A novel four-station testing mechanism for 0BB
Patent Information
- Application Number
- CN202521659902.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-05
- Publication Date
- 2026-08-14
- Estimated Expiration
- 2035-08-05
AI Technical Summary
现有的硅片中,正面具有主栅线,主栅线会对太阳能电池的表面进行遮挡,影响电池片对光的吸收,进而影响发电效率,后续新型的硅片中,正面主栅线进行取消,形成0BB硅片,生产过程中对0BB硅片的质量需要进行检测,常规的导轨与转盘在对接结构不稳定,导致0BB硅片的移送位置不能精准对接
[0011] The beneficial effects of this utility model are as follows: It provides a novel four-station testing mechanism for 0BB wafers. This novel four-station testing mechanism for 0BB wafers is used in the IV testing of 0BB silicon wafers. Through the transport of the guide rail, the 0BB silicon wafers are adsorbed and lifted, so that the upper turntable can be lowered and transferred to the IV testing section for testing. This effectively improves the accuracy of 0BB silicon wafers during the transport process and reduces the possibility of deviation.
Smart Images

Figure CN224632759U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the technical field of silicon wafer testing, and in particular to a novel four-station testing mechanism for OBB. Background Technology
[0002] Photovoltaic silicon wafers (hereinafter referred to as silicon wafers) are the core component of solar power generation systems and also the most valuable part. The function of silicon wafers is to convert solar energy into electrical energy, which is then stored in batteries or used directly as a power source. In existing silicon wafers, the front side has main grid lines. These main grid lines can block the surface of the solar cell, affecting the cell's absorption of light and thus its power generation efficiency. In newer silicon wafers, the front main grid lines are eliminated, forming OBB silicon wafers. During production, the quality of OBB silicon wafers needs to be inspected. Conventional guide rails and turntables have unstable docking structures, leading to inaccurate alignment during the transfer of OBB silicon wafers. Utility Model Content
[0003] One objective of this invention is to provide a novel four-station testing mechanism for 0BB, in which the lifting structure on the conveyor rail controls the 0BB silicon wafer to rise, and the wafer is then transferred by the adsorption structure of the turntable above, ensuring the accurate positioning of the 0BB silicon wafer.
[0004] To achieve this objective, the present invention adopts the following technical solution:
[0005] A novel four-station OBB testing mechanism includes a conveyor rail and a turntable. A voice coil motor is installed at the rear end of the conveyor rail, and a lifting frame is vertically connected to the drive end of the voice coil motor. Lower suction nozzles are provided on both sides of the lifting frame. Four stations are formed on the outer side of the turntable. Adsorption components are installed on both sides of each station. The adsorption components extend towards the center of the station. Several upper suction nozzles are installed at the lower end of the adsorption components. A turntable air pipe connector is installed in the center of the turntable. The turntable air pipe connector communicates with the upper suction nozzles after passing through the interior of the turntable and the interior of the adsorption components.
[0006] As a preferred technical solution, a conveying motor is installed at one end of the conveying guide rail, a conveying synchronous pulley is connected to the drive end of the conveying motor, a conveying synchronous belt is connected between the conveying synchronous pulleys, a conveying wheel is rotatably connected to both ends of the conveying guide rail, a drive shaft is connected between the conveying synchronous pulley and the conveying wheel, a conveying belt is driven on the conveying wheel, and the conveying belt is located on both sides of the conveying guide rail.
[0007] As a preferred technical solution, a centering and correction motor is installed below the conveying guide rail. The drive end of the centering and correction motor is connected to a centering and correction synchronous pulley. A centering and correction synchronous belt is connected between the centering and correction synchronous pulleys. A centering and correction bracket is fixed on the centering and correction synchronous belt. A pair of centering and correction brackets are located on both sides of the conveying guide rail.
[0008] As a preferred technical solution, the centering and correction bracket is equipped with centering and correction guide wheels.
[0009] As a preferred technical solution, a conveying sensor is installed in the middle of the conveying guide rail.
[0010] As a preferred technical solution, the side of the turntable is provided with an air passage groove, the outer end of the adsorption component is connected to the air passage groove, the air passage groove is covered with a sealing plate, and the turntable air pipe connector is located at the end of the air passage groove away from the adsorption component.
[0011] The beneficial effects of this utility model are as follows: It provides a novel four-station testing mechanism for 0BB wafers. This novel four-station testing mechanism for 0BB wafers is used in the IV testing of 0BB silicon wafers. Through the transport of the guide rail, the 0BB silicon wafers are adsorbed and lifted, so that the upper turntable can be lowered and transferred to the IV testing section for testing. This effectively improves the accuracy of 0BB silicon wafers during the transport process and reduces the possibility of deviation. Attached Figure Description
[0012] The present invention will now be described in further detail with reference to the accompanying drawings and embodiments.
[0013] Figure 1 This is a schematic diagram of the overall structure of a novel four-station testing mechanism for OBB as described in the embodiment.
[0014] Figure 2 This is a schematic diagram of the first structure of the conveying guide rail described in the embodiment;
[0015] Figure 3 This is a schematic diagram of the second structure of the conveying guide rail described in the embodiment;
[0016] Figure 4 This is a schematic diagram of the turntable described in the embodiment.
[0017] Figures 1 to 4 middle:
[0018] 1. Conveyor rail; 2. Turntable; 3. Voice coil motor; 4. Lifting frame; 5. Lower suction nozzle; 6. Workstation; 7. Adsorption assembly; 8. Upper suction nozzle; 9. Turntable air pipe connector; 10. Conveyor motor; 11. Conveyor synchronous pulley; 12. Conveyor synchronous belt; 13. Conveyor impeller; 14. Drive shaft; 15. Conveyor belt; 16. Centering and correction motor; 17. Centering and correction synchronous pulley; 18. Conveyor slide rail; 19. Centering and correction bracket; 20. Centering and correction guide wheel; 21. Sealing plate. Detailed Implementation
[0019] The technical solution of this utility model will be further described below with reference to the accompanying drawings and specific embodiments.
[0020] like Figures 1 to 4 As shown in this embodiment, a novel four-station OBB testing mechanism includes a conveyor rail 1 and a turntable 2. A voice coil motor 3 is installed at the rear end of the conveyor rail 1. A lifting frame 4 is vertically connected to the drive end of the voice coil motor 3. Lower suction nozzles 5 are provided on both sides of the lifting frame 4. Four stations 6 are formed on the outer side of the turntable 2. Adsorption components 7 are installed on both sides of each station 6. The adsorption components 7 extend towards the middle of the station 6. Several upper suction nozzles 8 are installed at the lower end of the adsorption components 7. A turntable air pipe connector 9 is installed in the middle of the turntable 2. The turntable air pipe connector 9 communicates with the upper suction nozzles 8 after passing through the interior of the turntable 2 and the interior of the adsorption components 7.
[0021] The conveyor rail 1 moves the silicon wafer backward. When it reaches the last end, the voice coil motor 3 controls the lifting frame 4 to rise. The two sides of the lifting frame 4 pick up the silicon wafer from the two sides of the conveyor rail 1 through the lower suction nozzle 5 and move it upward until it reaches the station 6 position of the turntable 2. At this time, the suction component 7 of the turntable 2 controls the upper suction nozzle 8 to pick up the silicon wafer, the lower suction nozzle 5 releases the silicon wafer, and then the turntable 2 rotates to transfer the picked-up silicon wafer to the IV detection section for testing.
[0022] A conveyor motor 10 is installed at one end of the conveyor guide rail 1. The drive end of the conveyor motor 10 is connected to a conveyor synchronous pulley 11. A conveyor synchronous belt 12 is connected between the conveyor synchronous pulleys 11. Both ends of the conveyor guide rail 1 are rotatably connected to conveyor wheels 13. A drive shaft 14 is connected between the conveyor synchronous pulleys 11 and the conveyor wheels 13. A conveyor belt 15 is driven on the conveyor wheels 13. The conveyor belt 15 is located on both sides of the conveyor guide rail 1. Furthermore, a conveyor sensor is installed in the middle of the conveyor guide rail 1.
[0023] The conveyor motor 10 provides power. Under the transmission of the conveyor synchronous pulley 11 and the conveyor synchronous belt 12, the drive shaft 14 rotates, and the conveyor wheel 13 rotates in turn under the action of the drive shaft 14. The conveyor belt 15 can then convey the silicon wafer backward. During the conveying process, the presence of the silicon wafer is sensed by the conveyor sensor.
[0024] A centering and correction motor 16 is installed below the conveying guide rail 1. The drive end of the centering and correction motor 16 is connected to a centering and correction synchronous pulley 17. A centering and correction synchronous belt is connected between the centering and correction synchronous pulleys 17. A centering and correction bracket 19 is fixed on the centering and correction synchronous belt. A pair of centering and correction brackets 19 are located on both sides of the conveying guide rail 1. Furthermore, a centering and correction guide wheel 20 is installed on the centering and correction bracket 19.
[0025] When the silicon wafer moves to the rear of the conveying guide rail 1, the centering and correction motor 16 uses the correction synchronous wheel and correction synchronous belt to make the centering and correction bracket 19 move from both sides along the conveying slide rail 18 towards the middle, aligning and straightening the silicon wafer, while the centering and correction guide wheel 20 reduces friction.
[0026] The side of the turntable 2 is provided with an air passage groove, the outer end of the adsorption component 7 is connected to the air passage groove, the air passage groove is covered with a sealing plate 21, and the turntable air pipe connector 9 is located at the end of the air passage groove away from the adsorption component 7.
[0027] The adsorption components 7 used on both sides of each station 6 of the turntable 2 extend from the outer air passage groove to the middle position of the turntable 2. The turntable air pipe connector 9 is installed in the middle of the turntable 2 for easier connection.
[0028] It should be stated that the above-described specific embodiments are merely preferred embodiments of this utility model and the technical principles applied thereto. Within the scope of the technology disclosed in this utility model, any variations or substitutions that are easily conceived by those skilled in the art should be covered within the protection scope of this utility model.
Claims
1. A novel four-station testing mechanism for OBB, characterized in that, The device includes a conveyor rail and a turntable. A voice coil motor is installed at the rear end of the conveyor rail. A lifting frame is vertically connected to the drive end of the voice coil motor. Lower suction nozzles are provided on both sides of the lifting frame. Four workstations are formed on the outer side of the turntable. Adsorption components are installed on both sides of each workstation. The adsorption components extend towards the center of the workstation. Several upper suction nozzles are installed at the lower end of the adsorption components. A turntable air pipe connector is installed in the center of the turntable. The turntable air pipe connector communicates with the upper suction nozzles after passing through the interior of the turntable and the interior of the adsorption components.
2. The novel four-station testing mechanism for OBB according to claim 1, characterized in that, A conveying motor is installed at one end of the conveying guide rail. The drive end of the conveying motor is connected to a conveying synchronous pulley. A conveying synchronous belt is connected between the conveying synchronous pulleys. Both ends of the conveying guide rail are rotatably connected to conveying wheels. A drive shaft is connected between the conveying synchronous pulley and the conveying wheels. A conveying belt drives the conveying wheels. The conveying belt is located on both sides of the conveying guide rail.
3. The novel four-station testing mechanism for OBB according to claim 1, characterized in that, A centering and correction motor is installed below the conveying guide rail. The drive end of the centering and correction motor is connected to a centering and correction synchronous pulley. A centering and correction synchronous belt is connected between the centering and correction synchronous pulleys. A centering and correction bracket is fixed on the centering and correction synchronous belt. A pair of centering and correction brackets are located on both sides of the conveying guide rail.
4. The novel four-station testing mechanism for OBB according to claim 3, characterized in that, The centering and correction bracket is equipped with centering and correction guide wheels.
5. The novel four-station testing mechanism for OBB according to claim 1, characterized in that, A conveying sensor is installed in the middle of the conveying guide rail.
6. The novel four-station testing mechanism for OBB according to claim 1, characterized in that, The turntable has an air passage groove on its side, the outer end of the adsorption component is connected to the air passage groove, the air passage groove is covered with a sealing plate, and the turntable air pipe connector is located at the end of the air passage groove away from the adsorption component.