A multi-temperature test bench for optical / electrical modules

Abstract

The present invention discloses a multi-temperature test bench for optical / electrical modules, which comprises an electrical component for testing an optical / electrical module (5), the multi-temperature test bench for optical / electrical modules further comprising a test chamber component (2) and an air duct (4) connected to the test chamber component (2), the test chamber component (2) comprising a frame and a plurality of mutually separated test chambers (20) located in the frame, the frame further comprising an insertion port (210) for inserting the optical / electrical module (5) and communicating with the test chamber (20), the air duct (4) communicating with a heat flow meter and the test chamber (20). The multi-temperature test bench for optical / electrical modules of the present invention can test a plurality of optical / electrical modules using a heat flow meter, thereby greatly improving the efficiency of the test; at the same time, one optical / electrical module corresponds to one test chamber, which can greatly reduce the volume of the test chamber, so that the test chamber can quickly reach the required temperature, further improving the efficiency of the detection and reducing the waste of time.

Description

Technical Field

[0001] The invention relates to testing equipment for optical / electrical modules, in particular to a multi-temperature testing platform for optical / electrical modules. Background Art

[0002] Optical / electrical modules play a very important role in communication technology. With the development of communication technology, the demand for optical / electrical modules is increasing. The performance of optical / electrical modules directly determines the quality and reliability of communication. Currently, optical / electrical modules need to undergo temperature testing to test whether they can operate normally under high temperature, room temperature, and low temperature conditions. In the existing technology, when testing optical / electrical modules, a temperature control box is usually used to change the temperature. However, the temperature change rate of the temperature control box is slow, resulting in a long test time, which is not conducive to improving the detection rate of the optical / electrical module. In the existing technology, heat flow meters are also used for testing. Although the temperature change rate of heat flow meters is fast, the current test bench can only test one optical / electrical module at a time, and the test speed is difficult to effectively improve. In addition, the existing technology also has defects such as unstable temperature and rapid heat and cold loss. Summary of the Invention

[0003] The object of the present invention is to address the above-mentioned defects in the prior art and provide an optical / electrical module multi-temperature test bench, which can test multiple optical / electrical modules with higher testing efficiency.

[0004] To achieve the above-mentioned purpose of the invention, the present invention proposes a multi-temperature test bench for optical / electrical modules, which includes an electrical component for testing optical / electrical modules. The multi-temperature test bench for optical / electrical modules also includes a test chamber component and an air duct connected to the test chamber component. The test chamber component includes a frame and a plurality of mutually separated test chambers located in the frame. The frame is also provided with an insertion port for inserting the optical / electrical module and communicating with the test chamber. The air duct connects a heat flow meter and the test chamber.

[0005] In addition, the present invention also proposes the following subsidiary technical solutions:

[0006] The shapes and sizes of the multiple test cavities are consistent.

[0007] The air duct includes a base and a plurality of air inlets opened on the base and corresponding to the test cavities.

[0008] The air guide duct further includes two oppositely arranged air gathering blocks connected to the base, and the air gathering blocks are provided with inclined surfaces inclined toward the air inlet.

[0009] A shower assembly is provided between the air guide pipe and the frame, and the shower assembly includes an introduction cavity corresponding to the test cavity and the air inlet, and a plurality of air holes located at the bottom of the introduction cavity.

[0010] The shower assembly includes a connecting piece and a perforated plate connected to the bottom of the connecting piece. The inlet cavity is arranged on the connecting piece, and the air hole is opened on the perforated plate.

[0011] The optical / electrical module multi-temperature test bench further includes a shell, the test cavity assembly is disposed in the shell, and the shell includes a shell inner cavity isolated from the test cavity.

[0012] The frame is made of bakelite.

[0013] The housing includes a front panel, and a socket corresponding to the insertion port and an indicator light are provided on the front panel.

[0014] The electrical assembly includes a temperature sensor disposed within the test cavity.

[0015] Compared with the prior art, the advantages of the present invention are:

[0016] 1. The optical / electrical module multi-temperature test bench of the present invention is equipped with a test chamber assembly having multiple test chambers and an air duct connecting a heat flow meter and each test chamber. Each test chamber is equipped with a separate optical / electrical module, so that multiple optical / electrical modules can be tested using a single heat flow meter, greatly improving test efficiency. Furthermore, each optical / electrical module corresponds to a single test chamber, which can significantly reduce the volume of the test chamber, allowing the test chamber to quickly reach the required temperature, further improving test efficiency and reducing time waste.

[0017] 2. The shape and size of each test cavity in the optical / electrical module multi-temperature test bench of the present invention are the same, so that the temperature inside can change synchronously. Each optical / electrical module can start and end testing at the same time, reducing waiting time. It is very convenient and efficient, and the test results are more accurate, reliable, and highly consistent.

[0018] 3. In the optical / electrical module multi-temperature test bench of the present invention, the air duct is provided with multiple air inlets corresponding to the test cavities. Air concentrators are positioned opposite the air inlets. The air concentrators have inclined surfaces inclined toward the air inlets, which allow airflow to flow along the inclined surfaces into the test cavities, preventing backflow.

[0019] 4. In the optical / electrical module multi-temperature test bench of the present invention, a shower assembly is further provided between the air duct and the test cavity. The shower assembly includes an introduction cavity corresponding to the air inlet and the test cavity, and a perforated plate is provided at the bottom of the introduction cavity. After the airflow entering from the air inlet is blocked by the perforated plate, it can enter the test cavity more evenly, so that the temperature in the test cavity changes evenly, and the test effect is better. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1It is a structural schematic diagram of the optical / electrical module multi-temperature test bench of the present invention.

[0021] Figure 2 It is an exploded view of the optical / electrical module multi-temperature test bench of the present invention.

[0022] Figure 3 This is a structural schematic diagram of the optical / electrical module multi-temperature test bench of the present invention without showing the upper cover plate.

[0023] Figure 4 This is a schematic diagram of the optical / electrical module multi-temperature test bench of the present invention without showing the air duct and the shower assembly.

[0024] Figure 5 yes Figure 4 Schematic diagram of another view of the multi-temperature test bench for optical / electrical modules shown in FIG.

[0025] Figure 6 It is a structural schematic diagram of the baffle in the present invention.

[0026] Figure 7 This is a schematic structural diagram of the optical / electrical module multi-temperature test bench of the present invention without the air duct.

[0027] Figure 8 yes Figure 7 Enlarged view of part I in the middle.

[0028] Figure 9 It is a structural schematic diagram of the air duct in the present invention.

[0029] Figure 10 This is a front view of the multi-temperature test bench for optical / electrical modules of the present invention. DETAILED DESCRIPTION

[0030] The technical solution of the present invention is further described in detail below in conjunction with preferred embodiments and the accompanying drawings.

[0031] like Figure 1 and Figure 2 As shown, a multi-temperature test bench for optical / electrical modules corresponding to a preferred embodiment of the present invention includes a shell 1, a test chamber assembly 2 connected to the shell 1, a shower assembly 3 connected to the test chamber assembly 2, an air duct 4 connected to the shower assembly 3, and an electrical component for testing whether the optical / electrical module 5 is working properly.

[0032] In this embodiment, the housing 1 is in the shape of a rectangular parallelepiped. Figure 2 and Figure 3As shown, it includes a front panel 10, a rear panel 11, a left side panel 12, a right side panel 13, an upper cover 14, and a lower base 15 that are interconnected. The front panel 10 and the rear panel 11 are disposed opposite each other, the left side panel 12 and the right side panel 13 are disposed opposite each other, and the upper cover 14 and the lower base 15 are disposed opposite each other. The front panel 10, the rear panel 11, the left side panel 12, the right side panel 13, the upper cover 14, and the lower base 15 enclose a housing cavity 16. The housing 1 can be manufactured using sheet metal processing.

[0033] Test chamber assembly 2, for inserting optical / electrical module 5 for testing, is located within housing 1. Air duct 4 is connected to a heat flow meter. Air from the heat flow meter passes through its outlet duct, then through duct 4 and shower assembly 3 before entering test chamber assembly 2. The upper end of test chamber assembly 2 is exposed on upper cover 14 of housing 1, allowing air to enter test chamber assembly 2 from above and alter the temperature of the environment surrounding optical / electrical module 5.

[0034] like Figure 4 As shown, the test chamber assembly 2 includes a plurality of test chambers 20. In this embodiment, the number of test chambers 20 is 4, and the openings are upward. The test chamber assembly 2 includes a frame, which is formed by a front plate 21, a rear plate 22, a left baffle 23, a right baffle 24 and a sealing plate 25 at the bottom. The front plate 21, the rear plate 22, the left baffle 23, the right baffle 24 and the sealing plate 25 enclose a rectangular cavity with an opening at the top. A plurality of partitions 27 are connected between the front plate 21 and the rear plate 22. The bottom of the partition 27 is in contact with the sealing plate 25, dividing the cavity in the frame into a plurality of test chambers 20. Preferably, the size of each test chamber 20 is consistent, so that the temperature change rate in each test chamber 20 is basically the same.

[0035] like Figure 1 and Figure 2 As shown, the front plate 21 is connected to the front panel 10 of the housing 1. A plurality of jacks 100 for inserting the optical / electrical module 5 are provided on the front panel 10. A plurality of insertion ports 210 corresponding to the jacks 100 are provided on the front plate 21. The optical / electrical module 5 can pass through the jacks 100 and the insertion ports 210 and extend into the test cavity 20. Figure 3The electrical assembly includes a circuit board 6 connected to the bottom of the sealing plate 25. The circuit board 6 is provided with an optical / electrical module connector that extends through the sealing plate 25 and into the test cavity 20. The optical / electrical module 5 can be inserted into this connector. The electrical assembly also includes a channel line 60 electrically connected to the circuit board 6, as well as a multi-channel adapter 61 and an interface group 62, both of which are connected to the rear panel 11. The channel line 60 is connected to the multi-channel adapter 61 to transmit test signals to an external test instrument. The multi-channel adapter 61 is a 2×8 multi-channel adapter that can centrally transmit test signals from four optical / electrical modules 5, making wiring simpler and more efficient. It is understood that if the number of optical / electrical modules 5 changes, the multi-channel adapter 61 can also be changed accordingly. The interface group 62 can be provided with multiple interfaces of the same or different types, depending on the situation. For example, it can be a USB, Type-C, network port, GPIB, etc., for reading and writing information from the optical / electrical module.

[0036] The electrical components are primarily concentrated within the housing cavity 16, which is isolated from the test cavity 20 and is less affected by temperature changes in the test cavity 20. Preferably, the test cavity assembly 2 is made of a material with poor thermal conductivity, such as bakelite for its front plate 21, rear plate 22, left baffle 23, right baffle 24, and sealing plate 25. This can effectively prevent or slow down heat conduction between the test cavity 20 and the housing cavity 16. On the one hand, the temperature of the housing cavity 16 has little effect on temperature changes within the test cavity 20, and the temperature within the test cavity 20 can be maintained or rapidly changed, resulting in more accurate test results. On the other hand, the high temperature within the test cavity 20 will not increase the temperature within the housing cavity 16, causing the electrical components to operate in a high-temperature environment, thereby effectively extending the service life of the electrical components.

[0037] like Figure 5As shown, the frame is also provided with a baffle 26 for automatically closing the insertion port 210. The baffle 26 is rotatably connected to the frame, for example, by a shaft connected to the front panel 21. The shaft is located near the top of the baffle 26. Under normal circumstances, the baffle 26 automatically droops under the action of gravity to seal the insertion port 210. When the optical / electrical module 5 is inserted, the baffle 26 is forced upward to prevent interference with the insertion of the optical / electrical module 5. When the optical / electrical module 5 is removed, the baffle 26 automatically flips down to block the insertion port 210. The significance of the baffle 26 is that when the optical / electrical module 5 is removed after testing, the insertion port 210 can be quickly sealed by the baffle 26, thereby preventing heat within the test chamber 20 from dissipating rapidly through the insertion port 210. This reduces the temperature change when the next optical / electrical module 5 is inserted for testing, further saving energy. In addition, the baffle 26 also prevents foreign matter such as dust from entering the test chamber 20, which helps ensure the reliability of the test. A spring, a torsion spring, etc. may also be provided between the baffle 26 and the frame to drive the baffle 26 to rotate toward the front plate 21 to close the insertion port 210 , so that the baffle 26 can close the insertion port 210 more reliably.

[0038] like Figure 6 As shown, a chamfer 260 is provided on the baffle 26 at least at the position in contact with the optical / electrical module 5. The setting of the chamfer 260 can minimize the wear of the sharp edges of the baffle 26 on the surface of the optical / electrical module 5. In this embodiment, chamfers 260 are provided on the lower end and side surfaces of the baffle 26.

[0039] The electrical assembly also includes a temperature sensor disposed in the test cavity 20. The temperature sensor is electrically connected to the circuit board 6 and can conveniently detect the temperature in the test cavity 20 in real time, so that the test cavity 20 can conveniently reach the required temperature and change or maintain it.

[0040] like Figure 7 and Figure 8 As shown, the shower assembly 3 includes a connector 30 connected to the frame and an orifice plate 31 located at the bottom of the connector 30. The connector 30 is provided with an inlet cavity 32 corresponding to the position and shape of the multiple test cavities 20. The cross-sectional shape, size, and position parameters of the inlet cavity 32 are consistent with those of the test cavity 20, allowing airflow to enter the test cavity 20 through the inlet cavity 32. A vent 310 is provided at a position corresponding to the inlet cavity 32 on the orifice plate 31. The vent 310 is used to guide the airflow into the test cavity 20. The airflow entering the inlet cavity 32 can be blocked by the orifice plate 31, thereby evenly diffusing it into the test cavity 20, preventing temperature shock and unevenness caused by the airflow directly blowing into the test cavity 20.

[0041] like Figure 9As shown, the air duct 4 is connected to the connector 30 and includes an annular base 40, two oppositely disposed air collecting blocks 41 disposed on the base 40, and a diverter plate 42 connected between the two air collecting blocks 41. The two air collecting blocks 41 are symmetrically arranged. The base 40 is provided with an opening for airflow to pass through, and the diverter plate 42 divides the opening into a plurality of air inlets 43 corresponding to the inlet cavity 32. The air collecting blocks 41 are also provided with an inclined surface 44 inclined toward the air inlets 43, making the air inlets 43 appear as a cavity that is larger at the top and smaller at the bottom. This allows the air volume of the heat flow meter to be slowly concentrated downward to prevent backflow.

[0042] like Figure 10 As shown, an LED indicator light 101 can also be provided at a position corresponding to the jack 100 on the front panel 10. The indicator light 101 is used to indicate whether the test result is qualified or unqualified. For example, it can indicate the following status through color changes: when the test starts, if the optical / electrical module 5 is not inserted into the jack 100, the indicator light 101 will be blue, prompting that the optical / electrical module 5 needs to be inserted; when the optical / electrical module 5 is inserted, the indicator light 101 changes color to yellow, indicating that the test is in progress; when the optical / electrical module 5 passes the test, the corresponding indicator light 101 will be green, indicating a pass; when the optical / electrical module 5 fails the test, the corresponding indicator light 101 will be red, indicating a fail. In this way, the operator can be prompted with relevant information through color changes, which is more convenient for interactive use.

[0043] When using the optical / electrical module multi-temperature test bench of the present invention, one only needs to insert the optical / electrical module 5 into the test chamber 20, then control the heat flow meter to change the temperature within the test chamber 20 for testing. During the test, the temperature within the test chamber 20 can be monitored in real time to ensure that it meets the required test value. After the test is completed, the optical / electrical module 5 can be simply unplugged and reinserted with a new optical / electrical module 5 to be tested, making operation very convenient. The multiple test chambers 20 in the present invention can all test optical / electrical modules, and the testing methods and sequences can be diverse, including but not limited to serial testing or parallel testing. The term "serial testing" refers to testing multiple optical / electrical modules sequentially, while the term "parallel testing" refers to testing multiple optical / electrical modules simultaneously.

[0044] The optical / electrical modules described in this article include but are not limited to SFP / SFP+ / QSFP / QSFP28 / QSFP56 / QSFP-DD / OSFP / AOC / CFP DCO / CFP2 DCO series of optical / electrical modules.

[0045] The optical / electrical module multi-temperature test bench of the present invention has at least the following advantages:

[0046] 1. The optical / electrical module multi-temperature test bench of the present invention is equipped with a test chamber assembly having multiple test chambers and an air duct connecting a heat flow meter and each test chamber. Each test chamber is equipped with a separate optical / electrical module, so that multiple optical / electrical modules can be tested using a single heat flow meter, greatly improving test efficiency. Furthermore, each optical / electrical module corresponds to a single test chamber, which can significantly reduce the volume of the test chamber, allowing the test chamber to quickly reach the required temperature, further improving test efficiency and reducing time waste.

[0047] 2. The shape and size of each test cavity in the optical / electrical module multi-temperature test bench of the present invention are the same, so that the temperature inside can change synchronously. Each optical / electrical module can start and end testing at the same time, reducing waiting time. It is very convenient and efficient, and the test results are more accurate, reliable, and highly consistent.

[0048] 3. In the optical / electrical module multi-temperature test bench of the present invention, the air duct is provided with multiple air inlets corresponding to the test cavities. Air concentrators are positioned opposite the air inlets. The air concentrators have inclined surfaces inclined toward the air inlets, which allow airflow to flow along the inclined surfaces into the test cavities, preventing backflow.

[0049] 4. In the optical / electrical module multi-temperature test bench of the present invention, a shower assembly is further provided between the air duct and the test cavity. The shower assembly includes an introduction cavity corresponding to the air inlet and the test cavity, and a perforated plate is provided at the bottom of the introduction cavity. After the airflow entering from the air inlet is blocked by the perforated plate, it can enter the test cavity more evenly, so that the temperature in the test cavity changes evenly, and the test effect is better.

[0050] It should be noted that the above preferred embodiments are merely illustrative of the technical concepts and features of the present invention. Their purpose is to enable those skilled in the art to understand the contents of the present invention and implement them accordingly. They are not intended to limit the scope of protection of the present invention. Any equivalent changes or modifications made in accordance with the spirit and essence of the present invention are intended to be encompassed within the scope of protection of the present invention.

Claims

1. A multi-temperature test bench for optical / electrical modules, comprising electrical components for testing optical / electrical modules (5), characterized in that: The optical / electrical module multi-temperature test bench further comprises a test chamber assembly (2) and an air duct (4) connected to the test chamber assembly (2); the test chamber assembly (2) comprises a frame and a plurality of mutually separated test chambers (20) located in the frame, the number of the test chambers (20) being four and opening upward; the frame is further provided with an insertion port (210) for inserting the optical / electrical module (5) and communicating with the test chamber (20); the air duct (4) communicates with the heat flow instrument and the test chamber (20); the air duct (4) comprises a base (40) and a plurality of air inlets (43) corresponding to the test chamber (20) and located on the base (40); a shower assembly (3) is arranged between the air duct (4) and the frame, the shower assembly (3) comprising an introduction chamber (32) corresponding to the test chamber (20) and the air inlet (43) and a plurality of air holes (310) located at the bottom of the introduction chamber (32).

2. The optical / electrical module multi-temperature test bench according to claim 1, characterized in that: The shapes and sizes of the multiple test cavities (20) are consistent.

3. The optical / electrical module multi-temperature test bench according to claim 1, characterized in that: The air guide duct (4) further comprises two oppositely arranged air gathering blocks (41) connected to the base (40), wherein the air gathering blocks (41) are provided with inclined surfaces (44) inclined towards the air inlet (43).

4. The optical / electrical module multi-temperature test bench according to claim 1, characterized in that: The shower assembly (3) comprises a connecting piece (30) and a perforated plate (31) connected to the bottom of the connecting piece (30); the inlet cavity (32) is arranged on the connecting piece (30); and the air hole (310) is opened on the perforated plate (31).

5. The optical / electrical module multi-temperature test bench according to any one of claims 1 to 4, characterized in that: It also comprises a housing (1), the test chamber assembly (2) being arranged in the housing (1), and the housing (1) comprising a housing inner chamber (16) isolated from the test chamber (20).

6. The optical / electrical module multi-temperature test bench according to claim 5, characterized in that: The frame is made of bakelite.

7. The optical / electrical module multi-temperature test bench according to claim 5, characterized in that: The housing (1) comprises a front panel (10), and a socket (100) corresponding to the insertion port (210) and an indicator light (101) are provided on the front panel (10).

8. The optical / electrical module multi-temperature test bench according to any one of claims 1 to 4, characterized in that: The electrical component comprises a temperature sensor arranged in the test cavity (20).

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