Semiconductor equipment

JP7885474B1Active Publication Date: 2026-07-06SEMICON ENERGY LAB CO LTD
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Patent Information

Application Number
JP2026087324
Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
Priority Date
2009-01-22
Filing Date
2026-05-25
Publication Date
2026-07-06
Estimated Expiration
2030-01-12

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Abstract

It suppresses transistor degradation. [Solution] The method comprises a first period and a second period. In the first period, the first transit The zista and the second transistor repeatedly switch on and off alternately, and the third transistor and The fourth transistor is turned off. During the second period, the first transistor and the second The transistor turns off, and the third and fourth transistors turn on alternately. It repeatedly switches between being on and off. In this way, the time the transistor is on can be shortened. Therefore, it suppresses the degradation of transistor characteristics.
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Citation Information

Patent Citations

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