Industrial control computer temperature stress test device

Abstract

The application provides an industrial control computer temperature stress testing device. The device comprises a test box, an external power supply device and an independent temperature control circulating system. The independent temperature control circulating system comprises a constant temperature cavity with a heat preservation layer located in the interior of the test box and a cooling circulating machine located in the exterior of the test box. The constant temperature cavity is connected with the cooling circulating machine through a flow guide pipe. The application can make the jigs and components which are not resistant to high temperature work normally in a constant temperature environment, so that the temperature stress testing of the industrial control computer mainboard can be carried out normally.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of industrial control computer testing, and in particular to an industrial control computer temperature stress testing device. BACKGROUND

[0002] Due to application requirements of an industrial site, an industrial control computer needs to be subjected to strict reliability testing, including high and low temperature testing, etc. During the testing process, a testing interface needs to be externally connected to a testing fixture, and a power supply, a hard disk, a testing tooling, etc. need to be connected to extension lines for testing, as shown in a connection diagram. Figure 1 Thus, during high and low temperature testing, the extension lines are excessively consumed, the probability of being disturbed by EMI (Electro-Magnetic Interference) during start and stop of a device compressor is increased, connection failure is easily caused, testing accuracy is affected or testing cannot be performed, and testing cannot be performed. SUMMARY

[0003] The industrial control computer temperature stress testing device provided by the present application can make fixtures and components that are not resistant to high temperatures work normally in a constant temperature environment, thereby ensuring that temperature stress testing of an industrial control computer mainboard is normally performed.

[0004] In a first aspect, the present application provides an industrial control computer temperature stress testing device, which comprises a test box, an external power supply device and an independent temperature control circulation system, the independent temperature control circulation system comprises a constant temperature cavity with a heat preservation layer located inside the test box and a cooling circulation machine located outside the test box, and the constant temperature cavity is connected to the cooling circulation machine through a flow guide pipe; wherein,

[0005] The test box is used to provide a testing environment with stepwise temperature increase or decrease for a mainboard to be tested.

[0006] The external power supply device is used to supply power to the mainboard to be tested.

[0007] The constant temperature cavity is used to provide a constant temperature environment for key components required for testing.

[0008] The cooling circulation machine is used to control the temperature of the constant temperature cavity.

[0009] Optionally, the key components required for testing include a power supply, a testing fixture, a hard disk and a CPU cooling head.

[0010] Optionally, the power supply is connected to the external power supply device and connected to the mainboard to be tested through a power supply line to supply power to the mainboard to be tested.

[0011] Optionally, the test fixture is connected to the interface of the mainboard to be tested through a test line, and is used for testing the performance of the interface.

[0012] Optionally, the hard disk is connected to the SATA interface of the mainboard to be tested through a SATA line, and is used for testing the performance of the SATA interface.

[0013] Optionally, the CPU cooling head is directly connected to the CPU of the mainboard to be tested, and is used for controlling the working temperature of the CPU.

[0014] Optionally, the cooling medium of the cooling circulation machine is water or anhydrous ethanol.

[0015] The industrial control computer temperature stress test device provided by the application comprises a test box, an external power supply device and an independent temperature control circulation system. Compared with the prior art, the test area and the constant temperature area are isolated, so that the fixtures and components that cannot tolerate high temperature can work normally in the constant temperature environment, thereby ensuring the smooth performance of the limit temperature stress test of the sample to be tested. BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 It is a connection diagram for testing the temperature of the independent components or modules of the industrial control computer in the prior art.

[0017] Figure 2 It is a structural diagram of the industrial control computer temperature stress test device according to an embodiment of the application.

[0018] Figure 3 It is a structural diagram of the industrial control computer temperature stress test device according to another embodiment of the application. DETAILED DESCRIPTION

[0019] In order to make the purpose, technical scheme and advantages of the embodiments of the application clearer, the technical scheme of the embodiments of the application will be described clearly and completely below with reference to the drawings of the embodiments of the application.

[0020] The application provides an industrial control computer temperature stress test device, which comprises a test box, an external power supply device and an independent temperature control circulation system. Figure 2As shown, the device comprises a test box 11, an external power supply device 12 and an independent temperature control circulating system 13, the independent temperature control circulating system 13 comprises a constant temperature cavity 131 with a heat preservation layer located inside the test box and a cooling circulating machine 132 located outside the test box, and the constant temperature cavity 131 is connected with the cooling circulating machine 132 through a flow guide pipe.

[0021] The test box 11 is used for providing a test environment with stepwise temperature increase or decrease for a mainboard to be tested.

[0022] The external power supply device 12 is used for supplying power for the mainboard to be tested.

[0023] The constant temperature cavity 131 is used for providing a constant temperature environment for key components required for testing.

[0024] Optionally, the key components required for testing include a power supply, a test fixture, a hard disk and a CPU cooling head. The power supply is connected with the external power supply device 12 and connected with the mainboard to be tested through a power supply line to supply power for the mainboard to be tested; the test fixture is connected with an interface of the mainboard to be tested through a test line to test the performance of the interface; the hard disk is connected with a SATA interface of the mainboard to be tested through a SATA line to test the performance of the SATA interface; and the CPU cooling head is directly connected with a CPU of the mainboard to be tested to control the working temperature of the CPU.

[0025] The cooling circulating machine 132 is used for controlling the temperature of the constant temperature cavity 131.

[0026] The cooling medium of the cooling circulating machine 132 is water or anhydrous ethanol, preferably, the cooling medium of the cooling circulating machine 132 is anhydrous ethanol.

[0027] The main application scene of the industrial control computer temperature stress test device provided by the application is to perform high-low temperature stepwise temperature increase or decrease stress verification on an industrial control computer system. Generally, the performance test of the port of the industrial control computer needs to be connected with a test fixture, for example, the performance of reading and writing data of the USB port needs to be tested by connecting the USB port of the mainboard to the USB test fixture through a connecting line. The SATA port is used for transmitting data between the mainboard and a storage device, and the ability of the SATA port to transmit data needs to be tested by connecting a hard disk.

[0028] Under the limit temperature stress, the power supply, the CPU, the hard disk and the test fixture of the industrial control computer cannot work normally. The industrial control computer temperature stress test device provided by the application can divide the temperature interval of the mainboard to be tested and the components that cannot work at high temperature, such as the power supply, the CPU, the hard disk and the test fixture. Figure 3As shown, it is a structural schematic view of an embodiment of the industrial control computer temperature stress test device of the present application, the to-be-tested mainboard is located in the test box, the USB test fixture, the power supply, the hard disk and the CPU cooling head are located in the constant temperature cavity with a thermal insulation layer and above the mainboard. The USB test fixture in the constant temperature cavity is connected to the USB port of the mainboard through the connecting line of the short head, the hard disk is connected to the SATA interface of the mainboard through the SATA line, the AC-DC power supply is connected to the mainboard through the power line, and the CPU cooling head is directly connected to the CPU on the to-be-tested mainboard. In this way, when the test box is at the limit high temperature, the USB test fixture in the constant temperature cavity will not appear the high temperature aging phenomenon, and since the USB extension line is short, the problem of USB wire failure can also be avoided; the test box always maintains a large air speed, and the humidity can be controlled very low, when the test box is at the limit low temperature, the AC-DC power supply and the hard disk will not fail due to condensation.

[0029] The other ports of the industrial control computer such as the VGA (Video Graphics Array) interface, the LAN (Local Area Network) interface and the like are tested, and the corresponding test fixture is also placed in the constant temperature cavity 131 and connected to the corresponding port of the to-be-tested mainboard through a short connecting line, so that the performance test under the limit temperature can be normally carried out.

[0030] The independent temperature control circulating system 13 controls the temperature of the whole cavity through the cooling circulating machine 132, and the cooling medium is preferably anhydrous ethanol. Through the independent temperature control circulating system 13, the hard disk, the power supply and the test fixture and other key components can work normally in the constant temperature environment, the temperature reaches the set temperature point, and the next step of limit temperature test is continued. In addition, the extension line, the power line and other non-key test components can work stably under the limit temperature, and the test can be carried out smoothly.

[0031] The industrial control computer temperature stress test device provided by the present application comprises a test box 11, an external power supply device 12 and an independent temperature control circulating system 13, the independent temperature control circulating system 13 comprises a constant temperature cavity 131 with a thermal insulation layer located in the test box and a cooling circulating machine 132 located outside the test box, and the constant temperature cavity 131 is connected with the cooling circulating machine 132 through a flow guide pipe. Compared with the prior art, the test area and the constant temperature area are isolated in the present application, so that the fixtures and components that cannot withstand high temperature can work normally in the constant temperature environment, so that the limit temperature stress test of the measured sample can be carried out smoothly.

[0032] Based on the industrial control computer temperature stress test device provided by the application, when the test box temperature is increased to the temperature protection point of the CPU during the test under the high-temperature environment, the CPU needs to be cooled by the circulating machine at this time to ensure that the mainboard works for the next test; when the test is carried out under the low-temperature environment, the CPU needs to be temperature-controlled to ensure that the mainboard can be started for the next test when verifying the reliability of the mainboard under the temperature of-5 DEG C or-10 DEG C or below.

[0033] The above is only a specific embodiment of the application, but the protection scope of the application is not limited to this. Any person skilled in the art can easily think of changes or replacements within the technical range disclosed by the application, which should be covered in the protection scope of the application. Therefore, the protection scope of the application should be subject to the protection scope of the claims.

Claims

1. An industrial control computer temperature stress testing apparatus, characterized by, The device comprises a test box, an external power supply device and an independent temperature control circulation system, the independent temperature control circulation system comprises a constant temperature cavity with a heat preservation layer located inside the test box and a cooling circulation machine located outside the test box, the constant temperature cavity is connected with the cooling circulation machine through a flow guide pipe; wherein, The test box is used for providing a test environment with stepwise temperature increase or decrease for a mainboard to be tested; The external power supply device is used for supplying power for the mainboard to be tested; The constant temperature cavity is used for providing a constant temperature environment for key components required for testing; The cooling circulation machine is used for controlling the temperature of the constant temperature cavity; The key components required for testing are located in the constant temperature cavity; The key components required for testing are used for extreme temperature testing of the mainboard to be tested; The key components required for testing comprise a test fixture; The test fixture is connected with an interface of the mainboard to be tested through a test line, and is used for testing the performance of the interface.

2. The apparatus of claim 1, wherein, The key components required for testing further comprise a power supply, a hard disk and a CPU cooling head.

3. The apparatus of claim 2, wherein, The power supply is connected with the external power supply device, and is connected with the mainboard to be tested through a power supply line to supply power for the mainboard to be tested.

4. The apparatus of claim 2, wherein, The hard disk is connected with a SATA interface of the mainboard to be tested through a SATA line to test the performance of the SATA interface.

5. The apparatus of claim 2, wherein, The CPU cooling head is directly connected with a CPU of the mainboard to be tested to control the working temperature of the CPU.

6. The apparatus of claim 1, wherein, The cooling medium of the cooling circulation machine is water or anhydrous ethanol.

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