Thickness detection device, method, system, storage medium and processor

Abstract

The present application provides a thickness detection device, method, system, storage medium and processor. The thickness detection device includes: a detection unit, including a plurality of thickness detection chips, which are arranged in sequence at least along the second direction; a common unit, which is arranged opposite to the detection unit in the first direction and at intervals, at least two positions on the first surface of the common unit are at different distances from the detection unit, the second direction is respectively perpendicular to the first direction and the moving direction of the object to be measured, and the first surface is the surface of the common unit close to the detection unit. In the thickness detection device, at least two positions on the first surface of the common unit are at different distances from the detection unit, so that at least two positions of the common unit are at different intervals from the detection unit, thereby reducing the possibility of paper jams in the thickness detection device and improving the practicality of the thickness detection device. The common unit of the thickness detection device is simple to manufacture and low in cost, and is suitable for occasions of continuous measurement.

Description

Technical Field

[0001] The present application relates to the field of detection, and in particular, to a thickness detection device, method, system, storage medium and processor. Background Art

[0002] Online continuous thickness measurement of thin sheet items, such as banknotes, paper, bills, plastic films, textile products, etc., is becoming increasingly important in the production, testing, processing, and recycling of these products. In recent years, the detection device for the thickness of the film to be tested by electrostatic induction between parallel plate capacitors has been continuously developed. Figure 1 As shown, this detection device is usually divided into two parts: a detection unit 10 and a common unit 20. The common unit and the detection unit are arranged opposite to each other in the first direction, and are spaced at a certain distance to form a channel for the object to be detected with a uniform gap. The detection unit is composed of a frame 11, a detection substrate 12 and a cover plate 15. A thickness detection chip 13 is provided on the detection substrate in the second direction, and a detection control unit 14 is provided below the detection substrate. The common unit part is composed of a conductive cylinder. The conductive cylinder applies an electric field to the thickness detection chip. When the thickness of the medium between the common unit and the thickness detection chip changes, the voltage induced by the thickness detection chip will change, thereby detecting the thickness of the object. In order to improve the sensitivity, the distance between the common unit and the detection unit must be reduced. The reduction in distance makes it easy for this detection device to jam during continuous scanning, thereby limiting the application of this type of thickness detection device. Summary of the invention

[0003] The main purpose of the present application is to provide a thickness detection device, method, system, storage medium and processor to solve the problem that the thickness detection device in the prior art is prone to paper jam.

[0004] In order to achieve the above-mentioned purpose, according to one aspect of the present application, a thickness detection device is provided, including: a detection unit, including a plurality of thickness detection chips, and the thickness detection chips are arranged in sequence at least along a second direction; a common unit, opposite to and spaced apart from the detection unit in the first direction, at least two positions of the first surface of the common unit are at different distances from the detection unit, the second direction is respectively perpendicular to the first direction and the moving direction of the object to be measured, and the first surface is the surface of the common unit close to the detection unit.

[0005] Further, the first surface includes a first area and a second area, the distance between each position in the first area and the detection unit is a first distance, the distance between each position in the second area and the detection unit is a second distance, and the first distance is not equal to the second distance.

[0006] Furthermore, there are multiple first areas and multiple second areas, and the first areas and the second areas are alternately arranged in the second direction, the first distance is greater than the second distance, and among any two adjacent first areas and second areas, the length of the first area in the second direction is less than the length of the second area in the second direction.

[0007] Furthermore, the common unit includes a first conductor, a surface of one side of the first conductor close to the detection unit has a plurality of grooves, and the plurality of grooves are arranged at intervals along the second direction.

[0008] Furthermore, the groove is an annular groove.

[0009] Furthermore, the common unit further includes a second conductor, which is disposed in the groove, an exposed surface of the first conductor close to the detection unit is the first region, and a surface of the second conductor close to the detection unit is the second region.

[0010] Furthermore, a first insulating layer is provided between the second conductor and the first conductor, and the first insulating layer insulates the first conductor from the second conductor.

[0011] Furthermore, the second surface of the first conductor has a plurality of protrusions, the protrusions and the grooves are arranged in a one-to-one correspondence in the first direction, and the second surface is a surface of the first conductor away from the detection unit.

[0012] Furthermore, the common unit includes a third conductor and a plurality of annular sleeves, and the plurality of annular sleeves are sleeved on the third conductor at intervals along the second direction.

[0013] Furthermore, the annular sleeve is a conductive sleeve.

[0014] Furthermore, a second insulating layer is provided between the conductive sleeve and the third conductor, and the second insulating layer insulates the third conductor from the conductive sleeve.

[0015] Furthermore, the annular sleeve is a non-conductive sleeve.

[0016] Furthermore, the first conductor is a first cylinder, and an axis of the first cylinder is parallel to the second direction.

[0017] Furthermore, the third conductor is a second cylinder, and an axis of the second cylinder is parallel to the second direction.

[0018] According to another aspect of the present application, a thickness detection method is provided, and the detection method adopts any one of the detection devices for detection, and the detection method includes: applying a detection voltage to a common unit; placing an object to be measured in a gap between the common unit and the detection unit, controlling the movement of the object to be measured, and the movement direction of the object to be measured is perpendicular to a second direction, and obtaining a plurality of first voltage signals; obtaining a plurality of correction parameters, and the correction parameters correspond to the first voltage signals one by one; correcting the corresponding first voltage signals according to the correction parameters to obtain a plurality of corrected voltage signals; and calculating the thickness of the object to be measured according to the corrected voltage signals.

[0019] Furthermore, the correction parameters include a first correction parameter, and the process of obtaining the first correction parameter includes: applying the detection voltage to the common unit; controlling the detection device to perform an empty scan to obtain a plurality of the first correction parameters.

[0020] Further, the common unit includes a first conductor and a second conductor that are insulated, or the common unit includes an annular kit and a third conductor that are insulated, the annular kit is a conductive kit, the second conductor and the conductive kit are defined as a first predetermined conductor, the first conductor and the third conductor are defined as a second predetermined conductor, the detection voltage includes a first detection voltage and a second detection voltage, and before applying the detection voltage to the common unit, the detection method further includes: applying the first detection voltage to the first predetermined conductor; controlling the detection device to scan in vain, so that the plurality of thickness detection chips of the detection unit corresponding to the first predetermined conductor output a plurality of third voltage signals; placing a predetermined sample in the interval between the common unit and the detection unit, controlling the movement of the predetermined sample, and the movement direction of the predetermined sample is perpendicular to the second direction, detecting the predetermined sample, and the plurality of thickness detection chips corresponding to the first predetermined conductor output a plurality of fourth voltage signals; obtaining a first average value and a second average value, the first average value being the average value of the plurality of third voltage signals. The method comprises the following steps: applying a second preliminary voltage to the second predetermined conductor, wherein the second preliminary voltage is greater than the first detection voltage; controlling the detection device to perform an empty scan, and the plurality of thickness detection chips corresponding to the second predetermined conductor output a plurality of fifth voltage signals; placing the predetermined sample in the interval between the common unit and the detection unit, controlling the movement of the predetermined sample, and the movement direction of the predetermined sample is perpendicular to the second direction, and the plurality of thickness detection chips corresponding to the second predetermined conductor output a plurality of sixth voltage signals; obtaining a third average value and a fourth average value, wherein the third average value is the average value of the plurality of fifth voltage signals, and the fourth average value is the average value of the plurality of sixth voltage signals; adjusting the second preliminary voltage until the second difference is equal to the first difference, and when the second difference is equal to the first difference, the second preliminary voltage is the second detection voltage, the first difference is the difference between the first average value and the second average value, and the second difference is the difference between the third average value and the fourth average value.

[0021] Further, applying the detection voltage to the common unit includes: applying the first detection voltage to the first predetermined conductor; and applying the second detection voltage to the second predetermined conductor.

[0022] According to another aspect of the present application, a thickness detection system is provided, comprising a thickness detection device, wherein the thickness detection device is any one of the thickness detection devices described above.

[0023] Furthermore, the thickness detection system also includes a processing device, and the processing device is used to execute any one of the thickness detection methods.

[0024] According to another aspect of the present application, a storage medium is provided, wherein the storage medium includes a stored program, wherein when the program is executed, the device where the storage medium is located is controlled to execute any one of the thickness detection methods.

[0025] According to another aspect of the present application, a processor is provided, wherein the processor is used to run a program, and when the program is run, any one of the thickness detection methods is executed.

[0026] By applying the technical solution of the present application, in the above-mentioned thickness detection device, the distances between at least two positions of the first surface of the common unit and the detection unit are different, so that the intervals between at least two positions of the common unit and the detection unit are different, thereby reducing the possibility of paper jams in the thickness detection device and improving the practicality of the thickness detection device. In addition, the common unit of the thickness detection device is simple to manufacture and low in cost, and is suitable for occasions of continuous measurement. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] The drawings constituting part of the present application are used to provide a further understanding of the present application. The exemplary embodiments and descriptions of the present application are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0028] Figure 1 A schematic diagram of the structure of a thickness detection device in the prior art is shown;

[0029] Figure 2 The schematic diagram of the structure of the thickness detection device provided in Example 1 of the present application is shown;

[0030] Figure 3 A schematic structural diagram of a thickness detection device provided in Example 2 of the present application is shown;

[0031] Figure 4 The schematic diagram of the structure of the thickness detection device provided in Example 3 of the present application is shown;

[0032] Figure 5 A schematic diagram of the structure of a thickness detection device provided in Example 4 of the present application is shown;

[0033] Figure 6 A schematic diagram of the structure of a thickness detection device provided in Example 5 of the present application is shown;

[0034] Figure 7 A schematic diagram showing the structure of a thickness detection device provided in Example 6 of the present application is shown; and

[0035] Figure 8 A schematic structural diagram of a thickness detection device provided in Example 7 of the present application is shown.

[0036] The above drawings include the following reference numerals:

[0037] 10. Detection unit; 11. Frame; 12. Detection substrate; 13. Thickness detection chip; 14. Detection control unit; 15. Cover plate; 20. Common unit; 21. First conductor; 22. Second conductor; 23. First insulating layer; 24. Third conductor; 25. Ring kit; 26. Second insulating layer. DETAILED DESCRIPTION

[0038] It should be noted that the following detailed descriptions are illustrative and are intended to provide further explanation of the present application. Unless otherwise specified, all technical and scientific terms used herein have the same meanings as those commonly understood by those skilled in the art to which the present application belongs.

[0039] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprise" and / or "include" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0040] It should be understood that when an element (such as a layer, film, region, or substrate) is described as being "on" another element, the element may be directly on the other element, or there may be intermediate elements. Moreover, in the specification and claims, when an element is described as being "connected" to another element, the element may be "directly connected" to the other element, or "connected" to the other element through a third element.

[0041] As introduced in the background art, the thickness detection device in the prior art is prone to paper jam. In order to solve the above problem, the present application proposes a thickness detection device.

[0042] In a typical embodiment of the present application, a thickness detection device is provided, such as Figures 2 to 8 As shown, the thickness detection device comprises:

[0043] The detection unit 10 includes a plurality of thickness detection chips 13, wherein the thickness detection chips 13 are arranged in sequence at least along the second direction;

[0044] The common unit 20 is arranged opposite to and spaced from the detection unit 10 in the first direction. The distances between at least two positions of the first surface of the common unit 20 and the detection unit 10 are different. The second direction is respectively perpendicular to the first direction and the moving direction of the object to be detected. The first surface is the surface of the common unit 20 close to the detection unit 10.

[0045] In the thickness detection device, the distances between at least two positions of the first surface of the common unit and the detection unit are different, so that the intervals between at least two positions of the common unit and the detection unit are different, thereby reducing the possibility of paper jams in the thickness detection device and improving the practicality of the thickness detection device. In addition, the common unit of the thickness detection device is simple to manufacture and low in cost, and is suitable for occasions of continuous measurement.

[0046] In the actual thickness detection process, there may be large protrusions on the surface of the object to be measured. In order to further reduce the possibility of paper jam in the thickness detection device, in an embodiment of the present application, the above-mentioned first surface includes a first area and a second area, and the distance between each position of the above-mentioned first area and the above-mentioned detection unit is a first distance, and the distance between each position of the above-mentioned second area and the above-mentioned detection unit is a second distance, and the above-mentioned first distance is not equal to the above-mentioned second distance.

[0047] In order to further reduce the possibility of paper jams in the thickness detection device, in one embodiment of the present application, there are multiple first areas, there are multiple second areas, and the first areas and the second areas are alternately arranged in the second direction, the first distance is greater than the second distance, and in any two adjacent first areas and second areas, the length of the first area in the second direction is less than the length of the second area in the second direction. Specifically, the above structure further reduces the possibility of paper jams in the thickness detection device by alternately arranging the first area and the second area in the second direction so that the intervals between any two adjacent areas of the common unit and the detection unit are different.

[0048] It should be noted that the thickness detection chip output detection signal corresponding to the first area is the first detection signal, and the thickness detection chip output detection signal corresponding to the second area is the second detection signal. Since the above-mentioned second distance is smaller than the above-mentioned first distance, the second detection signal is stronger than the first detection signal. In other words, the thickness detection device of the present application has different sensitivities at different positions. Therefore, in order to ensure the accuracy of thickness detection, the thickness detection device of the present application can be subjected to sensitivity correction. Of course, the sensitivity of the positions corresponding to the above-mentioned first areas is the same, and the sensitivity of the positions corresponding to the above-mentioned second areas is also the same. Therefore, the first detection signal or the second detection signal can also be discarded, and the accuracy of thickness detection can also be ensured without sensitivity correction. However, discarding data will result in incomplete thickness detection, and this method is not suitable for full-width thickness detection.

[0049] In order to further improve the accuracy of thickness detection, in one embodiment of the present application, the length of the first area in the second direction is less than the length of the second area in the second direction. When the thickness detection device with the above structure is used for thickness detection, since the sensitivity of the position corresponding to the second area is high, the first detection signal is discarded and the second detection signal is used to calculate the thickness of the object to be detected, thereby further improving the accuracy of thickness detection.

[0050] In a specific embodiment of the present application, Figure 2 and Figure 8 As shown, the detection unit 10 includes a frame 11, a detection substrate 12 and a cover plate 15. The detection substrate 12 is arranged in the frame 11. The detection substrate 12 is provided with a plurality of thickness detection chips 13 arranged at least along the second direction. The cover plate 15 is arranged parallel to the detection substrate 12 and is mounted on the frame 11. The cover plate 15 is used to protect the thickness detection chip 13. The common unit is arranged on the surface of the cover plate, and the interval between the cover plate 15 and the common unit 20 is the transmission channel of the object to be detected.

[0051] In order to better control the output of the detection signal, such as Figure 2 and Figure 8 As shown, the detection unit 10 further includes a detection control unit 14 disposed on a surface of the detection substrate 12 away from the common unit 20 , and the detection control unit 14 is at least used to control the output of the detection signal of the thickness detection chip 13 .

[0052] The common unit of the present application may have various structures. Under the condition that the distances between at least two positions of the first surface of the common unit and the detection unit 10 are different, those skilled in the art may select a common unit with a suitable structure according to actual conditions.

[0053] In a specific embodiment of the present application, Figures 2 to 5 As shown, the common unit 20 includes a first conductor 21 , and a surface of the first conductor 21 close to the detection unit 10 has a plurality of grooves spaced apart along the second direction.

[0054] In a specific embodiment of the present application, Figure 3As shown, the groove is an annular groove. In the above structure, the distance between each position of the annular groove close to the exposed surface of the detection unit and the detection unit is a first distance, and the distance between each position of the remaining first conductor close to the side surface of the detection unit and the detection unit is a second distance, and the first distance is greater than the second distance. In addition, in the above structure, the first conductor with an annular groove can be manufactured by annularly grooving a metal rod.

[0055] In a specific embodiment of the present application, Figure 4 As shown, the common unit 20 further includes a second conductor 22, which is disposed in the groove, and the exposed surface of the first conductor 21 close to the detection unit 10 is the first area, and the surface of the second conductor 22 close to the detection unit 10 is the second area. In the above structure, the distance between each position of the surface of one side of the first conductor close to the detection unit and the detection unit is the first distance, and the distance between each position of the exposed surface of the second conductor close to the detection unit and the detection unit is the second distance, and the first distance is greater than the second distance.

[0056] In a specific embodiment of the present application, Figure 4 As shown, there is a first insulating layer 23 between the second conductor 22 and the first conductor 21, and the first insulating layer 23 insulates the first conductor 21 and the second conductor 22. In the above structure, the distance between each position of the surface of one side of the first conductor close to the detection unit and the detection unit is a first distance, and the distance between each position of the exposed surface of the second conductor close to the detection unit and the detection unit is a second distance, and the first distance is greater than the second distance. In this embodiment, the first conductor and the second conductor are insulated, and different voltages can be applied to the first conductor and the second conductor during the detection process, so as to obtain a more accurate detection result.

[0057] In a specific embodiment of the present application, Figure 5 As shown, the second surface of the first conductor 21 has a plurality of protrusions, and the protrusions are arranged one-to-one with the grooves in the first direction, and the second surface is the surface of the first conductor 21 away from the detection unit 10. In addition, in the above structure, the first conductor with protrusions can be made by bending a metal rod.

[0058] It should be noted that, those skilled in the art can also rotate the first conductor with the protrusion so that the second surface becomes the surface of the first conductor close to the detection unit. In this structure, the distance between each position of the exposed surface of the protrusion close to the detection unit and the detection unit is the second distance, and the distance between each position of the remaining surface of one side of the first conductor close to the detection unit and the detection unit is the first distance, and the first distance is greater than the second distance.

[0059] In a specific embodiment of the present application, Figures 6 to 8 As shown, the common unit 20 includes a third conductor 24 and a plurality of annular sleeves 25, and the plurality of annular sleeves 25 are sleeved on the third conductor 24 at intervals along the second direction. In the above structure, the distance between each position of the exposed surface of one side of the third conductor close to the detection unit and the detection unit is a first distance, and the distance between each position of the surface of the annular sleeve close to the detection unit and the detection unit is a second distance, and the first distance is greater than the second distance.

[0060] In a specific embodiment of the present application, Figure 6 As shown, the annular kit 25 is a conductive kit. In the above structure, when the object to be tested is stuck, the common unit can rotate so that the conductive kit is separated from the object to be tested, thereby making it easier for the object to be tested to pass through the detection channel, further reducing the possibility of paper jam. Specifically, the conductive kit can be a conductive rubber stick, which has a high friction coefficient, thereby making it easier for the object to be tested to pass through the detection channel. Of course, those skilled in the art can select a suitable conductive kit according to actual conditions.

[0061] Since the sensitivity of different positions of the thickness detection device is different, in order to calibrate the sensitivity of the thickness detection device by adjusting the detection voltage, in a specific embodiment of the present application, Figure 7 As shown, there is a second insulating layer 26 between the conductive sleeve and the third conductor 24, and the second insulating layer 26 insulates the third conductor 24 from the conductive sleeve. In this embodiment, the conductive sleeve and the third conductor are insulated, and different voltages can be applied to the conductive sleeve and the third conductor during the detection process, so as to obtain a more accurate detection result.

[0062] In a specific embodiment of the present application, Figure 8As shown, the annular kit 25 is a non-conductive kit. In the above structure, when the object to be tested is stuck, the common unit can rotate to separate the conductive kit from the object to be tested, thereby making it easier for the object to be tested to pass through the detection channel, further reducing the possibility of banknotes being stuck. Specifically, the conductive kit can be a non-conductive rubber stick. Of course, those skilled in the art can select a suitable conductive kit according to actual conditions.

[0063] In a specific embodiment of the present application, Figures 2 to 5 As shown, the first conductor 21 is a first cylinder, and the axis of the first cylinder is parallel to the second direction.

[0064] In a specific embodiment of the present application, Figures 6 to 8 As shown, the third conductor 24 is a second cylinder, and the axis of the second cylinder is parallel to the second direction.

[0065] Of course, the first conductor and the third conductor are not limited to cylinders, and those skilled in the art can select first conductors and third conductors of suitable shapes according to actual conditions, for example, prisms.

[0066] In another typical embodiment of the present application, a thickness detection method is provided, and the detection method adopts any one of the above-mentioned detection devices for detection.

[0067] Specifically, the detection method includes: applying a detection voltage to the common unit; placing the object to be detected in the gap between the common unit and the detection unit, controlling the movement of the object to be detected, and the movement direction of the object to be detected is perpendicular to the second direction, and obtaining a plurality of first voltage signals Cn; obtaining a plurality of correction parameters, and the correction parameters correspond one-to-one to the first voltage signals Cn; correcting the corresponding first voltage signals Cn according to the correction parameters to obtain a plurality of correction voltage signals Jn; and calculating the thickness of the object to be detected according to the correction voltage signals Jn.

[0068] In the above thickness detection method, the object to be detected is first detected to obtain multiple first voltage signals, then multiple correction parameters are obtained, and the corresponding first voltage signals are corrected according to the correction parameters to obtain multiple corrected voltage signals, and finally, the thickness of the above object to be detected is calculated according to the corrected voltage signals. Under the premise of ensuring that the possibility of paper jam is small, the thickness detection method performs sensitivity correction on the above thickness detection device to improve the accuracy of thickness detection.

[0069] In the actual detection process, due to the different sensitivities of different positions of the above-mentioned thickness detection device, the detected thickness is inaccurate. The above-mentioned thickness detection method can calibrate the sensitivity of the thickness detection device by adjusting the detection voltage. In this case, the first voltage signal can be corrected only according to the scan voltage signal to further improve the accuracy of thickness detection. In one embodiment of the present application, the above-mentioned correction parameters include a first correction parameter An, and the process of obtaining the above-mentioned first correction parameter An includes: applying the above-mentioned detection voltage to the above-mentioned common unit; controlling the above-mentioned detection device to scan in an empty space to obtain a plurality of the above-mentioned first correction parameters An. Specifically, the above-mentioned detection voltage is applied to the above-mentioned common unit, and the detection voltage is the same as the detection voltage applied when detecting the object to be detected, and then the above-mentioned detection device is controlled to scan in an empty space to obtain a plurality of the above-mentioned first correction parameters, and the above-mentioned first correction parameters correspond one to one with the above-mentioned first voltage signal.

[0070] Of course, it is also possible not to adjust the detection voltage to perform sensitivity correction on the thickness detection device. In this case, in order to reduce the impact of different sensitivities and further improve the accuracy of thickness detection, in one embodiment of the present application, the correction parameters also include a second correction parameter Kn, and the process of obtaining the second correction parameter Kn includes: applying the detection voltage to the common unit; placing a predetermined sample in the interval between the common unit and the detection unit, controlling the movement of the predetermined sample, and the movement direction of the predetermined sample is perpendicular to the second direction, to obtain a plurality of second voltage signals Bn; calculating the second correction parameter Kn according to the correction target value M, the first correction parameter An and the corresponding second voltage signal Bn, and correcting the corresponding first voltage signal according to the correction parameter to obtain a plurality of corrected voltage signals, including: correcting the corresponding first voltage signal Cn according to the first correction parameter An and the second correction parameter Kn, to obtain a plurality of corrected voltage signals Jn.

[0071] Specifically, the correction target value M ranges from 201 to 255. During a detection process, the correction target value is a fixed value. Technical personnel in this field can select a suitable correction target value according to actual conditions. The formula of the second correction parameter Kn is Kn=M / (Bn-An), where n is a positive integer. When the corresponding first voltage signal Cn is corrected according to the first correction parameter An and the second correction parameter Kn, the formula of the correction voltage signal Jn is Jn=(Cn-An)×Kn.

[0072] The thickness detection method of the present application can calibrate the corresponding first voltage signal only according to the first correction parameter. In this case, the sensitivity of the thickness detection device can be calibrated by adjusting the detection voltage. In a specific embodiment of the present application, the common unit includes a first conductor and a second conductor that are insulated, or the common unit includes an annular kit and a third conductor that are insulated, the annular kit is a conductive kit, the second conductor and the conductive kit are defined as a first predetermined conductor, the first conductor and the third conductor are defined as a second predetermined conductor, the detection voltage includes a first detection voltage and a second detection voltage, and before applying the detection voltage to the common unit, the detection method further includes: applying the first detection voltage to the first predetermined conductor; controlling the detection device to scan in vain, so that the plurality of thickness detection chips of the detection unit corresponding to the first predetermined conductor output a plurality of third voltage signals; placing a predetermined sample in the interval between the common unit and the detection unit, controlling the movement of the predetermined sample, and the movement direction of the predetermined sample is perpendicular to the second direction, detecting the predetermined sample, and the plurality of thickness detection chips corresponding to the first predetermined conductor output a plurality of fourth voltage signals; obtaining a first average value AL and a second average value BL, the first average value AL being the average value of the plurality of third voltage signals, The second average value BL is the average value of the plurality of the fourth voltage signals; a second preliminary voltage is applied to the second predetermined conductor, the second preliminary voltage being greater than the first detection voltage; the detection device is controlled to scan empty, and the plurality of thickness detection chips corresponding to the second predetermined conductor output a plurality of fifth voltage signals; the predetermined sample is placed in the interval between the common unit and the detection unit, the predetermined sample is controlled to move, and the moving direction of the predetermined sample is perpendicular to the second direction, and the plurality of thickness detection chips corresponding to the second predetermined conductor output a plurality of sixth voltage signals; a third average value AX and a fourth average value BX are obtained, the third average value AX is the average value of the plurality of the fifth voltage signals, and the fourth average value BX is the average value of the plurality of the sixth voltage signals; the second preliminary voltage is adjusted until the second difference is equal to the first difference, that is, BL-AL=BX-AX, when the second difference is equal to the first difference, the second preliminary voltage is the second detection voltage, the first difference is the difference between the first average value and the second average value, and the second difference is the difference between the third average value and the fourth average value. The above method of adjusting the detection voltage to perform sensitivity correction on the thickness detection device can eliminate the sensitivity difference at different positions of the detection unit, so that the detected voltage signal can truly reflect the actual thickness of the object being measured.

[0073] Specifically, in the process of adjusting the second preliminary voltage, the first detection voltage is always lower than the second detection voltage, and those skilled in the art may select a suitable first detection voltage according to actual conditions.

[0074] In order to reduce the influence caused by the different sensitivities of different positions of the thickness detection device, in a specific embodiment of the present application, applying the detection voltage to the common unit includes: applying the first detection voltage to the first predetermined conductor; applying the second detection voltage to the second predetermined conductor. Specifically, the corresponding first voltage signal Cn is corrected according to the first correction parameter An, and at this time, the formula of the correction voltage signal Jn is Jn=(Cn-An).

[0075] In another typical embodiment of the present application, a thickness detection system is provided, including a thickness detection device, wherein the thickness detection device is any one of the above-mentioned thickness detection devices.

[0076] In the above-mentioned thickness detection system, the distances between at least two positions on the first surface of the common unit and the detection unit are different, so that the intervals between at least two positions of the common unit and the detection unit are different, thereby reducing the possibility of paper jam in the thickness detection device and improving the practicality of the thickness detection device. It is particularly suitable for occasions of continuous measurement, and the thickness detection system can perform sensitivity correction on the above-mentioned thickness detection device to improve the accuracy of thickness detection.

[0077] The thickness detection system further comprises a processing device, and the processing device is used to execute any one of the detection methods mentioned above.

[0078] In another embodiment of the present application, when detecting the object to be measured, the signal output by the detection unit of the above-mentioned thickness detection device is a first voltage signal, and the above-mentioned processing device includes a control unit, an acquisition unit, a correction unit and a calculation unit, wherein the above-mentioned control unit is used to control the application of the detection voltage to the common unit of the above-mentioned thickness detection device, and is also used to control the movement of the above-mentioned object to be measured; the above-mentioned acquisition unit is used to obtain multiple correction parameters, and the above-mentioned correction parameters correspond one-to-one to the above-mentioned first voltage signal; the above-mentioned correction unit is used to correct the corresponding above-mentioned first voltage signal according to the above-mentioned correction parameters to obtain multiple corrected voltage signals; the above-mentioned calculation unit is used to calculate the thickness of the above-mentioned object to be measured according to the above-mentioned correction voltage signal.

[0079] In order to enable those skilled in the art to more clearly understand the technical solution of the present application, the technical solution of the present application will be explained below in conjunction with specific embodiments.

[0080] Example 1

[0081] like Figure 2As shown, the thickness detection device includes a detection unit 10 and a common unit 20. The common unit 20 is arranged opposite to the detection unit 10 in a first direction and spaced apart from each other.

[0082] The detection unit 10 includes a frame 11, a detection substrate 12, a thickness detection chip 13, a detection control unit 14 and a cover plate 15. The detection substrate 12 is arranged in the frame 11. The cover plate 15 is arranged in parallel with the detection substrate 12 and connected to the frame 11. The thickness detection chips 13 are arranged in sequence at least along the second direction on the surface of the detection substrate 12 close to the common unit 20. The detection control unit 14 is arranged on another surface of the detection substrate 12. There are 6 thickness detection chips 13, with a resolution of 50DPI, a total of 216 detection points, and an effective scanning length of 108 mm. The cover plate 15 is 0.4 mm ITO glass.

[0083] The common unit 20 includes a first conductor 21, and a surface of one side of the first conductor 21 close to the detection unit 10 has a plurality of grooves spaced along the second direction, and the second direction is perpendicular to the first direction and the moving direction of the object to be detected. The distance between each position of the exposed surface of the groove close to the detection unit 10 and the detection unit 10 is the first distance, and the distance between each position of the surface of the remaining first conductor 21 close to the detection unit 10 and the detection unit 10 is the second distance, the first distance is 3.5 mm, and the second distance is 0.5 mm. The first conductor 21 is a metal round rod with a diameter of 10 mm, the depth of the groove is 4 mm, the length in the second direction is 15 mm, and the distance between any two adjacent grooves is 20 mm.

[0084] Specific detection methods include:

[0085] Apply a detection voltage to the common unit; place the object to be measured in the gap between the common unit and the detection unit, control the movement of the object to be measured, and the moving direction of the object to be measured is perpendicular to the second direction, so as to obtain a plurality of first voltage signals Cn; apply the detection voltage to the common unit; control the detection device to scan in vain, obtain a plurality of first correction parameters An, the first correction parameters correspond to the first voltage signal Cn one by one, and apply the detection voltage to the common unit; place a predetermined sample in the gap between the common unit and the detection unit, control the movement of the predetermined sample, and the moving direction of the predetermined sample is perpendicular to the second direction, so as to obtain a plurality of second voltage signals Bn; calculate the second correction parameter Kn according to the correction target value M, the first correction parameter An and the corresponding second voltage signal Bn, the second correction parameter corresponds to the first voltage signal Cn one by one; correct the corresponding first voltage signal Cn according to the first correction parameter An and the second correction parameter Kn, so as to obtain a plurality of correction voltage signals Jn; calculate the thickness of the object to be measured according to the correction voltage signal Jn.

[0086] Example 2

[0087] The difference from Example 1 is that: Figure 3 As shown, the groove is an annular groove, the first conductor 21 is a metal round rod with a diameter of 16 mm, the depth of the annular groove is 3 mm, the length in the second direction is 3 mm, and the distance between any two adjacent grooves is 10 mm.

[0088] Example 3

[0089] The difference from Example 1 is:

[0090] like Figure 4 As shown, the common unit 20 further includes a second conductor 22 and a first insulating layer 23, the second conductor 22 is arranged in the groove, the first insulating layer 23 is arranged between the second conductor 22 and the first conductor 21, the exposed surface of the first conductor 21 close to the detection unit 10 is the first area, and the surface of the second conductor 22 close to the detection unit 10 is the second area, wherein the distance between each position of the surface of one side of the first conductor 21 close to the detection unit 10 and the detection unit 10 is the first distance, the distance between each position of the exposed surface of the second conductor 22 close to the detection unit 10 and the detection unit 10 is the second distance, the first distance is 2.3mm, the second distance is 0.3mm, and the second conductor 22 is formed by cutting 4mm of a metal round rod with a length of 15mm and a diameter of 10mm in the axial direction, and the cut surface is 1mm away from the axis.

[0091] Specific detection methods include:

[0092] Apply the first detection voltage to the second conductor; control the detection device to scan in vain, so that the plurality of thickness detection chips of the detection unit corresponding to the second conductor output a plurality of third voltage signals; place a predetermined sample in the interval between the common unit and the detection unit, control the movement of the predetermined sample, and the movement direction of the predetermined sample is perpendicular to the second direction, detect the predetermined sample, and the plurality of thickness detection chips corresponding to the first predetermined conductor output a plurality of fourth voltage signals; obtain a first average value AL and a second average value BL, wherein the first average value AL is the average value of the plurality of third voltage signals, and the second average value BL is the average value of the plurality of fourth voltage signals; apply a second preliminary voltage to the first conductor, wherein the second preliminary voltage is greater than the first detection voltage; control the detection device to scan in vain, so that the plurality of thickness detection chips corresponding to the first conductor output a plurality of fourth voltage signals. The detection chip outputs multiple fifth voltage signals; the above-mentioned predetermined sample is placed in the interval between the above-mentioned common unit and the above-mentioned detection unit, and the above-mentioned predetermined sample is controlled to move, and the moving direction of the above-mentioned predetermined sample is perpendicular to the above-mentioned second direction, and the multiple thickness detection chips corresponding to the above-mentioned second predetermined conductor output multiple sixth voltage signals; obtain a third average value AX and a fourth average value BX, the above-mentioned third average value AX is the average value of the multiple fifth voltage signals, and the above-mentioned fourth average value BX is the average value of the multiple sixth voltage signals; adjust the above-mentioned second preliminary voltage until the second difference is equal to the first difference, that is, BL-AL=BX-AX, when the above-mentioned second difference is equal to the above-mentioned first difference, the above-mentioned second preliminary voltage is the second detection voltage, the above-mentioned first difference is the difference between the above-mentioned first average value and the above-mentioned second average value, and the above-mentioned second difference is the difference between the above-mentioned third average value and the above-mentioned fourth average value.

[0093] Example 4

[0094] The difference from Example 1 is that: Figure 5 As shown, the second surface of the first conductor 21 has a plurality of protrusions, and the protrusions are arranged one-to-one with the grooves in the first direction. The second surface is the surface of the first conductor 21 away from the detection unit 10. The first conductor 21 is a metal round rod with a diameter of 10 mm, a depth of the groove is 4 mm, a length in the second direction is 15 mm, and a distance between any two adjacent grooves is 20 mm.

[0095] Example 5

[0096] The difference from Example 1 is that: Figure 6As shown, the common unit 20 includes a third conductor 24 and a plurality of annular sleeves 25, and the plurality of annular sleeves 25 are sleeved on the third conductor 24 at intervals along the second direction, and the annular sleeve 25 is a conductive sleeve. The distance between each position of the exposed surface of the third conductor 24 close to the detection unit 10 and the detection unit 10 is a first distance, and the distance between each position of the surface of the annular sleeve 25 close to the detection unit 10 and the detection unit 10 is a second distance, the first distance is 2.5 mm, and the second distance is 0.5 mm. The third conductor 24 is a metal round rod with a diameter of 10 mm, and the annular sleeve 25 is an annular conductive rubber stick with an inner diameter of 10 mm, an outer diameter of 12 mm, and a length of 10 mm.

[0097] Example 6

[0098] The difference from Example 5 is that: Figure 7 As shown, a second insulating layer 26 is provided between the annular sleeve 25 and the third conductor 24 , and the second insulating layer 26 insulates the third conductor 24 from the annular sleeve 25 .

[0099] Specific detection methods include:

[0100] Apply the first detection voltage to the conductive kit; control the detection device to scan in vain, and the plurality of thickness detection chips of the detection unit corresponding to the conductive kit output a plurality of third voltage signals; place a predetermined sample in the interval between the common unit and the detection unit, control the movement of the predetermined sample, and the movement direction of the predetermined sample is perpendicular to the second direction, detect the predetermined sample, and the plurality of thickness detection chips corresponding to the first predetermined conductor output a plurality of fourth voltage signals; obtain a first average value AL and a second average value BL, the first average value AL is the average value of the plurality of third voltage signals, and the second average value BL is the average value of the plurality of fourth voltage signals; apply a second preparatory voltage to the third conductor, and the second preparatory voltage is greater than the first detection voltage; control the detection device to scan in vain, and the plurality of thickness detection chips corresponding to the third conductor output a plurality of fourth voltage signals. The measuring chip outputs a plurality of fifth voltage signals; the predetermined sample is placed in the interval between the common unit and the detection unit, the predetermined sample is controlled to move, and the moving direction of the predetermined sample is perpendicular to the second direction, and the plurality of thickness detection chips corresponding to the second predetermined conductor output a plurality of sixth voltage signals; a third average value AX and a fourth average value BX are obtained, the third average value AX is the average value of the plurality of fifth voltage signals, and the fourth average value BX is the average value of the plurality of sixth voltage signals; the second preliminary voltage is adjusted until the second difference is equal to the first difference, that is, BL-AL=BX-AX, when the second difference is equal to the first difference, the second preliminary voltage is the second detection voltage, the first difference is the difference between the first average value and the second average value, and the second difference is the difference between the third average value and the fourth average value.

[0101] Example 7

[0102] The difference from Example 5 is that: Figure 8 As shown, the annular sleeve 25 is a non-conductive sleeve, the distance between each position of the exposed surface of one side of the third conductor 24 close to the detection unit 10 and the detection unit 10 is the first distance, the distance between each position of the surface of the annular sleeve 25 close to the detection unit 10 and the detection unit 10 is the second distance, the first distance is 0.4mm, and the second distance is 0.1mm, the third conductor 24 is a metal round rod with a diameter of 16mm, and the annular sleeve 25 is an annular non-conductive rubber stick with an inner diameter of 16mm, an outer diameter of 16.3mm, and a length of 2mm.

[0103] According to another aspect of an embodiment of the present application, a storage medium is further provided. The storage medium includes a stored program. Optionally, in this embodiment, the storage medium is configured to store program codes for executing the following steps:

[0104] Step S101, applying a detection voltage to the common unit;

[0105] Step S102, placing the object to be tested in the interval between the common unit and the detection unit, controlling the object to be tested to move, and the moving direction of the object to be tested is perpendicular to the second direction, to obtain a plurality of first voltage signals;

[0106] Step S103, obtaining a plurality of calibration parameters, wherein the calibration parameters correspond to the first voltage signal one by one;

[0107] Step S104, correcting the corresponding first voltage signal according to the correction parameter to obtain a plurality of corrected voltage signals;

[0108] Step S105, calculating the thickness of the object to be measured according to the correction voltage signal.

[0109] According to another aspect of an embodiment of the present application, a processor is further provided, and the processor is used to run a program, wherein when the program is running, program codes of the following steps in the scheduling method of the application program can be executed:

[0110] Step S101, applying a detection voltage to the common unit;

[0111] Step S102, placing the object to be tested in the interval between the common unit and the detection unit, controlling the object to be tested to move, and the moving direction of the object to be tested is perpendicular to the second direction, to obtain a plurality of first voltage signals;

[0112] Step S103, obtaining a plurality of calibration parameters, wherein the calibration parameters correspond to the first voltage signal one by one;

[0113] Step S104, correcting the corresponding first voltage signal according to the correction parameter to obtain a plurality of corrected voltage signals;

[0114] Step S105, calculating the thickness of the object to be measured according to the correction voltage signal.

[0115] The serial numbers of the above-mentioned embodiments of the present application are for description only and do not represent the advantages or disadvantages of the embodiments.

[0116] In the above embodiments of the present application, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, please refer to the relevant description of other embodiments.

[0117] In the several embodiments provided in this application, it should be understood that the disclosed technical content can be implemented in other ways. Among them, the device embodiments described above are only schematic. For example, the division of units can be a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of units or modules, which can be electrical or other forms.

[0118] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed over multiple units. Some or all of the units may be selected according to actual needs to achieve the purpose of the present embodiment.

[0119] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0120] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art or all or part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, server or network device, etc.) to perform all or part of the steps of each embodiment method of the present application. The aforementioned storage medium includes: U disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), mobile hard disk, disk or optical disk, etc. Various media that can store program codes.

[0121] The above are only preferred implementations of the present application. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present application. These improvements and modifications should also be regarded as the scope of protection of the present application.

[0122] From the above description, it can be seen that the above embodiments of the present application achieve the following technical effects:

[0123] 1) In the thickness detection device of the present application, the distances between at least two positions of the first surface of the common unit and the detection unit are different, so that the intervals between at least two positions of the common unit and the detection unit are different, thereby reducing the possibility of paper jams in the thickness detection device and improving the practicality of the thickness detection device. In addition, the common unit of the thickness detection device is simple to manufacture and low in cost, and is suitable for occasions of continuous measurement.

[0124] 2) In the thickness detection method of the present application, the object to be detected is first detected to obtain multiple first voltage signals, then multiple correction parameters are obtained, and the corresponding first voltage signals are corrected according to the correction parameters to obtain multiple corrected voltage signals, and finally, the thickness of the object to be detected is calculated according to the corrected voltage signals. Under the premise of ensuring that the possibility of paper jam is small, the thickness detection method performs sensitivity correction on the thickness detection device to improve the accuracy of thickness detection.

[0125] 3) In the thickness detection system of the present application, the distances between at least two positions on the first surface of the common unit and the detection unit are different, so that the intervals between at least two positions of the common unit and the detection unit are different, thereby reducing the possibility of paper jam in the thickness detection device and improving the practicality of the thickness detection device, which is particularly suitable for occasions of continuous measurement. In addition, the thickness detection system can perform sensitivity correction on the above-mentioned thickness detection device to improve the accuracy of thickness detection.

[0126] The above description is only the preferred embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A thickness detection device, characterized in that: include: A detection unit, comprising a plurality of thickness detection chips, wherein the thickness detection chips are arranged in sequence at least along a second direction; A common unit is arranged opposite to and spaced from the detection unit in a first direction, at least two positions of a first surface of the common unit are at different distances from the detection unit, the second direction is respectively perpendicular to the first direction and the moving direction of the object to be detected, and the first surface is a surface of the common unit close to the detection unit, The common unit includes a first conductor, a surface of the first conductor close to the detection unit has a plurality of grooves, and the plurality of grooves are arranged at intervals along the second direction. The second surface of the first conductor has a plurality of protrusions, and the protrusions and the grooves are arranged in a one-to-one correspondence in the first direction. The second surface is a surface of the first conductor away from the detection unit.

2. The thickness detection device according to claim 1, characterized in that: The first surface includes a first area and a second area, the distance between each position in the first area and the detection unit is a first distance, the distance between each position in the second area and the detection unit is a second distance, and the first distance is not equal to the second distance.

3. The thickness detection device according to claim 2, characterized in that: There are multiple first areas and multiple second areas, and the first areas and the second areas are alternately arranged in the second direction, the first distance is greater than the second distance, and in any two adjacent first areas and second areas, the length of the first area in the second direction is less than the length of the second area in the second direction.

4. The thickness detection device according to claim 1, characterized in that: The groove is an annular groove.

5. The thickness detection device according to claim 2, characterized in that: The common unit further includes a second conductor, which is disposed in the groove. An exposed surface of the first conductor close to the detection unit is the first region, and a surface of the second conductor close to the detection unit is the second region.

6. The thickness detection device according to claim 5, characterized in that: A first insulating layer is provided between the second conductor and the first conductor, and the first insulating layer insulates the first conductor from the second conductor.

7. The thickness detection device according to claim 2 or 3, characterized in that: The common unit includes a third conductor and a plurality of annular sleeves, and the plurality of annular sleeves are sleeved on the third conductor at intervals along the second direction.

8. The thickness detection device according to claim 7, characterized in that: The annular sleeve is a conductive sleeve.

9. The thickness detection device according to claim 8, characterized in that: A second insulating layer is provided between the conductive sleeve and the third conductive body, and the second insulating layer insulates the third conductive body from the conductive sleeve.

10. The thickness detection device according to claim 7, characterized in that: The annular sleeve is a non-conductive sleeve.

11. The thickness detection device according to claim 1, characterized in that: The first conductor is a first cylinder, and the axis of the first cylinder is parallel to the second direction.

12. The thickness detection device according to claim 7, characterized in that: The third conductor is a second cylinder, and the axis of the second cylinder is parallel to the second direction.

13. A thickness detection method, characterized in that: The detection method is performed using a detection device according to any one of claims 1 to 12, and the detection method comprises: applying a detection voltage to the common unit; Placing the object to be tested in the interval between the common unit and the detection unit, controlling the movement of the object to be tested, and the moving direction of the object to be tested is perpendicular to the second direction, to obtain a plurality of first voltage signals; Acquire a plurality of correction parameters, wherein the correction parameters correspond one-to-one to the first voltage signal; Correcting the corresponding first voltage signal according to the correction parameter to obtain a plurality of corrected voltage signals; calculating the thickness of the object to be measured according to the correction voltage signal, The correction parameter includes a first correction parameter, and the process of obtaining the first correction parameter includes: applying the detection voltage to the common unit; controlling the detection device to scan empty to obtain a plurality of the first calibration parameters, The common unit includes a first conductor and a second conductor that are insulated, or the common unit includes an annular set and a third conductor that are insulated, the annular set is a conductive set, the second conductor and the conductive set are defined as a first predetermined conductor, the first conductor and the third conductor are defined as a second predetermined conductor, the detection voltage includes a first detection voltage and a second detection voltage, and before applying the detection voltage to the common unit, the detection method further includes: applying the first detection voltage to the first predetermined conductor; Controlling the detection device to scan empty, so that the plurality of thickness detection chips of the detection unit corresponding to the first predetermined conductor output a plurality of third voltage signals; placing a predetermined sample in the interval between the common unit and the detection unit, controlling the movement of the predetermined sample, and the moving direction of the predetermined sample is perpendicular to the second direction, detecting the predetermined sample, and the plurality of thickness detection chips corresponding to the first predetermined conductor output a plurality of fourth voltage signals; Obtaining a first average value and a second average value, wherein the first average value is an average value of the plurality of third voltage signals, and the second average value is an average value of the plurality of fourth voltage signals; applying a second preliminary voltage to the second predetermined conductor, wherein the second preliminary voltage is greater than the first detection voltage; Controlling the detection device to scan empty, so that the plurality of thickness detection chips corresponding to the second predetermined conductor output a plurality of fifth voltage signals; The predetermined sample is placed in the interval between the common unit and the detection unit, and the predetermined sample is controlled to move, and the moving direction of the predetermined sample is perpendicular to the second direction, and the plurality of thickness detection chips corresponding to the second predetermined conductor output a plurality of sixth voltage signals; Obtaining a third average value and a fourth average value, wherein the third average value is an average value of the plurality of fifth voltage signals, and the fourth average value is an average value of the plurality of sixth voltage signals; The second preliminary voltage is adjusted until the second difference is equal to the first difference. When the second difference is equal to the first difference, the second preliminary voltage is the second detection voltage, the first difference is the difference between the first average value and the second average value, and the second difference is the difference between the third average value and the fourth average value.

14. The thickness detection method according to claim 13, characterized in that: Applying a detection voltage to the common unit includes: applying the first detection voltage to the first predetermined conductor; The second detection voltage is applied to the second predetermined conductor.

15. A thickness detection system, comprising a thickness detection device, characterized in that: The thickness detection device is the thickness detection device according to any one of claims 1 to 12, and the thickness detection system further comprises a processing device, wherein the processing device is used to execute the thickness detection method according to any one of claims 13 to 14.

16. A storage medium, characterized in that: The storage medium includes a stored program, wherein when the program is executed, the device where the storage medium is located is controlled to execute the thickness detection method according to any one of claims 13 to 14.

17. A processor, characterized in that: The processor is used to run a program, and when the program is run, the thickness detection method according to any one of claims 13 to 14 is executed.

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