact force testing device of claim 1, wherein, Fixed seat (14) is installed on installation platform (8), installation cavity (15) is set up in fixed seat (14) inside, telescopic push rod (16) is installed in installation cavity (15), a pair of transmission connecting rod (17) one end movably installed in telescopic push rod (16) output end, a pair of adjusting sliding groove (19) is set up on the upper wall of fixed seat (14), two pairs of adjusting block (20) are embedded in a pair of adjusting sliding groove (19), a pair of connecting frame (18) is connected with two pairs of adjusting block (20), a pair of transmission connecting rod (17) is connected with a pair of connecting frame (18), a pair of fixed clamping plate (21) is installed on two pairs of adjusting block (20).

6. A sensor impact force testing device according to claim 5, wherein Telescopic push rod (16) is installed in installation cavity (15) inside through support frame (22).

7. The sensor impact force testing device of claim 1, wherein, The adaptive mechanism (23) comprises an outer plate body (234), a middle plate body (233) and an inner plate body (231), the four corner positions of the outer plate body (234) and the middle plate body (233) are hingedly connected with each other, the other side surface four corner positions of the middle plate body (233) are hingedly connected with telescopic rods (232), and the other ends of the four telescopic rods (232) are hingedly connected with the four corner positions of one side surface of the inner plate body (231).

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