Sample Plate

Abstract

The present disclosure relates to a sample plate, which comprises: a sample slot for accommodating a sample; and a scale pattern for determining the magnification of a microscope.

Description

Technical Field

[0001] The present disclosure relates to the field of optical microscopy, and in particular to a sample plate. Background Art

[0002] At present, the sample plates used for cell counting or analysis usually include one or more sample slots, which are used to hold the cell samples to be tested, and then obtain the number, concentration, size and other parameters of the cells through the microscopic imaging system and the image analysis system. However, the detection of these parameters depends on the observation ability of the microscope or microscopic imaging system, among which the most important and important characteristic parameter is the magnification, and the actual magnification of many microscopic instruments on the market is inconsistent with their nominal values.

[0003] At present, the calibration and calibration of microscope magnification mainly adopts micrometer or similar technology, and the actual magnification of the microscope is calibrated by the cooperation of the eyepiece micrometer and the objective micrometer. For example, the actual magnification of the microscope is calculated by comparing the known interval size in the ruler with the size obtained in the microscopic imaging system. However, these technologies have certain defects. When the eyepiece or objective lens is replaced, recalibration is required, and the sample to be tested needs to be removed at this time, resulting in repeated and troublesome operations, and the original observation field needs to be found again. At the same time, it will cause the sample to move in the sample slot, affecting the observation results.

[0004] Therefore, it is of great significance to measure the magnification of a microscope or microscopic imaging system. However, the existing cell counting plate does not have the ability to accurately calibrate the magnification of the microscope, resulting in the inconsistency between the detected parameters and the actual parameters, which affects the accuracy of the final results. Summary of the invention

[0005] According to one aspect of the present disclosure, there is provided a sample plate, comprising: a sample well for accommodating a sample; and a ruler pattern for determining a magnification of a microscope.

[0006] In some embodiments according to the present disclosure, the ruler pattern is located at the bottom of the sample groove.

[0007] In some embodiments according to the present disclosure, the sample plate includes a plurality of sample slots, and the scale pattern is disposed at the bottom of each sample slot.

[0008] In some embodiments according to the present disclosure, the ruler pattern is located near the sample slot.

[0009] In some embodiments according to the present disclosure, the scale pattern includes first scale lines extending along a first direction.

[0010] In some embodiments according to the present disclosure, the scale pattern includes a plurality of first scale lines, and the plurality of first scale lines are arranged along a second direction different from the first direction.

[0011] In some embodiments according to the present disclosure, the first direction is perpendicular to the second direction.

[0012] In some embodiments according to the present disclosure, the sample groove extends along the first direction or the second direction.

[0013] In some embodiments according to the present disclosure, the scale pattern further includes second scale lines extending along a second direction.

[0014] In some embodiments according to the present disclosure, the scale pattern further includes a first mark for determining an extension direction and an arrangement direction of the sample slots.

[0015] In some embodiments according to the present disclosure, the first mark includes a first arrow and a second arrow that are perpendicular to each other.

[0016] In some embodiments according to the present disclosure, the scale pattern further includes a second mark for identifying the sample plate.

[0017] In some embodiments according to the present disclosure, the scale pattern further includes a third identifier for identifying the sample slot.

[0018] Other features and advantages of the present disclosure will become apparent from the following detailed description of exemplary embodiments of the present disclosure with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] The accompanying drawings, which constitute a part of the specification, illustrate embodiments of the present disclosure and, together with the description, serve to explain the principles of the present disclosure.

[0020] The present disclosure may be more clearly understood from the following detailed description with reference to the accompanying drawings, in which:

[0021] Figure 1 A schematic diagram of a microscopic device according to some embodiments of the present disclosure is shown.

[0022] Figure 2 A schematic diagram of a sample plate according to some embodiments of the present disclosure is shown.

[0023] Figure 3 A schematic diagram of a sample plate according to some embodiments of the present disclosure is shown.

[0024] Figure 4 A schematic diagram of a sample plate according to some embodiments of the present disclosure is shown.

[0025] Figure 5 A schematic diagram of a sample plate according to some embodiments of the present disclosure is shown.

[0026] Fig. 6A A ruler pattern on a sample plate according to some embodiments of the present disclosure is shown.

[0027] Figure 6B An image of a ruler pattern on a sample plate according to some embodiments of the present disclosure is shown.

[0028] Figure 7 A schematic diagram of a sample plate according to some embodiments of the present disclosure is shown.

[0029] Figure 8 A schematic diagram of a sample plate according to some embodiments of the present disclosure is shown.

[0030] Fig. 9 A schematic diagram of a sample plate according to some embodiments of the present disclosure is shown.

[0031] Fig.10 A schematic diagram of a sample plate according to some embodiments of the present disclosure is shown.

[0032] Fig.11 A set of tick marks in a scale pattern on a sample plate according to some embodiments of the present disclosure is shown.

[0033] Fig.12 A flow chart illustrating the operation of a microscopy device according to some embodiments of the present disclosure.

[0034] Fig.13 A schematic diagram showing the pixel arrangement direction of an image sensor.

[0035] Note that in the embodiments described below, the same reference numerals are sometimes used in common between different drawings to represent the same parts or parts with the same functions, and their repeated descriptions are omitted. In this specification, similar reference numerals and letters are used to represent similar items, so once an item is defined in one drawing, it does not need to be further discussed in subsequent drawings.

[0036] For ease of understanding, the positions, sizes, and ranges of various structures shown in the drawings and the like may not represent actual positions, sizes, and ranges, etc. Therefore, the disclosed invention is not limited to the positions, sizes, and ranges disclosed in the drawings and the like. DETAILED DESCRIPTION

[0037] Various exemplary embodiments of the present disclosure will now be described in detail with reference to the accompanying drawings. It should be noted that the relative arrangement of components and steps, numerical expressions and numerical values ​​set forth in these embodiments do not limit the scope of the present disclosure unless otherwise specifically stated.

[0038] The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the present disclosure, its application, or uses.

[0039] Technologies, methods, and apparatus known to ordinary technicians in the relevant field may not be discussed in detail, but where appropriate, such technologies, methods, and apparatus should be considered part of the authorization specification.

[0040] In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limiting. Therefore, other examples of the exemplary embodiments may have different values.

[0041] Figure 1 A schematic diagram of a microscopic device according to an embodiment of the present disclosure is shown.

[0042] like Figure 1 As shown, the microscope device 100 includes an image sensor 101, a memory 102, a processor 103, an optical imaging device 104, a sample stage 105 and a light source 106. When working, the sample plate to be observed is arranged on the sample stage 105. The light emitted by the light source 106 is irradiated onto the sample plate. The optical imaging device 104 may include, for example, an objective lens and an eyepiece (not shown), and the objective lens and the eyepiece may each be composed of one or more groups of lenses. The optical image formed by the optical device 104 is received by the image sensor 101 and converted into a digital image by the image sensor 101. The image sensor may be, for example, a charge coupled device (CCD), a complementary metal oxide semiconductor (CMOS), etc. In some embodiments according to the present disclosure, image capture devices such as mobile phones and cameras may also be arranged in the light path, and these image capture devices also include image sensors, and can capture images of samples in the sample plate through the optical device 104.

[0043] The digital image obtained by the image sensor 101 is stored in the memory 102 , and the processor 103 can read the digital image in the memory 102 and process the digital image.

[0044] Figure 2 Schematic diagram of a sample plate according to some embodiments of the present disclosure is shown. Figure 2 As shown, the sample plate 200 includes a plurality of sample slots 201 , and the samples to be observed and photographed can be accommodated in the sample slots 201 . In addition, the sample plate 200 also has a scale pattern 202 .

[0045] exist Figure 2In the exemplary embodiment shown, the ruler pattern 202 is located at the bottom of the sample slot (i.e., the surface where the sample slot contacts the sample therein). When acquiring an image of the sample through the microscope 100, the optical imaging device 104 is usually focused on the bottom of the sample slot. Placing the ruler pattern 202 at the bottom of the sample slot can obtain a clear image of the ruler pattern while obtaining the sample image. The ruler pattern 202 is a line segment along the horizontal direction, and the length is L. For example, in some exemplary embodiments, L can be 1 μm-100 μm. Using the ruler pattern 202, the magnification of the microscope 100 can be accurately calculated.

[0046] For example, Fig.13 As shown, for an image sensor 101 in which pixels are evenly arranged in two directions (X direction and Y direction) perpendicular to each other, it is assumed that in the digital image generated by the image sensor 101, the coordinates of the two ends of the line segment of the scale pattern 202 are (x1, y1) and (x2, y2) respectively. Here, the coordinates (x1, y1) and (x2, y2) represent the positions of the pixels corresponding to the two ends of the line segment on the image sensor 101. Then the size K of the line segment image formed by the line segment on the sample plate on the image sensor 101 can be calculated according to formula (1):

[0047] K=D·sqrt[(x2-x1) 2 +(y2-y1) 2 ] (1)

[0048] Wherein, D is the distance between adjacent pixels in the image sensor 101, that is, the distance from the center of one pixel to the center of an adjacent pixel along the X direction or the Y direction. The function sqrt represents calculating a square root.

[0049] Then, the magnification M of the optical imaging device 104 of the microscope 100 can be calculated according to the following formula (2):

[0050] M=K / L (2)

[0051] Through the above method, the actual magnification of the microscope device 100 can be accurately obtained.

[0052] In the above exemplary embodiments, the pixel array of the image sensor 101 is a rectangular array, and the spacing between adjacent pixels is the same in the X direction and the Y direction. In other embodiments according to the present disclosure, the spacing between adjacent pixels of the image sensor 101 is different in the X direction and the Y direction. For example, the spacing between adjacent pixels along the X direction is D1, and the spacing between adjacent pixels along the Y direction is D2. Then, the size K of the line segment image formed by the line segment on the sample plate on the image sensor 101 can be calculated according to the following formula (3):

[0053] K=sqrt[(D1)2 (x2-x1) 2 +(D2) 2 ·(y2-y1) 2 ] (3)

[0054] Then, the actual magnification M of the microscope device 100 can be calculated according to the above formula (2).

[0055] The calculation of the actual magnification can be performed by, for example, the processor 103 of the microscope 100. For example, the spacing between adjacent pixels of the image sensor 101 can be pre-stored in the memory 102. After the image sensor 101 generates a digital image of the sample plate 200, the digital image is stored in the memory 102.

[0056] Then, the processor 103 reads the digital image from the memory 102 and identifies the scale pattern in the digital image. Next, the processor 103 can read the spacing between adjacent pixels of the image sensor 101 from the memory and calculate the actual magnification M of the microscope 101 according to the above formulas (1)-(3).

[0057] In addition, in some embodiments according to the present disclosure, for a sample plate 200 having a plurality of sample slots 201 , the magnification M may also be calculated in the following manner.

[0058] for Figure 2 The sample plate 200 shown has three sample slots 201 , and the corresponding magnifications M1 , M2 and M3 can be calculated based on the scale pattern 202 on each sample slot 201 , and then the actual magnification M of the microscope device can be calculated using formula (4).

[0059] M=(M1+M2+M3) / 3 (4)

[0060] That is, the average value of the magnifications M1, M2 and M3 is taken as the actual magnification M of the microscope. In this way, the calculation error can be reduced and the accuracy of the magnification can be further improved.

[0061] In addition, in some other embodiments according to the present disclosure, the sum K' of the line segments of each scale pattern 202 may be calculated by the following formula (5).

[0062] K'=D·sqrt[(x2-x1) 2 +(y2-y1) 2 ]

[0063] +D sqrt[(x3-x4) 2 +(y3-y4) 2 ]

[0064] +D·sqrt[(x5-x6) 2 +(y5-y6) 2 ] (5)

[0065] Among them, (x1, y1) and (x2, y2) are Figure 2 The coordinates of the two ends of the line segment of the ruler pattern of the first sample slot 202 in the upper part in the digital image, (x3, y3) and (x4, y4) are Figure 2 The coordinates of the two ends of the line segment of the scale pattern of the second sample slot 202 in the middle in the digital image, (x5, y5) and (x6, y6) are Figure 2 The coordinates of the two ends of the line segment of the ruler pattern of the third sample slot 202 at the bottom in the digital image.

[0066] Then, the actual magnification M of the microscope device can be calculated by formula (6).

[0067] M=K' / (3L) (6)

[0068] In this way, the calculation error can be reduced and the accuracy of the magnification can be further improved.

[0069] The above briefly introduces how to calculate the actual magnification of the microscope device 100 according to the scale pattern on the sample plate. It should be understood that the present disclosure is not limited to the above method. Under the guidance and inspiration of the present disclosure, those skilled in the art can also use other methods to calculate the actual magnification of the microscope device 100 according to the scale pattern.

[0070] Figure 3 Schematic diagram of a sample plate according to some embodiments of the present disclosure is shown. Figure 3 As shown, the sample plate 300 includes a plurality of sample slots 301 , and the samples to be observed and photographed can be accommodated in the sample slots 301 . In addition, the sample plate 300 also has a scale pattern 302 .

[0071] exist Figure 3 In the exemplary embodiment shown, the ruler pattern 302 is located at the bottom of the sample slot. The ruler pattern 302 is a scale line (first scale line) with equal spacing, each scale line extends along the horizontal direction (first direction), and the spacing between each scale line in the vertical direction (second direction) is D. In some exemplary embodiments according to the present disclosure, the spacing D can be, for example, 1 μm-10 μm. Using the ruler pattern 302, the magnification of the microscope device can be accurately calculated.

[0072] For example, the processor 103 can obtain the coordinates (x1', y1') of a point on a scale line in the scale pattern 302 based on the digital image generated by the image sensor 101, and obtain the coordinates (x2', y2') of the intersection of the point (x1', y1') and the adjacent scale line in a direction perpendicular to the scale line.

[0073] Using a method similar to that described above, the actual magnification of the microscope device 100 can be calculated.

[0074] exist Figure 3 In the example shown, each sample well has a plurality of scale lines 302. When the magnification of the microscope 100 is relatively high, the actual magnification can be accurately obtained even if the field of view includes only a portion of a single sample well.

[0075] Figure 4 Schematic diagram of a sample plate 400 according to some embodiments of the present disclosure is shown. Figure 4 As shown, in the sample plate 400, the scale pattern 402 is arranged outside the sample slot 401. In this way, the interference of the scale pattern 402 with the sample in the sample slot 401 can be avoided, and the sample can be observed and analyzed more clearly. In order to obtain a clear image of the scale pattern 402, the scale pattern 402 can be located on the same plane as the bottom of the sample slot.

[0076] Figure 5 Schematic diagram of a sample plate 500 according to some embodiments of the present disclosure is shown. Figure 5 As shown, the sample plate 500 includes a plurality of sample slots 501. A cross-shaped scale pattern 502 is provided at the bottom of each sample slot 501. The scale pattern 502 includes two line segments perpendicular to each other, and the lengths of the two line segments can be the same or different. For example, one line segment (i.e., the first scale line) extends in the horizontal direction, and the other line segment (i.e., the second scale line) extends in the vertical direction.

[0077] use Figure 5 The scale pattern 502 on the sample plate 500 can also be used to calculate the magnification of the microscope from the digital image captured by the image sensor 101. For example, the magnification of the microscope can be calculated based on the above formulas (1)-(2) and the length of any one of the two line segments in the scale pattern 502. Alternatively, the magnification can be calculated based on each of the two line segments, and then the average of the two magnifications can be taken as the magnification of the microscope.

[0078] also, Figure 5The scale pattern 502 on the sample plate 500 can also be used to identify and correct the distortion of the microscope 100. For example, when the optical imaging device 104 of the microscope 100 does not have distortion, the image of the scale pattern 502 should also be two perpendicular line segments, such as Fig. 6A However, if the optical imaging device 104 of the microscope 100 is distorted, the two line segments in the image of the scale pattern 502 will no longer be perpendicular, as shown in FIG. Figure 6B Based on the images of the two line segments, the processor 103 can identify that there is distortion in the optical imaging device of the microscope 100. Furthermore, the processor 103 can also correct the digital image generated by the image sensor 101 based on known parameters such as the size of the scale pattern 502, thereby improving the image quality.

[0079] The sample plate according to the present disclosure and how to obtain the magnification of the microscope device according to the scale pattern on the sample plate are described above. It should be understood that the present application is not limited to the above embodiments.

[0080] For example, Figure 7 Schematic diagram of a sample plate 700 according to some embodiments of the present disclosure is shown. Figure 7 As shown, the sample plate 700 includes a plurality of sample slots 701 extending in the horizontal direction, and a ruler pattern 702 is provided at the bottom of each sample slot 701. The ruler pattern 702 includes a plurality of scale lines, each scale line extending in the horizontal direction (first direction), and the plurality of scale lines are arranged in the direction of the dotted line 703 (second direction). The direction of the dotted line 703 is not a vertical direction perpendicular to the horizontal direction. In this way, the ruler pattern 702 can cover most areas of the sample slot 701. When the magnification of the microscope 100 is large and the field of view can only cover a part of the sample slot 701, this form of ruler pattern 702 can ensure that at least one complete scale line appears in the field of view. In this way, no matter where the sample in the sample slot 701 is observed, the magnification of the microscope can be accurately calculated.

[0081] In addition, in some embodiments according to the present disclosure, the orientation of the sample plate and the sample slot can also be determined according to the scale pattern on the sample plate. Figure 3 The sample plate 300 shown includes a plurality of sample slots 301 arranged in a vertical direction, and each sample slot 301 extends in a horizontal direction.

[0082] When observing and photographing the samples in the sample wells 301 through the microscope 100, it is often impossible to simultaneously observe and photograph the samples in all the sample wells 301 due to reasons such as the field of view. Therefore, it is necessary to translate the sample stage 105 so that the sample plate translates in the field of view, thereby observing and photographing different sample wells 301 on the sample plate 300 or different parts of the same sample well 301.

[0083] like Figure 3 As shown, each scale line in the scale pattern 302 extends in the horizontal direction, that is, the extension direction of the scale line is the same as the extension direction of the sample slot, and the arrangement direction of the multiple scale lines is consistent with the arrangement direction of the multiple sample slots. Therefore, although only a part of the sample slot is displayed in the field of view of the microscope or the captured picture, the processor 103 or the operator can determine the extension direction and arrangement direction of the sample slot according to the extension direction and arrangement direction of the scale line, and move the sample plate 300 on the sample stage 105 according to the determined extension direction and arrangement direction of the sample slot, so as to achieve observation and shooting of different sample slots 301 or different areas of the same sample slot 301.

[0084] Figure 8 FIG. 8 is a schematic diagram of a sample plate 800 according to some other embodiments of the present disclosure. Figure 8 As shown, the sample plate 800 includes a plurality of sample slots 801 extending in the horizontal direction, and the plurality of sample slots 801 are arranged in the vertical direction. A ruler pattern 802 is provided at the bottom of each sample slot 801. The ruler pattern 802 includes a first mark for determining the arrangement direction and extension direction of the sample slot 801. The first mark is composed of two arrows 803 and 804 perpendicular to each other, wherein the arrow 803 extends in the vertical direction, and the arrow 804 extends in the horizontal direction. In addition, in this example, the arrangement direction of the sample slots is indicated by the longer arrow, and the extension direction of the sample slots is indicated by the shorter arrow. As shown in FIG. Figure 8 As shown, the length of arrow 803 is greater than the length of arrow 804 . Therefore, according to the extending direction of arrow 803 , it can be determined that the plurality of sample slots 801 are arranged in a vertical direction, and according to the extending direction of arrow 804 , it can be determined that the sample slot 802 extends in a horizontal direction.

[0085] Fig. 9 Schematic diagram of a sample plate 900 according to some embodiments of the present disclosure is shown. Fig. 9As shown, the sample plate 900 includes a plurality of sample slots 901 arranged in a horizontal direction, and each sample slot 901 also extends in a horizontal direction. A ruler pattern 902 is provided at the bottom of each sample slot 901. The ruler pattern 902 includes a first mark for determining the arrangement direction and extension direction of the sample slot 901. The first mark is composed of arrows 903 and 904, wherein the longer arrow 903 indicates the arrangement direction of the sample slot 901, and the shorter arrow 904 indicates the extension direction of the sample slot 901. In this way, through the extension direction of the arrows 903 and 904, it can be determined that the plurality of sample slots 901 are arranged in a horizontal direction, and each sample slot 901 also extends in a horizontal direction.

[0086] Fig.10 Schematic diagram of a sample plate 1000 according to some embodiments of the present disclosure is shown. Fig.10 As shown, the sample plate 1000 includes a plurality of sample slots 1001 arranged in a vertical direction, and each sample slot 1001 extends in a horizontal direction. A scale pattern 1002 is provided at the bottom of the sample slot 1001. The scale pattern 1002 includes a second identification 1004 for identifying the sample plate and a third identification 1003 for identifying the sample slot. The second identification 1004 and the third identification 1003 are composed of a plurality of scale lines, which are arranged in a horizontal direction, and each scale line extends in a vertical direction. The scale line 1005 on the far left and the scale line 1006 on the far right represent the start and end of the second identification 1004 and the third identification 1003. The second identification 1004 and the third identification 1003 are between the scale line 1005 and the scale line 1006. According to the second identification 1004 and the third identification 1003, the number of the sample plate and the number of the sample slot can be determined respectively.

[0087] like Fig.10 As shown, in the lower sample slot 1001, the third identifier 1003 includes two scale lines, and the number of the sample slot where the third identifier 1003 is located can be determined to be 11. In the upper sample slot 1001, the third identifier 1003 includes one scale line, and according to the spacing between the scale lines, it can be obtained that a scale line is missing in front of the scale line, so the number of the sample slot where the third identifier 1003 is located can be determined to be 01. Similarly, for the third identifier 1003 in the middle sample slot 1001, it can be determined that the sample slot is numbered 10.

[0088] Similarly, in the second identification 1004 , based on the spacing between the scale lines, it is determined that the missing scale line represents 0, and the number of the sample plate 1000 can be determined to be 1101.

[0089] In addition, in some embodiments according to the present disclosure, other methods may be used to represent 0 and 1 in the number. Fig.11In the set of scale lines shown, scale lines of different lengths can be used to represent 0 and 1, respectively. Among them, the longer scale line represents 1, and the shorter scale line represents 0. Fig.11 A set of tick marks in can be identified as 1011011.

[0090] It should be understood that under the guidance and inspiration of the present disclosure, those skilled in the art may also combine the first mark, the second mark, the third mark and the scale lines in other ways to form a scale pattern.

[0091] Fig.12 A flow chart illustrating the operation of the microscopy device 100 according to some embodiments of the present disclosure is shown.

[0092] like Fig.12 As shown, first, a sample plate is placed on the sample stage 105 (step 1201). The sample groove of the sample plate has a sample to be observed and photographed.

[0093] Then, a digital image of the sample is generated by the image sensor 101 (step 1202 ). The optical image formed by the optical imaging device 104 of the microscope 100 is received by the image sensor 101 , and a digital image is generated. The digital image may be stored in the memory 102 .

[0094] Next, the processor 103 can read the digital image from the memory 102 and perform various processing (step 1203). For example, as described above, the magnification of the microscope 100 can be calculated based on the scale pattern in the digital image, the extension direction and arrangement direction of the sample slot can be determined, the sample plate (number) can be identified, or the sample slot (number) can be identified, etc.

[0095] In addition, the embodiments of the present disclosure may also include the following technical solutions:

[0096] 1. A sample plate, comprising:

[0097] a sample well for holding a sample; and

[0098] Ruler pattern used to determine magnification.

[0099] 2. The sample plate according to 1, wherein the ruler pattern is located at the bottom of the sample groove.

[0100] 3. The sample plate according to 2, wherein the sample plate comprises a plurality of sample slots, and the scale pattern is disposed at the bottom of each sample slot.

[0101] 4. The sample plate according to 1, wherein the ruler pattern is located near the sample groove.

[0102] 5. The sample plate according to any one of 1 to 4, wherein the scale pattern comprises first scale lines extending along a first direction.

[0103] 6. The sample plate according to 5, wherein the scale pattern comprises a plurality of first scale lines, and the plurality of first scale lines are arranged along a second direction different from the first direction.

[0104] 7. The sample plate according to 6, wherein the first direction is perpendicular to the second direction.

[0105] 8. The sample plate according to 6 or 7, wherein the sample groove extends along the first direction or the second direction.

[0106] 9. The sample plate according to any one of 6-8, wherein the scale pattern further comprises second scale lines extending along a second direction.

[0107] 10. The sample plate according to any one of 1 to 9, wherein the ruler pattern further comprises a first mark for determining an extension direction and an arrangement direction of the sample grooves.

[0108] 11. The sample plate according to 10, wherein the first mark comprises a first arrow and a second arrow that are perpendicular to each other.

[0109] 12. The sample plate according to any one of 1 to 11, wherein the scale pattern further comprises a second mark for identifying the sample plate.

[0110] 13. The sample plate according to 12, wherein the scale pattern further comprises a third mark for identifying the sample slot.

[0111] The words "front", "rear", "top", "bottom", "above", "below", etc., if present, in the specification and claims are used for descriptive purposes and are not necessarily used to describe invariant relative positions. It should be understood that the words so used are interchangeable under appropriate circumstances, such that the embodiments of the disclosure described herein, for example, are capable of operation in other orientations than those illustrated or otherwise described herein.

[0112] As used herein, the word "exemplary" means "serving as an example, instance, or illustration," rather than as a "model" to be exactly copied. Any implementation described as an example herein is not necessarily to be construed as preferred or advantageous over other implementations. Furthermore, the present disclosure is not limited by any expressed or implied theory given in the above technical field, background technology, summary of the invention, or detailed description.

[0113] As used herein, the term "substantially" is intended to include any minor variations due to design or manufacturing imperfections, device or component tolerances, environmental influences, and / or other factors. The term "substantially" also allows for deviations from a perfect or ideal condition due to parasitic effects, noise, and other practical considerations that may exist in actual implementations.

[0114] The above description may indicate an element or node or feature that is "connected" or "coupled" together. As used herein, unless otherwise expressly stated, "connection" means that one element / node / feature is directly connected (or directly communicates) to another element / node / feature electrically, mechanically, logically or otherwise. Similarly, unless otherwise expressly stated, "coupling" means that one element / node / feature can be mechanically, electrically, logically or otherwise connected to another element / node / feature in a direct or indirect manner to allow interaction, even if the two features may not be directly connected. In other words, "coupling" is intended to include direct and indirect connections of elements or other features, including connections using one or more intermediate elements.

[0115] In addition, certain terms may be used in the following description for reference purposes only and are not intended to be limiting. For example, the words "first," "second," and other such numerical words referring to structures or elements do not imply a sequence or order unless the context clearly indicates otherwise.

[0116] It should also be understood that when the term “include / comprises” is used in this document, it indicates the presence of the specified features, integers, steps, operations, units and / or components, but does not exclude the presence or addition of one or more other features, integers, steps, operations, units and / or components and / or their combinations.

[0117] In this disclosure, the term "provide" is used in a broad sense to cover all ways of obtaining an object, and thus "providing an object" includes but is not limited to "purchasing", "preparing / manufacturing", "arranging / setting up", "installing / assembling", and / or "ordering" an object, etc.

[0118] Those skilled in the art will appreciate that the boundaries between the above operations are merely illustrative. Multiple operations can be combined into a single operation, a single operation can be distributed in additional operations, and operations can be performed at least partially overlapping in time. Moreover, alternative embodiments may include multiple instances of specific operations, and the order of operations may be changed in other various embodiments. However, other modifications, variations, and replacements are equally possible. Therefore, this specification and accompanying drawings should be considered illustrative, not restrictive.

[0119] Although some specific embodiments of the present disclosure have been described in detail by way of example, it should be understood by those skilled in the art that the above examples are for illustration only and are not intended to limit the scope of the present disclosure. The various embodiments disclosed herein may be combined in any manner without departing from the spirit and scope of the present disclosure. It should also be understood by those skilled in the art that various modifications may be made to the embodiments without departing from the scope and spirit of the present disclosure. The scope of the present disclosure is defined by the appended claims.

Claims

1. A sample plate, comprising: a sample holder for holding a sample; as well as A scale pattern for determining a magnification, wherein the scale pattern comprises a first mark for determining an extension direction and an arrangement direction of the sample slot, a second mark for identifying the sample plate, and a third mark for identifying the sample slot.

2. The sample plate according to claim 1, wherein: The ruler pattern is located at the bottom of the sample slot.

3. The sample plate according to claim 2, wherein: The sample plate comprises a plurality of sample slots, and the scale pattern is arranged at the bottom of each sample slot.

4. The sample plate according to claim 1, wherein: The scale pattern is located near the sample slot.

5. The sample plate according to any one of claims 1 to 4, wherein: The scale pattern includes first scale lines extending along a first direction.

6. The sample plate according to claim 5, wherein: The scale pattern includes a plurality of first scale lines, and the plurality of first scale lines are arranged along a second direction different from the first direction.

7. The sample plate according to claim 6, wherein: The first direction is perpendicular to the second direction.

8. The sample plate according to claim 6 or 7, wherein: The sample slot extends along the first direction.

9. The sample plate according to claim 6 or 7, wherein: The scale pattern further includes second scale lines extending along a second direction.

10. The sample plate according to claim 1, wherein The first mark includes a first arrow and a second arrow that are perpendicular to each other.

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