A patch component testing tool
Patent Information
- Application Number
- CN202521902410.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-09-04
- Publication Date
- 2026-09-11
- Estimated Expiration
- 2035-09-04
AI Technical Summary
[0004]本实用新型实施例提供一种贴片元器件测试工装，解决传统测试夹具存在测试准确性差且易对元器件造成损伤的问题
[0018]本实用新型实施例提供一种贴片元器件测试工装，所述贴片元器件测试工装包括：底座，所述底座上设有用于安放待测元器件的绝缘定位块；顶针测试组件，包括可弹性伸缩的第一顶针和第二顶针，所述第一顶针、所述第二顶针设于所述底座上且分别位于所述绝缘定位块的两侧，所述第一顶针用于与所述待测元器件一端的电极表面弹性抵压，所述第二顶针用于与所述待测元器件另一端的电极表面弹性抵压；调节组件，设于所述底座上且连接所述第一顶针，用于带动所述第一顶针靠近或远离所述第二顶针。本申请的贴片元器件测试工装有效提高了贴片式元器件的连接稳定性和导通可靠性，避免了因夹持不当或夹持力过大造成的虚接和接触电阻异常，显著提升了测试效率和测试结果的准确性和一致性，同时降低了对被测元器件的物理损伤风险，增强了测试过程的可重复性与产品质量稳定性。
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Figure CN224745057U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of component testing fixture technology, and in particular to a surface mount component testing fixture. Background Technology
[0002] Currently, most common surface mount component (SMD) testing fixtures use clamps to establish electrical connections with the SMD components. In actual production testing, the SMD components need to be clamped into the fixture to complete the test. However, for smaller SMD components (such as 0602 packaged resistors and capacitors), traditional clamping methods have certain limitations.
[0003] First, due to the small contact area between the clamp and the component, improper clamping during testing can easily lead to a loose connection, increasing contact resistance and affecting the accuracy and stability of the test results. Second, some clamps, due to their large clamping force, may damage the pads of the component under test during clamping, affecting its electrical performance or even causing component damage, resulting in fluctuations in test data and further reducing the reliability of the test. Utility Model Content
[0004] This utility model provides a surface mount component testing fixture that solves the problems of poor testing accuracy and easy damage to components caused by traditional testing fixtures.
[0005] In a first aspect, embodiments of this utility model provide a surface mount component testing fixture, which includes:
[0006] A base, wherein an insulating positioning block is provided on the base for placing the component under test;
[0007] The pin test assembly includes a first pin and a second pin that can be elastically extended and retracted. The first pin and the second pin are disposed on the base and are respectively located on both sides of the insulating positioning block. The first pin is used to elastically press against the electrode surface of one end of the component under test, and the second pin is used to elastically press against the electrode surface of the other end of the component under test.
[0008] An adjustment component, disposed on the base and connected to the first ejector pin, is used to move the first ejector pin closer to or away from the second ejector pin.
[0009] Furthermore, the upper side of the insulating positioning block is provided with a first inclined surface and a second inclined surface. The first inclined surface and the second inclined surface intersect each other and are inclined outward. The ends of the first pin and the second pin are located above the junction of the first inclined surface and the second inclined surface and are kept apart. The space between the first inclined surface and the second inclined surface is used to place the component to be tested.
[0010] Furthermore, both the first ejector pin and the second ejector pin include a contact pin, a sleeve, and an elastic element. The elastic element is assembled inside the sleeve. One end of the contact pin is telescopically disposed inside the sleeve and abuts against the elastic element. The other end of the contact pin extends above the junction between the first inclined surface and the second inclined surface. When the contact pin retracts into the sleeve, the elastic element undergoes elastic compression to drive the contact pin to rebound.
[0011] Furthermore, the diameter of the end of the stylus furthest from the sleeve gradually expands outward.
[0012] Furthermore, the adjustment assembly includes a mounting base and a movable component. The mounting base is disposed on the base and adjacent to one side of the insulating positioning block. The lower side of the mounting base is provided with a mounting groove. The movable component is disposed in the mounting groove and can move along the mounting groove to approach or move away from the insulating positioning block. The first pin is connected to the movable component.
[0013] Furthermore, the mounting bracket is connected and fixed to the base by screws.
[0014] Furthermore, the adjustment assembly also includes a spring, which is disposed in the mounting groove and has one end abutting against the movable member and the other end abutting against the groove wall of the mounting groove. When the movable member moves away from the insulating positioning block along the mounting groove, the spring is compressed to cause the movable member to spring back.
[0015] Furthermore, the rear end of the movable component is provided with a tail post, and the rear side of the mounting base is provided with a through hole extending to the rear end of the mounting groove. The tail post extends out of the rear side of the mounting base through the through hole. The spring is sleeved on the tail post, with one end abutting against the rear end of the movable component and the other end abutting against the side wall of the mounting groove.
[0016] Furthermore, the movable part is provided with a protrusion, and the upper side of the mounting base is provided with a first opening that extends through the mounting groove. The protrusion passes through the first opening and extends to the top of the mounting base, wherein the protrusion can move back and forth in the first opening.
[0017] Furthermore, the surface mount component testing fixture also includes a first connector, which is disposed on the base and spaced apart from one side of the insulating positioning block. One end of the second pin is fixed to the first connector, and the other end extends toward one side of the insulating positioning block.
[0018] This utility model provides a surface mount component (SMT) testing fixture, comprising: a base with an insulating positioning block for placing the component under test (DUT); a pin testing assembly including a first and second pin that are elastically extendable, the first and second pins being disposed on the base and located on opposite sides of the insulating positioning block; the first pin elastically pressing against the electrode surface of one end of the DUT, and the second pin elastically pressing against the electrode surface of the other end of the DUT; and an adjustment assembly disposed on the base and connected to the first pin, for moving the first pin closer to or away from the second pin. This surface mount component testing fixture effectively improves the connection stability and conductivity reliability of surface mount components, avoids poor connections and abnormal contact resistance caused by improper clamping or excessive clamping force, significantly improves testing efficiency and the accuracy and consistency of test results, reduces the risk of physical damage to the DUT, and enhances the repeatability of the testing process and the stability of product quality. Attached Figure Description
[0019] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0020] Figure 1 A perspective view of the surface mount component testing fixture provided in an embodiment of this utility model;
[0021] Figure 2 An exploded view of the surface mount component testing fixture provided in this embodiment of the utility model;
[0022] Figure 3 A perspective view of the insulating positioning block provided in an embodiment of this utility model;
[0023] Figure 4 A cross-sectional view of the insulating positioning block provided in an embodiment of this utility model;
[0024] Figure 5 A perspective view of the first ejector pin provided for an embodiment of this utility model;
[0025] Figure 6 A perspective view of the second ejector pin provided for an embodiment of this utility model;
[0026] Figure 7 A perspective view of the adjustment component provided in an embodiment of this utility model;
[0027] Figure 8A perspective view of the mounting base provided in an embodiment of this utility model;
[0028] Figure 9 A perspective view of the movable component provided in an embodiment of this utility model;
[0029] Figure 10 A perspective view of the first connector provided in an embodiment of this utility model.
[0030] The labels for the attached figures are as follows:
[0031] 10. Base; 11. Insulating positioning block; 101. First inclined surface; 102. Second inclined surface; 20. Ejector pin test assembly; 21. First ejector pin; 22. Second ejector pin; 201. Contact pin; 202. Sleeve; 30. Adjustment assembly; 31. Mounting base; 301. Mounting groove; 302. First opening; 302. Through hole; 32. Moving part; 321. Protrusion; 322. Tail post; 33. Spring; 40. First connecting part; 50. Screw. Detailed Implementation
[0032] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present utility model.
[0033] The directional terms used in this invention, such as "up," "down," "front," "back," "left," "right," "inner," "outer," and "side," are merely for reference to the accompanying drawings. Therefore, the directional terms used are for explanation and understanding of this invention, and not for limiting it. Furthermore, in the accompanying drawings, structures that are similar or identical are indicated by the same reference numerals.
[0034] Reference Figure 1 and Figure 2 This invention provides a surface mount component testing fixture. The structure and working principle of this surface mount component testing fixture will be described in detail below with reference to the accompanying drawings. Figure 1As shown, the surface mount component testing fixture includes: a base 10, on which an insulating positioning block 11 for placing the component under test is provided; a pin testing assembly 20, including a first pin 21 and a second pin 22 that are elastically extendable, the first pin 21 and the second pin 22 being disposed on the base 10 and respectively located on both sides of the insulating positioning block 11, the first pin 21 being used to elastically press against the electrode surface of one end of the component under test, and the second pin 22 being used to elastically press against the electrode surface of the other end of the component under test; and an adjustment assembly 30, disposed on the base 10 and connected to the first pin 21, for moving the first pin 21 closer to or away from the second pin 22.
[0035] In practice, traditional surface mount component (SMT) testing fixtures typically use clamps to hold the components. This method has several drawbacks. First, SMT components are usually small, resulting in a small contact area between the clamp and the component. If the component is not properly clamped, it can easily cause a loose connection, leading to increased contact resistance and affecting the accuracy and stability of the test results. Second, some clamps have a large clamping force, while the electrode pads of SMT components are small and fragile. The clamping process may damage the pads of the component under test, affecting its electrical performance or even causing it to break down, resulting in fluctuations in test data and further reducing the reliability of the test. Furthermore, some damage caused by clamping is hidden and difficult to detect in time during the production or assembly stage. It may flow with the product to downstream users and eventually reach the end consumer. Once a functional failure occurs, it often requires a lot of manpower and resources to trace the fault, which not only increases costs but may also negatively impact the brand image of downstream manufacturers, resulting in significant tangible and intangible losses.
[0036] To address the aforementioned issues, this embodiment provides a surface mount component (SMT) testing fixture. This fixture is primarily used for testing SMT components such as capacitors, resistors, and diodes. It establishes an electrical connection with the electrodes of the component under test (DUT) and, in conjunction with testing equipment, completes various tests on the DUT. Specifically, the SMT testing fixture mainly consists of a base 10, a pin testing assembly 20, and an adjustment assembly 30. The base 10 is equipped with an insulating positioning block 11 for placing the DUT. The DUT can be a surface mount capacitor, surface mount resistor, or similar component. The insulating positioning block 11 is designed with insulating material, typically plastic, to maintain insulation of the DUT in the testing environment, ensuring the accuracy of the test results. When placing the DUT, the insulating positioning block 11 fixes the DUT's position, keeping it in the correct, stationary position. The pin testing assembly 20 includes a first pin 21 and a second pin 22 that are elastically extendable. The first pin 21 and the second pin 22 can have the same pin structure and both have elastic extension function. The first pin 21 and the second pin 22 can be designed with a metal material with good conductivity and are used to contact the electrodes at both ends of the component under test. The first pin 21 and the second pin 22 are both mounted on the base 10 and are located on both sides of the insulating positioning block 11. The first pin 21 and the second pin 22 are on the same axis, and the ends of the two pins can maintain an interval of about the length of the component under test. After the component under test (DUT) is placed on the insulating positioning block 11, the first pin 21 and the second pin 22 are positioned on both sides of the DUT. The first pin 21 elastically presses against the electrode surface at one end of the DUT, and the second pin 22 elastically presses against the electrode surface at the other end of the DUT. The first pin 21 and the second pin 22 together clamp the DUT. The first pin 21 and the second pin 22 contact the electrode surfaces at both ends of the DUT to establish an electrical connection and lead the electrode signals at both ends of the DUT to the testing equipment, so that testing can be performed. The adjustment component 30 is mounted on the base 10 and connected to the first ejector pin 21. The adjustment component 30 is used to move the first ejector pin 21 closer to or further away from the second ejector pin 22. Specifically, the volume of different types or models of components under test may be different, and the distance between the electrodes at both ends may be different. Before testing, the adjustment component 30 can be operated to move the first ejector pin 21 away from the second ejector pin 22 so that the components under test can be accommodated between the first ejector pin 21 and the second ejector pin 22. After the components under test are placed, the adjustment component 30 is operated to move the first ejector pin 21 closer to the second ejector pin 22 so that the first ejector pin 21 and the second ejector pin 22 elastically press against the electrodes at both ends of the components under test, clamping the components under test into place, thereby establishing a stable electrical connection between the first ejector pin 21, the second ejector pin 22 and the electrodes of the components under test.Overall, thanks to the elastic extension and retraction of the first ejector pin 21 and the second ejector pin 22, the electrodes at both ends of the component under test are elastically pressed during the test, which will not damage the electrode pads of the component under test. Moreover, the component under test is clamped simultaneously from both ends, and the contact between the first ejector pin 21 and the second ejector pin 22 and the electrodes of the component under test is more precise and the contact area is larger, which will not cause the phenomenon of loose connection. The distance between the first ejector pin 21 and the second ejector pin 22 can be adjusted by adjusting the component 30, which is convenient for testing different types and sizes of components under test.
[0037] In one embodiment, reference is made to Figure 1 , Figure 3 as well as Figure 4 The insulating positioning block 11 has a first inclined surface 101 and a second inclined surface 102 on its upper side. The first inclined surface 101 and the second inclined surface 102 intersect each other and are inclined outward. The ends of the first ejector pin 21 and the second ejector pin 22 are located above the junction of the first inclined surface 101 and the second inclined surface 102 and are spaced apart. The space between the first inclined surface 101 and the second inclined surface 102 is used to place the component under test. In a specific implementation, the insulating positioning block 11 has a first inclined surface 101 and a second inclined surface 102 on its upper side. The first inclined surface 101 and the second inclined surface 102 are both straight inclined surface structures. The first inclined surface 101 and the second inclined surface 102 intersect each other and are inclined outward, forming a "V" shaped groove structure. The first inclined surface 101 and the second inclined surface 102 are the two side walls of the "V" shaped groove structure. The ends of the first ejector pin 21 and the second ejector pin 22 are located above the junction of the first inclined surface 101 and the second inclined surface 102, and the ends of the first ejector pin 21 and the second ejector pin 22 are kept apart. The component to be tested is placed between the first inclined surface 101 and the second inclined surface 102. As long as the component to be tested is placed between the first inclined surface 101 and the second inclined surface 102, under the guiding action of the first inclined surface 101 and the second inclined surface 102, the component to be tested will eventually fall accurately into the junction of the first inclined surface 101 and the second inclined surface 102, that is, into the bottom of the "V" shaped groove. The component under test (DUT) remains stationary at the junction of the first inclined plane 101 and the second inclined plane 102. The first pin 21 and the second pin 22 can accurately contact the electrode surfaces at both ends of the DUT at the junction of the first inclined plane 101 and the second inclined plane 102, thereby testing the DUT. The design of the first inclined plane 101 and the second inclined plane 102 makes the positioning of the DUT more accurate and the testing more reliable.
[0038] Furthermore, referring to Figure 5 and Figure 6Both the first ejector pin 21 and the second ejector pin 22 include a contact pin 201, a sleeve 202, and an elastic element (not shown in the figure). The elastic element is assembled inside the sleeve 202. One end of the contact pin 201 is telescopically disposed inside the sleeve 202 and abuts against the elastic element. The other end of the contact pin 201 extends above the junction between the first inclined surface 101 and the second inclined surface 102. When the contact pin 201 retracts into the sleeve 202, the elastic element undergoes elastic compression to cause the contact pin 201 to rebound. In specific implementation, both the first ejector pin 21 and the second ejector pin 22 are composed of a contact pin 201, a sleeve 202, and an elastic element. The sleeve 202 is hollow inside, and its inner diameter is slightly larger than the diameter of the contact pin 201. The elastic element is assembled entirely inside the sleeve 202 and is an elastically compressible structure, specifically a spring 33. The stylus 201 is a straight, cylindrical structure and is the main structure used to contact the electrode surface of the component under test. One end of the stylus 201 is telescopically disposed inside the sleeve 202, abutting against the elastic element inside the sleeve 202. The other end of the stylus 201 extends above the junction of the first inclined surface 101 and the second inclined surface 102 on the insulating positioning block 11, and contacts the electrode surface of the component under test through its end face. The stylus 201 can retract into the sleeve 202 by a certain length. When the stylus 201 retracts into the sleeve 202, the end of the stylus 201 presses against the elastic element, causing the elastic element to elastically compress. The elastic element generates a spring force that causes the stylus 201 to rebound, achieving elastic extension and retraction. In practical applications, the operating adjustment component 30 moves the first ejector pin 21 closer to the second ejector pin 22 until the contact pins 201 of both the first ejector pin 21 and the second ejector pin 22 contact the electrode surfaces at both ends of the component under test. Then, the operating adjustment component 30 continues to move the first ejector pin 21, causing the contact pins 201 of both the first ejector pin 21 and the second ejector pin 22 to retract into the sleeve 202. The elastic element is compressed, generating elastic force that acts on the contact pins 201, causing the contact pins 201 to elastically press against the electrode surfaces at both ends of the component under test, establishing a stable electrical connection with the electrodes at both ends of the component under test. Then, the component under test can be tested.
[0039] Furthermore, referring to Figure 5 and Figure 6 The diameter of the end of the stylus 201 furthest from the sleeve 202 gradually expands outward. In specific implementations, to enable the stylus 201 to better contact the electrode of the component under test, the diameter of the end of the stylus 201 furthest from the sleeve 202 is designed to gradually expand outward, with one end having a larger diameter than the other. The larger diameter end contacts the electrode surface of the component under test, allowing for more stable clamping of the component under test and providing a larger contact area with the electrode surface, thus improving the reliability of the test.
[0040] In one embodiment, reference is made to Figure 1 , Figure 7 as well as Figure 8 The adjustment component 30 includes a mounting base 31 and a movable component 32. The mounting base 31 is disposed on the base 10 and adjacent to one side of the insulating positioning block 11. The lower side of the mounting base 31 is provided with a mounting groove 301. The movable component 32 is disposed in the mounting groove 301 and can move along the mounting groove 301 to approach or move away from the insulating positioning block 11. The first pin 21 is connected to the movable component 32. In specific implementation, the adjustment component 30 includes a mounting base 31 and a movable component 32. A mounting groove 301 is provided on the lower side of the mounting base 31, and the mounting base 31 is entirely mounted on the base 10, so that the mounting groove 301 is snapped onto the base 10. The movable component 32 is block-shaped, with a shape and size matching the groove of the mounting groove 301. The movable component 32 is positioned within the mounting groove 301 and can move along the mounting groove 301. Moving along the mounting groove 301, the movable component 32 can move closer to or away from the insulating positioning block 11. The first ejector pin 21 is connected to the limiting component. In practical applications, the movable component 32 can be manually operated to move. Moving the movable component 32 along the mounting groove 301 closer to or away from the insulating positioning block 11 can drive the first ejector pin 21 to move synchronously, thereby moving the first ejector pin 21 closer to or away from the second ejector pin 22, thus adjusting the distance between the first ejector pin 21 and the second ejector pin 22.
[0041] Furthermore, referring to Figure 1 The mounting base 31 is connected and fixed to the base 10 by screws 50. In specific implementation, the mounting base 31 is connected and fixed to the base 10 by screws 50. Specifically, a screw hole matching the screw 50 is provided at a corresponding position on the base 10, and a through hole corresponding to the position of the screw hole is provided on the mounting base 31. After the screw 50 passes through the through hole, it is threadedly connected to the screw hole. When any part of the adjusting assembly 30 is damaged, the mounting base 31 can be removed to facilitate the repair or replacement of various parts.
[0042] In one embodiment, reference is made to Figure 1 , Figure 2 and Figure 7The adjusting assembly 30 further includes a spring 33, which is disposed in the mounting groove 301 with one end abutting against the movable member 32 and the other end abutting against the groove wall of the mounting groove 301. When the movable member 32 moves away from the insulating positioning block 11 along the mounting groove 301, the spring 33 compresses to cause the movable member 32 to rebound. In a specific implementation, the adjusting assembly 30 further includes a spring 33, which is entirely disposed within the mounting groove 301, with one end abutting against the rear end of the movable member 32 and the other end abutting against the groove wall at the rear end of the mounting groove 301. In practical applications, when the moving part 32 moves away from the insulating positioning block 11 along the mounting groove 301, the first ejector pin 21 moves synchronously with the moving part 32. The spring 33 in the mounting groove 301 is compressed to generate elastic force, which drives the moving part 32 to rebound. The rebound of the moving part 32 drives the first ejector pin 21 to rebound synchronously. This allows the first ejector pin 21 to have a larger adjustable range, and at the same time, it can better protect the component under test during the clamping process.
[0043] In one embodiment, reference is made to Figures 7 to 9 The movable component 32 has a tail post 322 extending from its rear end. The mounting base 31 has a through hole 302 extending to the rear end of the mounting groove 301. The tail post 322 passes through the through hole 302 and extends out from the rear end of the mounting base 31. The spring 33 is sleeved on the tail post 322, with one end abutting against the rear end of the movable component 32 and the other end abutting against the side wall of the mounting groove 301. In a specific implementation, the tail post 322 extends out from the rear end of the movable component 32. The tail post 322 is a straight columnar structure, and its length is greater than the length of the spring 33. The mounting base 31 has a through hole 302 at its rear end. The tail post 322 passes through the through hole 302 and extends out from the rear end of the mounting base 31. The spring 33 is entirely sleeved on the tail post 322, with the front end of the spring 33 abutting against the rear end of the movable component 32 and the rear end of the spring 33 abutting against the side wall of the rear end of the mounting groove 301. In practical applications, when the movable component 32 moves away from the insulating positioning block 11, the rear end of the movable component 32 pushes the spring 33, causing the spring 33 to be compressed as a whole. At the same time, the tail post 322 connected to the rear end of the movable component 32 moves synchronously with the movable component 32, extending further out of the rear end of the mounting base 31. The elastic force generated by the compression of the spring 33 will act on the rear end of the movable component 32, thereby causing the movable component 32 to rebound.
[0044] In one embodiment, reference is made to Figures 7 to 9The movable component 32 has a protruding portion 321. The upper side of the mounting base 31 has a first opening 302 that extends into the mounting groove 301. The protruding portion 321 passes through the first opening 302 and extends above the mounting base 31. The protruding portion 321 can move back and forth within the first opening 302. In a specific implementation, a first opening 302 is provided on the upper side of the mounting base 31, extending into the mounting groove 301. The movable component 32 has a protruding portion 321, which is a columnar structure protruding from one side of the movable component 32. The entire protruding portion 321 passes through the first opening 302 and extends above the mounting base 31. The front-to-back width of the protruding portion 321 is smaller than the front-to-back width of the first opening 302, allowing the protruding portion 321 to move back and forth a certain distance within the first opening 302. The distance that the protrusion 321 moves back and forth within the first opening 302 is the adjustment range of the first ejector pin 21. After the first ejector pin 21 moves a certain distance toward the second ejector pin 22, the protrusion 321 is blocked by the front side of the first opening 302, at which point the distance between the first ejector pin 21 and the second ejector pin 22 is closest. After the first ejector pin 21 moves a certain distance away from the second ejector pin 22, the protrusion 321 is blocked by the rear side of the first opening 302, at which point the distance between the first ejector pin 21 and the second ejector pin 22 is farthest. In practical applications, by operating the protrusion 321 to move the moving part 32 closer to or away from the insulating positioning block 11, and thus move the first ejector pin 21 closer to or away from the second ejector pin 22, the distance between the first ejector pin 21 and the second ejector pin 22 can be easily adjusted.
[0045] In one embodiment, reference is made to Figure 1 , Figure 2 as well as Figure 10 The surface mount component testing fixture further includes a first connector 40, which is disposed on the base 10 and spaced apart from one side of the insulating positioning block 11. One end of the second ejector pin 22 is fixed to the first connector 40, and the other end extends toward one side of the insulating positioning block 11. In a specific implementation, the surface mount component testing fixture further includes the first connector 40, which is disposed on the base 10 and spaced apart from one side of the insulating positioning block 11. Specifically, the first connector 40 is connected and fixed to the base 10 by screws 50 and can be freely disassembled. The first connector 40 provides a connection base for the second ejector pin 22. One end of the second ejector pin 22 is fixed to the first connector 40, and the other end extends toward one side of the insulating positioning block 11. The first connector 40 installs the second ejector pin 22 at a height that can hold the component under test and ensures the stability of the second ejector pin 22.
[0046] In summary, the surface mount component testing fixture of this embodiment effectively improves the connection stability and conductivity reliability of surface mount components, avoids poor connections and abnormal contact resistance caused by improper clamping or excessive clamping force, significantly improves testing efficiency and the accuracy and consistency of test results, while reducing the risk of physical damage to the tested components, enhancing the repeatability of the testing process and the stability of product quality, and has good practical value and promotion prospects.
[0047] The above description is merely a specific embodiment of this utility model, but the protection scope of this utility model is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in this utility model, and these modifications or substitutions should all be covered within the protection scope of this utility model. Therefore, the protection scope of this utility model should be determined by the scope of the claims.
Claims
1. A surface mount component testing fixture, characterized in that, include: A base, wherein an insulating positioning block is provided on the base for placing the component under test; The pin test assembly includes a first pin and a second pin that can be elastically extended and retracted. The first pin and the second pin are disposed on the base and are respectively located on both sides of the insulating positioning block. The first pin is used to elastically press against the electrode surface of one end of the component under test, and the second pin is used to elastically press against the electrode surface of the other end of the component under test. An adjustment component, disposed on the base and connected to the first ejector pin, is used to move the first ejector pin closer to or away from the second ejector pin.
2. The surface mount component testing fixture according to claim 1, characterized in that, The insulating positioning block has a first inclined surface and a second inclined surface on its upper side. The first inclined surface and the second inclined surface intersect each other and are inclined outward. The ends of the first pin and the second pin are located above the junction of the first inclined surface and the second inclined surface and are kept apart. The space between the first inclined surface and the second inclined surface is used to place the component to be tested.
3. The surface mount component testing fixture according to claim 2, characterized in that, Both the first ejector pin and the second ejector pin include a contact pin, a sleeve, and an elastic element. The elastic element is assembled inside the sleeve. One end of the contact pin is retractably disposed inside the sleeve and abuts against the elastic element. The other end of the contact pin extends above the junction between the first inclined surface and the second inclined surface. When the contact pin retracts into the sleeve, the elastic element undergoes elastic compression to cause the contact pin to rebound.
4. The surface mount component testing fixture according to claim 3, characterized in that, The diameter of the end of the stylus furthest from the sleeve gradually expands outward.
5. The surface mount component testing fixture according to any one of claims 1-4, characterized in that, The adjustment assembly includes a mounting base and a movable component. The mounting base is disposed on the base and adjacent to one side of the insulating positioning block. The lower side of the mounting base is provided with a mounting groove. The movable component is disposed in the mounting groove and can move along the mounting groove to approach or move away from the insulating positioning block. The first pin is connected to the movable component.
6. The surface mount component testing fixture according to claim 5, characterized in that, The mounting bracket is connected and fixed to the base by screws.
7. The surface mount component testing fixture according to claim 5, characterized in that, The adjustment assembly also includes a spring, which is disposed in the mounting groove and has one end abutting against the movable member and the other end abutting against the groove wall of the mounting groove. When the movable member moves away from the insulating positioning block along the mounting groove, the spring is compressed to cause the movable member to spring back.
8. The surface mount component testing fixture according to claim 7, characterized in that, The rear end of the movable component is provided with a tail post, and the rear side of the mounting base is provided with a through hole that extends to the rear end of the mounting groove. The tail post extends out of the rear side of the mounting base through the through hole. The spring is sleeved on the tail post and one end abuts against the rear end of the movable component, while the other end abuts against the side wall of the mounting groove.
9. The surface mount component testing fixture according to claim 5, characterized in that, The movable part is provided with a protrusion, and the upper side of the mounting base is provided with a first opening that extends through the mounting groove. The protrusion passes through the first opening and extends to the top of the mounting base, wherein the protrusion can move back and forth in the first opening.
10. The surface mount component testing fixture according to any one of claims 1-4, characterized in that, The surface mount component testing fixture also includes a first connector, which is disposed on the base and spaced apart from one side of the insulating positioning block. One end of the second pin is fixed to the first connector, and the other end extends toward one side of the insulating positioning block.