Material Measuring Device and Material Measuring System

Abstract

The present disclosure provides a material measurement device, comprising: a plurality of microstrip antennas, forming a plurality of transceiver antenna units, the transceiver antenna units including a transmitting antenna and a receiving antenna, the transmitting antenna being configured to generate a microwave transmitting beam, the receiving antenna being configured to receive a microwave reflected beam generated after the microwave transmitting beam is reflected, and measuring the material through the microwave transmitting beam and the microwave reflected beam; and a microwave lens, the plurality of microstrip antennas being located on one side of the microwave lens, on the other side of the microwave lens, the microwave lens converges the microwave transmitting beams emitted by each transmitting antenna, the angles of the converged microwave transmitting beams are different, and the microwave lens converges the microwave reflected beam so that the receiving antenna receives the converged microwave reflected beam. The present disclosure also provides a material measurement system.

Description

Technical Field

[0001] The present disclosure relates to a material measurement device and a material measurement system. Background Art

[0002] Measuring the volume of solid materials in storage has always been a difficult point. The main reason is that the materials will pile up into a mountain shape due to feeding or into a funnel shape due to discharging. For a silo with multiple feeding and discharging points, multiple mountains and funnel shapes will appear. The traditional method can only measure the level information at a single point or very few points. Single-point measurement cannot meet the needs at all. For multi-point measurement, the current method usually measures the material shape through three to four antennas, but still cannot meet the requirements.

[0003] The usual method is to use horn antennas, but the horn antennas are relatively large in volume. When the opening size is limited, the number will be restricted, so usually only three or four horn antennas are used. Moreover, in the existing design, every time an additional beam is added, the gain of a single beam will decrease, which will affect the measurement effect.

[0004] In addition, in a relatively complex measurement environment, the number of antennas in the prior art is small and the signal is weak, making it difficult to adapt to the measurement environment, such as difficult to penetrate solid dust, etc.

[0005] For the liquid level measurement, there are also cases where the surface of the material is not flat. It is more common that the liquid forms vortices due to stirring, and the above problems also exist at this time.

[0006] In addition, the effect of eliminating measurement interference in the prior art is not ideal. Summary of the Invention

[0007] To solve at least one of the above technical problems, the present disclosure provides a material measurement device and a material measurement system.

[0008] According to one aspect of the present disclosure, a material measurement device includes:

[0009] A plurality of microstrip antennas forming a plurality of transceiver antenna units, the transceiver antenna units including a transmitting antenna and a receiving antenna, the transmitting antenna being configured to generate a microwave transmitting beam, the receiving antenna being configured to receive a microwave reflected beam generated after the microwave transmitting beam is reflected, and measuring the material through the microwave transmitting beam and the microwave reflected beam; and

[0010] A microwave lens, with a plurality of microstrip antennas located on one side of the microwave lens. On the other side of the microwave lens, the microwave lens converges the microwave emission beams emitted by each transmitting antenna, and the angles of the converged microwave emission beams are different. And the microwave lens converges the microwave reflection beam so that the receiving antenna can receive the converged microwave reflection beam.

[0011] According to at least one embodiment of the present disclosure, a transmitting antenna and a receiving antenna form a transceiver antenna unit. In a transceiver antenna unit, a transmitting antenna and a receiving antenna share one microstrip antenna or are two microstrip antennas close to each other.

[0012] According to at least one embodiment of the present disclosure, the plurality of microstrip antennas are arranged on the focal plane of the microwave lens.

[0013] According to at least one embodiment of the present disclosure, the plurality of microstrip antennas are arranged on one printed circuit board or on multiple printed circuit boards.

[0014] According to at least one embodiment of the present disclosure, the plurality of microstrip antennas are arranged on one printed circuit board, and the angles of the plurality of microstrip antennas are different, or

[0015] the plurality of microstrip antennas are arranged on multiple printed circuit boards, and the angles of the multiple printed circuit boards are different so that the angles of the plurality of microstrip antennas are different.

[0016] According to at least one embodiment of the present disclosure, the printed circuit board is perpendicular or nearly perpendicular to the microwave emission beam emitted by the microstrip antenna arranged on the printed circuit board.

[0017] According to at least one embodiment of the present disclosure, a processing circuit is arranged on the printed circuit board. The processing circuit obtains the time difference between the emission time of the microwave emission beam emitted by the transmitting antenna and the reception time of the microwave reflection beam received by the receiving antenna based on the time-of-flight principle, so as to obtain information about the material measurement point.

[0018] According to at least one embodiment of the present disclosure, the frequency of the microwave emission beam emitted by the transmitting antenna is a continuously adjusted frequency.

[0019] According to at least one embodiment of the present disclosure, the processing circuit obtains the frequency difference between the two by comparing the frequency of the microwave emission beam emitted by the transmitting antenna at a certain moment with the frequency of the microwave reflection beam received by the receiving antenna, so as to obtain information about the material measurement point.

[0020] According to at least one embodiment of the present disclosure, the printed circuit board can be rotated or moved to change the emission angle or emission position of the microwave emission beam emitted by the microstrip antenna of the printed circuit board.

[0021] According to at least one embodiment of the present disclosure, the rotation or movement of the printed circuit board is periodic.

[0022] According to at least one embodiment of the present disclosure, a scanning surface for measuring the profile of the material is formed by rotating or moving the printed circuit board.

[0023] According to at least one embodiment of the present disclosure, the microwave lens is a single microwave lens or a combined microwave lens formed by multiple lenses, and the single microwave lens or the combined microwave lens is used to converge the microwave emission beam and the microwave reflection beam.

[0024] According to at least one embodiment of the present disclosure, a microwave transceiver processing module is further included. The microwave transceiver processing module includes a transmitting path and a receiving path. The transmitting path is used to provide a transmission signal to the transmitting antenna among the multiple transceiver antenna units, and the receiving path is used to receive the received signal from the receiving antenna among the multiple transceiver antenna units.

[0025] According to at least one embodiment of the present disclosure, the transmitting path and the receiving path are arranged on different sides of the microwave transceiver processing module.

[0026] According to at least one embodiment of the present disclosure, the multiple transceiver antenna units are independent of each other, and each transceiver antenna unit includes a respective transmitting antenna and a receiving antenna.

[0027] According to at least one embodiment of the present disclosure, one transmitting antenna or multiple transmitting antennas among the multiple transmitting antennas are combined with one receiving antenna or multiple receiving antennas among the multiple receiving antennas to form the multiple transceiver antenna units.

[0028] According to at least one embodiment of the present disclosure, a purging unit is further included. The purging unit is arranged on the other side of the microwave lens and is used to keep the other side of the microwave lens clean.

[0029] According to at least one embodiment of the present disclosure, an angle measurement unit is further included. The angle measurement unit is used to measure the inclination angle of the material measurement device so as to obtain the actual angle of the microwave emission beam and / or the microwave reflection beam based on the measured inclination angle.

[0030] According to at least one embodiment of the present disclosure, the plurality of microstrip antennas are located in or near a reference plane, the reference plane is parallel to and / or passes through the axis of the microwave lens, and the plurality of microstrip antennas located in or near the reference plane are arranged in a straight line or a curved shape or a shape close to a straight line or a curved shape; or

[0031] The plurality of microstrip antennas are located in or near more than two reference planes, the more than two reference planes are respectively parallel to and / or pass through the axis of the microwave lens, and the plurality of microstrip antennas located in or near each of the more than two reference planes are respectively arranged in a straight line or a curved shape or a shape close to a straight line or a curved shape.

[0032] According to at least one embodiment of the present disclosure, when the plurality of microstrip antennas are located in or near a reference plane, the reference plane is parallel to and passes through the axis of the microwave lens, and a transceiver antenna unit is provided on or near the axis;

[0033] When the plurality of microstrip antennas are located in or near more than two reference planes, the more than two reference planes are respectively parallel to and pass through the axis of the microwave lens, and a transceiver antenna unit is provided on or near the axis.

[0034] According to at least one embodiment of the present disclosure, when the plurality of microstrip antennas are located in or near more than two reference planes, the angles between adjacent reference planes are equal.

[0035] According to at least one embodiment of the present disclosure, when the plurality of microstrip antennas are located in or near more than two reference planes, the number of microstrip antennas located in or near each reference plane is the same or different.

[0036] According to at least one embodiment of the present disclosure, when the plurality of microstrip antennas are located in or near a reference plane, the microwave emission beams with different angles converged by the microwave lens are located in or near a plane, so as to form a beam scanning plane for measuring the materials on a section;

[0037] When the plurality of microstrip antennas are located in or near more than two reference planes, the microwave emission beams of the microstrip antennas located in or near each reference plane are converged by the microwave lens into microwave emission beams with different angles respectively located in a plane, so as to form a plurality of beam scanning planes for measuring the materials on a plurality of sections.

[0038] According to at least one embodiment of the present disclosure, it further includes a housing, and the housing and the microwave lens form a closed space for accommodating the microstrip antennas.

[0039] According to at least one embodiment of the present disclosure, at least one of the multiple microwave transmission beams transmitted by the multiple transmission antennas serves as a vertical microwave transmission beam, and the vertical microwave transmission beam is parallel to the axis of the microwave lens or passes through the axis of the microwave lens.

[0040] According to at least one embodiment of the present disclosure, when measuring materials with an inclined surface shape, one or more non-vertical microwave transmission beams other than the vertical microwave transmission beam are used to determine the material information that needs to be measured by the vertical microwave transmission beam.

[0041] According to at least one embodiment of the present disclosure, based on the angle difference between the non-vertical microwave transmission beam and the vertical microwave transmission beam, the material information that needs to be measured by the vertical microwave transmission beam is determined.

[0042] According to at least one embodiment of the present disclosure, the angle differences between the multiple microwave transmission beams transmitted by the multiple transmission antennas are equal or unequal, and are 0.5 to 1.5 times the beam opening angle of the microwave transmission beam.

[0043] According to at least one embodiment of the present disclosure, it further includes a storage unit for storing the information of the multiple microwave reflection beams.

[0044] According to at least one embodiment of the present disclosure, based on the time-of-flight principle, the time difference between the transmission time of the microwave transmission beam emitted by the transmission antenna and the reception time of the microwave reflection beam received by the reception antenna is obtained, so as to obtain the information of the material measurement point.

[0045] According to at least one embodiment of the present disclosure, it further includes an operation unit, and the operation unit obtains the information of the material measurement point according to the time difference.

[0046] According to at least one embodiment of the present disclosure, the frequency of the microwave transmission beam emitted by the transmission antenna is a continuously adjusted frequency, and the frequency difference between the two is obtained by comparing the frequency of the microwave transmission beam emitted by the transmission antenna at a certain moment with the frequency of the microwave reflection beam received by the reception antenna, so as to obtain the information of the material measurement point.

[0047] According to at least one embodiment of the present disclosure, it further includes an operation unit, and the operation unit obtains the information of the material measurement point according to the frequency difference.

[0048] According to at least one embodiment of the present disclosure, it further includes a display unit, and the display unit updates the information of the displayed material in real time according to the information of each microwave reflection beam.

[0049] According to at least one embodiment of the present disclosure, the number of the microwave transmission beams is at least three.

[0050] According to at least one embodiment of the present disclosure, the plurality of transceiver antenna units repeatedly transmit microwave transmission beams and receive microwave reflection beams so as to perform real-time measurement on the material measurement point.

[0051] According to another aspect of the present disclosure, a material measurement device includes:

[0052] One or more microstrip antennas forming one or more transceiver antenna units, the transceiver antenna unit including a transmitting antenna and a receiving antenna, the transmitting antenna being configured to generate a microwave transmission beam, the receiving antenna being configured to receive a microwave reflection beam generated after reflection of the microwave transmission beam, and measuring the material by the microwave transmission beam and the microwave reflection beam; and

[0053] A microwave lens, the microstrip antenna being located on one side of the microwave lens, on the other side of the microwave lens, the microwave lens converging the microwave transmission beams emitted by each transmitting antenna, the angles of the converged microwave transmission beams being different, and the microwave lens converging the microwave reflection beam so that the receiving antenna receives the converged microwave reflection beam,

[0054] wherein the one or more microstrip antennas are movable microstrip antennas, and the material is measured by moving the microstrip antennas.

[0055] According to at least one embodiment of the present disclosure, one transmitting antenna and one receiving antenna form a transceiver antenna unit, and one transmitting antenna and one receiving antenna in one transceiver antenna unit share one microstrip antenna or are two microstrip antennas close to each other.

[0056] According to at least one embodiment of the present disclosure, the microstrip antenna is disposed on the focal plane of the microwave lens.

[0057] According to at least one embodiment of the present disclosure, the microstrip antenna moves along the focal plane.

[0058] According to at least one embodiment of the present disclosure, the microstrip antenna is disposed on one printed circuit board or on a plurality of printed circuit boards, and the printed circuit board is movable.

[0059] According to at least one embodiment of the present disclosure, the microstrip antenna is disposed on one printed circuit board, and the angles of the microstrip antennas are different, or

[0060] the microstrip antenna is disposed on a plurality of printed circuit boards, and the angles of the plurality of printed circuit boards are different so that the angles of the microstrip antennas are different.

[0061] According to at least one embodiment of the present disclosure, the printed circuit board is perpendicular or nearly perpendicular to the microwave emission beam emitted by the microstrip antenna disposed on the printed circuit board.

[0062] According to at least one embodiment of the present disclosure, a processing circuit is disposed on the printed circuit board, and the processing circuit obtains a time difference between the emission time of the microwave emission beam emitted by the emission antenna and the reception time of the microwave reflection beam received by the reception antenna based on the time-of-flight principle, so as to obtain information about the material measurement point.

[0063] According to at least one embodiment of the present disclosure, the frequency of the microwave emission beam emitted by the emission antenna is a continuously adjusted frequency.

[0064] According to at least one embodiment of the present disclosure, the processing circuit obtains a frequency difference between the frequency of the microwave emission beam emitted by the emission antenna at a certain moment and the frequency of the microwave reflection beam received by the reception antenna by comparison, so as to obtain information about the material measurement point.

[0065] According to at least one embodiment of the present disclosure, the printed circuit board can be rotated or moved so as to change the emission angle or emission position of the microwave emission beam emitted by the microstrip antenna of the printed circuit board.

[0066] According to at least one embodiment of the present disclosure, the rotation or movement of the printed circuit board is periodic.

[0067] According to at least one embodiment of the present disclosure, a scanning surface for measuring the profile of the material is formed by the rotation or movement of the printed circuit board.

[0068] According to at least one embodiment of the present disclosure, the microwave lens is a single microwave lens or a combined microwave lens formed by a plurality of lenses, and the single microwave lens or the combined microwave lens is used to converge the microwave emission beam and the microwave reflection beam.

[0069] According to at least one embodiment of the present disclosure, a microwave transceiver processing module is further included, and the microwave transceiver processing module includes a transmission path and a reception path. The transmission path is used to provide a transmission signal to the emission antenna in the transceiver antenna unit, and the reception path is used to receive a reception signal from the reception antenna in the transceiver antenna unit.

[0070] According to at least one embodiment of the present disclosure, the transmission path and the reception path are disposed on different sides of the microwave transceiver processing module.

[0071] According to at least one embodiment of the present disclosure, the transmitting antenna and the receiving antenna are independent microstrip antennas of each other.

[0072] According to at least one embodiment of the present disclosure, one transmitting antenna among the plurality of transmitting antennas or a combination of the plurality of transmitting antennas and one receiving antenna among the plurality of receiving antennas or a combination of the plurality of receiving antennas are combined with each other to form the plurality of transceiver antenna units.

[0073] According to at least one embodiment of the present disclosure, a purging unit is further included, and the purging unit is disposed on the other side of the microwave lens for keeping the other side of the microwave lens clean.

[0074] According to at least one embodiment of the present disclosure, an angle measuring unit is further included, and the angle measuring unit is configured to measure the tilt angle of the material measuring device so as to obtain the actual angle of the microwave transmitting beam and / or the microwave reflection beam based on the measured tilt angle.

[0075] According to at least one embodiment of the present disclosure, the microstrip antenna moves in or near a reference plane, and the reference plane is parallel to and / or passes through the axis of the microwave lens; or

[0076] The microstrip antenna moves in or near two or more reference planes, and the two or more reference planes are respectively parallel to and / or pass through the axis of the microwave lens.

[0077] According to at least one embodiment of the present disclosure, in the case where the microstrip antenna moves in or near a reference plane, the reference plane is parallel to and passes through the axis of the microwave lens, and the microstrip antenna performs measurement at least on or near the axis;

[0078] In the case where the microstrip antenna moves in or near two or more reference planes, the two or more reference planes are respectively parallel to and pass through the axis of the microwave lens, and the microstrip antenna performs measurement at least on or near the axis.

[0079] According to at least one embodiment of the present disclosure, in the case where the microstrip antenna moves in or near two or more reference planes, the angle between adjacent reference planes is equal.

[0080] According to at least one embodiment of the present disclosure, in the case where the microstrip antenna moves in or near two or more reference planes, the moving spacing of the microstrip antenna is different.

[0081] According to at least one embodiment of the present disclosure, when the microstrip antenna moves in or near a reference plane, microwave emission beams at different angles converged by the microwave lens are located in or near a plane, thereby forming a beam scanning plane for measuring materials on a cross-section;

[0082] When the microstrip antenna moves in or near two or more reference planes, the microwave emission beams of the microstrip antenna located in or near each reference plane are converged by the microwave lens into microwave emission beams at different angles respectively located in a plane, thereby forming multiple beam scanning planes for measuring materials on multiple cross-sections.

[0083] According to at least one embodiment of the present disclosure, it further includes a housing, and the housing and the microwave lens form a closed space for accommodating the microstrip antenna.

[0084] According to at least one embodiment of the present disclosure, the transmitting antenna emits at least a vertical microwave emission beam, and the vertical microwave emission beam is parallel to the axis of the microwave lens or passes through the axis of the microwave lens.

[0085] According to at least one embodiment of the present disclosure, when measuring materials in the shape of an inclined plane, other one or more non-vertical microwave emission beams other than the vertical microwave emission beam are used to determine the material information that needs to be measured by the vertical microwave emission beam.

[0086] According to at least one embodiment of the present disclosure, based on the angle difference between the non-vertical microwave emission beam and the vertical microwave emission beam, the material information that needs to be measured by the vertical microwave emission beam is determined.

[0087] According to at least one embodiment of the present disclosure, the angle difference between multiple microwave emission beams emitted by the transmitting antenna during movement is equal or unequal, and is 0.5 to 1.5 times the beam opening angle of the microwave emission beam.

[0088] According to at least one embodiment of the present disclosure, it further includes a storage unit for storing information of multiple microwave reflection beams.

[0089] According to at least one embodiment of the present disclosure, based on the time-of-flight principle, the time difference between the emission time of the microwave emission beam emitted by the transmitting antenna and the reception time of the microwave reflection beam received by the receiving antenna is obtained, so as to obtain the information of the material measurement point.

[0090] According to at least one embodiment of the present disclosure, it further includes an operation unit, and the operation unit obtains the information of the material measurement point according to the time difference.

[0091] According to at least one embodiment of the present disclosure, the frequency of the microwave transmission beam emitted by the transmitting antenna is a continuously adjusted frequency. The frequency difference between the frequency of the microwave transmission beam emitted by the transmitting antenna at a certain moment and the frequency of the microwave reflection beam received by the receiving antenna is obtained to obtain information about the material measurement point.

[0092] According to at least one embodiment of the present disclosure, it further includes an operation unit, and the operation unit obtains information about the material measurement point based on the frequency difference.

[0093] According to at least one embodiment of the present disclosure, it further includes a display unit, and the display unit updates the displayed information of the material in real time based on the information of each microwave reflection beam.

[0094] According to at least one embodiment of the present disclosure, the transceiver antenna unit repeatedly emits microwave transmission beams and receives microwave reflection beams to perform real-time measurement of the material measurement point.

[0095] According to another aspect of the present disclosure, a material measurement system for measuring solid materials or liquid materials includes:

[0096] A container for containing the solid material or liquid material, and the container is provided with a feed inlet for the material to enter and a discharge outlet for the material to be discharged; and

[0097] The material measurement device as described above, and the material measurement device is installed above an opening formed in the container, and the material measurement device measures the material from multiple angles through microwave transmission beams with different angles.

[0098] According to at least one embodiment of the present disclosure, the number of the material measurement devices is two or more, and two or more material measurement devices are respectively arranged above the openings at different positions of the container.

[0099] According to at least one embodiment of the present disclosure, two or more of the material measurement devices are used to measure the material on one cross-section or measure the material on multiple cross-sections.

[0100] According to at least one embodiment of the present disclosure, the multiple microstrip antennas are located in or near a reference plane, and the reference plane is parallel to the axis of the microwave lens and / or passes through the axis. The multiple microstrip antennas located in or near the reference plane are arranged in a straight line or a curved shape or close to a straight line or a curved shape.

[0101] Wherein, the reference plane passes through the projection point of the feed inlet on the material or passes through a point near the projection point.

[0102] According to at least one embodiment of the present disclosure, the plurality of microstrip antennas are located in or near two or more reference planes, the two or more reference planes are respectively parallel to the axis of the microwave lens and / or pass through the axis, and the plurality of microstrip antennas respectively located in or near each of the two or more reference planes are respectively arranged in a straight line or a curved shape or a shape close to a straight line or a curved shape.

[0103] Wherein, the two or more reference planes pass through the projection point of the feed port on the material or pass through a point near the projection point.

[0104] According to at least one embodiment of the present disclosure, the plurality of microstrip antennas are circularly polarized microstrip antennas, and the polarization directions of the transmitting antenna and the receiving antenna are opposite, so that when the microwave emission beam of the transmitting antenna is reflected by the wall of the container and then the microwave reflection beam reflected by the material again will not be received by the receiving antenna.

[0105] According to at least one embodiment of the present disclosure, it further includes a processing unit, and the processing unit obtains at least one of the material shape, volume, mass, and average height at least according to the material information measured by the material measuring device.

[0106] According to another aspect of the present disclosure, a material measuring system for measuring the vortex of a liquid or solid material includes:

[0107] A container for containing the liquid or solid material;

[0108] A stirrer for stirring the liquid or solid material; and

[0109] The material measuring device as described above, the material measuring device is installed above the opening formed on the container, and the material measuring device measures the vortex from multiple angles through microwave emission beams with different angles.

[0110] According to at least one embodiment of the present disclosure, the number of the material measuring devices is two or more, and the two or more material measuring devices are respectively arranged above the openings at different positions of the container.

[0111] According to at least one embodiment of the present disclosure, the two or more material measuring devices are used to measure the vortex on one cross-section or measure the vortices on multiple cross-sections.

[0112] According to at least one embodiment of the present disclosure, the plurality of microstrip antennas are located in or near a reference plane, the reference plane is parallel to the axis of the microwave lens and / or passes through the axis, and the plurality of microstrip antennas located in or near the reference plane are arranged in a straight line or a curved shape or a shape close to a straight line or a curved shape.

[0113] Wherein, the one reference plane passes through or is near the stirring shaft of the stirrer.

[0114] According to at least one embodiment of the present disclosure, the plurality of microstrip antennas are located in or near two or more reference planes, the two or more reference planes are respectively parallel to the axis of the microwave lens and / or pass through the axis, and the plurality of microstrip antennas respectively located in or near each of the two or more reference planes are respectively arranged in a straight line or a curved shape or a shape close to a straight line or a curved shape.

[0115] Wherein, the two or more reference planes pass through or are near the stirring shaft of the stirrer.

[0116] According to at least one embodiment of the present disclosure, based on the distance measured by the first microwave emission beam perpendicular to the angle of the vortex in the converged microwave emission beam, the distance that should be measured by the second microwave emission beam vertically downward in the converged microwave emission beam is calculated.

[0117] According to at least one embodiment of the present disclosure, if the angle between the first microwave emission beam and the second microwave emission beam is set as θ, the distance measured by the first microwave emission beam is D1, and the distance that should be measured by the second microwave emission beam is D2, then D2 = D1 / cosθ.

[0118] According to at least one embodiment of the present disclosure, when the energy of the first microwave emission beam is greater than the energy of the microwave emission beams on the adjacent two sides, the first microwave emission beam is determined to be perpendicular to the angle of the vortex.

[0119] According to at least one embodiment of the present disclosure, the number of the microstrip antennas is more than 10.

[0120] According to at least one embodiment of the present disclosure, it further includes a processing unit, and the processing unit obtains at least one of the material shape, volume, mass, and average height according to at least the material information measured by the material measuring device.

[0121] According to another aspect of the present disclosure, a material measuring system for measuring a material includes:

[0122] A container for containing the material; and

[0123] The material measuring device as described above, the material measuring device is installed above an opening formed on the container, and the material measuring device measures the material from multiple angles through microwave emission beams with different angles.

[0124] Among them, the multiple microstrip antennas are located in or near two or more reference planes, the two or more reference planes are respectively parallel to the axis of the microwave lens and / or pass through the axis, and the multiple microstrip antennas located in or near each of the two or more reference planes are respectively arranged in a straight line or a curved shape or close to a straight line or a curved shape. In this way, when the multiple microstrip antennas in one reference plane are interfered by the interfering objects in the material measurement system, the measurement is carried out by the microstrip antennas in other reference planes to eliminate the interference of the interfering objects.

[0125] According to at least one embodiment of the present disclosure, the number of microstrip antennas in other reference planes is less than the number of microstrip antennas in this one reference plane.

[0126] According to at least one embodiment of the present disclosure, the number of the reference planes is two, and the two reference planes are perpendicular to each other.

[0127] According to at least one embodiment of the present disclosure, the interfering object is the stirring blade for stirring the liquid. The microstrip antennas in this one reference plane are used to measure the vortex formed when the liquid is stirred, while the microstrip antennas in other reference planes are used to eliminate the interference of the interfering objects.

[0128] According to still another aspect of the present disclosure, a material measurement system for measuring the material conveyed by a conveyor belt is characterized by comprising:

[0129] A conveyor belt for conveying the material along the conveying direction;

[0130] The material measurement device as described above, the material measurement device is arranged above the conveyor belt, and the material measurement device measures the material from multiple angles through microwave emission beams with different angles.

[0131] According to at least one embodiment of the present disclosure, the multiple microstrip antennas are located in or near one reference plane, the one reference plane is perpendicular or nearly perpendicular to the conveying direction, and the multiple microstrip antennas located in or near the one reference plane are arranged in a straight line or a curved shape or close to a straight line or a curved shape, and the multiple microstrip antennas are used to measure the cross-sectional area of the material.

[0132] According to at least one embodiment of the present disclosure, the conveying speed of the material is measured by the Doppler effect of the microstrip antennas, so as to obtain the volume flow rate of the material according to the cross-sectional area and the conveying speed of the material.

[0133] According to at least one embodiment of the present disclosure, the multiple microstrip antennas are at least respectively located on a first reference plane and a second reference plane, the first reference plane and the second reference plane are parallel or nearly parallel, and perpendicular to the conveying direction. The conveying speed of the material is obtained by the cross-sectional areas of the material measured by the multiple microstrip antennas on the first reference plane and the multiple microstrip antennas on the second reference plane, and the volume flow rate of the material is obtained according to the cross-sectional area and the conveying speed of the material.

[0134] According to at least one embodiment of the present disclosure, the multiple microstrip antennas are at least respectively located on a first reference plane and a second reference plane, the first reference plane and the second reference plane are perpendicular or nearly perpendicular, and the first reference plane is perpendicular to the conveying direction. The volume flow rate of the material is obtained by the cross-sectional area of the material measured by the multiple microstrip antennas on the first reference plane and the conveying speed of the material measured by the multiple microstrip antennas on the second reference plane. BRIEF DESCRIPTION OF THE DRAWINGS

[0135] The drawings illustrate exemplary embodiments of the present disclosure and, together with the description thereof, are used to explain the principles of the present disclosure. The drawings are included to provide a further understanding of the present disclosure and are incorporated in this specification and form a part of this specification.

[0136] Figure 1 It is a schematic diagram of a material measurement device according to an embodiment of the present disclosure.

[0137] Figure 2 It is a schematic diagram of the distribution of transmitting antennas and receiving antennas according to an embodiment of the present disclosure.

[0138] Figure 3 It is a schematic diagram of the distribution of transmitting antennas and receiving antennas according to an embodiment of the present disclosure.

[0139] Figure 4 It is a schematic diagram of the distribution of transmitting antennas and receiving antennas according to an embodiment of the present disclosure.

[0140] Figure 5 It is a schematic diagram of the distribution of transmitting antennas and receiving antennas according to an embodiment of the present disclosure.

[0141] Figure 6 It is a schematic diagram of a microwave lens according to an embodiment of the present disclosure.

[0142] Figure 7 It is a schematic diagram of the distribution of a transceiver antenna unit according to an embodiment of the present disclosure.

[0143] Figure 8 It is a schematic diagram of a microwave transceiver processing module according to an embodiment of the present disclosure.

[0144] Figure 9 Schematic diagram of a microwave transceiver processing module according to an embodiment of the present disclosure.

[0145] Figure 10 Schematic diagram of a microwave transceiver processing module according to an embodiment of the present disclosure.

[0146] Figure 11 Schematic diagram of a microwave transceiver processing module according to an embodiment of the present disclosure.

[0147] Figure 12 Schematic diagram of a microwave transceiver processing module according to an embodiment of the present disclosure.

[0148] Figure 13 Schematic diagram of a material measurement device according to an embodiment of the present disclosure.

[0149] Figure 14 Schematic diagram of a material measurement system according to an embodiment of the present disclosure.

[0150] Figure 15 Schematic diagram of a material measurement system according to an embodiment of the present disclosure.

[0151] Figure 16 Flowchart of a material measurement method according to an embodiment of the present disclosure.

[0152] Figure 17 Flowchart of a material measurement method according to an embodiment of the present disclosure.

[0153] Figure 18 Schematic diagram of a material measurement system according to an embodiment of the present disclosure.

[0154] Figure 19 Schematic diagram of a vortex measurement according to an embodiment of the present disclosure.

[0155] Figure 20 Schematic diagram of a vortex measurement according to an embodiment of the present disclosure.

[0156] Figure 21 Schematic diagram of an interference elimination according to an embodiment of the present disclosure.

[0157] Figure 22 Schematic diagram of conveyor belt materials according to an embodiment of the present disclosure.

[0158] Figure 23 Schematic diagram of conveyor belt materials according to an embodiment of the present disclosure. Detailed implementation manners

[0159] The present disclosure will be further described in detail below in conjunction with the accompanying drawings and embodiments. It can be understood that the specific embodiments described herein are only used to explain the relevant content and do not limit the present disclosure. Additionally, it should be noted that for the sake of description, only the parts related to the present disclosure are shown in the drawings.

[0160] It should be noted that, without conflict, the embodiments in the present disclosure and the features in the embodiments can be combined with each other. The technical solutions of the present disclosure will be described in detail below with reference to the accompanying drawings and embodiments.

[0161] Unless otherwise specified, the exemplary embodiments / examples shown will be understood to provide exemplary features of various details of some ways in which the technical concept of the present disclosure can be implemented in practice. Therefore, unless otherwise specified, without departing from the technical concept of the present disclosure, the features of various embodiments / examples can be additionally combined, separated, interchanged, and / or rearranged.

[0162] In the drawings, cross - hatching and / or shading are generally used to make the boundaries between adjacent components clear. Thus, unless stated otherwise, the presence or absence of cross - hatching or shading does not convey or imply any preference or requirement regarding the specific material, material properties, dimensions, proportions, commonality between the components shown, and / or any other characteristics, attributes, properties, etc. of the components. Additionally, in the drawings, for clarity and / or descriptive purposes, the dimensions and relative dimensions of components may be exaggerated. When the exemplary embodiments can be implemented differently, the specific process sequences can be performed in an order different from that described. For example, two consecutively described processes can be performed substantially simultaneously or in an order opposite to that described. Further, the same reference numerals denote the same components.

[0163] When a component is referred to as being "on" or "above" another component, "connected to" or "coupled to" another component, the component can be directly on the other component, directly connected to or directly coupled to the other component, or there can be an intermediate component. However, when the component is referred to as being "directly on" another component, "directly connected to" or "directly coupled to" another component, there is no intermediate component. For this reason, the term "connection" can refer to a physical connection, an electrical connection, etc., and can have or not have an intermediate component.

[0164] For descriptive purposes, the present disclosure may use spatial relative terms such as "under", "below", "beneath", "lower", "above", "upper", "upon", "higher", and "side (e.g., as in "sidewall")" to describe the relationship of one component to another (other) component as shown in the figures. In addition to the orientation depicted in the figures, the spatial relative terms are also intended to encompass different orientations of the device during use, operation, and / or manufacture. For example, if the device in the figures is flipped, a component described as "under" or "beneath" another component or feature will then be positioned "above" the other component or feature. Thus, the exemplary term "under" can encompass both "above" and "below" orientations. Additionally, the device can be otherwise positioned (e.g., rotated 90 degrees or at other orientations), and accordingly, the spatial relative descriptors used herein are to be interpreted.

[0165] The terms used herein are for the purpose of describing particular embodiments and are not intended to be limiting. As used herein, unless the context clearly indicates otherwise, the singular forms "a", "an", and "the" are also intended to include the plural forms. Additionally, when the terms "comprise" and / or "include" and their variants are used in this specification, it is stated that there are the stated features, integers, steps, operations, components, assemblies, and / or groups thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, components, assemblies, and / or groups thereof. It should also be noted that, as used herein, the terms "substantially", "about", and other similar terms are used as approximate terms and not as terms of degree, and thus are used to explain the inherent deviations of measured, calculated, and / or provided values that would be recognized by a person of ordinary skill in the art.

[0166] According to one embodiment of the present disclosure, a material measurement device is provided.

[0167] Figure 1 A material measurement device 10 according to one embodiment of the present disclosure is shown.

[0168] As Figure 1 shown, the material measurement device 10 may include a microstrip antenna 100 and a microwave lens 200. It further includes a housing, and the housing and the microwave lens form a closed space for accommodating the microstrip antenna.

[0169] The number of the microstrip antennas 100 is multiple. For example, the number of the microstrip antennas may be more than 5, more than 10, etc., so as to form a plurality of transceiver antenna units.

[0170] Each transceiver antenna unit includes a transmitting antenna 110 and a receiving antenna 120.

[0171] Figures 2 to 5 Examples of the transmitting antenna and the receiving antenna are shown.

[0172] In Figure 2 , the transmitting antenna 110 and the receiving antenna 120 of each transceiver antenna unit share a microstrip antenna 100. In this example, the transmission and reception can be combined into one path through a coupler, so that n transmitting antennas 110a, 110b,..., 110n and n receiving antennas 120a, 120b,..., 120n can be formed by n microstrip antennas.

[0173] In Figure 3 , each transmitting antenna and each receiving antenna respectively use a microstrip antenna 100, and the adjacent transmitting antenna and receiving antenna form a transceiver antenna unit. For example, the transmitting antenna 110a and the receiving antenna 120a form a transceiver antenna unit, the transmitting antenna 110b and the receiving antenna 120b form a transceiver antenna unit,..., and the transmitting antenna 110n and the receiving antenna 120n form a transceiver unit. Among them, the transmitting antenna and the receiving antenna in a transceiver antenna unit are two adjacent microstrip antennas.

[0174] In Figure 4 , each transmitting antenna and each receiving antenna respectively use a microstrip antenna 100, and two adjacent transmitting antennas and receiving antennas form a transceiver antenna unit. For example, the transmitting antenna 110a and the adjacent receiving antenna 120a form a transceiver antenna unit, the receiving antenna 120a also forms a transceiver antenna unit with the adjacent transmitting antenna 110b, the transmitting antenna 110b and the receiving antenna 120b form a transceiver antenna unit,.... In this way, the transceiver antenna units of different beams can share the transmitting antenna or the receiving antenna, and a transmitting antenna or a receiving antenna can be in the transceiver antenna units of two or more beams.

[0175] In this method, the transmitting antenna and the receiving antenna are in an alternating form. For example, in the case of alternating arrangement of four transmitting antennas and three receiving antennas, six transceiver antenna units can be formed and six beams can be processed. When the number of transmitting antennas is n and the number of receiving antennas is n + 1, 2n beams can be realized. When the number of transmitting antennas is n + 1 and the number of receiving antennas is n, 2n beams can also be realized.

[0176] In Figure 5 , each transmitting antenna and each receiving antenna respectively use a microstrip antenna 100, and the respective microstrip antennas 100 are close to each other, so that the transmitting antenna and the receiving antenna can be combined in pairs, and the number of processed beams is the product of the number of transmitting antennas and the number of receiving antennas.

[0177] The transmitting antenna 110 is used to generate a microwave transmitting beam and direct the microwave transmitting beam towards the microwave lens 200. The receiving antenna 120 is used to receive the microwave reflected beam generated after the microwave transmitting beam is reflected, and measure the material based on the microwave transmitting beam and the microwave reflected beam.

[0178] The microstrip antennas 100 are all located on the same side of the microwave lens 200, for example Figure 1 the upper side of the microwave lens 200 shown.

[0179] The transmitting antenna 110 emits a divergent microwave beam towards the microwave lens 200. The microwave beam is converged by the microwave lens 200 to form parallel or nearly parallel microwave beams on the other side of the microwave lens 200. The angles of the multiple microwave transmitting beams formed on the other side of the microwave lens 200 are different.

[0180] When the microwave transmitting beam converged by the microwave lens 200 reaches the material 300, it will be reflected by the material 300 to form a microwave reflected beam of the first reflection. Each microwave reflected beam enters the microwave lens 200 and is converged by the microwave lens 200, and is received by the receiving antenna located on one side of the microwave lens 200.

[0181] At least one microwave transmitting beam among the multiple microwave transmitting beams emitted by the multiple transmitting antennas serves as a vertical microwave transmitting beam, and the vertical microwave transmitting beam is parallel to the axis of the microwave lens or passes through the axis of the microwave lens.

[0182] When measuring a material with an inclined surface shape, the material information to be measured by the vertical microwave transmitting beam is determined according to one or more non-vertical microwave transmitting beams other than the vertical microwave transmitting beam.

[0183] Based on the angle difference between the non-vertical microwave transmitting beam and the vertical microwave transmitting beam, the material information to be measured by the vertical microwave transmitting beam is determined.

[0184] The angle differences between the multiple microwave transmitting beams emitted by the multiple transmitting antennas are equal or unequal, and are 0.5 to 1.5 times the beam opening angle of the microwave transmitting beam.

[0185] The microwave lens 200 is arranged to be penetrable by microwaves and can change the direction of microwaves.

[0186] The microwave lens 200 can be made of materials such as ceramics or plastics, and its dielectric constant can be uniform or non-uniform. In the present disclosure, the dielectric constant of the microwave lens 200 can be greater than 1, it can be penetrated by microwaves, and is made of a material with low loss, such as ceramics or plastics.

[0187] Figure 6Several forms of the microwave lens 200 are shown. Figure 6 The forms shown are merely examples, and the present disclosure is not limited to Figure 6 the forms shown. For example, the microwave lens 200 may have a structure of a convex lens that is thicker in the middle and thinner on the outside, the microwave lens 200 may have a structure of a concave lens that is thicker on the outside and thinner in the middle, the microwave lens 200 may have a structure with one curved surface and one flat surface, and the microwave lens 200 may have a structure with both surfaces being curved. The curved surface may be a spherical surface or an ellipsoidal spherical surface, or may be in the form of a combination of multiple curved surfaces. The microwave lens 200 may be in the form of a solid lens or a hollow lens.

[0188] In addition, the microwave lens 200 may include one microwave lens or may be a combination of two or more microwave lenses. The purpose of both a single microwave lens and a combination of microwave lenses is to converge the microwave emission beam and the microwave reflection beam.

[0189] In a preferred embodiment of the present disclosure, a plurality of microstrip antennas 100 are disposed on the focal plane of the microwave lens 200.

[0190] When a microwave beam is emitted by a microstrip antenna 100 on one side of the microwave lens 200, a converging microwave beam can be formed on the other side of the microwave lens 200 through the microwave lens 200.

[0191] For example Figure 1 as shown, the left and right microstrip antennas 100 can form a converging microwave beam through the microwave lens 200, and the middle microstrip antenna 100 can also form a converging microwave beam through the microwave lens 200.

[0192] Ideally, each converged microwave beam is a parallel beam, but in actual situations, there may be a small-angle divergence, and the divergence angle is preferably less than 15°.

[0193] The microwave beams emitted by the microstrip antennas 100 at the corresponding positions of the microwave lens 200 can all be converged by the microwave lens 200. The position where each microwave lens 200 is located can be called the focus of the microwave lens, and the plane formed by these foci can be called the focal plane of the microwave lens.

[0194] In addition, the microwave lens 200 can be arranged such that the focal plane of the microwave lens is a plane or a curved surface. By disposing the microstrip antennas 100 on the focal plane of the microwave lens 200, the energy of the microwave reflection beam received by the receiving antenna can be maximized.

[0195] Preferably, the transmitting antenna and the receiving antenna of a transceiver antenna unit are located at or near a focal point of the microwave lens 200. Each transceiver antenna unit arranged at the focal point of the microwave lens 200 can cooperate to process a transmitting beam and a reflected beam. These two beams are in opposite directions and are parallel, close to, or coincident.

[0196] As described above, the focal plane of the microwave lens 200 can be in a planar shape or a curved shape.

[0197] When the focal plane of the microwave lens 200 is in a planar shape, multiple microstrip antennas 100 can be arranged in a reference plane perpendicular to the cross-section of the microwave lens 200 (a plane perpendicular to the optical axis) or near this reference plane. In this way, multiple microstrip antennas 100 will be in a straight line or approximately in a straight line. Among them, this reference plane is preferably parallel to the axis of the microwave lens 200 or passes through this axis (this axis is located in this reference plane).

[0198] When the focal plane of the microwave lens 200 is in a curved shape, multiple microstrip antennas 100 can be arranged in a reference plane perpendicular to the cross-section of the microwave lens 200 (a plane perpendicular to the optical axis) or near this reference plane. In this way, multiple microstrip antennas 100 will be on a curve or approximately on a curve. Among them, this reference plane is preferably parallel to the axis of the microwave lens 200 or passes through this axis (this axis is located in this reference plane).

[0199] The above describes the microstrip antennas 100 arranged in a straight line or approximately in a straight line / curve. In the embodiments of the present disclosure, multiple microstrip antennas 100 can also be arranged in a shape of two or more straight lines / curves or approximately straight lines / curves.

[0200] At this time, multiple microstrip antennas 100 can be arranged in two or more reference planes perpendicular to the cross-section of the microwave lens 200 (a plane perpendicular to the optical axis) or near these two or more reference planes. In this way, when the focal plane of the microwave lens 200 is in a planar shape, multiple microstrip antennas 100 are arranged in a shape of two or more straight lines, and when the focal plane of the microwave lens 200 is in a curved shape, multiple microstrip antennas 100 are arranged in a shape of two or more curves. Preferably, each of the two or more reference planes passes through the axis of the microwave lens 200, and more preferably, the angles between adjacent reference planes among the two or more reference planes are equal to each other. For example, when forming two straight lines / curves, the reference planes where the two straight lines / curves are located are perpendicular to each other. When forming four straight lines / curves, the angles between adjacent reference planes among the four reference planes where the four straight lines / curves are located are 45° respectively.

[0201] When multiple microstrip antennas 100 are located in or near two or more reference planes, the number of microstrip antennas 100 located in or near each reference plane can be the same or different, that is to say, the number of microstrip antennas located on different straight lines / curves can be different. In a preferred embodiment of the present disclosure, a central transceiver antenna unit is disposed on or near the axis of the lens.

[0202] When multiple microstrip antennas 100 are located in or near a single reference plane, microwave emission beams at different angles converged by the microwave lens 200 are located in or near a single plane, thereby forming a beam scanning plane for measuring a cross-section of the material.

[0203] When multiple microstrip antennas 100 are located on a straight line / curve, after the microwave emission beams emitted by the microstrip antennas 100 are converged by the microwave lens 200, converged microwave emission beams at different angles are formed. In this way, the converged microwave emission beams at different angles can form a microwave beam plane, and this plane constitutes a measurement section plane. When the beam plane contacts the surface of the material, it is reflected by the material surface, and the distance information of several measurement points on the material surface is obtained through the microwave reflection signals received by the receiving antenna, so that a sectional structure of the material can be obtained.

[0204] When multiple microstrip antennas 100 are located in or near two or more reference planes, the microwave emission beams of the microstrip antennas 100 located in or near each reference plane are converged by the microwave lens 200 into microwave emission beams at different angles respectively located in a single plane, thereby forming multiple beam scanning planes for measuring multiple cross-sections of the material.

[0205] That is to say, multiple microstrip antennas 100 are arranged on two or more straight lines / curves, and multiple microstrip antennas 100 on each straight line / curve respectively form a microwave beam plane. In this way, two or more measurement section planes are formed by the two or more formed microwave beam planes. When two or more beam planes can measure the three-dimensional surface information of an object. Preferably, the two or more microwave beam planes can intersect with each other, so that sectional structures of the material at multiple different angles can be obtained to obtain the three-dimensional surface information of the material.

[0206] Figure 7 The arrangement shape of the microstrip antennas is shown when the cross-section of the microwave lens is circular. Among them, the microstrip antennas can be arranged in a straight line / curve, two microstrip antennas can be arranged in perpendicular intersecting straight lines / curves, and four microstrip antennas can be arranged in a similar circular ring shape (when the focal plane is a curved surface shape, different rings can be at different heights).

[0207] The microstrip antenna in the present disclosure can be an antenna formed on a printed circuit board (PCB). Multiple microstrip antennas can be formed on one printed circuit board or not on one printed circuit board. Preferably, multiple transceiver antenna units of the same microwave transceiver processing module described below are arranged on one printed circuit board.

[0208] The shape of the printed circuit board can be set according to the layout shape of the microstrip antenna. For example, it can be a flat shape (when the focal plane is a plane), or a curved shape (when the focal plane is a curved surface). Each transceiver antenna unit can be arranged on one printed circuit board, and multiple transceiver antenna units can be arranged on one printed circuit board. The mutually separated printed circuit boards can be at a certain angle to form a curved shape (when the focal plane is a curved surface).

[0209] Multiple microstrip antennas are arranged on one printed circuit board, and the angles of the multiple microstrip antennas are different, or multiple microstrip antennas are arranged on multiple printed circuit boards, and the angles of the multiple printed circuit boards are different so that the angles of the multiple microstrip antennas are different. The printed circuit board is perpendicular or nearly perpendicular to the microwave emission beam emitted by the microstrip antenna arranged on the printed circuit board.

[0210] The printed circuit board can be rotated or moved to change the emission angle or emission position of the microwave emission beam emitted by the microstrip antenna of the printed circuit board. The rotation or movement of the printed circuit board is periodic. A scanning surface for measuring the profile of the material is formed by the rotation or movement of the printed circuit board.

[0211] According to a further embodiment of the present disclosure, the material measuring device 10 further includes a microwave transceiver processing module. The microwave transceiver processing module obtains the time difference between the emission time of the microwave emission beam emitted by the emission antenna and the reception time of the microwave reflection beam received by the reception antenna based on the time-of-flight principle, so as to obtain the information of the material measurement point.

[0212] The frequency of the microwave emission beam emitted by the emission antenna is a continuously adjusted frequency. The frequency difference between the two is obtained by comparing the frequency of the microwave emission beam emitted by the emission antenna at a certain moment with the frequency of the microwave reflection beam received by the reception antenna, so as to obtain the information of the material measurement point.

[0213] Such as Figure 8As shown, the microwave transceiver processing module 130 can be at least used to provide a transmission signal for controlling the transmitting antenna and receive a reception signal from the receiving antenna. For example, when the transmitting antenna 110 and the receiving antenna 120 are independent, the microwave transceiver processing module 130 provides a transmission signal to the transmitting antenna 110 and receives a reception signal from the receiving antenna 120. When the transceiver antenna unit shares a microwave antenna, the form of a microwave antenna + microwave coupler can be adopted. The microwave coupler can mix the reception signal and the transmission signal. The microwave transceiver processing module 130 provides the transmission signal to the microwave coupler. The microwave antenna acts as a transmitting antenna to transmit a microwave beam. When receiving a signal, the microwave antenna acts as a receiving antenna to receive the microwave beam, and the reception signal is provided to the microwave transceiver processing module 130 through the microwave coupler.

[0214] In a preferred embodiment of the present disclosure, the microwave transceiver processing module is a multi-transmit and multi-receive module, that is, a module includes multiple transmit paths and multiple receive paths. As Figure 9 shown, the receive path and the transmit path are not arranged on the same side of the microwave transceiver processing module, which can increase the isolation between the reception and transmission of the microwave transceiver processing module.

[0215] As an example of the present disclosure, Figure 10 shows a case where the transmitting antenna and the receiving antenna are separate antennas and the transmitting antenna and the receiving antenna are in one-to-one correspondence. Here, the microwave transceiver processing module can be on the same side of the printed circuit board as the transmitting antenna and the receiving antenna, and the microwave transceiver processing module provides a transmission signal to the transmitting antenna through the transmit paths and receive paths on different sides, and receives a reception signal from the receiving antenna.

[0216] In Figure 10 , a pair of transceiver channels corresponds to a fixed transceiver antenna unit. In Figure 11 shows a case where one transmitting antenna and / or receiving antenna can be in two transceiver antenna units. The transmitting antenna and the receiving antenna are arranged alternately. For a specific description of the antenna, reference can be made to the description of Figure 4 . By controlling the combination relationship between the transmit path and the receive path through the microwave transceiver processing module, beam multiplication can be achieved. By combining more beams, a finer beam angle can be formed, so that the measurement of materials can be more accurate.

[0217] Figure 12It shows that multiple transceiver antenna units are in a multiple-input multiple-output microwave transceiver processing module. When multiple transmit antennas and multiple receive antennas are close to each other, the transmit antennas and receive antennas can be combined with each other. Through the control of the microwave transceiver processing module, the number of beams equal to the number of transmit antennas multiplied by the number of receive antennas can be obtained. Of course, the closer the distance between the transmit antenna and the receive antenna, the better the beam performance; the farther the distance, the worse the beam performance.

[0218] In addition, in the case where multiple transmit antennas and multiple receive antennas are combined to form transceiver antenna units to process more beams. In Figure 13 it, the transmit antenna 110a is used to transmit microwave beams. The microwave transmitted beams emitted by the transmit antenna 110a can be received by the receive antenna 120a. However, in the common area of the microwave beam corresponding to the receive antenna 120b and the transmit antenna 110a ( Figure 13 shown by the shaded line in it. As described above, since the microwave transmitted beam and the microwave reflected beam have a divergence angle), the microwave reflected beam generated by the microwave transmitted beam of the transmit antenna 110a can be received by the receive antenna 120b.

[0219] When the transmit antenna and the receive antenna are respective microstrip antennas, the transmit antenna and the receive antenna can adopt circularly polarized antennas, and the polarization directions of the transmit antenna and the receive antenna are opposite. For example, when the transmit antenna is right-handed circularly polarized, the receive antenna is left-handed circularly polarized; when the transmit antenna is left-handed circularly polarized, the receive antenna is right-handed circularly polarized. Since the material measurement device forms multiple microwave beams, thus forming a measurement plane, there will be a high probability that the microwave transmitted beam emitted from the material measurement device directly reaches the wall of the bin. After the microwave beam reaching the bin wall is received by the receive antenna, it must be a false signal. If these false signals are mixed in, then the shape of the measured material will be a false shape.

[0220] Therefore, in the present disclosure, the transmit antenna and the receive antenna can be circularly polarized antennas with opposite polarization directions. Each time the microwave beam of the circularly polarized antenna is reflected, the polarization direction changes. For example, when the transmit antenna is right-handed circularly polarized, the microwave beam emitted from the transmit antenna ( Figure 14 the leftmost beam in it) is right-handed circularly polarized. When it contacts the wall of the bin, the microwave beam reflected from the bin wall to the material surface becomes left-handed circularly polarized. When the microwave beam is reflected back from the material surface to the receive antenna, it becomes right-handed circularly polarized again. However, since the receive antenna is left-handed circularly polarized, the left-handed circularly polarized receive antenna cannot receive this right-handed circularly polarized microwave beam. Thus, the reflection generated by the bin is avoided.

[0221] In the manner of the present disclosure, compared with the prior art, it is possible to increase the antenna without reducing the gain, and it also has the characteristics of small size and low cost. When used for measuring materials, microstrip antennas with a large number and high gain can be adopted to achieve more accurate material measurement.

[0222] According to the second embodiment of the present disclosure, a material measurement system is provided.

[0223] The material measurement system includes the above-mentioned material measurement device 10, a processing unit, and a central control unit, and may further include a power supply unit, a communication unit, and a display unit.

[0224] As Figure 15 shown, a microwave transceiver processing unit may correspond to one or more transceiver antenna units. Although 3 are shown in the figure, it is not used for limitation. The material measurement system may include multiple microwave transceiver processing units.

[0225] The microwave transceiver processing module may be a collection of devices such as a local oscillator or VCO, a mixer, a power amplifier, and a low-noise amplifier. It can provide a signal source for microwave transmission and the mixing and amplification of microwave received signals to obtain an echo analog signal of the material surface reflection information.

[0226] The local oscillator can split a local oscillator signal into one path of signal to generate a reflection signal of the transceiver antenna unit, and split another path of signal to provide it to the mixer. The mixer also receives the reflection signal and mixes it to form a mixing signal for determining the material level distance. The amplifier is used to amplify the mixing signal.

[0227] The processing unit may be in the form of a digital calculation module, which can perform AD sampling on the mixing signal, perform operations such as FFT on the sampled digital signal to obtain spectrum information, and calculate the distance information of the contact point between the emission beam and the material surface through spectrum analysis.

[0228] Multiple transceiver antenna units can work simultaneously or only one transceiver antenna unit can work at a time. In this way, the distances of multiple points can be measured simultaneously, or the distance of only one point can be measured simultaneously.

[0229] One processing unit may correspond to one microwave transceiver processing unit, or may correspond to multiple microwave transceiver processing units. That is, one processing unit can calculate the distance of one point or the distances of multiple points.

[0230] Based on the time-of-flight principle, the time difference between the emission time of the microwave emission beam by the emission antenna and the reception time of the microwave reflection beam by the reception antenna is obtained to obtain the information of the material measurement point.

[0231] It also includes an arithmetic unit or a processing unit as the arithmetic unit, and the arithmetic unit obtains the information of the material measurement point according to the time difference.

[0232] The frequency of the microwave emission beam emitted by the transmitting antenna is a continuously adjusted frequency. By comparing the frequency of the microwave emission beam emitted by the transmitting antenna at a certain moment with the frequency of the microwave reflection beam received by the receiving antenna, the frequency difference between the two is obtained, so as to obtain the information of the material measurement point. The arithmetic unit obtains the information of the material measurement point according to the frequency difference.

[0233] The central control unit is responsible for controlling the work of each processing unit and the microwave processing module, collecting the distance calculation results of the processing unit, and then calculating the shape, average height, and total volume of the material, etc. according to the pre-set bin body information, the installation position information of the material measurement device, the position information of the inlet and outlet, and the angle information of the beam corresponding to each transceiver antenna.

[0234] The power supply unit is responsible for providing various voltages to the material measurement system. The communication unit outputs the information of the central control unit externally and inputs the external setting information. Among them, the communication unit can communicate by wired or wireless means. The display unit updates the information of the displayed material in real time according to the information of each microwave reflection beam.

[0235] According to a further embodiment, the material measurement system further includes a purging part, which is arranged below the microwave lens and can keep the microwave lens clean by compressed air, etc., so as to avoid the interference of dust, etc.

[0236] According to a further embodiment, the material measurement system further includes an angle measurement part, which is used to measure the tilt angle of the material measurement device, so as to obtain the actual angles of the microwave emission beam and / or the microwave reflection beam based on the measured tilt angle.

[0237] In order to obtain the best microwave reflection signal, the material measurement device can also be installed obliquely. The material measurement device can have a tilt angle, and the tilt angle is measured by a sensor. It can also be input by the customer. After the measured or input tilt angle, the angle information of all beams can be updated with this angle information to obtain the current actual angle information of all beams. The sensor for measuring the tilt angle can be a gyroscope or an inclinometer.

[0238] The material measurement device further includes a storage part for storing the information of the multiple microwave reflection beams.

[0239] In the above-mentioned embodiments or examples, the position of the microstrip antenna is fixed. However, in the present disclosure, the microstrip antenna can also be movable, and in this case, the number of microstrip antennas can be one or more.

[0240] An example will be used for illustration below. In this example, a scanning plane can be constructed by a moving microstrip antenna. For example, the moving microstrip antenna can move along a guide rail or the like. Measurement is achieved by transmitting and receiving beams at different positions on the focal plane, for example.

[0241] For other descriptions of the moving microstrip antenna, they are the same as the above-described embodiments and will not be elaborated here.

[0242] In the present disclosure, a method for measuring materials is also provided.

[0243] As Figure 16 shown, first, control each transmitting and receiving antenna unit of the material measurement device to transmit microwave beams, and obtain microwave reflection signals at multiple angles. Calculate the respective distance values from the material based on the microwave reflection signals. Obtain the material shape according to preset information (such as the shape of the accommodating body, the angle between microwave beams, the tilt angle of the material measurement device, etc.) and the respective distance values. Then, based on the material shape, obtain information such as the material volume, average height, mass, etc. Finally, provide the obtained information to the display device.

[0244] Figure 16 This is the measurement method when all microstrip antennas transmit and receive simultaneously. Figure 17 Illustrates the measurement method when microstrip antennas transmit and receive separately.

[0245] As Figure 17 shown, the transmitting antenna in a transmitting and receiving antenna unit transmits a microwave beam, then obtains the microwave reflection signal at the angle of this transmitting and receiving antenna unit, and calculates the distance from the material surface to the transmitting antenna based on this microwave reflection signal. Then, determine whether it is the last transmitting and receiving antenna unit. If not, continue to transmit the microwave beam. If so, distance values at each angle will be obtained. Obtain the material shape according to preset information (such as the shape of the accommodating body, the angle between microwave beams, the tilt angle of the material measurement device, etc.) and the respective distance values. Then, based on the material shape, obtain information such as the material volume, average height, mass, etc. Finally, provide the obtained information to the display device.

[0246] According to the third embodiment of the present disclosure, a material measurement system is provided for measuring solid materials or liquid materials, including: an accommodating body (a silo), for accommodating solid materials or liquid materials, and the accommodating body is provided with a feed inlet for the material to enter and a discharge outlet for the material to be discharged; and the above-described material measurement device, the material measurement device is installed above an opening formed on the accommodating body, and the material measurement device measures the material from multiple angles through microwave emission beams with different angles.

[0247] In some containers with larger sizes or containers having multiple feed ports / discharge ports, more than two material measurement devices may be provided, and the more than two material measurement devices are respectively arranged above the openings at different positions of the container. Figure 18 Two material measurement devices are shown in

[0248] The more than two material measurement devices are used to measure the material on a cross-section. That is to say, the microwave beams of the more than two material measurement devices form a measurement section plane, and each of them occupies at least a part of the measurement section plane. In this way, a complete profile information of the material can be obtained.

[0249] For example, when it is necessary to measure the three-dimensional shape of the material, the more than two material measurement devices can form intersecting measurement section planes. For example, in the case of two material measurement devices, they can be set to intersect at 90°, and in the case of four, the angle between adjacent measurement section planes is 45°. The angles between adjacent measurement section planes can be equal.

[0250] As described above, multiple microstrip antennas of a material measurement device are located in or near a reference plane, and a reference plane is parallel to and / or passes through the axis of the microwave lens. The multiple microstrip antennas located in or near a reference plane are arranged in a straight line or a curved shape or close to a straight line or a curved shape. In the present disclosure, preferably, a reference plane passes through or is located near the projection point of the feed port on the material.

[0251] As described above, multiple microstrip antennas of a material measurement device are located in or near more than two reference planes, and the more than two reference planes are respectively parallel to and / or pass through the axis of the microwave lens. The multiple microstrip antennas respectively located in or near each of the more than two reference planes are respectively arranged in a straight line or a curved shape or close to a straight line or a curved shape. In the present disclosure, preferably, the more than two reference planes pass through or are located near the projection point of the feed port on the material.

[0252] The multiple microstrip antennas are circularly polarized microstrip antennas, and the polarization directions of the transmitting antenna and the receiving antenna are opposite. In this way, when the microwave transmitting beam of the transmitting antenna is reflected by the wall of the container and then the microwave reflected beam reflected by the material again will not be received by the receiving antenna.

[0253] The material measurement system may further include a processing unit, a central control unit, a power supply unit, a communication unit, and a display unit included in the material measurement system described in the second embodiment above, and at least one of the material shape, volume, mass, and average height is obtained at least according to the material information measured by the material measurement device.

[0254] According to a fourth embodiment of the present disclosure, a material measurement system is provided for measuring the vortices of liquid or solid materials, including a container for containing liquid or solid materials, a stirrer for stirring the liquid or solid materials, and the material measurement device as described above. The material measurement device is installed above an opening formed in the container, and the material measurement device measures the vortices from multiple angles through microwave emission beams with different angles.

[0255] As described in the third embodiment, in this embodiment, the number of material measurement devices can be two or more, and two or more material measurement devices are respectively arranged above the openings at different positions of the container. Two or more material measurement devices are used to measure the vortices on one cross-section or measure the vortices on multiple cross-sections.

[0256] A plurality of microstrip antennas are located in or near a reference plane. A reference plane is parallel to and / or passes through the axis of the microwave lens. The plurality of microstrip antennas located in or near a reference plane are arranged in a straight line or a curved shape or close to a straight line or a curved shape. A reference plane passes through or is near the stirring shaft of the stirrer.

[0257] A plurality of microstrip antennas are located in or near two or more reference planes. Two or more reference planes are respectively parallel to and / or pass through the axis of the microwave lens. The plurality of microstrip antennas located in or near each of the two or more reference planes are respectively arranged in a straight line or a curved shape or close to a straight line or a curved shape. Among them, two or more reference planes pass through or are near the stirring shaft of the stirrer.

[0258] Based on the distance measured by the first microwave emission beam perpendicular to the angle of the vortex in the converged microwave emission beam, calculate the distance that the second microwave emission beam vertically emitted downward in the converged microwave emission beam should measure.

[0259] Set the angle between the first microwave emission beam and the second microwave emission beam as θ, the distance measured by the first microwave emission beam as D1, and the distance that the second microwave emission beam should measure as D2, then D2 = D1 / cosθ.

[0260] In the case where the energy of the first microwave emission beam is greater than the energy of the microwave emission beams on the adjacent sides, the first microwave emission beam is determined to be perpendicular to the angle of the vortex.

[0261] Figure 19 The schematic diagram of the reflected beam energy at the contact positions of each emission beam with the liquid surface is shown. It can be seen that in the case where the stirrer stirs to form a vortex, the beam d vertically emitted downward has a relatively weak reflected signal during stirring, and it will further weaken as the stirring intensity increases.

[0262] If there is a signal in each reflected beam, the distance of each measurement point can be calculated based on the signal, and then the shape of the vortex can be obtained according to the distances of the measurement points at various angles.

[0263] However, in the case of liquid materials, as the stirring becomes intense or there is internal diffused steam, the transmitted signal will be greatly reduced, and even only one or two transmitted beams perpendicular or nearly perpendicular to the liquid surface will have reflected signals. Therefore, it is very difficult to measure the vortex by conventional distance calculation methods. Similarly, in the case of measuring solid materials, no reflected signal can be measured when there is a large amount of dust.

[0264] The traditional multi-beams can reach at most 3 - 4, and generally cannot be linearly distributed, making it difficult to ensure that exactly one beam will be relatively close to perpendicular to the material surface.

[0265] To solve this situation, the multi-beam measurement device according to the present disclosure can form more beams, for example, it can form more than 10 beams, etc. As an example, the angles of the formed beams with respect to the vertical direction can be -50 degrees, -40 degrees, -30 degrees, -20 degrees, -10 degrees, 0 degrees, 10 degrees, 20 degrees, 30 degrees, 40 degrees, 50 degrees.

[0266] Because there are more beams, the shape of the vortex can be measured as shown in Figure 20 the following.

[0267] First, find the maximum value point of the change in the reflected signal, that is, the beam energy is greater than the beam energies on both sides. For example, if the energy of beam b is greater than that of beam a and at the same time greater than that of beam c, then it is considered that the angle of beam b is close to perpendicular to the vortex surface. According to the return time of the reflected beam (the method of calculating time can be the method of pulsed radar or the method of frequency-modulated continuous-wave radar), calculate the distance D1 of the echo of beam b. Since the angle of beam b is close to perpendicular to the vortex surface, the angle of beam b is the angle of the vortex. Thus, the angle of the vortex is ∠b, and according to ∠b, D1, and the axisymmetry of the vortex, the shape of the vortex can be obtained. The distance D2 from the transceiver antenna unit that vertically or nearly vertically emits downward to the vortex is D2 = D1 / cos(∠b). In this way, the distance value related to the beam with the weakest reflected signal will be calculated.

[0268] When the radius of the silo is known as R and the distance between the installation position of the material measurement device and the central axis is k, the average liquid level and the shape of the material can be calculated.

[0269] The above is described by taking liquid as an example. In the case of solid materials, the method is the same and will not be elaborated here.

[0270] The material measurement system may further include a processing unit, a central control unit, a power supply unit, a communication unit, and a display unit included in the material measurement system described in the second embodiment above, and obtain at least one of the material shape, volume, mass, and average height at least according to the material information measured by the material measurement device.

[0271] According to a fifth embodiment of the present disclosure, there is provided a material measurement system for measuring a material, including: a container for containing the material; and the material measurement device as described above, the material measurement device being installed above an opening formed in the container, and the material measurement device measuring the material from multiple angles through microwave emission beams with different angles, wherein a plurality of microstrip antennas are located in or near two or more reference planes, and the two or more reference planes are respectively parallel to and / or pass through the axis of the microwave lens, and the plurality of microstrip antennas respectively located in or near each of the two or more reference planes are respectively arranged in a straight line or a curved shape or close to a straight line or a curved shape, so that when the plurality of microstrip antennas in one reference plane are interfered by an interfering object in the material measurement system, the interference of the interfering object is excluded by measuring through the microstrip antennas in other reference planes.

[0272] In this embodiment, the number of microstrip antennas in other reference planes may be less than the number of microstrip antennas in this one reference plane.

[0273] The number of reference planes may be two, and the two reference planes are perpendicular to each other.

[0274] The interfering object is a stirring blade for stirring the liquid. The microstrip antennas in this one reference plane are used to measure the vortex formed when the liquid is stirred, while the microstrip antennas in other reference planes are used to exclude the interference of the interfering object.

[0275] Figure 21 A schematic diagram of the material measurement system is shown. As Figure 21 shown, the microstrip antennas are arranged in two straight lines / curves, and the two straight lines / curves intersect each other, for example, they can form 90°. If there are only a plurality of microstrip antennas in a single straight line / curve, the stirring blade will completely block all the microstrip antennas, which will cause the material measurement system to fail completely. Therefore, in Figure 21 a plurality of microstrip antennas (which can be arranged radially along the bin body) in another straight line / curve are provided, which intersect at an angle with the plurality of microstrip antennas in a single straight line / curve. In this way, when the plurality of microstrip antennas in a single straight line / curve are blocked, the plurality of microstrip antennas in another straight line / curve can perform supplementary measurements.

[0276] Preferably, in the present disclosure, the number of multiple microstrip antennas forming another straight line / curve may be less than the number of multiple microstrip antennas forming a straight line / curve.

[0277] The material measurement system may further include a processing unit, a central control unit, a power supply unit, a communication unit, and a display unit included in the material measurement system described in the second embodiment above, and obtain at least one of the material shape, volume, mass, and average height at least according to the material information measured by the material measurement device.

[0278] According to the sixth embodiment of the present disclosure, as Figure 22 shown, there is also provided a material measurement system for measuring materials conveyed by a conveyor belt, including: a conveyor belt for conveying materials along a conveying direction; and the material measurement device as described above, the material measurement device is arranged above the conveyor belt, and the material measurement device measures the materials from multiple angles through microwave emission beams with different angles. In addition, the presence or absence of materials on the conveyor belt and the conveying amount of materials can also be measured.

[0279] Multiple microstrip antennas are located in or near a reference plane, a reference plane is perpendicular or nearly perpendicular to the conveying direction, multiple microstrip antennas located in or near a reference plane are arranged in a straight line or curve shape or nearly in a straight line or curve shape, and the multiple microstrip antennas are used to measure the cross-sectional area of the material.

[0280] The conveying speed of the material is measured through the Doppler effect of the microstrip antenna, so as to obtain the volume flow rate of the material according to the cross-sectional area and the conveying speed of the material.

[0281] Multiple microstrip antennas are at least respectively located on a first reference plane and a second reference plane, the first reference plane and the second reference plane are parallel or nearly parallel, and are perpendicular to the conveying direction. The conveying speed of the material is obtained through the cross-sectional areas of the material measured by the multiple microstrip antennas on the first reference plane and the multiple microstrip antennas on the second reference plane, and the volume flow rate of the material is obtained according to the cross-sectional area and the conveying speed of the material.

[0282] Multiple microstrip antennas are at least respectively located on a first reference plane and a second reference plane, the first reference plane and the second reference plane are perpendicular or nearly perpendicular, and the first reference plane is perpendicular to the conveying direction. The volume flow rate of the material is obtained through the cross-sectional area of the material measured by the multiple microstrip antennas on the first reference plane and the conveying speed of the material measured by the multiple microstrip antennas on the second reference plane.

[0283] When it is necessary to measure the volume flow rate or mass flow rate of the material conveyed by the conveyor belt, it can be obtained according to the known cross-sectional shape and conveying speed of the conveyed material.

[0284] Therefore, two methods as shown in Figure 23 can be adopted for measurement.

[0285] In the left figure of Figure 23 , measurement is carried out through two vertically distributed transmitting and receiving antenna units.

[0286] As shown in the left figure of Figure 23 , the first measurement point is the measurement point where multiple transmitting and receiving antenna units forming a first straight line (which can be perpendicular to the conveying direction) measure the material. The cross-sectional shape of the material conveyed by the conveyor belt is measured by the multiple transmitting and receiving antenna units on the first straight line.

[0287] As shown in the left figure of Figure 23 , the second measurement point is the measurement point where multiple transmitting and receiving antenna units forming a second straight line (which can be parallel to the conveying direction) measure the material. The conveying speed of the material conveyed by the conveyor belt is measured by the multiple transmitting and receiving antenna units on the second straight line. The multiple transmitting and receiving antenna units on the second straight line obtain the conveying speed according to the change of the material form. For example, the conveying speed can be calculated through the time relationship of the height change of each measurement point and the distance value of each measurement point. Based on the microwave beam, the shape of the material can be confirmed, so the position of the material at time T1 and the position of the material at time T2 can be confirmed. If the difference between the positions of the two measurement points is D, then the material speed is D / (T2 - T1).

[0288] The cross-sectional area S of the conveyor belt material can be obtained through the scanning plane of the first straight line, then the volume flow rate of the material is equal to S*D / (T2 - T1). When the density of the material is known, the mass flow rate of the material can be obtained.

[0289] In the right figure of Figure 23 , measurement is carried out through two parallelly distributed transmitting and receiving antenna units.

[0290] As shown in the right figure of Figure 23 , the first measurement point is the measurement point where multiple transmitting and receiving antenna units forming a first straight line (which can be perpendicular to the conveying direction) measure the material. The cross-sectional shape of the material conveyed by the conveyor belt is measured by the multiple transmitting and receiving antenna units on the first straight line.

[0291] As shown in the right figure of Figure 23 , the second measurement point is the measurement point where multiple transmitting and receiving antenna units forming a second straight line (which can be perpendicular to the conveying direction) measure the material. The cross-sectional shape of the material conveyed by the conveyor belt is measured by the multiple transmitting and receiving antenna units on the second straight line.

[0292] By measuring the shape at the first measurement point and the shape at the second measurement point, for example, through shape comparison, it is possible to confirm the position of the material at time T1 and the position of the material at time T2. If the difference in the positions of the two measurement points is D, then the material velocity is D / (T2 - T1).

[0293] By knowing the cross-sectional area S of the material on the conveyor belt, the volumetric flow rate of the material is equal to S*D / (T2 - T1). When the density of the material is known, the mass flow rate can be obtained.

[0294] The material measurement system may further include a processing unit, a central control unit, a power supply unit, a communication unit, and a display unit included in the material measurement system described in the second embodiment above, and obtain at least one of the material shape, volume, mass, and average height based at least on the material information measured by the material measurement device.

[0295] In summary, according to the embodiments of the present disclosure, the material can be measured more accurately, and the gain will not be reduced when the number of antennas is increased. Moreover, according to the material measurement device of the present disclosure, the volume can be small and the cost can be low.

[0296] The present disclosure can effectively utilize a small installation opening to implement multiple high-gain antennas. The increase in the number of antennas is not limited by the opening. At the same time, the energy obtained by each antenna will not be reduced. Moreover, the cost of a single antenna is low, which can greatly increase the number of measurement points. In this way, the 3D shape of the material inside the storage tank can be measured more accurately, and thus the volume of the material can be measured more accurately.

[0297] In the description of this specification, the description with reference to terms such as "one embodiment / way", "some embodiments / ways", "example", "specific example", or "some examples" means that the specific features, structures, materials, or characteristics described in connection with the embodiment / way or example are included in at least one embodiment / way or example of the present application. In this specification, the schematic expressions of the above terms do not necessarily refer to the same embodiment / way or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in a suitable manner in any one or more embodiments / ways or examples. In addition, without contradiction, those skilled in the art can combine and combine the different embodiments / ways or examples described in this specification and the features of different embodiments / ways or examples.

[0298] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include at least one such feature. In the description of this application, "a plurality of" means at least two, such as two, three, etc., unless otherwise specifically defined.

[0299] Those skilled in the art should understand that the above-described embodiments are merely for clearly illustrating the present disclosure and are not intended to limit the scope of the present disclosure. For those skilled in the art, other changes or modifications can be made based on the above disclosure, and these changes or modifications are still within the scope of the present disclosure.

Claims

1. A material measurement device, characterized in that, Comprising: Multiple microstrip antennas form multiple transceiver antenna units. Each transceiver antenna unit includes a transmitting antenna and a receiving antenna. The transmitting antenna is used to generate a microwave transmitting beam, and the receiving antenna is used to receive the microwave reflected beam generated after the microwave transmitting beam is reflected. The material is measured by the microwave transmitting beam and the microwave reflected beam; A microwave lens. The multiple microstrip antennas are located on one side of the microwave lens. On the other side of the microwave lens, the microwave lens converges the microwave transmitting beams emitted by each transmitting antenna. The angles of the converged microwave transmitting beams are different, and the microwave lens converges the microwave reflected beam so that the receiving antenna can receive the converged microwave reflected beam; And A microwave transceiver processing module. The microwave transceiver processing module includes a transmitting path and a receiving path. The transmitting path is used to provide a transmitting signal to the transmitting antenna in the multiple transceiver antenna units, and the receiving path is used to receive the receiving signal from the receiving antenna in the multiple transceiver antenna units. The transmitting path and the receiving path are arranged on different sides of the microwave transceiver processing module. The microwave transceiver processing module and the transmitting antenna and the receiving antenna are located on the same side of the printed circuit board. The microwave transceiver processing module provides a transmitting signal to the transmitting antenna through the transmitting path, and the microwave transceiver processing module receives the receiving signal from the receiving antenna through the receiving path.

2. The material measuring device according to claim 1, characterized in that, One transmitting antenna and one receiving antenna form a transceiver antenna unit. One transmitting antenna and one receiving antenna in one transceiver antenna unit share one microstrip antenna or are two microstrip antennas close to each other.

3. The material measuring device according to claim 1, wherein, The multiple microstrip antennas are arranged on the focal plane of the microwave lens.

4. The material measuring device according to claim 3, wherein, The multiple microstrip antennas are arranged on one printed circuit board or on multiple printed circuit boards.

5. The material measuring device according to claim 4, wherein The multiple microstrip antennas are arranged on one printed circuit board, and the angles of the multiple microstrip antennas are different, or The multiple microstrip antennas are arranged on multiple printed circuit boards, and the angles of the multiple printed circuit boards are different so that the angles of the multiple microstrip antennas are different.

6. The material measuring device according to claim 5, wherein The printed circuit board is perpendicular or nearly perpendicular to the microwave transmitting beam emitted by the microstrip antenna arranged on the printed circuit board.

7. The material measuring device according to any one of claims 4 to 6, characterized in that, A processing circuit is arranged on the printed circuit board. The processing circuit obtains the time difference between the transmitting time of the microwave transmitting beam emitted by the transmitting antenna and the receiving time of the microwave reflected beam received by the receiving antenna based on the time-of-flight principle, so as to obtain the information of the material measurement point.

8. The material measuring device according to claim 7, characterized in that The frequency of the microwave transmitting beam emitted by the transmitting antenna is a continuously adjustable frequency.

9. The material measuring device according to claim 8, wherein, The processing circuit obtains the frequency difference between the two by comparing the frequency of the microwave transmitting beam emitted by the transmitting antenna at a certain moment with the frequency of the microwave reflected beam received by the receiving antenna, so as to obtain the information of the material measurement point.

10. The material measuring device according to any one of claims 4 to 6, characterized in that, The printed circuit board can be rotated or moved to change the emission angle or emission position of the microwave emission beam emitted by the microstrip antenna of the printed circuit board.

11. The material measuring device according to claim 10, characterized in that, Wherein the rotation or movement of the printed circuit board is periodic.

12. The material measuring device according to claim 10, wherein, A scanning surface for measuring the profile of the material is formed by the rotation or movement of the printed circuit board.

13. The material measuring device according to claim 1, characterized in that, The microwave lens is a single microwave lens or a combined microwave lens formed by multiple lenses, and the single microwave lens or the combined microwave lens is used to converge the microwave emission beam and the microwave reflection beam.

14. The material measuring device according to claim 1, wherein, The multiple transceiver antenna units are independent of each other, and each transceiver antenna unit includes a respective transmitting antenna and a receiving antenna.

15. The material measuring device according to claim 1, characterized in that One or more of the multiple transmitting antennas are combined with one or more of the multiple receiving antennas to form the multiple transceiver antenna units.

16. The material measuring device according to claim 1, wherein, It further includes a purging unit, which is arranged on the other side of the microwave lens and is used to keep the other side of the microwave lens clean.

17. The material measuring device according to claim 1, wherein, It further includes an angle measurement unit, which is used to measure the tilt angle of the material measuring device so as to obtain the actual angle of the microwave emission beam and / or the microwave reflection beam based on the measured tilt angle.

18. The material measuring device according to claim 1, wherein The multiple microstrip antennas are located in or near a reference plane, the reference plane is parallel to and / or passes through the axis of the microwave lens, and the multiple microstrip antennas located in or near the reference plane are arranged in a straight line or a curved shape or close to a straight line or a curved shape; Or The multiple microstrip antennas are located in or near more than two reference planes, the more than two reference planes are respectively parallel to and / or pass through the axis of the microwave lens, and the multiple microstrip antennas located in or near each of the more than two reference planes are respectively arranged in a straight line or a curved shape or close to a straight line or a curved shape.

19. The material measuring device according to claim 18, wherein When the multiple microstrip antennas are located in or near a reference plane, the reference plane is parallel to and passes through the axis of the microwave lens, and a transceiver antenna unit is arranged on or near the axis. When the multiple microstrip antennas are located in or near more than two reference planes, the more than two reference planes are respectively parallel to and pass through the axis of the microwave lens, and a transceiver antenna unit is arranged on or near the axis.

20. The material measuring device according to claim 19, characterized in that, When the multiple microstrip antennas are located in or near more than two reference planes, the angles between adjacent reference planes are equal.

21. The material measuring device according to claim 18, wherein, When the multiple microstrip antennas are located in or near more than two reference planes, the number of microstrip antennas located in or near each reference plane is the same or different.

22. The material measuring device according to any one of claims 19 to 21, wherein When the multiple microstrip antennas are located in or near a reference plane, microwave emission beams at different angles converged by the microwave lens are located in or near a plane, thereby forming a beam scanning plane for measuring materials on a cross-section; When the multiple microstrip antennas are located in or near two or more reference planes, the microwave emission beams of the microstrip antennas located in or near each reference plane are converged by the microwave lens into microwave emission beams at different angles respectively located in a plane, thereby forming multiple beam scanning planes for measuring materials on multiple cross-sections.

23. The material measuring device according to claim 1, wherein, It further includes a housing, and the housing and the microwave lens form a closed space for accommodating the microstrip antennas.

24. The material measuring device according to claim 1, wherein, At least one of the multiple microwave emission beams emitted by the multiple transmitting antennas serves as a vertical microwave emission beam, and the vertical microwave emission beam is parallel to the axis of the microwave lens or passes through the axis of the microwave lens.

25. The material measuring device according to claim 24, wherein When measuring materials with an inclined surface shape, based on one or more non-vertical microwave emission beams other than the vertical microwave emission beam, the material information to be measured by the vertical microwave emission beam is determined.

26. The material measuring device according to claim 25, characterized in that, Based on the angle difference between the non-vertical microwave emission beam and the vertical microwave emission beam, the material information to be measured by the vertical microwave emission beam is determined.

27. The material measuring device according to claim 1, wherein The angle differences between the multiple microwave emission beams emitted by the multiple transmitting antennas are equal or unequal, and are 0.5 to 1.5 times the beam opening angle of the microwave emission beam.

28. The material measuring device according to claim 1, characterized in that, It further includes a storage unit for storing the information of the multiple microwave reflection beams.

29. The material measuring device according to claim 1, characterized in that, Based on the time-of-flight principle, the time difference between the emission time of the microwave emission beam by the transmitting antenna and the reception time of the microwave reflection beam by the receiving antenna is obtained, so as to obtain the information of the material measurement point.

30. The material measuring device according to claim 29, wherein, It further includes an operation unit, and the operation unit obtains the information of the material measurement point according to the time difference.

31. The material measuring device according to claim 1, characterized in that, The frequency of the microwave emission beam emitted by the transmitting antenna is a continuously adjusted frequency. By comparing the frequency of the microwave emission beam emitted by the transmitting antenna at a certain moment with the frequency of the microwave reflection beam received by the receiving antenna, the frequency difference between the two is obtained, so as to obtain the information of the material measurement point.

32. The material measurement device according to claim 31, wherein It further includes an operation unit, and the operation unit obtains the information of the material measurement point according to the frequency difference.

33. The material measuring device according to claim 1, characterized in that, It further includes a display unit, and the display unit updates the displayed material information in real time according to the information of each microwave reflection beam.

34. The material measuring device according to claim 1, characterized in that, The number of the microwave emission beams is at least 3.

35. The material measurement device according to claim 1, wherein, The multiple transceiver antenna units repeatedly emit microwave emission beams and receive microwave reflection beams to perform real-time measurement on the material measurement point.

36. A material measuring device, characterized in that, Includes: One or more microstrip antennas form one or more transceiver antenna units. The transceiver antenna units include a transmitting antenna and a receiving antenna. The transmitting antenna is used to generate a microwave transmitting beam, and the receiving antenna is used to receive a microwave reflected beam generated after the microwave transmitting beam is reflected. The material is measured by the microwave transmitting beam and the microwave reflected beam. Among them, the one or more microstrip antennas are movable microstrip antennas, and the material is measured by moving the microstrip antennas. A microwave lens. The microstrip antenna is located on one side of the microwave lens. On the other side of the microwave lens, the microwave lens converges the microwave transmitting beams emitted by each transmitting antenna. The angles of the converged microwave transmitting beams are different, and the microwave lens converges the microwave reflected beam so that the receiving antenna can receive the converged microwave reflected beam. And A microwave transceiver processing module. The microwave transceiver processing module includes a transmitting path and a receiving path. The transmitting path is used to provide a transmitting signal to the transmitting antenna in the plurality of transceiver antenna units, and the receiving path is used to receive the receiving signal from the receiving antenna in the plurality of transceiver antenna units. The transmitting path and the receiving path are arranged on different sides of the microwave transceiver processing module. The microwave transceiver processing module and the transmitting antenna and the receiving antenna are located on the same side of the printed circuit board. The microwave transceiver processing module provides a transmitting signal to the transmitting antenna through the transmitting path, and the microwave transceiver processing module receives the receiving signal from the receiving antenna through the receiving path.

37. The material measuring device according to claim 36, wherein, One transmitting antenna and one receiving antenna form a transceiver antenna unit. One transmitting antenna and one receiving antenna in one transceiver antenna unit share one microstrip antenna or are two microstrip antennas close to each other.

38. The material measuring device according to claim 36, wherein The microstrip antenna is arranged on the focal plane of the microwave lens.

39. The material measuring device according to claim 38, characterized in that, The microstrip antenna moves along the focal plane.

40. The material measuring device according to claim 38, wherein, The microstrip antenna is arranged on one printed circuit board or on multiple printed circuit boards, and the printed circuit board is movable.

41. The material measuring device according to claim 40, wherein The microstrip antenna is arranged on one printed circuit board, and the angles of the microstrip antennas are different, or The microstrip antenna is arranged on multiple printed circuit boards, and the angles of the multiple printed circuit boards are different so that the angles of the microstrip antennas are different.

42. The material measuring device according to claim 41, wherein The printed circuit board is perpendicular or nearly perpendicular to the microwave transmitting beam emitted by the microstrip antenna arranged on the printed circuit board.

43. The material measuring device according to any one of claims 40 to 42, characterized in that, A processing circuit is arranged on the printed circuit board. The processing circuit obtains the time difference between the transmitting time of the microwave transmitting beam emitted by the transmitting antenna and the receiving time of the microwave reflected beam received by the receiving antenna based on the time-of-flight principle, so as to obtain the information of the material measurement point.

44. The material measuring device according to claim 43, wherein, The frequency of the microwave transmitting beam emitted by the transmitting antenna is a continuously adjusted frequency.

45. The material measuring device according to claim 44, characterized in that, The processing circuit obtains the frequency difference between the microwave emission beam emitted by the emission antenna at a certain moment and the microwave reflection beam received by the reception antenna, so as to obtain the information of the material measurement point.

46. The material measuring device according to any one of claims 40 to 42, characterized in that, The printed circuit board can be rotated or moved so as to change the emission angle or emission position of the microwave emission beam emitted by the microstrip antenna of the printed circuit board.

47. The material measuring device according to claim 46, characterized in that, The rotation or movement of the printed circuit board is periodic.

48. The material measuring device according to claim 46, wherein, The rotation or movement of the printed circuit board is used to form a scanning plane for measuring the cross-section of the material.

49. The material measuring device according to claim 36, characterized in that, The microwave lens is a single microwave lens or a combined microwave lens formed by multiple lenses, and the single microwave lens or the combined microwave lens is used to converge the microwave emission beam and the microwave reflection beam.

50. The material measuring device according to claim 36, wherein, The emission antenna and the reception antenna are independent microstrip antennas from each other.

51. The material measuring device according to claim 36, wherein, One emission antenna or multiple emission antennas among the multiple emission antennas are combined with one reception antenna or multiple reception antennas among the multiple reception antennas to form the multiple transceiver antenna units.

52. The material measuring device according to claim 36, characterized in that, It further includes a purging part, and the purging part is arranged on the other side of the microwave lens and is used to keep the other side of the microwave lens clean.

53. The material measuring device according to claim 36, wherein It further includes an angle measurement part, and the angle measurement part is used to measure the inclination angle of the material measurement device, so as to obtain the actual angle of the microwave emission beam and / or the microwave reflection beam based on the measured inclination angle.

54. The material measurement device according to claim 36, wherein the microstrip antenna moves in or near a reference plane, and the reference plane is parallel to and / or passes through the axis of the microwave lens; or the microstrip antenna moves in or near more than two reference planes, and the more than two reference planes are respectively parallel to and / or pass through the axis of the microwave lens.

55. The material measurement device according to claim 54, wherein when the microstrip antenna moves in or near a reference plane, the reference plane is parallel to and passes through the axis of the microwave lens, and the microstrip antenna performs measurement at least on or near the axis; when the microstrip antenna moves in or near more than two reference planes, the more than two reference planes are respectively parallel to and pass through the axis of the microwave lens, and the microstrip antenna performs measurement at least on or near the axis.

56. The material measuring device according to claim 55, characterized in that, When the microstrip antenna moves in or near more than two reference planes, the angle between adjacent reference planes is equal.

57. The material measuring device according to claim 55, characterized in that, When the microstrip antenna moves in or near more than two reference planes, the moving spacings of the microstrip antenna are different.

58. The material measurement device according to any one of claims 55 to 57, wherein when the microstrip antenna moves in or near a reference plane, the microwave emission beams with different angles converged by the microwave lens are located in or near a plane, so as to form a beam scanning plane for measuring the material on a section; When the microstrip antenna moves in or near two or more reference planes, the microwave emission beams of the microstrip antenna located in or near each reference plane are converged by the microwave lens into microwave emission beams at different angles in a plane respectively, so as to form a plurality of beam scanning planes for measuring materials in a plurality of cross-sections.

59. The material measuring device according to claim 36, characterized in that, It further includes a housing, and the housing and the microwave lens form a closed space for accommodating the microstrip antenna.

60. The material measuring device according to claim 36, wherein, The transmitting antenna emits at least a vertical microwave emission beam, and the vertical microwave emission beam is parallel to the axis of the microwave lens or passes through the axis of the microwave lens.

61. The material measuring device according to claim 60, wherein, When measuring materials with an inclined surface shape, other one or more non-vertical microwave emission beams other than the vertical microwave emission beam are used to determine the material information that needs to be measured by the vertical microwave emission beam.

62. The material measuring device according to claim 61, characterized in that, Based on the angle difference between the non-vertical microwave emission beam and the vertical microwave emission beam, the material information that needs to be measured by the vertical microwave emission beam is determined.

63. The material measuring device according to claim 36, wherein, The angle difference between the multiple microwave emission beams emitted by the transmitting antenna during the movement is equal or unequal, and is 0.5 to 1.5 times the beam opening angle of the microwave emission beam.

64. The material measuring device according to claim 36, characterized in that, It further includes a storage unit for storing the information of the multiple microwave reflection beams.

65. The material measuring device according to claim 36, wherein, Based on the time-of-flight principle, the time difference between the emission time of the microwave emission beam emitted by the transmitting antenna and the reception time of the microwave reflection beam received by the receiving antenna is obtained, so as to obtain the information of the material measurement point.

66. The material measuring device according to claim 65, wherein, It further includes an operation unit, and the operation unit obtains the information of the material measurement point according to the time difference.

67. The material measuring device according to claim 36, wherein, The frequency of the microwave emission beam emitted by the transmitting antenna is a continuously adjusted frequency, and the frequency difference between the two is obtained by comparing the frequency of the microwave emission beam emitted by the transmitting antenna at a certain moment with the frequency of the microwave reflection beam received by the receiving antenna, so as to obtain the information of the material measurement point.

68. The material measuring device according to claim 67, characterized in that, It further includes an operation unit, and the operation unit obtains the information of the material measurement point according to the frequency difference.

69. The material measuring device according to claim 36, characterized in that, It further includes a display unit, and the display unit updates the information of the displayed material in real time according to the information of each microwave reflection beam.

70. The material measuring device according to claim 36, wherein, The transceiver antenna unit repeatedly emits microwave emission beams and receives microwave reflection beams to perform real-time measurement of the material measurement point.

71. A material measurement system for measuring solid materials or liquid materials, characterized in that, It includes: A container for accommodating the solid material or liquid material, and the container is provided with a feed inlet for the material to enter and a discharge outlet for the material to be discharged; And The material measurement device according to any one of claims 1 to 70, the material measurement device is installed above the opening formed on the container, and the material measurement device measures the material from multiple angles through microwave emission beams with different angles.

72. The material measurement system according to claim 71, characterized in that, The number of the material measurement devices is two or more, and the two or more material measurement devices are respectively arranged above the openings at different positions of the container.

73. The material measurement system according to claim 72, characterized in that, The two or more material measurement devices are used to measure the materials in one cross-section or measure the materials in multiple cross-sections.

74. The material measurement system according to claim 71, wherein The microstrip antenna is located in or near a reference plane that is parallel to and / or passes through the axis of the microwave lens. The microstrip antenna located in or near the reference plane is arranged in a straight or curved shape or a shape approximating a straight or curved shape. Wherein, the reference plane passes through or is near the projection point of the feed port on the material.

75. The material measurement system according to claim 71, wherein The microstrip antenna is located in or near two or more reference planes that are respectively parallel to and / or pass through the axis of the microwave lens. The microstrip antennas located in or near each of the two or more reference planes are respectively arranged in a straight or curved shape or a shape approximating a straight or curved shape. Wherein, the two or more reference planes pass through or are near the projection point of the feed port on the material.

76. The material measurement system according to any one of claims 71 to 75, characterized in that, The microstrip antenna is a circularly polarized microstrip antenna, and the polarization directions of the transmitting antenna and the receiving antenna are opposite, so that the microwave reflection beam reflected by the material after the microwave emission beam of the transmitting antenna is reflected by the wall of the accommodating body is not received by the receiving antenna.

77. The material measurement system according to any one of claims 71 to 75, characterized in that, It further includes a processing unit that obtains at least one of the shape, volume, mass, and average height of the material based at least on the material information measured by the material measuring device.

78. A material measurement system for measuring the vortices of liquid or solid materials, characterized in that, Comprising: An accommodating body for accommodating the liquid or solid material; A stirrer for stirring the liquid or solid material; And The material measuring device according to any one of claims 1 to 70, wherein the material measuring device is installed above an opening formed in the accommodating body, and the material measuring device measures the vortex from multiple angles through microwave emission beams with different angles.

79. The material measurement system according to claim 78, characterized in that, The number of the material measuring devices is two or more, and the two or more material measuring devices are respectively arranged above the openings at different positions of the accommodating body.

80. The material measurement system according to claim 79, characterized in that, The two or more material measuring devices are used to measure the vortex on one cross-section or measure the vortices on multiple cross-sections.

81. The material measurement system according to claim 78, wherein The microstrip antenna is located in or near a reference plane that is parallel to and / or passes through the axis of the microwave lens. The microstrip antenna located in or near the reference plane is arranged in a straight or curved shape or a shape approximating a straight or curved shape. Wherein, the reference plane passes through or is near the stirring shaft of the stirrer.

82. The material measurement system according to claim 78, wherein The microstrip antenna is located in or near two or more reference planes that are respectively parallel to and / or pass through the axis of the microwave lens. The microstrip antennas located in or near each of the two or more reference planes are respectively arranged in a straight or curved shape or a shape approximating a straight or curved shape. Wherein, the two or more reference planes pass through or are near the stirring shaft of the stirrer.

83. The material measurement system according to any one of claims 78 to 82, characterized in that, Based on the distance measured by the first microwave emission beam perpendicular to the angle of the vortex in the converged microwave emission beam, calculate the distance that the second microwave emission beam vertically emitted downward in the converged microwave emission beam should measure.

84. The material measurement system according to claim 83, characterized in that, Set the angle between the first microwave emission beam and the second microwave emission beam as θ, the distance measured by the first microwave emission beam as D1, and the distance that the second microwave emission beam should measure as D2, then D2 = D1 / cosθ.

85. The material measurement system according to claim 83, characterized in that, In the case where the energy of the first microwave emission beam is greater than the energy of the microwave emission beams on the adjacent two sides, the first microwave emission beam is recognized as perpendicular to the angle of the vortex.

86. The material measurement system according to claim 83, wherein The number of the microstrip antennas is more than 10.

87. The material measurement system according to any one of claims 78 to 82, characterized in that, It further includes a processing unit, and the processing unit obtains at least one of the material shape, volume, mass, and average height based on at least the material information measured by the material measuring device.

88. A material measurement system for measuring materials, characterized in that, Comprising: A container for containing the material; And The material measuring device according to any one of claims 1 to 70, the material measuring device is installed above the opening formed on the container, and the material measuring device measures the material from multiple angles through microwave emission beams with different angles. Wherein, the microstrip antennas are located in or near two or more reference planes, the two or more reference planes are respectively parallel to the axis of the microwave lens and / or pass through the axis, and the microstrip antennas located in or near each of the two or more reference planes are respectively arranged in a straight line or a curved shape or close to a straight line or a curved shape, so that when the microstrip antennas in one reference plane are interfered by interfering objects in the material measurement system, the interfering objects are excluded by measuring through the microstrip antennas in other reference planes.

89. The material measurement system according to claim 88, characterized in that, The number of the microstrip antennas in other reference planes is less than the number of the microstrip antennas in this one reference plane.

90. The material measurement system according to claim 89, wherein The number of the reference planes is two, and the two reference planes are perpendicular to each other.

91. The material measurement system according to any one of claims 88 to 90, characterized in that, The interfering object is the stirring blade for stirring the liquid. The microstrip antennas in this one reference plane are used to measure the vortex formed when the liquid is stirred, while the microstrip antennas in other reference planes are used to exclude the interference of the interfering objects.

92. A material measurement system for measuring materials conveyed by a conveyor belt, characterized in that, Comprising: A conveyor belt for conveying the material along the conveying direction; The material measuring device according to any one of claims 1 to 70, the material measuring device is arranged above the conveyor belt, and the material measuring device measures the material from multiple angles through microwave emission beams with different angles.

93. The material measurement system according to claim 92, wherein, The microstrip antennas are located in or near one reference plane, the one reference plane is perpendicular or nearly perpendicular to the conveying direction, the microstrip antennas located in or near the one reference plane are arranged in a straight line or a curved shape or close to a straight line or a curved shape, and the microstrip antennas are used to measure the cross-sectional area of the material.

94. The material measurement system according to claim 93, characterized in that, Measure the conveying speed of the material through the Doppler effect of the microstrip antennas, so as to obtain the volume flow rate of the material according to the cross-sectional area and the conveying speed of the material.

95. The material measurement system according to claim 92, characterized in that, The microstrip antennas are at least respectively located on a first reference plane and a second reference plane. The first reference plane and the second reference plane are parallel or nearly parallel and perpendicular to the conveying direction. The conveying speed of the material is obtained by the cross-sectional areas of the material measured by the microstrip antennas on the first reference plane and the second reference plane respectively, and the volumetric flow rate of the material is obtained according to the cross-sectional area and the conveying speed of the material.

96. The material measurement system according to claim 92, wherein, The microstrip antennas are at least respectively located on a first reference plane and a second reference plane. The first reference plane and the second reference plane are perpendicular or nearly perpendicular, and the first reference plane is perpendicular to the conveying direction. The volumetric flow rate of the material is obtained by the cross-sectional area of the material measured by the microstrip antenna on the first reference plane and the conveying speed of the material measured by the microstrip antenna on the second reference plane.

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