A device and method for testing the delay index of an observation and aiming equipment

Abstract

The present invention discloses a device and method for testing the delay index of an observation and aiming equipment, belonging to the field of optoelectronic testing technology. The device for testing the delay index of the observation and aiming equipment includes a base, a millisecond meter, a plane mirror, a combined prism and a camera. Among them, the base is used to fix the equipment under test; the millisecond meter is placed on one side of the base; the plane mirror is movably arranged on the base; the combined prism is arranged at the front end of the eyepiece of the equipment under test; the camera is placed on one side of the base and is located on a straight line with the combined prism and the eyepiece of the equipment under test. The device and method for testing the delay index of the observation and aiming equipment provided by the present invention have a fast testing speed. The equipment under test does not need to be specially designed with a test interface and does not need to disassemble the whole machine. The test data is in the same picture, and the test is intuitive, which is conducive to processing and storage; it has strong versatility. According to the positioning and installation of different equipment under test, only the bracket needs to be improved, and it can test infrared equipment, low-light CMOS equipment, head-mounted display equipment, etc.

Description

Technical Field

[0001] The present invention relates to the technical field of optoelectronic testing, and particularly to a device and method for testing the delay index of an observation and aiming equipment. Background Art

[0002] With the development of various optoelectronic detection technologies, traditional direct vision optical systems can no longer meet the detection requirements in various environments. For example, infrared detection technology, low-light CMOS technology, etc. have been widely applied to optoelectronic detection fields such as aiming scopes and night vision goggles. Such equipment inevitably brings an index different from that of traditional direct vision optical systems, that is, video delay, which refers to the delay generated by the photoelectric conversion, transmission of the target light through the detector, and electro-optical conversion of the display.

[0003] For some equipment with high requirements for real-time performance, it is necessary to control its video delay. Generally, the time characteristics of detectors, circuits, etc. in the equipment are tested through waveforms. This method is not intuitive, requires disassembly testing, or leaves test ports, etc.; at the same time, it cannot comprehensively characterize the delay index of the whole machine equipment. Summary of the Invention

[0004] The purpose of the present invention is to provide a device and method for testing the delay index of an observation and aiming equipment, so as to solve the problem that for existing equipment with high requirements for real-time performance, generally, the time characteristics of detectors, circuits, etc. in the equipment are tested through waveforms, which requires disassembly testing, and the testing process is cumbersome and not intuitive.

[0005] To solve the above technical problems, the present invention provides a device for testing the delay index of an observation and aiming equipment, including:

[0006] A base for fixing the equipment to be tested;

[0007] A millisecond meter placed on one side of the base;

[0008] A plane mirror movably arranged on the base;

[0009] A combined prism arranged at the front end of the eyepiece of the equipment to be tested;

[0010] A camera placed on one side of the base and located on a straight line with the combined prism and the eyepiece of the equipment to be tested.

[0011] Optionally, a bracket is arranged on the base for fixing the equipment to be tested.

[0012] Optionally, the combined prism includes two right-angle prisms, and the bonding surface is coated with a transmissive and reflective film layer.

[0013] Optionally, the camera is a high-speed camera.

[0014] The present invention also provides a method for testing the delay index of an observation and aiming device, including:

[0015] Place the millisecond meter at the visible distance within the field of view of the device under test, observe from the camera position, and make the display characters of the millisecond meter appear clearly in the device under test;

[0016] Adjust the angles of the millisecond meter and the plane mirror, and observe from the camera position to avoid coincidence with the image of the device under test;

[0017] Take a photo with the camera, compare the two images of the millisecond meter in the photo at the same moment, and the delay time of the device under test can be obtained.

[0018] The device and method for testing the delay index of an observation and aiming device provided by the present invention have a fast testing speed. The device under test does not require a specially designed test interface and does not need to disassemble the whole machine. The test data is in the same picture, and the test is intuitive, which is conducive to processing and storage; it has strong versatility. According to the positioning and installation of different devices under test, only the bracket needs to be improved, and it can test infrared devices, low-light CMOS devices, head-mounted display devices, etc., and is easy to carry. Description of the Drawings

[0019] Figure 1 is a schematic structural diagram of a device for testing the delay index of an observation and aiming device provided by the present invention;

[0020] Figure 2 is a front view of a device for testing the delay index of an observation and aiming device provided by the present invention. Detailed Embodiment

[0021] The following further elaborates in detail on a device and method for testing the delay index of an observation and aiming device proposed by the present invention in conjunction with the accompanying drawings and specific embodiments. According to the following description and the claims, the advantages and features of the present invention will be clearer. It should be noted that the drawings are all in a very simplified form and use non-precise scales, only for the purpose of conveniently and clearly assisting in explaining the embodiments of the present invention.

[0022] Embodiment 1

[0023] The present invention provides a device for testing the delay index of an observation and aiming device, and its structure is as Figure 1 and Figure 2As shown in the figure, it includes a base 2, a millisecond timer 1, a plane mirror 3, a combined prism 4, and a camera 6. Among them, the base 2 is used to fix the equipment to be measured 7; the millisecond timer 1 is placed on one side of the base 2; the plane mirror 3 is movably arranged on the base 2; the combined prism 4 is arranged at the front end of the eyepiece of the equipment to be measured 7; the camera 6 is placed on one side of the base 2 and is on the same straight line as the combined prism 4 and the eyepiece of the equipment to be measured 7. Preferably, the camera 6 is a high-speed camera capable of taking pictures quickly in a short time.

[0024] Specifically, a bracket 5 is arranged on the base 2 for fixing the equipment to be measured 7. The combined prism 4 includes two right-angle prisms, and the bonding surface is coated with a transmissive and reflective film layer, which has reflection and transmission effects on light in different directions.

[0025] The present invention also provides a method for testing the delay index of an observation and aiming equipment, including the following steps: First, place the millisecond timer 1 at the visible distance within the field of view of the equipment to be measured 7, and observe from the position of the camera 6 to make the display characters of the millisecond timer 1 appear clearly in the equipment to be measured 7; then, adjust the angles of the millisecond timer 1 and the plane mirror 3, and observe from the position of the camera 6 to avoid overlapping with the image of the equipment to be measured 7; then, use the camera 6 to take pictures, and compare the two images of the millisecond timer 1 in the pictures at the same moment, and the delay time of the equipment to be measured 7 can be obtained.

[0026] The device and method for testing the delay index of an observation and aiming equipment provided by the present invention have a fast testing speed. The equipment to be measured 7 does not need to be specially designed with a testing interface, and the whole machine does not need to be disassembled. The testing data is in the same picture, and the testing is intuitive, which is conducive to processing and storage; it has strong versatility. According to the positioning and installation of different equipment to be measured, only the bracket 5 needs to be improved, and it can test infrared equipment, low-light CMOS equipment, head-mounted display equipment, etc., and is easy to carry.

[0027] The above description is only a description of the preferred embodiments of the present invention, and does not limit the scope of the present invention in any way. Any changes and modifications made by those of ordinary skill in the field of the present invention according to the above disclosure shall fall within the protection scope of the claims.

Claims

1. A device for testing the delay index of an observation and aiming equipment, characterized in that, it includes: a base (2) for fixing the equipment under test (7); a millisecond meter (1) placed on one side of the base (2); a plane mirror (3) movably arranged on the base (2); a combined prism (4) arranged at the front end of the eyepiece of the equipment under test (7); a camera (6) placed on one side of the base (2) and in a straight line with the combined prism (4) and the eyepiece of the equipment under test (7); a bracket (5) is arranged on the base (2) for fixing the equipment under test (7); the combined prism (4) includes two right-angle prisms, and the bonding surface is coated with a transmissive and reflective film layer, which has reflection and transmission effects on light in different directions; the camera (6) is a high-speed camera capable of taking pictures quickly in a short time; the steps of using the device to test the delay index of the observation and aiming equipment are as follows: Place the millisecond meter (1) at a visible distance within the field of view of the equipment under test (7), and observe from the position of the camera (6) to make the display characters of the millisecond meter (1) clearly imaged in the equipment under test (7); Adjust the angles of the millisecond meter (1) and the plane mirror (3) so that the image of the millisecond meter (1) is reflected by the plane mirror (3) and then reflected by the combined prism (4), and finally imaged on the camera (6), and observe the image of the millisecond meter (1) in the equipment under test (7) and the image of the millisecond meter (1) passing through the plane mirror (3) at the position of the camera (6) to avoid the two from overlapping; Take a picture with the camera (6) and compare the two images of the millisecond meter (1) in the photo at the same moment, and the delay time of the equipment under test (7) can be obtained.

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